HORIBA, Ltd.

Japon

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Type PI
        Brevet 1 239
        Marque 231
Juridiction
        États-Unis 723
        International 691
        Europe 44
        Canada 12
Propriétaire / Filiale
[Owner] HORIBA, Ltd. 822
HORIBA STEC, Co., Ltd. 340
Horiba Instruments Incorporated 125
Horiba ABX SAS 112
Horiba Jobin Yvon SAS 48
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Date
Nouveautés (dernières 4 semaines) 11
2025 septembre (MACJ) 3
2025 août 8
2025 juillet 12
2025 juin 18
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Classe IPC
G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques 93
G01N 1/22 - Dispositifs pour prélever des échantillons à l'état gazeux 81
G01M 17/007 - Véhicules à roues ou à chenilles 78
G01N 15/02 - Recherche de la dimension ou de la distribution des dimensions des particules 70
G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X 65
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Classe NICE
09 - Appareils et instruments scientifiques et électriques 190
07 - Machines et machines-outils 30
10 - Appareils et instruments médicaux 27
42 - Services scientifiques, technologiques et industriels, recherche et conception 27
37 - Services de construction; extraction minière; installation et réparation 25
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Statut
En Instance 121
Enregistré / En vigueur 1 349
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1.

THERMAL CONDUCTIVITY GAS ANALYZER

      
Numéro d'application JP2025006631
Numéro de publication 2025/182986
Statut Délivré - en vigueur
Date de dépôt 2025-02-26
Date de publication 2025-09-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Shintaku Akira

Abrégé

A thermal conductivity gas analyzer according to the present invention comprises: a plurality of cells respectively housing resistors constituting a Wheatstone bridge circuit; a first flow path section through which a sample gas or a reference gas flows; a second flow path section provided so as to branch off of the first flow path section; and a supply gas switching unit connected to the first flow path section. Each resistor is constituted by a thermal conductivity thin-film sensor or a thermal conductivity semiconductor sensor. The plurality of cells include measurement cells that respectively house resistors located on one pair of opposite sides of the Wheatstone bridge circuit. The second flow path section connects to the measurement cells. The supply gas switching unit alternately supplies the sample gas and the reference gas to the first flow path section.

Classes IPC  ?

  • G01N 27/18 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance d'un corps chauffé électriquement dépendant de variations de température produite par des variations de la conductivité thermique d'un matériau de l'espace environnant à tester
  • G01N 25/18 - Recherche ou analyse des matériaux par l'utilisation de moyens thermiques en recherchant la conductivité thermique

2.

RADIATION TEMPERATURE MEASUREMENT DEVICE, RADIATION TEMPERATURE MEASUREMENT METHOD, AND RADIATION TEMPERATURE MEASUREMENT PROGRAM

      
Numéro d'application JP2025005873
Numéro de publication 2025/182774
Statut Délivré - en vigueur
Date de dépôt 2025-02-20
Date de publication 2025-09-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Fujino, Sho
  • Saito, Takashi
  • Tominaga, Koji
  • Hirai, Asuka

Abrégé

A radiation temperature measurement device 100 that detects infrared rays radiated from a measurement subject W to measure the temperature of the measurement subject W, the radiation temperature measurement device 100 comprising: an infrared ray detection unit 2 that detects the respective infrared ray amounts of a plurality of wavelength components and that detects the infrared ray amount of each of a plurality of polarization components in at least one of the plurality of wavelength components; and a temperature computation unit 3 that computes the temperature of the measurement subject W on the basis of at least three kinds of infrared ray amounts detected by the infrared ray detection unit 2.

Classes IPC  ?

  • G01J 5/59 - Pyrométrie des radiations, p. ex. thermométrie infrarouge ou optique en utilisant la polarisationLeurs détails
  • G01J 5/00 - Pyrométrie des radiations, p. ex. thermométrie infrarouge ou optique
  • G01J 5/60 - Pyrométrie des radiations, p. ex. thermométrie infrarouge ou optique en utilisant la détermination de la température de couleur

3.

VAPORIZER AND VAPORIZATION SYSTEM

      
Numéro d'application JP2025003893
Numéro de publication 2025/182512
Statut Délivré - en vigueur
Date de dépôt 2025-02-06
Date de publication 2025-09-04
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s)
  • Hirai, Soichiro
  • Yada, Hidetaka

Abrégé

This vaporizer vaporizes a liquid material by heating a heating flow path through which the liquid material flows, and is characterized by including: a filter that is provided in the heating flow path and collects particles flowing through the heating flow path; a heat exchanger that is provided upstream of the filter in the heating flow path and performs heat exchange with the liquid material; and a pre-filter that is provided upstream of the filter in the heating flow path and collects the particles. The vaporizer is also characterized in that, in a cross-section taken orthogonal to the direction in which the fluid flows, a cross-section of the filter is provided so as to block the heating flow path, and a cross-section of the pre-filter does not block the heating flow path when compared to the cross-section of the filter.

Classes IPC  ?

  • C23C 16/448 - Revêtement chimique par décomposition de composés gazeux, ne laissant pas de produits de réaction du matériau de la surface dans le revêtement, c.-à-d. procédés de dépôt chimique en phase vapeur [CVD] caractérisé par le procédé de revêtement caractérisé par le procédé utilisé pour produire des courants de gaz réactifs, p. ex. par évaporation ou par sublimation de matériaux précurseurs
  • B01J 7/02 - Appareillage pour la production de gaz par voie humide
  • H01L 21/205 - Dépôt de matériaux semi-conducteurs sur un substrat, p. ex. croissance épitaxiale en utilisant la réduction ou la décomposition d'un composé gazeux donnant un condensat solide, c.-à-d. un dépôt chimique

4.

FLUID DEVICE

      
Numéro d'application 19057586
Statut En instance
Date de dépôt 2025-02-19
Date de la première publication 2025-08-21
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Horiguchi, Hiroshi

Abrégé

According to the present invention, it is possible to fix a fluid resistance element to a flow path while reducing positional displacement or vibration of the fluid resistance element in the flow path. A fixing mechanism that fixes a fluid resistance element to an internal flow path includes: an element holder that holds the fluid resistance element; a holder mounting portion that is formed to communicate with the internal flow path in a flow path block and on which the element holder is mounted; and a seal member interposed between the element holder and the holder mounting portion. In a state where the seal member is crushed by the element holder and a surface facing the element holder in the holder mounting portion, the element holder is positioned and mounted on the holder mounting portion.

Classes IPC  ?

  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques
  • G01F 1/34 - Mesure du débit volumétrique ou du débit massique d'un fluide ou d'un matériau solide fluent, dans laquelle le fluide passe à travers un compteur par un écoulement continu en utilisant des effets mécaniques en mesurant la pression ou la différence de pression
  • G01F 15/00 - Détails des appareils des groupes ou accessoires pour ces derniers, dans la mesure où de tels accessoires ou détails ne sont pas adaptés à ces types particuliers d'appareils, p. ex. pour l'indication à distance

5.

UCMN

      
Numéro d'application 1870108
Statut Enregistrée
Date de dépôt 2025-06-09
Date d'enregistrement 2025-06-09
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Apparatus and instruments for measuring unburnt combustible content in ash, and parts and fittings therefor; apparatus and instruments for measuring and analyzing unburnt combustible content in ash, and parts and fittings therefor; gas measuring and analyzing apparatus and instruments, and parts and fittings therefor; mass concentration measuring apparatus and instruments, and parts and fittings therefor; mass concentration measuring and analyzing apparatus and instruments, and parts and fittings therefor; X-ray fluorescence apparatus and instruments for elemental analysis, and parts and fittings therefor; X-ray fluorescence apparatus and instruments for elemental measurement and analysis, and parts and fittings therefor; computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; computer software for controlling gas measuring and analyzing apparatus and instruments; computer software for controlling mass concentration measuring apparatus and instruments; computer software for controlling mass concentration measuring and analyzing apparatus and instruments; computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; computer software for measuring or testing machines and instruments; computer software for laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair and maintenance of apparatus and instruments for measuring unburnt combustible content in ash; repair and maintenance of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; repair and maintenance of gas measuring and analyzing apparatus and instruments; repair and maintenance of mass concentration measuring apparatus and instruments; repair and maintenance of mass concentration measuring and analyzing apparatus and instruments; repair and maintenance of X-ray fluorescence apparatus and instruments for elemental analysis; repair and maintenance of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; repair and maintenance of measuring or testing machines and instruments; repair and maintenance of laboratory apparatus and instruments; repair and maintenance of electronic machines and apparatus; repair and maintenance of optical machines and apparatus; repair and maintenance of cinematographic machines and apparatus; repair and maintenance of photographic machines and apparatus. Rental of apparatus and instruments for measuring unburnt combustible content in ash; rental of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; rental of gas measuring and analyzing apparatus and instruments; rental of mass concentration measuring apparatus and instruments; rental of mass concentration measuring and analyzing apparatus and instruments; rental of X-ray fluorescence apparatus and instruments for elemental analysis; rental of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of apparatus and instruments for measuring unburnt combustible content in ash; calibration of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; calibration of gas measuring and analyzing apparatus and instruments; calibration of mass concentration measuring apparatus and instruments; calibration of mass concentration measuring and analyzing apparatus and instruments; calibration of X-ray fluorescence apparatus and instruments for elemental analysis; calibration of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of apparatus and instruments for measuring unburnt combustible content in ash; design of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; design of gas measuring and analyzing apparatus and instruments; design of mass concentration measuring apparatus and instruments; design of mass concentration measuring and analyzing apparatus and instruments; design of X-ray fluorescence apparatus and instruments for elemental analysis; design of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; design, programming and maintenance of computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; design, programming and maintenance of computer software for controlling gas measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling mass concentration measuring apparatus and instruments; design, programming and maintenance of computer software for controlling mass concentration measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; design, programming and maintenance of computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; design, programming and maintenance of computer software; rental of computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; rental of computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; rental of computer software for controlling gas measuring and analyzing apparatus and instruments; rental of computer software for controlling mass concentration measuring apparatus and instruments; rental of computer software for controlling mass concentration measuring and analyzing apparatus and instruments; rental of computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; rental of computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; rental of computer software; providing on-line non-downloadable computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; providing on-line non-downloadable computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; providing on-line non-downloadable computer software for controlling gas measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling mass concentration measuring apparatus and instruments; providing on-line non-downloadable computer software for controlling mass concentration measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; providing on-line non-downloadable computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

6.

PARTICLE ANALYSIS DEVICE

      
Numéro d'application 18702425
Statut En instance
Date de dépôt 2023-01-17
Date de la première publication 2025-08-14
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abrégé

In order to enable a device to be installed in a limited space on the periphery of a line and to keep a path for transportation of a sample from the line short, the present invention is configured so as to comprise a flow cell through which a sample including particles flows, a light source for radiating light to the particles in the flow cell, a photodetector for detecting secondary light from the particles, and a computation circuit for detecting an autocorrelation function from a light intensity signal outputted from the photodetector and analyzing the autocorrelation function or the particles included in the sample, an optical system unit including the flow cell and the light source, and a control unit including the photodetector and the computation circuit being separate from each other and connected via a light guiding member for guiding the secondary light to the photodetector.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques

7.

LIQUID MATERIAL VAPORIZING DEVICE, METHOD FOR CONTROLLING LIQUID MATERIAL VAPORIZING DEVICE, AND PROGRAM FOR CONTROLLING LIQUID MATERIAL VAPORIZING DEVICE

      
Numéro d'application JP2024045290
Numéro de publication 2025/169623
Statut Délivré - en vigueur
Date de dépôt 2024-12-20
Date de publication 2025-08-14
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s)
  • Kawakado, Hajime
  • Oba, Hidenori
  • Taguchi, Akihiro

Abrégé

This liquid material vaporizing device comprises: a tank 1 that stores a liquid material and in which the liquid material is vaporized; a supply path R1 that supplies the liquid material to the tank 1; a liquid level detection unit 2 that detects at least a first liquid level that is one of the liquid levels in the tank 1; a valve V1 that is provided in the supply path R1 and opens and closes the supply path R1; and a valve control unit 41 that opens the valve V1 to supply the liquid material to the tank 1 when the liquid level in the tank 1 is less than the first liquid level. The valve control unit 41 provides a closing duration at least once in which the closed state of the valve V1 continues until the liquid level in the tank 1 reaches the first liquid level from a level less than the first liquid level.

Classes IPC  ?

  • B01J 7/00 - Appareillage pour la production de gaz
  • B01J 4/00 - Dispositifs d'alimentationDispositifs de commande d'alimentation ou d'évacuation
  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques

8.

APPARATUS AND METHOD FOR TESTING AUTOMATED VEHICLES

      
Numéro d'application 19189329
Statut En instance
Date de dépôt 2025-04-25
Date de la première publication 2025-08-07
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s) Breton, Leo Alphonse Gerard

Abrégé

A vehicle test system includes a free-wheeling automobile wheel including a rim defining a rim passage, and a bearing that extends through the rim passage such that the bearing is outside the rim to support the free-wheeling automobile wheel and retracts through the rim passage such that the bearing is inside the rim.

Classes IPC  ?

  • G01M 17/013 - Roues
  • G07C 5/08 - Enregistrement ou indication de données de marche autres que le temps de circulation, de fonctionnement, d'arrêt ou d'attente, avec ou sans enregistrement des temps de circulation, de fonctionnement, d'arrêt ou d'attente

9.

ENERGY ANALYSIS DEVICE, ENERGY MANAGEMENT SYSTEM, ENERGY ANALYSIS PROGRAM, AND ENERGY ANALYSIS METHOD

      
Numéro d'application JP2025002590
Numéro de publication 2025/164611
Statut Délivré - en vigueur
Date de dépôt 2025-01-28
Date de publication 2025-08-07
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Higa, Kazushi
  • Iwao, Keijiro
  • Shiomi, Kenji
  • Kakino, Toru

Abrégé

The present invention enables efficient efforts for energy saving by analyzing electric power consumption data of a plurality of electric power supply facilities, the invention comprising: an electric power consumption data acquisition unit that acquires electric power consumption data of each of a plurality of electric power supply facilities for supplying electric power to a plurality of energy demand facilities; an electric power supply pattern model generation unit that performs multivariate analysis on the electric power consumption data, and generates an electric power supply pattern profile in which the plurality of electric power supply facilities are respectively classified into a plurality of electric power fluctuation patterns and/or an electric power supply pattern operation state sequence indicating operation states over time of the electric power supply pattern profile; and an electric power load amount calculation unit that, on the basis of the electric power supply pattern profile and/or the electric power supply pattern operation state sequence, calculates the electric power load amount of a plurality of energy demand facilities or the plurality of electric power supply facilities corresponding to the plurality of electric power fluctuation patterns, or the electric power load amount over time corresponding to the plurality of electric power fluctuation patterns.

Classes IPC  ?

  • H02J 13/00 - Circuits pour pourvoir à l'indication à distance des conditions d'un réseau, p. ex. un enregistrement instantané des conditions d'ouverture ou de fermeture de chaque sectionneur du réseauCircuits pour pourvoir à la commande à distance des moyens de commutation dans un réseau de distribution d'énergie, p. ex. mise en ou hors circuit de consommateurs de courant par l'utilisation de signaux d'impulsion codés transmis par le réseau
  • G06Q 50/06 - Fourniture d’énergie ou d’eau

10.

GAS-LIQUID MIXER AND LIQUID MATERIAL VAPORIZER

      
Numéro d'application 19041070
Statut En instance
Date de dépôt 2025-01-30
Date de la première publication 2025-08-07
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Hirai, Soichiro
  • Nishiwaki, Keisuke

Abrégé

To reduce pressure loss in a gas-liquid mixer, provided is a main body block for mixing together a liquid material and a carrier gas, and a control valve disposed in the main body block that adjusts a flow rate of the liquid material. An annular liquid material supply groove having a supply port for the liquid material formed in an inner surface thereof, and an annular gas-liquid mixing groove having a supply port for the carrier gas and a discharge port for the gas-liquid mixture formed in an inner surface thereof are formed in a valve seat portion of the main body block which the control valve is either in contact with or is separated from. One of either the liquid material supply groove or the gas-liquid mixing groove is formed on an inner side of the other of the liquid material supply groove or the gas-liquid mixing groove.

Classes IPC  ?

  • B01F 35/83 - Formation d'un rapport prédéterminé des substances à mélanger en commandant le rapport entre plusieurs débits, p. ex. en utilisant des dispositifs de détection ou de commande du débit
  • B01F 23/213 - Mélange de gaz avec des liquides par l’ajout de liquides dans les milieux gazeux par pulvérisation ou atomisation des liquides
  • B01F 35/90 - Systèmes de chauffage ou de refroidissement

11.

PLASMA GENERATOR AND COOLING JACKET

      
Numéro d'application 19041307
Statut En instance
Date de dépôt 2025-01-30
Date de la première publication 2025-08-07
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Watanabe, Yoshio

Abrégé

A plasma generator includes: a microwave-generating source that generates a microwave; a cylindrical plasma generation tube through which a gas to be plasmatized by the microwave flows; a waveguide that transmits the microwave to the plasma generation tube; a matching device provided to the waveguide between the microwave-generating source and the plasma generation tube; a cooling jacket that is provided on an outer peripheral surface of the plasma generation tube for cooling; and a cylindrical casing that houses the plasma generation tube and the cooling jacket. The cooling jacket includes: three slits that extend along a traveling direction of the gas flowing through the plasma generation tube, or along a direction inclined with respect to the traveling direction, and through which the microwave passes toward the plasma generation tube; and a cooling channel that is provided between the slits adjacent to each other, and through which a cooling fluid flows.

Classes IPC  ?

  • H01J 37/32 - Tubes à décharge en atmosphère gazeuse
  • H01J 37/244 - DétecteursComposants ou circuits associés

12.

MULTI-TRACK RAMAN ANALYZER

      
Numéro d'application US2025013122
Numéro de publication 2025/160520
Statut Délivré - en vigueur
Date de dépôt 2025-01-27
Date de publication 2025-07-31
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s)
  • Vezard, Nicolas
  • Tuladhar, Aashish
  • George, Chris

Abrégé

A spectroscopy system simultaneously obtains Raman measurements from multiple samples or multiple areas of a liquid or solid sample. At least two Raman probes simultaneously acquire spectra from the sample(s) using an imaging spectrometer having a single shared two-dimensional scientific CMOS sensor. Each probe is coupled to a laser, which may be integrated into the probe, and the spectrometer and includes a lens focusing laser light within or on the sample and collecting light from the sample for the spectrometer. The spectrometer images light from multiple probes simultaneously on the scientific CMOS sensor, spaced from one another to reduce crosstalk. A sample positioning device and a probe positioning mechanism may provide relative movement between samples or sample areas and the probes to acquire data from a different subset of samples or sample areas, and may also adjust probe distance from the sample(s) for desired laser focus spot size and location.

Classes IPC  ?

13.

Flow ratio controller system operating in alternative control modes

      
Numéro d'application 18416713
Numéro de brevet 12399516
Statut Délivré - en vigueur
Date de dépôt 2024-01-18
Date de la première publication 2025-07-24
Date d'octroi 2025-08-26
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Lowery, Patrick
  • Gundlach, Maximilian Martin
  • Yasuda, Tadahiro
  • Price, Andrew

Abrégé

A flow ratio controller system includes an inlet receiving a total inlet fluid flow from one or more inlet channels, distribution channels fluidically connected to the inlet and arranged in parallel in a branching flow path downstream of the inlet, and a controller. The distribution channels includes a hybrid distribution channel. The controller selectively operates in alternative control modes including a flow verification control mode and a flow ratio control mode. In the flow verification control mode, the controller calculates a calibrated value for a reference volume using measurements from a mass flow meter in the hybrid distribution channel, then calculates a target channel calibration value for the mass flow meter in the target distribution channel. In the flow ratio control mode, the controller controls each of the distribution channels, including the hybrid channel, according to a respective flow ratio setpoint for each distribution channel.

Classes IPC  ?

  • G05D 11/13 - Commande du rapport des débits de plusieurs matériaux fluides ou fluents caractérisée par l'usage de moyens électriques
  • G01F 25/10 - Test ou étalonnage des appareils pour la mesure du volume, du débit volumétrique ou du niveau des liquides, ou des appareils pour compter par volume des débitmètres

14.

RADIATION DETECTION DEVICE AND RADIATION DETECTOR

      
Numéro d'application 18851523
Statut En instance
Date de dépôt 2023-04-25
Date de la première publication 2025-07-10
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga, Daisuke
  • Minowa, Hiroki

Abrégé

A radiation detection device including an illumination unit illuminating a sample, an irradiation unit irradiating the sample with X-rays and a radiation detection element detecting X-rays generated from the sample is provided with a magnetic field production unit that produces a magnetic field in part of a space from the sample to the radiation detection element and a block that holds the magnetic field production unit. The block is located at a position where light from the illumination unit to the radiation detection element is shielded.

Classes IPC  ?

  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
  • G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs

15.

RADIATION DETECTION ELEMENT, RADIATION DETECTOR, RADIATION DETECTION DEVICE, AND METHOD FOR MANUFACTURING RADIATION DETECTION ELEMENT

      
Numéro d'application 18681896
Statut En instance
Date de dépôt 2022-08-18
Date de la première publication 2025-07-10
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Ishikura, Koji

Abrégé

A radiation detection element includes: a semiconductor part including an incidence surface to which radiations to be detected are incident; a first electrode provided on the incidence surface; and a second electrode that is provided on the incidence surface and is disposed at a position surrounding the periphery of the first electrode. The radiation detection element is a silicon drift-type radiation detection element, and is provided with an insulating protective film that covers the second electrode.

Classes IPC  ?

  • G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs
  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
  • H10F 39/00 - Dispositifs intégrés, ou ensembles de plusieurs dispositifs, comprenant au moins un élément couvert par le groupe , p. ex. détecteurs de rayonnement comportant une matrice de photodiodes
  • H10F 39/18 - Capteurs d’images à semi-conducteurs d’oxyde de métal complémentaire [CMOS]Capteurs d’images à matrice de photodiodes

16.

CONVEYANCE DEVICE, ANALYSIS SYSTEM, PROGRAM FOR CONVEYANCE DEVICE, AND CONVEYANCE METHOD

      
Numéro d'application 18853181
Statut En instance
Date de dépôt 2023-03-31
Date de la première publication 2025-07-10
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Tatewaki, Yasuhiro
  • Mori, Tetsuya

Abrégé

To provide a conveyance device that is more user-friendly than conventional devices, and further enhance workability, a conveyance device that conveys a container accommodating a sample to an analysis device includes: a pallet in which a plurality of installation portions is provided, the container being installed in the installation portions; sensors that are provided for the respective installation portions in one-to-one correspondence, and acquire container information that is information obtained when the container is installed; a conveyance unit that picks up the container installed in the pallet, and conveys the container to the analysis device; and a conveyance control unit that causes the conveyance unit to pick up the container in accordance with a pick-up order determined on the basis of the container information.

Classes IPC  ?

  • G01N 35/04 - Détails du transporteur
  • B65G 1/137 - Dispositifs d'emmagasinage mécaniques avec des aménagements ou des moyens de commande automatique pour choisir les objets qui doivent être enlevés
  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet

17.

GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM FOR GAS ANALYSIS DEVICE

      
Numéro d'application JP2024043601
Numéro de publication 2025/142454
Statut Délivré - en vigueur
Date de dépôt 2024-12-10
Date de publication 2025-07-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Mizutani, Naoto
  • Nakamura, Kentaro

Abrégé

This gas analysis device is for analyzing a target gas containing hydrogen gas that is a main component and at least one impurity gas that is a sub-component. The gas analysis device comprises: a comparison chamber where a first resistance element that has a constant current flowing therethrough and that generates heat is disposed, and where hydrogen gas is introduced into; a measurement chamber where a second resistance element that has a constant current flowing therethrough and that generates heat is disposed, and where the target gas is introduced into; a bridge circuit that is formed by comprising the first resistance element and the second resistance element in a closed circuit and that detects the resistivity of the second resistance element or a related value thereof; a calibration curve data storage unit that is for storing calibration curve data that indicates, using the hydrogen gas as a base gas and a predetermined single component gas other than the hydrogen gas as a span gas, the relationship between the resistivity of the second resistance element detected by the bridge circuit or a related value thereof and the concentration of the span gas; and a concentration calculation unit for estimating the total concentration of the impurity gas in the target gas in terms of a gas component in which the thermal conductivity is greater than or equal to that of oxygen, on the basis of the calibration curve data and the resistivity of the second resistance element detected by the bridge circuit or the related value thereof.

Classes IPC  ?

  • G01N 25/18 - Recherche ou analyse des matériaux par l'utilisation de moyens thermiques en recherchant la conductivité thermique
  • G01N 27/12 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance d'un corps solide dépendant de l'absorption d'un fluideRecherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance d'un corps solide dépendant de la réaction avec un fluide

18.

MEASUREMENT PROBE, MEASUREMENT PROBE UNIT, MEASUREMENT DEVICE, AND MEASUREMENT METHOD

      
Numéro d'application JP2024044569
Numéro de publication 2025/142627
Statut Délivré - en vigueur
Date de dépôt 2024-12-17
Date de publication 2025-07-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Wakabayashi Satoru

Abrégé

Provided is a measurement probe for realizing a measurement device capable of measuring characteristic values of biopolymers, such as protein, in real time at a lower concentration than conventional devices. The measurement probe is used by being connected to a light source and a detector by means of an optical fiber, and comprises: a cylindrical housing having a first port and a second port formed at one end, the first port introducing light from a first optical fiber and outputting light to the first optical fiber, and the second port outputting light to a second optical fiber; a reflective member that is located inside the housing, is provided at an end of the housing on the opposite side to the end at which the first port and the second port are formed, and reflects and refracts light introduced from the first port toward the second port; and a measurement target liquid accommodating portion formed between two window members that are disposed on an output optical path passing between the reflective member and the second port.

Classes IPC  ?

19.

ION ANALYSIS DEVICE AND ION ANALYSIS METHOD

      
Numéro d'application JP2024041993
Numéro de publication 2025/142287
Statut Délivré - en vigueur
Date de dépôt 2024-11-27
Date de publication 2025-07-03
Propriétaire
  • HORIBA ADVANCED TECHNO, CO., LTD. (Japon)
  • HORIBA, LTD. (Japon)
Inventeur(s)
  • Miyamura, Kazuhiro
  • Kido, Masanori
  • Okada, Yoichi
  • Yamashita, Tsubasa

Abrégé

Provided is an ion analysis device capable of performing measurements using a sample liquid with a smaller liquid volume than conventional methods. The ion analysis device comprises: a measurement electrode provided with a response unit which responds to ions; a reference electrode provided with a liquid junction section; a measurement flow path in which the response membrane and the liquid junction section are disposed; and a calculation unit that calculates the ion concentration in the sample liquid on the basis of the potential difference between the measurement electrode and the reference electrode, the device further comprising a hydrophilic section connecting the response unit and the liquid junction section inside the measurement flow path.

Classes IPC  ?

  • G01N 27/416 - Systèmes
  • G01N 27/28 - Composants de cellules électrolytiques
  • G01N 27/30 - Électrodes, p. ex. électrodes pour testsDemi-cellules
  • H01M 8/02 - Éléments à combustibleLeur fabrication Détails
  • H01M 8/04 - Dispositions auxiliaires, p. ex. pour la commande de la pression ou pour la circulation des fluides
  • H01M 8/0444 - ConcentrationDensité

20.

END POINT DETECTION DEVICE, ETCHING CONTROL SYSTEM, END POINT DETECTION METHOD, AND END POINT DETECTION PROGRAM

      
Numéro d'application 18999366
Statut En instance
Date de dépôt 2024-12-23
Date de la première publication 2025-07-03
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Imanishi, Michie
  • Hada, Miyako
  • Sakaguchi, Yuhei
  • Minami, Masakazu
  • Takahashi, Motonobu

Abrégé

An end point detection device that detects an end point in etching processing of a multilayer film, includes a measurement unit that measures a physical quantity that changes with the etching processing, an end point detection unit that detects an end point in a target film for which the end point is to be detected using a predetermined detection algorithm based on a measurement value obtained by the measurement unit, and an algorithm change unit that changes the detection algorithm in the film that is being subjected to the etching processing based on the measurement value obtained by the measurement unit when another film of a same type as the target film was being subjected to the etching processing in a same multilayer film as the target film currently being etching processed.

Classes IPC  ?

  • H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants

21.

VEHICLE TESTING SYSTEM, VEHICLE TESTING METHOD, AND VEHICLE TESTING PROGRAM

      
Numéro d'application JP2024043828
Numéro de publication 2025/142489
Statut Délivré - en vigueur
Date de dépôt 2024-12-11
Date de publication 2025-07-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Shiota Aoi
  • Kawazoe Hiroshi

Abrégé

This vehicle testing system comprises: a first output pattern acquiring unit that acquires, as a first output pattern, travel data when a target vehicle travels in a prescribed environment; a second output pattern acquiring unit that acquires, as a second output pattern, travel data when a traveling vehicle travels along a prescribed travel route; a data acquiring unit that acquires, from the first output pattern, a plurality of items of similar data and a plurality of items of instantaneous energy consumption data; and a calculating unit that adds up a plurality of instantaneous energy consumptions to calculate a total energy consumption when the target vehicle is assumed to travel along the prescribed travel route.

Classes IPC  ?

22.

FLUORESCENCE MEASUREMENT PROBE, FLUORESCENCE MEASUREMENT PROBE UNIT, AND FLUORESCENCE MEASURING DEVICE

      
Numéro d'application JP2024044582
Numéro de publication 2025/142635
Statut Délivré - en vigueur
Date de dépôt 2024-12-17
Date de publication 2025-07-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Wakabayashi, Satoru

Abrégé

Provided is a fluorescence measuring device capable of measuring biopolymers such as proteins in real time at lower concentrations than in conventional devices. This fluorescence measurement probe is used by being connected by an optical fiber to a light source for irradiating a liquid being measured with excitation light and a detector for detecting fluorescence derived from the liquid being measured that is excited by the excitation light from the light source, the fluorescence measurement probe being provided with: a port for introducing the excitation light from the optical fiber and for guiding out fluorescence and scattered light from the liquid being measured to the optical fiber; a condensing optical system for collimating and/or condensing the excitation light, the fluorescence, and the scattered light; a polarizing plate transparent to the excitation light, the fluorescence, and the scattered light; and a housing for internally accommodating the condensing optical system and the polarizing plate and having an opening portion for injecting the excitation light into the liquid being measured and taking in the fluorescence and the scattered light from the liquid being measured.

Classes IPC  ?

23.

HYDROGEN ELECTROCHEMICAL SYSTEM, METHOD FOR DETERMINING STATE OF HYDROGEN CELL STACK, AND PROGRAM

      
Numéro d'application JP2024045705
Numéro de publication 2025/142931
Statut Délivré - en vigueur
Date de dépôt 2024-12-24
Date de publication 2025-07-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga Shimpachi
  • Higa Kazushi
  • Yamashita Tsubasa

Abrégé

In the present invention, a hydrogen electrochemical system 100 comprises an acquisition unit 541, a storage unit 53, and a determination unit 544. The acquisition unit 541 acquires at least distribution information Ds2, De2, and Dt2 indicating the distribution of a physical quantity Q in a hydrogen cell stack 1. In the hydrogen cell stack 1, water is generated by an electrochemical reaction in which hydrogen is used, or vice versa. The storage unit 53 stores correlation data Dc. The correlation data Dc indicates a correlation between the state of the hydrogen cell stack 1 and a feature amount φ that is converted from at least the information Ds2 and De2 regarding the distribution in the hydrogen cell stack 1 in a state including a normal state and one or more abnormal states. On the basis of the correlation information Dc, the determination unit 544 determines the state of the hydrogen cell stack 1 from at least the distribution information Dt2 of the hydrogen cell stack 1 in operation.

Classes IPC  ?

  • H01M 8/04 - Dispositions auxiliaires, p. ex. pour la commande de la pression ou pour la circulation des fluides
  • C25B 1/04 - Hydrogène ou oxygène par électrolyse de l'eau
  • C25B 9/00 - Cellules ou assemblages de cellulesÉléments de structure des cellulesAssemblages d'éléments de structure, p. ex. assemblages d'électrode-diaphragmeCaractéristiques des cellules relatives aux procédés
  • C25B 15/025 - Paramètres de l’électrolyte
  • C25B 15/027 - Température
  • H01M 8/10 - Éléments à combustible avec électrolytes solides
  • H01M 8/0432 - TempératureTempérature ambiante
  • H01M 8/04492 - HumiditéHumidité ambianteTeneur en eau
  • H01M 8/04664 - Défaillance ou fonction anormale
  • H01M 8/04992 - Procédés de commande des éléments à combustible ou des systèmes d’éléments à combustible caractérisés par la mise en œuvre d’algorithmes mathématiques ou de calcul, p. ex. les boucles de commande de rétroaction, la logique floue, les réseaux neuronaux ou l’intelligence artificielle

24.

CLEANING DEVICE AND SUBSTRATE PROCESSING SYSTEM

      
Numéro d'application JP2024044607
Numéro de publication 2025/142639
Statut Délivré - en vigueur
Date de dépôt 2024-12-17
Date de publication 2025-07-03
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s) Watanabe Yoshio

Abrégé

This cleaning device 100 for separating an inflow gas Go and particles that are contained in the gas Go includes a housing 1, a plate-shaped baffle 2, and a plurality of plasma units 5. The housing 1 has a cylindrical shape extending in the axial direction Da, and has an inflow port 121 and an outflow port 131 for the gas Go. The baffle 2 is disposed within the housing 1. The plasma units 5 generate plasma within the housing 1. The inside of the housing 1 has a plurality of internal spaces 14, and is configured so that the gas Go flowing thereinto from the inflow port 121 can flow out from the outflow port 131. Some internal spaces 14 adjacent to each other are connected so that the gas Go can flow therethrough. At least some adjacent internal spaces 14 are adjacent to each other by the intermediary of the baffle 2. The plasma units 5 are disposed with respect to at least two internal spaces 14.

Classes IPC  ?

  • C23C 16/44 - Revêtement chimique par décomposition de composés gazeux, ne laissant pas de produits de réaction du matériau de la surface dans le revêtement, c.-à-d. procédés de dépôt chimique en phase vapeur [CVD] caractérisé par le procédé de revêtement
  • C23C 14/00 - Revêtement par évaporation sous vide, pulvérisation cathodique ou implantation d'ions du matériau composant le revêtement
  • H01L 21/31 - Traitement des corps semi-conducteurs en utilisant des procédés ou des appareils non couverts par les groupes pour former des couches isolantes en surface, p. ex. pour masquer ou en utilisant des techniques photolithographiquesPost-traitement de ces couchesEmploi de matériaux spécifiés pour ces couches
  • H01L 21/205 - Dépôt de matériaux semi-conducteurs sur un substrat, p. ex. croissance épitaxiale en utilisant la réduction ou la décomposition d'un composé gazeux donnant un condensat solide, c.-à-d. un dépôt chimique
  • H01L 21/3065 - Gravure par plasmaGravure au moyen d'ions réactifs
  • H05H 1/46 - Production du plasma utilisant des champs électromagnétiques appliqués, p. ex. de l'énergie à haute fréquence ou sous forme de micro-ondes

25.

FLUID CONTROL VALVE, FLUID CONTROL DEVICE, AND FLUID CONTROL VALVE MANUFACTURING METHOD

      
Numéro d'application 18852129
Statut En instance
Date de dépôt 2023-03-27
Date de la première publication 2025-06-26
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Shakudo, Kazuya

Abrégé

The present invention improves the sealability of a fluid control valve, and includes a valve seat having a flat valve seat surface and a valve plug having a flat sitting surface sitting on the valve seat surface. A first surface that is one of the valve seat surface and the sitting surface has a surface hardness higher than a surface hardness of a second surface that is the other one of the valve seat surface and the sitting surface.

Classes IPC  ?

  • F16K 1/42 - Sièges de soupapes
  • F16K 1/54 - Dispositifs pour modifier la façon dont le débit varie pendant le fonctionnement de la soupape
  • F16K 37/00 - Moyens particuliers portés par ou sur les soupapes ou autres dispositifs d'obturation pour repérer ou enregistrer leur fonctionnement ou pour permettre de donner l'alarme

26.

PRESSURE FLOW RATE SENSOR, FLOW RATE CALCULATION DEVICE, FLOW RATE CALCULATION METHOD, FLOW RATE CALCULATION PROGRAM, AND FLUID CONTROL DEVICE

      
Numéro d'application 18990774
Statut En instance
Date de dépôt 2024-12-20
Date de la première publication 2025-06-26
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Yokoi, Shuntaro

Abrégé

The present invention is configured to calculate a flow rate across a wide range of flow rate, from a low range to a high range, and includes: a fluid resistance element provided to a channel; an upstream pressure sensor that detects an upstream pressure with respect to the fluid resistance element; a downstream pressure sensor that detects a downstream pressure with respect to the fluid resistance element; and a flow rate calculation unit that calculates a flow rate based on the upstream pressure and the downstream pressure, in which the flow rate calculation unit calculates the flow rate based on viscous resistance, inertial resistance, and a degree of effect of rarefaction.

Classes IPC  ?

  • G01F 1/36 - Mesure du débit volumétrique ou du débit massique d'un fluide ou d'un matériau solide fluent, dans laquelle le fluide passe à travers un compteur par un écoulement continu en utilisant des effets mécaniques en mesurant la pression ou la différence de pression la pression ou la différence de pression étant produite par une contraction de la veine fluide

27.

PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE

      
Numéro d'application JP2024042708
Numéro de publication 2025/134758
Statut Délivré - en vigueur
Date de dépôt 2024-12-03
Date de publication 2025-06-26
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Sugasawa, Hirosuke

Abrégé

The present invention is a particle size distribution measurement device, wherein is provided a history data management part 33 that facilitates integrated recognition of various stored operations, states of devices, and instantaneous values of particle size measurement results, and that causes a history data storage part D1 to store an operation history indicating the history of operations performed on the particle size distribution measurement device 100 by an operator, a measurement result history indicating the history of particle size measurement results, or a device state history indicating the history of the state of the particle size distribution measurement device 100, in a format that can be displayed as a time-series graph.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques

28.

PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE SIZE DISTRIBUTION MEASUREMENT PROGRAM

      
Numéro d'application JP2024043046
Numéro de publication 2025/134788
Statut Délivré - en vigueur
Date de dépôt 2024-12-05
Date de publication 2025-06-26
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abrégé

This particle size distribution measurement system comprises: a cell that accommodates a test liquid containing particles; a test liquid supply unit that samples the test liquid from a generation flow passage through which the test liquid flows, and supplies the test liquid to the cell via a flow passage; a particle size distribution measurement unit that measures the particle size distribution of the particles by irradiating the test liquid with light and detecting scattered light produced from the particles; a cleaning liquid supply unit that, after the measurement of the particle size distribution is complete, supplies a cleaning liquid to the cell via a flow passage, said cleaning liquid being a liquid that cleans the cell; and a contamination determination unit that determines contamination of the cell on the basis of transmitted light and/or scattered light from the cell during a condition in which the cleaning liquid is supplied to the cell.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques
  • G01N 1/00 - ÉchantillonnagePréparation des éprouvettes pour la recherche
  • G01N 21/15 - Prévention de la souillure des éléments du système optique ou de l'obstruction du chemin lumineux

29.

PARTICLE NUMBER MEASUREMENT SYSTEM, BRAKE INSPECTION SYSTEM, AND PARTICLE NUMBER MEASUREMENT METHOD

      
Numéro d'application JP2024036850
Numéro de publication 2025/134506
Statut Délivré - en vigueur
Date de dépôt 2024-10-16
Date de publication 2025-06-26
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Kitahara, Takahiro
  • Fukushima, Suguru

Abrégé

The present invention reduces the cost for introducing a particle number measurement system, and reduces the difference between the uncertainty in measurement of the number of solid particles and the uncertainty in measurement of the total number of particles. The present invention comprises: a first diluter for diluting a sample gas; an evaporator for vaporizing volatile particles contained in the sample gas diluted by the first diluter; a second diluter for diluting the sample gas that has passed through the evaporator; a first particle number measurement device for measuring the number of particles contained in the sample gas diluted by the second diluter as the number of solid particles obtained by removing the volatile particles; and a second particle number measurement device for measuring the number of particles contained in the sample gas that has been diluted by the first diluter and is yet to pass through the evaporator as the total number of particles including the volatile particles.

Classes IPC  ?

  • G01N 15/06 - Recherche de la concentration des suspensions de particules
  • G01M 17/007 - Véhicules à roues ou à chenilles
  • G01N 1/02 - Dispositifs pour prélever des échantillons
  • G01N 15/00 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux

30.

INFORMATION PROCESSING METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Numéro d'application JP2024041560
Numéro de publication 2025/134691
Statut Délivré - en vigueur
Date de dépôt 2024-11-25
Date de publication 2025-06-26
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Murata, Shunsuke

Abrégé

Provided are an information processing method, an information processing device, and a computer program for outputting a response corresponding to a request of a user with respect to an analysis device. In the present invention, a query pertaining to an analysis device is acquired, a language generation model is used to acquire a response pertaining to control of the analysis device corresponding to the query, and the response is output.

Classes IPC  ?

  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet
  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

31.

RADIATION DETECTION DEVICE, CONTROL METHOD, AND COMPUTER PROGRAM

      
Numéro d'application JP2024041367
Numéro de publication 2025/126801
Statut Délivré - en vigueur
Date de dépôt 2024-11-22
Date de publication 2025-06-19
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga, Daisuke
  • Bamba, Tomohiro

Abrégé

Provided are a radiation detection device, a control method, and a computer program capable of appropriately adjusting the temperature of a radiation detection element. The radiation detection device comprises: a sample chamber inside which a sample is disposed; a radiation detection element that is disposed inside the sample chamber and is for detecting radiation generated from the sample; an atmosphere adjustment unit that adjusts the atmosphere inside the sample chamber to either a state in which the inside of the sample chamber is depressurized or a state in which a predetermined gas is introduced into the sample chamber; a temperature adjustment unit that adjusts the temperature of the radiation detection element; and a control unit. When the atmosphere adjustment unit adjusts the atmosphere inside the sample chamber to the state in which the predetermined gas is introduced, the control unit causes the temperature adjustment unit to adjust the temperature of the radiation detection element to a higher temperature than when the atmosphere adjustment unit adjusts the atmosphere inside the sample chamber to the state in which the inside of the sample chamber is depressurized.

Classes IPC  ?

  • H01J 37/244 - DétecteursComposants ou circuits associés
  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
  • G01T 7/00 - Détails des instruments de mesure des radiations
  • H01J 37/252 - Tubes analyseurs à spot par faisceaux électroniques ou ioniquesMicro-analyseurs

32.

XTROLOGY

      
Numéro d'application 1859351
Statut Enregistrée
Date de dépôt 2025-04-03
Date d'enregistrement 2025-04-03
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

Semiconductor wafer inspection apparatus; analyzing apparatus for defect of semiconductor wafers; analyzing apparatus for stress of semiconductor wafers; analyzing apparatus for composition of semiconductor wafers; semiconductor wafer measuring apparatus; semiconductor wafer testing apparatus; semiconductor photomask inspection apparatus; analyzing apparatus for defect of semiconductor photomasks; analyzing apparatus for stress of semiconductor photomasks; analyzing apparatus for composition of semiconductor photomasks; semiconductor photomask measuring apparatus; semiconductor photomask testing apparatus; semiconductor reticle inspection apparatus; analyzing apparatus for defect of semiconductor reticles; analyzing apparatus for stress of semiconductor reticles; analyzing apparatus for composition of semiconductor reticles; semiconductor reticle measuring apparatus; semiconductor reticle testing apparatus; semiconductor substrate inspection apparatus; analyzing apparatus for defect of semiconductor substrates; analyzing apparatus for stress of semiconductor substrates; analyzing apparatus for composition of semiconductor substrates; semiconductor substrate measuring apparatus; semiconductor substrate testing apparatus; sensors for mapping semiconductor wafers; Raman spectrographic measurement apparatus, and parts and accessories therefor; Raman spectroscopic analyzing apparatus, and parts and accessories therefor; measuring apparatus for measuring film thickness; measuring apparatus for spectral measurements; automated optical inspection apparatus; X-ray fluorescence measuring apparatus; measuring or testing machines and instruments, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrometers, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrographs, and parts and accessories therefor; optical machines and apparatus; photographic machines and apparatus; cinematographic machines and apparatus; laboratory apparatus and instruments; computer software for inspection, defect analysis, stress analysis, composition analysis, measurement and testing of semiconductor wafers, photomasks, reticles and substrates; computer software; computer programs; scanning probe microscopes; X-ray fluorescence analyzing apparatus; electronic computer and data processing machines and apparatus and their parts; power distribution or control machines and apparatus; rotary converters; phase modifiers; batteries and cells; electric or magnetic meters and testers; electric wires and cables; spectacles [eyeglasses and goggles]; life-saving apparatus and equipment; telecommunication machines and apparatus; fire alarms; gas alarms; water leak alarms; oil leak alarms; anti-theft warning apparatus.

33.

ELECTROSTATIC CHUCK DEVICE AND COOLING PLATE

      
Numéro d'application 18956305
Statut En instance
Date de dépôt 2024-11-22
Date de la première publication 2025-06-12
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Gonzalez, Esteban
  • Nayak, Ajayaketan
  • Yasuda, Tadahiro

Abrégé

The present invention is an electrostatic chuck device which makes a temperature of a target object clamped to a clamping plate uniform and clamps the target object via an electrostatic force, including: a clamping plate having a clamping surface that clamps a target object to its front surface side; and a cooling plate which is provided on a back surface side of the clamping plate and which has an internal flow channel through which a coolant flows, in which the internal flow channel forms a flow channel geometry in which flow channel elements of an identical pattern in a plan view are systematically connected.

Classes IPC  ?

  • H01L 21/683 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants pour le maintien ou la préhension
  • H01J 37/32 - Tubes à décharge en atmosphère gazeuse

34.

BATTERY CHARGING DEVICE, BATTERY CHARGING METHOD, AND BATTERY CHARGING PROGRAM

      
Numéro d'application JP2024041531
Numéro de publication 2025/121172
Statut Délivré - en vigueur
Date de dépôt 2024-11-22
Date de publication 2025-06-12
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga, Shimpachi
  • Tatsukawa, Shogo

Abrégé

The present invention is for efficiently measuring internal resistance for use as a battery degradation index during battery charging, and comprises: a battery charging unit 2 that supplies charging current and/or voltage to a battery B; a battery management unit 3 that manages the charging state of the battery B; a pulse signal generation unit 4 that superimposes, at one or more charging points corresponding to the charging state of the battery B, pulse current or voltage on the charging current or voltage and supplies the same to the battery; an internal resistance calculation unit 5 that calculates the internal resistance of the battery B on the basis of the current value and the voltage value of the battery obtained when charging power superposed with pulse power has been supplied; and a data management unit 6 that records, in a memory, the internal resistance calculated by the internal resistance calculation unit 5.

Classes IPC  ?

  • H02J 7/10 - Régulation du courant ou de la tension de charge utilisant des tubes à décharge ou des dispositifs à semi-conducteurs utilisant uniquement des dispositifs à semi-conducteurs
  • G01R 31/382 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p. ex. état de charge
  • G01R 31/385 - Dispositions pour mesurer des variables des batteries ou des accumulateurs
  • G01R 31/389 - Mesure de l’impédance interne, de la conductance interne ou des variables similaires
  • G01R 31/392 - Détermination du vieillissement ou de la dégradation de la batterie, p. ex. état de santé
  • H01M 10/44 - Méthodes pour charger ou décharger
  • H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p. ex. le niveau ou la densité de l'électrolyte
  • H02J 7/00 - Circuits pour la charge ou la dépolarisation des batteries ou pour alimenter des charges par des batteries

35.

MULTI-TRACK RAMAN ANALYZER

      
Numéro d'application 19037340
Statut En instance
Date de dépôt 2025-01-27
Date de la première publication 2025-06-12
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s)
  • Vezard, Nicolas
  • Tuladhar, Aashish
  • George, Chris

Abrégé

A spectroscopy system simultaneously obtains Raman measurements from multiple samples or multiple areas of a liquid or solid sample. At least two Raman probes simultaneously acquire spectra from the sample(s) using an imaging spectrometer having a single shared two-dimensional scientific CMOS sensor. Each probe is coupled to a laser, which may be integrated into the probe, and the spectrometer and includes a lens focusing laser light within or on the sample and collecting light from the sample for the spectrometer. The spectrometer images light from multiple probes simultaneously on the scientific CMOS sensor, spaced from one another to reduce crosstalk. A sample positioning device and a probe positioning mechanism may provide relative movement between samples or sample areas and the probes to acquire data from a different subset of samples or sample areas, and may also adjust probe distance from the sample(s) for desired laser focus spot size and location.

Classes IPC  ?

  • G01J 3/44 - Spectrométrie RamanSpectrométrie par diffusion
  • G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
  • G01J 3/12 - Production du spectreMonochromateurs
  • G01N 21/65 - Diffusion de Raman

36.

VAPORIZATION DEVICE, MATERIAL STATE DETERMINATION DEVICE, MATERIAL STATE DETERMINATION METHOD FOR VAPORIZATION DEVICE, AND MATERIAL STATE DETERMINATION PROGRAM FOR VAPORIZATION DEVICE

      
Numéro d'application 18956405
Statut En instance
Date de dépôt 2024-11-22
Date de la première publication 2025-06-12
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Ikeyama, Toshihiro
  • Watanabe, Takao

Abrégé

A vaporizer that vaporizes a material, a flow rate control device including a flow rate sensor that measures a flow rate of a material gas generated by the vaporizer, and a determination unit that determines that the material gas has returned to a state before the vaporization on the basis of a transient response of the flow rate measured by the flow rate sensor are included.

Classes IPC  ?

  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques
  • G01F 1/68 - Mesure du débit volumétrique ou du débit massique d'un fluide ou d'un matériau solide fluent, dans laquelle le fluide passe à travers un compteur par un écoulement continu en utilisant des effets thermiques
  • G01N 11/02 - Recherche des propriétés d'écoulement des matériaux, p. ex. la viscosité, la plasticitéAnalyse des matériaux en déterminant les propriétés d'écoulement en mesurant l'écoulement du matériau

37.

PARTICLE ANALYZING DEVICE, PARTICLE ANALYSIS METHOD, AND PARTICLE ANALYSIS PROGRAM

      
Numéro d'application 18841496
Statut En instance
Date de dépôt 2023-03-02
Date de la première publication 2025-06-05
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s) Tatewaki, Yasuhiro

Abrégé

In analysis of a particle by a PTA method, in order to enable each particle to be analyzed for each type while suppressing increase in size and cost of a device even in a case where excitation wavelengths of fluorescent markers or particles having property of autofluorescence overlap each other, a light irradiation unit (2) that irradiates a sample emitting fluorescence of a plurality of colors with excitation light, one or a plurality of filters (5) that transmits the fluorescence of the plurality of colors while cutting off excitation light, an imaging unit (3) having color identification ability to image fluorescence passing through the filter (5), and an analysis unit (43) that obtains a diffusion rate due to Brownian motion of a particle included in a sample from image data of fluorescence obtained by the imaging unit (3) and analyzes physical property of the particle are included.

Classes IPC  ?

38.

SAMPLE CARRIER AND SAMPLE ANALYSIS SYSTEM

      
Numéro d'application JP2024038894
Numéro de publication 2025/115509
Statut Délivré - en vigueur
Date de dépôt 2024-10-31
Date de publication 2025-06-05
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Kawakami, Shun
  • Park, Sangwoon

Abrégé

This sample carrier is used in a sample analyzer for extracting and analyzing a component, as a gas, generated by heating a measurement sample, and is detachably attached to a predetermined sample input position provided to the sample analyzer. The sample carrier comprises: a container body which has an accommodation chamber for accommodating the measurement sample therein, and which has formed on the bottom surface thereof a sample outlet port for discharging the measurement sample in the accommodation chamber; a bottom plate which is rotatably attached to a bottom part of the container body through a seal member, and on which through-holes are formed in a manner opening to the upper surface and the lower surface; and a distance adjustment mechanism for adjusting an inter-surface distance between the upper surface of the bottom plate and the bottom surface of the container body. The sample carrier is configured such that, by having one of the container body and the bottom plate rotate with respect to the other, the sample outlet port moves between: a predetermined sealed position where the sample outlet port is blocked by the upper surface of the bottom plate and the accommodating chamber is sealed airtight; and an open position where the sample outlet port opens to the through-holes of the bottom plate and the measurement sample can be discharged. The distance adjustment mechanism adjusts an inter-surface distance while the sample outlet port is moving between the sealed position and the open position so as to be longer than the inter-surface distance when the sample outlet port is at the sealed position.

Classes IPC  ?

  • G01N 31/12 - Utilisation de la combustion
  • G01N 1/00 - ÉchantillonnagePréparation des éprouvettes pour la recherche

39.

PROCESSING ADJUSTING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING SYSTEM, PROCESSING ADJUSTING METHOD, AND PROCESSING ADJUSTING PROGRAM

      
Numéro d'application JP2024040665
Numéro de publication 2025/115654
Statut Délivré - en vigueur
Date de dépôt 2024-11-15
Date de publication 2025-06-05
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abrégé

This processing adjusting device is for adjusting processes in a particle size distribution measuring system comprising a particle size distribution measuring unit that measures the particle size distribution of a sample, and a sample supply unit that samples the sample and supplies the sample to the particle size distribution measuring unit, the processing adjusting device comprising: a sampling interval accepting unit that accepts a sampling interval, which is a time from the start of a sampling process for sampling the sample to the start of the next sampling process; and a process time adjusting unit that, if the sampling interval accepted by the sampling interval accepting unit is equal to or less than a prescribed value, adjusts the processing time of at least one of the sampling process for sampling the sample, a measuring process for measuring the particle size distribution of the sample, a cleaning process for cleaning the particle size distribution measuring unit or the sample supply unit, and a standby process for waiting until the start of the next sampling process.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques
  • G01N 1/00 - ÉchantillonnagePréparation des éprouvettes pour la recherche
  • G01N 15/00 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux
  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet

40.

INVERTAU

      
Numéro d'application 1858474
Statut Enregistrée
Date de dépôt 2025-04-28
Date d'enregistrement 2025-04-28
Propriétaire HORIBA Instruments Incorporated (USA)
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

Fluorescence spectrometers; scientific apparatus and instruments for optical analysis, namely, spectrometers, photoluminescence and fluorescence spectrometers; apparatus and instruments for photoluminescence lifetime measurement and spectrographs; microscopes; confocal microscopes for performing fluorescence lifetime imaging (FLIM); microscopes for capturing and analyzing fluorescence decay profiles for use in measuring molecular interactions, local environmental conditions, and biological parameters including FRET, pH, viscosity, binding efficiency, and temperature.

41.

PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE SIZE DISTRIBUTION MEASUREMENT PROGRAM

      
Numéro d'application JP2024040664
Numéro de publication 2025/115653
Statut Délivré - en vigueur
Date de dépôt 2024-11-15
Date de publication 2025-06-05
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abrégé

This particle size distribution measurement system comprises: a particle size distribution measurement unit that measures the particle size distribution of specimens; a specimen supply unit that samples the specimens and supplies the sampled specimens to the particle size distribution measurement unit through a flow path through which the sampled specimens flow; and an arrival time calculation unit that calculates, on the basis of flow path information that is information about the flow path, an arrival time that is the period of time from when the specimens are sampled to when the specimens reach the particle size distribution measurement unit.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques
  • G01N 1/00 - ÉchantillonnagePréparation des éprouvettes pour la recherche
  • G01N 1/10 - Dispositifs pour prélever des échantillons à l'état liquide ou fluide
  • G01N 15/00 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux
  • G01N 15/0227 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’imagerieRecherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’holographie

42.

DEVICE AND METHOD FOR PRODUCING A CONCENTRATED REAGENT FROM A SOLID SUBSTANCE

      
Numéro d'application FR2024051558
Numéro de publication 2025/114665
Statut Délivré - en vigueur
Date de dépôt 2024-11-26
Date de publication 2025-06-05
Propriétaire HORIBA ABX SAS (France)
Inventeur(s)
  • Donnarumma, Dario
  • Couderc, Guilhem

Abrégé

The invention relates to a device (1) for producing a concentrated reagent, comprising: - a solvent reservoir (3), - a container (5) containing a solid substance having a solubility in water at 20°C of greater than or equal to 340 g/l, - a pump (9), and - a production circuit (11) including a first line (13) provided with a first valve (15) and a second line (17) provided with a second valve (19). The pump (9) is fluidically connected to the reservoir (3) and to the container (5) respectively by the first line (13) and the second line (17). The pump (9) makes it possible to take solvent from the reservoir (3) and then deliver it to the container (5) such that a concentrated reagent is produced therein by dissolving at least a portion of the solid substance in the solvent.

Classes IPC  ?

  • G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p. ex. dispositifs d'aspiration, dispositifs d'injection
  • B01F 21/20 - Dissolution utilisant le mélange à écoulement
  • B01F 21/00 - Dissolution
  • B01F 35/71 - Mécanismes d'alimentation
  • B01F 35/75 - Mécanismes d’évacuation

43.

DEVICE AND METHOD FOR PERFORMING A COMPLETE BLOOD COUNT AND DETERMINING A SEDIMENTATION RATE

      
Numéro d'application 18856808
Statut En instance
Date de dépôt 2023-04-14
Date de la première publication 2025-05-29
Propriétaire HORIBA ABX SAS (France)
Inventeur(s)
  • Piedcoq, Philippe
  • Couderc, Guilhem

Abrégé

A device for performing a complete blood count and for determining a sedimentation rate comprises a first group (4) arranged so as to sample a blood sample from a tube and to carry out a complete blood count on this sample, characterised in that it comprises a second group (6) arranged so as to sample a blood sample from a tube and to carry out a sedimentation rate determination. This device comprises at least one sampling member (8) which could be controlled for a measurement by the first group (4) and a measurement by the second group (6) for sampling a blood sample so that a sample sampled for the first group (4) is not used by the second group (6), and that a sample sampled for the second group (6) is not used by the first group (4), the second group (6) being provided with a sensor (20) comprising an infrared light source (12) and an optical sensor (14) arranged substantially opposite one another around a tube (16) connected to an outlet end of the at least one sampling member (8) so that the light emitted by the infrared light source (12) reaches the optical sensor (14) after having crossed said tube (16). This device further comprises a converter (10) arranged so as to receive one or more light-transmission measurement(s) from the optical sensor (14) and to determine a sedimentation rate.

Classes IPC  ?

  • G01N 15/05 - Recherche de la sédimentation des suspensions de particules dans du sang
  • G01N 15/01 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux spécialement adaptée aux cellules biologiques, p. ex. aux cellules sanguines
  • G01N 15/14 - Techniques de recherche optique, p. ex. cytométrie en flux

44.

MACHINE LEARNING DEVICE, VEHICLE TESTING SYSTEM, MACHINE LEARNING METHOD, AND VEHICLE TESTING METHOD

      
Numéro d'application 18868716
Statut En instance
Date de dépôt 2023-05-15
Date de la première publication 2025-05-29
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Komatsu, Yoji
  • Nagaoka, Makoto

Abrégé

The present invention makes it possible to simplify the task of reproducing a load such as a road gradient resistance or the like when a vehicle is actually traveling on a road, and includes a learning data acquisition unit that acquires learning data formed by load data that includes a road gradient resistance of a travel route and driving resistance variables deriving from a vehicle's behavior, and by vehicle traveling data that includes a vehicle's speed, accelerator pedal position, and brake pedal position when that vehicle is traveling on the travel route, and a machine learning unit that employs machine learning to determine a correlation between the load data and the vehicle traveling data, and then creates a simulated gradient prediction model that shows the correlation between the load data and the vehicle traveling data.

Classes IPC  ?

  • G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle
  • G01M 17/007 - Véhicules à roues ou à chenilles
  • G06F 119/14 - Analyse des forces ou optimisation des forces, p. ex. forces statiques ou dynamiques

45.

DEVICE AND METHOD FOR DETERMINING A SEDIMENTATION RATE

      
Numéro d'application 18856821
Statut En instance
Date de dépôt 2023-04-13
Date de la première publication 2025-05-29
Propriétaire HORIBA ABX SAS (France)
Inventeur(s)
  • Piedcoq, Philippe
  • Couderc, Guilhem
  • Fudaly, Christophe

Abrégé

A device for determining a sedimentation rate comprises at least one member (8) for sampling a blood sample, and a sensor (20) comprising an infrared light source (12) and an optical sensor (14) arranged substantially opposite each other around a substantially transparent portion (16) of the sampling member (8) so that the light emitted by the infrared light source (12) reaches the optical sensor (14) after having passed through said substantially transparent portion (16). The optical sensor (14) is arranged so as to carry out a blank measurement, the device further comprising a converter (10) arranged so as to receive one or more light transmission measurement(s) from the optical sensor (14), to calculate the ratio between the blank measurement and the one or more light transmission measurement(s) and to return a sedimentation rate.

Classes IPC  ?

  • G01N 15/05 - Recherche de la sédimentation des suspensions de particules dans du sang

46.

Device for spreading or colouring and determining a sedimentation rate

      
Numéro d'application 18856813
Numéro de brevet 12313516
Statut Délivré - en vigueur
Date de dépôt 2023-04-13
Date de la première publication 2025-05-27
Date d'octroi 2025-05-27
Propriétaire HORIBA ABX SAS (France)
Inventeur(s)
  • Couderc, Guilhem
  • Beauducel, Florent
  • Thoraval, Coralie

Abrégé

A device for spreading or colouring and for determining a sedimentation rate includes a first group arranged so as to sample a blood sample from a tube and to carry out a smear test on the sample and a second group arranged so as to sample a blood sample from a tube and to carry out a sedimentation rate determination. At least one sampling member is controllable for an operation by the first group and an operation by the second group for sampling a blood sample so that a sample sampled for one group is not used by the other group. The second group is provided with a sensor. A converter is arranged so as to receive one or more light-transmission measurements from the sensor and to determine a sedimentation rate.

Classes IPC  ?

  • G01N 15/05 - Recherche de la sédimentation des suspensions de particules dans du sang
  • G01N 1/28 - Préparation d'échantillons pour l'analyse
  • G01N 33/49 - Analyse physique de matériau biologique de matériau biologique liquide de sang

47.

FLOW RATE MEASUREMENT MECHANISM AND FLUID CONTROL APPARATUS

      
Numéro d'application 18948860
Statut En instance
Date de dépôt 2024-11-15
Date de la première publication 2025-05-22
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Cocciadiferro, Edward
  • Dick, John

Abrégé

A fluid resistance element is disposed on a flow path along which flows a fluid, and in which a resistance flow path is formed. A fluid receiving portion is provided on the flow path and is hit by the fluid flowing from upstream of the fluid resistance element so as to cause the fluid to flow to a side. Flexible components support the fluid resistance element and deform in accordance with a flow rate of the fluid. A displacement sensor measures a displacement of the flexible components, and a flow rate calculation unit calculates a flow rate of the fluid based on the displacement. The fluid that is made to flow to the side by the fluid receiving portion flows along the resistance flow path of the fluid resistance element.

Classes IPC  ?

  • G01F 1/38 - Mesure du débit volumétrique ou du débit massique d'un fluide ou d'un matériau solide fluent, dans laquelle le fluide passe à travers un compteur par un écoulement continu en utilisant des effets mécaniques en mesurant la pression ou la différence de pression la pression ou la différence de pression étant produite par une contraction de la veine fluide la pression ou la différence de pression étant mesurée au moyen d'un élément mobile, p. ex. une membrane, un piston, un tube de Bourdon ou une capsule déformable
  • G01F 1/40 - Détails de structure des dispositifs de contraction de la veine fluide

48.

ANALYSIS DEVICE, ANALYSIS SYSTEM, ANALYSIS METHOD, AND PROGRAM

      
Numéro d'application JP2024038226
Numéro de publication 2025/105150
Statut Délivré - en vigueur
Date de dépôt 2024-10-25
Date de publication 2025-05-22
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Yamaguchi, Kazuki

Abrégé

The objective of the present invention is to accurately calculate an amount of particulate matter without being affected by changes in the amount of light emitted onto the particulate matter. An analysis device (100) comprises: a holding member (1) that holds particulate matter (FP); a light source (3) that emits light toward an imaging target area (VA) including a holding area of the holding member (1) in which the particulate matter (FP) is held; a two-dimensional sensor (4) that images the imaging target area (VA); and a calculating unit (5) that calculates particle amount-related information relating to the amount of particulate matter (FP) on the basis of analysis image data acquired by employing the two-dimensional sensor (4) to image the imaging target area (VA) for use in analyzing the particulate matter (FP), and an impact resulting from a change in the amount of light from the light source (3) when the analysis image data were acquired, relative to a reference amount of light.

Classes IPC  ?

  • G01N 15/075 - Recherche de la concentration des suspensions de particules par des moyens optiques
  • G01N 1/02 - Dispositifs pour prélever des échantillons
  • G01N 21/17 - Systèmes dans lesquels la lumière incidente est modifiée suivant les propriétés du matériau examiné
  • G06T 7/00 - Analyse d'image
  • G06V 20/69 - Objets microscopiques, p. ex. cellules biologiques ou pièces cellulaires

49.

PARTICLE ANALYSIS DEVICE, PARTICLE ANALYSIS DEVICE PROGRAM, AND PARTICLE ANALYSIS METHOD

      
Numéro d'application 18841503
Statut En instance
Date de dépôt 2023-03-28
Date de la première publication 2025-05-22
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Sugasawa, Hirosuke
  • Tatewaki, Yasuhiro
  • Igushi, Tatsuo

Abrégé

A particle analysis device can take a fluorescence observation mode in which fluorescence emitted by a fluorescent marker added to a particle or by the particle itself is imaged by irradiating the particle with excitation light, and a scattered light observation mode in which scattered light produced by irradiating the particle with the light is imaged. A particle specifying unit specifies the particle to which the fluorescent marker is added or the particle that emits the fluorescence from fluorescence image data obtained in the fluorescence observation mode. An analyzing unit analyzes physical properties of the particle by obtaining diffusion speed due to the Brownian motion of the particle specified by the particle specifying unit from the image data of the scattered light obtained in the scattered light observation mode having a frame number larger than that in the fluorescence observation mode.

Classes IPC  ?

  • G01N 15/1434 - Dispositions optiques
  • G01N 15/01 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux spécialement adaptée aux cellules biologiques, p. ex. aux cellules sanguines
  • G01N 33/58 - Analyse chimique de matériau biologique, p. ex. de sang ou d'urineTest par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligandsTest immunologique faisant intervenir des substances marquées

50.

LIQUID MATERIAL VAPORIZATION APPARATUS AND OPERATION SETTING METHOD THEREOF

      
Numéro d'application 18950461
Statut En instance
Date de dépôt 2024-11-18
Date de la première publication 2025-05-22
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Oba, Hidenori
  • Kawakado, Hajime

Abrégé

A liquid material vaporization apparatus operates such that, in a gas generation mode, a liquid material is supplied to a tank through a supply path via a first on-off valve set to a predetermined first opening degree, and operates such that, in a purge mode, a purge gas is introduced into the tank through the supply path via the first on-off valve set to a second opening degree that is larger than the first opening degree.

Classes IPC  ?

  • F22B 35/00 - Systèmes de commande pour chaudières à vapeur
  • F22B 37/78 - Adaptation ou montage d'indicateurs de niveau
  • H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants

51.

X-RAY ANALYSIS DEVICE

      
Numéro d'application JP2024038984
Numéro de publication 2025/105205
Statut Délivré - en vigueur
Date de dépôt 2024-10-31
Date de publication 2025-05-22
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Aoyama, Tomoki
  • Ohashi, Satoshi
  • Tajima, Mikiya

Abrégé

An x-ray analysis device according to the present invention is to analyze the elements included in a measurement sample transported in a prescribed direction and comprises an x-ray irradiation unit that radiates x-rays toward the measurement sample, an x-ray detection unit that faces the measurement sample and detects x-ray fluorescence produced from the measurement sample, and a standard sample that has a known element content and is provided in a region of overlap between a region irradiated with the x-rays radiated from the x-ray irradiation unit and a region in which x-ray fluorescence can be detected by the x-ray detection unit.

Classes IPC  ?

  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

52.

HYDROGEN DETECTION DEVICE AND HYDROGEN DETECTION METHOD

      
Numéro d'application JP2024033736
Numéro de publication 2025/100115
Statut Délivré - en vigueur
Date de dépôt 2024-09-20
Date de publication 2025-05-15
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Shiba, Takumi
  • Naya, Hiroshi

Abrégé

This hydrogen detection device for detecting hydrogen contained in a gas in a chamber or in a pipe comprises: a casing which is inserted into the chamber or the pipe and has an internal space into which the gas can be introduced; a physical quantity change part which is provided in the internal space and in which a physical quantity changes according to the concentration of the hydrogen; and a physical quantity detection part which is provided in the internal space and detects the physical quantity in the physical quantity change part. The internal space is separated into a first space and a second space by a separation member. The gas is introduced into the first space and the physical quantity change part is housed in the first space. The gas is not introduced into the second space and the physical quantity detection part is housed in the second space.

Classes IPC  ?

  • G01N 21/78 - Systèmes dans lesquels le matériau est soumis à une réaction chimique, le progrès ou le résultat de la réaction étant analysé en observant l'effet sur un réactif chimique produisant un changement de couleur

53.

PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING METHOD, PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, AND KIT FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE

      
Numéro d'application 18728676
Statut En instance
Date de dépôt 2023-01-18
Date de la première publication 2025-05-15
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s) Tatewaki, Yasuhiro

Abrégé

A particle size distribution measuring device includes: a measurement cell including a sample accommodation space that accommodates a sample obtained by dispersing a plurality of particles in a dispersion medium; a stirring means that stirs the sample by sucking and discharging the sample in the measurement cell; a light irradiation unit that irradiates the sample in the measurement cell with light; a light detection unit that detects scattered light or fluorescent light generated from the sample in the measurement cell; and an analysis unit that measures a particle size distribution of a particle group including the plurality of particles using a detection signal obtained by the light detection unit.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques
  • G01N 1/38 - Dilution, dispersion ou mélange des échantillons
  • G01N 15/01 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux spécialement adaptée aux cellules biologiques, p. ex. aux cellules sanguines

54.

PITOT TUBE FLOWMETER, GAS ANALYSIS DEVICE, AND GAS ANALYSIS METHOD

      
Numéro d'application 18835696
Statut En instance
Date de dépôt 2023-03-02
Date de la première publication 2025-05-08
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Mizutani, Naoto
  • Nagaoka, Makoto
  • Inoue, Kentaro
  • Uraoka, Masaru
  • Iseki, Hirotaka

Abrégé

The present invention makes a pitot tube type flowmeter less affected by the flow velocity distribution caused by the flow passage shape on the upstream side, and includes a pitot tube having total pressure holes for detecting a total pressure of a fluid and static pressure holes for detecting a static pressure of the fluid, and a differential pressure sensor that is connected to the pitot tube and detects a differential pressure between the total pressure and the static pressure. The pitot tube includes a main tube portion, and a plurality of branch tube portions, which branches off from the main tube portion and in which the total pressure holes and the static pressure holes are formed. Each of the main tube portion and the plurality of branch tube portions has a shape that reduces a pressure loss.

Classes IPC  ?

55.

CONTROL PARAMETER CALCULATION APPARATUS, CONTROL PARAMETER CALCULATION METHOD, AND CONTROL PARAMETER CALCULATION PROGRAM

      
Numéro d'application 18938474
Statut En instance
Date de dépôt 2024-11-06
Date de la première publication 2025-05-08
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Higuchi, Seiji
  • Takijiri, Kotaro

Abrégé

A control parameter calculation apparatus calculates a control parameter of a fluid control apparatus that controls a fluid. The control parameter calculation apparatus stores correlation data indicating a correlation of a reference control parameter of the fluid control apparatus and a reference response signal output by using the reference control parameter, acquires a target response signal output by using a target control parameter of the fluid control apparatus different from the fluid control apparatus serving as a reference, acquires the correlation data and the target response signal and calculates a correlation control parameter corresponding to the target response signal in the fluid control apparatus serving as a reference by using the correlation data, and calculates an adjustment amount of the target control parameter based on the correlation control parameter and the reference control parameter.

Classes IPC  ?

  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques

56.

COMPOSITION FOR HEMATOLOGY ANALYSES

      
Numéro d'application FR2024051428
Numéro de publication 2025/093835
Statut Délivré - en vigueur
Date de dépôt 2024-10-29
Date de publication 2025-05-08
Propriétaire HORIBA ABX SAS (France)
Inventeur(s)
  • Donnarumma, Dario
  • Adjemian, Jocelyne

Abrégé

The invention relates to a composition for hematology analyses and to the method for producing same. The composition comprises an anticoagulant, in an amount of between 0.1% and 8% by weight, preferably between 2% and 6%; a salt in an amount of between 30% and 90% by weight, preferably between 50% and 80%; a pH buffer in an amount of between 0.1% and 50% by weight, preferably greater than or equal to 10%; and a surfactant in an amount of between 0.01% and 2% by weight, preferably between 0.05% and 1.5%, in solid form. The invention also relates to a solution obtained from the solid composition.

Classes IPC  ?

  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet

57.

DILUTION MECHANISM, PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT

      
Numéro d'application 18728729
Statut En instance
Date de dépôt 2023-01-17
Date de la première publication 2025-05-01
Propriétaire
  • HORIBA, Ltd. (Japon)
  • HORIBA Advanced Techno, Co., Ltd. (Japon)
Inventeur(s)
  • Sakuramoto, Keijiro
  • Mori, Tetsuya
  • Habu, Kazunori

Abrégé

A dilution mechanism includes: a sample line that guides the sample containing the particles to the particle size distribution measurement device; a dilution line that merges with the sample line and through which a diluent flows; a concentration adjusting unit that adjusts the concentration of the particles contained in the diluted sample; a conductivity measuring unit that measures a conductivity of the diluted sample; a control unit that controls the concentration adjusting unit to bring the conductivity measured by the conductivity measuring unit or a conductivity-related value that is a value calculated from the conductivity, to a predetermined target value.

Classes IPC  ?

  • G01N 15/06 - Recherche de la concentration des suspensions de particules
  • G01N 1/38 - Dilution, dispersion ou mélange des échantillons
  • G01N 15/14 - Techniques de recherche optique, p. ex. cytométrie en flux

58.

DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING DEVICE, DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING METHOD, AND DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING PROGRAM

      
Numéro d'application JP2024037561
Numéro de publication 2025/089267
Statut Délivré - en vigueur
Date de dépôt 2024-10-22
Date de publication 2025-05-01
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Sakuramoto, Keijiro

Abrégé

Provided is a dynamic light scattering type particle diameter distribution measuring device comprising: a light irradiation unit that irradiates a sample flowing through a flow path with light; a light detection unit that detects light scattered by the sample; a particle diameter distribution calculation unit that calculates the particle diameter distribution of the sample on the basis of the light intensity obtained by the light detection unit; a flow rate acquisition unit that acquires the flow rate of the sample flowing through the flow path; and a particle diameter distribution correction unit that corrects the particle diameter distribution calculated by the particle diameter distribution calculation unit, on the basis of the flow rate acquired by the flow rate acquisition unit.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques

59.

INVERTAU

      
Numéro de série 99154006
Statut En instance
Date de dépôt 2025-04-24
Propriétaire HORIBA Instruments Incorporated ()
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

Fluorescence spectrometers; scientific apparatus and instruments for optical analysis, namely, spectrometers, photoluminescence and fluorescence spectrometers; apparatus and instruments for photoluminescence lifetime measurement and spectrographs; microscopes; confocal microscopes for performing fluorescence lifetime imaging (FLIM); microscopes for capturing and analyzing fluorescence decay profiles for use in measuring molecular interactions, local environmental conditions, and biological parameters including FRET, pH, viscosity, binding efficiency, and temperature

60.

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETECTION APPARATUS AND RECORDING MEDIUM

      
Numéro d'application 18682769
Statut En instance
Date de dépôt 2022-08-12
Date de la première publication 2025-04-24
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Murata, Shunsuke
  • Valiev, Ildar

Abrégé

A signal processing method for processing a signal including a response wave generated in response to detection of radiation, includes: measuring a feature corresponding to a duration of a response wave or a response wave group composed of a plurality of response waves; counting, for each wave height, the number of response waves or response wave groups whose measured features are included in a predetermined first range in which a feature of a single response wave is included; and performing correction processing of subtracting a specific value from a counted number according to a response wave or a response wave group whose feature is not included in the first range.

Classes IPC  ?

  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
  • G01T 1/17 - Dispositions de circuits non adaptés à un type particulier de détecteur

61.

FLUID CONTROL VALVE, FLUID CONTROL DEVICE AND DRIVE CIRCUIT

      
Numéro d'application 18923498
Statut En instance
Date de dépôt 2024-10-22
Date de la première publication 2025-04-24
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Takakura, Hiroshi

Abrégé

A drive circuit of a piezo actuator is provided with a flyback transformer whose primary winding is connected to a DC power supply, and whose secondary winding is connected to the piezo actuator, a charging switch that is connected to the primary winding, a discharging switch that is connected to the secondary winding, a regenerative capacitor that is connected to the primary winding and in which discharge energy from the piezo actuator is regenerated, and a switch control unit that controls ON/OFF operations of the charging switch and the discharging switch. The switch control unit controls the ON/OFF operations of the charging switch and the discharging switch so as to repeatedly charge and discharge the piezo actuator and thereby control the applied voltage of the piezo actuator.

Classes IPC  ?

  • F16K 31/00 - Moyens de fonctionnementDispositifs de retour à la position de repos
  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques
  • H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants

62.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Numéro d'application 18923513
Statut En instance
Date de dépôt 2024-10-22
Date de la première publication 2025-04-24
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Kawai, Yuya
  • Ieki, Atsushi

Abrégé

In order to configure a fluid control valve to have the life prolonged while keeping an inexpensive configuration, the fluid control valve includes: a valve body that can come into contact and separate from a valve seat; an actuator that causes the valve body to move; a diaphragm member provided between the valve body and the actuator and having a protruding part protruding toward the valve body; and a sphere housed inside the protruding part, in which the actuator moves the valve body by pressing a distal end of the protruding part through the sphere, and the sphere is formed of a ceramic material.

Classes IPC  ?

  • F16K 7/12 - Dispositifs d'obturation à diaphragme, p. ex. dont un élément est déformé, sans être déplacé entièrement, pour fermer l'ouverture à diaphragme plat, en forme d'assiette ou en forme de bol
  • F16K 37/00 - Moyens particuliers portés par ou sur les soupapes ou autres dispositifs d'obturation pour repérer ou enregistrer leur fonctionnement ou pour permettre de donner l'alarme

63.

LF-F

      
Numéro d'application 1850530
Statut Enregistrée
Date de dépôt 2025-01-17
Date d'enregistrement 2025-01-17
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Classes de Nice  ?
  • 07 - Machines et machines-outils
  • 09 - Appareils et instruments scientifiques et électriques

Produits et services

Semiconductor manufacturing machines, and part and fittings therefor; machines for manufacturing batteries, and part and fittings therefor; machines for manufacturing electric storage batteries, and part and fittings therefor; machines for manufacturing solar cell, and part and fittings therefor; machines for manufacturing electronic components, and part and fittings therefor; machines for manufacturing light emitting diode, and part and fittings therefor; machines for manufacturing displays, and part and fittings therefor; machines for manufacturing liquid crystal, and part and fittings therefor; machines for manufacturing organic electroluminescence, and part and fittings therefor; fluid controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; flow controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid measurement apparatus for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid flow meters for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid flow sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; apparatus for measuring temperature difference for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor. Measuring or testing machines and instruments; fluid controllers; flow controllers; fluid measurement apparatus; fluid flow meters; fluid flow sensors; pressure controllers; pressure gauges; pressure sensors; temperature controllers; temperature gauges; temperature sensors; apparatus for measuring temperature difference; automatic controllers for measurement of fluid; automatic controllers for measurement of flow; automatic controllers for measurement of pressure; automatic controllers for measurement of temperature; laboratory apparatus and instruments; electronic computer and data processing machines and apparatus and their parts; computer programs; computer software.

64.

RADIATION DETECTION ELEMENT MANUFACTURING METHOD, RADIATION DETECTION ELEMENT, AND RADIATION DETECTOR

      
Numéro d'application JP2024035360
Numéro de publication 2025/079486
Statut Délivré - en vigueur
Date de dépôt 2024-10-03
Date de publication 2025-04-17
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Ishikura, Koji

Abrégé

Provided are a radiation detection element manufacturing method, a radiation detection element, and a radiation detector that make it possible to accurately detect radiation having low energy. This radiation detection element manufacturing method comprises: forming an oxide layer composed of an oxide of a semiconductor on a first semiconductor layer; forming a second semiconductor layer on the oxide layer; and implanting, into the first semiconductor layer via the second semiconductor layer and the oxide layer, ions of a dopant that alters a semiconductor forming the first semiconductor layer to a semiconductor of a different type, thereby forming a doping layer composed of a semiconductor doped with the dopant between the first semiconductor layer and the oxide layer.

Classes IPC  ?

  • G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs

65.

XTROLOGY

      
Numéro de série 79425805
Statut En instance
Date de dépôt 2025-04-03
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

Semiconductor wafer inspection apparatus; analyzing apparatus for defect of semiconductor wafers; analyzing apparatus for stress of semiconductor wafers; analyzing apparatus for composition of semiconductor wafers; semiconductor wafer measuring apparatus; semiconductor wafer testing apparatus; semiconductor photomask inspection apparatus; analyzing apparatus for defect of semiconductor photomasks; analyzing apparatus for stress of semiconductor photomasks; analyzing apparatus for composition of semiconductor photomasks; semiconductor photomask measuring apparatus; semiconductor photomask testing apparatus; semiconductor reticle inspection apparatus; analyzing apparatus for defect of semiconductor reticles; analyzing apparatus for stress of semiconductor reticles; analyzing apparatus for composition of semiconductor reticles; semiconductor reticle measuring apparatus; semiconductor reticle testing apparatus; semiconductor substrate inspection apparatus; analyzing apparatus for defect of semiconductor substrates; analyzing apparatus for stress of semiconductor substrates; analyzing apparatus for composition of semiconductor substrates; semiconductor substrate measuring apparatus; semiconductor substrate testing apparatus; sensors for mapping semiconductor wafers; Raman spectrographic measurement apparatus, and parts and accessories therefor; Raman spectroscopic analyzing apparatus, and parts and accessories therefor; measuring apparatus for measuring film thickness; measuring apparatus for spectral measurements; automated optical inspection apparatus; X-ray fluorescence measuring apparatus; measuring or testing machines and instruments, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrometers, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrographs, and parts and accessories therefor; optical machines and apparatus; photographic machines and apparatus; cinematographic machines and apparatus; laboratory apparatus and instruments; computer software for inspection, defect analysis, stress analysis, composition analysis, measurement and testing of semiconductor wafers, photomasks, reticles and substrates; computer software; computer programs; scanning probe microscopes; X-ray fluorescence analyzing apparatus; electronic computer and data processing machines and apparatus and their parts; power distribution or control machines and apparatus; rotary converters; phase modifiers; batteries and cells; electric or magnetic meters and testers; electric wires and cables; spectacles [eyeglasses and goggles]; life-saving apparatus and equipment; telecommunication machines and apparatus; fire alarms; gas alarms; water leak alarms; oil leak alarms; anti-theft warning apparatus.

66.

PATTERN MEASUREMENT DEVICE, PATTERN MEASUREMENT PROGRAM, AND PATTERN MEASUREMENT METHOD

      
Numéro d'application 18899560
Statut En instance
Date de dépôt 2024-09-27
Date de la première publication 2025-04-03
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Higuchi, Seiji
  • Ogaki, Ryosuke
  • Ueda, Takayuki

Abrégé

The present invention is to accurately measure a dimension of a pattern by using statistical outlier processing, and is a pattern measurement device for measuring a dimension of a pattern formed on a sample. The pattern measurement device includes: a dimension measurement unit configured to measure a dimension of the pattern; an outlier removal unit configured to execute outlier processing at least twice on a plurality of dimension values measured by the dimension measurement unit; and a representative value determination unit configured to obtain a representative dimension value of the pattern from one or a plurality of the dimension values from which an outlier has been removed by the outlier removal unit.

Classes IPC  ?

  • G01B 11/14 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la distance ou la marge entre des objets ou des ouvertures espacés

67.

X-RAY ANALYSIS DEVICE, X-RAY ANALYSIS METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Numéro d'application JP2024034558
Numéro de publication 2025/070683
Statut Délivré - en vigueur
Date de dépôt 2024-09-27
Date de publication 2025-04-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Aoyama, Tomoki

Abrégé

Provided are: an X-ray analysis device that is capable of individually measuring the amounts of elements contained in layers on the obverse surface side and the reverse surface side of a multilayer sample; an X-ray analysis method; an information processing device; and a computer program. This X-ray analysis device is provided with: an emission unit that emits X-rays to a sample in which a plurality of layers are laminated, so as to sequentially penetrate a first layer, an intermediate layer, and a second layer; a fluorescent X-ray detector that detects fluorescent X-rays generated from the first layer or the second layer; a penetrating X-ray detector that detects penetrating X-rays that have penetrated the sample; and an analysis unit. The analysis unit calculates the amount of a specific element contained in one of the first layer or the second layer in accordance with the intensity of fluorescent X-rays having a prescribed first energy, calculates the total amount of the specific element contained in the first layer and the second layer in accordance with the intensity of penetrating X-rays having a prescribed second energy higher than the first energy, and calculates the amount of the specific element contained in the other of the first layer or the second layer.

Classes IPC  ?

  • G01N 23/2206 - Combinaison de plusieurs mesures, l'une au moins étant celle d’une émission secondaire, p. ex. combinaison d’une mesure d’électrons secondaires [ES] et d’électrons rétrodiffusés [ER]
  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

68.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Numéro d'application JP2024029184
Numéro de publication 2025/069770
Statut Délivré - en vigueur
Date de dépôt 2024-08-16
Date de publication 2025-04-03
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s) Dick, John

Abrégé

The present invention improves the durability of a displacement changing mechanism that changes the displacement of an actuator and transmits this displacement to a valve body, while reducing the number of components to achieve a compact configuration. A displacement changing mechanism 6 for changing the displacement of an actuator 4 and transmitting this displacement to a valve body 3 side is provided with: a cylindrical holding member 61 interposed between the valve body 3 and the actuator 4; a plurality of movable members 62 forming a partial columnar shape corresponding to the inner peripheral surface of the holding member 61; and a plurality of rotation support shafts 63 for rotatably supporting the plurality of movable members 62 with respect to the holding member 61. Each of the plurality of movable members 62 has an input part 62a displaced by receiving the driving force from the actuator 4, and an output part 62b for changing the displacement applied to the input part 62a and transmitting this displacement to the valve body 3 side.

Classes IPC  ?

  • F16K 1/32 - Soupapes ou clapets, c.-à-d. dispositifs obturateurs dont l'élément de fermeture possède au moins une composante du mouvement d'ouverture ou de fermeture perpendiculaire à la surface d'obturation Détails

69.

PLATINALINK

      
Numéro d'application 1847626
Statut Enregistrée
Date de dépôt 2024-12-13
Date d'enregistrement 2024-12-13
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Computer software for verifying data integrity; computer software for verifying data accuracy, completeness and consistency; computer software for access control, user identification, verification and security management; computer software for generating reports regarding data integrity; computer software for generating reports regarding data accuracy, completeness and consistency; computer software for measuring, controlling, testing, experimenting, data collection and management of engines, brakes and drives and apparatus attached thereto for vehicles and automobiles; computer software for measuring, controlling, testing, experimenting, data collection and management of pharmaceuticals, cosmetics, foodstuffs and dietary supplements; computer software for measuring, controlling, testing, experimenting, data collection and management of solid samples, gaseous samples and liquid samples; computer software for use with measuring or testing machines and instruments; computer software for use with laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus. Repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of electronic machines and apparatus; repair or maintenance of optical machines and apparatus. Design, programming and maintenance of computer software for verifying data integrity; design, programming and maintenance of computer software for verifying data accuracy, completeness and consistency; design, programming and maintenance of computer software for access control, user identification, verification and security management; design, programming and maintenance of computer software; computer software design, computer programming, or maintenance of computer software; rental of computer software for verifying data integrity; rental of computer software for verifying data accuracy, completeness and consistency; rental of computer software for access control, user identification, verification and security management; rental of computer software; providing on-line non-downloadable computer software for verifying data integrity; providing on-line non-downloadable computer software for verifying data accuracy, completeness and consistency; providing on-line non-downloadable computer software for access control, user identification, verification and security management; providing on-line non-downloadable computer software; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of measuring or testing machines and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on measuring or testing machines and instruments.

70.

HORIBA PLATINALINK

      
Numéro d'application 1847627
Statut Enregistrée
Date de dépôt 2024-12-13
Date d'enregistrement 2024-12-13
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Computer software for verifying data integrity; computer software for verifying data accuracy, completeness and consistency; computer software for access control, user identification, verification and security management; computer software for generating reports regarding data integrity; computer software for generating reports regarding data accuracy, completeness and consistency; computer software for measuring, controlling, testing, experimenting, data collection and management of engines, brakes and drives and apparatus attached thereto for vehicles and automobiles; computer software for measuring, controlling, testing, experimenting, data collection and management of pharmaceuticals, cosmetics, foodstuffs and dietary supplements; computer software for measuring, controlling, testing, experimenting, data collection and management of solid samples, gaseous samples and liquid samples; computer software for use with measuring or testing machines and instruments; computer software for use with laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus. Repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of electronic machines and apparatus; repair or maintenance of optical machines and apparatus. Design, programming and maintenance of computer software for verifying data integrity; design, programming and maintenance of computer software for verifying data accuracy, completeness and consistency; design, programming and maintenance of computer software for access control, user identification, verification and security management; design, programming and maintenance of computer software; computer software design, computer programming, or maintenance of computer software; rental of computer software for verifying data integrity; rental of computer software for verifying data accuracy, completeness and consistency; rental of computer software for access control, user identification, verification and security management; rental of computer software; providing on-line non-downloadable computer software for verifying data integrity; providing on-line non-downloadable computer software for verifying data accuracy, completeness and consistency; providing on-line non-downloadable computer software for access control, user identification, verification and security management; providing on-line non-downloadable computer software; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of measuring or testing machines and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on measuring or testing machines and instruments.

71.

VAPORIZER AND VAPORIZING SYSTEM

      
Numéro d'application 18904016
Statut En instance
Date de dépôt 2024-10-01
Date de la première publication 2025-04-03
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Kanamaru, Takashi
  • Kawakado, Hajime

Abrégé

A vaporizer for vaporizing a liquid substance includes: a tank for storing the liquid substance; a heater for heating the liquid substance by heating the tank; and a porous structure, disposed inside the tank, for breaking up and letting pass through it bubbles that form as a result of the liquid substance being heated by the heater.

Classes IPC  ?

  • B01J 7/02 - Appareillage pour la production de gaz par voie humide

72.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Numéro d'application JP2024031091
Numéro de publication 2025/062997
Statut Délivré - en vigueur
Date de dépôt 2024-08-29
Date de publication 2025-03-27
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Park, Sangwoon

Abrégé

This analysis device is provided with: an impulse heating furnace or a high-frequency heating furnace that heats a sample to generate a sample gas containing elements that constitute the sample; a suction flow path that sucks the sample gas generated in the impulse heating furnace or the high-frequency heating furnace by means of a suction unit; and an element detecting unit that is provided in the suction flow path to detect the elements contained in the sample gas.

Classes IPC  ?

73.

CAPACITIVE PRESSURE SENSOR

      
Numéro d'application 18824086
Statut En instance
Date de dépôt 2024-09-04
Date de la première publication 2025-03-27
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Kuwahara, Akira
  • Kishida, Sotaro

Abrégé

The present invention is intended to simplify the configuration of the baffle and prevent deposition on the diaphragm, and includes: a housing surrounding a pressure receiving surface of the diaphragm to form a measurement chamber, the housing having a gas introduction port for introducing a gas into the measurement chamber; and a baffle member provided in the measurement chamber, in which the baffle member includes: a facing surface portion facing the gas introduction port; and an surrounding surface portion provided closer to a side of the gas introduction port than the facing surface portion and surrounding a periphery of the gas introduction port, and the surrounding surface portion includes a flow passage portion that allows a gas introduced from the gas introduction port to flow from an end portion on the side of the gas introduction port side toward a side of the diaphragm.

Classes IPC  ?

  • G01L 19/06 - Moyens pour empêcher la surcharge ou l'influence délétère du milieu à mesurer sur le dispositif de mesure ou vice versa
  • G01L 9/00 - Mesure de la pression permanente, ou quasi permanente d’un fluide ou d’un matériau solide fluent par des éléments électriques ou magnétiques sensibles à la pressionTransmission ou indication par des moyens électriques ou magnétiques du déplacement des éléments mécaniques sensibles à la pression, utilisés pour mesurer la pression permanente ou quasi permanente d’un fluide ou d’un matériau solide fluent

74.

VAPORIZER AND LIQUID MATERIAL VAPORIZING DEVICE

      
Numéro d'application 18892220
Statut En instance
Date de dépôt 2024-09-20
Date de la première publication 2025-03-27
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Nishiwaki, Keisuke

Abrégé

A vaporizer that heats and vaporizes liquid material includes a spray chamber, a plurality of heating channels, and a tapered portion. The liquid material is sprayed into the spray chamber. The plurality of heating channels extends from the spray chamber to at least an axial direction one side. The tapered portion is tapered off toward the axial direction in a communication portion between the spray chamber and the heating channel.

Classes IPC  ?

  • B01B 1/00 - ÉbullitionAppareils à ébullition en vue d'applications physiques ou chimiques
  • H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants

75.

DISPENSING INSTRUMENT PROVIDED WITH A MEMBER FOR PREVENTING THE REMOVAL OF A TUBE

      
Numéro d'application FR2024051228
Numéro de publication 2025/062102
Statut Délivré - en vigueur
Date de dépôt 2024-09-19
Date de publication 2025-03-27
Propriétaire HORIBA ABX SAS (France)
Inventeur(s) Cremien, Didier

Abrégé

The invention relates to a dispensing instrument (55) comprising: - an elongate body (13) having a cavity extending from a first end (15) to a second end (17), wherein the body (13) further has an opening at the first end (15) and a hole at the second end (17); - a needle (31) partially covered by a sleeve (33) and extending within the cavity, wherein the needle (31) exits the body (13) through the hole; - a tube (7) closed by a cap (9) and accommodated in the cavity such that the cap (9) compresses the sleeve (33) and the needle (31) pierces the sleeve (33), passes through the cap (9) and enters the tube (7); and - a member (11) arranged so as to prevent the removal of the tube (7) by counteracting the return force exerted on the tube (7) by the sleeve (33).

Classes IPC  ?

  • A61B 5/15 - Dispositifs de prélèvement d'échantillons de sang
  • A61B 5/154 - Dispositifs de prélèvement d'échantillons de sang spécialement adaptés pour le prélèvement d'échantillons de sang veineux ou artériel, p. ex. par des seringues utilisant des moyens préalablement mis sous vide
  • B01L 9/06 - Supports de tubes à essaiPorte-tubes à essai

76.

VEHICLE ELEMENT RESPONSE LEARNING METHOD, VEHICLE ELEMENT RESPONSE CALCULATION METHOD, VEHICLE ELEMENT RESPONSE LEARNING SYSTEM, AND VEHICLE ELEMENT RESPONSE LEARNING PROGRAM

      
Numéro d'application 18293282
Statut En instance
Date de dépôt 2022-07-29
Date de la première publication 2025-03-20
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Tabata, Kunio
  • Roberts, Philip
  • Bates, Luke
  • Whelan, Steven

Abrégé

The present invention is to accurately obtain a vehicle element response data under a desired driving environment by simulation without performing actual road driving and is a vehicle element response learning method for generating a trained model related to a response of a vehicle element that is a vehicle or a part of the vehicle, and the method includes: (1) an input step of giving an input including parameters related to a vehicle speed, a load, and a temperature assuming actual road driving, to the vehicle element; (2) an acquisition step of acquiring response data of the vehicle element and acquiring, as training data, input data representing the input and the response data; and (3) a generation step of generating the trained model related to the response of the vehicle element, from the training data by using machine learning.

Classes IPC  ?

77.

ANALYSIS DEVICE, SPECIMEN EVALUATION SYSTEM, AND ANALYSIS METHOD

      
Numéro d'application JP2024031162
Numéro de publication 2025/053065
Statut Délivré - en vigueur
Date de dépôt 2024-08-30
Date de publication 2025-03-13
Propriétaire
  • HORIBA, LTD. (Japon)
  • HORIBA ADVANCED TECHNO, CO., LTD. (Japon)
Inventeur(s)
  • Miyamura, Kazuhiro
  • Okada, Yoichi
  • Yamashita, Tsubasa

Abrégé

Provided is an analysis device used in a specimen evaluation device that evaluates the state of a specimen by analyzing a waste liquid from the specimen. This analysis device comprises a component concentration measurement unit that is connected to a discharge gas flow passage through which a post-dilution waste liquid obtained by diluting the waste liquid discharged from the specimen by a diluent flows and that measures the concentration of a component contained in the post-dilution waste liquid.

Classes IPC  ?

  • H01M 8/0444 - ConcentrationDensité
  • C25B 15/023 - Mesure, analyse ou test pendant la production électrolytique
  • G01N 1/22 - Dispositifs pour prélever des échantillons à l'état gazeux
  • G01N 5/00 - Analyse des matériaux par pesage, p. ex. pesage des fines particules séparées d'un gaz ou d'un liquide
  • H01M 8/04 - Dispositions auxiliaires, p. ex. pour la commande de la pression ou pour la circulation des fluides
  • H01M 8/02 - Éléments à combustibleLeur fabrication Détails
  • H01M 8/10 - Éléments à combustible avec électrolytes solides
  • H01M 8/12 - Éléments à combustible avec électrolytes solides fonctionnant à haute température, p. ex. avec un électrolyte en ZrO2 stabilisé

78.

ASSAY METHOD USING MAGNETIC PARTICLES

      
Numéro d'application 18722357
Statut En instance
Date de dépôt 2022-12-13
Date de la première publication 2025-03-06
Propriétaire HORIBA ABX SAS (France)
Inventeur(s)
  • Daynes, Aurélien
  • Temurok, Nevzat

Abrégé

Method for assaying a target analyte in a biological sample in liquid medium, comprising: contacting the sample with first magnetic particles bearing a first receptor specific to a first analyte site of attachment to form first complexes; applying a first magnetic field to locally combine the formed complexes formed and optionally to agglomerate interfering complexes to form interfering aggregates; negating the applied magnetic field; adding second magnetic particles to a liquid medium that bear a second receptor specific to a second analyte site of attachment; measuring a first quantity of interfering aggregates; applying a second magnetic field to form second complexes; measuring a second quantity of the collective amount of interfering aggregates and second complexes to determine an amount of formed second complexes as a function of the first quantity, and deducing the amount of analyte present in the sample and, optionally, the amount of interfering analyte.

Classes IPC  ?

  • G01N 33/543 - Tests immunologiquesTests faisant intervenir la formation de liaisons biospécifiquesMatériaux à cet effet avec un support insoluble pour l'immobilisation de composés immunochimiques

79.

SPECIMEN TESTING SYSTEM, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM

      
Numéro d'application JP2024028237
Numéro de publication 2025/047353
Statut Délivré - en vigueur
Date de dépôt 2024-08-07
Date de publication 2025-03-06
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Tabata, Kunio
  • Shimura, Miyoko
  • Yamamoto, Mitsunobu

Abrégé

Provided are a specimen testing system, an information processing method, and a computer program for preventing alteration of data pertaining to measurement. The specimen testing system comprises a measurement device and an information processing device. The measurement device acquires, in accordance with a prescribed rule, a measurement result required to assess the state of a specimen, generates measurement data representing the measurement result, and stores, in association with each other: protected device data that includes device data and a hash vale for the device data, said device data representing a result of testing whether the state of the measurement device follows the prescribed rule; and protected measurement data that includes the measurement data and a hash value for the measurement data.

Classes IPC  ?

  • G06F 21/64 - Protection de l’intégrité des données, p. ex. par sommes de contrôle, certificats ou signatures

80.

FLOW RATE CONTROL VALVE, MANUFACTURING METHOD OF FLOW RATE CONTROL VALVE, AND FLOW RATE CONTROL APPARATUS

      
Numéro d'application 18723382
Statut En instance
Date de dépôt 2022-10-20
Date de la première publication 2025-02-27
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Shakudo, Kazuya
  • Hayashi, Shigeyuki
  • Nagasawa, Masayuki

Abrégé

A flow rate control valve includes a valve seat portion, a valve member, a driving portion, and a support member supporting the valve member via a diaphragm portion. The valve member has an opposite face opposite from a valve seat face with respect to a seat face and a circumferential face connecting together the seat face and the opposite face. The diaphragm portion is connected to the circumferential face of the valve member at a position closer to the seat face than to the opposite face. The support member has a first face on the same side as the opposite face with respect to a membrane face of the diaphragm portion and a second face closer to the valve seat portion than the first face. When the diaphragm portion is not deformed, the opposite face and the first face are on the same plane.

Classes IPC  ?

  • F16K 1/36 - Corps de soupapes
  • F16K 27/02 - Structures des logementsMatériaux utilisés à cet effet des soupapes de levage

81.

ENCLOSED BATTERY EMISSIONS DILUTION AND SAMPLING

      
Numéro d'application US2024040155
Numéro de publication 2025/042552
Statut Délivré - en vigueur
Date de dépôt 2024-07-30
Date de publication 2025-02-27
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s)
  • Rahman, Montajir
  • Stocker, Richard
  • Sobczak, Terry

Abrégé

An enclosed battery emissions dilution and sampling system includes a heated exhaust tube, an enclosure defining at least one inlet port on one end of the enclosure and an outlet port on another end of the enclosure fed into the heated exhaust tube, a dilution air line, at least one heated inlet line arranged with an end of the dilution air line and fed into the at least one inlet port, and a bypass line connected between the dilution air line and heated exhaust tube, and around the enclosure.

Classes IPC  ?

  • H01M 10/42 - Procédés ou dispositions pour assurer le fonctionnement ou l'entretien des éléments secondaires ou des demi-éléments secondaires
  • G01N 33/00 - Recherche ou analyse des matériaux par des méthodes spécifiques non couvertes par les groupes

82.

OPEN AIR BATTERY EMISSIONS DILUTION AND SAMPLING

      
Numéro d'application US2024041956
Numéro de publication 2025/042612
Statut Délivré - en vigueur
Date de dépôt 2024-08-12
Date de publication 2025-02-27
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s)
  • Rahman, Montajir
  • Stocker, Richard
  • Sobczak, Terry
  • Israel, Joshua

Abrégé

An open air battery emissions dilution and sampling system includes a sample accumulator that defines a funneled cavity having an open end exposed to ambient dilution air and that captures and dilutes with the ambient dilution air emissions from a battery, at least partially disposed within the funneled cavity and experiencing thermal runaway, to form diluted exhaust.

Classes IPC  ?

  • G01N 1/38 - Dilution, dispersion ou mélange des échantillons
  • G01N 1/24 - Dispositifs d'aspiration
  • G01N 33/00 - Recherche ou analyse des matériaux par des méthodes spécifiques non couvertes par les groupes
  • H01M 10/42 - Procédés ou dispositions pour assurer le fonctionnement ou l'entretien des éléments secondaires ou des demi-éléments secondaires

83.

ENCLOSED BATTERY EMISSIONS DILUTION AND SAMPLING

      
Numéro d'application 18452131
Statut En instance
Date de dépôt 2023-08-18
Date de la première publication 2025-02-20
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s)
  • Rahman, Montajir
  • Stocker, Richard
  • Sobczak, Terry

Abrégé

An enclosed battery emissions dilution and sampling system includes a heated exhaust tube, an enclosure defining at least one inlet port on one end of the enclosure and an outlet port on another end of the enclosure fed into the heated exhaust tube, a dilution air line, at least one heated inlet line arranged with an end of the dilution air line and fed into the at least one inlet port, and a bypass line connected between the dilution air line and heated exhaust tube, and around the enclosure.

Classes IPC  ?

  • G01F 1/684 - Dispositions de structureMontage des éléments, p. ex. relativement à l'écoulement de fluide
  • G01F 1/696 - Circuits à cet effet, p. ex. débitmètres à courant constant
  • G01F 15/00 - Détails des appareils des groupes ou accessoires pour ces derniers, dans la mesure où de tels accessoires ou détails ne sont pas adaptés à ces types particuliers d'appareils, p. ex. pour l'indication à distance
  • H01M 10/42 - Procédés ou dispositions pour assurer le fonctionnement ou l'entretien des éléments secondaires ou des demi-éléments secondaires

84.

OPEN AIR BATTERY EMISSIONS DILUTION AND SAMPLING

      
Numéro d'application 18452191
Statut En instance
Date de dépôt 2023-08-18
Date de la première publication 2025-02-20
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s)
  • Rahman, Montajir
  • Stocker, Richard
  • Sobczak, Terry
  • Israel, Joshua

Abrégé

An open air battery emissions dilution and sampling system includes a sample accumulator that defines a funneled cavity having an open end exposed to ambient dilution air and that captures and dilutes with the ambient dilution air emissions from a battery, at least partially disposed within the funneled cavity and experiencing thermal runaway, to form diluted exhaust.

Classes IPC  ?

  • H01M 10/52 - Enlèvement des gaz situés à l'intérieur de l'élément secondaire, p. ex. par absorption
  • H01M 10/42 - Procédés ou dispositions pour assurer le fonctionnement ou l'entretien des éléments secondaires ou des demi-éléments secondaires
  • H01M 10/615 - Chauffage ou maintien de la chaleur
  • H01M 50/317 - Aménagements refermables

85.

ENERGY MANAGEMENT SYSTEM, ENERGY MANAGEMENT METHOD, AND ENERGY MANAGEMENT PROGRAM

      
Numéro d'application JP2024027995
Numéro de publication 2025/033401
Statut Délivré - en vigueur
Date de dépôt 2024-08-06
Date de publication 2025-02-13
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Iwao, Keijiro
  • Kakino, Toru
  • Ishikuma, Toru

Abrégé

The present invention is an energy management system that realizes energy conservation focusing on a frequency distribution indicating the frequency of energy consumption amounts in an energy demand facility, the energy management system managing consumed energy in the energy demand facility, wherein the energy management system comprises a clustering unit for clustering past energy consumption amounts for the energy demand facility into a plurality of clusters on the basis of a prescribed condition, a modeling unit for modeling a frequency distribution indicating the frequency of the energy consumption amounts in each cluster into a distribution having at least one positive skew, and a schedule adjustment unit for adjusting the operation schedule of the energy demand facility so as to reduce the variance of the modeled distribution.

Classes IPC  ?

86.

POLISPECTRA

      
Numéro d'application 019138490
Statut Enregistrée
Date de dépôt 2025-02-04
Date d'enregistrement 2025-06-13
Propriétaire HORIBA Instruments Incorporated (USA)
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

SCIENTIFIC APPARATUS AND INSTRUMENTS FOR OPTICAL ANALYSIS, SPECTROSCOPY, NAMELY, IMAGING CCD AND SCMOS SPECTROMETERS AND SPECTROGRAPHS.

87.

GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM FOR GAS ANALYSIS DEVICE

      
Numéro d'application 18696835
Statut En instance
Date de dépôt 2022-10-03
Date de la première publication 2025-01-30
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Nagura, Naoki
  • Kawabuchi, Yasushi
  • Takahashi, Daichi
  • Hara, Kenji
  • Kikuta, Takayuki
  • Yoshioka, Masaya
  • Nakamura, Kotaro

Abrégé

A gas analysis device includes a sample cell into which sample gas is introduced, a light source that irradiates the sample cell with light, a photodetector that detects light intensity of light which passes through the sample cell irradiated by the light source, a concentration calculation unit which calculates a concentration of a measurement target component contained in the sample gas based on light intensity outputted from the photodetector, and a light intensity output unit that outputs, comparably with a reference light intensity set in advance, a light intensity at calibration detected by the photodetector during calibration.

Classes IPC  ?

  • G01N 21/3504 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse des gaz, p. ex. analyse de mélanges de gaz
  • G01N 1/22 - Dispositifs pour prélever des échantillons à l'état gazeux
  • G01N 21/03 - Détails de structure des cuvettes
  • G01N 21/35 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge
  • G01N 21/39 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant des lasers à longueur d'onde réglable

88.

Yumivet

      
Numéro d'application 1834279
Statut Enregistrée
Date de dépôt 2024-12-04
Date d'enregistrement 2024-12-04
Propriétaire HORIBA ABX SAS (France)
Classes de Nice  ? 10 - Appareils et instruments médicaux

Produits et services

Veterinary apparatus and instruments.

89.

Miscellaneous Design

      
Numéro d'application 1835060
Statut Enregistrée
Date de dépôt 2024-11-28
Date d'enregistrement 2024-11-28
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 10 - Appareils et instruments médicaux

Produits et services

Computer software; computer software for medical use; computer software for electronic chart for medical purposes; computer software for veterinary use; computer software for electronic chart for veterinary purposes; computer programs; measuring or testing machines and instruments; laboratory apparatus and instruments; photographic machines and apparatus; optical machines and apparatus. Medical apparatus and instruments; diagnostic apparatus and instruments; veterinary apparatus and instruments; veterinary diagnostic apparatus and instruments.

90.

BLOOD ANALYSIS APPARATUS, BLOOD ANALYSIS METHOD, AND RECORDING MEDIUM

      
Numéro d'application 18715686
Statut En instance
Date de dépôt 2022-11-28
Date de la première publication 2025-01-23
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Isshiki, Ryota
  • Ikeda, Motohide
  • Osawa, Kenta

Abrégé

A blood analysis apparatus includes: a container information acquisition portion that acquires container information on the type of sample container to be used; a needle that sucks and discharges a blood sample contained in the sample container; a blood analysis portion having a chamber that receives the blood sample sucked from the sample container and discharged into it with the needle; and a control portion that controls suction and discharge of the blood sample with the needle based on the container information. The control portion sets the amount of blood sample to be sucked with the needle based on the container information.

Classes IPC  ?

  • G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p. ex. dispositifs d'aspiration, dispositifs d'injection
  • G01N 1/14 - Dispositifs d'aspiration, p. ex. pompesDispositifs d'éjection
  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet

91.

OUTPUT DEVICE, BLOOD ANALYSIS APPARATUS, BLOOD ANALYSIS METHOD, AND RECORDING MEDIUM

      
Numéro d'application 18715671
Statut En instance
Date de dépôt 2022-11-28
Date de la première publication 2025-01-16
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Nishimori, Masashi
  • Ohashi, Akika
  • Nakagawa, Yohei

Abrégé

An output device includes: a measurement information reception portion configured to receive measurement information including a measurement result on a blood sample; a code information generation portion configured to generate code information by adding the measurement information to browsing destination information indicating a browsing destination at which to browse the measurement information; and an output portion configured to output the code information.

Classes IPC  ?

  • G16H 10/40 - TIC spécialement adaptées au maniement ou au traitement des données médicales ou de soins de santé relatives aux patients pour des données relatives aux analyses de laboratoire, p. ex. pour des analyses d’échantillon de patient
  • G01N 33/48 - Matériau biologique, p. ex. sang, urineHémocytomètres
  • G06F 21/60 - Protection de données
  • G06K 19/06 - Supports d'enregistrement pour utilisation avec des machines et avec au moins une partie prévue pour supporter des marques numériques caractérisés par le genre de marque numérique, p. ex. forme, nature, code

92.

FLOW RATE CALCULATION DEVICE AND FLOW RATE CALCULATION METHOD

      
Numéro d'application 18770538
Statut En instance
Date de dépôt 2024-07-11
Date de la première publication 2025-01-16
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Horinouchi, Osamu

Abrégé

A flow rate calculation device includes: a specific flow path and a bypass flow path which are provided to branch from a main flow path; a first fluid resistance element which is provided in the specific flow path; a second fluid resistance element which is provided in the bypass flow path; a container which is arranged in the specific flow path; a pressure sensor which detects a pressure in the container; and a flow rate calculation unit. The flow rate calculation unit calculates the flow rate of a first branch fluid diverted to the specific flow path based on a change in the pressure in the container, and calculates the flow rate of the fluid flowing through the main flow path based on the calculated flow rate of the first branch fluid and a diversion ratio determined according to the first fluid resistance element and the second fluid resistance element.

Classes IPC  ?

  • G01F 1/36 - Mesure du débit volumétrique ou du débit massique d'un fluide ou d'un matériau solide fluent, dans laquelle le fluide passe à travers un compteur par un écoulement continu en utilisant des effets mécaniques en mesurant la pression ou la différence de pression la pression ou la différence de pression étant produite par une contraction de la veine fluide

93.

RADIATION DETECTION DEVICE AND SIGNAL PROCESSING METHOD

      
Numéro d'application JP2024021278
Numéro de publication 2025/013496
Statut Délivré - en vigueur
Date de dépôt 2024-06-12
Date de publication 2025-01-16
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga, Daisuke
  • Murata, Shunsuke
  • Ohashi, Satoshi
  • Valiev, Ildar
  • Aoyama, Tomoki
  • Okubo, Yuji

Abrégé

Provided are a radiation detection device and a signal processing method that are capable of preventing damage to a radiation detector. The radiation detection device comprises: a radiation detector that outputs a signal in response to the entry of radiation or light; and a stop processing unit that determines whether excessive radiation or excessive light has entered the radiation detector on the basis of the signal output from the radiation detector, and that stops the operation of the radiation detector or stops the generation of radiation or light when it is determined that excessive radiation or excessive light has entered the radiation detector.

Classes IPC  ?

  • G01T 1/17 - Dispositions de circuits non adaptés à un type particulier de détecteur
  • G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs

94.

VERIDRIVE

      
Numéro d'application 1833419
Statut Enregistrée
Date de dépôt 2024-11-26
Date d'enregistrement 2024-11-26
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measurement apparatus and instruments for engine emission, and parts and fittings therefor; measurement apparatus and instruments for emission, and parts and fittings therefor; measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; measurement apparatus and instruments for process gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; on-board measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for emission, and parts and fittings therefor; on-board measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measurement apparatus and instruments for process gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; portable measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for emission, and parts and fittings therefor; portable measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measurement apparatus and instruments for process gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; measurement apparatus and instruments for automobile emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for automobile emission, and parts and fittings therefor; measurement apparatus and instruments for vehicle emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle emission, and parts and fittings therefor; vehicle engine testing apparatus and instruments, and parts and fittings therefor; automotive engine testing apparatus and instruments, and parts and fittings therefor; engine testing apparatus and instruments, and parts and fittings therefor; computer software for controlling measurement apparatus and instruments for vehicle engine emission; computer software for controlling measurement apparatus and instruments for engine emission; computer software for controlling measurement apparatus and instruments for emission; computer software for controlling measurement apparatus and instruments for exhaust gases; computer software for controlling measurement apparatus and instruments for process gases; computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; computer software for controlling measuring and analyzing apparatus and instruments for engine emission; computer software for controlling measuring and analyzing apparatus and instruments for emission; computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; computer software for controlling measuring and analyzing apparatus and instruments for process gases; computer software for controlling engine testing apparatus and instruments; computer software; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair or maintenance of measurement apparatus and instruments for vehicle engine emission; repair or maintenance of measurement apparatus and instruments for engine emission; repair or maintenance of measurement apparatus and instruments for emission; repair or maintenance of measurement apparatus and instruments for exhaust gases; repair or maintenance of measurement apparatus and instruments for process gases; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for emission; repair or maintenance of measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of measuring and analyzing apparatus and instruments for process gases; repair or maintenance of on-board measurement apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measurement apparatus and instruments for engine emission; repair or maintenance of on-board measurement apparatus and instruments for emission; repair or maintenance of on-board measurement apparatus and instruments for exhaust gases; repair or maintenance of on-board measurement apparatus and instruments for process gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for process gases; repair or maintenance of portable measurement apparatus and instruments for vehicle engine emission; repair or maintenance of portable measurement apparatus and instruments for engine emission; repair or maintenance of portable measurement apparatus and instruments for emission; repair or maintenance of portable measurement apparatus and instruments for exhaust gases; repair or maintenance of portable measurement apparatus and instruments for process gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for process gases; repair or maintenance of measurement apparatus and instruments for automobile emission; repair or maintenance of measuring and analyzing apparatus and instruments for automobile emission; repair or maintenance of measurement apparatus and instruments for vehicle emission; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle emission; repair or maintenance of vehicle engine testing apparatus and instruments; repair or maintenance of automotive engine testing apparatus and instruments; repair or maintenance of engine testing apparatus and instruments; repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of optical machines and apparatus; repair or maintenance of cinematographic machines and apparatus; repair or maintenance of photographic machines and apparatus. Rental of measurement apparatus and instruments for vehicle engine emission; rental of measurement apparatus and instruments for engine emission; rental of measurement apparatus and instruments for emission; rental of measurement apparatus and instruments for exhaust gases; rental of measurement apparatus and instruments for process gases; rental of measuring and analyzing apparatus and instruments for vehicle engine emission; rental of measuring and analyzing apparatus and instruments for engine emission; rental of measuring and analyzing apparatus and instruments for emission; rental of measuring and analyzing apparatus and instruments for exhaust gases; rental of measuring and analyzing apparatus and instruments for process gases; rental of on-board measurement apparatus and instruments for vehicle engine emission; rental of on-board measurement apparatus and instruments for engine emission; rental of on-board measurement apparatus and instruments for emission; rental of on-board measurement apparatus and instruments for exhaust gases; rental of on-board measurement apparatus and instruments for process gases; rental of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; rental of on-board measuring and analyzing apparatus and instruments for engine emission; rental of on-board measuring and analyzing apparatus and instruments for emission; rental of on-board measuring and analyzing apparatus and instruments for exhaust gases; rental of on-board measuring and analyzing apparatus and instruments for process gases; rental of portable measurement apparatus and instruments for vehicle engine emission; rental of portable measurement apparatus and instruments for engine emission; rental of portable measurement apparatus and instruments for emission; rental of portable measurement apparatus and instruments for exhaust gases; rental of portable measurement apparatus and instruments for process gases; rental of portable measuring and analyzing apparatus and instruments for vehicle engine emission; rental of portable measuring and analyzing apparatus and instruments for engine emission; rental of portable measuring and analyzing apparatus and instruments for emission; rental of portable measuring and analyzing apparatus and instruments for exhaust gases; rental of portable measuring and analyzing apparatus and instruments for process gases; rental of measurement apparatus and instruments for automobile emission; rental of measuring and analyzing apparatus and instruments for automobile emission; rental of measurement apparatus and instruments for vehicle emission; rental of measuring and analyzing apparatus and instruments for vehicle emission; rental of vehicle engine testing apparatus and instruments; rental of automotive engine testing apparatus and instruments; rental of engine testing apparatus and instruments; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; calibration of measurement apparatus and instruments for vehicle engine emission; calibration of measurement apparatus and instruments for engine emission; calibration of measurement apparatus and instruments for emission; calibration of measurement apparatus and instruments for exhaust gases; calibration of measurement apparatus and instruments for process gases; calibration of measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of measuring and analyzing apparatus and instruments for engine emission; calibration of measuring and analyzing apparatus and instruments for emission; calibration of measuring and analyzing apparatus and instruments for exhaust gases; calibration of measuring and analyzing apparatus and instruments for process gases; calibration of on-board measurement apparatus and instruments for vehicle engine emission; calibration of on-board measurement apparatus and instruments for engine emission; calibration of on-board measurement apparatus and instruments for emission; calibration of on-board measurement apparatus and instruments for exhaust gases; calibration of on-board measurement apparatus and instruments for process gases; calibration of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of on-board measuring and analyzing apparatus and instruments for engine emission; calibration of on-board measuring and analyzing apparatus and instruments for emission; calibration of on-board measuring and analyzing apparatus and instruments for exhaust gases; calibration of on-board measuring and analyzing apparatus and instruments for process gases; calibration of portable measurement apparatus and instruments for vehicle engine emission; calibration of portable measurement apparatus and instruments for engine emission; calibration of portable measurement apparatus and instruments for emission; calibration of portable measurement apparatus and instruments for exhaust gases; calibration of portable measurement apparatus and instruments for process gases; calibration of portable measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of portable measuring and analyzing apparatus and instruments for engine emission; calibration of portable measuring and analyzing apparatus and instruments for emission; calibration of portable measuring and analyzing apparatus and instruments for exhaust gases; calibration of portable measuring and analyzing apparatus and instruments for process gases; calibration of measurement apparatus and instruments for automobile emission; calibration of measuring and analyzing apparatus and instruments for automobile emission; calibration of measurement apparatus and instruments for vehicle emission; calibration of measuring and analyzing apparatus and instruments for vehicle emission; calibration of vehicle engine testing apparatus and instruments; calibration of automotive engine testing apparatus and instruments; calibration of engine testing apparatus and instruments; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of measurement apparatus and instruments for vehicle engine emission; design of measurement apparatus and instruments for engine emission; design of measurement apparatus and instruments for emission; design of measurement apparatus and instruments for exhaust gases; design of measurement apparatus and instruments for process gases; design of measuring and analyzing apparatus and instruments for vehicle engine emission; design of measuring and analyzing apparatus and instruments for engine emission; design of measuring and analyzing apparatus and instruments for emission; design of measuring and analyzing apparatus and instruments for exhaust gases; design of measuring and analyzing apparatus and instruments for process gases; design of on-board measurement apparatus and instruments for vehicle engine emission; design of on-board measurement apparatus and instruments for engine emission; design of on-board measurement apparatus and instruments for emission; design of on-board measurement apparatus and instruments for exhaust gases; design of on-board measurement apparatus and instruments for process gases; design of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; design of on-board measuring and analyzing apparatus and instruments for engine emission; design of on-board measuring and analyzing apparatus and instruments for emission; design of on-board measuring and analyzing apparatus and instruments for exhaust gases; design of on-board measuring and analyzing apparatus and instruments for process gases; design of portable measurement apparatus and instruments for vehicle engine emission; design of portable measurement apparatus and instruments for engine emission; design of portable measurement apparatus and instruments for emission; design of portable measurement apparatus and instruments for exhaust gases; design of portable measurement apparatus and instruments for process gases; design of portable measuring and analyzing apparatus and instruments for vehicle engine emission; design of portable measuring and analyzing apparatus and instruments for engine emission; design of portable measuring and analyzing apparatus and instruments for emission; design of portable measuring and analyzing apparatus and instruments for exhaust gases; design of portable measuring and analyzing apparatus and instruments for process gases; design of measurement apparatus and instruments for automobile emission; design of measuring and analyzing apparatus and instruments for automobile emission; design of measurement apparatus and instruments for vehicle emission; design of measuring and analyzing apparatus and instruments for vehicle emission; design of vehicle engine testing apparatus and instruments; design of automotive engine testing apparatus and instruments; design of engine testing apparatus and instruments; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling engine testing apparatus and instruments; design, programming and maintenance of computer software; rental of computer software for controlling measurement apparatus and instruments for vehicle engine emission; rental of computer software for controlling measurement apparatus and instruments for engine emission; rental of computer software for controlling measurement apparatus and instruments for emission; rental of computer software for controlling measurement apparatus and instruments for exhaust gases; rental of computer software for controlling measurement apparatus and instruments for process gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for process gases; rental of computer software for controlling engine testing apparatus and instruments; rental of computer software; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling engine testing apparatus and instruments; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

95.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Numéro d'application 18574020
Statut En instance
Date de dépôt 2022-05-25
Date de la première publication 2025-01-09
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Tachibana, Kohei
  • Nakamura, Keishi
  • Niina, Kodai
  • Miyawaki, Daisuke
  • Watanabe, Tsuyoshi
  • Ido, Takuya

Abrégé

To appropriately take explosion-proof measures for an analysis device while suppressing consumption of a purge gas, an analysis device includes a filling unit, an irradiation unit, a propagation unit, a housing, a purge gas introduction unit, and an explosion-proof gas introduction unit. The filling unit is filled with a sample gas containing a gas to be measured. The irradiation unit emits measurement light to be used for analyzing the gas to be measured. The propagation unit is disposed between the filling unit and the irradiation unit, so as to form a propagation space for propagating the measurement light emitted from the irradiation unit to the filling unit. The housing houses the filling unit, the irradiation unit, and the propagation unit. The purge gas introduction unit introduces the purge gas into the propagation space. The explosion-proof gas introduction unit introduces an explosion-proof gas into the internal space of the housing.

Classes IPC  ?

  • G01N 21/31 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique
  • G01N 33/00 - Recherche ou analyse des matériaux par des méthodes spécifiques non couvertes par les groupes

96.

GATELINK

      
Numéro d'application 1831423
Statut Enregistrée
Date de dépôt 2024-11-28
Date d'enregistrement 2024-11-28
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 10 - Appareils et instruments médicaux

Produits et services

Computer software; computer software for medical use; computer software for electronic chart for medical purposes; computer software for veterinary use; computer software for electronic chart for veterinary purposes; computer programs; measuring or testing machines and instruments; laboratory apparatus and instruments; photographic machines and apparatus; optical machines and apparatus. Medical apparatus and instruments; diagnostic apparatus and instruments; veterinary apparatus and instruments; veterinary diagnostic apparatus and instruments.

97.

GAS ANALYSIS DEVICE, FUEL GAS SUPPLY MECHANISM, AND GAS ANALYSIS METHOD

      
Numéro d'application JP2024018439
Numéro de publication 2025/004598
Statut Délivré - en vigueur
Date de dépôt 2024-05-20
Date de publication 2025-01-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Kondo, Yosuke
  • Kasugai, Tetsuya
  • Nishigai, Hiroki

Abrégé

The present invention is a fuel gas supply mechanism for replacing a fuel gas cylinder without causing an accidental fire of hydrogen flame in a hydrogen flame ionization detection device, and comprises a first fuel gas port 51 to which a first fuel gas cylinder 10a is connected, a second fuel gas port 52 to which a second fuel gas cylinder 10b is connected, a first fuel gas flow passage 53 that connects the first fuel gas port 51 and an FID detector 4, a second fuel gas flow passage 54 that connects the second fuel gas port 52 and the FID detector 4, and a fuel gas backflow prevention mechanism 50 that prevents backflow from the first fuel gas flow passage 53 to the second fuel gas flow passage 54 or backflow from the second fuel gas flow passage 54 to the first fuel gas flow passage 53.

Classes IPC  ?

  • G01N 27/626 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'ionisation des gaz, p. ex. des aérosolsRecherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant les décharges électriques, p. ex. l'émission cathodique utilisant la chaleur pour ioniser un gaz
  • G01M 15/10 - Test des moteurs à combustion interne par contrôle des gaz d'échappement

98.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Numéro d'application JP2024021190
Numéro de publication 2025/004791
Statut Délivré - en vigueur
Date de dépôt 2024-06-11
Date de publication 2025-01-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Nakamura, Ryuhei
  • Ito, Hiroshi
  • Matsumoto, Erika

Abrégé

The present invention acquires analysis results relating to the mass concentration and the elements of an analysis object in a short time and with a simple device configuration. An analysis device (100) comprises a β ray source (51), a detection unit (7, 7', 7"), and an analysis unit (9). The β ray source (51) irradiates the analysis object with β rays. The detection unit (7, 7', 7") simultaneously detects transmitted β rays that have passed through the analysis object and fluorescent X-rays that have been produced by irradiating the analysis object with the β rays, and outputs detection signals. The analysis unit (9) acquires, from the detection signals, a first signal produced by detecting the transmitted β rays and a second signal produced by detecting the fluorescent X-rays. The analysis unit (9) calculates information relating to the mass concentration of the analysis object on the basis of the first signal, and calculates information relating to the elements included in the analysis object on the basis of the second signal.

Classes IPC  ?

  • G01N 23/2206 - Combinaison de plusieurs mesures, l'une au moins étant celle d’une émission secondaire, p. ex. combinaison d’une mesure d’électrons secondaires [ES] et d’électrons rétrodiffusés [ER]
  • G01N 23/02 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau

99.

BATTERY CASE EVALUATION SYSTEM, BATTERY CASE EVALUATION PROGRAM, AND BATTERY CASE EVALUATION METHOD

      
Numéro d'application JP2024023511
Numéro de publication 2025/005247
Statut Délivré - en vigueur
Date de dépôt 2024-06-28
Date de publication 2025-01-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga, Shimpachi
  • Hatakeyama, Hiroshi
  • Tatsukawa, Shogo

Abrégé

A battery case evaluation system 100 for evaluating the thermal properties of a battery case BC constituting a battery pack or of a component of said battery case BC, said system being equipped with a simulation battery 10 which is installed in the battery case BC and simulates the thermal behavior of an actual battery which is a component of a battery pack, a power supply device 20 which supplies power to the simulation battery 10, and a control device 30 which controls the power supply device 20, wherein the control device 30 is configured so as to have: a parameter reception unit 31 which receives an input profile expressing the change over time in the current, voltage or power supplied to the actual battery as one evaluation parameter; a resistance value calculation unit 331 which calculates a resistance value of the actual battery which changes over time on the basis of the simulation battery temperature and the input profile; and a supply power control unit 33 which controls the power supply device 20 by using the resistance value calculated by the resistance value calculation unit 331.

Classes IPC  ?

  • G01R 31/367 - Logiciels à cet effet, p. ex. pour le test des batteries en utilisant une modélisation ou des tables de correspondance
  • G01N 25/18 - Recherche ou analyse des matériaux par l'utilisation de moyens thermiques en recherchant la conductivité thermique
  • G01R 31/382 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p. ex. état de charge
  • G01R 31/385 - Dispositions pour mesurer des variables des batteries ou des accumulateurs
  • G01R 31/389 - Mesure de l’impédance interne, de la conductance interne ou des variables similaires
  • G01R 31/392 - Détermination du vieillissement ou de la dégradation de la batterie, p. ex. état de santé
  • H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p. ex. le niveau ou la densité de l'électrolyte

100.

TEST SAMPLE TESTING SYSTEM, TEMPERATURE ADJUSTMENT DEVICE, TEST SAMPLE TESTING METHOD, AND TEST SAMPLE TESTING PROGRAM

      
Numéro d'application JP2024021305
Numéro de publication 2025/004803
Statut Délivré - en vigueur
Date de dépôt 2024-06-12
Date de publication 2025-01-02
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Tatsukawa, Shogo
  • Hatakeyama, Hiroshi
  • Matsunaga, Shimpachi

Abrégé

The present invention is for testing a test sample while simulating heat input or heat dissipation via an actual power line during actual use, and is a test sample testing system 100 for testing a test sample W, which is an electrical device, the test sample testing system 100 comprising: a test power line 4 that is connected to the test sample W; and a temperature adjustment device 5 for adjusting the temperature of the test power line 4 connected to the test sample W.

Classes IPC  ?

  • G01M 17/007 - Véhicules à roues ou à chenilles
  • G01R 31/36 - Dispositions pour le test, la mesure ou la surveillance de l’état électrique d’accumulateurs ou de batteries, p. ex. de la capacité ou de l’état de charge
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