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2025
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P/S
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Site services, namely, preparing, assessing, and optimizing laboratory and research environments ... |
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P/S
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Software as a service (SaaS) featuring software for operating, monitoring, and managing electron ... |
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Invention
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Automated and robust method for recording nm-resolution 3d image data from serial ultra-sections ... |
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Invention
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Techniques for reducing electromagnetic interference effects in charged particle microscopy.
Emb... |
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Invention
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Junction between hexaboride-containing and tantalum-containing components.
Apparatus and methods... |
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Invention
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Area selection in charged particle microscope imaging.
Disclosed herein are apparatuses, systems... |
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Invention
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Scanning electron microspcope for capturing diffraction patterns. An electron microscope is discl... |
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Invention
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Beam synchronization in microscopy. A method for mixed signal synchronization for a charged parti... |
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Invention
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Digital sample model for instrumental optimization. System and methods are disclosed for a scient... |
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Invention
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Beam synchronization in microscopy.
A method for mixed signal synchronization for a charged part... |
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Invention
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Temporal characterization of oscillator signals in charged particle microscopy.
A method for cha... |
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Invention
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Method for obtaining a tilt series of images of a sample at a plurality of tilt angles.
A method... |
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Invention
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Charged particle microscope having a charged particle detector.
A charged particle microscope th... |
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Invention
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Artificial intelligence enabled metrology.
Methods and systems for implementing artificial intel... |
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Invention
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Virtual interactive microscope experiment simulation platform. Embodiments herein relate to a pro... |
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Invention
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3d fiducial for precision 3d nand channel tilt/shift analysis.
Systems for and methods for gener... |
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Invention
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Sample tip.
A sample holder tip (hereinafter referred to as a sample tip) releasably holds a sam... |
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Invention
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Broad ion beam (bib) systems for more efficient processing of multiple samples.
Systems and meth... |
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Invention
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Data acquisition in charged particle microscopy.
Disclosed herein are charged particle microscop... |
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P/S
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Downloadable software application to automate laboratory measurements |
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2024
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P/S
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Scientific apparatus, namely, a Focused Ion Beam Scanning
Electron Microscope (FIB-SEM) for semi... |
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Invention
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Tomography stage control.
A method and system for obtaining electron tomography data from a samp... |
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Invention
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Beam alignment and synchronization in microscopy.
A method for aligning a pulsed laser beam in m... |
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Invention
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Beam alignment and synchronization in microscopy.
A method for flexible beam blanking in ultrafa... |
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Invention
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Spectral image analysis via integration-constrained fitting.
Systems or techniques are provided ... |
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P/S
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Providing online non-downloadable workflow management
software. |
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P/S
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Downloadable workflow management software. |
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P/S
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Semiconductor testing apparatus, namely, a Focused Ion Beam Scanning Electron Microscope (FIB-SEM... |
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Invention
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Detecting and adjusting lamella deformation.
A method including performing, with a charged parti... |
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Invention
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Lens arrangement in an electron microscopy system.
A charged particle beam system includes a sou... |
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Invention
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Charging artifact mitigation via scanning direction rotation.
Systems/techniques are provided fo... |
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Invention
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Classification of substrate regions.
Methods and apparatus are disclosed for classifying regions... |
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Invention
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Correction of aberrations in in-line electron holography.
Embodiments herein relate to a process... |
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Invention
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Magnetic shielding of the photomultiplier in the magnetic immersion field.
Charged-particle dete... |
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Invention
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Inhomogeneous d-shaped focused ion beams.
Methods include producing a charged particle beam with... |
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Invention
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Scanning deflector.
The charged beam particle system including a first electron detector, a seco... |
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Invention
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Large language model assistance for charged-particle microscope operation.
Systems/techniques ar... |
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Invention
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Split-column acceleration tube for scanning electron microscope.
Embodiments of the present disc... |
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Invention
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Drift compensation for radiation-sensitive specimens.
In one example, a method performed via a c... |
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Invention
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Classifying microscopic components of physical samples.
Disclosed herein are systems for classif... |
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Invention
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Electrical and thermal connection cable for charged particle microscopes.
Systems, methods, and ... |
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Invention
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Sample support grid recognition.
Embodiments herein relate to a process for sample support recog... |
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Invention
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Hybrid background extraction in electron holography.
Embodiments herein relate to a process for ... |
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Invention
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Situ protective polymer via milling-excitation.
Systems or techniques are provided for facilitat... |
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Invention
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Automatic correction of energy dependent defocus in particle beam systems due to a configuration ... |
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Invention
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Sample preparation with non-uniform dose.
Variable dosage ion beam milling techniques for sample... |
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Invention
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Virtual interactive microscope experiment simulation platform.
Embodiments herein relate to a pr... |
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Invention
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Airless transfer and electrical testing of solid state batteries in scanning electron microscopes... |
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Invention
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Ion beam column ion species measurement.
A charged particle system including a plasma source con... |
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Invention
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Preparation of planar lamella from a multi-layer structure.
A method for preparing a planar lame... |
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Invention
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Tiled region adjacency graph computation via pixel-region adjacency graphs.
Systems or technique... |
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Invention
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Heating assembly for charged particle beam system.
Systems, devices, and techniques for heating ... |
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P/S
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Downloadable workflow management software |
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P/S
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Providing online non-downloadable workflow management software |
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P/S
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transmission electron microscope (TEM) |
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2023
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P/S
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Laboratory instrument, namely, a scanning electron microscope for material imaging and analysis |
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Invention
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Method of virtual sectioning of stem sample using combination of se.
Scanning transmission elect... |
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P/S
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Laboratory apparatus, namely, a carrier for samples in the
field of electron microscopy. |
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P/S
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Laboratory instrument, namely, an ion beam polisher. |
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P/S
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Laboratory instrument, namely, an ion beam polisher. |
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P/S
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Scanning transmission electron microscope for sample preparation and imaging analysis in the fiel... |
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2022
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P/S
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Laboratory apparatus, namely, a container for holding biological samples to be viewed on an elect... |
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P/S
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Laboratory instrument, namely, ion milling machines for preparing specimens for observation with ... |
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2021
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P/S
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cryo dual-beam electron microscope |
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P/S
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Laboratory apparatus, namely, an optical instrument for imaging inside an electron microscope |
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P/S
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Providing demonstration of products in the field of electron
microscopes. Providing facilities f... |
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2020
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P/S
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Providing demonstration of products in the field of electron microscopes Providing facilities for... |
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P/S
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Electron microscopes. |
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2019
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P/S
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Electron microscope |
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P/S
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Electron microscope. |
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P/S
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Laboratory instrument for processing samples for single
particle analysis and/or cryo-tomography... |
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P/S
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High brightness, submicron ion and electron beam columns
using field emission technology for sci... |
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P/S
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Laboratory instrument for processing samples for single particle analysis and/or cryo-tomography ... |
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2018
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P/S
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high brightness, submicron ion and electron beam columns using field emission technology, namely,... |
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2002
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P/S
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Equipment and micro-machining equipment for manufacture of semi-conductors, data storage componen... |
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2001
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P/S
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Scientific, nautical, surveying, electric, photographic, cinematographic, optical, weighing, meas... |
