- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/27 - Testing of devices without physical removal from the circuit of which they form part, e.g. compensating for effects due to surrounding elements
Patent holdings for IPC class G01R 31/27
Total number of patents in this class: 234
10-year publication summary
|
13
|
20
|
17
|
25
|
31
|
21
|
24
|
21
|
31
|
10
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Samsung Electronics Co., Ltd. | 143021 |
10 |
| Intel Corporation | 46631 |
9 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 41799 |
9 |
| Tokyo Electron Limited | 12420 |
9 |
| Mitsubishi Electric Corporation | 45583 |
8 |
| Infineon Technologies AG | 8179 |
6 |
| Delphi Technologies IP Limited | 331 |
6 |
| Siemens AG | 24542 |
5 |
| Rohm Co., Ltd. | 6411 |
5 |
| ABB Schweiz AG | 6851 |
4 |
| STMicroelectronics (Crolles 2) SAS | 647 |
4 |
| International Business Machines Corporation | 60753 |
3 |
| Renesas Electronics Corporation | 6093 |
3 |
| Robert Bosch GmbH | 42296 |
3 |
| Dialight Corporation | 229 |
3 |
| STMicroelectronics International N.V. | 3018 |
3 |
| Teradyne, Inc. | 545 |
3 |
| Advantest Test Solutions, Inc. | 41 |
3 |
| Adeia Semiconductor Bonding Technologies Inc. | 314 |
3 |
| Micron Technology, Inc. | 26152 |
2 |
| Other owners | 133 |