Tokyo Electron Limited

Japon


 
Quantité totale PI 12 645
Quantité totale incluant filiales 12 719 (+ 138 pour les filiales)
Rang # Quantité totale PI 72
Note d'activité PI 4,5/5.0    8 365
Rang # Activité PI 58
Activité incl filiales 4,3/5.0    8 367
Symbole boursier
ISIN JP3571400005
Capitalisation 8668609632540.0  (JPY)
Industrie Semiconductor Equipment & Materials
Secteur Technology
Classe Nice dominante Machines et machines-outils

Brevets

Marques

7 943 93
0 2
4 509 92
6
 
Dernier brevet 2025 - Substrate processing method and ...
Premier brevet 1978 - Magnetron sputtering target and ...
Dernière marque 2025 - TEL SERVICE ADVANTAGE
Première marque 1989 - TEL

Filiales

6 subsidiaries with IP (136 patents, 2 trademarks)

2 subsidiaries without IP

 S'inscrire grtuitement pour accéder à la liste des filiales

Industrie (Classification de Nice)

Derniers inventions, produits et services

2025 P/S Installation, maintenance and repair of semiconductor manufacturing machines; installation, main...
Invention Film formation method and substrate processing apparatus. A film formation method of forming, in...
Invention Plasma treatment device and etching method. A plasma processing apparatus is provided. The appar...
Invention Plasma treatment device and plasma treatment method. A plasma processing apparatus, comprising: ...
Invention Stage and substrate processing apparatus. A stage includes a first member made of a material hav...
Invention Substrate treatment system. A substrate processing system comprising: a plasma processing appara...
Invention Substrate processing method and substrate processing system. A substrate processing method inclu...
Invention Substrate processing method and substrate processing apparatus. A substrate processing method fo...
Invention Plasma processing apparatus and power supply system. A technique for improving controllability o...
Invention Cooling device, substrate processing apparatus, and cooling method. A cooling device that cools ...
Invention Substrate evaluation method and substrate processing apparatus. A substrate evaluation method in...
Invention Film deposition apparatus for fine pattern forming. In a mask pattern forming method, a resist f...
Invention Film forming method and film forming apparatus. A film forming method includes: preparing a subs...
Invention Plasma processing apparatus and plasma processing method. A plasma processing apparatus is discl...
Invention Plasma processing apparatus. A plasma processing apparatus includes: a plasma process chamber; a...
2024 Invention Substrate processing apparatus, substrate processing method, and filter. A substrate processing ...
Invention Substrate-processing apparatus and substrate-processing method. A substrate-processing apparatus...
Invention Gas box and semiconductor manufacturing apparatus. A gas box includes: a first housing having a ...
Invention Materials and methods for forming patterned mask on substrate. A method includes depositing an o...
Invention Anti-spacer masking process using resist layer with solubility shifting agent. A method for formi...
Invention Anti-spacer masking process using resist layer with solubility shifting agent. A method for form...
Invention Materials and methods for forming patterned mask on substrate. A method includes forming mandrel...
Invention Masking process using switchable polymer. A method for forming a patterned mask can include prov...
Invention Anti-spacer masking process using second switchable polymer. A method for forming a patterned ma...
Invention Detection method, substrate processing system, and control program. Provided is a detection metho...
Invention Substrate processing device and substrate processing method. A substrate processing device that p...
Invention Substrate processing device and electrostatic chuck. This electrostatic chuck comprises a chuck m...
Invention Plasma processing device, prediction method, prediction program, and information processing devic...
Invention Substrate processing device and substrate temperature control method. An acquisition unit accordi...
Invention Substrate processing system and substrate processing method. The present disclosure provides a me...
Invention Processing liquid supply device and processing liquid supply method. The present disclosure expla...
P/S Semiconductor manufacturing machines and their component parts and fittings
P/S Semiconductor manufacturing machines and their component parts and fittings; flat panel display ...
Invention Processing system and processing method. A processing system for mounting a plurality of types of...
Invention Etching method and substrate processing apparatus. The present invention provides a technique for...
Invention Correcting of design and mask shape position due to die and wafer distortion for bonding. Aspects...
P/S Semiconductor manufacturing machines and their component parts and fittings; flat panel display m...
Invention Plasma processing device. The present invention provides a plasma processing device in which wear...
P/S Downloadable computer software for controlling semiconductor manufacturing processes; downloadabl...
P/S Downloadable computer software for controlling semiconductor manufacturing processes; downloadab...
Invention Integrated optical nanothermometry for real-time wafer temperature monitoring during processing. ...
Invention Selective deposition on metal-containing mask using promoter. A method of selective deposition o...
Invention Methods for protecting a peripheral edge and backside of a semiconductor substrate. Various embo...
Invention Method and system for plasma process. A method for generating a bias voltage includes generating...
Invention Method and system for plasma process. A method for plasma processing includes providing a tailor...
Invention Substrate support with printed heater. A substrate support includes a top plate including a diel...
Invention Correcting of design and mask shape position due to die and wafer distortion for bonding. Aspect...
Invention Fault detection and classification (fdc) for endpoint detection (epd) by reflectometry. A method...
2023 P/S Machines and instruments used for measuring and testing semiconductor manufacturing machines, nam...
P/S Machines and instruments used for measuring and testing semiconductor manufacturing machines; co...
Invention Device for storing liquid, system for processing substrate, and method for identifying liquid lev...
Invention Inspection apparatus. There is provided an inspection apparatus for inspecting a device to be in...
Invention Filling method and substrate processing system. A filling method of filling a film containing a ...
Invention Monitoring substrate and monitoring method. A monitoring substrate for monitoring the inside of ...
2022 P/S Semiconductor manufacturing machines and their component parts and fittings.
2021 Invention Substrate treatment system and substrate treatment method. A substrate treatment system connecte...
P/S Semiconductor manufacturing machines and their component parts and fittings; machines for mainten...
P/S Semiconductor manufacturing machines and their component parts and fittings; machines for mainte...
2020 P/S Semiconductor manufacturing machines and their structural parts; flat panel display manufacturing...