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2023
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Invention
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Swab collection systems and methods. Systems and methods under the present disclosure include swa... |
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2019
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Invention
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Method and system for resolving hot spots in lit. Localizing hot spots in multi layered device un... |
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Invention
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Laser-assisted device alteration using synchronized laser pulses. A pulsed-laser LADA system is p... |
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2018
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Invention
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Self correcting floating sil tip. An optics arrangement for a solid immersion lens (SIL) is discl... |
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Invention
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System and method for fault isolation by emission spectra analysis. An apparatus and method for o... |
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2016
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Invention
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Probe-based data collection system with adaptive mode of probing controlled by local sample prope... |
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Invention
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Method for imaging a feature using a scanning probe microscope. Using a local-potential-driving p... |
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Invention
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System and method for modulation mapping. Probing an integrated circuit (IC), by: electrically ap... |
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2015
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Invention
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Systems and method for laser voltage imaging. An apparatus and method for laser voltage testing o... |
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Invention
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Through process flow intra-chip and inter-chip electrical analysis and process control using in-l... |
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Invention
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Spectral mapping of photo emission. An apparatus and method for optical probing of a DUT is discl... |
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2014
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Invention
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Optimized wavelength photon emission microscope for vlsi devices. A method for emission testing o... |
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Invention
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Apparatus and method for annular optical power management. A system and method for obtaining supe... |
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2013
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Invention
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Method and system for the examination of a sample by means of thermography. n are characteristic ... |
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2012
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Invention
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Method for examination of a sample by means of the heat flow thermography. The invention provides... |
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2000
|
Invention
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Optical coupling for testing integrated circuits. A method and system of testing integrated circu... |
