Tokyo Electron U.S. Holdings, Inc

États‑Unis d’Amérique

Commandez votre montre hebdomadaire Tokyo Electron U.S. Holdings, Inc
Quantité totale PI 799
Quantité totale incluant filiales 818 (+ 19 pour les filiales)
Rang # Quantité totale PI 1 676
Note d'activité PI 3,6/5.0    767
Rang # Activité PI 939
Classe Nice dominante Services de construction; extrac...

Brevets

Marques

3 1
0 0
794 1
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Dernier brevet 2025 - Apparatus and method for impleme...
Premier brevet 2012 - Adaptive recipe selector
Dernière marque 2019 - TECHNOLOGY ENABLING LIFE
Première marque 2019 - TECHNOLOGY ENABLING LIFE

Filiales

1 subsidiaries with IP (19 patents, 0 trademarks)

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Industrie (Classification de Nice)

Derniers inventions, produits et services

2025 Invention Apparatus and method for implementing a scalable digital infrastructure for measuring ring oscill...
Invention Die to wafer bonding method and apparatus with thermal contactless die shape control. Aspects of ...
Invention Die to wafer bonding method and apparatus with thermal contact die shape control. Aspects of the ...
Invention Eccentricity based wafer shape control. Aspects of the present disclosure provide an apparatus fo...
Invention Multipatterning with crosslinkable overcoat. An example method of processing a substrate includes...
Invention Using laser based system for mean of shaping of unsingulated & singulated dies by substrate latti...
Invention Apparatus and method for detecting and monitoring objects in a fluid bath and adjusting the fluid...
Invention Photoresist patterning using planar trim layer. A method includes forming a photoresist layer ove...
Invention High-performance adaptable sampling system. According to an embodiment, a plasma processing syste...
Invention X-ray methods and systems for semiconductor substrate alignment. X-rays are directed to a first s...
Invention Method for patterning mask layer using metal-containing resist. 44, HBr, or hydrogen.
Invention Method for patterning for chemical mechanical polishing (cmp) iso-dense bias compensation using z...
Invention Autocatalytic acid amplification for photoselective acid diffusion. An embodiment method of proce...
Invention Method for removing metal-containing materials in small pitch structures. Undesired metal-contain...
Invention Method and wafer processing system for wet etching a semiconductor wafer. A method and wafer proc...
Invention Etching bi-metal oxides with alkaline earth metals. An example method for etching a barium contai...
Invention Gap filling by atomic layer deposition (ald). A method of manufacturing a semiconductor device is...
Invention Metallization and planarization. A method of defect detection includes providing a wafer includin...
Invention Hard mask protection of metal interconnects. A method for protecting metal interconnects includes...
Invention Methods for wet atomic layer etching of tungsten. Various embodiments of methods are provided for...
Invention Selective in-situ carbon-based mask protection. A method of etching an underlying layer includes ...
Invention Method for protecting graphene layer during metal etching. A method for making a semiconductor de...
Invention Method of hybrid bonding using die distribution model. A method of hybrid bonding includes access...
Invention Ceramic heater assembly with internal and external heating functionality useful in the fabricatio...
Invention Wet processing systems having novel wafer chuck designs for retaining a processing liquid on a su...
Invention Methods and compositions for trench formation using advanced track-based patterning processes. A ...
Invention Method for semiconductor manufacturing. A method of processing a substrate includes forming a rec...
Invention Methods for wet atomic layer etching of silicon dioxide. i2i22 layer and form a silicate passivat...
Invention Controlling etch edge effects. A method for controlling an etch edge effect in a partial plasma e...
Invention System and method of pulse scoring. A method of pulse scoring is provided. The method includes ex...
Invention System and method for adjusting etch selectivity of etchant solution. An apparatus includes a fir...
Invention Die shape control for die to wafer bond enhancement. Aspects of the present disclosure provide a ...
Invention Vertical feature growth using fluorine-containing gas. A method of vertically growing a material,...
Invention In situ removable blocking layer formation. A method of etching a target material of a substrate ...
Invention Radio frequency sensor calibration by virtual metrology. A method of chamber matching is provided...
Invention Bottom-up directional atomic layer deposition (ald). A method of film deposition is provided. The...
Invention 3) solution. 332333 etch solution onto the silicon surface.
Invention Selective etching of silicon adjacent to silicon-germanium. A process for forming at least portio...
Invention Method for semiconductor processing. A method of processing a substrate includes forming a recess...
Invention Bonding energy measurement. A method of determining a bonding energy of a bonded wafer includes r...
Invention Plasma etch-deposition processes and systems. A method of processing a substrate in a plasma proc...
Invention Cyclic etch/deposition plasma processes using tungsten based precursor gas. A method of plasma et...
Invention Etch stop layer in all-in-one harc etch. A method of forming a device includes receiving, in a pr...
2024 Invention Protection structure for liner removal. A method of etching a liner formed between a patterned la...
Invention Direct current superposition (dcs) for protection of organic mandrel during spacer deposition. Me...
Invention In-situ metal deposition for reduced charging during dielectric etch. A method of etching a diele...
Invention Harc etch chemistry for seminconductors. 4333. Therefore, increased selectivity between the mask ...
Invention Plasma potential adjustment circuit. A method of adjusting sheath potential of a plasma at a subs...
Invention Resonant phase-controlled oscillator. A resonant oscillator circuit includes an amplifier that in...
Invention Plasma adjustment using source-less resonant structure. A plasma processing apparatus includes a ...
2019 P/S Semiconductor manufacturing support services, namely, repair or maintenance of semiconductor man...
P/S Semiconductor manufacturing support services, namely, technical support services in the nature of...