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2025
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G/S
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Providing laboratory research services in the field of electron microscopy including grid prepara... |
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Invention
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Bifocal electron microscope.
Methods for using a single electron microscope system for investiga... |
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Invention
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Methods for determining the virtual source location of a liquid metal ion source.
Variations in ... |
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G/S
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Downloadable software application to automate laboratory measurements |
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2024
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G/S
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Scientific apparatus, namely, a Focused Ion Beam Scanning
Electron Microscope (FIB-SEM) for semi... |
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Invention
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Systems and methods for performing sample lift-out for highly reactive materials.
Methods and sy... |
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Invention
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Automatic grid finger detection.
Embodiments herein relate to sample support imaging and sample ... |
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Invention
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Segmented endpointing for sample preparation.
Segmented endpointing techniques for sample prepar... |
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Invention
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Transmission electron microscopy of streams of ions and molecules. A method of analyzing a sample... |
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Invention
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Correction of optical aberrations in charged particle beam microscopy.
A charged particle beam m... |
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Invention
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Methods and systems of electron diffraction.
A method of producing an electron diffraction patte... |
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Invention
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Eds calibration.
A method comprises providing reference data indicative of at least one referenc... |
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Invention
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Tensorial template matching. A method of template matching a tensorial template of a target parti... |
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Invention
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Methods and apparatus for electron backscatter diffraction sample characterisation.
A method of ... |
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Invention
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Beta tilt sample holder.
Aspects of a sample holder configured for an analytical instrument syst... |
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Invention
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Methods and systems for elemental mapping.
Methods and systems for imaging a sample with a charg... |
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Invention
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Tem grids with liquid spreading lanes.
A grid for sampling a liquid specimen includes a first la... |
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Invention
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Liquid specimen grid for transmission electron microscope.
A grid for sampling a liquid specimen... |
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Invention
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Particle-induced x-ray emission (pixe) using hydrogen and multi-species focused ion beams.
An ap... |
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Invention
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Sem navigation by focused ion beam system with cryo cooling sample stage.
Embodiments of an anal... |
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G/S
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Providing online non-downloadable workflow management
software. |
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G/S
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Downloadable workflow management software. |
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G/S
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Semiconductor testing apparatus, namely, a Focused Ion Beam Scanning Electron Microscope (FIB-SEM... |
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Invention
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Method and system for sample preparation.
A sample is milled to expose the region of interest (R... |
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Invention
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Lamella end-pointing via graph-weighted neural networks.
Systems or techniques are provided for ... |
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Invention
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Supervised machine learning based classification of adeno associated viruses in cryogenic electro... |
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G/S
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Downloadable workflow management software |
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G/S
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Providing online non-downloadable workflow management software |
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G/S
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transmission electron microscope (TEM) |
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2023
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Invention
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Carbon containing precursors for beam-induced deposition.
Systems, components, and methods for b... |
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Invention
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Increasing information resulting from apodization.
Embodiments herein relate to apodization of a... |
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Invention
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Minimization of energy spread in focused ion beam (fib) systems.
Charged-particle beam (CPB) opt... |
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Invention
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Dry electron source environment.
A charged particle microscope system, comprising an electron so... |
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G/S
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Laboratory instrument, namely, a scanning electron microscope for material imaging and analysis |
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Invention
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Cryogenic cleaning device.
Cryogenic cleaning devices comprise a body and an attachment element ... |
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Invention
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Aberration correction systems and charged particle microscope systems including the same.
Aberra... |
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Invention
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Method and system for orientating a sample for inspection with charged particle microscopy.
In s... |
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Invention
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Multipole elements and charged particle microscope systems including the same.
Multipole element... |
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Invention
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Adaptive slice depth in slice & view workflow.
Milling depth is selected based on sample dimensi... |
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Invention
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Secondary electron detector for ion beam systems.
Dual beam charged particle microscopy systems,... |
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Invention
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Sample carrier and uses thereof.
A sample carrier for a charged particle microscope. The sample ... |
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Invention
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Blanker-enhanced moire imaging.
In some embodiments, a scientific instrument includes an electro... |
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Invention
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Delayering apparatus and methods.
Methods include conditioning at least a portion of a gas deliv... |
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Invention
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Automated region selection for auto sweep.
Sample regions of interest (ROIs) for use in autofocu... |
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Invention
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Fast and accurate strain mapping using electron diffraction.
In some embodiments, a scientific i... |
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Invention
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Techniques for imaging low duty cycle signals using a scanning electron microscope.
Systems, com... |
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Invention
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Techniques for waveform detection of periodic signals using voltage contrast.
Systems, component... |
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Invention
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Shielded detector for charged particle microscopy.
Systems, components, and methods for detectin... |
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Invention
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Differential phase contrast microanalysis using energy loss spectrometers.
Systems, components, ... |
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Invention
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Microscopy sample preparation methods and associated systems.
In an example, a method includes p... |
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Invention
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Thermal conditioning enclosure for a charged particle instrument.
A charged particle instrument ... |
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Invention
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Energy dispersive x-ray spectroscopy phase spectrum synthesis.
Systems, computer program product... |
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Invention
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Interface detection in reciprocal space.
Methods and apparatus determine a location of a boundar... |
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Invention
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Fib and sem resolution enhancement using asymmetric probe deconvolution.
Elongated or other non-... |
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Invention
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Apparatus and method for manipulating a microscopic sample.
A sample manipulation system for a s... |
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Invention
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Device line understanding using composed templates.
Systems, components, methods, and algorithms... |
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Invention
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Precision handling system with compliant gripper.
A precision handling system including a grippe... |
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G/S
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Laboratory apparatus, namely, a carrier for samples in the
field of electron microscopy. |
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G/S
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Laboratory instrument, namely, an ion beam polisher. |
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G/S
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Laboratory instrument, namely, an ion beam polisher. |
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G/S
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Scanning transmission electron microscope for sample preparation and imaging analysis in the fiel... |
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2022
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G/S
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Laboratory apparatus, namely, a container for holding biological samples to be viewed on an elect... |
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Invention
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Apparatus for moving sample holders.
An apparatus for moving first and second sample holders bet... |
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G/S
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Laboratory instrument, namely, ion milling machines for preparing specimens for observation with ... |
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2021
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Invention
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System and method for spectrometry of a sample in a plasma.
A system and method for spectrometry... |
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G/S
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cryo dual-beam electron microscope |
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G/S
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Laboratory apparatus, namely, an optical instrument for imaging inside an electron microscope |
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G/S
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Providing demonstration of products in the field of electron
microscopes. Providing facilities f... |
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2020
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G/S
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Providing demonstration of products in the field of electron microscopes Providing facilities for... |
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G/S
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Electron microscopes. |
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2019
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G/S
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Electron microscope |
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G/S
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Electron microscope. |
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G/S
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Laboratory instrument for processing samples for single
particle analysis and/or cryo-tomography... |
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G/S
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High brightness, submicron ion and electron beam columns
using field emission technology for sci... |
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G/S
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Laboratory instrument for processing samples for single particle analysis and/or cryo-tomography ... |
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2018
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G/S
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high brightness, submicron ion and electron beam columns using field emission technology, namely,... |
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2002
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G/S
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Equipment and micro-machining equipment for manufacture of semi-conductors, data storage componen... |
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2001
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G/S
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Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, meas... |
