ASML Netherlands B.V.

Netherlands


 
Total IP 7,247
Total IP incl. subs 7,247 (+ 0 for subs)
Total IP Rank # 131
IP Activity Score 4.3/5.0    4,653
IP Activity Rank # 123
Parent Entity ASML Holding N.V.
Dominant Nice Class Scientific and electric apparatu...

Patents

Trademarks

3,934 43
55 7
3,128 41
39
 
Last Patent 2025 - Lithographic apparatus controlle...
First Patent 1990 - Two-step positioning device usin...
Last Trademark 2025 - HMI eP5
First Trademark 1999 - TWINSCAN

Subsidiaries

1 subsidiaries with IP (0 patents, 0 trademarks)

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Industry (Nice Classification)

Latest Inventions, Goods, Services

2025 G/S Computer software for use in processing semiconductor wafers; computer software, recorded; semi-c...
G/S Computer software for use in processing semiconductor wafers; computer software, recorded; semi-...
2024 Invention Charged particle assessment system and method. An assessment method comprising: using an assessm...
Invention Method of assessing a sample, apparatus for assessing a sample. The present disclosure relates t...
G/S Semiconductor manufacturing machines and semiconductor machinery.. Electronic imaging hardware an...
Invention Training a model to generate predictive data. A method of training a generator model comprising:...
Invention Electron-optical device. A charged particle-optical device for projecting a plurality of charged...
Invention Method of processing data derived from a sample. The embodiments of the present disclosure provi...
G/S Semi-conductor lithographic machines, and their parts and fittings.
G/S Semi-conductor lithographic machines, and their parts and fittings.
Invention Defect detection from a scanning electron microscope derived depth map with neural network and de...
G/S Semiconductor manufacturing machines and semiconductor machinery. Electronic imaging hardware and...
G/S Semiconductor manufacturing machines and semiconductor machinery. Electronic imaging hardware an...
Invention Pulse compression for sample assessment. A charged particle-optical device configured to assess a...
Invention Method of assessing a charged particle beam, and method of assessing a beam grid. Methods and app...
Invention Methods and assemblies for wavelength calibration. Assemblies and methods for wavelength calibrat...
Invention Systems and methods for motion control of a patterning device in a lithography apparatus. A retic...
Invention Broadband light source assembly. A broadband light source assembly, a metrology apparatus and a m...
Invention A method of refurbishing a substrate support. A method of refurbishing a substrate support, the s...
Invention Apparatus of plural charged-particle beams. A multi-beam apparatus for observing a sample with h...
Invention Radiation spectrum configuration system. A radiation source, a metrology tool, a lithographic app...
Invention Height measurement system. A system for measuring the height of a resist-covered surface of a sub...
Invention Speeding up forward electromagnetic computations for sxr reconstruction. A computer-implemented m...
Invention Method for designing a focus target for focus metrology. Disclosed is a method for designing a fo...
Invention Method of determining a dimensional parameter of a microstructured optical fiber. A method of det...
Invention Radiation system. A radiation system comprising a deformable minor having a reflective surface ar...
Invention Lithographic apparatus, metrology systems, digital holographic microscopy alignment sensor, and m...
Invention Setpoint generator, position control system, stage apparatus and exposure apparatus. The inventio...
Invention Systems and methods for contactless measurement of energy barriers during device fabrication. Sys...
Invention Methodology to predict a part per trillion failure rate. A method of predicting a part per trilli...
Invention Systems and methods for beam alignment in multi charged-particle beam systems. Systems and method...
Invention Optical element for use in euv lithography. An optical element for an EUV lithographic apparatus,...
Invention Projection system characterisation system and method. Disclosed herein is a computing system conf...
Invention Substrate coupling systems. Current substrate (e.g., semiconductor wafer) coupling (e.g., bonding...
Invention Optical vortex based metrology systems and methods. Optical vortex based metrology systems and me...
Invention A method of spectrally configuring measurement illumination of a metrology tool and associated ap...
Invention Method for reducing stochastic failures via source-mask optimization. Systems and methods for sou...
Invention Molten metal transfer line. A transfer line for transferring molten metal from a reservoir to a n...
Invention Masking module. A masking module for use in a lithographic apparatus, comprising a moveable maski...
Invention A measurement system and a diffraction grating therefor. A measurement system (shearing interfero...
Invention Membrane monitoring apparatus and method, and lithographic apparatus. A monitoring subsystem for ...
Invention Real time recipe tuning for inspection system. The present disclosure provides a method for real ...
Invention Method for determining root causes of events of a semiconductor manufacturing process and for mon...
Invention Lithographic apparatus and gas lock funnel. A lithographic apparatus comprises: a substrate table...
Invention An optical filter, a heterodyne interferometer system comprising the filter, and a method for fil...
G/S Inspection tool using an electron beam for inspection of semiconductor materials, devices and pro...
G/S Inspection tool using an electron beam for inspection of semiconductor materials, devices and pr...
2023 G/S Machines for micro lithography and machines for use in the manufacture, fabrication and treatment...
G/S Machines for micro lithography and machines for use in the fields of integrated circuits, semico...
Invention Lithographic apparatus controller system. A controller system is configured to control a plant a...
G/S Registered software, namely, recorded software for the storage, processing and generation of data...
G/S Software, especially software for the storage, processing and generation of data and graphics.
Invention Assembly for a lithographic apparatus. An assembly for a lithographic apparatus, wherein the ass...
Invention A supercontinuum radiation source and associated metrology devices. A supercontinuum radiation s...
Invention Active learning to improve wafer defect classification. Systems and methods for training a machi...
2022 Invention Resist under-layer for use in a lithographic apparatus. A substrate arrangement for use in a lit...
Invention Method for controlling a production system and method for thermally controlling at least part of ...
Invention Systems and methods for generating multiple illumination spots from a single illumination source....
Invention Optical apparatus. An optical apparatus for a reticle stage of a lithographic apparatus is discl...
Invention A framework for condition tuning and image processing for metrology applications. A method for p...
Invention Method and system of defect detection for inspection sample based on machine learning model. Sys...
G/S Software, especially software for the storage, processing and generation of data and graphics.
G/S Micro-lithography apparatus and instruments for use in the electronics, micro-lithography, semi-c...
Invention Image enhancement in charged particle inspection. An improved systems and methods for generating...
2021 G/S Recorded software, in particular software for the storage, processing, and generation of data and...
2020 G/S Maintenance and repair services in connection with machines for use in microlithography and in th...
G/S Maintenance and repair services in connection with machines for use in the electronics, micro-lit...
G/S Maintenance and repair services in connection with machines for use in the electronics, micro-li...
2018 G/S Computer hardware and software for the design and manufacture of semiconductor wafers and masks; ...
G/S Computer hardware and software for the design and manufacture of semiconductor wafers and masks;...
2017 G/S Semiconductor lithographic machines, namely, lithographic machines used to manufacture semiconduc...
G/S Computer hardware for improving lithography manufacturing processes; computer software for impro...
G/S Maintenance and repair services in connection with machines, apparatus and instruments for use in...
2016 G/S Micro-lithography equipment; machines for use in the manufacture by micro-lithography, especially...
2015 G/S Exposure units being optical instruments and their parts, for use in lithographic machines, namel...
G/S Exposure units [optical instruments] and their parts, for use in lithographic machines.
Invention Membranes for use within a lithographic apparatus and a lithographic apparatus comprising such a ...
G/S Machine tool for mounting, demounting and remounting a pellicle to a reticle in lithographic equ...
G/S Electronic inspection devices, data processors, computer hardware and software for defect inspect...
G/S [ Electronic inspection devices and ] computer software for inspection of semiconductor materials...
2014 G/S Process control equipment for semiconductor wafer production, namely particle beam emitter in the...
G/S Optical measuring apparatus and instruments for measuring test wafers for the manufacture of elec...
G/S Optical measuring apparatus and instruments for measuring test wafers for the manufacture of ele...
2013 G/S Electronic imaging platforms in the field of inspection of semiconductor materials, namely, semic...
G/S Technology supervision and inspection in the field of quality control of semiconductor wafers and...
2012 G/S Machinery maintenance and repair in the field of semiconductor industry; installation of semicond...
G/S testing and inspection in the field of quality control of semiconductor wafers and reticles
G/S Micro-lithography machines, namely, machines for manufacturing electronic components, integrated ...
G/S Micro-lithography machines; machines for use in the electronics, integrated circuit, semi-conduc...
G/S [ Cutting, polishing and heat treatment and coating of glass and other optical surfaces, namely, ...