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2025
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Invention
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Antenna device and an automated test equipment comprising an orthomode transducer.
The invention... |
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Invention
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Pore chip case.
A pore chip case houses a pore chip. A main body includes a chip housing space, ... |
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Invention
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Antenna device and an automated test equipment with a ridged blind mating waveguide flange.
An a... |
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Invention
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Semiconductor integrated circuit.
A pin electronics IC is formed on a semiconductor chip. The pi... |
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Invention
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Electronic device and method of idetifying circuit board thereof.
An electronic device and a met... |
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Invention
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Pin electronics apparatus, test apparatus, and method.
Provided is a pin electronics apparatus i... |
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Invention
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Pin electronics apparatus, test apparatus, and method.
Provided is a pin electronics apparatus w... |
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Invention
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Planer antenna.
An antenna array with multiple testing antenna elements 14 that can test a devic... |
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Invention
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Da conversion apparatus.
Provided is a DA conversion apparatus which generates an output signal ... |
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Invention
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Measurement device and measurement method. Provided is a measurement device comprising: a plate-s... |
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Invention
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Measurement device, measurement method, and device to be tested. Provided is a measurement device... |
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Invention
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Electromagnetic wave measuring apparatus, method, and recording medium.
An electromagnetic wave ... |
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Invention
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Frequency stabilization circuit, frequency stabilization method, and optical comb generator.
Pro... |
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Invention
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Switch device and testing device.
A switch device comprising: a plurality of routing circuits ea... |
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Invention
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Pore device.
A pore device has a device main body and a sealing member. The device main body has... |
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Invention
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Pore device.
A pore device can accommodate a pore chip. A body has the internal space partitione... |
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Invention
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Antenna device for ota device testing using automated test equipment.
Embodiments of the present... |
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Invention
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Pusher for use in an automated test equipment, a test arrangement comprising the pusher and a met... |
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Invention
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Amplifier arrangement and method for amplifier arrangement with set current at control input of t... |
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P/S
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Semiconductor testing machines; computer software for
semiconductor testing machines. |
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P/S
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Semiconductor testing machines; downloadable computer software for semiconductor testing machines. |
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Invention
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Automated test equipment, method for testing a device under test and computer program using a fit... |
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Invention
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Automated test equipment, method for testing a device under test and computer program using an it... |
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Invention
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Optical waveguide and manufacturing method of optical waveguide.
Provided is an optical waveguid... |
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Invention
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Coaxial cable and device testing apparatus.
A coaxial cable includes a tubular outer conductor, ... |
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Invention
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Test arrangement for over-the-air testing an angled device under test in a device-under-test sock... |
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Invention
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Test arrangement for over-the-air testing an angled device under test using a carrier structure w... |
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Invention
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Test arrangement for over-the-air testing an angled device under test that is tilted relative to ... |
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2024
|
Invention
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Semiconductor device handling apparatus and semiconductor device testing apparatus.
A semiconduc... |
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Invention
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Device handling apparatus and device testing apparatus.
A device handling apparatus that handles... |
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Invention
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Cooling plate, wiring board assembly and device testing apparatus.
A cooling plate cools an elec... |
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Invention
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Switch device.
Provided is a switch device including a phase-change material switch and a first ... |
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Invention
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Test apparatus and test method. Provided is a test apparatus comprising an input unit that is con... |
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Invention
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Testing device, testing method, and computer program product. The present invention provides a te... |
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Invention
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Testing device, testing method, and program. Provided is a testing device comprising a voltage ge... |
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Invention
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Contact terminal, terminal assembly, and device testing apparatus.
A contact terminal includes o... |
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Invention
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Apparatus, method, and program. This apparatus comprises an acquiring unit that acquires a respon... |
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Invention
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Optical connector.
An optical connector includes one ferrule and a ferrule position retaining po... |
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Invention
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Synchronization techniques between single-site and multi-site dut test programs.
A method of tes... |
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Invention
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Tester for an automatic test equipment system and method for controlling the same. Tester for an ... |
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Invention
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Probe assembly for calibrating rf power signals to a device pin.
Various embodiments disclosed h... |
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Invention
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Device for equalising attenuation of a signal by a transmission line and system for testing elect... |
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Invention
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Automated test equipment, test arrangement and method for testing with individual sensing in a ga... |
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Invention
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Measurement device, measurement method, and measurement program. Provided is a measurement device... |
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Invention
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Power switch and method for operating a power switch using a switchable current source. A power s... |
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Invention
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A device under test socket structure with a pusher surrounded with an electromagnetic absorber an... |
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Invention
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Testing apparatus, testing method, and program. The present invention provides a testing apparatu... |
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Invention
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Four-port network analyzer and method for measuring four-port network parameters. The invention r... |
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2023
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Invention
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Power supply filter circuit, power supply arrangement, automated test equipment and method for ac... |
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2022
|
Invention
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Biasing circuit.
A biasing circuit includes a signal input terminal, a signal output terminal, a... |
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Invention
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Socket assembly and electronic component test apparatus.
A socket assembly used in an electronic... |
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2021
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P/S
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Downloadable and recorded computer software for controlling the operation of semiconductor testin... |
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P/S
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Computer software for controlling the operation of
semiconductor testing machines. |
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2020
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P/S
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Semiconductor testing machines; system large scale integrated circuits testing machines; large sc... |
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P/S
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Semiconductor testing machines; system large scale
integrated circuits testing machines; large s... |
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2018
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P/S
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Wireless data loggers; temperature indicators; strain gauges; voltmeters; hygrometers; pressure g... |
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P/S
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Measuring or testing machines and instruments; computer
software; wireless data loggers; tempera... |
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2016
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P/S
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Photoacoustic microscope. |
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2013
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P/S
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Rental of semiconductor testing machines and system and
their parts and fitting; design, install... |
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P/S
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Rental of semiconductor testing machines and system and their parts and fitting; design, installa... |
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2012
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P/S
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Machines to test semiconductors, machines to test system large scale integrated circuits, machine... |
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P/S
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Optical inspection apparatus for inspection and testing of
semiconductor materials, namely, phot... |
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P/S
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Optical inspection apparatus for inspection and testing of semiconductor materials, namely, photo... |
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2010
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P/S
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Computer software used for the operation and control of photomask inspection and testing machines... |
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P/S
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Computer software for photomask inspection or testing
machines and systems; computer software; p... |
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2007
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P/S
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Semiconductor testing machines, system large scale integrated circuits testing machines, large sc... |
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P/S
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Semiconductor manufacturing machines and systems. Semiconductor (including "system large scale in... |
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2006
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P/S
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Scientific, photographic, measuring, checking (supervision) and teaching apparatus and instrument... |
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2005
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P/S
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Measuring or testing machines and instruments; electric or
magnetic meters and testers; telecomm... |
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P/S
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Scanning electron microscopes; electron beam lithography equipment; telecommunication switches; e... |
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2001
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P/S
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[MEASURING APPARATUS AND INSTRUMENTS, NAMELY, DIGITAL MULTIMETERS EQUIPPED WITH DC VOLTAGES/CURRE... |
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2000
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P/S
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Semiconductor manufacturing machines, integrated circuit manufacturing machines |
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P/S
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Semiconductor manufacturing machines Applied electrical and electronic machines and instruments, ... |
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1998
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P/S
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Computer software used for data conversion, namely, for converting information developed in the d... |
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1985
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P/S
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Memory test system (RAM, HMOS-RAM, ECL-RAM, ROM, semiconductor memory devices test), VLSI test sy... |
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1981
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P/S
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Testing Machinery and Equipment Used for Electrical Components and Semiconductors-, namely, Large... |
