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2024
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Invention
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Electrically conductive pin and method for manufacturing electrically conductive pin. The present... |
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Invention
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Test probe and method of manufacturing the same. Disclosed is a test probe. The test probe includ... |
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Invention
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Test probe and test device. Disclosed is a test probe for testing the electrical characteristics ... |
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Invention
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Test probe and method of manufacturing the same. Disclosed is a test probe for testing electrical... |
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Invention
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Test probe and method of manufacturing the same. Disclosed is a method of manufacturing a test pr... |
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Invention
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Method for manufacturing contact tip and electroconductive pin having contact tip.
Proposed are ... |
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Invention
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Test probe and method of fabricating the same. Disclosed is a method of fabricating a test probe ... |
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Invention
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Test probe and test device. Disclosed is a test probe. The test probe includes a barrel including... |
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Invention
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Test device. Disclosed is a test device for testing characteristics of a subject-to-be-tested wit... |
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Invention
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Test socket and method for fabricating the same.
The disclosure relates to a test socket and a m... |
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Invention
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Method for manufacturing contact tip, and electrically conductive pin including contact tip. Prov... |
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Invention
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Test probe. Disclosed is a test probe for testing the electrical characteristics of a subject-to-... |
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2023
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Invention
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Test probe. Disclosed is a test probe for testing electrical characteristics of a subject-to-be-t... |
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Invention
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Test socket. Disclosed is a test socket for transmitting a test signal between a first terminal o... |
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Invention
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Test probe. Disclosed is a test probe. The test probe includes: a barrel including a tubular barr... |
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Invention
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Method of fabricating test probe. Disclosed is a method of fabricating a test probe including a t... |
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Invention
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Test probe and test device. Disclosed is a test probe. The test probe includes: a barrel includin... |
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2022
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Invention
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Probe contact. Disclosed is a probe contact for electrical connection between a first terminal an... |
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Invention
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Test device. A test device for a high-speed/high-frequency test. The test device includes: a cond... |
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2021
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Invention
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Test socket and method of manufacturing the same.
Disclosed is a test socket. The test socket in... |
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Invention
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Test socket and method of manufacturing the same. Disclosed is a test socket. The test socket inc... |
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Invention
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Test device. Disclosed is a test device for testing electrical characteristics of an object-to-be... |
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Invention
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Test socket and method of fabricating the same. A test socket includes a socket block of an insul... |
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Invention
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Test socket and method of fabricating the same. Disclosed is a test socket supporting a probe. Th... |
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Invention
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Test socket. Disclosed is a test socket. The test socket includes a first block comprising a firs... |
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Invention
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Method for fabricating test socket. The disclosure relates to a method of fabricating a test sock... |
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Invention
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Test socket and method for fabricating the same.
The disclosure relates to a method of fabricati... |
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Invention
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Test socket and method for fabricating the same. The disclosure relates to a method of fabricatin... |
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2020
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Invention
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Test probe, method of manufacturing the same, and test socket supporting the same. Disclosed is a... |
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Invention
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Test device. Disclosed is a test device for testing electric characteristics of an object-to-be-t... |
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Invention
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Contact and test socket using same. Disclosed is a contact for electrically connecting a first co... |
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Invention
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Probe cleaner. Disclosed is a probe cleaner for cleaning and decontaminating a probe. The probe c... |
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Invention
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Test device. Disclosed is a test device for testing an electric characteristic of an object to be... |
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Invention
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Test probe assembly and test socket. A test probe assembly includes: a conductive pipe; a probe i... |
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Invention
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Test device. Disclosed is a test device for testing electric characteristics of an object to be t... |
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2019
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Invention
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Probe socket. A probe socket for inspecting electric characteristics of an object to be tested. T... |
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Invention
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Test device. Disclosed is a test device for testing a high-frequency and high-speed semiconductor... |
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Invention
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Testing device. Disclosed is a testing device. The testing device includes a testing socket confi... |
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2018
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Invention
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Test device. Disclosed is a test device for a high-speed/high-frequency test. The test device inc... |
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P/S
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Sockets for testing semiconductors; probes for testing semiconductors; probe cards for testing se... |
