- All sections
- G - Physics
- G21K - Techniques for handling particles or ionising radiation not otherwise provided forirradiation devicesgamma ray or x-ray microscopes
- G21K 7/00 - Gamma ray or X-ray microscopes
Patent holdings for IPC class G21K 7/00
Total number of patents in this class: 320
10-year publication summary
|
12
|
17
|
15
|
10
|
13
|
9
|
11
|
11
|
8
|
4
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Tech Corporation | 5351 |
52 |
| FEI Company | 949 |
24 |
| Carl Zeiss X-Ray Microscopy, Inc. | 108 |
19 |
| California Institute of Technology | 3981 |
13 |
| Shenzhen Xpectvision Technology Co., Ltd. | 375 |
9 |
| ASML Netherlands B.V. | 7418 |
8 |
| Carl Zeiss SMT GmbH | 3011 |
7 |
| Canon Anelva Corporation | 685 |
6 |
| KLA-Tencor Technologies Corporation | 188 |
6 |
| Applied Materials Israel, Ltd. | 614 |
5 |
| Bruker Nano, Inc. | 343 |
5 |
| ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH | 158 |
5 |
| JEOL Ltd. | 590 |
5 |
| Lawrence Livermore National Security, LLC | 1942 |
4 |
| National Institute of Advanced Industrial Science and Technology | 3792 |
4 |
| Ebara Corporation | 2176 |
4 |
| Hologic, Inc. | 1127 |
4 |
| Osaka University | 3384 |
4 |
| Canon Kabushiki Kaisha | 7066 |
4 |
| Hermes Microvision Incorporated B.V. | 124 |
4 |
| Other owners | 128 |