- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 15/00 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons
Patent holdings for IPC class G01B 15/00
Total number of patents in this class: 528
10-year publication summary
|
37
|
50
|
35
|
50
|
41
|
32
|
18
|
17
|
40
|
20
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Hitachi High-Technologies Corporation | 2004 |
84 |
| Hitachi High-Tech Corporation | 5275 |
46 |
| KLA-Tencor Corporation | 2545 |
14 |
| Advantest Corporation | 1830 |
9 |
| Precision Planting LLC | 1111 |
9 |
| Samsung Electronics Co., Ltd. | 145025 |
8 |
| Applied Materials Israel, Ltd. | 608 |
8 |
| The Boeing Company | 20031 |
7 |
| ASML Netherlands B.V. | 7355 |
7 |
| May Patents Ltd. | 140 |
7 |
| KLA Corporation | 1526 |
7 |
| Siemens AG | 24525 |
6 |
| Tsinghua University | 5886 |
6 |
| Nuctech Company Limited | 1417 |
6 |
| Applied Materials, Inc. | 18501 |
5 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 42389 |
5 |
| Arcam AB | 202 |
5 |
| NEC Corporation | 35509 |
4 |
| Robert Bosch GmbH | 42614 |
4 |
| Shimadzu Corporation | 6151 |
4 |
| Other owners | 277 |