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2025
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Invention
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Inspection device and inspection method.
An inspection device includes: a camera configured to c... |
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Invention
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Temperature control device, temperature control method, program, prober, and learning model gener... |
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Invention
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Machining device.
Provided is a machining device capable of precisely measuring a shape of a mac... |
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P/S
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Precision measuring machines and instruments for uses in the nature of surface texture, contour, ... |
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Invention
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Charge/discharge test system.
A charge/discharge test system includes: a plurality of charge/dis... |
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Invention
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Charge/discharge test system and control method for charge/discharge test system.
A charge/disch... |
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Invention
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Wafer inspection apparatus, chuck position measurement method, and target.
A wafer inspection ap... |
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Invention
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Wafer chamfering device. A wafer chamfering device, which trues (S4) an abrasive grinding wheel 1... |
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Invention
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Prober, and wafer cooling method.
A prober includes a wafer chuck that is a support member for s... |
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Invention
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Semiconductor manufacturing device. This semiconductor manufacturing device comprises: a conveyan... |
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Invention
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Dicing apparatus and trimming method for dicing apparatus. The purpose of the present invention i... |
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Invention
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Grinding performance determination device and grinding performance determination method. Provided... |
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Invention
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Grinding device. Provided is a grinding device capable of improving the efficiency of blade adjus... |
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Invention
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Three-position control device and three-position control method.
A three-position control device... |
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Invention
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Laser processing method and laser processing device. Provided are a laser processing method and a... |
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P/S
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Semiconductor manufacturing devices; sharpeners for semiconductor manufacturing devices; grinding... |
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Invention
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Prober.
A prober includes a measurement unit, a wafer chuck, an alignment device, and a falling ... |
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Invention
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Crack measuring instrument. This crack measuring instrument is for detecting a crack generated in... |
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Invention
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Inner diameter measuring apparatus and system thereof.
Provided is an inner diameter measuring a... |
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Invention
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Own-position estimating device, own-position estimating method, and camera relative position adju... |
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Invention
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Diagnostic device, diagnostic method, and needle mark inspection device. Provided are a diagnosti... |
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Invention
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Own-position estimating device and own-position estimating method. Provided is an own-position es... |
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Invention
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Own-position estimating device and own-position estimating method. Provided are an own-position e... |
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Invention
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Calibration method and calibration device. Provided are a calibration method and a calibration de... |
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Invention
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Measurement device and method for controlling mobile body. Provided are a measurement device and ... |
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Invention
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Chamfering device for wafer, and chamfering method. Disclosed is a chamfering device for a wafer,... |
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Invention
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Chamfering device and chamfering method. Provided is a chamfering device 100 for grinding a perip... |
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Invention
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Laser beam machining method and laser beam machining device. Provided is a laser beam machining m... |
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P/S
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Length measuring gauges; comparators, non-electronic;
interferometers; screw-thread measuring ma... |
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P/S
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Precision measuring machines and instruments; roundness
measurement machines and instruments; cy... |
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P/S
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Precision measuring machines and instruments; laboratory
apparatus and instruments; optical mach... |
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Invention
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Temperature regulation system and circulation unit. The objective of the present invention is to ... |
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Invention
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Prober.
A prober according to an embodiment tests the electrical characteristics of semiconducto... |
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Invention
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Laser machining device and laser machining method. This laser machining device comprises: a prote... |
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Invention
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Machining method. Provided is a machining method for machining a workpiece with a hubless blade i... |
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Invention
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Laser processing device and laser processing method. This laser processing device includes: a lig... |
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Invention
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Machining apparatus. This machining apparatus comprises: a machining laser irradiation device tha... |
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Invention
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Grinding apparatus.
To make an improvement in the shape accuracy of a wafer shaped in the grindi... |
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Invention
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Prober. A prober according to the present invention is characterized by comprising an XY stage 22... |
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Invention
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Prober and probe inspection method. A prober 100 for executing an electric test on a wafer includ... |
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Invention
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Stylus attitude determination method and stylus attitude determination device. nn) on a measureme... |
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Invention
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Method for surface treatment of chuck for wafer testing device and chuck for wafer testing device... |
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Invention
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Inspection device and inspection method. This inspection device is provided with: a light source ... |
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Invention
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Prober. A prober 1 inspects the electrical characteristics of a device formed on a wafer W. The p... |
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Invention
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Calibration method and calibration device for camera. This calibration method for a camera includ... |
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2024
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Invention
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Non-contact temperature measuring device and non-contact temperature measuring method. voptopt));... |
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Invention
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Shape measurement device, shape measurement method, and wafer processing system. Provided is a sh... |
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Invention
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Wafer processing system and wafer processing method. A wafer processing system (10) comprises: a ... |
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P/S
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X-ray computed tomography [CT] scanners, not for medical
purposes; non-destructive inspection ap... |
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Invention
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Non-contact shape measuring apparatus and position adjusting method. Provided are: a sensor head ... |
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P/S
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Contactless electronic displacement sensors; electronic displacement sensors; contactless contour... |
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Invention
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Charge and discharge test system, charge and discharge test method, and program. Provided are a c... |
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Invention
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Charge and discharge test system, charge and discharge test method, and control device. Provided ... |
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Invention
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Wafer transfer arm and wafer transfer system. This transfer arm is provided with: a plurality of ... |
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P/S
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Battery manufacturing equipment; semiconductor manufacturing
machines. Measuring or testing mach... |
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2023
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P/S
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Measuring or testing machines and instruments for
manufacturing semi-conductors; precision measu... |
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P/S
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Semiconductor manufacturing machines and their component parts and fittings; machines for detecti... |
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P/S
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Semiconductor manufacturing machines and their parts and
fittings; machines for detecting defect... |
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P/S
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Semiconductor manufacturing machines and their parts and fittings; machines for detecting defecti... |
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Invention
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Shape measurement device. [Solution] A shape measurement device for acquiring a plurality of surf... |
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2022
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P/S
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Measuring or testing machines and instruments, namely, instruments for measuring dimensions and d... |
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P/S
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Measuring or testing machines and instruments; measuring
heads; inner diameter measuring heads; ... |
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Invention
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Tool holder attachment state detection method, tool holder attachment state detection device, dis... |
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2021
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Invention
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Cleaning device for wafer-suction chuck mechanism.
A cleaning device for a wafer-suction chuck m... |
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P/S
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Semiconductor manufacturing machines and systems; machines
for detecting defective products for ... |
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P/S
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Custom manufacture of semiconductor manufacturing machines and systems for others; custom manufac... |
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P/S
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Custom manufacture of semiconductor manufacturing machines
and systems for others; custom manufa... |
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2017
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P/S
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Chemical machines, namely, semiconductor wafer drying machines, semiconductor wafer scrubbing and... |
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2014
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P/S
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Interferometers |
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P/S
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Interferometers. |
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P/S
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Machinery installation; Repair or maintenance of metalworking machines and tools; Repair or maint... |
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2008
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P/S
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Machine balancer, and electronic controller and
accelerometer therefor, sold as a unit; machine ... |
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2005
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P/S
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Wire slicing machines, wafer slicing machines, slicing machines for non-silicon wafers, wafer cle... |
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2002
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P/S
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cutting machines for manufacturing semiconductor chips; cutting machines for manufacturing liquid... |
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P/S
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dicing machines |
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2000
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P/S
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Metal working machines and tools, namely, semiconductor manufacturing equipment, namely, wafer pr... |
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1995
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P/S
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machine balancer, and electronic controller and accelerometer therefor, sold as a unit; machine b... |
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1985
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P/S
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SURFACE ROUGHNESS MEASURING INSTRUMENT |
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1973
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P/S
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ELECTRONIC INSTRUMENTS COMPRISING A GAUGE HEAD, INSTRUMENT BASE, AMPLIFYING, CONTROL AND RECORDIN... |
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1969
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P/S
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AUTOMATIC ELECTRONIC MEASURING AND CONTROL DEVICES FOR MEASURING THE WORK PRODUCT OF CYLINDRICAL ... |
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1963
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P/S
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[ ELECTRIC MICROMETERS, ] ELECTRO-MECHANICAL INSTRUMENTS FOR THE MEASUREMENT OF SURFACE ROUGHNESS... |
