- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/305 - Contactless testing using electron beams
Patent holdings for IPC class G01R 31/305
Total number of patents in this class: 65
10-year publication summary
|
5
|
3
|
4
|
4
|
3
|
0
|
3
|
3
|
3
|
6
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Applied Materials, Inc. | 18968 |
8 |
| FEI Company | 958 |
6 |
| Hitachi High-Tech Corporation | 5404 |
5 |
| Applied Materials Israel, Ltd. | 616 |
4 |
| ASML Netherlands B.V. | 7490 |
3 |
| ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | 157 |
3 |
| Intel Corporation | 47239 |
2 |
| Ricoh Company, Ltd. | 13384 |
2 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 43854 |
2 |
| DCG Systems, Inc. | 55 |
2 |
| KLA-Tencor Technologies Corporation | 181 |
2 |
| Samsung Electronics Co., Ltd. | 147983 |
1 |
| Centre National de La Recherche Scientifique | 10576 |
1 |
| Texas Instruments Incorporated | 19456 |
1 |
| Renesas Electronics Corporation | 5969 |
1 |
| Applied Materials GmbH | 3 |
1 |
| Tokyo Electron Limited | 12994 |
1 |
| Macronix International Co., Ltd. | 2548 |
1 |
| Hamilton Sundstrand Corporation | 4931 |
1 |
| Ebara Corporation | 2199 |
1 |
| Other owners | 17 |