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2025
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P/S
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Semiconductor testing machines; computer software for
semiconductor testing machines. |
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P/S
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Semiconductor testing machines; computer software for semiconductor testing machines. |
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Invention
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Automated test equipment, method for testing a device under test and computer program using a fit... |
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Invention
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Automated test equipment, method for testing a device under test and computer program using an it... |
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Invention
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Optical waveguide and manufacturing method of optical waveguide.
Provided is an optical waveguid... |
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Invention
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Test arrangement for over-the-air testing an angled device under test in a device-under-test sock... |
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Invention
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Test arrangement for over-the-air testing an angled device under test using a carrier structure w... |
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Invention
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Test arrangement for over-the-air testing an angled device under test that is tilted relative to ... |
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2024
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Invention
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Apparatus for testing a device under test separating errors within a received pattern associated ... |
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Invention
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Device handling apparatus and device testing apparatus.
A device handling apparatus that handles... |
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Invention
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Cooling plate, wiring board assembly and device testing apparatus.
A cooling plate cools an elec... |
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Invention
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Automated test equipment and method using a trigger generation.
An automated test equipment comp... |
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Invention
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Connecting device, testing device, and communication device.
A connecting device, including: a f... |
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Invention
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Optical circuit and method.
Provided is an optical circuit comprising: an optical switch that ou... |
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Invention
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Test apparatus and test method. Provided is a test apparatus comprising an input unit that is con... |
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Invention
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Testing device, testing method, and computer program product. The present invention provides a te... |
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Invention
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Testing device, testing method, and program. Provided is a testing device comprising a voltage ge... |
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Invention
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Contact terminal, terminal assembly, and device testing apparatus.
A contact terminal includes o... |
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Invention
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Three-dimensional device and manufacturing method thereof.
When testing a memory chip, the memor... |
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Invention
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Optical connector.
An optical connector includes one ferrule and a ferrule position retaining po... |
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Invention
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Test apparatus, test method, and computer-readable storage medium.
A test apparatus includes: an... |
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Invention
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Semiconductor wafer handling apparatus and semiconductor wafer testing system.
A semiconductor w... |
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Invention
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Semiconductor device handling apparatus and semiconductor device testing apparatus.
A semiconduc... |
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Invention
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Testing apparatus.
A testing apparatus includes a driver and a test signal providing section. Th... |
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Invention
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Method and apparatus for determining and information about characteristics of one or more devices... |
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Invention
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Microfluidic device and microparticle measurement system.
A microfluidic device has a microfluid... |
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Invention
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Reduced header signal information testing systems and methods.
Presented embodiments facilitate ... |
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Invention
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Coaxial cable and semiconductor device testing apparatus.
A coaxial cable includes an inner cond... |
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Invention
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Cooling shroud and enclosure for consumer electronic memory device for optimized performance ther... |
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Invention
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Testing apparatus, testing method, and computer-readable storage medium.
Provided is a testing a... |
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Invention
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Temperature adjusting system, controller, electronic device handling apparatus, tester, and elect... |
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Invention
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Fine particle measurement device and fine particle measurement method. A fine particle measuremen... |
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Invention
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Microparticle measurement apparatus. This microparticle measurement device 1 is used together wit... |
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Invention
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Electromagnetic wave measuring apparatus, method, and recording medium.
An electromagnetic wave ... |
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Invention
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Phase change material switch and manufacturing method. Provided is a phase change material switch... |
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Invention
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Secretion component measuring device. This secretion component measuring device comprises a first... |
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Invention
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Inductor. The inductor comprises a magnetic core and a coil. The magnetic core has an end surface... |
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2023
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Invention
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Pattern-generating device. Provided is a pattern-generating device comprising a timing generation... |
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Invention
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System and method for testing devices, computer readable medium. The present invention relates to... |
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Invention
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Test device, test method, and program. Provided is a test device comprising: a pattern generation... |
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Invention
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Variable attenuator, step attenuator, and test device. The present invention provides a variable ... |
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Invention
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Test apparatus and test method. Provided is a test apparatus comprising: a first power source tha... |
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Invention
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Optical measurement device. The present invention reduces loss of light between an optical probe ... |
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Invention
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Switchable routing circuit and method for routing a signal. The invention relates to a switchable... |
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Invention
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Method, apparatus, and non-transitory computer medium for detecting defects of a device under tes... |
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Invention
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Antenna device with curved ridges. The invention relates to an antenna device and an automated te... |
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Invention
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Optical input/output device. The present invention facilitates alignment of an end surface of an ... |
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Invention
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Testing arrangement and method for determining an optimized distance between a device under test ... |
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Invention
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Image output apparatus, method, program, and recording medium.
An image output apparatus include... |
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2022
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Invention
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Signal source specifying apparatus, method, program, and recording medium.
A signal source speci... |
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2021
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Invention
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Temperature adjustment system and electronic component testing apparatus.
A temperature adjustme... |
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P/S
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Downloadable and recorded computer software for controlling the operation of semiconductor testin... |
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P/S
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Computer software for controlling the operation of
semiconductor testing machines. |
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2020
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P/S
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Semiconductor testing machines; system large scale integrated circuits testing machines; large sc... |
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P/S
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Semiconductor testing machines; system large scale
integrated circuits testing machines; large s... |
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2018
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P/S
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Wireless data loggers; temperature indicators; strain gauges; voltmeters; hygrometers; pressure g... |
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P/S
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Measuring or testing machines and instruments; computer
software; wireless data loggers; tempera... |
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2016
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P/S
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Photoacoustic microscope. |
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2013
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P/S
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Rental of semiconductor testing machines and system and
their parts and fitting; design, install... |
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P/S
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Rental of semiconductor testing machines and system and their parts and fitting; design, installa... |
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2012
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P/S
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Machines to test semiconductors, machines to test system large scale integrated circuits, machine... |
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P/S
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Optical inspection apparatus for inspection and testing of
semiconductor materials, namely, phot... |
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P/S
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Optical inspection apparatus for inspection and testing of semiconductor materials, namely, photo... |
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2010
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P/S
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Computer software used for the operation and control of photomask inspection and testing machines... |
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P/S
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Computer software for photomask inspection or testing
machines and systems; computer software; p... |
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2007
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P/S
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Semiconductor testing machines, system large scale integrated circuits testing machines, large sc... |
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P/S
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Semiconductor manufacturing machines and systems. Semiconductor (including "system large scale in... |
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2006
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P/S
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Scientific, photographic, measuring, checking (supervision) and teaching apparatus and instrument... |
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2005
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P/S
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Measuring or testing machines and instruments; electric or
magnetic meters and testers; telecomm... |
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P/S
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Scanning electron microscopes; electron beam lithography equipment; telecommunication switches; e... |
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2001
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P/S
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[MEASURING APPARATUS AND INSTRUMENTS, NAMELY, DIGITAL MULTIMETERS EQUIPPED WITH DC VOLTAGES/CURRE... |
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2000
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P/S
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Semiconductor manufacturing machines, integrated circuit manufacturing machines |
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P/S
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Semiconductor manufacturing machines Applied electrical and electronic machines and instruments, ... |
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1998
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P/S
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Computer software used for data conversion, namely, for converting information developed in the d... |
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1985
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P/S
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Memory test system (RAM, HMOS-RAM, ECL-RAM, ROM, semiconductor memory devices test), VLSI test sy... |
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1981
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P/S
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Testing Machinery and Equipment Used for Electrical Components and Semiconductors-, namely, Large... |
