HORIBA, Ltd.

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Type PI
        Brevet 1 260
        Marque 234
Juridiction
        États-Unis 735
        International 702
        Europe 44
        Canada 13
Propriétaire / Filiale
[Owner] HORIBA, Ltd. 833
HORIBA STEC, Co., Ltd. 350
Horiba Instruments Incorporated 127
Horiba ABX SAS 112
Horiba Jobin Yvon SAS 48
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Date
Nouveautés (dernières 4 semaines) 8
2025 novembre (MACJ) 6
2025 octobre 13
2025 septembre 7
2025 août 8
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Classe IPC
G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques 96
G01M 17/007 - Véhicules à roues ou à chenilles 83
G01N 1/22 - Dispositifs pour prélever des échantillons à l'état gazeux 81
G01N 15/02 - Recherche de la dimension ou de la distribution des dimensions des particules 70
G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X 66
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Classe NICE
09 - Appareils et instruments scientifiques et électriques 193
07 - Machines et machines-outils 31
42 - Services scientifiques, technologiques et industriels, recherche et conception 29
10 - Appareils et instruments médicaux 27
37 - Services de construction; extraction minière; installation et réparation 27
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Statut
En Instance 122
Enregistré / En vigueur 1 372
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1.

CCEVA

      
Numéro d'application 1889994
Statut Enregistrée
Date de dépôt 2025-10-14
Date d'enregistrement 2025-10-14
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Carbon dioxide measuring apparatus, and parts and fittings therefor; carbon dioxide analyzing apparatus, and parts and fittings therefor; carbon dioxide measuring and analyzing apparatus, and parts and fittings therefor; gas measuring apparatus, and parts and fittings therefor; gas analyzing apparatus, and parts and fittings therefor; gas measuring and analyzing apparatus, and parts and fittings therefor; fluid flow meters; measuring or testing machines and instruments; laboratory apparatus and instruments; photographic machines and apparatus; cinematographic machines and apparatus; optical machines and apparatus; telecommunication machines and apparatus; electronic computer and data processing machines and apparatus and their parts; downloadable and recorded computer software for controlling carbon dioxide measuring apparatus, carbon dioxide analyzing apparatus, and carbon dioxide measuring and analyzing apparatus; downloadable and recorded computer software for controlling gas measuring apparatus, gas analyzing apparatus, and gas measuring and analyzing apparatus; computer software; computer programs. Repair and maintenance of carbon dioxide measuring apparatus; repair and maintenance of carbon dioxide analyzing apparatus; repair and maintenance of carbon dioxide measuring and analyzing apparatus; repair and maintenance of gas measuring apparatus; repair and maintenance of gas analyzing apparatus; repair and maintenance of gas measuring and analyzing apparatus; repair and maintenance of fluid flow meters; repair and maintenance of measuring or testing machines and instruments; repair and maintenance of laboratory apparatus and instruments; repair and maintenance of photographic machines and apparatus; repair and maintenance of cinematographic machines and apparatus; repair and maintenance of optical machines and apparatus; repair and maintenance of telecommunication machines and apparatus; repair and maintenance of electronic machines and apparatus. Rental of carbon dioxide measuring apparatus; rental of carbon dioxide analyzing apparatus; rental of carbon dioxide measuring and analyzing apparatus; rental of gas measuring apparatus; rental of gas analyzing apparatus; rental of gas measuring and analyzing apparatus; rental of fluid flow meters; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of carbon dioxide measuring apparatus; calibration of carbon dioxide analyzing apparatus; calibration of carbon dioxide measuring and analyzing apparatus; calibration of gas measuring apparatus; calibration of gas analyzing apparatus; calibration of gas measuring and analyzing apparatus; calibration of fluid flow meters; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of photographic machines and apparatus; calibration of cinematographic machines and apparatus; calibration of optical machines and apparatus; calibration of telecommunication machines and apparatus; calibration of electronic machines and apparatus; design of carbon dioxide measuring apparatus; design of carbon dioxide analyzing apparatus; design of carbon dioxide measuring and analyzing apparatus; design of gas measuring apparatus; design of gas analyzing apparatus; design of gas measuring and analyzing apparatus; design of fluid flow meters; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of photographic machines and apparatus; design of cinematographic machines and apparatus; design of optical machines and apparatus; design of telecommunication machines and apparatus; design of electronic machines and apparatus; design, programming and maintenance of computer software for controlling carbon dioxide measuring apparatus, carbon dioxide analyzing apparatus, and carbon dioxide measuring and analyzing apparatus; design, programming and maintenance of computer software for controlling gas measuring apparatus, gas analyzing apparatus, gas measuring and analyzing apparatus, and fluid flow meters; design, programming and maintenance of computer software; design, programming and maintenance of computer programs; providing on-line non-downloadable computer software for controlling carbon dioxide measuring apparatus, carbon dioxide analyzing apparatus, and carbon dioxide measuring and analyzing apparatus; providing on-line non-downloadable computer software for controlling gas measuring apparatus, gas analyzing apparatus, gas measuring and analyzing apparatus, and fluid flow meters; providing on-line non-downloadable computer software; providing on-line non-downloadable computer programs; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

2.

TEST SYSTEM, TEST METHOD, AND TEST PROGRAM FOR HEAT MANAGEMENT SYSTEM

      
Numéro d'application JP2025017856
Numéro de publication 2025/243948
Statut Délivré - en vigueur
Date de dépôt 2025-05-16
Date de publication 2025-11-27
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Hirai, Seiji
  • Iseki, Hirotaka
  • Michikita, Toshiyuki
  • Yoshimura, Ryo

Abrégé

The present invention makes it possible to improve tracking with respect to changes in an amount of heat at a heat management system and comprises a simulated heat source body 2 for thermally simulating a heat source component, a heat supply device 3 that supplies heat to the simulated heat source body 2, a heat amount acquisition unit 41 that acquires the amount of heat produced by a heat source component of a heat-generating device, and a heat simulation control unit 42 that controls the heat supply device 3 to thermally simulate the heat source component using the simulated heat source body 2. The heat simulation control unit 42 controls the heat supply device 3 on the basis of the amount of heat acquired by the heat amount acquisition unit 41 and an outlet temperature T5 or an outlet flow rate FR5 for a test object temperature adjustment apparatus 210 of a heat management system 200.

Classes IPC  ?

  • G01M 17/007 - Véhicules à roues ou à chenilles
  • G01M 99/00 - Matière non prévue dans les autres groupes de la présente sous-classe

3.

LIQUID SAMPLE ANALYSIS METHOD, LIQUID SAMPLE ANALYSIS PROGRAM, AND LIQUID SAMPLE ANALYSIS SYSTEM

      
Numéro d'application JP2025016885
Numéro de publication 2025/243856
Statut Délivré - en vigueur
Date de dépôt 2025-05-08
Date de publication 2025-11-27
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Aoyama, Tomoki
  • Mori, Tetsuya

Abrégé

Even for a liquid sample in which particle elements forming solid particles partially overlap compound elements forming a compound dissolved in a solution, the present invention quantifies only the solid particles. The present invention involves: measuring the concentration of elements (hereinafter referred to as non-overlapping elements) in the liquid not overlapping particle elements; calculating the concentration of elements (hereinafter referred to as overlapping elements) in the liquid overlapping the particle elements; measuring the total concentration of the overlapping elements and the particle elements included in the liquid sample; and calculating the concentration of the particle elements by subtracting the concentration of the overlapping elements from the total concentration.

Classes IPC  ?

  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

4.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Numéro d'application 19212430
Statut En instance
Date de dépôt 2025-05-19
Date de la première publication 2025-11-20
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Shakudo, Kazuya
  • Hida, Yuki

Abrégé

The present invention reduces seat leakage while increasing a flow rate, and includes an orifice 31 having a valve seat surface 31s and a valve body 32 having a seating surface 32s seated on the valve seat surface 31s. The orifice 31 has an annular groove M1 formed in the valve seat surface 31s and an internal flow path L1 communicating with an upstream flow path R1 and opened in the annular groove M1. The internal flow path L1 is opened on the same plane as the valve seat surface 31s and extends outward of the annular groove M1 in plan view.

Classes IPC  ?

5.

UR-Z

      
Numéro d'application 1886814
Statut Enregistrée
Date de dépôt 2025-09-08
Date d'enregistrement 2025-09-08
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Classes de Nice  ?
  • 07 - Machines et machines-outils
  • 09 - Appareils et instruments scientifiques et électriques

Produits et services

Automatic pressure regulators being parts of machines; pressure regulators being parts of machines; pressure regulating valves being parts of machines; semiconductor manufacturing machines, and part and fittings therefor; machines for manufacturing batteries, and part and fittings therefor; machines for manufacturing electric storage batteries, and part and fittings therefor; machines for manufacturing solar cell, and part and fittings therefor; machines for manufacturing electronic components, and part and fittings therefor; machines for manufacturing light emitting diode, and part and fittings therefor; machines for manufacturing displays, and part and fittings therefor; machines for manufacturing liquid crystal, and part and fittings therefor; machines for manufacturing organic electroluminescence, and part and fittings therefor; pressure regulators for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure controllers [valves] being parts of machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor. Pressure gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor.

6.

Fluid control device

      
Numéro d'application 29836390
Numéro de brevet D1101105
Statut Délivré - en vigueur
Date de dépôt 2022-04-26
Date de la première publication 2025-11-04
Date d'octroi 2025-11-04
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Shakudo, Kazuya
  • Oe, Kenichi
  • Kunita, Daichi

7.

EVALUATION SYSTEM, PROGRAM FOR EVALUATION SYSTEM, AND EVALUATION METHOD

      
Numéro d'application JP2025014891
Numéro de publication 2025/225466
Statut Délivré - en vigueur
Date de dépôt 2025-04-16
Date de publication 2025-10-30
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Echigoya, Takeshi

Abrégé

An evaluation system according to the present invention evaluates the performance of an electrolysis cell that electrolyzes supplied steam to generate hydrogen gas or a test piece that is a portion thereof and comprises a steam supply line that supplies steam to the test piece, a hydrogen gas extraction line that extracts hydrogen gas that is generated from the test piece by electrolysis, a generated hydrogen information acquisition unit that acquires generated hydrogen information that directly or indirectly indicates the hydrogen gas content of a fluid that flows along the hydrogen gas extraction line, and a steam control unit that controls the flow rate of the steam supplied to the test piece from the steam supply line on the basis of the acquired generated hydrogen information.

Classes IPC  ?

  • C25B 15/023 - Mesure, analyse ou test pendant la production électrolytique
  • C25B 1/042 - Hydrogène ou oxygène par électrolyse de l'eau par électrolyse de la vapeur
  • G01N 1/00 - ÉchantillonnagePréparation des éprouvettes pour la recherche

8.

SYSTEMS AND METHODS FOR BRAKE-EMISSIONS TESTING

      
Numéro d'application US2025024833
Numéro de publication 2025/226475
Statut Délivré - en vigueur
Date de dépôt 2025-04-16
Date de publication 2025-10-30
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s)
  • Filer, Gregory
  • Newberger, Norman Malcolm

Abrégé

A free-wheeling hub wheel can be mounted to a wheel hub of a vehicle such that the free-wheeling hub wheel surrounds a brake of the vehicle. A cover is disposed over the brake and mounted around a perimeter of a rim of the free-wheeling hub wheel such that the rim and cover define a sealed container completely encapsulating the brake to capture emissions from the brake.

Classes IPC  ?

  • G01M 17/007 - Véhicules à roues ou à chenilles
  • F16D 66/00 - Dispositions pour la surveillance des conditions de fonctionnement des freins, p. ex. de l'usure ou de la température

9.

Fluid control device

      
Numéro d'application 29836396
Numéro de brevet D1100142
Statut Délivré - en vigueur
Date de dépôt 2022-04-26
Date de la première publication 2025-10-28
Date d'octroi 2025-10-28
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Shakudo, Kazuya
  • Oe, Kenichi
  • Kunita, Daichi

10.

MICROCHIP, SPECIMEN TESTING APPARATUS, AND SPECIMEN TESTING METHOD

      
Numéro d'application 18290726
Statut En instance
Date de dépôt 2022-07-13
Date de la première publication 2025-10-23
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Matsuda, Yasunori
  • Hirata, Katsuki

Abrégé

A microchip (3) has a fluid circuit in it. The fluid circuit includes: a specimen introduction portion (31) into which a specimen is introduced; a component separation portion (32) that, when a centrifugal force in a first direction (D1) occurs in the microchip (3), separates, under the centrifugal force in the first direction (D1), a component contained in the specimen introduced into the specimen introduction portion (31); and a reagent reaction portion (33) that has a carrier member (330) carrying a reagent and that makes part of the component introduced from the component separation portion (32) into the carrier member (330) react with the reagent. When a centrifugal force in a second direction (D2) different from the first direction (D1) occurs in the microchip (3), the component separated in the component separation portion (32) is introduced, under the centrifugal force in the second direction (D2), from the component separation portion (32) into the carrier member (330).

Classes IPC  ?

  • B01L 3/00 - Récipients ou ustensiles pour laboratoires, p. ex. verrerie de laboratoireCompte-gouttes
  • G01N 21/77 - Systèmes dans lesquels le matériau est soumis à une réaction chimique, le progrès ou le résultat de la réaction étant analysé en observant l'effet sur un réactif chimique

11.

SYSTEMS AND METHODS FOR BRAKE-EMISSIONS TESTING

      
Numéro d'application 18643556
Statut En instance
Date de dépôt 2024-04-23
Date de la première publication 2025-10-23
Propriétaire HORIBA Instruments Incorporated (USA)
Inventeur(s)
  • Filer, Gregory
  • Newberger, Norman Malcolm

Abrégé

A free-wheeling hub wheel can be mounted to a wheel hub of a vehicle such that the free-wheeling hub wheel surrounds a brake of the vehicle. A cover is disposed over the brake and mounted around a perimeter of a rim of the free-wheeling hub wheel such that the rim and cover define a sealed container completely encapsulating the brake to capture emissions from the brake.

Classes IPC  ?

  • F16D 65/00 - Éléments constitutifs ou détails des freins
  • F16D 65/853 - Caractéristiques relatives au refroidissement pour freins à disques avec système de refroidissement fermé
  • F16D 66/00 - Dispositions pour la surveillance des conditions de fonctionnement des freins, p. ex. de l'usure ou de la température

12.

GAS ANALYSIS DEVICE, LIGHT EMISSION-INDUCING GAS GENERATION DEVICE, AND ANALYSIS METHOD

      
Numéro d'application JP2025008487
Numéro de publication 2025/220352
Statut Délivré - en vigueur
Date de dépôt 2025-03-07
Date de publication 2025-10-23
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Miyahara, Kohei
  • Nagasawa, Kenya
  • Mizumoto, Kazunori
  • Yamada, Ryusuke
  • Kobayashi, Go
  • Serizawa, Izumi

Abrégé

The present invention suppresses the generation of components other than a light emission-inducing gas. The gas analysis device (100) comprises a light emission-inducing gas generation device (9) that generates a light emission-inducing gas that interacts with a gas to be analyzed to generate reaction light. The light emission-inducing gas generation device (9) has a housing (91) and a light source (92). The housing (91) has an internal space (SP) into which a raw material gas serving as a raw material for the light emission-inducing gas is introduced. The light source (92) is provided in the internal space (SP) and emits light for generating a light emission-inducing gas from the raw material gas. At least one of electric wires of the light source (92) is disposed in the internal space SP of the housing (91). The electrical wires disposed in the internal space (SP) of the housing (91) are electrically connected at a portion facing the internal space of the housing (91).

Classes IPC  ?

13.

INFRARED GAS ANALYZER, AND INFRARED GAS ANALYSIS METHOD

      
Numéro d'application 18863980
Statut En instance
Date de dépôt 2023-04-27
Date de la première publication 2025-10-16
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Sakakura, Seiji
  • Imamura, Yuki

Abrégé

The present invention is one which reduces running costs by eliminating the need for a catalyst, which is a consumable item, and comprises a measurement cell into which sample gas is introduced, an infrared light source that irradiates the measurement cell with infrared light, an infrared light detector that detects infrared light that has passed through the measurement cell, and a gas filter within which a plurality of interference components that interfere with a measurement component in the sample gas are enclosed.

Classes IPC  ?

  • G01N 21/3504 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique en utilisant la lumière infrarouge pour l'analyse des gaz, p. ex. analyse de mélanges de gaz

14.

VERIFICATION METHOD OF THERMAL SIMULATION SYSTEM, VERIFICATION PROGRAM, VERIFICATION DEVICE FOR THERMAL SIMULATION SYSTEM, THERMAL SIMULATION SYSTEM, TEST METHOD, AND TEST SYSTEM

      
Numéro d'application JP2025013513
Numéro de publication 2025/216147
Statut Délivré - en vigueur
Date de dépôt 2025-04-02
Date de publication 2025-10-16
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Iseki, Hirotaka
  • Hirai, Seiji
  • Michikita, Toshiyuki
  • Yoshimura, Ryo

Abrégé

The present invention facilitates parameter setting of a thermal simulation system used for a test of a thermal management system and is a verification method of a thermal simulation system 100 for testing the thermal management system for managing heat generated from one or a plurality of heat source components of a vehicle, the method including an acquisition step for acquiring heat quantity data indicating a heat quantity generated from the heat source component and an arithmetic step for inputting the acquired heat quantity data to a thermal simulation system model M, which is software obtained by modeling the thermal simulation system 100, and calculating a parameter of the thermal simulation system 100 for reproducing the heat quantity, by the thermal simulation system model M.

Classes IPC  ?

15.

SHIFT OPERATION MECHANISM, AUTOMATED DRIVING ROBOT, TEST SPECIMEN TESTING SYSTEM, AND SHIFT OPERATION METHOD FOR AUTOMATED DRIVING ROBOT

      
Numéro d'application JP2025013678
Numéro de publication 2025/211427
Statut Délivré - en vigueur
Date de dépôt 2025-04-03
Date de publication 2025-10-09
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Yamada, Daiki
  • Aoyagi, Kazuma
  • Kugai, Kotaro
  • Hirose, Yoku
  • Oi, Kousuke

Abrégé

This shift operation mechanism 1 for an automated driving robot 100 that drives a test specimen, which is a vehicle or a part thereof, comprises a clamping mechanism 10 that clamps a rotary type dial shift R, and an actuator 20 that rotates the clamping mechanism 10 about the axis of rotation of the dial shift R, wherein the clamping mechanism 10 comprises: a plurality of clamping pieces 11 that clamp the dial shift R from the sides of the dial shift R; and an elastic member 12 that imparts an elastic force in the direction in which the plurality of clamping pieces 11 clamp the dial shift R.

Classes IPC  ?

16.

SHIFT OPERATION MECHANISM, AUTOMATIC DRIVING ROBOT, TEST PRODUCT TESTING SYSTEM, AND SHIFT OPERATION METHOD OF AUTOMATIC DRIVING ROBOT

      
Numéro d'application JP2025013679
Numéro de publication 2025/211428
Statut Délivré - en vigueur
Date de dépôt 2025-04-03
Date de publication 2025-10-09
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Yamada, Daiki
  • Kugai, Kotaro
  • Nara, Kazuteru
  • Hashimoto, Kaho
  • Furukawa, Kazuki
  • Hirose, Yoku
  • Matsubara, Yoshiaki

Abrégé

Provided is a shift operation mechanism 1 of an automatic driving robot for driving a test product, which is a vehicle or a part thereof, said shift operation mechanism 1 comprising: a shift lever operation unit 11 that operates a shift lever of the test product; a shift button operation unit 12 that operates a button B provided to the shift lever L of the test product; and a control unit 13 that controls the shift lever operation unit 11 and the shift button operation unit 12.

Classes IPC  ?

17.

FLUID CONTROL DEVICE, CONTROL METHOD FOR A FLUID CONTROL VALVE, FLUID CONTROL METHOD, AND FLUID CONTROL PROGRAM

      
Numéro d'application 19095159
Statut En instance
Date de dépôt 2025-03-31
Date de la première publication 2025-10-09
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Nakaya, Yugo
  • Nishizato, Hiroshi

Abrégé

The present invention reduces damage to a valve seat surface or a valve body that occurs when a fluid control valve is fully closed, and is provided with a fluid control valve in which a distance between a valve seat surface and a valve body varies in accordance with a value of a drive signal, and a control mechanism that outputs the drive signal so as to control the fluid control valve. In a case in which the fluid control valve is to be fully closed, the control mechanism outputs to the fluid control valve a drive signal that causes the fluid control valve to temporarily stop prior to being placed in the fully closed state, and thereafter outputs to the fluid control valve a drive signal that causes the fluid control valve to be placed in the fully closed state.

Classes IPC  ?

  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques

18.

CHARACTERIZATION AND CHANGE OF POLYHYDROXYALKANOATE (PHA) CRYSTALLOGRAPHIC PHASE

      
Numéro d'application 18623559
Statut En instance
Date de dépôt 2024-04-01
Date de la première publication 2025-10-02
Propriétaire HORIBA Instruments Incorporated (USA)
Inventeur(s) Adar, Fran

Abrégé

A composition and/or processing conditions of a development sample of polyhydroxyalkanoate can be changed based on data gathered from techniques described herein to alter a crystallographic property of the development sample in an attempt to produce non-centrosymmetric β crystallographic structure in the development sample with stable piezoelectric properties. Such would have use in a variety of applications.

Classes IPC  ?

  • C08G 63/06 - Polyesters dérivés soit d'acides hydroxycarboxyliques, soit d'acides polycarboxyliques et de composés polyhydroxylés dérivés des acides hydroxycarboxyliques
  • G01N 21/31 - CouleurPropriétés spectrales, c.-à-d. comparaison de l'effet du matériau sur la lumière pour plusieurs longueurs d'ondes ou plusieurs bandes de longueurs d'ondes différentes en recherchant l'effet relatif du matériau pour les longueurs d'ondes caractéristiques d'éléments ou de molécules spécifiques, p. ex. spectrométrie d'absorption atomique
  • G16C 20/10 - Analyse ou conception des réactions, des synthèses ou des procédés chimiques

19.

CONCENTRATION MEASUREMENT DEVICE, CONCENTRATION MEASUREMENT METHOD, STARTING MATERIAL VAPORIZATION SYSTEM, AND CONCENTRATION MEASUREMENT METHOD FOR STARTING MATERIAL VAPORIZATION SYSTEM

      
Numéro d'application 18868515
Statut En instance
Date de dépôt 2023-01-23
Date de la première publication 2025-10-02
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Imanishi, Michie
  • Shimizu, Toru

Abrégé

A concentration measurement device measures a concentration of starting material gas contained in mixed gas, and includes: a partial pressure sensor configured to detect a partial pressure of the starting material gas contained in the mixed gas, and output a partial pressure signal indicating the partial pressure; a total pressure sensor configured to detect a total pressure that is a pressure of the mixed gas, and output a total pressure signal indicating the total pressure; a delay filter configured to perform processing of delaying a response speed of the total pressure signal, and output a delayed total pressure signal that is a total pressure signal after the processing; and a calculation unit configured to calculate a concentration of the starting material gas contained in the mixed gas based on the partial pressure signal and the delayed total pressure signal.

Classes IPC  ?

  • G01N 7/14 - Analyse des matériaux en mesurant la pression ou le volume d'un gaz ou d'une vapeur en permettant au matériau d'émettre un gaz ou une vapeur, p. ex. la vapeur d'eau, et en mesurant une différence de pression ou de volume
  • C23C 16/448 - Revêtement chimique par décomposition de composés gazeux, ne laissant pas de produits de réaction du matériau de la surface dans le revêtement, c.-à-d. procédés de dépôt chimique en phase vapeur [CVD] caractérisé par le procédé de revêtement caractérisé par le procédé utilisé pour produire des courants de gaz réactifs, p. ex. par évaporation ou par sublimation de matériaux précurseurs
  • G01L 9/00 - Mesure de la pression permanente, ou quasi permanente d’un fluide ou d’un matériau solide fluent par des éléments électriques ou magnétiques sensibles à la pressionTransmission ou indication par des moyens électriques ou magnétiques du déplacement des éléments mécaniques sensibles à la pression, utilisés pour mesurer la pression permanente ou quasi permanente d’un fluide ou d’un matériau solide fluent
  • G01L 11/02 - Mesure de la pression permanente, ou quasi permanente d'un fluide ou d'un matériau solide fluent par des moyens non prévus dans les groupes ou par des moyens optiques
  • G01N 33/00 - Recherche ou analyse des matériaux par des méthodes spécifiques non couvertes par les groupes

20.

MEXACUBE

      
Numéro d'application 1877758
Statut Enregistrée
Date de dépôt 2025-07-30
Date d'enregistrement 2025-07-30
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measurement apparatus and instruments for engine emission, and parts and fittings therefor; measurement apparatus and instruments for emission, and parts and fittings therefor; measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; measurement apparatus and instruments for process gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; on-board measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for emission, and parts and fittings therefor; on-board measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measurement apparatus and instruments for process gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; portable measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for emission, and parts and fittings therefor; portable measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measurement apparatus and instruments for process gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; measurement apparatus and instruments for automobile emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for automobile emission, and parts and fittings therefor; measurement apparatus and instruments for vehicle emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle emission, and parts and fittings therefor; gas measurement apparatus and instruments, and parts and fittings therefor; gas measuring and analyzing apparatus and instruments, and parts and fittings therefor; vehicle engine testing apparatus and instruments, and parts and fittings therefor; automotive engine testing apparatus and instruments, and parts and fittings therefor; engine testing apparatus and instruments, and parts and fittings therefor; computer software for controlling measurement apparatus and instruments for vehicle engine emission; computer software for controlling measurement apparatus and instruments for engine emission; computer software for controlling measurement apparatus and instruments for emission; computer software for controlling measurement apparatus and instruments for exhaust gases; computer software for controlling measurement apparatus and instruments for process gases; computer software for controlling gas measurement apparatus and instruments; computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; computer software for controlling measuring and analyzing apparatus and instruments for engine emission; computer software for controlling measuring and analyzing apparatus and instruments for emission; computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; computer software for controlling measuring and analyzing apparatus and instruments for process gases; computer software for controlling gas measuring and analyzing apparatus and instruments; computer software for controlling engine testing apparatus and instruments; computer software; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair or maintenance of measurement apparatus and instruments for vehicle engine emission; repair or maintenance of measurement apparatus and instruments for engine emission; repair or maintenance of measurement apparatus and instruments for emission; repair or maintenance of measurement apparatus and instruments for exhaust gases; repair or maintenance of measurement apparatus and instruments for process gases; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for emission; repair or maintenance of measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of measuring and analyzing apparatus and instruments for process gases; repair or maintenance of on-board measurement apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measurement apparatus and instruments for engine emission; repair or maintenance of on-board measurement apparatus and instruments for emission; repair or maintenance of on-board measurement apparatus and instruments for exhaust gases; repair or maintenance of on-board measurement apparatus and instruments for process gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for process gases; repair or maintenance of portable measurement apparatus and instruments for vehicle engine emission; repair or maintenance of portable measurement apparatus and instruments for engine emission; repair or maintenance of portable measurement apparatus and instruments for emission; repair or maintenance of portable measurement apparatus and instruments for exhaust gases; repair or maintenance of portable measurement apparatus and instruments for process gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for process gases; repair or maintenance of measurement apparatus and instruments for automobile emission; repair or maintenance of measuring and analyzing apparatus and instruments for automobile emission; repair or maintenance of measurement apparatus and instruments for vehicle emission; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle emission; repair or maintenance of gas measurement apparatus and instruments; repair or maintenance of gas measuring and analyzing apparatus and instruments; repair or maintenance of vehicle engine testing apparatus and instruments; repair or maintenance of automotive engine testing apparatus and instruments; repair or maintenance of engine testing apparatus and instruments; repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of optical machines and apparatus; repair or maintenance of cinematographic machines and apparatus; repair or maintenance of photographic machines and apparatus. Rental of measurement apparatus and instruments for vehicle engine emission; rental of measurement apparatus and instruments for engine emission; rental of measurement apparatus and instruments for emission; rental of measurement apparatus and instruments for exhaust gases; rental of measurement apparatus and instruments for process gases; rental of measuring and analyzing apparatus and instruments for vehicle engine emission; rental of measuring and analyzing apparatus and instruments for engine emission; rental of measuring and analyzing apparatus and instruments for emission; rental of measuring and analyzing apparatus and instruments for exhaust gases; rental of measuring and analyzing apparatus and instruments for process gases; rental of on-board measurement apparatus and instruments for vehicle engine emission; rental of on-board measurement apparatus and instruments for engine emission; rental of on-board measurement apparatus and instruments for emission; rental of on-board measurement apparatus and instruments for exhaust gases; rental of on-board measurement apparatus and instruments for process gases; rental of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; rental of on-board measuring and analyzing apparatus and instruments for engine emission; rental of on-board measuring and analyzing apparatus and instruments for emission; rental of on-board measuring and analyzing apparatus and instruments for exhaust gases; rental of on-board measuring and analyzing apparatus and instruments for process gases; rental of portable measurement apparatus and instruments for vehicle engine emission; rental of portable measurement apparatus and instruments for engine emission; rental of portable measurement apparatus and instruments for emission; rental of portable measurement apparatus and instruments for exhaust gases; rental of portable measurement apparatus and instruments for process gases; rental of portable measuring and analyzing apparatus and instruments for vehicle engine emission; rental of portable measuring and analyzing apparatus and instruments for engine emission; rental of portable measuring and analyzing apparatus and instruments for emission; rental of portable measuring and analyzing apparatus and instruments for exhaust gases; rental of portable measuring and analyzing apparatus and instruments for process gases; rental of measurement apparatus and instruments for automobile emission; rental of measuring and analyzing apparatus and instruments for automobile emission; rental of measurement apparatus and instruments for vehicle emission; rental of measuring and analyzing apparatus and instruments for vehicle emission; rental of gas measurement apparatus and instruments; rental of gas measuring and analyzing apparatus and instruments; rental of vehicle engine testing apparatus and instruments; rental of automotive engine testing apparatus and instruments; rental of engine testing apparatus and instruments; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; calibration of measurement apparatus and instruments for vehicle engine emission; calibration of measurement apparatus and instruments for engine emission; calibration of measurement apparatus and instruments for emission; calibration of measurement apparatus and instruments for exhaust gases; calibration of measurement apparatus and instruments for process gases; calibration of measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of measuring and analyzing apparatus and instruments for engine emission; calibration of measuring and analyzing apparatus and instruments for emission; calibration of measuring and analyzing apparatus and instruments for exhaust gases; calibration of measuring and analyzing apparatus and instruments for process gases; calibration of on-board measurement apparatus and instruments for vehicle engine emission; calibration of on-board measurement apparatus and instruments for engine emission; calibration of on-board measurement apparatus and instruments for emission; calibration of on-board measurement apparatus and instruments for exhaust gases; calibration of on-board measurement apparatus and instruments for process gases; calibration of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of on-board measuring and analyzing apparatus and instruments for engine emission; calibration of on-board measuring and analyzing apparatus and instruments for emission; calibration of on-board measuring and analyzing apparatus and instruments for exhaust gases; calibration of on-board measuring and analyzing apparatus and instruments for process gases; calibration of portable measurement apparatus and instruments for vehicle engine emission; calibration of portable measurement apparatus and instruments for engine emission; calibration of portable measurement apparatus and instruments for emission; calibration of portable measurement apparatus and instruments for exhaust gases; calibration of portable measurement apparatus and instruments for process gases; calibration of portable measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of portable measuring and analyzing apparatus and instruments for engine emission; calibration of portable measuring and analyzing apparatus and instruments for emission; calibration of portable measuring and analyzing apparatus and instruments for exhaust gases; calibration of portable measuring and analyzing apparatus and instruments for process gases; calibration of measurement apparatus and instruments for automobile emission; calibration of measuring and analyzing apparatus and instruments for automobile emission; calibration of measurement apparatus and instruments for vehicle emission; calibration of measuring and analyzing apparatus and instruments for vehicle emission; calibration of gas measurement apparatus and instruments; calibration of gas measuring and analyzing apparatus and instruments; calibration of vehicle engine testing apparatus and instruments; calibration of automotive engine testing apparatus and instruments; calibration of engine testing apparatus and instruments; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of measurement apparatus and instruments for vehicle engine emission; design of measurement apparatus and instruments for engine emission; design of measurement apparatus and instruments for emission; design of measurement apparatus and instruments for exhaust gases; design of measurement apparatus and instruments for process gases; design of measuring and analyzing apparatus and instruments for vehicle engine emission; design of measuring and analyzing apparatus and instruments for engine emission; design of measuring and analyzing apparatus and instruments for emission; design of measuring and analyzing apparatus and instruments for exhaust gases; design of measuring and analyzing apparatus and instruments for process gases; design of on-board measurement apparatus and instruments for vehicle engine emission; design of on-board measurement apparatus and instruments for engine emission; design of on-board measurement apparatus and instruments for emission; design of on-board measurement apparatus and instruments for exhaust gases; design of on-board measurement apparatus and instruments for process gases; design of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; design of on-board measuring and analyzing apparatus and instruments for engine emission; design of on-board measuring and analyzing apparatus and instruments for emission; design of on-board measuring and analyzing apparatus and instruments for exhaust gases; design of on-board measuring and analyzing apparatus and instruments for process gases; design of portable measurement apparatus and instruments for vehicle engine emission; design of portable measurement apparatus and instruments for engine emission; design of portable measurement apparatus and instruments for emission; design of portable measurement apparatus and instruments for exhaust gases; design of portable measurement apparatus and instruments for process gases; design of portable measuring and analyzing apparatus and instruments for vehicle engine emission; design of portable measuring and analyzing apparatus and instruments for engine emission; design of portable measuring and analyzing apparatus and instruments for emission; design of portable measuring and analyzing apparatus and instruments for exhaust gases; design of portable measuring and analyzing apparatus and instruments for process gases; design of measurement apparatus and instruments for automobile emission; design of measuring and analyzing apparatus and instruments for automobile emission; design of measurement apparatus and instruments for vehicle emission; design of measuring and analyzing apparatus and instruments for vehicle emission; design of gas measurement apparatus and instruments; design of gas measuring and analyzing apparatus and instruments; design of vehicle engine testing apparatus and instruments; design of automotive engine testing apparatus and instruments; design of engine testing apparatus and instruments; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling gas measurement apparatus and instruments; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling gas measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling engine testing apparatus and instruments; design, programming and maintenance of computer software; rental of computer software for controlling measurement apparatus and instruments for vehicle engine emission; rental of computer software for controlling measurement apparatus and instruments for engine emission; rental of computer software for controlling measurement apparatus and instruments for emission; rental of computer software for controlling measurement apparatus and instruments for exhaust gases; rental of computer software for controlling measurement apparatus and instruments for process gases; rental of computer software for controlling gas measurement apparatus and instruments; rental of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for process gases; rental of computer software for controlling gas measuring and analyzing apparatus and instruments; rental of computer software for controlling engine testing apparatus and instruments; rental of computer software; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling gas measurement apparatus and instruments; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling gas measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling engine testing apparatus and instruments; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

21.

MATERIAL GAS SUPPLY SYSTEM, MATERIAL GAS SUPPLY METHOD, AND MATERIAL GAS SUPPLY PROGRAM

      
Numéro d'application JP2025009315
Numéro de publication 2025/197717
Statut Délivré - en vigueur
Date de dépôt 2025-03-12
Date de publication 2025-09-25
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Saito, Takashi
  • Ding, Li
  • Ichikawa, Takato
  • Shibuya, Kyoji
  • Yamamoto, Tomomi

Abrégé

The present invention reduces the burden of managing the flow rate of a material gas that is supplied to a processing device that uses a chemical reaction. The present invention comprises: a flow rate controller that controls the flow rate of the material gas that is supplied to the processing device; a gas analysis device that measures the concentration of a component to be measured that is included in a derivation gas emitted from the processing device; and a control device that inputs a flow rate setting value to the flow rate controller on the basis of the concentration measurement value of the component to be measured obtained by the gas analysis device. The control device determines a flow rate setting value to be inputted to the flow rate controller, on the basis of a control parameter determined by using a simulation model based on a chemical reaction occurring in the processing device or the volume of a reaction space in the processing device.

Classes IPC  ?

  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques

22.

FLUID CONTROL DEVICE, CONTROL UNIT FOR FLUID CONTROL DEVICE, FLUID CONTROL METHOD, AND FLUID CONTROL PROGRAM

      
Numéro d'application 19066647
Statut En instance
Date de dépôt 2025-02-28
Date de la première publication 2025-09-18
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Hamada, Chihiro
  • Hayashi, Daisuke

Abrégé

The present invention makes it possible to perform highly accurate flow rate control while also achieving a fast response. Based on a deviation between a flow rate measurement value output by a flow rate sensor and a flow rate estimation value output by a flow rate sensor model, an observer determines a model error estimation value, which is obtained by estimating a model error in the flow rate sensor model relative to the flow rate sensor, and a flow rate error estimation value, which is obtained by estimating a flow rate error caused by a change in a fluid control valve, and inputs the model error estimation value into the flow rate sensor model, and then outputs an estimation value to a feedback controller based on the flow rate error estimation value and the valve flow rate estimation value output by the valve model.

Classes IPC  ?

  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques

23.

SPECIMEN MEASUREMENT CHIP, METHOD FOR MANUFACTURING SPECIMEN MEASUREMENT CHIP, SPECIMEN MEASUREMENT DEVICE, SPECIMEN MEASUREMENT METHOD, AND SPECIMEN MEASUREMENT PROGRAM

      
Numéro d'application JP2025009380
Numéro de publication 2025/192655
Statut Délivré - en vigueur
Date de dépôt 2025-03-12
Date de publication 2025-09-18
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Anzai, Hiroshi
  • Hirata, Katsuki

Abrégé

A specimen measurement chip 2, which is used for measuring a specimen, has a space 22 in which a specimen or a reagent is accommodated so as to prevent erroneous detection of the accommodation state of the specimen or the reagent while obtaining a stable reflected light quantity. The specimen measurement chip 2 includes a detection unit 23 formed on an inner surface 2a forming the space 22 and detecting the accommodation state of the specimen or the reagent. The detection unit 23 includes: a linear groove 231 formed with a reflection surface 231x that reflects light on a bottom surface; and an air lead-out passage 232 communicating with one end 231a of the groove 231.

Classes IPC  ?

  • G01N 35/08 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet en utilisant un courant d'échantillons discrets circulant dans une canalisation, p. ex. analyse à injection dans un écoulement
  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet
  • G01N 37/00 - Détails non couverts par les autres groupes de la présente sous-classe

24.

THERMAL CONDUCTIVITY GAS ANALYZER

      
Numéro d'application JP2025006631
Numéro de publication 2025/182986
Statut Délivré - en vigueur
Date de dépôt 2025-02-26
Date de publication 2025-09-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Shintaku Akira

Abrégé

A thermal conductivity gas analyzer according to the present invention comprises: a plurality of cells respectively housing resistors constituting a Wheatstone bridge circuit; a first flow path section through which a sample gas or a reference gas flows; a second flow path section provided so as to branch off of the first flow path section; and a supply gas switching unit connected to the first flow path section. Each resistor is constituted by a thermal conductivity thin-film sensor or a thermal conductivity semiconductor sensor. The plurality of cells include measurement cells that respectively house resistors located on one pair of opposite sides of the Wheatstone bridge circuit. The second flow path section connects to the measurement cells. The supply gas switching unit alternately supplies the sample gas and the reference gas to the first flow path section.

Classes IPC  ?

  • G01N 27/18 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance d'un corps chauffé électriquement dépendant de variations de température produite par des variations de la conductivité thermique d'un matériau de l'espace environnant à tester
  • G01N 25/18 - Recherche ou analyse des matériaux par l'utilisation de moyens thermiques en recherchant la conductivité thermique

25.

RADIATION TEMPERATURE MEASUREMENT DEVICE, RADIATION TEMPERATURE MEASUREMENT METHOD, AND RADIATION TEMPERATURE MEASUREMENT PROGRAM

      
Numéro d'application JP2025005873
Numéro de publication 2025/182774
Statut Délivré - en vigueur
Date de dépôt 2025-02-20
Date de publication 2025-09-04
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Fujino, Sho
  • Saito, Takashi
  • Tominaga, Koji
  • Hirai, Asuka

Abrégé

A radiation temperature measurement device 100 that detects infrared rays radiated from a measurement subject W to measure the temperature of the measurement subject W, the radiation temperature measurement device 100 comprising: an infrared ray detection unit 2 that detects the respective infrared ray amounts of a plurality of wavelength components and that detects the infrared ray amount of each of a plurality of polarization components in at least one of the plurality of wavelength components; and a temperature computation unit 3 that computes the temperature of the measurement subject W on the basis of at least three kinds of infrared ray amounts detected by the infrared ray detection unit 2.

Classes IPC  ?

  • G01J 5/59 - Pyrométrie des radiations, p. ex. thermométrie infrarouge ou optique en utilisant la polarisationLeurs détails
  • G01J 5/00 - Pyrométrie des radiations, p. ex. thermométrie infrarouge ou optique
  • G01J 5/60 - Pyrométrie des radiations, p. ex. thermométrie infrarouge ou optique en utilisant la détermination de la température de couleur

26.

VAPORIZER AND VAPORIZATION SYSTEM

      
Numéro d'application JP2025003893
Numéro de publication 2025/182512
Statut Délivré - en vigueur
Date de dépôt 2025-02-06
Date de publication 2025-09-04
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s)
  • Hirai, Soichiro
  • Yada, Hidetaka

Abrégé

This vaporizer vaporizes a liquid material by heating a heating flow path through which the liquid material flows, and is characterized by including: a filter that is provided in the heating flow path and collects particles flowing through the heating flow path; a heat exchanger that is provided upstream of the filter in the heating flow path and performs heat exchange with the liquid material; and a pre-filter that is provided upstream of the filter in the heating flow path and collects the particles. The vaporizer is also characterized in that, in a cross-section taken orthogonal to the direction in which the fluid flows, a cross-section of the filter is provided so as to block the heating flow path, and a cross-section of the pre-filter does not block the heating flow path when compared to the cross-section of the filter.

Classes IPC  ?

  • C23C 16/448 - Revêtement chimique par décomposition de composés gazeux, ne laissant pas de produits de réaction du matériau de la surface dans le revêtement, c.-à-d. procédés de dépôt chimique en phase vapeur [CVD] caractérisé par le procédé de revêtement caractérisé par le procédé utilisé pour produire des courants de gaz réactifs, p. ex. par évaporation ou par sublimation de matériaux précurseurs
  • B01J 7/02 - Appareillage pour la production de gaz par voie humide
  • H01L 21/205 - Dépôt de matériaux semi-conducteurs sur un substrat, p. ex. croissance épitaxiale en utilisant la réduction ou la décomposition d'un composé gazeux donnant un condensat solide, c.-à-d. un dépôt chimique

27.

FLUID DEVICE

      
Numéro d'application 19057586
Statut En instance
Date de dépôt 2025-02-19
Date de la première publication 2025-08-21
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Horiguchi, Hiroshi

Abrégé

According to the present invention, it is possible to fix a fluid resistance element to a flow path while reducing positional displacement or vibration of the fluid resistance element in the flow path. A fixing mechanism that fixes a fluid resistance element to an internal flow path includes: an element holder that holds the fluid resistance element; a holder mounting portion that is formed to communicate with the internal flow path in a flow path block and on which the element holder is mounted; and a seal member interposed between the element holder and the holder mounting portion. In a state where the seal member is crushed by the element holder and a surface facing the element holder in the holder mounting portion, the element holder is positioned and mounted on the holder mounting portion.

Classes IPC  ?

  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques
  • G01F 1/34 - Mesure du débit volumétrique ou du débit massique d'un fluide ou d'un matériau solide fluent, dans laquelle le fluide passe à travers un compteur par un écoulement continu en utilisant des effets mécaniques en mesurant la pression ou la différence de pression
  • G01F 15/00 - Détails des appareils des groupes ou accessoires pour ces derniers, dans la mesure où de tels accessoires ou détails ne sont pas adaptés à ces types particuliers d'appareils, p. ex. pour l'indication à distance

28.

UCMN

      
Numéro d'application 1870108
Statut Enregistrée
Date de dépôt 2025-06-09
Date d'enregistrement 2025-06-09
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Apparatus and instruments for measuring unburnt combustible content in ash, and parts and fittings therefor; apparatus and instruments for measuring and analyzing unburnt combustible content in ash, and parts and fittings therefor; gas measuring and analyzing apparatus and instruments, and parts and fittings therefor; mass concentration measuring apparatus and instruments, and parts and fittings therefor; mass concentration measuring and analyzing apparatus and instruments, and parts and fittings therefor; X-ray fluorescence apparatus and instruments for elemental analysis, and parts and fittings therefor; X-ray fluorescence apparatus and instruments for elemental measurement and analysis, and parts and fittings therefor; computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; computer software for controlling gas measuring and analyzing apparatus and instruments; computer software for controlling mass concentration measuring apparatus and instruments; computer software for controlling mass concentration measuring and analyzing apparatus and instruments; computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; computer software for measuring or testing machines and instruments; computer software for laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair and maintenance of apparatus and instruments for measuring unburnt combustible content in ash; repair and maintenance of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; repair and maintenance of gas measuring and analyzing apparatus and instruments; repair and maintenance of mass concentration measuring apparatus and instruments; repair and maintenance of mass concentration measuring and analyzing apparatus and instruments; repair and maintenance of X-ray fluorescence apparatus and instruments for elemental analysis; repair and maintenance of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; repair and maintenance of measuring or testing machines and instruments; repair and maintenance of laboratory apparatus and instruments; repair and maintenance of electronic machines and apparatus; repair and maintenance of optical machines and apparatus; repair and maintenance of cinematographic machines and apparatus; repair and maintenance of photographic machines and apparatus. Rental of apparatus and instruments for measuring unburnt combustible content in ash; rental of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; rental of gas measuring and analyzing apparatus and instruments; rental of mass concentration measuring apparatus and instruments; rental of mass concentration measuring and analyzing apparatus and instruments; rental of X-ray fluorescence apparatus and instruments for elemental analysis; rental of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of apparatus and instruments for measuring unburnt combustible content in ash; calibration of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; calibration of gas measuring and analyzing apparatus and instruments; calibration of mass concentration measuring apparatus and instruments; calibration of mass concentration measuring and analyzing apparatus and instruments; calibration of X-ray fluorescence apparatus and instruments for elemental analysis; calibration of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of apparatus and instruments for measuring unburnt combustible content in ash; design of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; design of gas measuring and analyzing apparatus and instruments; design of mass concentration measuring apparatus and instruments; design of mass concentration measuring and analyzing apparatus and instruments; design of X-ray fluorescence apparatus and instruments for elemental analysis; design of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; design, programming and maintenance of computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; design, programming and maintenance of computer software for controlling gas measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling mass concentration measuring apparatus and instruments; design, programming and maintenance of computer software for controlling mass concentration measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; design, programming and maintenance of computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; design, programming and maintenance of computer software; rental of computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; rental of computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; rental of computer software for controlling gas measuring and analyzing apparatus and instruments; rental of computer software for controlling mass concentration measuring apparatus and instruments; rental of computer software for controlling mass concentration measuring and analyzing apparatus and instruments; rental of computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; rental of computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; rental of computer software; providing on-line non-downloadable computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; providing on-line non-downloadable computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; providing on-line non-downloadable computer software for controlling gas measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling mass concentration measuring apparatus and instruments; providing on-line non-downloadable computer software for controlling mass concentration measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; providing on-line non-downloadable computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

29.

PARTICLE ANALYSIS DEVICE

      
Numéro d'application 18702425
Statut En instance
Date de dépôt 2023-01-17
Date de la première publication 2025-08-14
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abrégé

In order to enable a device to be installed in a limited space on the periphery of a line and to keep a path for transportation of a sample from the line short, the present invention is configured so as to comprise a flow cell through which a sample including particles flows, a light source for radiating light to the particles in the flow cell, a photodetector for detecting secondary light from the particles, and a computation circuit for detecting an autocorrelation function from a light intensity signal outputted from the photodetector and analyzing the autocorrelation function or the particles included in the sample, an optical system unit including the flow cell and the light source, and a control unit including the photodetector and the computation circuit being separate from each other and connected via a light guiding member for guiding the secondary light to the photodetector.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques

30.

LIQUID MATERIAL VAPORIZING DEVICE, METHOD FOR CONTROLLING LIQUID MATERIAL VAPORIZING DEVICE, AND PROGRAM FOR CONTROLLING LIQUID MATERIAL VAPORIZING DEVICE

      
Numéro d'application JP2024045290
Numéro de publication 2025/169623
Statut Délivré - en vigueur
Date de dépôt 2024-12-20
Date de publication 2025-08-14
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s)
  • Kawakado, Hajime
  • Oba, Hidenori
  • Taguchi, Akihiro

Abrégé

This liquid material vaporizing device comprises: a tank 1 that stores a liquid material and in which the liquid material is vaporized; a supply path R1 that supplies the liquid material to the tank 1; a liquid level detection unit 2 that detects at least a first liquid level that is one of the liquid levels in the tank 1; a valve V1 that is provided in the supply path R1 and opens and closes the supply path R1; and a valve control unit 41 that opens the valve V1 to supply the liquid material to the tank 1 when the liquid level in the tank 1 is less than the first liquid level. The valve control unit 41 provides a closing duration at least once in which the closed state of the valve V1 continues until the liquid level in the tank 1 reaches the first liquid level from a level less than the first liquid level.

Classes IPC  ?

  • B01J 7/00 - Appareillage pour la production de gaz
  • B01J 4/00 - Dispositifs d'alimentationDispositifs de commande d'alimentation ou d'évacuation
  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques

31.

APPARATUS AND METHOD FOR TESTING AUTOMATED VEHICLES

      
Numéro d'application 19189329
Statut En instance
Date de dépôt 2025-04-25
Date de la première publication 2025-08-07
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s) Breton, Leo Alphonse Gerard

Abrégé

A vehicle test system includes a free-wheeling automobile wheel including a rim defining a rim passage, and a bearing that extends through the rim passage such that the bearing is outside the rim to support the free-wheeling automobile wheel and retracts through the rim passage such that the bearing is inside the rim.

Classes IPC  ?

  • G01M 17/013 - Roues
  • G07C 5/08 - Enregistrement ou indication de données de marche autres que le temps de circulation, de fonctionnement, d'arrêt ou d'attente, avec ou sans enregistrement des temps de circulation, de fonctionnement, d'arrêt ou d'attente

32.

ENERGY ANALYSIS DEVICE, ENERGY MANAGEMENT SYSTEM, ENERGY ANALYSIS PROGRAM, AND ENERGY ANALYSIS METHOD

      
Numéro d'application JP2025002590
Numéro de publication 2025/164611
Statut Délivré - en vigueur
Date de dépôt 2025-01-28
Date de publication 2025-08-07
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Higa, Kazushi
  • Iwao, Keijiro
  • Shiomi, Kenji
  • Kakino, Toru

Abrégé

The present invention enables efficient efforts for energy saving by analyzing electric power consumption data of a plurality of electric power supply facilities, the invention comprising: an electric power consumption data acquisition unit that acquires electric power consumption data of each of a plurality of electric power supply facilities for supplying electric power to a plurality of energy demand facilities; an electric power supply pattern model generation unit that performs multivariate analysis on the electric power consumption data, and generates an electric power supply pattern profile in which the plurality of electric power supply facilities are respectively classified into a plurality of electric power fluctuation patterns and/or an electric power supply pattern operation state sequence indicating operation states over time of the electric power supply pattern profile; and an electric power load amount calculation unit that, on the basis of the electric power supply pattern profile and/or the electric power supply pattern operation state sequence, calculates the electric power load amount of a plurality of energy demand facilities or the plurality of electric power supply facilities corresponding to the plurality of electric power fluctuation patterns, or the electric power load amount over time corresponding to the plurality of electric power fluctuation patterns.

Classes IPC  ?

  • H02J 13/00 - Circuits pour pourvoir à l'indication à distance des conditions d'un réseau, p. ex. un enregistrement instantané des conditions d'ouverture ou de fermeture de chaque sectionneur du réseauCircuits pour pourvoir à la commande à distance des moyens de commutation dans un réseau de distribution d'énergie, p. ex. mise en ou hors circuit de consommateurs de courant par l'utilisation de signaux d'impulsion codés transmis par le réseau
  • G06Q 50/06 - Fourniture d’énergie ou d’eau

33.

GAS-LIQUID MIXER AND LIQUID MATERIAL VAPORIZER

      
Numéro d'application 19041070
Statut En instance
Date de dépôt 2025-01-30
Date de la première publication 2025-08-07
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Hirai, Soichiro
  • Nishiwaki, Keisuke

Abrégé

To reduce pressure loss in a gas-liquid mixer, provided is a main body block for mixing together a liquid material and a carrier gas, and a control valve disposed in the main body block that adjusts a flow rate of the liquid material. An annular liquid material supply groove having a supply port for the liquid material formed in an inner surface thereof, and an annular gas-liquid mixing groove having a supply port for the carrier gas and a discharge port for the gas-liquid mixture formed in an inner surface thereof are formed in a valve seat portion of the main body block which the control valve is either in contact with or is separated from. One of either the liquid material supply groove or the gas-liquid mixing groove is formed on an inner side of the other of the liquid material supply groove or the gas-liquid mixing groove.

Classes IPC  ?

  • B01F 35/83 - Formation d'un rapport prédéterminé des substances à mélanger en commandant le rapport entre plusieurs débits, p. ex. en utilisant des dispositifs de détection ou de commande du débit
  • B01F 23/213 - Mélange de gaz avec des liquides par l’ajout de liquides dans les milieux gazeux par pulvérisation ou atomisation des liquides
  • B01F 35/90 - Systèmes de chauffage ou de refroidissement

34.

PLASMA GENERATOR AND COOLING JACKET

      
Numéro d'application 19041307
Statut En instance
Date de dépôt 2025-01-30
Date de la première publication 2025-08-07
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Watanabe, Yoshio

Abrégé

A plasma generator includes: a microwave-generating source that generates a microwave; a cylindrical plasma generation tube through which a gas to be plasmatized by the microwave flows; a waveguide that transmits the microwave to the plasma generation tube; a matching device provided to the waveguide between the microwave-generating source and the plasma generation tube; a cooling jacket that is provided on an outer peripheral surface of the plasma generation tube for cooling; and a cylindrical casing that houses the plasma generation tube and the cooling jacket. The cooling jacket includes: three slits that extend along a traveling direction of the gas flowing through the plasma generation tube, or along a direction inclined with respect to the traveling direction, and through which the microwave passes toward the plasma generation tube; and a cooling channel that is provided between the slits adjacent to each other, and through which a cooling fluid flows.

Classes IPC  ?

  • H01J 37/32 - Tubes à décharge en atmosphère gazeuse
  • H01J 37/244 - DétecteursComposants ou circuits associés

35.

MULTI-TRACK RAMAN ANALYZER

      
Numéro d'application US2025013122
Numéro de publication 2025/160520
Statut Délivré - en vigueur
Date de dépôt 2025-01-27
Date de publication 2025-07-31
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s)
  • Vezard, Nicolas
  • Tuladhar, Aashish
  • George, Chris

Abrégé

A spectroscopy system simultaneously obtains Raman measurements from multiple samples or multiple areas of a liquid or solid sample. At least two Raman probes simultaneously acquire spectra from the sample(s) using an imaging spectrometer having a single shared two-dimensional scientific CMOS sensor. Each probe is coupled to a laser, which may be integrated into the probe, and the spectrometer and includes a lens focusing laser light within or on the sample and collecting light from the sample for the spectrometer. The spectrometer images light from multiple probes simultaneously on the scientific CMOS sensor, spaced from one another to reduce crosstalk. A sample positioning device and a probe positioning mechanism may provide relative movement between samples or sample areas and the probes to acquire data from a different subset of samples or sample areas, and may also adjust probe distance from the sample(s) for desired laser focus spot size and location.

Classes IPC  ?

36.

MEXACUBE

      
Numéro de série 79433442
Statut En instance
Date de dépôt 2025-07-30
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measurement apparatus and instruments for engine emission, and parts and fittings therefor; measurement apparatus and instruments for emission, and parts and fittings therefor; measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; measurement apparatus and instruments for process gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; on-board measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for emission, and parts and fittings therefor; on-board measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measurement apparatus and instruments for process gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; portable measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for emission, and parts and fittings therefor; portable measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measurement apparatus and instruments for process gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; measurement apparatus and instruments for automobile emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for automobile emission, and parts and fittings therefor; measurement apparatus and instruments for vehicle emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle emission, and parts and fittings therefor; gas measurement apparatus and instruments, and parts and fittings therefor; gas measuring and analyzing apparatus and instruments, and parts and fittings therefor; vehicle engine testing apparatus and instruments, and parts and fittings therefor; automotive engine testing apparatus and instruments, and parts and fittings therefor; engine testing apparatus and instruments, and parts and fittings therefor; computer software for controlling measurement apparatus and instruments for vehicle engine emission; computer software for controlling measurement apparatus and instruments for engine emission; computer software for controlling measurement apparatus and instruments for emission; computer software for controlling measurement apparatus and instruments for exhaust gases; computer software for controlling measurement apparatus and instruments for process gases; computer software for controlling gas measurement apparatus and instruments; computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; computer software for controlling measuring and analyzing apparatus and instruments for engine emission; computer software for controlling measuring and analyzing apparatus and instruments for emission; computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; computer software for controlling measuring and analyzing apparatus and instruments for process gases; computer software for controlling gas measuring and analyzing apparatus and instruments; computer software for controlling engine testing apparatus and instruments; computer software; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair or maintenance of measurement apparatus and instruments for vehicle engine emission; repair or maintenance of measurement apparatus and instruments for engine emission; repair or maintenance of measurement apparatus and instruments for emission; repair or maintenance of measurement apparatus and instruments for exhaust gases; repair or maintenance of measurement apparatus and instruments for process gases; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for emission; repair or maintenance of measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of measuring and analyzing apparatus and instruments for process gases; repair or maintenance of on-board measurement apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measurement apparatus and instruments for engine emission; repair or maintenance of on-board measurement apparatus and instruments for emission; repair or maintenance of on-board measurement apparatus and instruments for exhaust gases; repair or maintenance of on-board measurement apparatus and instruments for process gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for process gases; repair or maintenance of portable measurement apparatus and instruments for vehicle engine emission; repair or maintenance of portable measurement apparatus and instruments for engine emission; repair or maintenance of portable measurement apparatus and instruments for emission; repair or maintenance of portable measurement apparatus and instruments for exhaust gases; repair or maintenance of portable measurement apparatus and instruments for process gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for process gases; repair or maintenance of measurement apparatus and instruments for automobile emission; repair or maintenance of measuring and analyzing apparatus and instruments for automobile emission; repair or maintenance of measurement apparatus and instruments for vehicle emission; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle emission; repair or maintenance of gas measurement apparatus and instruments; repair or maintenance of gas measuring and analyzing apparatus and instruments; repair or maintenance of vehicle engine testing apparatus and instruments; repair or maintenance of automotive engine testing apparatus and instruments; repair or maintenance of engine testing apparatus and instruments; repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of optical machines and apparatus; repair or maintenance of cinematographic machines and apparatus; repair or maintenance of photographic machines and apparatus. Rental of measurement apparatus and instruments for vehicle engine emission; rental of measurement apparatus and instruments for engine emission; rental of measurement apparatus and instruments for emission; rental of measurement apparatus and instruments for exhaust gases; rental of measurement apparatus and instruments for process gases; rental of measuring and analyzing apparatus and instruments for vehicle engine emission; rental of measuring and analyzing apparatus and instruments for engine emission; rental of measuring and analyzing apparatus and instruments for emission; rental of measuring and analyzing apparatus and instruments for exhaust gases; rental of measuring and analyzing apparatus and instruments for process gases; rental of on-board measurement apparatus and instruments for vehicle engine emission; rental of on-board measurement apparatus and instruments for engine emission; rental of on-board measurement apparatus and instruments for emission; rental of on-board measurement apparatus and instruments for exhaust gases; rental of on-board measurement apparatus and instruments for process gases; rental of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; rental of on-board measuring and analyzing apparatus and instruments for engine emission; rental of on-board measuring and analyzing apparatus and instruments for emission; rental of on-board measuring and analyzing apparatus and instruments for exhaust gases; rental of on-board measuring and analyzing apparatus and instruments for process gases; rental of portable measurement apparatus and instruments for vehicle engine emission; rental of portable measurement apparatus and instruments for engine emission; rental of portable measurement apparatus and instruments for emission; rental of portable measurement apparatus and instruments for exhaust gases; rental of portable measurement apparatus and instruments for process gases; rental of portable measuring and analyzing apparatus and instruments for vehicle engine emission; rental of portable measuring and analyzing apparatus and instruments for engine emission; rental of portable measuring and analyzing apparatus and instruments for emission; rental of portable measuring and analyzing apparatus and instruments for exhaust gases; rental of portable measuring and analyzing apparatus and instruments for process gases; rental of measurement apparatus and instruments for automobile emission; rental of measuring and analyzing apparatus and instruments for automobile emission; rental of measurement apparatus and instruments for vehicle emission; rental of measuring and analyzing apparatus and instruments for vehicle emission; rental of gas measurement apparatus and instruments; rental of gas measuring and analyzing apparatus and instruments; rental of vehicle engine testing apparatus and instruments; rental of automotive engine testing apparatus and instruments; rental of engine testing apparatus and instruments; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; calibration of measurement apparatus and instruments for vehicle engine emission; calibration of measurement apparatus and instruments for engine emission; calibration of measurement apparatus and instruments for emission; calibration of measurement apparatus and instruments for exhaust gases; calibration of measurement apparatus and instruments for process gases; calibration of measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of measuring and analyzing apparatus and instruments for engine emission; calibration of measuring and analyzing apparatus and instruments for emission; calibration of measuring and analyzing apparatus and instruments for exhaust gases; calibration of measuring and analyzing apparatus and instruments for process gases; calibration of on-board measurement apparatus and instruments for vehicle engine emission; calibration of on-board measurement apparatus and instruments for engine emission; calibration of on-board measurement apparatus and instruments for emission; calibration of on-board measurement apparatus and instruments for exhaust gases; calibration of on-board measurement apparatus and instruments for process gases; calibration of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of on-board measuring and analyzing apparatus and instruments for engine emission; calibration of on-board measuring and analyzing apparatus and instruments for emission; calibration of on-board measuring and analyzing apparatus and instruments for exhaust gases; calibration of on-board measuring and analyzing apparatus and instruments for process gases; calibration of portable measurement apparatus and instruments for vehicle engine emission; calibration of portable measurement apparatus and instruments for engine emission; calibration of portable measurement apparatus and instruments for emission; calibration of portable measurement apparatus and instruments for exhaust gases; calibration of portable measurement apparatus and instruments for process gases; calibration of portable measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of portable measuring and analyzing apparatus and instruments for engine emission; calibration of portable measuring and analyzing apparatus and instruments for emission; calibration of portable measuring and analyzing apparatus and instruments for exhaust gases; calibration of portable measuring and analyzing apparatus and instruments for process gases; calibration of measurement apparatus and instruments for automobile emission; calibration of measuring and analyzing apparatus and instruments for automobile emission; calibration of measurement apparatus and instruments for vehicle emission; calibration of measuring and analyzing apparatus and instruments for vehicle emission; calibration of gas measurement apparatus and instruments; calibration of gas measuring and analyzing apparatus and instruments; calibration of vehicle engine testing apparatus and instruments; calibration of automotive engine testing apparatus and instruments; calibration of engine testing apparatus and instruments; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of measurement apparatus and instruments for vehicle engine emission; design of measurement apparatus and instruments for engine emission; design of measurement apparatus and instruments for emission; design of measurement apparatus and instruments for exhaust gases; design of measurement apparatus and instruments for process gases; design of measuring and analyzing apparatus and instruments for vehicle engine emission; design of measuring and analyzing apparatus and instruments for engine emission; design of measuring and analyzing apparatus and instruments for emission; design of measuring and analyzing apparatus and instruments for exhaust gases; design of measuring and analyzing apparatus and instruments for process gases; design of on-board measurement apparatus and instruments for vehicle engine emission; design of on-board measurement apparatus and instruments for engine emission; design of on-board measurement apparatus and instruments for emission; design of on-board measurement apparatus and instruments for exhaust gases; design of on-board measurement apparatus and instruments for process gases; design of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; design of on-board measuring and analyzing apparatus and instruments for engine emission; design of on-board measuring and analyzing apparatus and instruments for emission; design of on-board measuring and analyzing apparatus and instruments for exhaust gases; design of on-board measuring and analyzing apparatus and instruments for process gases; design of portable measurement apparatus and instruments for vehicle engine emission; design of portable measurement apparatus and instruments for engine emission; design of portable measurement apparatus and instruments for emission; design of portable measurement apparatus and instruments for exhaust gases; design of portable measurement apparatus and instruments for process gases; design of portable measuring and analyzing apparatus and instruments for vehicle engine emission; design of portable measuring and analyzing apparatus and instruments for engine emission; design of portable measuring and analyzing apparatus and instruments for emission; design of portable measuring and analyzing apparatus and instruments for exhaust gases; design of portable measuring and analyzing apparatus and instruments for process gases; design of measurement apparatus and instruments for automobile emission; design of measuring and analyzing apparatus and instruments for automobile emission; design of measurement apparatus and instruments for vehicle emission; design of measuring and analyzing apparatus and instruments for vehicle emission; design of gas measurement apparatus and instruments; design of gas measuring and analyzing apparatus and instruments; design of vehicle engine testing apparatus and instruments; design of automotive engine testing apparatus and instruments; design of engine testing apparatus and instruments; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling gas measurement apparatus and instruments; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling gas measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling engine testing apparatus and instruments; design, programming and maintenance of computer software; rental of computer software for controlling measurement apparatus and instruments for vehicle engine emission; rental of computer software for controlling measurement apparatus and instruments for engine emission; rental of computer software for controlling measurement apparatus and instruments for emission; rental of computer software for controlling measurement apparatus and instruments for exhaust gases; rental of computer software for controlling measurement apparatus and instruments for process gases; rental of computer software for controlling gas measurement apparatus and instruments; rental of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for process gases; rental of computer software for controlling gas measuring and analyzing apparatus and instruments; rental of computer software for controlling engine testing apparatus and instruments; rental of computer software; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling gas measurement apparatus and instruments; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling gas measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling engine testing apparatus and instruments; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

37.

Flow ratio controller system operating in alternative control modes

      
Numéro d'application 18416713
Numéro de brevet 12399516
Statut Délivré - en vigueur
Date de dépôt 2024-01-18
Date de la première publication 2025-07-24
Date d'octroi 2025-08-26
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Lowery, Patrick
  • Gundlach, Maximilian Martin
  • Yasuda, Tadahiro
  • Price, Andrew

Abrégé

A flow ratio controller system includes an inlet receiving a total inlet fluid flow from one or more inlet channels, distribution channels fluidically connected to the inlet and arranged in parallel in a branching flow path downstream of the inlet, and a controller. The distribution channels includes a hybrid distribution channel. The controller selectively operates in alternative control modes including a flow verification control mode and a flow ratio control mode. In the flow verification control mode, the controller calculates a calibrated value for a reference volume using measurements from a mass flow meter in the hybrid distribution channel, then calculates a target channel calibration value for the mass flow meter in the target distribution channel. In the flow ratio control mode, the controller controls each of the distribution channels, including the hybrid channel, according to a respective flow ratio setpoint for each distribution channel.

Classes IPC  ?

  • G05D 11/13 - Commande du rapport des débits de plusieurs matériaux fluides ou fluents caractérisée par l'usage de moyens électriques
  • G01F 25/10 - Test ou étalonnage des appareils pour la mesure du volume, du débit volumétrique ou du niveau des liquides, ou des appareils pour compter par volume des débitmètres

38.

RADIATION DETECTION DEVICE AND RADIATION DETECTOR

      
Numéro d'application 18851523
Statut En instance
Date de dépôt 2023-04-25
Date de la première publication 2025-07-10
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga, Daisuke
  • Minowa, Hiroki

Abrégé

A radiation detection device including an illumination unit illuminating a sample, an irradiation unit irradiating the sample with X-rays and a radiation detection element detecting X-rays generated from the sample is provided with a magnetic field production unit that produces a magnetic field in part of a space from the sample to the radiation detection element and a block that holds the magnetic field production unit. The block is located at a position where light from the illumination unit to the radiation detection element is shielded.

Classes IPC  ?

  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
  • G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs

39.

RADIATION DETECTION ELEMENT, RADIATION DETECTOR, RADIATION DETECTION DEVICE, AND METHOD FOR MANUFACTURING RADIATION DETECTION ELEMENT

      
Numéro d'application 18681896
Statut En instance
Date de dépôt 2022-08-18
Date de la première publication 2025-07-10
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Ishikura, Koji

Abrégé

A radiation detection element includes: a semiconductor part including an incidence surface to which radiations to be detected are incident; a first electrode provided on the incidence surface; and a second electrode that is provided on the incidence surface and is disposed at a position surrounding the periphery of the first electrode. The radiation detection element is a silicon drift-type radiation detection element, and is provided with an insulating protective film that covers the second electrode.

Classes IPC  ?

  • G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs
  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
  • H10F 39/00 - Dispositifs intégrés, ou ensembles de plusieurs dispositifs, comprenant au moins un élément couvert par le groupe , p. ex. détecteurs de rayonnement comportant une matrice de photodiodes
  • H10F 39/18 - Capteurs d’images à semi-conducteurs d’oxyde de métal complémentaire [CMOS]Capteurs d’images à matrice de photodiodes

40.

CONVEYANCE DEVICE, ANALYSIS SYSTEM, PROGRAM FOR CONVEYANCE DEVICE, AND CONVEYANCE METHOD

      
Numéro d'application 18853181
Statut En instance
Date de dépôt 2023-03-31
Date de la première publication 2025-07-10
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Tatewaki, Yasuhiro
  • Mori, Tetsuya

Abrégé

To provide a conveyance device that is more user-friendly than conventional devices, and further enhance workability, a conveyance device that conveys a container accommodating a sample to an analysis device includes: a pallet in which a plurality of installation portions is provided, the container being installed in the installation portions; sensors that are provided for the respective installation portions in one-to-one correspondence, and acquire container information that is information obtained when the container is installed; a conveyance unit that picks up the container installed in the pallet, and conveys the container to the analysis device; and a conveyance control unit that causes the conveyance unit to pick up the container in accordance with a pick-up order determined on the basis of the container information.

Classes IPC  ?

  • G01N 35/04 - Détails du transporteur
  • B65G 1/137 - Dispositifs d'emmagasinage mécaniques avec des aménagements ou des moyens de commande automatique pour choisir les objets qui doivent être enlevés
  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet

41.

ION ANALYSIS DEVICE AND ION ANALYSIS METHOD

      
Numéro d'application JP2024041993
Numéro de publication 2025/142287
Statut Délivré - en vigueur
Date de dépôt 2024-11-27
Date de publication 2025-07-03
Propriétaire
  • HORIBA ADVANCED TECHNO, CO., LTD. (Japon)
  • HORIBA, LTD. (Japon)
Inventeur(s)
  • Miyamura, Kazuhiro
  • Kido, Masanori
  • Okada, Yoichi
  • Yamashita, Tsubasa

Abrégé

Provided is an ion analysis device capable of performing measurements using a sample liquid with a smaller liquid volume than conventional methods. The ion analysis device comprises: a measurement electrode provided with a response unit which responds to ions; a reference electrode provided with a liquid junction section; a measurement flow path in which the response membrane and the liquid junction section are disposed; and a calculation unit that calculates the ion concentration in the sample liquid on the basis of the potential difference between the measurement electrode and the reference electrode, the device further comprising a hydrophilic section connecting the response unit and the liquid junction section inside the measurement flow path.

Classes IPC  ?

  • G01N 27/416 - Systèmes
  • G01N 27/28 - Composants de cellules électrolytiques
  • G01N 27/30 - Électrodes, p. ex. électrodes pour testsDemi-cellules
  • H01M 8/02 - Éléments à combustibleLeur fabrication Détails
  • H01M 8/04 - Dispositions auxiliaires, p. ex. pour la commande de la pression ou pour la circulation des fluides
  • H01M 8/0444 - ConcentrationDensité

42.

GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM FOR GAS ANALYSIS DEVICE

      
Numéro d'application JP2024043601
Numéro de publication 2025/142454
Statut Délivré - en vigueur
Date de dépôt 2024-12-10
Date de publication 2025-07-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Mizutani, Naoto
  • Nakamura, Kentaro

Abrégé

This gas analysis device is for analyzing a target gas containing hydrogen gas that is a main component and at least one impurity gas that is a sub-component. The gas analysis device comprises: a comparison chamber where a first resistance element that has a constant current flowing therethrough and that generates heat is disposed, and where hydrogen gas is introduced into; a measurement chamber where a second resistance element that has a constant current flowing therethrough and that generates heat is disposed, and where the target gas is introduced into; a bridge circuit that is formed by comprising the first resistance element and the second resistance element in a closed circuit and that detects the resistivity of the second resistance element or a related value thereof; a calibration curve data storage unit that is for storing calibration curve data that indicates, using the hydrogen gas as a base gas and a predetermined single component gas other than the hydrogen gas as a span gas, the relationship between the resistivity of the second resistance element detected by the bridge circuit or a related value thereof and the concentration of the span gas; and a concentration calculation unit for estimating the total concentration of the impurity gas in the target gas in terms of a gas component in which the thermal conductivity is greater than or equal to that of oxygen, on the basis of the calibration curve data and the resistivity of the second resistance element detected by the bridge circuit or the related value thereof.

Classes IPC  ?

  • G01N 25/18 - Recherche ou analyse des matériaux par l'utilisation de moyens thermiques en recherchant la conductivité thermique
  • G01N 27/12 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance d'un corps solide dépendant de l'absorption d'un fluideRecherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance d'un corps solide dépendant de la réaction avec un fluide

43.

MEASUREMENT PROBE, MEASUREMENT PROBE UNIT, MEASUREMENT DEVICE, AND MEASUREMENT METHOD

      
Numéro d'application JP2024044569
Numéro de publication 2025/142627
Statut Délivré - en vigueur
Date de dépôt 2024-12-17
Date de publication 2025-07-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Wakabayashi Satoru

Abrégé

Provided is a measurement probe for realizing a measurement device capable of measuring characteristic values of biopolymers, such as protein, in real time at a lower concentration than conventional devices. The measurement probe is used by being connected to a light source and a detector by means of an optical fiber, and comprises: a cylindrical housing having a first port and a second port formed at one end, the first port introducing light from a first optical fiber and outputting light to the first optical fiber, and the second port outputting light to a second optical fiber; a reflective member that is located inside the housing, is provided at an end of the housing on the opposite side to the end at which the first port and the second port are formed, and reflects and refracts light introduced from the first port toward the second port; and a measurement target liquid accommodating portion formed between two window members that are disposed on an output optical path passing between the reflective member and the second port.

Classes IPC  ?

44.

END POINT DETECTION DEVICE, ETCHING CONTROL SYSTEM, END POINT DETECTION METHOD, AND END POINT DETECTION PROGRAM

      
Numéro d'application 18999366
Statut En instance
Date de dépôt 2024-12-23
Date de la première publication 2025-07-03
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Imanishi, Michie
  • Hada, Miyako
  • Sakaguchi, Yuhei
  • Minami, Masakazu
  • Takahashi, Motonobu

Abrégé

An end point detection device that detects an end point in etching processing of a multilayer film, includes a measurement unit that measures a physical quantity that changes with the etching processing, an end point detection unit that detects an end point in a target film for which the end point is to be detected using a predetermined detection algorithm based on a measurement value obtained by the measurement unit, and an algorithm change unit that changes the detection algorithm in the film that is being subjected to the etching processing based on the measurement value obtained by the measurement unit when another film of a same type as the target film was being subjected to the etching processing in a same multilayer film as the target film currently being etching processed.

Classes IPC  ?

  • H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants

45.

VEHICLE TESTING SYSTEM, VEHICLE TESTING METHOD, AND VEHICLE TESTING PROGRAM

      
Numéro d'application JP2024043828
Numéro de publication 2025/142489
Statut Délivré - en vigueur
Date de dépôt 2024-12-11
Date de publication 2025-07-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Shiota Aoi
  • Kawazoe Hiroshi

Abrégé

This vehicle testing system comprises: a first output pattern acquiring unit that acquires, as a first output pattern, travel data when a target vehicle travels in a prescribed environment; a second output pattern acquiring unit that acquires, as a second output pattern, travel data when a traveling vehicle travels along a prescribed travel route; a data acquiring unit that acquires, from the first output pattern, a plurality of items of similar data and a plurality of items of instantaneous energy consumption data; and a calculating unit that adds up a plurality of instantaneous energy consumptions to calculate a total energy consumption when the target vehicle is assumed to travel along the prescribed travel route.

Classes IPC  ?

46.

FLUORESCENCE MEASUREMENT PROBE, FLUORESCENCE MEASUREMENT PROBE UNIT, AND FLUORESCENCE MEASURING DEVICE

      
Numéro d'application JP2024044582
Numéro de publication 2025/142635
Statut Délivré - en vigueur
Date de dépôt 2024-12-17
Date de publication 2025-07-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Wakabayashi, Satoru

Abrégé

Provided is a fluorescence measuring device capable of measuring biopolymers such as proteins in real time at lower concentrations than in conventional devices. This fluorescence measurement probe is used by being connected by an optical fiber to a light source for irradiating a liquid being measured with excitation light and a detector for detecting fluorescence derived from the liquid being measured that is excited by the excitation light from the light source, the fluorescence measurement probe being provided with: a port for introducing the excitation light from the optical fiber and for guiding out fluorescence and scattered light from the liquid being measured to the optical fiber; a condensing optical system for collimating and/or condensing the excitation light, the fluorescence, and the scattered light; a polarizing plate transparent to the excitation light, the fluorescence, and the scattered light; and a housing for internally accommodating the condensing optical system and the polarizing plate and having an opening portion for injecting the excitation light into the liquid being measured and taking in the fluorescence and the scattered light from the liquid being measured.

Classes IPC  ?

47.

HYDROGEN ELECTROCHEMICAL SYSTEM, METHOD FOR DETERMINING STATE OF HYDROGEN CELL STACK, AND PROGRAM

      
Numéro d'application JP2024045705
Numéro de publication 2025/142931
Statut Délivré - en vigueur
Date de dépôt 2024-12-24
Date de publication 2025-07-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga Shimpachi
  • Higa Kazushi
  • Yamashita Tsubasa

Abrégé

In the present invention, a hydrogen electrochemical system 100 comprises an acquisition unit 541, a storage unit 53, and a determination unit 544. The acquisition unit 541 acquires at least distribution information Ds2, De2, and Dt2 indicating the distribution of a physical quantity Q in a hydrogen cell stack 1. In the hydrogen cell stack 1, water is generated by an electrochemical reaction in which hydrogen is used, or vice versa. The storage unit 53 stores correlation data Dc. The correlation data Dc indicates a correlation between the state of the hydrogen cell stack 1 and a feature amount φ that is converted from at least the information Ds2 and De2 regarding the distribution in the hydrogen cell stack 1 in a state including a normal state and one or more abnormal states. On the basis of the correlation information Dc, the determination unit 544 determines the state of the hydrogen cell stack 1 from at least the distribution information Dt2 of the hydrogen cell stack 1 in operation.

Classes IPC  ?

  • H01M 8/04 - Dispositions auxiliaires, p. ex. pour la commande de la pression ou pour la circulation des fluides
  • C25B 1/04 - Hydrogène ou oxygène par électrolyse de l'eau
  • C25B 9/00 - Cellules ou assemblages de cellulesÉléments de structure des cellulesAssemblages d'éléments de structure, p. ex. assemblages d'électrode-diaphragmeCaractéristiques des cellules relatives aux procédés
  • C25B 15/025 - Paramètres de l’électrolyte
  • C25B 15/027 - Température
  • H01M 8/10 - Éléments à combustible avec électrolytes solides
  • H01M 8/0432 - TempératureTempérature ambiante
  • H01M 8/04492 - HumiditéHumidité ambianteTeneur en eau
  • H01M 8/04664 - Défaillance ou fonction anormale
  • H01M 8/04992 - Procédés de commande des éléments à combustible ou des systèmes d’éléments à combustible caractérisés par la mise en œuvre d’algorithmes mathématiques ou de calcul, p. ex. les boucles de commande de rétroaction, la logique floue, les réseaux neuronaux ou l’intelligence artificielle

48.

CLEANING DEVICE AND SUBSTRATE PROCESSING SYSTEM

      
Numéro d'application JP2024044607
Numéro de publication 2025/142639
Statut Délivré - en vigueur
Date de dépôt 2024-12-17
Date de publication 2025-07-03
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s) Watanabe Yoshio

Abrégé

This cleaning device 100 for separating an inflow gas Go and particles that are contained in the gas Go includes a housing 1, a plate-shaped baffle 2, and a plurality of plasma units 5. The housing 1 has a cylindrical shape extending in the axial direction Da, and has an inflow port 121 and an outflow port 131 for the gas Go. The baffle 2 is disposed within the housing 1. The plasma units 5 generate plasma within the housing 1. The inside of the housing 1 has a plurality of internal spaces 14, and is configured so that the gas Go flowing thereinto from the inflow port 121 can flow out from the outflow port 131. Some internal spaces 14 adjacent to each other are connected so that the gas Go can flow therethrough. At least some adjacent internal spaces 14 are adjacent to each other by the intermediary of the baffle 2. The plasma units 5 are disposed with respect to at least two internal spaces 14.

Classes IPC  ?

  • C23C 16/44 - Revêtement chimique par décomposition de composés gazeux, ne laissant pas de produits de réaction du matériau de la surface dans le revêtement, c.-à-d. procédés de dépôt chimique en phase vapeur [CVD] caractérisé par le procédé de revêtement
  • C23C 14/00 - Revêtement par évaporation sous vide, pulvérisation cathodique ou implantation d'ions du matériau composant le revêtement
  • H01L 21/31 - Traitement des corps semi-conducteurs en utilisant des procédés ou des appareils non couverts par les groupes pour former des couches isolantes en surface, p. ex. pour masquer ou en utilisant des techniques photolithographiquesPost-traitement de ces couchesEmploi de matériaux spécifiés pour ces couches
  • H01L 21/205 - Dépôt de matériaux semi-conducteurs sur un substrat, p. ex. croissance épitaxiale en utilisant la réduction ou la décomposition d'un composé gazeux donnant un condensat solide, c.-à-d. un dépôt chimique
  • H01L 21/3065 - Gravure par plasmaGravure au moyen d'ions réactifs
  • H05H 1/46 - Production du plasma utilisant des champs électromagnétiques appliqués, p. ex. de l'énergie à haute fréquence ou sous forme de micro-ondes

49.

FLUID CONTROL VALVE, FLUID CONTROL DEVICE, AND FLUID CONTROL VALVE MANUFACTURING METHOD

      
Numéro d'application 18852129
Statut En instance
Date de dépôt 2023-03-27
Date de la première publication 2025-06-26
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Shakudo, Kazuya

Abrégé

The present invention improves the sealability of a fluid control valve, and includes a valve seat having a flat valve seat surface and a valve plug having a flat sitting surface sitting on the valve seat surface. A first surface that is one of the valve seat surface and the sitting surface has a surface hardness higher than a surface hardness of a second surface that is the other one of the valve seat surface and the sitting surface.

Classes IPC  ?

  • F16K 1/42 - Sièges de soupapes
  • F16K 1/54 - Dispositifs pour modifier la façon dont le débit varie pendant le fonctionnement de la soupape
  • F16K 37/00 - Moyens particuliers portés par ou sur les soupapes ou autres dispositifs d'obturation pour repérer ou enregistrer leur fonctionnement ou pour permettre de donner l'alarme

50.

PRESSURE FLOW RATE SENSOR, FLOW RATE CALCULATION DEVICE, FLOW RATE CALCULATION METHOD, FLOW RATE CALCULATION PROGRAM, AND FLUID CONTROL DEVICE

      
Numéro d'application 18990774
Statut En instance
Date de dépôt 2024-12-20
Date de la première publication 2025-06-26
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Yokoi, Shuntaro

Abrégé

The present invention is configured to calculate a flow rate across a wide range of flow rate, from a low range to a high range, and includes: a fluid resistance element provided to a channel; an upstream pressure sensor that detects an upstream pressure with respect to the fluid resistance element; a downstream pressure sensor that detects a downstream pressure with respect to the fluid resistance element; and a flow rate calculation unit that calculates a flow rate based on the upstream pressure and the downstream pressure, in which the flow rate calculation unit calculates the flow rate based on viscous resistance, inertial resistance, and a degree of effect of rarefaction.

Classes IPC  ?

  • G01F 1/36 - Mesure du débit volumétrique ou du débit massique d'un fluide ou d'un matériau solide fluent, dans laquelle le fluide passe à travers un compteur par un écoulement continu en utilisant des effets mécaniques en mesurant la pression ou la différence de pression la pression ou la différence de pression étant produite par une contraction de la veine fluide

51.

PARTICLE NUMBER MEASUREMENT SYSTEM, BRAKE INSPECTION SYSTEM, AND PARTICLE NUMBER MEASUREMENT METHOD

      
Numéro d'application JP2024036850
Numéro de publication 2025/134506
Statut Délivré - en vigueur
Date de dépôt 2024-10-16
Date de publication 2025-06-26
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Kitahara, Takahiro
  • Fukushima, Suguru

Abrégé

The present invention reduces the cost for introducing a particle number measurement system, and reduces the difference between the uncertainty in measurement of the number of solid particles and the uncertainty in measurement of the total number of particles. The present invention comprises: a first diluter for diluting a sample gas; an evaporator for vaporizing volatile particles contained in the sample gas diluted by the first diluter; a second diluter for diluting the sample gas that has passed through the evaporator; a first particle number measurement device for measuring the number of particles contained in the sample gas diluted by the second diluter as the number of solid particles obtained by removing the volatile particles; and a second particle number measurement device for measuring the number of particles contained in the sample gas that has been diluted by the first diluter and is yet to pass through the evaporator as the total number of particles including the volatile particles.

Classes IPC  ?

  • G01N 15/06 - Recherche de la concentration des suspensions de particules
  • G01M 17/007 - Véhicules à roues ou à chenilles
  • G01N 1/02 - Dispositifs pour prélever des échantillons
  • G01N 15/00 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux

52.

PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE

      
Numéro d'application JP2024042708
Numéro de publication 2025/134758
Statut Délivré - en vigueur
Date de dépôt 2024-12-03
Date de publication 2025-06-26
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Sugasawa, Hirosuke

Abrégé

The present invention is a particle size distribution measurement device, wherein is provided a history data management part 33 that facilitates integrated recognition of various stored operations, states of devices, and instantaneous values of particle size measurement results, and that causes a history data storage part D1 to store an operation history indicating the history of operations performed on the particle size distribution measurement device 100 by an operator, a measurement result history indicating the history of particle size measurement results, or a device state history indicating the history of the state of the particle size distribution measurement device 100, in a format that can be displayed as a time-series graph.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques

53.

PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE SIZE DISTRIBUTION MEASUREMENT PROGRAM

      
Numéro d'application JP2024043046
Numéro de publication 2025/134788
Statut Délivré - en vigueur
Date de dépôt 2024-12-05
Date de publication 2025-06-26
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abrégé

This particle size distribution measurement system comprises: a cell that accommodates a test liquid containing particles; a test liquid supply unit that samples the test liquid from a generation flow passage through which the test liquid flows, and supplies the test liquid to the cell via a flow passage; a particle size distribution measurement unit that measures the particle size distribution of the particles by irradiating the test liquid with light and detecting scattered light produced from the particles; a cleaning liquid supply unit that, after the measurement of the particle size distribution is complete, supplies a cleaning liquid to the cell via a flow passage, said cleaning liquid being a liquid that cleans the cell; and a contamination determination unit that determines contamination of the cell on the basis of transmitted light and/or scattered light from the cell during a condition in which the cleaning liquid is supplied to the cell.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques
  • G01N 1/00 - ÉchantillonnagePréparation des éprouvettes pour la recherche
  • G01N 21/15 - Prévention de la souillure des éléments du système optique ou de l'obstruction du chemin lumineux

54.

INFORMATION PROCESSING METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Numéro d'application JP2024041560
Numéro de publication 2025/134691
Statut Délivré - en vigueur
Date de dépôt 2024-11-25
Date de publication 2025-06-26
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Murata, Shunsuke

Abrégé

Provided are an information processing method, an information processing device, and a computer program for outputting a response corresponding to a request of a user with respect to an analysis device. In the present invention, a query pertaining to an analysis device is acquired, a language generation model is used to acquire a response pertaining to control of the analysis device corresponding to the query, and the response is output.

Classes IPC  ?

  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet
  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

55.

RADIATION DETECTION DEVICE, CONTROL METHOD, AND COMPUTER PROGRAM

      
Numéro d'application JP2024041367
Numéro de publication 2025/126801
Statut Délivré - en vigueur
Date de dépôt 2024-11-22
Date de publication 2025-06-19
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga, Daisuke
  • Bamba, Tomohiro

Abrégé

Provided are a radiation detection device, a control method, and a computer program capable of appropriately adjusting the temperature of a radiation detection element. The radiation detection device comprises: a sample chamber inside which a sample is disposed; a radiation detection element that is disposed inside the sample chamber and is for detecting radiation generated from the sample; an atmosphere adjustment unit that adjusts the atmosphere inside the sample chamber to either a state in which the inside of the sample chamber is depressurized or a state in which a predetermined gas is introduced into the sample chamber; a temperature adjustment unit that adjusts the temperature of the radiation detection element; and a control unit. When the atmosphere adjustment unit adjusts the atmosphere inside the sample chamber to the state in which the predetermined gas is introduced, the control unit causes the temperature adjustment unit to adjust the temperature of the radiation detection element to a higher temperature than when the atmosphere adjustment unit adjusts the atmosphere inside the sample chamber to the state in which the inside of the sample chamber is depressurized.

Classes IPC  ?

  • H01J 37/244 - DétecteursComposants ou circuits associés
  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
  • G01T 7/00 - Détails des instruments de mesure des radiations
  • H01J 37/252 - Tubes analyseurs à spot par faisceaux électroniques ou ioniquesMicro-analyseurs

56.

XTROLOGY

      
Numéro d'application 1859351
Statut Enregistrée
Date de dépôt 2025-04-03
Date d'enregistrement 2025-04-03
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

Semiconductor wafer inspection apparatus; analyzing apparatus for defect of semiconductor wafers; analyzing apparatus for stress of semiconductor wafers; analyzing apparatus for composition of semiconductor wafers; semiconductor wafer measuring apparatus; semiconductor wafer testing apparatus; semiconductor photomask inspection apparatus; analyzing apparatus for defect of semiconductor photomasks; analyzing apparatus for stress of semiconductor photomasks; analyzing apparatus for composition of semiconductor photomasks; semiconductor photomask measuring apparatus; semiconductor photomask testing apparatus; semiconductor reticle inspection apparatus; analyzing apparatus for defect of semiconductor reticles; analyzing apparatus for stress of semiconductor reticles; analyzing apparatus for composition of semiconductor reticles; semiconductor reticle measuring apparatus; semiconductor reticle testing apparatus; semiconductor substrate inspection apparatus; analyzing apparatus for defect of semiconductor substrates; analyzing apparatus for stress of semiconductor substrates; analyzing apparatus for composition of semiconductor substrates; semiconductor substrate measuring apparatus; semiconductor substrate testing apparatus; sensors for mapping semiconductor wafers; Raman spectrographic measurement apparatus, and parts and accessories therefor; Raman spectroscopic analyzing apparatus, and parts and accessories therefor; measuring apparatus for measuring film thickness; measuring apparatus for spectral measurements; automated optical inspection apparatus; X-ray fluorescence measuring apparatus; measuring or testing machines and instruments, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrometers, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrographs, and parts and accessories therefor; optical machines and apparatus; photographic machines and apparatus; cinematographic machines and apparatus; laboratory apparatus and instruments; computer software for inspection, defect analysis, stress analysis, composition analysis, measurement and testing of semiconductor wafers, photomasks, reticles and substrates; computer software; computer programs; scanning probe microscopes; X-ray fluorescence analyzing apparatus; electronic computer and data processing machines and apparatus and their parts; power distribution or control machines and apparatus; rotary converters; phase modifiers; batteries and cells; electric or magnetic meters and testers; electric wires and cables; spectacles [eyeglasses and goggles]; life-saving apparatus and equipment; telecommunication machines and apparatus; fire alarms; gas alarms; water leak alarms; oil leak alarms; anti-theft warning apparatus.

57.

ELECTROSTATIC CHUCK DEVICE AND COOLING PLATE

      
Numéro d'application 18956305
Statut En instance
Date de dépôt 2024-11-22
Date de la première publication 2025-06-12
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Gonzalez, Esteban
  • Nayak, Ajayaketan
  • Yasuda, Tadahiro

Abrégé

The present invention is an electrostatic chuck device which makes a temperature of a target object clamped to a clamping plate uniform and clamps the target object via an electrostatic force, including: a clamping plate having a clamping surface that clamps a target object to its front surface side; and a cooling plate which is provided on a back surface side of the clamping plate and which has an internal flow channel through which a coolant flows, in which the internal flow channel forms a flow channel geometry in which flow channel elements of an identical pattern in a plan view are systematically connected.

Classes IPC  ?

  • H01L 21/683 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants pour le maintien ou la préhension
  • H01J 37/32 - Tubes à décharge en atmosphère gazeuse

58.

BATTERY CHARGING DEVICE, BATTERY CHARGING METHOD, AND BATTERY CHARGING PROGRAM

      
Numéro d'application JP2024041531
Numéro de publication 2025/121172
Statut Délivré - en vigueur
Date de dépôt 2024-11-22
Date de publication 2025-06-12
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Matsunaga, Shimpachi
  • Tatsukawa, Shogo

Abrégé

The present invention is for efficiently measuring internal resistance for use as a battery degradation index during battery charging, and comprises: a battery charging unit 2 that supplies charging current and/or voltage to a battery B; a battery management unit 3 that manages the charging state of the battery B; a pulse signal generation unit 4 that superimposes, at one or more charging points corresponding to the charging state of the battery B, pulse current or voltage on the charging current or voltage and supplies the same to the battery; an internal resistance calculation unit 5 that calculates the internal resistance of the battery B on the basis of the current value and the voltage value of the battery obtained when charging power superposed with pulse power has been supplied; and a data management unit 6 that records, in a memory, the internal resistance calculated by the internal resistance calculation unit 5.

Classes IPC  ?

  • H02J 7/10 - Régulation du courant ou de la tension de charge utilisant des tubes à décharge ou des dispositifs à semi-conducteurs utilisant uniquement des dispositifs à semi-conducteurs
  • G01R 31/382 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p. ex. état de charge
  • G01R 31/385 - Dispositions pour mesurer des variables des batteries ou des accumulateurs
  • G01R 31/389 - Mesure de l’impédance interne, de la conductance interne ou des variables similaires
  • G01R 31/392 - Détermination du vieillissement ou de la dégradation de la batterie, p. ex. état de santé
  • H01M 10/44 - Méthodes pour charger ou décharger
  • H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p. ex. le niveau ou la densité de l'électrolyte
  • H02J 7/00 - Circuits pour la charge ou la dépolarisation des batteries ou pour alimenter des charges par des batteries

59.

MULTI-TRACK RAMAN ANALYZER

      
Numéro d'application 19037340
Statut En instance
Date de dépôt 2025-01-27
Date de la première publication 2025-06-12
Propriétaire HORIBA INSTRUMENTS INCORPORATED (USA)
Inventeur(s)
  • Vezard, Nicolas
  • Tuladhar, Aashish
  • George, Chris

Abrégé

A spectroscopy system simultaneously obtains Raman measurements from multiple samples or multiple areas of a liquid or solid sample. At least two Raman probes simultaneously acquire spectra from the sample(s) using an imaging spectrometer having a single shared two-dimensional scientific CMOS sensor. Each probe is coupled to a laser, which may be integrated into the probe, and the spectrometer and includes a lens focusing laser light within or on the sample and collecting light from the sample for the spectrometer. The spectrometer images light from multiple probes simultaneously on the scientific CMOS sensor, spaced from one another to reduce crosstalk. A sample positioning device and a probe positioning mechanism may provide relative movement between samples or sample areas and the probes to acquire data from a different subset of samples or sample areas, and may also adjust probe distance from the sample(s) for desired laser focus spot size and location.

Classes IPC  ?

  • G01J 3/44 - Spectrométrie RamanSpectrométrie par diffusion
  • G01J 3/02 - SpectrométrieSpectrophotométrieMonochromateursMesure de la couleur Parties constitutives
  • G01J 3/12 - Production du spectreMonochromateurs
  • G01N 21/65 - Diffusion de Raman

60.

VAPORIZATION DEVICE, MATERIAL STATE DETERMINATION DEVICE, MATERIAL STATE DETERMINATION METHOD FOR VAPORIZATION DEVICE, AND MATERIAL STATE DETERMINATION PROGRAM FOR VAPORIZATION DEVICE

      
Numéro d'application 18956405
Statut En instance
Date de dépôt 2024-11-22
Date de la première publication 2025-06-12
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Ikeyama, Toshihiro
  • Watanabe, Takao

Abrégé

A vaporizer that vaporizes a material, a flow rate control device including a flow rate sensor that measures a flow rate of a material gas generated by the vaporizer, and a determination unit that determines that the material gas has returned to a state before the vaporization on the basis of a transient response of the flow rate measured by the flow rate sensor are included.

Classes IPC  ?

  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques
  • G01F 1/68 - Mesure du débit volumétrique ou du débit massique d'un fluide ou d'un matériau solide fluent, dans laquelle le fluide passe à travers un compteur par un écoulement continu en utilisant des effets thermiques
  • G01N 11/02 - Recherche des propriétés d'écoulement des matériaux, p. ex. la viscosité, la plasticitéAnalyse des matériaux en déterminant les propriétés d'écoulement en mesurant l'écoulement du matériau

61.

SYSTEM AND METHOD FOR ENHANCED RF POWER DELIVERY USING HARMONIC WAVEFORM SYNTHESIS

      
Numéro d'application 18976123
Statut En instance
Date de dépôt 2024-12-10
Date de la première publication 2025-06-12
Propriétaire HORIBA STEC CO., LTD. (Japon)
Inventeur(s) Turner, Terry R.

Abrégé

The present disclosure provides a RF power delivery method for delivering the RF power to a plasma load in a microelectronic manufacturing environment. The RF power delivery method includes generating a harmonically distorted sinusoidal waveform. Such harmonically distorted sinusoidal waveform being derived from a predetermined harmonic signature corresponding to a desired plasma state. Next, the method includes amplifying the harmonically distorted sinusoidal waveform and capable of operating under conditions of high reflected power. Next, the method includes interfacing with a non-linear plasma load impedance. Thereafter, the method includes measuring the RF power spectrum at an output of the fixed impedance matching network, the measured spectrum being used to adjust the amplified harmonically distorted sinusoidal waveform to recreate a desired plasma state.

Classes IPC  ?

  • H01J 37/32 - Tubes à décharge en atmosphère gazeuse

62.

PARTICLE ANALYZING DEVICE, PARTICLE ANALYSIS METHOD, AND PARTICLE ANALYSIS PROGRAM

      
Numéro d'application 18841496
Statut En instance
Date de dépôt 2023-03-02
Date de la première publication 2025-06-05
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s) Tatewaki, Yasuhiro

Abrégé

In analysis of a particle by a PTA method, in order to enable each particle to be analyzed for each type while suppressing increase in size and cost of a device even in a case where excitation wavelengths of fluorescent markers or particles having property of autofluorescence overlap each other, a light irradiation unit (2) that irradiates a sample emitting fluorescence of a plurality of colors with excitation light, one or a plurality of filters (5) that transmits the fluorescence of the plurality of colors while cutting off excitation light, an imaging unit (3) having color identification ability to image fluorescence passing through the filter (5), and an analysis unit (43) that obtains a diffusion rate due to Brownian motion of a particle included in a sample from image data of fluorescence obtained by the imaging unit (3) and analyzes physical property of the particle are included.

Classes IPC  ?

63.

SAMPLE CARRIER AND SAMPLE ANALYSIS SYSTEM

      
Numéro d'application JP2024038894
Numéro de publication 2025/115509
Statut Délivré - en vigueur
Date de dépôt 2024-10-31
Date de publication 2025-06-05
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Kawakami, Shun
  • Park, Sangwoon

Abrégé

This sample carrier is used in a sample analyzer for extracting and analyzing a component, as a gas, generated by heating a measurement sample, and is detachably attached to a predetermined sample input position provided to the sample analyzer. The sample carrier comprises: a container body which has an accommodation chamber for accommodating the measurement sample therein, and which has formed on the bottom surface thereof a sample outlet port for discharging the measurement sample in the accommodation chamber; a bottom plate which is rotatably attached to a bottom part of the container body through a seal member, and on which through-holes are formed in a manner opening to the upper surface and the lower surface; and a distance adjustment mechanism for adjusting an inter-surface distance between the upper surface of the bottom plate and the bottom surface of the container body. The sample carrier is configured such that, by having one of the container body and the bottom plate rotate with respect to the other, the sample outlet port moves between: a predetermined sealed position where the sample outlet port is blocked by the upper surface of the bottom plate and the accommodating chamber is sealed airtight; and an open position where the sample outlet port opens to the through-holes of the bottom plate and the measurement sample can be discharged. The distance adjustment mechanism adjusts an inter-surface distance while the sample outlet port is moving between the sealed position and the open position so as to be longer than the inter-surface distance when the sample outlet port is at the sealed position.

Classes IPC  ?

  • G01N 31/12 - Utilisation de la combustion
  • G01N 1/00 - ÉchantillonnagePréparation des éprouvettes pour la recherche

64.

PROCESSING ADJUSTING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING SYSTEM, PROCESSING ADJUSTING METHOD, AND PROCESSING ADJUSTING PROGRAM

      
Numéro d'application JP2024040665
Numéro de publication 2025/115654
Statut Délivré - en vigueur
Date de dépôt 2024-11-15
Date de publication 2025-06-05
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abrégé

This processing adjusting device is for adjusting processes in a particle size distribution measuring system comprising a particle size distribution measuring unit that measures the particle size distribution of a sample, and a sample supply unit that samples the sample and supplies the sample to the particle size distribution measuring unit, the processing adjusting device comprising: a sampling interval accepting unit that accepts a sampling interval, which is a time from the start of a sampling process for sampling the sample to the start of the next sampling process; and a process time adjusting unit that, if the sampling interval accepted by the sampling interval accepting unit is equal to or less than a prescribed value, adjusts the processing time of at least one of the sampling process for sampling the sample, a measuring process for measuring the particle size distribution of the sample, a cleaning process for cleaning the particle size distribution measuring unit or the sample supply unit, and a standby process for waiting until the start of the next sampling process.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques
  • G01N 1/00 - ÉchantillonnagePréparation des éprouvettes pour la recherche
  • G01N 15/00 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux
  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet

65.

INVERTAU

      
Numéro d'application 1858474
Statut Enregistrée
Date de dépôt 2025-04-28
Date d'enregistrement 2025-04-28
Propriétaire HORIBA Instruments Incorporated (USA)
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

Fluorescence spectrometers; scientific apparatus and instruments for optical analysis, namely, spectrometers, photoluminescence and fluorescence spectrometers; apparatus and instruments for photoluminescence lifetime measurement and spectrographs; microscopes; confocal microscopes for performing fluorescence lifetime imaging (FLIM); microscopes for capturing and analyzing fluorescence decay profiles for use in measuring molecular interactions, local environmental conditions, and biological parameters including FRET, pH, viscosity, binding efficiency, and temperature.

66.

PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE SIZE DISTRIBUTION MEASUREMENT PROGRAM

      
Numéro d'application JP2024040664
Numéro de publication 2025/115653
Statut Délivré - en vigueur
Date de dépôt 2024-11-15
Date de publication 2025-06-05
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abrégé

This particle size distribution measurement system comprises: a particle size distribution measurement unit that measures the particle size distribution of specimens; a specimen supply unit that samples the specimens and supplies the sampled specimens to the particle size distribution measurement unit through a flow path through which the sampled specimens flow; and an arrival time calculation unit that calculates, on the basis of flow path information that is information about the flow path, an arrival time that is the period of time from when the specimens are sampled to when the specimens reach the particle size distribution measurement unit.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques
  • G01N 1/00 - ÉchantillonnagePréparation des éprouvettes pour la recherche
  • G01N 1/10 - Dispositifs pour prélever des échantillons à l'état liquide ou fluide
  • G01N 15/00 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux
  • G01N 15/0227 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’imagerieRecherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques utilisant l’holographie

67.

DEVICE AND METHOD FOR PRODUCING A CONCENTRATED REAGENT FROM A SOLID SUBSTANCE

      
Numéro d'application FR2024051558
Numéro de publication 2025/114665
Statut Délivré - en vigueur
Date de dépôt 2024-11-26
Date de publication 2025-06-05
Propriétaire HORIBA ABX SAS (France)
Inventeur(s)
  • Donnarumma, Dario
  • Couderc, Guilhem

Abrégé

The invention relates to a device (1) for producing a concentrated reagent, comprising: - a solvent reservoir (3), - a container (5) containing a solid substance having a solubility in water at 20°C of greater than or equal to 340 g/l, - a pump (9), and - a production circuit (11) including a first line (13) provided with a first valve (15) and a second line (17) provided with a second valve (19). The pump (9) is fluidically connected to the reservoir (3) and to the container (5) respectively by the first line (13) and the second line (17). The pump (9) makes it possible to take solvent from the reservoir (3) and then deliver it to the container (5) such that a concentrated reagent is produced therein by dissolving at least a portion of the solid substance in the solvent.

Classes IPC  ?

  • G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p. ex. dispositifs d'aspiration, dispositifs d'injection
  • B01F 21/20 - Dissolution utilisant le mélange à écoulement
  • B01F 21/00 - Dissolution
  • B01F 35/71 - Mécanismes d'alimentation
  • B01F 35/75 - Mécanismes d’évacuation

68.

DEVICE AND METHOD FOR PERFORMING A COMPLETE BLOOD COUNT AND DETERMINING A SEDIMENTATION RATE

      
Numéro d'application 18856808
Statut En instance
Date de dépôt 2023-04-14
Date de la première publication 2025-05-29
Propriétaire HORIBA ABX SAS (France)
Inventeur(s)
  • Piedcoq, Philippe
  • Couderc, Guilhem

Abrégé

A device for performing a complete blood count and for determining a sedimentation rate comprises a first group (4) arranged so as to sample a blood sample from a tube and to carry out a complete blood count on this sample, characterised in that it comprises a second group (6) arranged so as to sample a blood sample from a tube and to carry out a sedimentation rate determination. This device comprises at least one sampling member (8) which could be controlled for a measurement by the first group (4) and a measurement by the second group (6) for sampling a blood sample so that a sample sampled for the first group (4) is not used by the second group (6), and that a sample sampled for the second group (6) is not used by the first group (4), the second group (6) being provided with a sensor (20) comprising an infrared light source (12) and an optical sensor (14) arranged substantially opposite one another around a tube (16) connected to an outlet end of the at least one sampling member (8) so that the light emitted by the infrared light source (12) reaches the optical sensor (14) after having crossed said tube (16). This device further comprises a converter (10) arranged so as to receive one or more light-transmission measurement(s) from the optical sensor (14) and to determine a sedimentation rate.

Classes IPC  ?

  • G01N 15/05 - Recherche de la sédimentation des suspensions de particules dans du sang
  • G01N 15/01 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux spécialement adaptée aux cellules biologiques, p. ex. aux cellules sanguines
  • G01N 15/14 - Techniques de recherche optique, p. ex. cytométrie en flux

69.

MACHINE LEARNING DEVICE, VEHICLE TESTING SYSTEM, MACHINE LEARNING METHOD, AND VEHICLE TESTING METHOD

      
Numéro d'application 18868716
Statut En instance
Date de dépôt 2023-05-15
Date de la première publication 2025-05-29
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Komatsu, Yoji
  • Nagaoka, Makoto

Abrégé

The present invention makes it possible to simplify the task of reproducing a load such as a road gradient resistance or the like when a vehicle is actually traveling on a road, and includes a learning data acquisition unit that acquires learning data formed by load data that includes a road gradient resistance of a travel route and driving resistance variables deriving from a vehicle's behavior, and by vehicle traveling data that includes a vehicle's speed, accelerator pedal position, and brake pedal position when that vehicle is traveling on the travel route, and a machine learning unit that employs machine learning to determine a correlation between the load data and the vehicle traveling data, and then creates a simulated gradient prediction model that shows the correlation between the load data and the vehicle traveling data.

Classes IPC  ?

  • G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle
  • G01M 17/007 - Véhicules à roues ou à chenilles
  • G06F 119/14 - Analyse des forces ou optimisation des forces, p. ex. forces statiques ou dynamiques

70.

Device and method for determining a sedimentation rate

      
Numéro d'application 18856821
Numéro de brevet 12449343
Statut Délivré - en vigueur
Date de dépôt 2023-04-13
Date de la première publication 2025-05-29
Date d'octroi 2025-10-21
Propriétaire HORIBA ABX SAS (France)
Inventeur(s)
  • Piedcoq, Philippe
  • Couderc, Guilhem
  • Fudaly, Christophe

Abrégé

A device for determining a sedimentation rate comprises at least one member for sampling a blood sample, and a sensor comprising an infrared light source and an optical sensor arranged substantially opposite each other around a substantially transparent portion of the sampling member so that the light emitted by the infrared light source reaches the optical sensor after having passed through said substantially transparent portion. The optical sensor is arranged so as to carry out a blank measurement. A converter is arranged so as to receive one or more light transmission measurements from the optical sensor, to calculate the ratio between the blank measurement and the one or more light transmission measurements and to return a sedimentation rate.

Classes IPC  ?

  • G01N 15/05 - Recherche de la sédimentation des suspensions de particules dans du sang

71.

Device for spreading or colouring and determining a sedimentation rate

      
Numéro d'application 18856813
Numéro de brevet 12313516
Statut Délivré - en vigueur
Date de dépôt 2023-04-13
Date de la première publication 2025-05-27
Date d'octroi 2025-05-27
Propriétaire HORIBA ABX SAS (France)
Inventeur(s)
  • Couderc, Guilhem
  • Beauducel, Florent
  • Thoraval, Coralie

Abrégé

A device for spreading or colouring and for determining a sedimentation rate includes a first group arranged so as to sample a blood sample from a tube and to carry out a smear test on the sample and a second group arranged so as to sample a blood sample from a tube and to carry out a sedimentation rate determination. At least one sampling member is controllable for an operation by the first group and an operation by the second group for sampling a blood sample so that a sample sampled for one group is not used by the other group. The second group is provided with a sensor. A converter is arranged so as to receive one or more light-transmission measurements from the sensor and to determine a sedimentation rate.

Classes IPC  ?

  • G01N 15/05 - Recherche de la sédimentation des suspensions de particules dans du sang
  • G01N 1/28 - Préparation d'échantillons pour l'analyse
  • G01N 33/49 - Analyse physique de matériau biologique de matériau biologique liquide de sang

72.

FLOW RATE MEASUREMENT MECHANISM AND FLUID CONTROL APPARATUS

      
Numéro d'application 18948860
Statut En instance
Date de dépôt 2024-11-15
Date de la première publication 2025-05-22
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Cocciadiferro, Edward
  • Dick, John

Abrégé

A fluid resistance element is disposed on a flow path along which flows a fluid, and in which a resistance flow path is formed. A fluid receiving portion is provided on the flow path and is hit by the fluid flowing from upstream of the fluid resistance element so as to cause the fluid to flow to a side. Flexible components support the fluid resistance element and deform in accordance with a flow rate of the fluid. A displacement sensor measures a displacement of the flexible components, and a flow rate calculation unit calculates a flow rate of the fluid based on the displacement. The fluid that is made to flow to the side by the fluid receiving portion flows along the resistance flow path of the fluid resistance element.

Classes IPC  ?

  • G01F 1/38 - Mesure du débit volumétrique ou du débit massique d'un fluide ou d'un matériau solide fluent, dans laquelle le fluide passe à travers un compteur par un écoulement continu en utilisant des effets mécaniques en mesurant la pression ou la différence de pression la pression ou la différence de pression étant produite par une contraction de la veine fluide la pression ou la différence de pression étant mesurée au moyen d'un élément mobile, p. ex. une membrane, un piston, un tube de Bourdon ou une capsule déformable
  • G01F 1/40 - Détails de structure des dispositifs de contraction de la veine fluide

73.

ANALYSIS DEVICE, ANALYSIS SYSTEM, ANALYSIS METHOD, AND PROGRAM

      
Numéro d'application JP2024038226
Numéro de publication 2025/105150
Statut Délivré - en vigueur
Date de dépôt 2024-10-25
Date de publication 2025-05-22
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Yamaguchi, Kazuki

Abrégé

The objective of the present invention is to accurately calculate an amount of particulate matter without being affected by changes in the amount of light emitted onto the particulate matter. An analysis device (100) comprises: a holding member (1) that holds particulate matter (FP); a light source (3) that emits light toward an imaging target area (VA) including a holding area of the holding member (1) in which the particulate matter (FP) is held; a two-dimensional sensor (4) that images the imaging target area (VA); and a calculating unit (5) that calculates particle amount-related information relating to the amount of particulate matter (FP) on the basis of analysis image data acquired by employing the two-dimensional sensor (4) to image the imaging target area (VA) for use in analyzing the particulate matter (FP), and an impact resulting from a change in the amount of light from the light source (3) when the analysis image data were acquired, relative to a reference amount of light.

Classes IPC  ?

  • G01N 15/075 - Recherche de la concentration des suspensions de particules par des moyens optiques
  • G01N 1/02 - Dispositifs pour prélever des échantillons
  • G01N 21/17 - Systèmes dans lesquels la lumière incidente est modifiée suivant les propriétés du matériau examiné
  • G06T 7/00 - Analyse d'image
  • G06V 20/69 - Objets microscopiques, p. ex. cellules biologiques ou pièces cellulaires

74.

PARTICLE ANALYSIS DEVICE, PARTICLE ANALYSIS DEVICE PROGRAM, AND PARTICLE ANALYSIS METHOD

      
Numéro d'application 18841503
Statut En instance
Date de dépôt 2023-03-28
Date de la première publication 2025-05-22
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s)
  • Sugasawa, Hirosuke
  • Tatewaki, Yasuhiro
  • Igushi, Tatsuo

Abrégé

A particle analysis device can take a fluorescence observation mode in which fluorescence emitted by a fluorescent marker added to a particle or by the particle itself is imaged by irradiating the particle with excitation light, and a scattered light observation mode in which scattered light produced by irradiating the particle with the light is imaged. A particle specifying unit specifies the particle to which the fluorescent marker is added or the particle that emits the fluorescence from fluorescence image data obtained in the fluorescence observation mode. An analyzing unit analyzes physical properties of the particle by obtaining diffusion speed due to the Brownian motion of the particle specified by the particle specifying unit from the image data of the scattered light obtained in the scattered light observation mode having a frame number larger than that in the fluorescence observation mode.

Classes IPC  ?

  • G01N 15/1434 - Dispositions optiques
  • G01N 15/01 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux spécialement adaptée aux cellules biologiques, p. ex. aux cellules sanguines
  • G01N 33/58 - Analyse chimique de matériau biologique, p. ex. de sang ou d'urineTest par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligandsTest immunologique faisant intervenir des substances marquées

75.

LIQUID MATERIAL VAPORIZATION APPARATUS AND OPERATION SETTING METHOD THEREOF

      
Numéro d'application 18950461
Statut En instance
Date de dépôt 2024-11-18
Date de la première publication 2025-05-22
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Oba, Hidenori
  • Kawakado, Hajime

Abrégé

A liquid material vaporization apparatus operates such that, in a gas generation mode, a liquid material is supplied to a tank through a supply path via a first on-off valve set to a predetermined first opening degree, and operates such that, in a purge mode, a purge gas is introduced into the tank through the supply path via the first on-off valve set to a second opening degree that is larger than the first opening degree.

Classes IPC  ?

  • F22B 35/00 - Systèmes de commande pour chaudières à vapeur
  • F22B 37/78 - Adaptation ou montage d'indicateurs de niveau
  • H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants

76.

X-RAY ANALYSIS DEVICE

      
Numéro d'application JP2024038984
Numéro de publication 2025/105205
Statut Délivré - en vigueur
Date de dépôt 2024-10-31
Date de publication 2025-05-22
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Aoyama, Tomoki
  • Ohashi, Satoshi
  • Tajima, Mikiya

Abrégé

An x-ray analysis device according to the present invention is to analyze the elements included in a measurement sample transported in a prescribed direction and comprises an x-ray irradiation unit that radiates x-rays toward the measurement sample, an x-ray detection unit that faces the measurement sample and detects x-ray fluorescence produced from the measurement sample, and a standard sample that has a known element content and is provided in a region of overlap between a region irradiated with the x-rays radiated from the x-ray irradiation unit and a region in which x-ray fluorescence can be detected by the x-ray detection unit.

Classes IPC  ?

  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

77.

HYDROGEN DETECTION DEVICE AND HYDROGEN DETECTION METHOD

      
Numéro d'application JP2024033736
Numéro de publication 2025/100115
Statut Délivré - en vigueur
Date de dépôt 2024-09-20
Date de publication 2025-05-15
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Shiba, Takumi
  • Naya, Hiroshi

Abrégé

This hydrogen detection device for detecting hydrogen contained in a gas in a chamber or in a pipe comprises: a casing which is inserted into the chamber or the pipe and has an internal space into which the gas can be introduced; a physical quantity change part which is provided in the internal space and in which a physical quantity changes according to the concentration of the hydrogen; and a physical quantity detection part which is provided in the internal space and detects the physical quantity in the physical quantity change part. The internal space is separated into a first space and a second space by a separation member. The gas is introduced into the first space and the physical quantity change part is housed in the first space. The gas is not introduced into the second space and the physical quantity detection part is housed in the second space.

Classes IPC  ?

  • G01N 21/78 - Systèmes dans lesquels le matériau est soumis à une réaction chimique, le progrès ou le résultat de la réaction étant analysé en observant l'effet sur un réactif chimique produisant un changement de couleur

78.

PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING METHOD, PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, AND KIT FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE

      
Numéro d'application 18728676
Statut En instance
Date de dépôt 2023-01-18
Date de la première publication 2025-05-15
Propriétaire HORIBA, Ltd. (Japon)
Inventeur(s) Tatewaki, Yasuhiro

Abrégé

A particle size distribution measuring device includes: a measurement cell including a sample accommodation space that accommodates a sample obtained by dispersing a plurality of particles in a dispersion medium; a stirring means that stirs the sample by sucking and discharging the sample in the measurement cell; a light irradiation unit that irradiates the sample in the measurement cell with light; a light detection unit that detects scattered light or fluorescent light generated from the sample in the measurement cell; and an analysis unit that measures a particle size distribution of a particle group including the plurality of particles using a detection signal obtained by the light detection unit.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques
  • G01N 1/38 - Dilution, dispersion ou mélange des échantillons
  • G01N 15/01 - Recherche de caractéristiques de particulesRecherche de la perméabilité, du volume des pores ou de l'aire superficielle effective de matériaux poreux spécialement adaptée aux cellules biologiques, p. ex. aux cellules sanguines

79.

PITOT TUBE FLOWMETER, GAS ANALYSIS DEVICE, AND GAS ANALYSIS METHOD

      
Numéro d'application 18835696
Statut En instance
Date de dépôt 2023-03-02
Date de la première publication 2025-05-08
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Mizutani, Naoto
  • Nagaoka, Makoto
  • Inoue, Kentaro
  • Uraoka, Masaru
  • Iseki, Hirotaka

Abrégé

The present invention makes a pitot tube type flowmeter less affected by the flow velocity distribution caused by the flow passage shape on the upstream side, and includes a pitot tube having total pressure holes for detecting a total pressure of a fluid and static pressure holes for detecting a static pressure of the fluid, and a differential pressure sensor that is connected to the pitot tube and detects a differential pressure between the total pressure and the static pressure. The pitot tube includes a main tube portion, and a plurality of branch tube portions, which branches off from the main tube portion and in which the total pressure holes and the static pressure holes are formed. Each of the main tube portion and the plurality of branch tube portions has a shape that reduces a pressure loss.

Classes IPC  ?

80.

CONTROL PARAMETER CALCULATION APPARATUS, CONTROL PARAMETER CALCULATION METHOD, AND CONTROL PARAMETER CALCULATION PROGRAM

      
Numéro d'application 18938474
Statut En instance
Date de dépôt 2024-11-06
Date de la première publication 2025-05-08
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Higuchi, Seiji
  • Takijiri, Kotaro

Abrégé

A control parameter calculation apparatus calculates a control parameter of a fluid control apparatus that controls a fluid. The control parameter calculation apparatus stores correlation data indicating a correlation of a reference control parameter of the fluid control apparatus and a reference response signal output by using the reference control parameter, acquires a target response signal output by using a target control parameter of the fluid control apparatus different from the fluid control apparatus serving as a reference, acquires the correlation data and the target response signal and calculates a correlation control parameter corresponding to the target response signal in the fluid control apparatus serving as a reference by using the correlation data, and calculates an adjustment amount of the target control parameter based on the correlation control parameter and the reference control parameter.

Classes IPC  ?

  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques

81.

COMPOSITION FOR HEMATOLOGY ANALYSES

      
Numéro d'application FR2024051428
Numéro de publication 2025/093835
Statut Délivré - en vigueur
Date de dépôt 2024-10-29
Date de publication 2025-05-08
Propriétaire HORIBA ABX SAS (France)
Inventeur(s)
  • Donnarumma, Dario
  • Adjemian, Jocelyne

Abrégé

The invention relates to a composition for hematology analyses and to the method for producing same. The composition comprises an anticoagulant, in an amount of between 0.1% and 8% by weight, preferably between 2% and 6%; a salt in an amount of between 30% and 90% by weight, preferably between 50% and 80%; a pH buffer in an amount of between 0.1% and 50% by weight, preferably greater than or equal to 10%; and a surfactant in an amount of between 0.01% and 2% by weight, preferably between 0.05% and 1.5%, in solid form. The invention also relates to a solution obtained from the solid composition.

Classes IPC  ?

  • G01N 35/00 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet

82.

DILUTION MECHANISM, PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT

      
Numéro d'application 18728729
Statut En instance
Date de dépôt 2023-01-17
Date de la première publication 2025-05-01
Propriétaire
  • HORIBA, Ltd. (Japon)
  • HORIBA Advanced Techno, Co., Ltd. (Japon)
Inventeur(s)
  • Sakuramoto, Keijiro
  • Mori, Tetsuya
  • Habu, Kazunori

Abrégé

A dilution mechanism includes: a sample line that guides the sample containing the particles to the particle size distribution measurement device; a dilution line that merges with the sample line and through which a diluent flows; a concentration adjusting unit that adjusts the concentration of the particles contained in the diluted sample; a conductivity measuring unit that measures a conductivity of the diluted sample; a control unit that controls the concentration adjusting unit to bring the conductivity measured by the conductivity measuring unit or a conductivity-related value that is a value calculated from the conductivity, to a predetermined target value.

Classes IPC  ?

  • G01N 15/06 - Recherche de la concentration des suspensions de particules
  • G01N 1/38 - Dilution, dispersion ou mélange des échantillons
  • G01N 15/14 - Techniques de recherche optique, p. ex. cytométrie en flux

83.

DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING DEVICE, DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING METHOD, AND DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING PROGRAM

      
Numéro d'application JP2024037561
Numéro de publication 2025/089267
Statut Délivré - en vigueur
Date de dépôt 2024-10-22
Date de publication 2025-05-01
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Sakuramoto, Keijiro

Abrégé

Provided is a dynamic light scattering type particle diameter distribution measuring device comprising: a light irradiation unit that irradiates a sample flowing through a flow path with light; a light detection unit that detects light scattered by the sample; a particle diameter distribution calculation unit that calculates the particle diameter distribution of the sample on the basis of the light intensity obtained by the light detection unit; a flow rate acquisition unit that acquires the flow rate of the sample flowing through the flow path; and a particle diameter distribution correction unit that corrects the particle diameter distribution calculated by the particle diameter distribution calculation unit, on the basis of the flow rate acquired by the flow rate acquisition unit.

Classes IPC  ?

  • G01N 15/0205 - Recherche de la dimension ou de la distribution des dimensions des particules par des moyens optiques

84.

INVERTAU

      
Numéro de série 99154006
Statut En instance
Date de dépôt 2025-04-24
Propriétaire HORIBA Instruments Incorporated ()
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

Fluorescence spectrometers other than for medical purposes; scientific apparatus and instruments for optical analysis, namely, spectrometers, photoluminescence and fluorescence spectrometers; scientific apparatus and instruments for photoluminescence lifetime measurement and spectrographs; microscopes; confocal microscopes for performing fluorescence lifetime imaging (FLIM); microscopes for capturing and analyzing fluorescence decay profiles for use in measuring molecular interactions, local environmental conditions, and biological parameters including FRET, pH, viscosity, binding efficiency, and temperature

85.

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETECTION APPARATUS AND RECORDING MEDIUM

      
Numéro d'application 18682769
Statut En instance
Date de dépôt 2022-08-12
Date de la première publication 2025-04-24
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s)
  • Murata, Shunsuke
  • Valiev, Ildar

Abrégé

A signal processing method for processing a signal including a response wave generated in response to detection of radiation, includes: measuring a feature corresponding to a duration of a response wave or a response wave group composed of a plurality of response waves; counting, for each wave height, the number of response waves or response wave groups whose measured features are included in a predetermined first range in which a feature of a single response wave is included; and performing correction processing of subtracting a specific value from a counted number according to a response wave or a response wave group whose feature is not included in the first range.

Classes IPC  ?

  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
  • G01T 1/17 - Dispositions de circuits non adaptés à un type particulier de détecteur

86.

FLUID CONTROL VALVE, FLUID CONTROL DEVICE AND DRIVE CIRCUIT

      
Numéro d'application 18923498
Statut En instance
Date de dépôt 2024-10-22
Date de la première publication 2025-04-24
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Takakura, Hiroshi

Abrégé

A drive circuit of a piezo actuator is provided with a flyback transformer whose primary winding is connected to a DC power supply, and whose secondary winding is connected to the piezo actuator, a charging switch that is connected to the primary winding, a discharging switch that is connected to the secondary winding, a regenerative capacitor that is connected to the primary winding and in which discharge energy from the piezo actuator is regenerated, and a switch control unit that controls ON/OFF operations of the charging switch and the discharging switch. The switch control unit controls the ON/OFF operations of the charging switch and the discharging switch so as to repeatedly charge and discharge the piezo actuator and thereby control the applied voltage of the piezo actuator.

Classes IPC  ?

  • F16K 31/00 - Moyens de fonctionnementDispositifs de retour à la position de repos
  • G05D 7/06 - Commande de débits caractérisée par l'utilisation de moyens électriques
  • H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants

87.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Numéro d'application 18923513
Statut En instance
Date de dépôt 2024-10-22
Date de la première publication 2025-04-24
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Kawai, Yuya
  • Ieki, Atsushi

Abrégé

In order to configure a fluid control valve to have the life prolonged while keeping an inexpensive configuration, the fluid control valve includes: a valve body that can come into contact and separate from a valve seat; an actuator that causes the valve body to move; a diaphragm member provided between the valve body and the actuator and having a protruding part protruding toward the valve body; and a sphere housed inside the protruding part, in which the actuator moves the valve body by pressing a distal end of the protruding part through the sphere, and the sphere is formed of a ceramic material.

Classes IPC  ?

  • F16K 7/12 - Dispositifs d'obturation à diaphragme, p. ex. dont un élément est déformé, sans être déplacé entièrement, pour fermer l'ouverture à diaphragme plat, en forme d'assiette ou en forme de bol
  • F16K 37/00 - Moyens particuliers portés par ou sur les soupapes ou autres dispositifs d'obturation pour repérer ou enregistrer leur fonctionnement ou pour permettre de donner l'alarme

88.

LF-F

      
Numéro d'application 1850530
Statut Enregistrée
Date de dépôt 2025-01-17
Date d'enregistrement 2025-01-17
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Classes de Nice  ?
  • 07 - Machines et machines-outils
  • 09 - Appareils et instruments scientifiques et électriques

Produits et services

Semiconductor manufacturing machines, and part and fittings therefor; machines for manufacturing batteries, and part and fittings therefor; machines for manufacturing electric storage batteries, and part and fittings therefor; machines for manufacturing solar cell, and part and fittings therefor; machines for manufacturing electronic components, and part and fittings therefor; machines for manufacturing light emitting diode, and part and fittings therefor; machines for manufacturing displays, and part and fittings therefor; machines for manufacturing liquid crystal, and part and fittings therefor; machines for manufacturing organic electroluminescence, and part and fittings therefor; fluid controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; flow controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid measurement apparatus for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid flow meters for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid flow sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; apparatus for measuring temperature difference for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor. Measuring or testing machines and instruments; fluid controllers; flow controllers; fluid measurement apparatus; fluid flow meters; fluid flow sensors; pressure controllers; pressure gauges; pressure sensors; temperature controllers; temperature gauges; temperature sensors; apparatus for measuring temperature difference; automatic controllers for measurement of fluid; automatic controllers for measurement of flow; automatic controllers for measurement of pressure; automatic controllers for measurement of temperature; laboratory apparatus and instruments; electronic computer and data processing machines and apparatus and their parts; computer programs; computer software.

89.

RADIATION DETECTION ELEMENT MANUFACTURING METHOD, RADIATION DETECTION ELEMENT, AND RADIATION DETECTOR

      
Numéro d'application JP2024035360
Numéro de publication 2025/079486
Statut Délivré - en vigueur
Date de dépôt 2024-10-03
Date de publication 2025-04-17
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Ishikura, Koji

Abrégé

Provided are a radiation detection element manufacturing method, a radiation detection element, and a radiation detector that make it possible to accurately detect radiation having low energy. This radiation detection element manufacturing method comprises: forming an oxide layer composed of an oxide of a semiconductor on a first semiconductor layer; forming a second semiconductor layer on the oxide layer; and implanting, into the first semiconductor layer via the second semiconductor layer and the oxide layer, ions of a dopant that alters a semiconductor forming the first semiconductor layer to a semiconductor of a different type, thereby forming a doping layer composed of a semiconductor doped with the dopant between the first semiconductor layer and the oxide layer.

Classes IPC  ?

  • G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs

90.

XTROLOGY

      
Numéro de série 79425805
Statut En instance
Date de dépôt 2025-04-03
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Classes de Nice  ? 09 - Appareils et instruments scientifiques et électriques

Produits et services

Semiconductor wafer inspection apparatus; analyzing apparatus for defect of semiconductor wafers; analyzing apparatus for stress of semiconductor wafers; analyzing apparatus for composition of semiconductor wafers; semiconductor wafer measuring apparatus; semiconductor wafer testing apparatus; semiconductor photomask inspection apparatus; analyzing apparatus for defect of semiconductor photomasks; analyzing apparatus for stress of semiconductor photomasks; analyzing apparatus for composition of semiconductor photomasks; semiconductor photomask measuring apparatus; semiconductor photomask testing apparatus; semiconductor reticle inspection apparatus; analyzing apparatus for defect of semiconductor reticles; analyzing apparatus for stress of semiconductor reticles; analyzing apparatus for composition of semiconductor reticles; semiconductor reticle measuring apparatus; semiconductor reticle testing apparatus; semiconductor substrate inspection apparatus; analyzing apparatus for defect of semiconductor substrates; analyzing apparatus for stress of semiconductor substrates; analyzing apparatus for composition of semiconductor substrates; semiconductor substrate measuring apparatus; semiconductor substrate testing apparatus; sensors for mapping semiconductor wafers; Raman spectrographic measurement apparatus, and parts and accessories therefor; Raman spectroscopic analyzing apparatus, and parts and accessories therefor; measuring apparatus for measuring film thickness; measuring apparatus for spectral measurements; automated optical inspection apparatus; X-ray fluorescence measuring apparatus; measuring or testing machines and instruments, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrometers, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrographs, and parts and accessories therefor; optical machines and apparatus; photographic machines and apparatus; cinematographic machines and apparatus; laboratory apparatus and instruments; computer software for inspection, defect analysis, stress analysis, composition analysis, measurement and testing of semiconductor wafers, photomasks, reticles and substrates; computer software; computer programs; scanning probe microscopes; X-ray fluorescence analyzing apparatus; electronic computer and data processing machines and apparatus and their parts; power distribution or control machines and apparatus; rotary converters; phase modifiers; batteries and cells; electric or magnetic meters and testers; electric wires and cables; spectacles [eyeglasses and goggles]; life-saving apparatus and equipment; telecommunication machines and apparatus; fire alarms; gas alarms; water leak alarms; oil leak alarms; anti-theft warning apparatus.

91.

PATTERN MEASUREMENT DEVICE, PATTERN MEASUREMENT PROGRAM, AND PATTERN MEASUREMENT METHOD

      
Numéro d'application 18899560
Statut En instance
Date de dépôt 2024-09-27
Date de la première publication 2025-04-03
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Higuchi, Seiji
  • Ogaki, Ryosuke
  • Ueda, Takayuki

Abrégé

The present invention is to accurately measure a dimension of a pattern by using statistical outlier processing, and is a pattern measurement device for measuring a dimension of a pattern formed on a sample. The pattern measurement device includes: a dimension measurement unit configured to measure a dimension of the pattern; an outlier removal unit configured to execute outlier processing at least twice on a plurality of dimension values measured by the dimension measurement unit; and a representative value determination unit configured to obtain a representative dimension value of the pattern from one or a plurality of the dimension values from which an outlier has been removed by the outlier removal unit.

Classes IPC  ?

  • G01B 11/14 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la distance ou la marge entre des objets ou des ouvertures espacés

92.

X-RAY ANALYSIS DEVICE, X-RAY ANALYSIS METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Numéro d'application JP2024034558
Numéro de publication 2025/070683
Statut Délivré - en vigueur
Date de dépôt 2024-09-27
Date de publication 2025-04-03
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Aoyama, Tomoki

Abrégé

Provided are: an X-ray analysis device that is capable of individually measuring the amounts of elements contained in layers on the obverse surface side and the reverse surface side of a multilayer sample; an X-ray analysis method; an information processing device; and a computer program. This X-ray analysis device is provided with: an emission unit that emits X-rays to a sample in which a plurality of layers are laminated, so as to sequentially penetrate a first layer, an intermediate layer, and a second layer; a fluorescent X-ray detector that detects fluorescent X-rays generated from the first layer or the second layer; a penetrating X-ray detector that detects penetrating X-rays that have penetrated the sample; and an analysis unit. The analysis unit calculates the amount of a specific element contained in one of the first layer or the second layer in accordance with the intensity of fluorescent X-rays having a prescribed first energy, calculates the total amount of the specific element contained in the first layer and the second layer in accordance with the intensity of penetrating X-rays having a prescribed second energy higher than the first energy, and calculates the amount of the specific element contained in the other of the first layer or the second layer.

Classes IPC  ?

  • G01N 23/2206 - Combinaison de plusieurs mesures, l'une au moins étant celle d’une émission secondaire, p. ex. combinaison d’une mesure d’électrons secondaires [ES] et d’électrons rétrodiffusés [ER]
  • G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

93.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Numéro d'application JP2024029184
Numéro de publication 2025/069770
Statut Délivré - en vigueur
Date de dépôt 2024-08-16
Date de publication 2025-04-03
Propriétaire HORIBA STEC, CO., LTD. (Japon)
Inventeur(s) Dick, John

Abrégé

The present invention improves the durability of a displacement changing mechanism that changes the displacement of an actuator and transmits this displacement to a valve body, while reducing the number of components to achieve a compact configuration. A displacement changing mechanism 6 for changing the displacement of an actuator 4 and transmitting this displacement to a valve body 3 side is provided with: a cylindrical holding member 61 interposed between the valve body 3 and the actuator 4; a plurality of movable members 62 forming a partial columnar shape corresponding to the inner peripheral surface of the holding member 61; and a plurality of rotation support shafts 63 for rotatably supporting the plurality of movable members 62 with respect to the holding member 61. Each of the plurality of movable members 62 has an input part 62a displaced by receiving the driving force from the actuator 4, and an output part 62b for changing the displacement applied to the input part 62a and transmitting this displacement to the valve body 3 side.

Classes IPC  ?

  • F16K 1/32 - Soupapes ou clapets, c.-à-d. dispositifs obturateurs dont l'élément de fermeture possède au moins une composante du mouvement d'ouverture ou de fermeture perpendiculaire à la surface d'obturation Détails

94.

PLATINALINK

      
Numéro d'application 1847626
Statut Enregistrée
Date de dépôt 2024-12-13
Date d'enregistrement 2024-12-13
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Computer software for verifying data integrity; computer software for verifying data accuracy, completeness and consistency; computer software for access control, user identification, verification and security management; computer software for generating reports regarding data integrity; computer software for generating reports regarding data accuracy, completeness and consistency; computer software for measuring, controlling, testing, experimenting, data collection and management of engines, brakes and drives and apparatus attached thereto for vehicles and automobiles; computer software for measuring, controlling, testing, experimenting, data collection and management of pharmaceuticals, cosmetics, foodstuffs and dietary supplements; computer software for measuring, controlling, testing, experimenting, data collection and management of solid samples, gaseous samples and liquid samples; computer software for use with measuring or testing machines and instruments; computer software for use with laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus. Repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of electronic machines and apparatus; repair or maintenance of optical machines and apparatus. Design, programming and maintenance of computer software for verifying data integrity; design, programming and maintenance of computer software for verifying data accuracy, completeness and consistency; design, programming and maintenance of computer software for access control, user identification, verification and security management; design, programming and maintenance of computer software; computer software design, computer programming, or maintenance of computer software; rental of computer software for verifying data integrity; rental of computer software for verifying data accuracy, completeness and consistency; rental of computer software for access control, user identification, verification and security management; rental of computer software; providing on-line non-downloadable computer software for verifying data integrity; providing on-line non-downloadable computer software for verifying data accuracy, completeness and consistency; providing on-line non-downloadable computer software for access control, user identification, verification and security management; providing on-line non-downloadable computer software; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of measuring or testing machines and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on measuring or testing machines and instruments.

95.

HORIBA PLATINALINK

      
Numéro d'application 1847627
Statut Enregistrée
Date de dépôt 2024-12-13
Date d'enregistrement 2024-12-13
Propriétaire HORIBA, Ltd. (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 37 - Services de construction; extraction minière; installation et réparation
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Computer software for verifying data integrity; computer software for verifying data accuracy, completeness and consistency; computer software for access control, user identification, verification and security management; computer software for generating reports regarding data integrity; computer software for generating reports regarding data accuracy, completeness and consistency; computer software for measuring, controlling, testing, experimenting, data collection and management of engines, brakes and drives and apparatus attached thereto for vehicles and automobiles; computer software for measuring, controlling, testing, experimenting, data collection and management of pharmaceuticals, cosmetics, foodstuffs and dietary supplements; computer software for measuring, controlling, testing, experimenting, data collection and management of solid samples, gaseous samples and liquid samples; computer software for use with measuring or testing machines and instruments; computer software for use with laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus. Repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of electronic machines and apparatus; repair or maintenance of optical machines and apparatus. Design, programming and maintenance of computer software for verifying data integrity; design, programming and maintenance of computer software for verifying data accuracy, completeness and consistency; design, programming and maintenance of computer software for access control, user identification, verification and security management; design, programming and maintenance of computer software; computer software design, computer programming, or maintenance of computer software; rental of computer software for verifying data integrity; rental of computer software for verifying data accuracy, completeness and consistency; rental of computer software for access control, user identification, verification and security management; rental of computer software; providing on-line non-downloadable computer software for verifying data integrity; providing on-line non-downloadable computer software for verifying data accuracy, completeness and consistency; providing on-line non-downloadable computer software for access control, user identification, verification and security management; providing on-line non-downloadable computer software; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of measuring or testing machines and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on measuring or testing machines and instruments.

96.

VAPORIZER AND VAPORIZING SYSTEM

      
Numéro d'application 18904016
Statut En instance
Date de dépôt 2024-10-01
Date de la première publication 2025-04-03
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Kanamaru, Takashi
  • Kawakado, Hajime

Abrégé

A vaporizer for vaporizing a liquid substance includes: a tank for storing the liquid substance; a heater for heating the liquid substance by heating the tank; and a porous structure, disposed inside the tank, for breaking up and letting pass through it bubbles that form as a result of the liquid substance being heated by the heater.

Classes IPC  ?

  • B01J 7/02 - Appareillage pour la production de gaz par voie humide

97.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Numéro d'application JP2024031091
Numéro de publication 2025/062997
Statut Délivré - en vigueur
Date de dépôt 2024-08-29
Date de publication 2025-03-27
Propriétaire HORIBA, LTD. (Japon)
Inventeur(s) Park, Sangwoon

Abrégé

This analysis device is provided with: an impulse heating furnace or a high-frequency heating furnace that heats a sample to generate a sample gas containing elements that constitute the sample; a suction flow path that sucks the sample gas generated in the impulse heating furnace or the high-frequency heating furnace by means of a suction unit; and an element detecting unit that is provided in the suction flow path to detect the elements contained in the sample gas.

Classes IPC  ?

98.

CAPACITIVE PRESSURE SENSOR

      
Numéro d'application 18824086
Statut En instance
Date de dépôt 2024-09-04
Date de la première publication 2025-03-27
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s)
  • Kuwahara, Akira
  • Kishida, Sotaro

Abrégé

The present invention is intended to simplify the configuration of the baffle and prevent deposition on the diaphragm, and includes: a housing surrounding a pressure receiving surface of the diaphragm to form a measurement chamber, the housing having a gas introduction port for introducing a gas into the measurement chamber; and a baffle member provided in the measurement chamber, in which the baffle member includes: a facing surface portion facing the gas introduction port; and an surrounding surface portion provided closer to a side of the gas introduction port than the facing surface portion and surrounding a periphery of the gas introduction port, and the surrounding surface portion includes a flow passage portion that allows a gas introduced from the gas introduction port to flow from an end portion on the side of the gas introduction port side toward a side of the diaphragm.

Classes IPC  ?

  • G01L 19/06 - Moyens pour empêcher la surcharge ou l'influence délétère du milieu à mesurer sur le dispositif de mesure ou vice versa
  • G01L 9/00 - Mesure de la pression permanente, ou quasi permanente d’un fluide ou d’un matériau solide fluent par des éléments électriques ou magnétiques sensibles à la pressionTransmission ou indication par des moyens électriques ou magnétiques du déplacement des éléments mécaniques sensibles à la pression, utilisés pour mesurer la pression permanente ou quasi permanente d’un fluide ou d’un matériau solide fluent

99.

VAPORIZER AND LIQUID MATERIAL VAPORIZING DEVICE

      
Numéro d'application 18892220
Statut En instance
Date de dépôt 2024-09-20
Date de la première publication 2025-03-27
Propriétaire HORIBA STEC, Co., Ltd. (Japon)
Inventeur(s) Nishiwaki, Keisuke

Abrégé

A vaporizer that heats and vaporizes liquid material includes a spray chamber, a plurality of heating channels, and a tapered portion. The liquid material is sprayed into the spray chamber. The plurality of heating channels extends from the spray chamber to at least an axial direction one side. The tapered portion is tapered off toward the axial direction in a communication portion between the spray chamber and the heating channel.

Classes IPC  ?

  • B01B 1/00 - ÉbullitionAppareils à ébullition en vue d'applications physiques ou chimiques
  • H01L 21/67 - Appareils spécialement adaptés pour la manipulation des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide pendant leur fabrication ou leur traitementAppareils spécialement adaptés pour la manipulation des plaquettes pendant la fabrication ou le traitement des dispositifs à semi-conducteurs ou des dispositifs électriques à l'état solide ou de leurs composants

100.

DISPENSING INSTRUMENT PROVIDED WITH A MEMBER FOR PREVENTING THE REMOVAL OF A TUBE

      
Numéro d'application FR2024051228
Numéro de publication 2025/062102
Statut Délivré - en vigueur
Date de dépôt 2024-09-19
Date de publication 2025-03-27
Propriétaire HORIBA ABX SAS (France)
Inventeur(s) Cremien, Didier

Abrégé

The invention relates to a dispensing instrument (55) comprising: - an elongate body (13) having a cavity extending from a first end (15) to a second end (17), wherein the body (13) further has an opening at the first end (15) and a hole at the second end (17); - a needle (31) partially covered by a sleeve (33) and extending within the cavity, wherein the needle (31) exits the body (13) through the hole; - a tube (7) closed by a cap (9) and accommodated in the cavity such that the cap (9) compresses the sleeve (33) and the needle (31) pierces the sleeve (33), passes through the cap (9) and enters the tube (7); and - a member (11) arranged so as to prevent the removal of the tube (7) by counteracting the return force exerted on the tube (7) by the sleeve (33).

Classes IPC  ?

  • A61B 5/15 - Dispositifs de prélèvement d'échantillons de sang
  • A61B 5/154 - Dispositifs de prélèvement d'échantillons de sang spécialement adaptés pour le prélèvement d'échantillons de sang veineux ou artériel, p. ex. par des seringues utilisant des moyens préalablement mis sous vide
  • B01L 9/06 - Supports de tubes à essaiPorte-tubes à essai
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