Tokyo Electron Limited
Japon
Nouveaux brevets et marques déposées la semaine dernière
Dernière mise à jour : 2026-04-04
Sommaire
Brevets |
Marques |
|
![]() |
15 | 0 |
![]() |
0 | 0 |
![]() |
27 | 1 |
![]() |
0 |
Commandez votre montre hebdomadaire Tokyo Electron Limited
1
Viewing 1 - 43 of 43
marques
brevets
| # | ID | Juridiction | Title |
|---|---|---|---|
| 1 | 19413022 |
|
VALVE DEVICE AND LEAK DETECTION METHOD |
| 2 | 18902673 |
|
STEP RAMP GRADING YIELD ENHANCEMENT FOR HYBRID BONDING |
| 3 | 18903802 |
|
METHOD FOR PATTERNING SUBSTRATE USING METAL OXIDE RESIST |
| 4 | 18899263 |
|
LOW-TEMPERATURE ETCHING OF CARBON-CONTAINING LAYERS |
| 5 | 19042196 |
|
METHODS FOR WET ATOMIC LAYER ETCHING OF TITANIUM NITRIDE USING HALOGENATION |
| 6 | 19371540 |
|
PROBER, METHOD FOR CONTROLLING PROBER, INSPECTION SYSTEM, AND METHOD FOR CONTROLLING INSPECTION SYSTEM |
| 7 | JP2025032040 |
|
PLASMA PROCESSING DEVICE |
| 8 | US2025033326 |
|
METHOD FOR PROCESSING SUBSTRATE |
| 9 | US2025043177 |
|
IN-SITU WAFER MONITORING WITH DYNAMIC BACKSIDE GAS FEEDBACK CONTROL AS WAFER BOW COUNTERMEASURE |
| 10 | JP2025033996 |
|
METHOD FOR FORMING THERMAL SPRAYING FILM AND METHOD FOR PRODUCING THERMAL SPRAYING MATERIAL |
| 11 | JP2025032466 |
|
SCREW HOLDING DEVICE AND SCREW FASTENING DEVICE |
| 12 | JP2025032468 |
|
PLASMA PROCESSING DEVICE AND PLASMA CONTROL METHOD |
| 13 | JP2025033334 |
|
COMPUTER PROGRAM, INFORMATION PROCESSING METHOD, AND INFORMATION PROCESSING DEVICE |
| 14 | JP2025032887 |
|
INFORMATION PROCESSING METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM |
| 15 | JP2025032886 |
|
COMPUTER PROGRAM, INFORMATION PROCESSING METHOD, LEARNING DATA GENERATION METHOD, LEARNING MODEL GENERATION METHOD, AND INFORMATION PROCESSING DEVICE |
| 16 | JP2025032392 |
|
SUBSTRATE PROCESSING DEVICE, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM |
| 17 | US2025033448 |
|
LOW-TEMPERATURE ETCHING OF CARBON-CONTAINING LAYERS |
| 18 | JP2025032791 |
|
SUBSTRATE PROCESSING SYSTEM AND CONVEYANCE METHOD |
| 19 | JP2025032590 |
|
PLASMA PROCESSING DEVICE AND ETCHING METHOD |
| 20 | 18903784 |
|
METHODS FOR FORMING LOW-RESISTIVITY INTERCONNECT STRUCTURES COMPRISING RUTHENIUM |
| 21 | 19414325 |
|
SYSTEM OF PROCESSING SUBSTRATE, TRANSFER METHOD, TRANSFER PROGRAM, AND HOLDER |
| 22 | 19333444 |
|
SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD |
| 23 | 19413273 |
|
FILM FORMING METHOD |
| 24 | 19333364 |
|
INFORMATION PROCESSING METHOD, COMPUTER PROGRAM, AND INFORMATION PROCESSING APPARATUS |
| 25 | 18900130 |
|
METHOD FOR PROCESSING SUBSTRATE |
| 26 | 18904348 |
|
MASK MODIFICATION METHOD |
| 27 | 19331966 |
|
Plasma Processing Apparatus |
| 28 | 19412929 |
|
SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD |
| 29 | JP2025032269 |
|
SUBSTRATE PROCESSING SYSTEM |
| 30 | JP2025033064 |
|
TEMPERATURE CONTROL METHOD AND INSPECTION SYSTEM |
| 31 | JP2025032437 |
|
SUBSTRATE PROCESSING APPARATUS |
| 32 | US2025033167 |
|
PATTERNING SEMICONDUCTOR MATERIALS USING SURFACE MODIFICATION TECHNIQUES |
| 33 | JP2025032579 |
|
ETCHING METHOD AND PLASMA PROCESSING DEVICE |
| 34 | JP2025032464 |
|
INFORMATION PROCESSING METHOD, EXPERIMENT METHOD, AND COMPUTER PROGRAM |
| 35 | JP2025032474 |
|
COMPUTER PROGRAM, INFORMATION PROCESSING METHOD, AND INFORMATION PROCESSING DEVICE |
| 36 | US2025040626 |
|
METHODS FOR DETERMINING A TEMPERATURE ACHIEVED BY A HEATING PROCESS |
| 37 | US2025032911 |
|
METHODS FOR WET ATOMIC LAYER ETCHING OF TUNGSTEN USING HALOGENATION |
| 38 | US2025033702 |
|
STEP RAMP GRADING YIELD ENHANCEMENT FOR HYBRID BONDING |
| 39 | JP2025032759 |
|
SUBSTRATE CONVEYANCE MODULE AND METHOD FOR OPERATING SUBSTRATE CONVEYANCE MODULE |
| 40 | JP2025032880 |
|
COMPUTER PROGRAM, INFORMATION PROCESSING METHOD, LEARNING MODEL GENERATION METHOD, AND INFORMATION PROCESSING DEVICE |
| 41 | JP2025032773 |
|
SUBSTRATE PROCESSING DEVICE |
| 42 | JP2025032917 |
|
INFORMATION PROCESSING METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM |
1



