Applied Materials, Inc.

United States of America


 
Total IP 18,501
Total IP incl. subs 20,436 (+ 1,988 for subs)
Total IP Rank # 45
IP Activity Score 4.6/5.0    13,669
IP Activity Rank # 31
IP AS incl. subs 4.5/5.0    14,124
Stock Symbol
ISIN US0382221051
Market Cap. 141,699M  (USD)
Industry Semiconductor Equipment & Materials
Sector Technology
Dominant Nice Class Machines and machine tools

Patents

Trademarks

9,575 331
0 17
8,325 231
22
 
Last Patent 2025 - Rf blocker for uniformity control
First Patent 1974 - Induction heated vapor source
Last Trademark 2025 - SMARTFACTORY AI
First Trademark 1981 - PROMIS

Subsidiaries

16 subsidiaries with IP (1958 patents, 30 trademarks)

30 subsidiaries without IP

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Industry (Nice Classification)

Latest Inventions, Goods, Services

2025 G/S Providing an online non-downloadable software suite for automating and optimizing manufacturing o...
G/S Providing online non-downloadable software for managing, coordinating, monitoring, updating, and ...
G/S Semiconductor manufacturing equipment used to densify materials on wafers
G/S Semiconductor wafer processing equipment and components, namely, chemical mechanical polishers an...
G/S Optical defect inspection equipment in the nature of an optical microscope used for inspecting an...
G/S Semiconductor wafer processing equipment used for implanting different materials into wafers.
G/S Operational software for the quality control, and measurement of semiconductor materials, namely,...
G/S Semiconductor manufacturing machines used for digital lithography-based patterning. Recorded sof...
Invention Substrate measurement subsystem. An identification feature of a substrate in a substrate measure...
G/S Semiconductor manufacturing equipment used to densify materials on wafers.
Invention Methods of depositing silicon-containing dielectric layers for semiconductor devices. Methods of...
Invention Method for cmp temperature control. A chemical mechanical polishing system includes a platen to ...
Invention Auto fine-tuner for desired temperature profile. Embodiments disclosed herein include a method o...
G/S Semiconductor wafer processing chamber for depositing dielectric materials.
G/S semiconductor wafer processing chamber for depositing dielectric materials
G/S Semiconductor manufacturing machines used for digital lithography-based patterning Recorded softw...
G/S O-rings, non-metal gaskets, non-metal seals, and elastomer seals for use in semiconductor manufa...
Invention Paddle configuration for a particle coating reactor. A reactor for coating particles includes a ...
Invention Methods and mechanisms for adjusting process chamber parameters during substrate manufacturing. ...
G/S O-rings, non-metal gaskets, non-metal seals, and elastomer seals for use in semiconductor manufac...
G/S Analytical equipment used for material metrology and inspection in the field of semiconductor wa...
Invention Self-aligning backside gate connection. Embodiments of the present disclosure relate to a method...
2024 G/S Analytical equipment used for material metrology and inspection in the field of semiconductor waf...
Invention Air-core coil in analog circuit filters for plasma processing. A system includes a processing cha...
Invention Method and apparatus of substrate support repair and refurbishment. Methods of refurbishing ceram...
Invention Gas delivery system. A gas delivery system includes a substrate. The substrate includes a first ...
Invention Selective deposition of capping layer. Provided are methods of forming a semiconductor device. Th...
Invention Real-time measurement of microwave resonators as plasma diagnostics for process monitoring. Embod...
Invention Direct applied interposer for co-packaged optics. A method of forming a packaged multichip module...
Invention Process chamber gas supply improvement. A process chamber is provided including: a chamber body a...
Invention Stress layer modification using energetic beam processing through photoresist mask. A method may ...
Invention Multimode dose compensation system. A method, a system and computer program product for controlli...
Invention Substrate stress management using direct selective area processing. A method may include providin...
Invention High conformal coating on textured surface of processing chamber component. A plasma processing c...
G/S Machines for the design and manufacture of OLED display substrates using semiconductor evaporato...
Invention Nanocrystalline diamond and ultra-nanocrystalline diamond films by catalytic cvd. A hot wire chem...
Invention Atomic layer etching of silicon oxide at cryogenic temperature. Embodiments of the disclosure inc...
G/S Semiconductor evaporator processing equipment for the design and manufacture of OLED display subs...
Invention Plasma injection configurations for processing chambers, and related apparatus, chamber kits, and...
Invention Esc design with enhanced tunability for wafer far edge plasma profile control. A substrate suppor...
G/S Machines for use in the manufacture of electrical and electronic circuitry. Optical defect inspe...
Invention Rf blocker for uniformity control. A semiconductor processing system with improved plasma density...
G/S Machines for use in the manufacture of electrical and electronic circuitry Optical defect inspect...
Invention Constructing a substrate topology map based on measured properties. A system includes a displacem...
G/S Semiconductor manufacturing equipment, namely, systems comprised of semiconductor manufacturing ...
G/S Semiconductor manufacturing equipment, namely, systems comprised of semiconductor manufacturing m...
G/S Software-controlled systems used in the semiconductor manufacturing industry, namely, recorded so...
G/S Semiconductor wafer processing equipment.
Invention Treating silicon nitride based dielectric films. The present disclosure provides methods of gap f...
G/S Semiconductor wafer inspection system used to inspect wafers for darkfield defects, including pa...
G/S Inspection machines for the inspection of semiconductor wafers to inspect darkfield defects, name...
G/S Semiconductor wafer and glass panel process and processing equipment. OLED based display devices...
G/S Semiconductor wafer processing equipment including equipment for manufacturing OLED (Organic ligh...
G/S Semiconductor manufacturing equipment used to deposit metal on wafers.
G/S Semiconductor manufacturing equipment used to deposit materials on substrates.
G/S Providing non-downloadable electronic publications featuring information about the environment, ...
G/S Eco-efficient semiconductor wafer processing equipment. Software-controlled, eco-efficient system...
G/S Optical devices for high performance photonic applications.
G/S Equipment for testing chemical delivery systems including ampoules or containers. Downloadable a...
G/S Downloadable and/or recordable software for creating semiconductor fabrication recipes.
G/S Equipment for delivery systems, namely, containers made of metal for storing and delivering chem...
G/S Recorded computer software used for running, tracking, and providing feedback for on-tool metrol...
G/S Semiconductor wafer processing equipment used for implanting different materials into wafers.
G/S Semiconductor wafer processing equipment used for implanting different materials into wafers
G/S Semiconductor manufacturing equipment used to remove material from substrates.
G/S Semiconductor manufacturing software used to provide wafer doping uniformity.
G/S Semiconductor wafer processing equipment for modifying film properties of substrates.
G/S Semiconductor manufacturing machines used to deposit metal on wafers.
G/S Semiconductor processing equipment components, namely, chambers used to deposit materials on sub...
Invention Manifold for material removal system. A system includes a material removal apparatus including a...
2023 Invention System and process for post-chemical mechanical polishing cleaning. A substrate cleaning system ...
Invention Real-time measurement of microwave resonators as plasma diagnostics for process monitoring. Embo...
Invention Selective deposition of capping layer. Provided are methods of forming a semiconductor device. T...
Invention Rf blocker for uniformity control. A semiconductor processing system with improved plasma densit...
Invention Substrate stress management using direct selective area processing. A method may include providi...
Invention Stress layer modification using energetic beam processing through photoresist mask. A method may...
Invention Process chamber gas supply improvement. A process chamber is provided including: a chamber body ...
Invention Air-core coil in analog circuit filters for plasma processing. A system includes a processing ch...
Invention Treating silicon nitride based dielectric films. The present disclosure provides methods of gap ...
Invention Constructing a substrate topology map based on measured properties. A system includes a displace...
Invention Multimode dose compensation system. A method, a system and computer program product for controll...
Invention Method and apparatus of substrate support repair and refurbishment. Methods of refurbishing cera...
Invention Isolation formation method in high-aspect ratio cmos stacked devices. A system and method for fo...
Invention Endpoint detection by generating synthetic sensor data. A method includes providing, to a traine...
Invention Electron-stimulated etching of silicon. Methods and apparatus for processing a substrate which i...
Invention Direct applied interposer for co-packaged optics. A method of forming a packaged multichip modul...
Invention Atomic layer etching of silicon oxide at cryogenic temperature. Embodiments of the disclosure in...
Invention Modular processing chambers and related heating configurations, methods, apparatus, and modules f...
Invention Bottom-up dielectric gap-fill for device isolation during source/drain epitaxy in cfet. A system...
Invention Electrode configurations and magnet configurations for processing chambers, and related methods a...
Invention Electrode and coil configurations for processing chambers and related chamber kits, apparatus, an...
2022 Invention Methods and apparatuses for identifying defective electrical connections of a substrate. A metho...
Invention Method and apparatus for testing a packaging substrate. A method of testing a packaging substrat...