Abrégé

An energy supply for a test device includes an energy source configured to provide energy via an inductive element for use by test circuitry; and an energy recovery circuit electrically couplable to the energy source and configured to direct unused energy from the inductive element to the energy source.

Classes IPC  ?

• G01R 31/26 - Test de dispositifs individuels à semi-conducteurs
• G01R 1/36 - Aménagements ou circuits de protection contre les surcharges, pour appareils de mesures électriques

Abrégé

A method is provided for using a loop-back test device to verify continuity between loop-back probes electrically connected to each other on a probe card, the loop-back test device including a first conductive region electrically connected to a substrate, a second conductive region electrically isolated from the substrate, the second conductive region spaced apart from the first conductive region such that when a first loop-back probe contacts the first conductive region a second loop-back probe contacts the second conductive region, The method includes placing the first loop-back probe in electrical contact with the first conductive region, and placing the second loop-back probe in electrical contact with the second conductive region. Continuity between the substrate and the second conductive region is then measured.

Classes IPC  ?

• G01R 1/067 - Sondes de mesure
• G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux

Abrégé

A device and method for limiting damage to a semiconductor device under test when the semiconductor device fails during a high current, or high power test is provided. The occurrence of a failure of the device under test is detected, and power applied to the semiconductor device is diverted through a parallel path element upon detection of failure of the semiconductor device.

Classes IPC  ?

• G01R 1/067 - Sondes de mesure
• G01R 1/36 - Aménagements ou circuits de protection contre les surcharges, pour appareils de mesures électriques
• G01R 31/12 - Test de la rigidité diélectrique ou de la tension disruptive
• G01R 31/27 - Test de dispositifs sans les extraire physiquement du circuit dont ils font partie, p. ex. compensation des effets dus aux éléments environnants
• G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
• G01R 31/26 - Test de dispositifs individuels à semi-conducteurs
• G01R 31/02 - Essai des appareils, des lignes ou des composants électriques pour y déceler la présence de courts-circuits, de discontinuités, de fuites ou de connexions incorrectes de lignes

Abrégé

A device and method for limiting damage to a semiconductor device under test when the semiconductor device fails during a high current, or high power test is provided. The occurrence of a failure of the device under test is detected, and power applied to the semiconductor device is diverted through a parallel path element upon detection of failure of the semiconductor device.

Classes IPC  ?

• G01R 31/26 - Test de dispositifs individuels à semi-conducteurs

Abrégé

A test system, apparatus and method for applying high current test stimuli to a semiconductor device in wafer or chip form includes a plurality of probes for electrically coupling to respective contact points on the semiconductor device, a plurality of current limiters electrically coupled to respective ones of the plurality of probes, and a current sensor electrically coupled to the plurality of probes. The current limiters are operative to limit current flow passing through a respective probe, and the current sensor is operative to provide a signal when detected current in any contact of the plurality of probes exceeds a threshold level.

Classes IPC  ?

• G01R 31/02 - Essai des appareils, des lignes ou des composants électriques pour y déceler la présence de courts-circuits, de discontinuités, de fuites ou de connexions incorrectes de lignes
• G01R 31/26 - Test de dispositifs individuels à semi-conducteurs
• G01R 1/00 - Détails ou dispositions des appareils des types couverts par les groupes ou

Produits et services

commercial work stations including accessories and components therefor for building, testing and repairing probe cards for use in semiconductor manufacture