The present invention provides: a method for manufacturing an electrically conductive pin provided in an inspection apparatus for inspecting electrical characteristics of an object to be inspected, the method comprising a preparation step of preparing a tubular member with a hollow hole formed from one end up to at least a partial length thereof, a deformation step of narrowing the hollow hole corresponding to one end area of the tubular member, thereby forming a deformation part, and a first contact part formation step of processing the deformation part so as to form a first contact part in contact with the object to be inspected, and thus processing time and manufacturing costs can be reduced; and the electrically conductive pin having improved durability with a reduced number of constituent parts.
Provided are a method for manufacturing a contact tip, and an electrically conductive pin including contact tips and tip parts of various shapes, the method comprising: a preparation step for preparing a contact member to be machined in order to form a contact tip and a tip part in various shapes for inspecting the electrical characteristics of an object under inspection; a tip part formation step for forming a tip part by cutting one surface in the lengthwise direction of the contact member; a flat part formation step for forming a flat surface, to which the tip part is connected, by cutting the one surface; and a contact tip formation step for forming the exterior of a contact tip by machining the side surface of the contact member.
Proposed are a method for manufacturing a contact tip that can form a contact tip and an end portion into various shapes, and an electroconductive pin having a contact tip and an end portion of various shapes. A contact tip of various shapes can be provided by manufacturing a contact tip through processing, and adjusting the height of an end portion, the slope of the end portion, and the interval between end portions. In addition, an electroconductive pin of various shapes can be provided by forming a contact tip into various shapes through processing.
H01R 11/18 - Pièces d'extrémité se terminant par une sonde
H01R 43/16 - Appareils ou procédés spécialement adaptés à la fabrication, l'assemblage, l'entretien ou la réparation de connecteurs de lignes ou de collecteurs de courant ou pour relier les conducteurs électriques pour la fabrication des pièces de contact, p. ex. par découpage et pliage
Disclosed is a test probe. The test probe includes a barrel shaped like a barrel; and a terminal including a terminal body portion partially inserted in a first end of the barrel, and a contact portion extending integrally from the terminal body portion to come into contact with a bump terminal of a subject-to-be-tested. The contact portion includes: a tip supporting portion including a supporting main body provided on the terminal body portion and a tip base protruding from a first end of the supporting main body in a horn shape; and a tip portion plated on an outer surface of the tip base and an upper surface of the supporting main body surrounding a lower end of the tip base, with a material having a higher hardness than the tip supporting portion, and formed more thickly on an upper portion of the tip base than a lower portion.
Disclosed is a test probe. The test probe includes a barrel shaped like a barrel; and a terminal including a terminal body portion partially inserted in a first end of the barrel, and a contact portion extending integrally from the terminal body portion to come into contact with a bump terminal of a subject-to-be-tested. The contact portion includes: a tip supporting portion including a supporting main body provided on the terminal body portion and a tip base protruding from a first end of the supporting main body in a horn shape; and a tip portion plated on an outer surface of the tip base with a material having a higher hardness than the tip supporting portion and formed more thickly on an upper portion of the tip base than a lower portion.
Disclosed is a test probe for testing the electrical characteristics of a subject-to-be-tested. The test probe may include a pin unit; and a terminal unit connected to the pin unit along a longitudinal direction. One of the pin unit and the terminal unit may include an engagement extending portion extending along the longitudinal direction and including a locking portion recessed in a radial direction. The other one of the pin unit and the terminal unit may include an engagement accommodating portion that includes a skirt portion formed by a plurality of slits extending along the longitudinal direction to be elastically transformable in the radial direction, and an engagement portion formed in the skirt portion and engaging with the locking portion to prevent the engagement extending portion from separating in the longitudinal direction, and accommodates the engagement extending portion along the longitudinal direction.
Disclosed is a test probe for testing the electrical characteristics of a subject-to-be-tested. The test probe includes a pin unit; and a terminal unit connected to the pin unit along a longitudinal direction. One of the pin unit and the terminal unit includes an engagement extending portion extending along the longitudinal direction, and including a plurality of cutting portions formed along the longitudinal direction to be elastically transformable in a radial direction, and a locking portion recessed in the radial direction. The other one of the pin unit and the terminal unit includes an engagement accommodating portion including an engagement portion engaging with the locking portion to prevent the engagement extending portion from separating in the longitudinal direction, and accommodating the engagement extending portion along the longitudinal direction.
Disclosed is a test probe for testing electrical characteristics of a subject-to-be-tested. The test probe includes: a barrel; and a terminal including at least one tip portion to come into contact with the subject-to-be-tested, and a terminal body portion inserted in the barrel and supporting the at least one tip portion. The at least one tip portion includes a supporting surface extending in a radial direction of the terminal body portion to face an end portion surface of the barrel in an axial direction, an inclined surface sloping inward in the radial direction along the axial direction from an outer edge of the supporting surface, and a plurality of supporting portions arranged at predetermined intervals along a circumferential direction around an axis of the barrel.
Disclosed is a method of manufacturing a test probe. The method includes: forming a terminal body portion by stacking a lower dry film on a substrate and filling a predetermined material into a molding groove of the lower dry film; forming a tip portion by stacking an upper dry film on the lower dry film and filling a predetermined material in a molding groove of the upper dry film; forming at least one tip by machining an upper portion of the tip portion; and removing the upper dry film and the lower dry film from the tip portion formed with the tip and the terminal body portion.
Disclosed is a method of manufacturing a test probe. The method includes: forming a terminal body portion by stacking a lower dry film on a substrate and filling a predetermined material into a molding groove of the lower dry film; forming a lower tip portion by stacking an intermediate dry film on the lower dry film and filling a predetermined material in a molding groove of the intermediate dry film; and forming an upper tip portion by stacking an upper dry film on a top of the intermediate dry film, forming a molding groove of the upper dry film, which is narrower than the molding groove of the intermediate dry film in a direction transverse to a stacking direction, and filling a predetermined material in the molding groove of the upper dry film.
Disclosed is a method of fabricating a test probe including a tubular barrel and a plunger slidably and partially inserted in the barrel. The method includes: forming a diameter-reducing portion at one end portion of the barrel; machining a fore-end inner surface of the diameter-reducing portion by cylindrical cutting in an axial-line direction of the barrel; and forming a plurality of slits at least in the diameter-reducing portion along the axial-line direction.
Disclosed is a test device for testing characteristics of a subject-to-be-tested with a built-in antenna that emits a wireless signal. The test device includes: a signal probe including one end portion to be in contact with a first terminal of the subject-to-be-tested to transmit a test signal; a ground probe to be in contact with a second terminal of the subject-to-be-tested; and a socket block including a probe supporter to support the signal probe and the ground probe, and a waveguide corresponding to the antenna of the subject-to-be-tested and penetrating therethrough in a lengthwise direction of the signal probe to measure the wireless signal in a different area from the probe supporter.
Disclosed is a test probe. The test probe includes a barrel including a tubular barrel main body, and a plurality of skirt portions separated from each other by a plurality of slits formed in a first end portion of the barrel main body in a lengthwise direction; and a plunger including a sliding portion accommodated in the barrel main body and sliding along the lengthwise direction of the barrel, and a terminal contact portion extending from the sliding portion along the lengthwise direction and exposed beyond the skirt portion. The skirt portion includes a skirt main body extending in the lengthwise direction of the barrel main body, and a skirt diameter-reducing portion curved reducing a diameter thereof in a fore-end area of the skirt main body in the lengthwise direction of the barrel and including a facing end portion to face a surface of the terminal contact portion. The sliding portion includes a small diameter portion positioned in the skirt main body and having a first diameter, and a large diameter portion positioned in the barrel main body and having a second diameter larger than the first diameter.
Disclosed is a test probe. The test probe includes a barrel including a tubular barrel main body, and a plurality of skirt portions separated from each other by a plurality of slits formed in a first end portion of the barrel main body in a lengthwise direction; and a plunger including a sliding portion accommodated in the barrel main body and sliding along the lengthwise direction of the barrel, and a terminal contact portion extending from the sliding portion beyond the skirt portion along the lengthwise direction. The skirt portion includes a skirt main body extending in the lengthwise direction of the barrel main body, and a skirt diameter-reducing portion curved reducing a diameter thereof in a fore-end area of the skirt main body in an axial-line direction of the barrel and including a facing end portion to face a surface of the terminal contact portion. The facing length of the facing end portion in the axial-line direction is greater than the thickness of the skirt diameter-reducing portion.
The disclosure relates to a test socket and a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a probe hole for accommodating the probe in a base member made of a conductive material, filling the probe hole with a resin as an insulating material to a predetermined depth from an upper surface of the base member to form a probe support member; and forming a first support hole for supporting one end portion of the probe in the probe support member in the probe hole to expose the one end portion of the probe.
Disclosed is a test probe for testing the electrical characteristics of a subject-to-be-tested. The test probe includes a barrel shaped like a cylinder; and a plunger having an inner end portion and a side portion provided inside the barrel. The side portion extends toward an inner end portion with a predetermined curvature in a direction perpendicular to a longitudinal central axis of the barrel.
Disclosed is a test probe. The test probe includes: a barrel including a tubular barrel main body, and a plurality of skirt portions formed in a first end portion of the barrel main body, spaced apart from each other by lengthwise slits, and decreased in diameter along a direction from the barrel main body to a fore-end; and a plunger including a sliding portion accommodated in the barrel main body, and a terminal contact portion extending from the sliding portion, exposed through the skirt portion, including an outer diameter surface to come into elastic contact with a fore-end area of the skirt portion, and decreased in diameter in at least a partial section in a direction toward the sliding portion.
G01R 27/02 - Mesure de résistances, de réactances, d'impédances réelles ou complexes, ou autres caractéristiques bipolaires qui en dérivent, p. ex. constante de temps
G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
Disclosed is a method of fabricating a test probe including a tubular barrel and a plunger partially and slidably inserted in the barrel. The method includes: forming a plurality of skirt portions formed in a first end portion of the barrel, spaced apart from each other by lengthwise slits, and including a sectional contact surface formed on an inner diameter surface of a fore-end area and extending throughout a predetermined length section; and decreasing the plurality of skirt portions in diameter having a partially conical shape so that the sectional contact surface can be in contact with an outer diameter surface of the plunger.
G01R 3/00 - Appareils ou procédés spécialement adaptés à la fabrication des appareils de mesure
G01R 27/02 - Mesure de résistances, de réactances, d'impédances réelles ou complexes, ou autres caractéristiques bipolaires qui en dérivent, p. ex. constante de temps
G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
Disclosed is a test probe for testing electrical characteristics of a subject-to-be-tested. The test probe includes: a cylindrical barrel comprising main securing protrusions that protrude inward and face each other; and a terminal including: a contact portion that comes into contact with the subject-to-be-tested, a securing portion that has a polygonal cross-section, extends integrally from the contact portion, and is inserted in a first end portion of the barrel, and an engaging portion that protrudes from a first surface of the polygonal cross-section toward the main securing protrusion, extends in a lengthwise direction of the securing portion, and includes a main securing groove recessed to insert the main securing protrusion therein.
Disclosed is a test socket for transmitting a test signal between a first terminal of a subject-to-be-tested and a second terminal of a test circuit board. The test socket includes: at least one signal probe including a first end portion that comes into contact with the first terminal of the subject-to-be-tested, and a second end portion that comes into contact with the second terminal of the test circuit board; and a probe supporting block made of a conductive material, including a bottom to be seated on the test circuit board, contactlessly supporting the at least one signal probe, and including a tunnel recessed from the bottom along a signal line through which the test signal is transmitted to the second terminal of the test circuit board.
Disclosed is a test probe. The test probe includes: a barrel including a tubular barrel main body, and a plurality of skirt portions formed in a first end portion of the barrel main body and spaced apart from each other by lengthwise slits; and a plunger including a sliding portion accommodated in the barrel main body, and a terminal contact portion extending from the sliding portion and exposed through the skirt portion to come into elastic contact with the skirt portion. The skirt portion includes a skirt main body formed to be decreased in diameter having a partially conical shape along a direction from the barrel main body to a fore-end, and a skirt fore-end portion provided in a fore-end area of the skirt main body. The skirt fore-end portion includes a sectional contact surface formed on an inner diameter surface thereof, with which an outer diameter surface of the terminal contact portion is in contact throughout a predetermined length section.
G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
G01R 27/02 - Mesure de résistances, de réactances, d'impédances réelles ou complexes, ou autres caractéristiques bipolaires qui en dérivent, p. ex. constante de temps
The disclosure relates to a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a coupling block by joining an insulating member of an insulating material to one surface of a base member of a conductive material, forming a probe accommodating hole for accommodating the probe in the coupling block and a first support hole for supporting one end portion of the probe, forming a second support hole in a cover member of an insulating material for supporting the other end portion of the probe, inserting the probe into the probe accommodating hole so that the one end portion of the probe is supported by the first support hole, and joining the cover member to the other surface of the base member so that the other end portion of the probe is supported by the second support hole.
Disclosed is a test socket. The test socket includes a base frame shaped like a plate having a plurality of probe holes and conductive probes accommodated in the plurality of probe holes, having terminal portions protruding from both sides of the base frame, and comprising elastic material having higher elastic deformation than the base frame and conductive particles distributed in the elastic material.
Disclosed is a test socket. The test socket includes a first block comprising a first base member of a conductive material and a first insulating member of an insulating material, a second block comprising a second base member of a conductive material and a second insulating member of an insulating material, a gap member of an insulating material, interposed between the first block and the second block, a first probe supported being in contact with the first base member and being not in contact with the second base member, a second probe supported being not in contact with the first base member and being in contact with the second base member, and electronic parts provided in the gap member and placed on a conductive path by which the first base member and the second base member are electrically connected.
The disclosure relates to a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a probe hole for accommodating the probe in a base member made of a conductive material, filling the probe hole with a resin as an insulating material to a predetermined depth from an upper surface of the base member to form a probe support member; and forming a first support hole for supporting one end portion of the probe in the probe support member in the probe hole to expose the one end portion of the probe.
The disclosure relates to a method of fabricating a test socket including forming a plate-shaped first coupling block by joining a first base member made of a conductive material and a first insulating member made of an insulating material; forming a plate-shaped second coupling block by joining a second base member made of the conductive material and a second insulating member made of the insulating material; forming a first barrel accommodating hole for accommodating a part of the probe and a first support hole for supporting one end portion of the probe in the first coupling block; forming a second barrel accommodating hole for accommodating the rest of the probe and a first support hole for supporting the other end portion of the probe in the second coupling block; inserting one end of the probe into the first barrel accommodating hole to be supported on the first support hole, and inserting the other end of the probe into the second barrel accommodating hole to be supported on the second support hole; and joining the first coupling block and the second coupling block.
G01R 3/00 - Appareils ou procédés spécialement adaptés à la fabrication des appareils de mesure
B29C 43/18 - Moulage par pressage, c.-à-d. en appliquant une pression externe pour faire couler la matière à moulerAppareils à cet effet pour la fabrication d'objets de longueur définie, c.-à-d. d'objets séparés en incorporant des parties ou des couches préformées, p. ex. moulage par pressage autour d'inserts ou sur des objets à recouvrir
B29C 43/20 - Fabrication d'objets multicouches ou polychromes
G01R 1/04 - BoîtiersOrganes de supportAgencements des bornes
A test socket includes a socket block of an insulating material, provided with a probe hole to accommodate the probe, and a coating portion comprising an external film of a conductive material coated on an outer surface of the socket block, and an internal film of a conductive material coated on an inner surface of the probe hole, at least a portion of the internal film being electrically isolated from the external film.
Disclosed is a probe contact for electrical connection between a first terminal and a second terminal. The probe contact includes a stationary plunger which comprises a first main body having a first end to come into contact with the first terminal, and a first protrusion protruding transversely to a longitudinal direction of the first main body, a plurality of movable plungers which comprises a second main body having a first end to come into contact with the second terminal and a second end being in electric contact with the stationary plunger, and a second protrusion protruding transversely to a longitudinal direction of the second main body, and are disposed to relatively slide independently of each other in the longitudinal direction and a spring which is provided between the first protrusion and the second protrusion.
Disclosed is a test socket. The test socket includes a base frame shaped like a plate having a plurality of probe holes and conductive probes accommodated in the plurality of probe holes, having terminal portions protruding from both sides of the base frame, and comprising elastic material having higher elastic deformation than the base frame and conductive particles distributed in the elastic material.
Disclosed is a test device for testing electrical characteristics of an object-to-be-tested. The test device includes a test socket comprising a probe configured to transmit a test signal to the object-to-be-tested, a pusher body coupled to the test socket, a pusher unit supported on the pusher body and pressing and releasing the object-to-be-tested and a heat shield cover to perform shielding the pusher unit exposed to a top of the pusher body and releasing the shielding.
A test device for a high-speed/high-frequency test. The test device includes: a conductive block which includes a probe hole; at least one signal probe which is supported in an inner wall of the probe hole without contact, includes a first end to be in contact with a testing contact point of the object to be tested, and is retractable in a lengthwise direction; and a coaxial cable which includes a core wire to be in electric contact with a second end of the signal probe. With this test device, the coaxial cable is in direct contact with the signal probe, thereby fully blocking out noise in a test circuit board.
Disclosed is a test device for testing an electric characteristic of an object to be tested. The test device includes a block comprising a probe hole, a probe supported in the probe hole and retractably configured to connect a first contact point and a second contact point, and a coaxial cable comprising an insulated sheath, a main core surrounded with the insulated sheath, and a probe contact portion exposed from the insulated sheath and extended from the main core so as to be in contact with the probe. An axis of the probe is spaced apart from an axis of the coaxial cable, and the probe contact portion is extended from the main core toward the axis of the probe.
G01R 31/26 - Test de dispositifs individuels à semi-conducteurs
G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
H01L 21/66 - Test ou mesure durant la fabrication ou le traitement
H01L 23/58 - Dispositions électriques structurelles non prévues ailleurs pour dispositifs semi-conducteurs
H01L 29/10 - Corps semi-conducteurs caractérisés par les formes, les dimensions relatives, ou les dispositions des régions semi-conductrices avec des régions semi-conductrices connectées à une électrode ne transportant pas le courant à redresser, amplifier ou commuter, cette électrode faisant partie d'un dispositif à semi-conducteur qui comporte trois électrodes ou plus
Disclosed is a test socket supporting a probe. The test socket includes a socket block of an insulating material, provided with a probe hole to accommodate the probe, and a coating portion comprising an external film of a conductive material coated on an outer surface of the socket block, and an internal film of a conductive material coated on an inner surface of the probe hole, at least a portion of the internal film being electrically isolated from the external film.
Disclosed is a test socket. The test socket includes a first block comprising a first base member of a conductive material and a first insulating member of an insulating material, a second block comprising a second base member of a conductive material and a second insulating member of an insulating material, a gap member of an insulating material, interposed between the first block and the second block, a first probe supported being in contact with the first base member and being not in contact with the second base member, a second probe supported being not in contact with the first base member and being in contact with the second base member, and electronic parts provided in the gap member and placed on a conductive path by which the first base member and the second base member are electrically connected.
The disclosure relates to a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a probe hole for accommodating the probe in a base member made of a conductive material, filling the probe hole with a resin as an insulating material to a predetermined depth from an upper surface of the base member to form a probe support member; and forming a first support hole for supporting one end portion of the probe in the probe support member in the probe hole to expose the one end portion of the probe.
B29C 45/14 - Moulage par injection, c.-à-d. en forçant un volume déterminé de matière à mouler par une buse d'injection dans un moule ferméAppareils à cet effet en incorporant des parties ou des couches préformées, p. ex. moulage par injection autour d'inserts ou sur des objets à recouvrir
The disclosure relates to a method of fabricating a test socket that supports a probe stretchable in a longitudinal direction. The method of fabricating a test socket includes forming a coupling block by joining an insulating member of an insulating material to one surface of a base member of a conductive material, forming a probe accommodating hole for accommodating the probe in the coupling block and a first support hole for supporting one end portion of the probe, forming a second support hole in a cover member of an insulating material for supporting the other end portion of the probe, inserting the probe into the probe accommodating hole so that the one end portion of the probe is supported by the first support hole, and joining the cover member to the other surface of the base member so that the other end portion of the probe is supported by the second support hole.
G01R 3/00 - Appareils ou procédés spécialement adaptés à la fabrication des appareils de mesure
G01R 1/04 - BoîtiersOrganes de supportAgencements des bornes
G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
B29C 45/14 - Moulage par injection, c.-à-d. en forçant un volume déterminé de matière à mouler par une buse d'injection dans un moule ferméAppareils à cet effet en incorporant des parties ou des couches préformées, p. ex. moulage par injection autour d'inserts ou sur des objets à recouvrir
B29C 65/48 - Assemblage d'éléments préformésAppareils à cet effet en utilisant des adhésifs
B29C 65/02 - Assemblage d'éléments préformésAppareils à cet effet par chauffage, avec ou sans pressage
The disclosure relates to a method of fabricating a test socket including forming a plate-shaped first coupling block by joining a first base member made of a conductive material and a first insulating member made of an insulating material; forming a plate-shaped second coupling block by joining a second base member made of the conductive material and a second insulating member made of the insulating material; forming a first barrel accommodating hole for accommodating a part of the probe and a first support hole for supporting one end portion of the probe in the first coupling block; forming a second barrel accommodating hole for accommodating the rest of the probe and a first support hole for supporting the other end portion of the probe in the second coupling block; inserting one end of the probe into the first barrel accommodating hole to be supported on the first support hole, and inserting the other end of the probe into the second barrel accommodating hole to be supported on the second support hole; and joining the first coupling block and the second coupling block.
B29C 65/02 - Assemblage d'éléments préformésAppareils à cet effet par chauffage, avec ou sans pressage
B29C 51/14 - Façonnage par thermoformage, p. ex. façonnage de feuilles dans des moules en deux parties ou par emboutissage profondAppareils à cet effet de préformes ou de feuilles multicouches
B29C 43/18 - Moulage par pressage, c.-à-d. en appliquant une pression externe pour faire couler la matière à moulerAppareils à cet effet pour la fabrication d'objets de longueur définie, c.-à-d. d'objets séparés en incorporant des parties ou des couches préformées, p. ex. moulage par pressage autour d'inserts ou sur des objets à recouvrir
B29C 43/20 - Fabrication d'objets multicouches ou polychromes
Disclosed is a test device for testing a high-frequency and high-speed semiconductor. The test device includes a probe supporting block formed with a tube accommodating portion along a test direction; a conductive shield tube accommodated in the tube accommodating portion; and a probe accommodated and supported in the shield tube without contact, the tube accommodating portion including a conductive contact portion for transmitting a ground signal to the shield tube. When a high-frequency and high-speed semiconductor or the like subject is tested, the test device easily and inexpensively prevents crosstalk between the adjacent signal probes and improves impedance characteristic.
Disclosed is a test probe for testing a device to be tested. The test probe includes a line contact portion comprising a first contact line set and a second contact line set each comprising two contact lines linearly extending to be spaced apart from each other, wherein the first contact line set and the second contact line set are disposed in a V shape or U shape.
Disclosed is a test device for testing electric characteristics of an object-to-be-tested. The test device includes: a test socket including a probe configured to transmit a test signal to the object-to-be-tested; and a pusher unit configured to press the object-to-be-tested to move close to and away from the probe, the pusher unit including: a pressing procession configured to press the object-to-be-tested; a pusher base including the pressing projection on a first side thereof, and a plurality of heat-dissipation column insertion portions on a second side thereof; and a heat-dissipation column shaped like a bar and including one end portion to be inserted in the heat-dissipation column insertion portion, and a plurality of heat dissipation wings on an outer circumferential surface thereof.
Disclosed is a contact for electrically connecting a first contact point and a second contact point. The contact includes: a first contact part in contact with the first contact point; a second contact part in contact with the second contact point; and a vertical bar which connects a plurality of mutually continuous elastic units, which connect the first contact part and the second contact part along the axial direction, and other elastic units adjacent thereto. The contact comprises an elastic part having a pair of horizontal bars in which the elastic units are arranged spaced apart from each other at intervals in the axial direction, and a connection loop having a closed section for interconnecting both ends of the horizontal bars and a connection interval greater than the intervals in the axial direction.
Disclosed is a test device for testing an electric characteristic of an object to be tested. The test device includes a block comprising a probe hole, a probe supported in the probe hole and retractably configured to connect a first contact point and a second contact point, and a coaxial cable comprising an insulated sheath, a main core surrounded with the insulated sheath, and a probe contact portion exposed from the insulated sheath and extended from the main core so as to be in contact with the probe. An axis of the probe is spaced apart from an axis of the coaxial cable, and the probe contact portion is extended from the main core toward the axis of the probe.
Disclosed is a probe cleaner for cleaning and decontaminating a probe. The probe cleaner includes a main body including a cleaning surface facing toward a test socket in which probes are arranged; a cleaning member provided in the cleaning surface and configured to remove a foreign material at a tip of the probe; and a positioning guide configured to guide a cleaning position of the main body as being engaged with a corresponding shape portion of the test socket based on movement of the main body toward the test socket.
A test probe assembly includes: a conductive pipe; a probe inserted in the pipe without contacts and elastically retractable along a lengthwise direction; and an insulation probe supporting member configured to support the probe between an inner wall of the pipe and an outer surface of the probe. The test probe assembly of the present disclosure is improved in noise shield performance and convenient in repairing the probe since the probe is mounted to a probe socket as supported in a metal pipe without contacts.
A test device for a high-speed/high-frequency test. The test device includes: a conductive block which includes a probe hole; at least one signal probe which is supported in an inner wall of the probe hole without contact, includes a first end to be in contact with a testing contact point of the object to be tested, and is retractable in a lengthwise direction; and a coaxial cable which includes a core wire to be in electric contact with a second end of the signal probe. With this test device, the coaxial cable is in direct contact with the signal probe, thereby fully blocking out noise in a test circuit board.
Disclosed is a test device for testing electric characteristics of an object to be tested. The test device comprises a test circuit board comprising an insulating base substrate formed with a printed circuit, a plurality of signal contact points connected to the printed circuit and applying a test signal to the object to be tested, and a substrate shielding portion formed in a thickness direction of the base substrate between the plurality of signal contact points; and a test socket comprising a plurality of signal pins to be in contact with the plurality of signal contact points, and a conductive block supporting the plurality of signal pins without contact. With this, a secure noise shield is made between lines for applying a test signal when a high-frequency and high-seed semiconductor is subjected to the test, thereby improving reliability of the test.
A probe socket for inspecting electric characteristics of an object to be tested. The probe socket includes a plurality of power pins for applying power to the object to be tested, a plurality of ground pins arranged in parallel with the power pins, a support block for accommodating and supporting the plurality of power pins or ground pins in parallel, and a conductive plate arranged inside the support block in a direction transverse to lengthwise directions of the power pin and the ground pin and having at least one of a power connection pattern for electrically connecting the plurality of power pins in common and a ground connection pattern for electrically connecting the plurality of ground pins in common.
Disclosed is a test device for testing a high-frequency and high-speed semiconductor. The test device includes a probe supporting block formed with a tube accommodating portion along a test direction; a conductive shield tube accommodated in the tube accommodating portion; and a probe accommodated and supported in the shield tube without contact, the tube accommodating portion including a conductive contact portion for transmitting a ground signal to the shield tube. When a high-frequency and high-speed semiconductor or the like subject is tested, the test device easily and inexpensively prevents crosstalk between the adjacent signal probes and improves impedance characteristic.
Disclosed is a testing device. The testing device includes a testing socket configured to support a plurality of probes, a testing-circuit substrate which includes a contact point to contact the probe, a slider which makes the testing socket be coupled to and separated from the testing-circuit substrate, and a slider operator which includes a main body arranged on the testing socket, and a slider pressing portion up/down-movably supported on the main body and moving down from the main body toward the slider so that the slider can slide along a surface direction of the testing socket.
G01R 31/00 - Dispositions pour tester les propriétés électriquesDispositions pour la localisation des pannes électriquesDispositions pour tests électriques caractérisées par ce qui est testé, non prévues ailleurs
G01R 1/04 - BoîtiersOrganes de supportAgencements des bornes
Disclosed is a test device for a high-speed/high-frequency test. The test device includes: a conductive block which includes a probe hole; at least one signal probe which is supported in an inner wall of the probe hole without contact, includes a first end to be in contact with a testing contact point of the object to be tested, and is retractable in a lengthwise direction; and a coaxial cable which includes a core wire to be in electric contact with a second end of the signal probe. With this test device, the coaxial cable is in direct contact with the signal probe, thereby fully blocking out noise in a test circuit board.
Disclosed is a test probe assembly. The test probe assembly includes: a conductive pipe; a probe inserted in the pipe without contacts and elastically retractable along a lengthwise direction; and an insulation probe supporting member configured to support the probe between an inner wall of the pipe and an outer surface of the probe. The test probe assembly of the present disclosure is improved in noise shield performance and convenient in repairing the probe since the probe is mounted to a probe socket as supported in a metal pipe without contacts.
A microelectromechanical system (MEMS) probe for electric connection between a tested contact point of an object to be tested and a testing contact point of a test circuit. The MEMS probe includes: a first terminal contact portion; a second terminal contact portion movable close to and away from the first terminal contact portion; and an elastic connecting portion connecting the first terminal contact portion and the second terminal contact portion, elastically deformed by an approach of the second terminal contact portion and comprising a plurality of plating layers stacked in the elastic deformation direction. According to the present disclosure, the MEMS probe includes a plurality of plating layers stacked in the elastic deformation direction, thereby decreasing fatigue failure and improving durability.
H01R 43/16 - Appareils ou procédés spécialement adaptés à la fabrication, l'assemblage, l'entretien ou la réparation de connecteurs de lignes ou de collecteurs de courant ou pour relier les conducteurs électriques pour la fabrication des pièces de contact, p. ex. par découpage et pliage
G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
Disclosed is a test device for testing electric characteristics of an object to be tested. The test device comprises a test circuit board comprising an insulating base substrate formed with a printed circuit, a plurality of signal contact points connected to the printed circuit and applying a test signal to the object to be tested, and a substrate shielding portion formed in a thickness direction of the base substrate between the plurality of signal contact points; and a test socket comprising a plurality of signal pins to be in contact with the plurality of signal contact points, and a conductive block supporting the plurality of signal pins without contact. With this, a secure noise shield is made between lines for applying a test signal when a high-frequency and high-seed semiconductor is subjected to the test, thereby improving reliability of the test.
A test probe for testing electric characteristics of an object to be tested. The test probe includes: a first contact portion; a second contact portion movable close to or away from the first contact portion; and an elastic deformation portion connecting the first contact portion and the second contact portion and elastically deformed by compression in a probe axial line direction, wherein at least one of the first contact portion and the second contact portion comprises a plurality of split contact portions separated by a first slit formed along a lengthwise direction. According to the present disclosure, the plurality of split contact portions are configured to independently contact the tested contact point of the object to be tested, thereby not only enhancing contact reliability but also securing contact reliability by an alternative split contact portion even though one of the split contact portions is defective or damaged.
A test device for testing electric characteristics of an object to be tested. The test device includes: a first support member comprising a plurality of guide holes; a second support member comprising a plurality of terminal holes and arranged to be spaced apart from and in parallel with the first support member; a plurality of main contact probes; and a plurality of sub contact probes arranged to be adjacent to the main contact probes along a lengthwise direction. According to the present disclosure, contact reliability is improved by multi contact with the terminal of the test circuit board (interposer) and/or the object to be tested.
Disclosed is a test probe for testing electric characteristics of an object to be test. The test probe includes a barrel; a plunger including at least two divisional plungers which are in parallel and partially inserted facing with each other in the barrel and arranged to be movable independently of each other along a probe axial line; and an elastic body configured to provide elasticity so that the plunger can resiliently move along the probe axial line within the barrel. According to the present disclosure, the test probe is improved in contact and decreased in contact resistance, thereby enhancing test reliability.
A test socket assembly for electrically connecting a contact point to be tested in a test object and a contact point for testing in a testing circuit. The test socket assembly includes: a plurality of signal probes; a socket block including a bottom surface facing toward the testing circuit, a top surface facing toward the test object, a plurality of probe holes for accommodating the plurality of signal probes to be parallel with one another while opposite ends of the signal probes are exposed from the top surface and the bottom surface, and a recessed portion recessed from at least partial area of the top surface and the bottom surface excluding a circumferential area of the probe holes; and an elastic grounding member accommodated in the recessed portion and made of a conductive elastic material to come into contact with at least one of the test object and the testing circuit.
H01R 12/88 - Dispositifs de couplage raccordés avec une force d'insertion faible ou nulle moyens produisant une pression de contact, contacts activés après insertion des circuits imprimés ou des structures similaires agissant manuellement par rotation ou pivotement des pièces du boîtier du connecteur
H01R 13/24 - Contacts pour coopération par aboutage élastiquesContacts pour coopération par aboutage montés élastiquement
Disclosed is a probe socket for inspecting electric characteristics of an object to be tested. The probe socket includes a plurality of power pins for applying power to the object to be tested, a plurality of ground pins arranged in parallel with the power pins, a support block for accommodating and supporting the plurality of power pins or ground pins in parallel, and a conductive plate arranged inside the support block in a direction transverse to lengthwise directions of the power pin and the ground pin and having at least one of a power connection pattern for electrically connecting the plurality of power pins in common and a ground connection pattern for electrically connecting the plurality of ground pins in common.
A test socket unit for electrically connecting a test object and a test circuit device. The test socket unit includes: a plurality of support locking pins configured to be stationarily installed on the surface of the test substrate; a socket main body configured to support a plurality of probes for signal transmission; a floating plate configured to include a pin guide hole in which the support locking pin is inserted; an elastic member configured to be interposed in between the socket main body and the floating plate; and at least one locking member configured to include a locking portion engaged with the locking engaging portion and prevented from separating upward by the locking stopper.
Disclosed is a test probe for an object with a barrel-shaped contact terminal having a curved surface. The test probe includes a first contact member configured to comprise a contact portion having a pair of contact surfaces which are arranged in a form of 'V' and respectively contact the contact terminal to be tested at points spaced from each other, and an extended portion integrally extended from the contact portion backward in a lengthwise direction. Thus, the test probe can effectively contacts a partially curved barrel-shaped contact terminal of an object to be tested, such as a subminiature camera module for a smart phone.
The radio frequency (RF) probe socket is disclosed. The probe socket includes a conductive noise shielding body configured to accommodate the plurality of signal probes to be parallel with one another while exposing opposite ends thereof, and shield noise; upper and lower noise shielding walls configured to be extended from the noise shielding body to some areas between the exposed opposite ends of the plurality of signal probes; and upper and lower holding members configured to be arranged on top and bottom sides of the noise shielding body, support the exposed opposite ends of the plurality of signal probes, and comprise accommodating grooves accommodate the noise shielding walls, respectively. With this, the noise shielding wall extended from the shielding block makes a shield between the signal probe pins passing through the upper and lower holding member, thereby preventing crosstalk between the signal probe pins.
Disclosed is a test device which electrically connects a terminal of an object to be tested and a testing terminal of a testing circuit. The test device includes a signal probe; a ground probe; a conductive block configured to comprise a signal probe hole through which the signal probe pass without electric contact, and a ground probe hole through which the ground probe pass with electric contact; and an insulating housing configured to accommodate the conductive block and support opposite ends of the signal probe. Thus, it is possible to effectively shield noise between the signal probe and a signal terminal.
Disclosed is a probe for testing an electric characteristic of an object to be tested. The probe includes a core with conductive properties and shaped like a bar; and an elastic plating layer made of a material having higher elasticity than the core and plated on an outer surface of the core. The probe according to the present disclosure is not only excellent in contact with the object to be tested and durability but also has low resistance, and makes it easy to manufacture a probe supporter for supporting the probe.
Disclosed is a testing device. The testing device includes a testing socket configured to support a plurality of probes, a testing-circuit substrate which includes a contact point to contact the probe, a slider which makes the testing socket be coupled to and separated from the testing-circuit substrate, and a slider operator which includes a main body arranged on the testing socket, and a slider pressing portion up/down-movably supported on the main body and moving down from the main body toward the slider so that the slider can slide along a surface direction of the testing socket.
09 - Appareils et instruments scientifiques et électriques
Produits et services
Sockets for testing semiconductors; probes for testing semiconductors; probe cards for testing semiconductors; electric connections, including, electric sockets, plugs, and contacts for connecting electrical products, electrical components, integrated circuits, and printed circuit boards; testing apparatus not for medical purposes, including, testing apparatus for testing electrical attributes of electrical products, electrical components, integrated circuits, and printed circuit boards; probes for scientific purposes, including, probes for testing electrical attributes of electrical products, electrical components, integrated circuits, and printed circuit boards; measuring instruments, including, jigs; electric measuring device, including, technical measuring, testing and checking apparatus and instruments for measuring, testing and checking the electrical conduction and insulation, and electrical attributes of semiconductors, electrical products, electrical components, integrated circuits, and printed circuit boards; electric contacts; electric terminals, including, electrical terminal blocks, electrical terminal boxes, electric connecting terminals, elastic electric connecting terminals, and electrical terminals for electrical connectors; electric control panels; printed circuit boards; testing apparatus for testing automotive electronic systems.
09 - Appareils et instruments scientifiques et électriques
Produits et services
Sockets for testing semiconductors; probes for testing semiconductors; probe cards for testing semiconductors; electric connections, namely, electric sockets, plugs, and contacts for connecting electrical products, electrical components, integrated circuits, and printed circuit boards; testing apparatus not for medical purposes, namely, testing apparatus for testing electrical attributes of electrical products, electrical components, integrated circuits, and printed circuit boards; probes for scientific purposes, namely, probes for testing electrical attributes of electrical products, electrical components, integrated circuits, and printed circuit boards; measuring instruments, namely, jigs; electric measuring device, namely, technical measuring, testing and checking apparatus and instruments for measuring, testing and checking the electrical conduction and insulation, and electrical attributes of semiconductors, electrical products, electrical components, integrated circuits, and printed circuit boards; electric contacts; electric terminals, namely, electrical terminal blocks, electrical terminal boxes, electric connecting terminals, elastic electric connecting terminals, and electrical terminals for electrical connectors; electric control panels; printed circuit boards; testing apparatus for testing automotive electronic systems
A test device for testing electric properties of an object. The test device includes an object support unit configured to support an object; a cover unit configured to include a cover body coupled to the object support unit and a pusher supported by the cover body so as to move toward and away from the object; and a pressure adjuster configured to include a multi-stage adjusting cam which is rotatably provided in the cover body while contacting the pusher and has a multi-stage contact pressing portion with contact radii varied depending on rotated angles so that the pusher can be in a moving-back position and be positioned at a plurality of pressing distances from the cover body, and an operation unit which operates the multi-stage adjusting cam.
Disclosed is a test socket unit for electrically connecting a test object and a test circuit device. The test socket unit includes: a plurality of support locking pins configured to be stationarily installed on the surface of the test substrate; a socket main body configured to support a plurality of probes for signal transmission; a floating plate configured to include a pin guide hole in which the support locking pin is inserted; an elastic member configured to be interposed in between the socket main body and the floating plate; and at least one locking member configured to include a locking portion engaged with the locking engaging portion and prevented from separating upward by the locking stopper.
Disclosed is a test socket assembly for electrically connecting a contact point to be tested in a test object and a contact point for testing in a testing circuit. The test socket assembly includes: a plurality of signal probes; a socket block including a bottom surface facing toward the testing circuit, a top surface facing toward the test object, a plurality of probe holes for accommodating the plurality of signal probes to be parallel with one another while opposite ends of the signal probes are exposed from the top surface and the bottom surface, and a recessed portion recessed from at least partial area of the top surface and the bottom surface excluding a circumferential area of the probe holes; and an elastic grounding member accommodated in the recessed portion and made of a conductive elastic material to come into contact with at least one of the test object and the testing circuit.
Disclosed is a test socket for inspecting an electronic device that is particular about properties.
The test socket for inspecting electric properties of a subject includes a plurality of probes configured to be retractable in an inspection direction; a probe supporter configured to support the plurality of probes so that first ends of the plurality of probes protrudes to contact with an object contact point of a subject; and a printed circuit board (PCB) configured to be placed beneath the probe supporter, be mounted with electronic parts, be formed with holes through which second ends of the plurality of probes pass, include at least one first pad with which at least one second end of the plurality of probes comes into contact and at least one second pad formed on an opposite side to the first pad, and be formed with electric paths extended from the first pad and the second pad and connected to the mounted electronic parts.
A high frequency (RF) probe socket is disclosed. The disclosed RF probe socket comprises: a conductive noise shield main body for shielding the probe socket from noise by accommodating a plurality of signal probes to be parallel with each other such that both end parts of the conductive noise shield main body are exposed; upper and lower noise blocking walls extending from the noise shield main body to a partial region between the exposed both end parts of the plurality of signal probes; and upper and lower fixing members respectively arranged at an upper part and a lower part of the noise shield main body, respectively supporting the exposed both end parts of the plurality of signal probes, and having accommodation groove parts for accommodating the noise blocking walls. Therefore, crosstalk between signal probe pins, which pass through the upper and lower fixing members, can be prevented by the shielding, between the signal probe pins, performed by the noise blocking walls extending from a shield block.
Disclosed is a test socket in which a floating member for accommodating a test object at a test is prevented from separating from a socket main body. The separation preventer of the test socket includes hooking projections which protrude from one of the floating member and the socket main body toward the other one, are elastically transformable in a direction transverse to their protruding direction, and have hooking protrusions transversely protruding from their free end portions; and a locking protrusion which is provided in the other one of the floating member and the socket main body, and engages with the hooking protrusion so that the floating member can float within a predetermined vertical range with respect to the socket main body.
Disclosed is a test device for testing electric characteristics of a test object having a test contact point. The test device includes an insert which accommodates the test object; a socket which supports a plurality of probes having one end portion to be in contact with the test contact point of the test object; and a test object tray which is arranged on the socket, seats thereon the test object transferred from the insert during a test, and comprises a probe hole on a bottom thereof corresponding to the test contact point of the test object.
Disclosed is a test device for testing electric properties of an object. The test device includes an object support unit configured to support an object; a cover unit configured to include a cover body coupled to the object support unit and a pusher supported by the cover body so as to move toward and away from the object; and a pressure adjuster configured to include a multi-stage adjusting cam which is rotatably provided in the cover body while contacting the pusher and has a multi-stage contact pressing portion with contact radii varied depending on rotated angles so that the pusher can be in a moving-back position and be positioned at a plurality of pressing distances from the cover body, and an operation unit which operates the multi-stage adjusting cam.
Disclosed is a contact probe for a high current, which electrically connect a contact point of an object to be tested and a contact point of a test circuit. The contact probe comprises a first plunger configured to be in contact with the contact point of the object to be tested, a second plunger configured to be in contact with the contact point of the test circuit, a barrel configured to support at least one of the first plunger and the second plunger to slide therein, and a spring configured to be interposed between the first plunger and the second plunger within the barrel, wherein one of the first plunger and the second plunger comprises an opening hole to accommodate one end of the spring, the other one of the first plunger and the second plunger includes a stem to be accommodated in the opening hole, and a free end of the stem is disposed at least within the opening hole after the spring is restored due to completion of the test.
Disclosed is a test socket for inspecting an electronic device that is particular about properties. The test socket for inspecting electric properties of a subject includes a plurality of probes configured to be retractable in an inspection direction; a probe supporter configured to support the plurality of probes so that first ends of the plurality of probes protrudes to contact with an object contact point of a subject; and a printed circuit board (PCB) configured to be placed beneath the probe supporter, be mounted with electronic parts, be formed with holes through which second ends of the plurality of probes pass, include at least one first pad with which at least one second end of the plurality of probes comes into contact and at least one second pad formed on an opposite side to the first pad, and be formed with electric paths extended from the first pad and the second pad and connected to the mounted electronic parts.
Disclosed is an anisotropic conductive connector comprising: a planar elastic body which comprises a plurality of conductors in which conductive particles having magnetism to show conductivity in a thickness direction are oriented in the thickness direction and contained, and an elastic insulator formed around the plurality of conductors, the conductor and the elastic insulator being integrally formed by one high molecular substance, wherein the conductor comprises an end portion having a concave-convex portion to be in partial contact with a surface of an inspection contact point of an object to be inspected, the end portion more protruding than a surface of the elastic insulator. The end portion of the conductor is formed as a sharp tip to be in contact with the inspective contact point of the object to be inspected, so that foreign materials generated at a test, e.g., tin (Sn) can be prevented from transition, thereby stably maintaining a resistance characteristic.
H01R 11/01 - Éléments de connexion individuels assurant plusieurs emplacements de connexion espacés pour des organes conducteurs qui sont ou qui peuvent être interconnectés de cette façon, p. ex. pièces d'extrémité pour fils ou câbles supportées par le fil ou par le câble et possédant des moyens pour faciliter la connexion électrique avec quelqu'autre fil, borne, ou organe conducteur, répartiteurs caractérisés par la forme ou par la disposition de l'interconnexion entre leurs emplacements de connexion
Disclosed is a coaxial probe comprising, an internal conductor comprising an upper contact configured to contact a semiconductor device; a lower contact configured to contact a tester for testing the semiconductor device; and an internal elastic member configured to elastically bias at least one of the upper and lower contacts to make the upper and lower contacts distant from each other; an external conductor configured to surround the internal conductor; a plurality of gap members which is respectively inserted into opposite ends between the internal conductor and the external conductor to create a predetermined air gap between the internal conductor and the external conductor; and at least one external elastic member that is inserted into an external circumferential surface of the external conductor to elastically bias at least one of the semiconductor device and the tester to a direction that makes either the semiconductor device or the test distant from the external conductor.
Disclosed is an inspection apparatus for a semiconductor device, which is to inspect an electric characteristic of an inspective object having a plurality of electric inspective contact points. The inspection apparatus includes a socket assembly which includes a plurality of probe pins retractable in a longitudinal direction, a probe pin supporter supporting the probe pins in parallel with each other, and a socket board including a plurality of fixed contact points a first end portion of the probe pins, and an inspective object carrier which includes an inspective object accommodating portion accommodating the inspective object so that the inspective contact points face toward a second end portion of the probe pins, and a floor member interposed between the inspective object and the probe pin supporter and including probe holes penetrated corresponding to the inspective contact points and passing the second end portion of the probe pin therethrough.
Disclosed are a test probe and a machining method of a test probe, the test probe including a plunger end part contacting a tested contact point, the plunger end part including a plurality of tips protruding toward the tested contact point, and at least one of the plurality of tips is a higher tip and at least another one of the plurality of tips is a lower tip that is lower than the higher tip.
Disclosed is a probe which stably transmits a test signal. The probe electrically connects a semiconductor device and a tester for testing the semiconductor device. The probe may include an upper plunger which is configured to be electrically connected to the semiconductor device; a lower plunger which is configured to be electrically connected to the tester; an elastic member which is disposed between the upper plunger and the lower plunger, and elastically biases the upper and lower plungers to have them spaced from each other; a conductive member which is disposed in an inside or outside of the elastic member and electrically connects the upper plunger and the lower plunger; and a barrel which accommodates therein the upper plunger, the lower plunger, the elastic member and the conductive member.
Disclosed is a coaxial probe capable of improved durability and productivity. The disclosed coaxial probe is characterized by comprising: an inner conductor including an upper contact capable of contacting a semiconductor device, a lower contact capable of contacting a tester for testing the semiconductor device, and an inner resilient member for resiliently biasing at least one of the upper contact and the lower contact in order for the upper contact and the lower contact to move away from each other; an outer conductor surrounding the inner conductor; a plurality of gap members inserted into both ends between the inner conductor and the outer conductor such that a fixed air gap exists between the inner conductor and the outer conductor; and at least one outer resilient member inserted over the outer peripheral surface of the outer member so as to resiliently bias at least one of the semiconductor device and the tester in a direction away from the outer conductor.
The present invention relates to an apparatus for inspecting a semiconductor device which inspects electric properties of an inspecting target having a plurality of contact points to be electrically inspected, comprising: a socket assembly including: a plurality of probe pins which can be extended in a longitudinal direction; a probe pin supporter for supporting the probe pins which are parallel to each other; and a socket board having a plurality of fixed contact points which come in contact with one end of each probe pin, and an inspecting target carrier including: an inspecting target storage unit for storing the inspecting target to direct the contact points toward the other end of each probe pin; and a bottom member which is inserted between the inspecting target and the probe pin supporter and has probe holes corresponding to the contact points through which the other end of each probe pin pass.
Provided is a probe that can stably transmit a detection signal. The probe electrically connects a semiconductor device to a tester for testing the semiconductor device. The probe includes an upper plunger electrically connected to the semiconductor device, a lower plunger electrically connected to the tester, an elastic member disposed between the upper plunger and the lower plunger, wherein the elastic member elastically biases the upper plunger from the lower plunger to space the upper and lower plungers apart from each other, a conductive member disposed inside or outside the elastic member to electrically connect the upper plunger to the lower plunger, and a barrel configured to receive the upper and lower plungers, the elastic member, and the conductive member.
Disclosed is a semiconductor chip test socket having an extended service life. The socket includes a support plate having a fitting hole formed in the center, a silicone part fitted in the fitting hole of the support plate and having a protruded part, a plurality of conductive silicone portions composed of metal balls vertically disposed in the protruded part, a coupling plate placed on the protruded part and having a plurality of plungers for coming into contact with solder balls of a semiconductor chip, and a cap having through-holes corresponding to the plurality of plungers and having a reception space for receiving the protruded part, the cap being coupled to the silicone part to hold the coupling plate. The coupling plate including the plungers fitted therein for coming into contact with a solder ball of a semiconductor chip is coupled on the silicone part to prevent wear of the conductive silicone portions and thus to extend a service life.
Disclosed is an independent module socket using clips and probes. The module socket is used to insert a memory module substrate into the module socket and test the memory module substrate. The module socket includes a probe having a plunger, a plunger cover, and an elastic body for applying elastic force between an end of the plunger and an inner portion of the plunger cover; an independent module clip formed in an S-shape lying in a horizontal direction and provided with a contact portion for making contact with the memory module substrate; and a housing having a space defined in the housing, the independent module clip being inserted into the space, and a hole formed on a lower end, the plunger being inserted into the hole to make contact with a PCB. The module socket is advantageous in that, by providing S-shaped clips lying in the horizontal direction, no separate rubber packing is necessary.
