Applied Materials, Inc.

États‑Unis d’Amérique


Commandez votre montre hebdomadaire Applied Materials, Inc.
Quantité totale PI 20 514
Quantité totale incluant filiales 22 454 (+ 1 997 pour les filiales)
Rang # Quantité totale PI 41
Note d'activité PI 4,6/5.0    14 567
Rang # Activité PI 33
Activité incl filiales 4,5/5.0    15 028
Symbole boursier
ISIN US0382221051
Capitalisation 141,699M  (USD)
Industrie Semiconductor Equipment & Materials
Secteur Technology
Classe Nice dominante Machines et machines-outils

Brevets

Marques

10 773 302
2 17
9 170 225
25
 
Dernier brevet 2026 - In-trench quality improvement of...
Premier brevet 1974 - Induction heated vapor source
Dernière marque 2026 - LIGHTVEIL
Première marque 1981 - PROMIS

Filiales

16 subsidiaries with IP (1970 patents, 27 trademarks)

30 subsidiaries without IP

 S'inscrire grtuitement pour accéder à la liste des filiales

Industrie (Classification de Nice)

Derniers inventions, produits et services

2026 P/S Optical components for head-mounted and near-eye display devices, namely, waveguides, lenses, opt...
P/S Charitable services, namely, providing financial support to women college students in STEM areas ...
P/S Semiconductor manufacturing machines and machine tools, namely, machines for wafer processing fe...
P/S Semiconductor manufacturing machines and machine tools, namely, machines for wafer processing fea...
P/S Semiconductor manufacturing machines, namely, electrochemical plating (ECP) machines, substrate ...
P/S Semiconductor manufacturing machines, namely, electrochemical plating (ECP) machines, substrate c...
Invention System and method for non-invasive sensing of radio-frequency current spectra flowing in a plasma...
P/S Design, development, maintenance, updating, installation, and implementation of computer softwar...
P/S Maintenance and repair services for semiconductor processing and production equipment and compon...
P/S Semiconductor wafer processing equipment. Recorded computer software for use in connection with ...
P/S Design, development, maintenance, updating, installation, and implementation of computer software...
P/S Semiconductor wafer processing equipment Recorded computer software for use in connection with de...
P/S Maintenance and repair services for semiconductor processing and production equipment and compone...
Invention Selective tantalum nitride deposition for barrier applications. Methods of forming semiconductor...
Invention Moisture blocking structures for anode protection. Embodiments described herein generally relate ...
Invention Spin-dry chamber for cleaning various sized substrates. Embodiments of the present disclosure gen...
Invention Organic light emitting material patterning for dot type configuration. Embodiments described here...
Invention Led panel with contact define layer. The present disclosure provides devices and methods of makin...
Invention Evaporation system and device structure for leakage current mitigation of advanced oled device. E...
Invention Seam free molybdenum gap fill. Embodiments of the disclosure relate to methods for molybdenum ga...
Invention Highly reliable resistive memory cell and methods of forming the same. The present disclosure rel...
P/S Semiconductor wafer processing equipment, namely, semiconductor processing chambers used to depo...
Invention Improving high-aspect-ratio devices dielectric material patterning through surface charge relaxat...
P/S Semiconductor wafer processing equipment, namely, semiconductor processing chambers used to depos...
Invention Resonator coil pitch adjustment systems and methods. The present subject matter relates to system...
2025 P/S providing an online non-downloadable software suite for automating and optimizing manufacturing o...
P/S Semiconductor manufacturing equipment, namely, machines for heating semiconductor wafers; wafer ...
P/S Semiconductor manufacturing equipment, namely, machines for heating semiconductor wafers; wafer p...
Invention Lubricating a rail interface. A system for lubricating a rail interface that is located within a ...
Invention Automated center finding process. A method includes loading an end effector with a substrate and ...
Invention Turning element arrays for optical interfaces. An optical interface includes a plurality of inner...
Invention Ampoule blocker. In one or more embodiments, a precursor delivery system includes a container and...
Invention Composite silicide for 3d dram devices. A semiconductor structure includes a layer stack on a sub...
Invention Fully isolated super via in wafer stacking structure. A method of forming a fully isolated super ...
Invention Methods for reshaping masking layer openings. A method of modifying an opening in a material laye...
Invention System and method for adjusting an ion beam. Ion beam implantation systems, devices, and methods ...
Invention Integrated plasma activation measurement for enhanced plasma process system. A method includes pe...
Invention Atomic layer deposition with carbon inhibition profile tuning. Exemplary methods of semiconductor...
Invention In-trench quality improvement of silicon-and-oxygen-containing materials. Exemplary methods of se...
Invention Highly reliable resistive memory at high operation temperatures. The present disclosure relates ...
Invention Apparatus and method for cleaning susceptors with plasma. Embodiments described herein relate to ...
Invention Highly reliable resistive memory cell and methods of forming the same. The present disclosure re...
Invention Thin film thickness and non-uniformity monitoring. Embodiments described herein relate to a metho...
Invention Process chamber process kit with protective coating. ZAVGZAVG, of less than or equal to about 20 ...
P/S Providing online non-downloadable software for managing, coordinating, monitoring, updating, and...
P/S Providing an online non-downloadable software suite for automating and optimizing manufacturing ...
P/S Semiconductor wafer processing chambers for depositing dielectric materials. Recorded computer s...
P/S Semiconductor wafer processing machines for depositing dielectric materials Recorded computer sof...
P/S Machines for the design and manufacture of OLED display substrates using semiconductor evaporator...
P/S Providing an online non-downloadable software suite for automating and optimizing manufacturing o...
Invention Die-level warp control in device manufacturing. Disclosed systems and techniques are directed to...
P/S Providing online non-downloadable software for managing, coordinating, monitoring, updating, and ...
P/S Semiconductor manufacturing equipment used to densify materials on wafers.
P/S Semiconductor wafer processing equipment used for implanting different materials into wafers.
P/S Semiconductor wafer processing equipment and components, namely, chemical mechanical polishers a...
P/S Semiconductor manufacturing machines used to densify materials on wafers
P/S Semiconductor wafer processing equipment and components, namely, chemical mechanical polishers an...
P/S Optical inspection apparatus in the nature of an optical microscope used for inspecting and analy...
P/S Semiconductor wafer processing equipment used for implanting different materials into wafers.
P/S Semiconductor manufacturing machines used for digital lithography-based patterning. Recorded sof...
Invention Ampoule blocker. In one or more embodiments, a precursor delivery system includes a container an...
Invention Automated center finding process. A method includes loading an end effector with a substrate and...
Invention Spin-dry chamber for cleaning various sized substrates. Embodiments of the present disclosure ge...
P/S Semiconductor wafer processing chamber for depositing dielectric materials.
Invention In-trench quality improvement of silicon-and-oxygen-containing materials. Exemplary methods of s...
Invention Atomic layer deposition with carbon inhibition profile tuning. Exemplary methods of semiconducto...
Invention Method of a critical dimension measurement on a substrate, a method of manufacturing one or more ...
Invention Integrated plasma activation measurement for enhanced plasma process system. A method includes p...
Invention Thin film thickness and non-uniformity monitoring. Embodiments described herein relate to a meth...
Invention Methods for reshaping masking layer openings. A method of modifying an opening in a material lay...
Invention Fully isolated super via in wafer stacking structure. A method of forming a fully isolated super...
Invention Non-uniform subsrate processing using a scanned spot ion beam. A method of processing a substrat...
Invention Turning element arrays for optical interfaces. An optical interface includes a plurality of inne...
Invention Composite silicide for 3d dram devices. A semiconductor structure includes a layer stack on a su...
Invention Apparatus and method for cleaning susceptors with plasma. Embodiments described herein relate to...
Invention Pull-back selective etching processes. Pull-back selective etching processes for bottom-up selec...
Invention System and method for adjusting an ion beam. Ion beam implantation systems, devices, and methods...
Invention Resonator coil pitch adjustment systems and methods. The present subject matter relates to syste...
Invention Electrostatic chuck, deposition system, method of fabricating an electrostatic chuck and method o...
P/S Semiconductor wafer processing machines for depositing dielectric materials
P/S Semiconductor manufacturing equipment used to densify materials on wafers
P/S Semiconductor manufacturing machines used for digital lithography-based patterning Recorded softw...
P/S O-rings, non-metal gaskets, non-metal seals, and elastomer seals for use in semiconductor manufa...
P/S O-rings, non-metal industrial-use and pipe gaskets, non-metal sealing rings for use as connection...
P/S Analytical equipment used for material metrology and inspection in the field of semiconductor wa...
2024 Invention Method of fabricating an optical structure. Aspects of the present disclosure provide methods of...
Invention Direct and selective mass transfer process for microled display fabrication. Described herein ar...
Invention Laser absorption and scattered light metrology tool. Embodiments described herein relate to an o...