HORIBA, Ltd.

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        Patent 1,236
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[Owner] HORIBA, Ltd. 820
HORIBA STEC, Co., Ltd. 339
Horiba Instruments Incorporated 125
Horiba ABX SAS 112
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2025 August 8
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2025 May 16
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IPC Class
G05D 7/06 - Control of flow characterised by the use of electric means 93
G01N 1/22 - Devices for withdrawing samples in the gaseous state 81
G01M 17/007 - Wheeled or endless-tracked vehicles 78
G01N 15/02 - Investigating particle size or size distribution 70
G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence 65
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09 - Scientific and electric apparatus and instruments 190
07 - Machines and machine tools 30
10 - Medical apparatus and instruments 27
42 - Scientific, technological and industrial services, research and design 27
37 - Construction and mining; installation and repair services 25
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Pending 121
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1.

FLUID DEVICE

      
Application Number 19057586
Status Pending
Filing Date 2025-02-19
First Publication Date 2025-08-21
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Horiguchi, Hiroshi

Abstract

According to the present invention, it is possible to fix a fluid resistance element to a flow path while reducing positional displacement or vibration of the fluid resistance element in the flow path. A fixing mechanism that fixes a fluid resistance element to an internal flow path includes: an element holder that holds the fluid resistance element; a holder mounting portion that is formed to communicate with the internal flow path in a flow path block and on which the element holder is mounted; and a seal member interposed between the element holder and the holder mounting portion. In a state where the seal member is crushed by the element holder and a surface facing the element holder in the holder mounting portion, the element holder is positioned and mounted on the holder mounting portion.

IPC Classes  ?

  • G05D 7/06 - Control of flow characterised by the use of electric means
  • G01F 1/34 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure
  • G01F 15/00 - Details of, or accessories for, apparatus of groups insofar as such details or appliances are not adapted to particular types of such apparatus

2.

UCMN

      
Application Number 1870108
Status Registered
Filing Date 2025-06-09
Registration Date 2025-06-09
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Apparatus and instruments for measuring unburnt combustible content in ash, and parts and fittings therefor; apparatus and instruments for measuring and analyzing unburnt combustible content in ash, and parts and fittings therefor; gas measuring and analyzing apparatus and instruments, and parts and fittings therefor; mass concentration measuring apparatus and instruments, and parts and fittings therefor; mass concentration measuring and analyzing apparatus and instruments, and parts and fittings therefor; X-ray fluorescence apparatus and instruments for elemental analysis, and parts and fittings therefor; X-ray fluorescence apparatus and instruments for elemental measurement and analysis, and parts and fittings therefor; computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; computer software for controlling gas measuring and analyzing apparatus and instruments; computer software for controlling mass concentration measuring apparatus and instruments; computer software for controlling mass concentration measuring and analyzing apparatus and instruments; computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; computer software for measuring or testing machines and instruments; computer software for laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair and maintenance of apparatus and instruments for measuring unburnt combustible content in ash; repair and maintenance of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; repair and maintenance of gas measuring and analyzing apparatus and instruments; repair and maintenance of mass concentration measuring apparatus and instruments; repair and maintenance of mass concentration measuring and analyzing apparatus and instruments; repair and maintenance of X-ray fluorescence apparatus and instruments for elemental analysis; repair and maintenance of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; repair and maintenance of measuring or testing machines and instruments; repair and maintenance of laboratory apparatus and instruments; repair and maintenance of electronic machines and apparatus; repair and maintenance of optical machines and apparatus; repair and maintenance of cinematographic machines and apparatus; repair and maintenance of photographic machines and apparatus. Rental of apparatus and instruments for measuring unburnt combustible content in ash; rental of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; rental of gas measuring and analyzing apparatus and instruments; rental of mass concentration measuring apparatus and instruments; rental of mass concentration measuring and analyzing apparatus and instruments; rental of X-ray fluorescence apparatus and instruments for elemental analysis; rental of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of apparatus and instruments for measuring unburnt combustible content in ash; calibration of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; calibration of gas measuring and analyzing apparatus and instruments; calibration of mass concentration measuring apparatus and instruments; calibration of mass concentration measuring and analyzing apparatus and instruments; calibration of X-ray fluorescence apparatus and instruments for elemental analysis; calibration of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of apparatus and instruments for measuring unburnt combustible content in ash; design of apparatus and instruments for measuring and analyzing unburnt combustible content in ash; design of gas measuring and analyzing apparatus and instruments; design of mass concentration measuring apparatus and instruments; design of mass concentration measuring and analyzing apparatus and instruments; design of X-ray fluorescence apparatus and instruments for elemental analysis; design of X-ray fluorescence apparatus and instruments for elemental measurement and analysis; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; design, programming and maintenance of computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; design, programming and maintenance of computer software for controlling gas measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling mass concentration measuring apparatus and instruments; design, programming and maintenance of computer software for controlling mass concentration measuring and analyzing apparatus and instruments; design, programming and maintenance of computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; design, programming and maintenance of computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; design, programming and maintenance of computer software; rental of computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; rental of computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; rental of computer software for controlling gas measuring and analyzing apparatus and instruments; rental of computer software for controlling mass concentration measuring apparatus and instruments; rental of computer software for controlling mass concentration measuring and analyzing apparatus and instruments; rental of computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; rental of computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; rental of computer software; providing on-line non-downloadable computer software for controlling apparatus and instruments for measuring unburnt combustible content in ash; providing on-line non-downloadable computer software for controlling apparatus and instruments for measuring and analyzing unburnt combustible content in ash; providing on-line non-downloadable computer software for controlling gas measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling mass concentration measuring apparatus and instruments; providing on-line non-downloadable computer software for controlling mass concentration measuring and analyzing apparatus and instruments; providing on-line non-downloadable computer software for controlling X-ray fluorescence apparatus and instruments for elemental analysis; providing on-line non-downloadable computer software for controlling X-ray fluorescence apparatus and instruments for elemental measurement and analysis; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

3.

PARTICLE ANALYSIS DEVICE

      
Application Number 18702425
Status Pending
Filing Date 2023-01-17
First Publication Date 2025-08-14
Owner HORIBA, Ltd. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

In order to enable a device to be installed in a limited space on the periphery of a line and to keep a path for transportation of a sample from the line short, the present invention is configured so as to comprise a flow cell through which a sample including particles flows, a light source for radiating light to the particles in the flow cell, a photodetector for detecting secondary light from the particles, and a computation circuit for detecting an autocorrelation function from a light intensity signal outputted from the photodetector and analyzing the autocorrelation function or the particles included in the sample, an optical system unit including the flow cell and the light source, and a control unit including the photodetector and the computation circuit being separate from each other and connected via a light guiding member for guiding the secondary light to the photodetector.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means

4.

LIQUID MATERIAL VAPORIZING DEVICE, METHOD FOR CONTROLLING LIQUID MATERIAL VAPORIZING DEVICE, AND PROGRAM FOR CONTROLLING LIQUID MATERIAL VAPORIZING DEVICE

      
Application Number JP2024045290
Publication Number 2025/169623
Status In Force
Filing Date 2024-12-20
Publication Date 2025-08-14
Owner HORIBA STEC, CO., LTD. (Japan)
Inventor
  • Kawakado, Hajime
  • Oba, Hidenori
  • Taguchi, Akihiro

Abstract

This liquid material vaporizing device comprises: a tank 1 that stores a liquid material and in which the liquid material is vaporized; a supply path R1 that supplies the liquid material to the tank 1; a liquid level detection unit 2 that detects at least a first liquid level that is one of the liquid levels in the tank 1; a valve V1 that is provided in the supply path R1 and opens and closes the supply path R1; and a valve control unit 41 that opens the valve V1 to supply the liquid material to the tank 1 when the liquid level in the tank 1 is less than the first liquid level. The valve control unit 41 provides a closing duration at least once in which the closed state of the valve V1 continues until the liquid level in the tank 1 reaches the first liquid level from a level less than the first liquid level.

IPC Classes  ?

  • B01J 7/00 - Apparatus for generating gases
  • B01J 4/00 - Feed devicesFeed or outlet control devices
  • G05D 7/06 - Control of flow characterised by the use of electric means

5.

APPARATUS AND METHOD FOR TESTING AUTOMATED VEHICLES

      
Application Number 19189329
Status Pending
Filing Date 2025-04-25
First Publication Date 2025-08-07
Owner HORIBA INSTRUMENTS INCORPORATED (USA)
Inventor Breton, Leo Alphonse Gerard

Abstract

A vehicle test system includes a free-wheeling automobile wheel including a rim defining a rim passage, and a bearing that extends through the rim passage such that the bearing is outside the rim to support the free-wheeling automobile wheel and retracts through the rim passage such that the bearing is inside the rim.

IPC Classes  ?

  • G01M 17/013 - Wheels
  • G07C 5/08 - Registering or indicating performance data other than driving, working, idle, or waiting time, with or without registering driving, working, idle, or waiting time

6.

ENERGY ANALYSIS DEVICE, ENERGY MANAGEMENT SYSTEM, ENERGY ANALYSIS PROGRAM, AND ENERGY ANALYSIS METHOD

      
Application Number JP2025002590
Publication Number 2025/164611
Status In Force
Filing Date 2025-01-28
Publication Date 2025-08-07
Owner HORIBA, LTD. (Japan)
Inventor
  • Higa, Kazushi
  • Iwao, Keijiro
  • Shiomi, Kenji
  • Kakino, Toru

Abstract

The present invention enables efficient efforts for energy saving by analyzing electric power consumption data of a plurality of electric power supply facilities, the invention comprising: an electric power consumption data acquisition unit that acquires electric power consumption data of each of a plurality of electric power supply facilities for supplying electric power to a plurality of energy demand facilities; an electric power supply pattern model generation unit that performs multivariate analysis on the electric power consumption data, and generates an electric power supply pattern profile in which the plurality of electric power supply facilities are respectively classified into a plurality of electric power fluctuation patterns and/or an electric power supply pattern operation state sequence indicating operation states over time of the electric power supply pattern profile; and an electric power load amount calculation unit that, on the basis of the electric power supply pattern profile and/or the electric power supply pattern operation state sequence, calculates the electric power load amount of a plurality of energy demand facilities or the plurality of electric power supply facilities corresponding to the plurality of electric power fluctuation patterns, or the electric power load amount over time corresponding to the plurality of electric power fluctuation patterns.

IPC Classes  ?

  • H02J 13/00 - Circuit arrangements for providing remote indication of network conditions, e.g. an instantaneous record of the open or closed condition of each circuitbreaker in the networkCircuit arrangements for providing remote control of switching means in a power distribution network, e.g. switching in and out of current consumers by using a pulse code signal carried by the network
  • G06Q 50/06 - Energy or water supply

7.

GAS-LIQUID MIXER AND LIQUID MATERIAL VAPORIZER

      
Application Number 19041070
Status Pending
Filing Date 2025-01-30
First Publication Date 2025-08-07
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Hirai, Soichiro
  • Nishiwaki, Keisuke

Abstract

To reduce pressure loss in a gas-liquid mixer, provided is a main body block for mixing together a liquid material and a carrier gas, and a control valve disposed in the main body block that adjusts a flow rate of the liquid material. An annular liquid material supply groove having a supply port for the liquid material formed in an inner surface thereof, and an annular gas-liquid mixing groove having a supply port for the carrier gas and a discharge port for the gas-liquid mixture formed in an inner surface thereof are formed in a valve seat portion of the main body block which the control valve is either in contact with or is separated from. One of either the liquid material supply groove or the gas-liquid mixing groove is formed on an inner side of the other of the liquid material supply groove or the gas-liquid mixing groove.

IPC Classes  ?

  • B01F 35/83 - Forming a predetermined ratio of the substances to be mixed by controlling the ratio of two or more flows, e.g. using flow sensing or flow controlling devices
  • B01F 23/213 - Mixing gases with liquids by introducing liquids into gaseous media by spraying or atomising of the liquids
  • B01F 35/90 - Heating or cooling systems

8.

PLASMA GENERATOR AND COOLING JACKET

      
Application Number 19041307
Status Pending
Filing Date 2025-01-30
First Publication Date 2025-08-07
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Watanabe, Yoshio

Abstract

A plasma generator includes: a microwave-generating source that generates a microwave; a cylindrical plasma generation tube through which a gas to be plasmatized by the microwave flows; a waveguide that transmits the microwave to the plasma generation tube; a matching device provided to the waveguide between the microwave-generating source and the plasma generation tube; a cooling jacket that is provided on an outer peripheral surface of the plasma generation tube for cooling; and a cylindrical casing that houses the plasma generation tube and the cooling jacket. The cooling jacket includes: three slits that extend along a traveling direction of the gas flowing through the plasma generation tube, or along a direction inclined with respect to the traveling direction, and through which the microwave passes toward the plasma generation tube; and a cooling channel that is provided between the slits adjacent to each other, and through which a cooling fluid flows.

IPC Classes  ?

  • H01J 37/32 - Gas-filled discharge tubes
  • H01J 37/244 - DetectorsAssociated components or circuits therefor

9.

MULTI-TRACK RAMAN ANALYZER

      
Application Number US2025013122
Publication Number 2025/160520
Status In Force
Filing Date 2025-01-27
Publication Date 2025-07-31
Owner HORIBA INSTRUMENTS INCORPORATED (USA)
Inventor
  • Vezard, Nicolas
  • Tuladhar, Aashish
  • George, Chris

Abstract

A spectroscopy system simultaneously obtains Raman measurements from multiple samples or multiple areas of a liquid or solid sample. At least two Raman probes simultaneously acquire spectra from the sample(s) using an imaging spectrometer having a single shared two-dimensional scientific CMOS sensor. Each probe is coupled to a laser, which may be integrated into the probe, and the spectrometer and includes a lens focusing laser light within or on the sample and collecting light from the sample for the spectrometer. The spectrometer images light from multiple probes simultaneously on the scientific CMOS sensor, spaced from one another to reduce crosstalk. A sample positioning device and a probe positioning mechanism may provide relative movement between samples or sample areas and the probes to acquire data from a different subset of samples or sample areas, and may also adjust probe distance from the sample(s) for desired laser focus spot size and location.

IPC Classes  ?

10.

Flow ratio controller system operating in alternative control modes

      
Application Number 18416713
Grant Number 12399516
Status In Force
Filing Date 2024-01-18
First Publication Date 2025-07-24
Grant Date 2025-08-26
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Lowery, Patrick
  • Gundlach, Maximilian Martin
  • Yasuda, Tadahiro
  • Price, Andrew

Abstract

A flow ratio controller system includes an inlet receiving a total inlet fluid flow from one or more inlet channels, distribution channels fluidically connected to the inlet and arranged in parallel in a branching flow path downstream of the inlet, and a controller. The distribution channels includes a hybrid distribution channel. The controller selectively operates in alternative control modes including a flow verification control mode and a flow ratio control mode. In the flow verification control mode, the controller calculates a calibrated value for a reference volume using measurements from a mass flow meter in the hybrid distribution channel, then calculates a target channel calibration value for the mass flow meter in the target distribution channel. In the flow ratio control mode, the controller controls each of the distribution channels, including the hybrid channel, according to a respective flow ratio setpoint for each distribution channel.

IPC Classes  ?

  • G05D 11/13 - Controlling ratio of two or more flows of fluid or fluent material characterised by the use of electric means
  • G01F 25/10 - Testing or calibration of apparatus for measuring volume, volume flow or liquid level or for metering by volume of flowmeters

11.

RADIATION DETECTION DEVICE AND RADIATION DETECTOR

      
Application Number 18851523
Status Pending
Filing Date 2023-04-25
First Publication Date 2025-07-10
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Minowa, Hiroki

Abstract

A radiation detection device including an illumination unit illuminating a sample, an irradiation unit irradiating the sample with X-rays and a radiation detection element detecting X-rays generated from the sample is provided with a magnetic field production unit that produces a magnetic field in part of a space from the sample to the radiation detection element and a block that holds the magnetic field production unit. The block is located at a position where light from the illumination unit to the radiation detection element is shielded.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors

12.

RADIATION DETECTION ELEMENT, RADIATION DETECTOR, RADIATION DETECTION DEVICE, AND METHOD FOR MANUFACTURING RADIATION DETECTION ELEMENT

      
Application Number 18681896
Status Pending
Filing Date 2022-08-18
First Publication Date 2025-07-10
Owner HORIBA, LTD. (Japan)
Inventor Ishikura, Koji

Abstract

A radiation detection element includes: a semiconductor part including an incidence surface to which radiations to be detected are incident; a first electrode provided on the incidence surface; and a second electrode that is provided on the incidence surface and is disposed at a position surrounding the periphery of the first electrode. The radiation detection element is a silicon drift-type radiation detection element, and is provided with an insulating protective film that covers the second electrode.

IPC Classes  ?

  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • H10F 39/00 - Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group , e.g. radiation detectors comprising photodiode arrays
  • H10F 39/18 - Complementary metal-oxide-semiconductor [CMOS] image sensorsPhotodiode array image sensors

13.

CONVEYANCE DEVICE, ANALYSIS SYSTEM, PROGRAM FOR CONVEYANCE DEVICE, AND CONVEYANCE METHOD

      
Application Number 18853181
Status Pending
Filing Date 2023-03-31
First Publication Date 2025-07-10
Owner HORIBA, Ltd. (Japan)
Inventor
  • Tatewaki, Yasuhiro
  • Mori, Tetsuya

Abstract

To provide a conveyance device that is more user-friendly than conventional devices, and further enhance workability, a conveyance device that conveys a container accommodating a sample to an analysis device includes: a pallet in which a plurality of installation portions is provided, the container being installed in the installation portions; sensors that are provided for the respective installation portions in one-to-one correspondence, and acquire container information that is information obtained when the container is installed; a conveyance unit that picks up the container installed in the pallet, and conveys the container to the analysis device; and a conveyance control unit that causes the conveyance unit to pick up the container in accordance with a pick-up order determined on the basis of the container information.

IPC Classes  ?

  • G01N 35/04 - Details of the conveyor system
  • B65G 1/137 - Storage devices mechanical with arrangements or automatic control means for selecting which articles are to be removed
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

14.

ION ANALYSIS DEVICE AND ION ANALYSIS METHOD

      
Application Number JP2024041993
Publication Number 2025/142287
Status In Force
Filing Date 2024-11-27
Publication Date 2025-07-03
Owner
  • HORIBA ADVANCED TECHNO, CO., LTD. (Japan)
  • HORIBA, LTD. (Japan)
Inventor
  • Miyamura, Kazuhiro
  • Kido, Masanori
  • Okada, Yoichi
  • Yamashita, Tsubasa

Abstract

Provided is an ion analysis device capable of performing measurements using a sample liquid with a smaller liquid volume than conventional methods. The ion analysis device comprises: a measurement electrode provided with a response unit which responds to ions; a reference electrode provided with a liquid junction section; a measurement flow path in which the response membrane and the liquid junction section are disposed; and a calculation unit that calculates the ion concentration in the sample liquid on the basis of the potential difference between the measurement electrode and the reference electrode, the device further comprising a hydrophilic section connecting the response unit and the liquid junction section inside the measurement flow path.

IPC Classes  ?

  • G01N 27/416 - Systems
  • G01N 27/28 - Electrolytic cell components
  • G01N 27/30 - Electrodes, e.g. test electrodesHalf-cells
  • H01M 8/02 - Fuel cellsManufacture thereof Details
  • H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
  • H01M 8/0444 - ConcentrationDensity

15.

GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM FOR GAS ANALYSIS DEVICE

      
Application Number JP2024043601
Publication Number 2025/142454
Status In Force
Filing Date 2024-12-10
Publication Date 2025-07-03
Owner HORIBA, LTD. (Japan)
Inventor
  • Mizutani, Naoto
  • Nakamura, Kentaro

Abstract

This gas analysis device is for analyzing a target gas containing hydrogen gas that is a main component and at least one impurity gas that is a sub-component. The gas analysis device comprises: a comparison chamber where a first resistance element that has a constant current flowing therethrough and that generates heat is disposed, and where hydrogen gas is introduced into; a measurement chamber where a second resistance element that has a constant current flowing therethrough and that generates heat is disposed, and where the target gas is introduced into; a bridge circuit that is formed by comprising the first resistance element and the second resistance element in a closed circuit and that detects the resistivity of the second resistance element or a related value thereof; a calibration curve data storage unit that is for storing calibration curve data that indicates, using the hydrogen gas as a base gas and a predetermined single component gas other than the hydrogen gas as a span gas, the relationship between the resistivity of the second resistance element detected by the bridge circuit or a related value thereof and the concentration of the span gas; and a concentration calculation unit for estimating the total concentration of the impurity gas in the target gas in terms of a gas component in which the thermal conductivity is greater than or equal to that of oxygen, on the basis of the calibration curve data and the resistivity of the second resistance element detected by the bridge circuit or the related value thereof.

IPC Classes  ?

  • G01N 25/18 - Investigating or analysing materials by the use of thermal means by investigating thermal conductivity
  • G01N 27/12 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon absorption of a fluidInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating impedance by investigating resistance of a solid body in dependence upon reaction with a fluid

16.

MEASUREMENT PROBE, MEASUREMENT PROBE UNIT, MEASUREMENT DEVICE, AND MEASUREMENT METHOD

      
Application Number JP2024044569
Publication Number 2025/142627
Status In Force
Filing Date 2024-12-17
Publication Date 2025-07-03
Owner HORIBA, LTD. (Japan)
Inventor Wakabayashi Satoru

Abstract

Provided is a measurement probe for realizing a measurement device capable of measuring characteristic values of biopolymers, such as protein, in real time at a lower concentration than conventional devices. The measurement probe is used by being connected to a light source and a detector by means of an optical fiber, and comprises: a cylindrical housing having a first port and a second port formed at one end, the first port introducing light from a first optical fiber and outputting light to the first optical fiber, and the second port outputting light to a second optical fiber; a reflective member that is located inside the housing, is provided at an end of the housing on the opposite side to the end at which the first port and the second port are formed, and reflects and refracts light introduced from the first port toward the second port; and a measurement target liquid accommodating portion formed between two window members that are disposed on an output optical path passing between the reflective member and the second port.

IPC Classes  ?

  • G01N 21/01 - Arrangements or apparatus for facilitating the optical investigation
  • G01N 21/47 - Scattering, i.e. diffuse reflection
  • G01N 21/59 - Transmissivity
  • G01N 21/64 - FluorescencePhosphorescence

17.

END POINT DETECTION DEVICE, ETCHING CONTROL SYSTEM, END POINT DETECTION METHOD, AND END POINT DETECTION PROGRAM

      
Application Number 18999366
Status Pending
Filing Date 2024-12-23
First Publication Date 2025-07-03
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Imanishi, Michie
  • Hada, Miyako
  • Sakaguchi, Yuhei
  • Minami, Masakazu
  • Takahashi, Motonobu

Abstract

An end point detection device that detects an end point in etching processing of a multilayer film, includes a measurement unit that measures a physical quantity that changes with the etching processing, an end point detection unit that detects an end point in a target film for which the end point is to be detected using a predetermined detection algorithm based on a measurement value obtained by the measurement unit, and an algorithm change unit that changes the detection algorithm in the film that is being subjected to the etching processing based on the measurement value obtained by the measurement unit when another film of a same type as the target film was being subjected to the etching processing in a same multilayer film as the target film currently being etching processed.

IPC Classes  ?

  • H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components

18.

VEHICLE TESTING SYSTEM, VEHICLE TESTING METHOD, AND VEHICLE TESTING PROGRAM

      
Application Number JP2024043828
Publication Number 2025/142489
Status In Force
Filing Date 2024-12-11
Publication Date 2025-07-03
Owner HORIBA, LTD. (Japan)
Inventor
  • Shiota Aoi
  • Kawazoe Hiroshi

Abstract

This vehicle testing system comprises: a first output pattern acquiring unit that acquires, as a first output pattern, travel data when a target vehicle travels in a prescribed environment; a second output pattern acquiring unit that acquires, as a second output pattern, travel data when a traveling vehicle travels along a prescribed travel route; a data acquiring unit that acquires, from the first output pattern, a plurality of items of similar data and a plurality of items of instantaneous energy consumption data; and a calculating unit that adds up a plurality of instantaneous energy consumptions to calculate a total energy consumption when the target vehicle is assumed to travel along the prescribed travel route.

IPC Classes  ?

19.

FLUORESCENCE MEASUREMENT PROBE, FLUORESCENCE MEASUREMENT PROBE UNIT, AND FLUORESCENCE MEASURING DEVICE

      
Application Number JP2024044582
Publication Number 2025/142635
Status In Force
Filing Date 2024-12-17
Publication Date 2025-07-03
Owner HORIBA, LTD. (Japan)
Inventor Wakabayashi, Satoru

Abstract

Provided is a fluorescence measuring device capable of measuring biopolymers such as proteins in real time at lower concentrations than in conventional devices. This fluorescence measurement probe is used by being connected by an optical fiber to a light source for irradiating a liquid being measured with excitation light and a detector for detecting fluorescence derived from the liquid being measured that is excited by the excitation light from the light source, the fluorescence measurement probe being provided with: a port for introducing the excitation light from the optical fiber and for guiding out fluorescence and scattered light from the liquid being measured to the optical fiber; a condensing optical system for collimating and/or condensing the excitation light, the fluorescence, and the scattered light; a polarizing plate transparent to the excitation light, the fluorescence, and the scattered light; and a housing for internally accommodating the condensing optical system and the polarizing plate and having an opening portion for injecting the excitation light into the liquid being measured and taking in the fluorescence and the scattered light from the liquid being measured.

IPC Classes  ?

20.

HYDROGEN ELECTROCHEMICAL SYSTEM, METHOD FOR DETERMINING STATE OF HYDROGEN CELL STACK, AND PROGRAM

      
Application Number JP2024045705
Publication Number 2025/142931
Status In Force
Filing Date 2024-12-24
Publication Date 2025-07-03
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga Shimpachi
  • Higa Kazushi
  • Yamashita Tsubasa

Abstract

In the present invention, a hydrogen electrochemical system 100 comprises an acquisition unit 541, a storage unit 53, and a determination unit 544. The acquisition unit 541 acquires at least distribution information Ds2, De2, and Dt2 indicating the distribution of a physical quantity Q in a hydrogen cell stack 1. In the hydrogen cell stack 1, water is generated by an electrochemical reaction in which hydrogen is used, or vice versa. The storage unit 53 stores correlation data Dc. The correlation data Dc indicates a correlation between the state of the hydrogen cell stack 1 and a feature amount φ that is converted from at least the information Ds2 and De2 regarding the distribution in the hydrogen cell stack 1 in a state including a normal state and one or more abnormal states. On the basis of the correlation information Dc, the determination unit 544 determines the state of the hydrogen cell stack 1 from at least the distribution information Dt2 of the hydrogen cell stack 1 in operation.

IPC Classes  ?

  • H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
  • C25B 1/04 - Hydrogen or oxygen by electrolysis of water
  • C25B 9/00 - Cells or assemblies of cellsConstructional parts of cellsAssemblies of constructional parts, e.g. electrode-diaphragm assembliesProcess-related cell features
  • C25B 15/025 - Measuring, analysing or testing during electrolytic production of electrolyte parameters
  • C25B 15/027 - Temperature
  • H01M 8/10 - Fuel cells with solid electrolytes
  • H01M 8/0432 - TemperatureAmbient temperature
  • H01M 8/04492 - HumidityAmbient humidityWater content
  • H01M 8/04664 - Failure or abnormal function
  • H01M 8/04992 - Processes for controlling fuel cells or fuel cell systems characterised by the implementation of mathematical or computational algorithms, e.g. feedback control loops, fuzzy logic, neural networks or artificial intelligence

21.

CLEANING DEVICE AND SUBSTRATE PROCESSING SYSTEM

      
Application Number JP2024044607
Publication Number 2025/142639
Status In Force
Filing Date 2024-12-17
Publication Date 2025-07-03
Owner HORIBA STEC, CO., LTD. (Japan)
Inventor Watanabe Yoshio

Abstract

This cleaning device 100 for separating an inflow gas Go and particles that are contained in the gas Go includes a housing 1, a plate-shaped baffle 2, and a plurality of plasma units 5. The housing 1 has a cylindrical shape extending in the axial direction Da, and has an inflow port 121 and an outflow port 131 for the gas Go. The baffle 2 is disposed within the housing 1. The plasma units 5 generate plasma within the housing 1. The inside of the housing 1 has a plurality of internal spaces 14, and is configured so that the gas Go flowing thereinto from the inflow port 121 can flow out from the outflow port 131. Some internal spaces 14 adjacent to each other are connected so that the gas Go can flow therethrough. At least some adjacent internal spaces 14 are adjacent to each other by the intermediary of the baffle 2. The plasma units 5 are disposed with respect to at least two internal spaces 14.

IPC Classes  ?

  • C23C 16/44 - Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
  • C23C 14/00 - Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
  • H01L 21/31 - Treatment of semiconductor bodies using processes or apparatus not provided for in groups to form insulating layers thereon, e.g. for masking or by using photolithographic techniquesAfter-treatment of these layersSelection of materials for these layers
  • H01L 21/205 - Deposition of semiconductor materials on a substrate, e.g. epitaxial growth using reduction or decomposition of a gaseous compound yielding a solid condensate, i.e. chemical deposition
  • H01L 21/3065 - Plasma etchingReactive-ion etching
  • H05H 1/46 - Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy

22.

PRESSURE FLOW RATE SENSOR, FLOW RATE CALCULATION DEVICE, FLOW RATE CALCULATION METHOD, FLOW RATE CALCULATION PROGRAM, AND FLUID CONTROL DEVICE

      
Application Number 18990774
Status Pending
Filing Date 2024-12-20
First Publication Date 2025-06-26
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Yokoi, Shuntaro

Abstract

The present invention is configured to calculate a flow rate across a wide range of flow rate, from a low range to a high range, and includes: a fluid resistance element provided to a channel; an upstream pressure sensor that detects an upstream pressure with respect to the fluid resistance element; a downstream pressure sensor that detects a downstream pressure with respect to the fluid resistance element; and a flow rate calculation unit that calculates a flow rate based on the upstream pressure and the downstream pressure, in which the flow rate calculation unit calculates the flow rate based on viscous resistance, inertial resistance, and a degree of effect of rarefaction.

IPC Classes  ?

  • G01F 1/36 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure the pressure or differential pressure being created by the use of flow constriction

23.

FLUID CONTROL VALVE, FLUID CONTROL DEVICE, AND FLUID CONTROL VALVE MANUFACTURING METHOD

      
Application Number 18852129
Status Pending
Filing Date 2023-03-27
First Publication Date 2025-06-26
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Shakudo, Kazuya

Abstract

The present invention improves the sealability of a fluid control valve, and includes a valve seat having a flat valve seat surface and a valve plug having a flat sitting surface sitting on the valve seat surface. A first surface that is one of the valve seat surface and the sitting surface has a surface hardness higher than a surface hardness of a second surface that is the other one of the valve seat surface and the sitting surface.

IPC Classes  ?

  • F16K 1/42 - Valve seats
  • F16K 1/54 - Arrangements for modifying the way in which the rate of flow varies during the actuation of the valve
  • F16K 37/00 - Special means in or on valves or other cut-off apparatus for indicating or recording operation thereof, or for enabling an alarm to be given

24.

PARTICLE NUMBER MEASUREMENT SYSTEM, BRAKE INSPECTION SYSTEM, AND PARTICLE NUMBER MEASUREMENT METHOD

      
Application Number JP2024036850
Publication Number 2025/134506
Status In Force
Filing Date 2024-10-16
Publication Date 2025-06-26
Owner HORIBA, LTD. (Japan)
Inventor
  • Kitahara, Takahiro
  • Fukushima, Suguru

Abstract

The present invention reduces the cost for introducing a particle number measurement system, and reduces the difference between the uncertainty in measurement of the number of solid particles and the uncertainty in measurement of the total number of particles. The present invention comprises: a first diluter for diluting a sample gas; an evaporator for vaporizing volatile particles contained in the sample gas diluted by the first diluter; a second diluter for diluting the sample gas that has passed through the evaporator; a first particle number measurement device for measuring the number of particles contained in the sample gas diluted by the second diluter as the number of solid particles obtained by removing the volatile particles; and a second particle number measurement device for measuring the number of particles contained in the sample gas that has been diluted by the first diluter and is yet to pass through the evaporator as the total number of particles including the volatile particles.

IPC Classes  ?

  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G01N 1/02 - Devices for withdrawing samples
  • G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials

25.

PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT DEVICE

      
Application Number JP2024042708
Publication Number 2025/134758
Status In Force
Filing Date 2024-12-03
Publication Date 2025-06-26
Owner HORIBA, LTD. (Japan)
Inventor Sugasawa, Hirosuke

Abstract

The present invention is a particle size distribution measurement device, wherein is provided a history data management part 33 that facilitates integrated recognition of various stored operations, states of devices, and instantaneous values of particle size measurement results, and that causes a history data storage part D1 to store an operation history indicating the history of operations performed on the particle size distribution measurement device 100 by an operator, a measurement result history indicating the history of particle size measurement results, or a device state history indicating the history of the state of the particle size distribution measurement device 100, in a format that can be displayed as a time-series graph.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means

26.

PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE SIZE DISTRIBUTION MEASUREMENT PROGRAM

      
Application Number JP2024043046
Publication Number 2025/134788
Status In Force
Filing Date 2024-12-05
Publication Date 2025-06-26
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

This particle size distribution measurement system comprises: a cell that accommodates a test liquid containing particles; a test liquid supply unit that samples the test liquid from a generation flow passage through which the test liquid flows, and supplies the test liquid to the cell via a flow passage; a particle size distribution measurement unit that measures the particle size distribution of the particles by irradiating the test liquid with light and detecting scattered light produced from the particles; a cleaning liquid supply unit that, after the measurement of the particle size distribution is complete, supplies a cleaning liquid to the cell via a flow passage, said cleaning liquid being a liquid that cleans the cell; and a contamination determination unit that determines contamination of the cell on the basis of transmitted light and/or scattered light from the cell during a condition in which the cleaning liquid is supplied to the cell.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means
  • G01N 1/00 - SamplingPreparing specimens for investigation
  • G01N 21/15 - Preventing contamination of the components of the optical system or obstruction of the light path

27.

INFORMATION PROCESSING METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2024041560
Publication Number 2025/134691
Status In Force
Filing Date 2024-11-25
Publication Date 2025-06-26
Owner HORIBA, LTD. (Japan)
Inventor Murata, Shunsuke

Abstract

Provided are an information processing method, an information processing device, and a computer program for outputting a response corresponding to a request of a user with respect to an analysis device. In the present invention, a query pertaining to an analysis device is acquired, a language generation model is used to acquire a response pertaining to control of the analysis device corresponding to the query, and the response is output.

IPC Classes  ?

  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

28.

RADIATION DETECTION DEVICE, CONTROL METHOD, AND COMPUTER PROGRAM

      
Application Number JP2024041367
Publication Number 2025/126801
Status In Force
Filing Date 2024-11-22
Publication Date 2025-06-19
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Bamba, Tomohiro

Abstract

Provided are a radiation detection device, a control method, and a computer program capable of appropriately adjusting the temperature of a radiation detection element. The radiation detection device comprises: a sample chamber inside which a sample is disposed; a radiation detection element that is disposed inside the sample chamber and is for detecting radiation generated from the sample; an atmosphere adjustment unit that adjusts the atmosphere inside the sample chamber to either a state in which the inside of the sample chamber is depressurized or a state in which a predetermined gas is introduced into the sample chamber; a temperature adjustment unit that adjusts the temperature of the radiation detection element; and a control unit. When the atmosphere adjustment unit adjusts the atmosphere inside the sample chamber to the state in which the predetermined gas is introduced, the control unit causes the temperature adjustment unit to adjust the temperature of the radiation detection element to a higher temperature than when the atmosphere adjustment unit adjusts the atmosphere inside the sample chamber to the state in which the inside of the sample chamber is depressurized.

IPC Classes  ?

  • H01J 37/244 - DetectorsAssociated components or circuits therefor
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01T 7/00 - Details of radiation-measuring instruments
  • H01J 37/252 - Tubes for spot-analysing by electron or ion beamsMicroanalysers

29.

XTROLOGY

      
Application Number 1859351
Status Registered
Filing Date 2025-04-03
Registration Date 2025-04-03
Owner HORIBA STEC, Co., Ltd. (Japan)
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Semiconductor wafer inspection apparatus; analyzing apparatus for defect of semiconductor wafers; analyzing apparatus for stress of semiconductor wafers; analyzing apparatus for composition of semiconductor wafers; semiconductor wafer measuring apparatus; semiconductor wafer testing apparatus; semiconductor photomask inspection apparatus; analyzing apparatus for defect of semiconductor photomasks; analyzing apparatus for stress of semiconductor photomasks; analyzing apparatus for composition of semiconductor photomasks; semiconductor photomask measuring apparatus; semiconductor photomask testing apparatus; semiconductor reticle inspection apparatus; analyzing apparatus for defect of semiconductor reticles; analyzing apparatus for stress of semiconductor reticles; analyzing apparatus for composition of semiconductor reticles; semiconductor reticle measuring apparatus; semiconductor reticle testing apparatus; semiconductor substrate inspection apparatus; analyzing apparatus for defect of semiconductor substrates; analyzing apparatus for stress of semiconductor substrates; analyzing apparatus for composition of semiconductor substrates; semiconductor substrate measuring apparatus; semiconductor substrate testing apparatus; sensors for mapping semiconductor wafers; Raman spectrographic measurement apparatus, and parts and accessories therefor; Raman spectroscopic analyzing apparatus, and parts and accessories therefor; measuring apparatus for measuring film thickness; measuring apparatus for spectral measurements; automated optical inspection apparatus; X-ray fluorescence measuring apparatus; measuring or testing machines and instruments, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrometers, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrographs, and parts and accessories therefor; optical machines and apparatus; photographic machines and apparatus; cinematographic machines and apparatus; laboratory apparatus and instruments; computer software for inspection, defect analysis, stress analysis, composition analysis, measurement and testing of semiconductor wafers, photomasks, reticles and substrates; computer software; computer programs; scanning probe microscopes; X-ray fluorescence analyzing apparatus; electronic computer and data processing machines and apparatus and their parts; power distribution or control machines and apparatus; rotary converters; phase modifiers; batteries and cells; electric or magnetic meters and testers; electric wires and cables; spectacles [eyeglasses and goggles]; life-saving apparatus and equipment; telecommunication machines and apparatus; fire alarms; gas alarms; water leak alarms; oil leak alarms; anti-theft warning apparatus.

30.

ELECTROSTATIC CHUCK DEVICE AND COOLING PLATE

      
Application Number 18956305
Status Pending
Filing Date 2024-11-22
First Publication Date 2025-06-12
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Gonzalez, Esteban
  • Nayak, Ajayaketan
  • Yasuda, Tadahiro

Abstract

The present invention is an electrostatic chuck device which makes a temperature of a target object clamped to a clamping plate uniform and clamps the target object via an electrostatic force, including: a clamping plate having a clamping surface that clamps a target object to its front surface side; and a cooling plate which is provided on a back surface side of the clamping plate and which has an internal flow channel through which a coolant flows, in which the internal flow channel forms a flow channel geometry in which flow channel elements of an identical pattern in a plan view are systematically connected.

IPC Classes  ?

  • H01L 21/683 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for supporting or gripping
  • H01J 37/32 - Gas-filled discharge tubes

31.

BATTERY CHARGING DEVICE, BATTERY CHARGING METHOD, AND BATTERY CHARGING PROGRAM

      
Application Number JP2024041531
Publication Number 2025/121172
Status In Force
Filing Date 2024-11-22
Publication Date 2025-06-12
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Shimpachi
  • Tatsukawa, Shogo

Abstract

The present invention is for efficiently measuring internal resistance for use as a battery degradation index during battery charging, and comprises: a battery charging unit 2 that supplies charging current and/or voltage to a battery B; a battery management unit 3 that manages the charging state of the battery B; a pulse signal generation unit 4 that superimposes, at one or more charging points corresponding to the charging state of the battery B, pulse current or voltage on the charging current or voltage and supplies the same to the battery; an internal resistance calculation unit 5 that calculates the internal resistance of the battery B on the basis of the current value and the voltage value of the battery obtained when charging power superposed with pulse power has been supplied; and a data management unit 6 that records, in a memory, the internal resistance calculated by the internal resistance calculation unit 5.

IPC Classes  ?

  • H02J 7/10 - Regulation of the charging current or voltage using discharge tubes or semiconductor devices using semiconductor devices only
  • G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
  • G01R 31/385 - Arrangements for measuring battery or accumulator variables
  • G01R 31/389 - Measuring internal impedance, internal conductance or related variables
  • G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
  • H01M 10/44 - Methods for charging or discharging
  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
  • H02J 7/00 - Circuit arrangements for charging or depolarising batteries or for supplying loads from batteries

32.

MULTI-TRACK RAMAN ANALYZER

      
Application Number 19037340
Status Pending
Filing Date 2025-01-27
First Publication Date 2025-06-12
Owner HORIBA INSTRUMENTS INCORPORATED (USA)
Inventor
  • Vezard, Nicolas
  • Tuladhar, Aashish
  • George, Chris

Abstract

A spectroscopy system simultaneously obtains Raman measurements from multiple samples or multiple areas of a liquid or solid sample. At least two Raman probes simultaneously acquire spectra from the sample(s) using an imaging spectrometer having a single shared two-dimensional scientific CMOS sensor. Each probe is coupled to a laser, which may be integrated into the probe, and the spectrometer and includes a lens focusing laser light within or on the sample and collecting light from the sample for the spectrometer. The spectrometer images light from multiple probes simultaneously on the scientific CMOS sensor, spaced from one another to reduce crosstalk. A sample positioning device and a probe positioning mechanism may provide relative movement between samples or sample areas and the probes to acquire data from a different subset of samples or sample areas, and may also adjust probe distance from the sample(s) for desired laser focus spot size and location.

IPC Classes  ?

  • G01J 3/44 - Raman spectrometryScattering spectrometry
  • G01J 3/02 - SpectrometrySpectrophotometryMonochromatorsMeasuring colours Details
  • G01J 3/12 - Generating the spectrumMonochromators
  • G01N 21/65 - Raman scattering

33.

VAPORIZATION DEVICE, MATERIAL STATE DETERMINATION DEVICE, MATERIAL STATE DETERMINATION METHOD FOR VAPORIZATION DEVICE, AND MATERIAL STATE DETERMINATION PROGRAM FOR VAPORIZATION DEVICE

      
Application Number 18956405
Status Pending
Filing Date 2024-11-22
First Publication Date 2025-06-12
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Ikeyama, Toshihiro
  • Watanabe, Takao

Abstract

A vaporizer that vaporizes a material, a flow rate control device including a flow rate sensor that measures a flow rate of a material gas generated by the vaporizer, and a determination unit that determines that the material gas has returned to a state before the vaporization on the basis of a transient response of the flow rate measured by the flow rate sensor are included.

IPC Classes  ?

  • G05D 7/06 - Control of flow characterised by the use of electric means
  • G01F 1/68 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using thermal effects
  • G01N 11/02 - Investigating flow properties of materials, e.g. viscosity or plasticityAnalysing materials by determining flow properties by measuring flow of the material

34.

PARTICLE ANALYZING DEVICE, PARTICLE ANALYSIS METHOD, AND PARTICLE ANALYSIS PROGRAM

      
Application Number 18841496
Status Pending
Filing Date 2023-03-02
First Publication Date 2025-06-05
Owner HORIBA, Ltd. (Japan)
Inventor Tatewaki, Yasuhiro

Abstract

In analysis of a particle by a PTA method, in order to enable each particle to be analyzed for each type while suppressing increase in size and cost of a device even in a case where excitation wavelengths of fluorescent markers or particles having property of autofluorescence overlap each other, a light irradiation unit (2) that irradiates a sample emitting fluorescence of a plurality of colors with excitation light, one or a plurality of filters (5) that transmits the fluorescence of the plurality of colors while cutting off excitation light, an imaging unit (3) having color identification ability to image fluorescence passing through the filter (5), and an analysis unit (43) that obtains a diffusion rate due to Brownian motion of a particle included in a sample from image data of fluorescence obtained by the imaging unit (3) and analyzes physical property of the particle are included.

IPC Classes  ?

35.

SAMPLE CARRIER AND SAMPLE ANALYSIS SYSTEM

      
Application Number JP2024038894
Publication Number 2025/115509
Status In Force
Filing Date 2024-10-31
Publication Date 2025-06-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Kawakami, Shun
  • Park, Sangwoon

Abstract

This sample carrier is used in a sample analyzer for extracting and analyzing a component, as a gas, generated by heating a measurement sample, and is detachably attached to a predetermined sample input position provided to the sample analyzer. The sample carrier comprises: a container body which has an accommodation chamber for accommodating the measurement sample therein, and which has formed on the bottom surface thereof a sample outlet port for discharging the measurement sample in the accommodation chamber; a bottom plate which is rotatably attached to a bottom part of the container body through a seal member, and on which through-holes are formed in a manner opening to the upper surface and the lower surface; and a distance adjustment mechanism for adjusting an inter-surface distance between the upper surface of the bottom plate and the bottom surface of the container body. The sample carrier is configured such that, by having one of the container body and the bottom plate rotate with respect to the other, the sample outlet port moves between: a predetermined sealed position where the sample outlet port is blocked by the upper surface of the bottom plate and the accommodating chamber is sealed airtight; and an open position where the sample outlet port opens to the through-holes of the bottom plate and the measurement sample can be discharged. The distance adjustment mechanism adjusts an inter-surface distance while the sample outlet port is moving between the sealed position and the open position so as to be longer than the inter-surface distance when the sample outlet port is at the sealed position.

IPC Classes  ?

  • G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods using combustion
  • G01N 1/00 - SamplingPreparing specimens for investigation

36.

PROCESSING ADJUSTING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING SYSTEM, PROCESSING ADJUSTING METHOD, AND PROCESSING ADJUSTING PROGRAM

      
Application Number JP2024040665
Publication Number 2025/115654
Status In Force
Filing Date 2024-11-15
Publication Date 2025-06-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

This processing adjusting device is for adjusting processes in a particle size distribution measuring system comprising a particle size distribution measuring unit that measures the particle size distribution of a sample, and a sample supply unit that samples the sample and supplies the sample to the particle size distribution measuring unit, the processing adjusting device comprising: a sampling interval accepting unit that accepts a sampling interval, which is a time from the start of a sampling process for sampling the sample to the start of the next sampling process; and a process time adjusting unit that, if the sampling interval accepted by the sampling interval accepting unit is equal to or less than a prescribed value, adjusts the processing time of at least one of the sampling process for sampling the sample, a measuring process for measuring the particle size distribution of the sample, a cleaning process for cleaning the particle size distribution measuring unit or the sample supply unit, and a standby process for waiting until the start of the next sampling process.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means
  • G01N 1/00 - SamplingPreparing specimens for investigation
  • G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

37.

INVERTAU

      
Application Number 1858474
Status Registered
Filing Date 2025-04-28
Registration Date 2025-04-28
Owner HORIBA Instruments Incorporated (USA)
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Fluorescence spectrometers; scientific apparatus and instruments for optical analysis, namely, spectrometers, photoluminescence and fluorescence spectrometers; apparatus and instruments for photoluminescence lifetime measurement and spectrographs; microscopes; confocal microscopes for performing fluorescence lifetime imaging (FLIM); microscopes for capturing and analyzing fluorescence decay profiles for use in measuring molecular interactions, local environmental conditions, and biological parameters including FRET, pH, viscosity, binding efficiency, and temperature.

38.

PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PARTICLE SIZE DISTRIBUTION MEASUREMENT PROGRAM

      
Application Number JP2024040664
Publication Number 2025/115653
Status In Force
Filing Date 2024-11-15
Publication Date 2025-06-05
Owner HORIBA, LTD. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya

Abstract

This particle size distribution measurement system comprises: a particle size distribution measurement unit that measures the particle size distribution of specimens; a specimen supply unit that samples the specimens and supplies the sampled specimens to the particle size distribution measurement unit through a flow path through which the sampled specimens flow; and an arrival time calculation unit that calculates, on the basis of flow path information that is information about the flow path, an arrival time that is the period of time from when the specimens are sampled to when the specimens reach the particle size distribution measurement unit.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means
  • G01N 1/00 - SamplingPreparing specimens for investigation
  • G01N 1/10 - Devices for withdrawing samples in the liquid or fluent state
  • G01N 15/00 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials
  • G01N 15/0227 - Investigating particle size or size distribution by optical means using imagingInvestigating particle size or size distribution by optical means using holography

39.

DEVICE AND METHOD FOR PRODUCING A CONCENTRATED REAGENT FROM A SOLID SUBSTANCE

      
Application Number FR2024051558
Publication Number 2025/114665
Status In Force
Filing Date 2024-11-26
Publication Date 2025-06-05
Owner HORIBA ABX SAS (France)
Inventor
  • Donnarumma, Dario
  • Couderc, Guilhem

Abstract

The invention relates to a device (1) for producing a concentrated reagent, comprising: - a solvent reservoir (3), - a container (5) containing a solid substance having a solubility in water at 20°C of greater than or equal to 340 g/l, - a pump (9), and - a production circuit (11) including a first line (13) provided with a first valve (15) and a second line (17) provided with a second valve (19). The pump (9) is fluidically connected to the reservoir (3) and to the container (5) respectively by the first line (13) and the second line (17). The pump (9) makes it possible to take solvent from the reservoir (3) and then deliver it to the container (5) such that a concentrated reagent is produced therein by dissolving at least a portion of the solid substance in the solvent.

IPC Classes  ?

  • G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
  • B01F 21/20 - Dissolving using flow mixing
  • B01F 21/00 - Dissolving
  • B01F 35/71 - Feed mechanisms
  • B01F 35/75 - Discharge mechanisms

40.

DEVICE AND METHOD FOR PERFORMING A COMPLETE BLOOD COUNT AND DETERMINING A SEDIMENTATION RATE

      
Application Number 18856808
Status Pending
Filing Date 2023-04-14
First Publication Date 2025-05-29
Owner HORIBA ABX SAS (France)
Inventor
  • Piedcoq, Philippe
  • Couderc, Guilhem

Abstract

A device for performing a complete blood count and for determining a sedimentation rate comprises a first group (4) arranged so as to sample a blood sample from a tube and to carry out a complete blood count on this sample, characterised in that it comprises a second group (6) arranged so as to sample a blood sample from a tube and to carry out a sedimentation rate determination. This device comprises at least one sampling member (8) which could be controlled for a measurement by the first group (4) and a measurement by the second group (6) for sampling a blood sample so that a sample sampled for the first group (4) is not used by the second group (6), and that a sample sampled for the second group (6) is not used by the first group (4), the second group (6) being provided with a sensor (20) comprising an infrared light source (12) and an optical sensor (14) arranged substantially opposite one another around a tube (16) connected to an outlet end of the at least one sampling member (8) so that the light emitted by the infrared light source (12) reaches the optical sensor (14) after having crossed said tube (16). This device further comprises a converter (10) arranged so as to receive one or more light-transmission measurement(s) from the optical sensor (14) and to determine a sedimentation rate.

IPC Classes  ?

  • G01N 15/05 - Investigating sedimentation of particle suspensions in blood
  • G01N 15/01 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials specially adapted for biological cells, e.g. blood cells
  • G01N 15/14 - Optical investigation techniques, e.g. flow cytometry

41.

MACHINE LEARNING DEVICE, VEHICLE TESTING SYSTEM, MACHINE LEARNING METHOD, AND VEHICLE TESTING METHOD

      
Application Number 18868716
Status Pending
Filing Date 2023-05-15
First Publication Date 2025-05-29
Owner HORIBA, LTD. (Japan)
Inventor
  • Komatsu, Yoji
  • Nagaoka, Makoto

Abstract

The present invention makes it possible to simplify the task of reproducing a load such as a road gradient resistance or the like when a vehicle is actually traveling on a road, and includes a learning data acquisition unit that acquires learning data formed by load data that includes a road gradient resistance of a travel route and driving resistance variables deriving from a vehicle's behavior, and by vehicle traveling data that includes a vehicle's speed, accelerator pedal position, and brake pedal position when that vehicle is traveling on the travel route, and a machine learning unit that employs machine learning to determine a correlation between the load data and the vehicle traveling data, and then creates a simulated gradient prediction model that shows the correlation between the load data and the vehicle traveling data.

IPC Classes  ?

  • G06F 30/27 - Design optimisation, verification or simulation using machine learning, e.g. artificial intelligence, neural networks, support vector machines [SVM] or training a model
  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G06F 119/14 - Force analysis or force optimisation, e.g. static or dynamic forces

42.

DEVICE AND METHOD FOR DETERMINING A SEDIMENTATION RATE

      
Application Number 18856821
Status Pending
Filing Date 2023-04-13
First Publication Date 2025-05-29
Owner HORIBA ABX SAS (France)
Inventor
  • Piedcoq, Philippe
  • Couderc, Guilhem
  • Fudaly, Christophe

Abstract

A device for determining a sedimentation rate comprises at least one member (8) for sampling a blood sample, and a sensor (20) comprising an infrared light source (12) and an optical sensor (14) arranged substantially opposite each other around a substantially transparent portion (16) of the sampling member (8) so that the light emitted by the infrared light source (12) reaches the optical sensor (14) after having passed through said substantially transparent portion (16). The optical sensor (14) is arranged so as to carry out a blank measurement, the device further comprising a converter (10) arranged so as to receive one or more light transmission measurement(s) from the optical sensor (14), to calculate the ratio between the blank measurement and the one or more light transmission measurement(s) and to return a sedimentation rate.

IPC Classes  ?

  • G01N 15/05 - Investigating sedimentation of particle suspensions in blood

43.

Device for spreading or colouring and determining a sedimentation rate

      
Application Number 18856813
Grant Number 12313516
Status In Force
Filing Date 2023-04-13
First Publication Date 2025-05-27
Grant Date 2025-05-27
Owner HORIBA ABX SAS (France)
Inventor
  • Couderc, Guilhem
  • Beauducel, Florent
  • Thoraval, Coralie

Abstract

A device for spreading or colouring and for determining a sedimentation rate includes a first group arranged so as to sample a blood sample from a tube and to carry out a smear test on the sample and a second group arranged so as to sample a blood sample from a tube and to carry out a sedimentation rate determination. At least one sampling member is controllable for an operation by the first group and an operation by the second group for sampling a blood sample so that a sample sampled for one group is not used by the other group. The second group is provided with a sensor. A converter is arranged so as to receive one or more light-transmission measurements from the sensor and to determine a sedimentation rate.

IPC Classes  ?

  • G01N 15/05 - Investigating sedimentation of particle suspensions in blood
  • G01N 1/28 - Preparing specimens for investigation
  • G01N 33/49 - Physical analysis of biological material of liquid biological material blood

44.

FLOW RATE MEASUREMENT MECHANISM AND FLUID CONTROL APPARATUS

      
Application Number 18948860
Status Pending
Filing Date 2024-11-15
First Publication Date 2025-05-22
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Cocciadiferro, Edward
  • Dick, John

Abstract

A fluid resistance element is disposed on a flow path along which flows a fluid, and in which a resistance flow path is formed. A fluid receiving portion is provided on the flow path and is hit by the fluid flowing from upstream of the fluid resistance element so as to cause the fluid to flow to a side. Flexible components support the fluid resistance element and deform in accordance with a flow rate of the fluid. A displacement sensor measures a displacement of the flexible components, and a flow rate calculation unit calculates a flow rate of the fluid based on the displacement. The fluid that is made to flow to the side by the fluid receiving portion flows along the resistance flow path of the fluid resistance element.

IPC Classes  ?

  • G01F 1/38 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure the pressure or differential pressure being created by the use of flow constriction the pressure or differential pressure being measured by means of a movable element, e.g. diaphragm, piston, Bourdon tube or flexible capsule
  • G01F 1/40 - Details of construction of the flow constriction devices

45.

ANALYSIS DEVICE, ANALYSIS SYSTEM, ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2024038226
Publication Number 2025/105150
Status In Force
Filing Date 2024-10-25
Publication Date 2025-05-22
Owner HORIBA, LTD. (Japan)
Inventor Yamaguchi, Kazuki

Abstract

The objective of the present invention is to accurately calculate an amount of particulate matter without being affected by changes in the amount of light emitted onto the particulate matter. An analysis device (100) comprises: a holding member (1) that holds particulate matter (FP); a light source (3) that emits light toward an imaging target area (VA) including a holding area of the holding member (1) in which the particulate matter (FP) is held; a two-dimensional sensor (4) that images the imaging target area (VA); and a calculating unit (5) that calculates particle amount-related information relating to the amount of particulate matter (FP) on the basis of analysis image data acquired by employing the two-dimensional sensor (4) to image the imaging target area (VA) for use in analyzing the particulate matter (FP), and an impact resulting from a change in the amount of light from the light source (3) when the analysis image data were acquired, relative to a reference amount of light.

IPC Classes  ?

  • G01N 15/075 - Investigating concentration of particle suspensions by optical means
  • G01N 1/02 - Devices for withdrawing samples
  • G01N 21/17 - Systems in which incident light is modified in accordance with the properties of the material investigated
  • G06T 7/00 - Image analysis
  • G06V 20/69 - Microscopic objects, e.g. biological cells or cellular parts

46.

PARTICLE ANALYSIS DEVICE, PARTICLE ANALYSIS DEVICE PROGRAM, AND PARTICLE ANALYSIS METHOD

      
Application Number 18841503
Status Pending
Filing Date 2023-03-28
First Publication Date 2025-05-22
Owner HORIBA, Ltd. (Japan)
Inventor
  • Sugasawa, Hirosuke
  • Tatewaki, Yasuhiro
  • Igushi, Tatsuo

Abstract

A particle analysis device can take a fluorescence observation mode in which fluorescence emitted by a fluorescent marker added to a particle or by the particle itself is imaged by irradiating the particle with excitation light, and a scattered light observation mode in which scattered light produced by irradiating the particle with the light is imaged. A particle specifying unit specifies the particle to which the fluorescent marker is added or the particle that emits the fluorescence from fluorescence image data obtained in the fluorescence observation mode. An analyzing unit analyzes physical properties of the particle by obtaining diffusion speed due to the Brownian motion of the particle specified by the particle specifying unit from the image data of the scattered light obtained in the scattered light observation mode having a frame number larger than that in the fluorescence observation mode.

IPC Classes  ?

  • G01N 15/1434 - Optical arrangements
  • G01N 15/01 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials specially adapted for biological cells, e.g. blood cells
  • G01N 33/58 - Chemical analysis of biological material, e.g. blood, urineTesting involving biospecific ligand binding methodsImmunological testing involving labelled substances

47.

LIQUID MATERIAL VAPORIZATION APPARATUS AND OPERATION SETTING METHOD THEREOF

      
Application Number 18950461
Status Pending
Filing Date 2024-11-18
First Publication Date 2025-05-22
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Oba, Hidenori
  • Kawakado, Hajime

Abstract

A liquid material vaporization apparatus operates such that, in a gas generation mode, a liquid material is supplied to a tank through a supply path via a first on-off valve set to a predetermined first opening degree, and operates such that, in a purge mode, a purge gas is introduced into the tank through the supply path via the first on-off valve set to a second opening degree that is larger than the first opening degree.

IPC Classes  ?

  • F22B 35/00 - Control systems for steam boilers
  • F22B 37/78 - Adaptations or mounting of level indicators
  • H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components

48.

X-RAY ANALYSIS DEVICE

      
Application Number JP2024038984
Publication Number 2025/105205
Status In Force
Filing Date 2024-10-31
Publication Date 2025-05-22
Owner HORIBA, LTD. (Japan)
Inventor
  • Aoyama, Tomoki
  • Ohashi, Satoshi
  • Tajima, Mikiya

Abstract

An x-ray analysis device according to the present invention is to analyze the elements included in a measurement sample transported in a prescribed direction and comprises an x-ray irradiation unit that radiates x-rays toward the measurement sample, an x-ray detection unit that faces the measurement sample and detects x-ray fluorescence produced from the measurement sample, and a standard sample that has a known element content and is provided in a region of overlap between a region irradiated with the x-rays radiated from the x-ray irradiation unit and a region in which x-ray fluorescence can be detected by the x-ray detection unit.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

49.

HYDROGEN DETECTION DEVICE AND HYDROGEN DETECTION METHOD

      
Application Number JP2024033736
Publication Number 2025/100115
Status In Force
Filing Date 2024-09-20
Publication Date 2025-05-15
Owner HORIBA, LTD. (Japan)
Inventor
  • Shiba, Takumi
  • Naya, Hiroshi

Abstract

This hydrogen detection device for detecting hydrogen contained in a gas in a chamber or in a pipe comprises: a casing which is inserted into the chamber or the pipe and has an internal space into which the gas can be introduced; a physical quantity change part which is provided in the internal space and in which a physical quantity changes according to the concentration of the hydrogen; and a physical quantity detection part which is provided in the internal space and detects the physical quantity in the physical quantity change part. The internal space is separated into a first space and a second space by a separation member. The gas is introduced into the first space and the physical quantity change part is housed in the first space. The gas is not introduced into the second space and the physical quantity detection part is housed in the second space.

IPC Classes  ?

  • G01N 21/78 - Systems in which material is subjected to a chemical reaction, the progress or the result of the reaction being investigated by observing the effect on a chemical indicator producing a change of colour

50.

PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, PARTICLE SIZE DISTRIBUTION MEASURING METHOD, PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE, AND KIT FOR PARTICLE SIZE DISTRIBUTION MEASURING DEVICE

      
Application Number 18728676
Status Pending
Filing Date 2023-01-18
First Publication Date 2025-05-15
Owner HORIBA, Ltd. (Japan)
Inventor Tatewaki, Yasuhiro

Abstract

A particle size distribution measuring device includes: a measurement cell including a sample accommodation space that accommodates a sample obtained by dispersing a plurality of particles in a dispersion medium; a stirring means that stirs the sample by sucking and discharging the sample in the measurement cell; a light irradiation unit that irradiates the sample in the measurement cell with light; a light detection unit that detects scattered light or fluorescent light generated from the sample in the measurement cell; and an analysis unit that measures a particle size distribution of a particle group including the plurality of particles using a detection signal obtained by the light detection unit.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means
  • G01N 1/38 - Diluting, dispersing or mixing samples
  • G01N 15/01 - Investigating characteristics of particlesInvestigating permeability, pore-volume or surface-area of porous materials specially adapted for biological cells, e.g. blood cells

51.

PITOT TUBE FLOWMETER, GAS ANALYSIS DEVICE, AND GAS ANALYSIS METHOD

      
Application Number 18835696
Status Pending
Filing Date 2023-03-02
First Publication Date 2025-05-08
Owner HORIBA, LTD. (Japan)
Inventor
  • Mizutani, Naoto
  • Nagaoka, Makoto
  • Inoue, Kentaro
  • Uraoka, Masaru
  • Iseki, Hirotaka

Abstract

The present invention makes a pitot tube type flowmeter less affected by the flow velocity distribution caused by the flow passage shape on the upstream side, and includes a pitot tube having total pressure holes for detecting a total pressure of a fluid and static pressure holes for detecting a static pressure of the fluid, and a differential pressure sensor that is connected to the pitot tube and detects a differential pressure between the total pressure and the static pressure. The pitot tube includes a main tube portion, and a plurality of branch tube portions, which branches off from the main tube portion and in which the total pressure holes and the static pressure holes are formed. Each of the main tube portion and the plurality of branch tube portions has a shape that reduces a pressure loss.

IPC Classes  ?

52.

CONTROL PARAMETER CALCULATION APPARATUS, CONTROL PARAMETER CALCULATION METHOD, AND CONTROL PARAMETER CALCULATION PROGRAM

      
Application Number 18938474
Status Pending
Filing Date 2024-11-06
First Publication Date 2025-05-08
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Higuchi, Seiji
  • Takijiri, Kotaro

Abstract

A control parameter calculation apparatus calculates a control parameter of a fluid control apparatus that controls a fluid. The control parameter calculation apparatus stores correlation data indicating a correlation of a reference control parameter of the fluid control apparatus and a reference response signal output by using the reference control parameter, acquires a target response signal output by using a target control parameter of the fluid control apparatus different from the fluid control apparatus serving as a reference, acquires the correlation data and the target response signal and calculates a correlation control parameter corresponding to the target response signal in the fluid control apparatus serving as a reference by using the correlation data, and calculates an adjustment amount of the target control parameter based on the correlation control parameter and the reference control parameter.

IPC Classes  ?

  • G05D 7/06 - Control of flow characterised by the use of electric means

53.

COMPOSITION FOR HEMATOLOGY ANALYSES

      
Application Number FR2024051428
Publication Number 2025/093835
Status In Force
Filing Date 2024-10-29
Publication Date 2025-05-08
Owner HORIBA ABX SAS (France)
Inventor
  • Donnarumma, Dario
  • Adjemian, Jocelyne

Abstract

The invention relates to a composition for hematology analyses and to the method for producing same. The composition comprises an anticoagulant, in an amount of between 0.1% and 8% by weight, preferably between 2% and 6%; a salt in an amount of between 30% and 90% by weight, preferably between 50% and 80%; a pH buffer in an amount of between 0.1% and 50% by weight, preferably greater than or equal to 10%; and a surfactant in an amount of between 0.01% and 2% by weight, preferably between 0.05% and 1.5%, in solid form. The invention also relates to a solution obtained from the solid composition.

IPC Classes  ?

  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

54.

DILUTION MECHANISM, PARTICLE SIZE DISTRIBUTION MEASUREMENT SYSTEM, PARTICLE SIZE DISTRIBUTION MEASUREMENT METHOD, AND PROGRAM FOR PARTICLE SIZE DISTRIBUTION MEASUREMENT

      
Application Number 18728729
Status Pending
Filing Date 2023-01-17
First Publication Date 2025-05-01
Owner
  • HORIBA, Ltd. (Japan)
  • HORIBA Advanced Techno, Co., Ltd. (Japan)
Inventor
  • Sakuramoto, Keijiro
  • Mori, Tetsuya
  • Habu, Kazunori

Abstract

A dilution mechanism includes: a sample line that guides the sample containing the particles to the particle size distribution measurement device; a dilution line that merges with the sample line and through which a diluent flows; a concentration adjusting unit that adjusts the concentration of the particles contained in the diluted sample; a conductivity measuring unit that measures a conductivity of the diluted sample; a control unit that controls the concentration adjusting unit to bring the conductivity measured by the conductivity measuring unit or a conductivity-related value that is a value calculated from the conductivity, to a predetermined target value.

IPC Classes  ?

  • G01N 15/06 - Investigating concentration of particle suspensions
  • G01N 1/38 - Diluting, dispersing or mixing samples
  • G01N 15/14 - Optical investigation techniques, e.g. flow cytometry

55.

DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING DEVICE, DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING METHOD, AND DYNAMIC LIGHT SCATTERING TYPE PARTICLE DIAMETER DISTRIBUTION MEASURING PROGRAM

      
Application Number JP2024037561
Publication Number 2025/089267
Status In Force
Filing Date 2024-10-22
Publication Date 2025-05-01
Owner HORIBA, LTD. (Japan)
Inventor Sakuramoto, Keijiro

Abstract

Provided is a dynamic light scattering type particle diameter distribution measuring device comprising: a light irradiation unit that irradiates a sample flowing through a flow path with light; a light detection unit that detects light scattered by the sample; a particle diameter distribution calculation unit that calculates the particle diameter distribution of the sample on the basis of the light intensity obtained by the light detection unit; a flow rate acquisition unit that acquires the flow rate of the sample flowing through the flow path; and a particle diameter distribution correction unit that corrects the particle diameter distribution calculated by the particle diameter distribution calculation unit, on the basis of the flow rate acquired by the flow rate acquisition unit.

IPC Classes  ?

  • G01N 15/0205 - Investigating particle size or size distribution by optical means

56.

INVERTAU

      
Serial Number 99154006
Status Pending
Filing Date 2025-04-24
Owner HORIBA Instruments Incorporated ()
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Fluorescence spectrometers; scientific apparatus and instruments for optical analysis, namely, spectrometers, photoluminescence and fluorescence spectrometers; apparatus and instruments for photoluminescence lifetime measurement and spectrographs; microscopes; confocal microscopes for performing fluorescence lifetime imaging (FLIM); microscopes for capturing and analyzing fluorescence decay profiles for use in measuring molecular interactions, local environmental conditions, and biological parameters including FRET, pH, viscosity, binding efficiency, and temperature

57.

SIGNAL PROCESSING METHOD, SIGNAL PROCESSING DEVICE, RADIATION DETECTION APPARATUS AND RECORDING MEDIUM

      
Application Number 18682769
Status Pending
Filing Date 2022-08-12
First Publication Date 2025-04-24
Owner HORIBA, LTD. (Japan)
Inventor
  • Murata, Shunsuke
  • Valiev, Ildar

Abstract

A signal processing method for processing a signal including a response wave generated in response to detection of radiation, includes: measuring a feature corresponding to a duration of a response wave or a response wave group composed of a plurality of response waves; counting, for each wave height, the number of response waves or response wave groups whose measured features are included in a predetermined first range in which a feature of a single response wave is included; and performing correction processing of subtracting a specific value from a counted number according to a response wave or a response wave group whose feature is not included in the first range.

IPC Classes  ?

  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector

58.

FLUID CONTROL VALVE, FLUID CONTROL DEVICE AND DRIVE CIRCUIT

      
Application Number 18923498
Status Pending
Filing Date 2024-10-22
First Publication Date 2025-04-24
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Takakura, Hiroshi

Abstract

A drive circuit of a piezo actuator is provided with a flyback transformer whose primary winding is connected to a DC power supply, and whose secondary winding is connected to the piezo actuator, a charging switch that is connected to the primary winding, a discharging switch that is connected to the secondary winding, a regenerative capacitor that is connected to the primary winding and in which discharge energy from the piezo actuator is regenerated, and a switch control unit that controls ON/OFF operations of the charging switch and the discharging switch. The switch control unit controls the ON/OFF operations of the charging switch and the discharging switch so as to repeatedly charge and discharge the piezo actuator and thereby control the applied voltage of the piezo actuator.

IPC Classes  ?

  • F16K 31/00 - Operating meansReleasing devices
  • G05D 7/06 - Control of flow characterised by the use of electric means
  • H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components

59.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Application Number 18923513
Status Pending
Filing Date 2024-10-22
First Publication Date 2025-04-24
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Kawai, Yuya
  • Ieki, Atsushi

Abstract

In order to configure a fluid control valve to have the life prolonged while keeping an inexpensive configuration, the fluid control valve includes: a valve body that can come into contact and separate from a valve seat; an actuator that causes the valve body to move; a diaphragm member provided between the valve body and the actuator and having a protruding part protruding toward the valve body; and a sphere housed inside the protruding part, in which the actuator moves the valve body by pressing a distal end of the protruding part through the sphere, and the sphere is formed of a ceramic material.

IPC Classes  ?

  • F16K 7/12 - Diaphragm cut-off apparatus, e.g. with a member deformed, but not moved bodily, to close the passage with flat, dished, or bowl-shaped diaphragm
  • F16K 37/00 - Special means in or on valves or other cut-off apparatus for indicating or recording operation thereof, or for enabling an alarm to be given

60.

LF-F

      
Application Number 1850530
Status Registered
Filing Date 2025-01-17
Registration Date 2025-01-17
Owner HORIBA STEC, Co., Ltd. (Japan)
NICE Classes  ?
  • 07 - Machines and machine tools
  • 09 - Scientific and electric apparatus and instruments

Goods & Services

Semiconductor manufacturing machines, and part and fittings therefor; machines for manufacturing batteries, and part and fittings therefor; machines for manufacturing electric storage batteries, and part and fittings therefor; machines for manufacturing solar cell, and part and fittings therefor; machines for manufacturing electronic components, and part and fittings therefor; machines for manufacturing light emitting diode, and part and fittings therefor; machines for manufacturing displays, and part and fittings therefor; machines for manufacturing liquid crystal, and part and fittings therefor; machines for manufacturing organic electroluminescence, and part and fittings therefor; fluid controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; flow controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature controllers for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid measurement apparatus for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid flow meters for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; fluid flow sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; pressure sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature gauges for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; temperature sensors for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor; apparatus for measuring temperature difference for use with machines for manufacturing semiconductor, batteries, electric storage batteries, solar cell, electronic components, light emitting diode, displays, liquid crystal, organic electroluminescence, and part and fittings therefor. Measuring or testing machines and instruments; fluid controllers; flow controllers; fluid measurement apparatus; fluid flow meters; fluid flow sensors; pressure controllers; pressure gauges; pressure sensors; temperature controllers; temperature gauges; temperature sensors; apparatus for measuring temperature difference; automatic controllers for measurement of fluid; automatic controllers for measurement of flow; automatic controllers for measurement of pressure; automatic controllers for measurement of temperature; laboratory apparatus and instruments; electronic computer and data processing machines and apparatus and their parts; computer programs; computer software.

61.

RADIATION DETECTION ELEMENT MANUFACTURING METHOD, RADIATION DETECTION ELEMENT, AND RADIATION DETECTOR

      
Application Number JP2024035360
Publication Number 2025/079486
Status In Force
Filing Date 2024-10-03
Publication Date 2025-04-17
Owner HORIBA, LTD. (Japan)
Inventor Ishikura, Koji

Abstract

Provided are a radiation detection element manufacturing method, a radiation detection element, and a radiation detector that make it possible to accurately detect radiation having low energy. This radiation detection element manufacturing method comprises: forming an oxide layer composed of an oxide of a semiconductor on a first semiconductor layer; forming a second semiconductor layer on the oxide layer; and implanting, into the first semiconductor layer via the second semiconductor layer and the oxide layer, ions of a dopant that alters a semiconductor forming the first semiconductor layer to a semiconductor of a different type, thereby forming a doping layer composed of a semiconductor doped with the dopant between the first semiconductor layer and the oxide layer.

IPC Classes  ?

  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors

62.

XTROLOGY

      
Serial Number 79425805
Status Pending
Filing Date 2025-04-03
Owner HORIBA STEC, Co., Ltd. (Japan)
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

Semiconductor wafer inspection apparatus; analyzing apparatus for defect of semiconductor wafers; analyzing apparatus for stress of semiconductor wafers; analyzing apparatus for composition of semiconductor wafers; semiconductor wafer measuring apparatus; semiconductor wafer testing apparatus; semiconductor photomask inspection apparatus; analyzing apparatus for defect of semiconductor photomasks; analyzing apparatus for stress of semiconductor photomasks; analyzing apparatus for composition of semiconductor photomasks; semiconductor photomask measuring apparatus; semiconductor photomask testing apparatus; semiconductor reticle inspection apparatus; analyzing apparatus for defect of semiconductor reticles; analyzing apparatus for stress of semiconductor reticles; analyzing apparatus for composition of semiconductor reticles; semiconductor reticle measuring apparatus; semiconductor reticle testing apparatus; semiconductor substrate inspection apparatus; analyzing apparatus for defect of semiconductor substrates; analyzing apparatus for stress of semiconductor substrates; analyzing apparatus for composition of semiconductor substrates; semiconductor substrate measuring apparatus; semiconductor substrate testing apparatus; sensors for mapping semiconductor wafers; Raman spectrographic measurement apparatus, and parts and accessories therefor; Raman spectroscopic analyzing apparatus, and parts and accessories therefor; measuring apparatus for measuring film thickness; measuring apparatus for spectral measurements; automated optical inspection apparatus; X-ray fluorescence measuring apparatus; measuring or testing machines and instruments, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrometers, and parts and accessories therefor; photoluminescence or fluorescence microscope spectrographs, and parts and accessories therefor; optical machines and apparatus; photographic machines and apparatus; cinematographic machines and apparatus; laboratory apparatus and instruments; computer software for inspection, defect analysis, stress analysis, composition analysis, measurement and testing of semiconductor wafers, photomasks, reticles and substrates; computer software; computer programs; scanning probe microscopes; X-ray fluorescence analyzing apparatus; electronic computer and data processing machines and apparatus and their parts; power distribution or control machines and apparatus; rotary converters; phase modifiers; batteries and cells; electric or magnetic meters and testers; electric wires and cables; spectacles [eyeglasses and goggles]; life-saving apparatus and equipment; telecommunication machines and apparatus; fire alarms; gas alarms; water leak alarms; oil leak alarms; anti-theft warning apparatus.

63.

PATTERN MEASUREMENT DEVICE, PATTERN MEASUREMENT PROGRAM, AND PATTERN MEASUREMENT METHOD

      
Application Number 18899560
Status Pending
Filing Date 2024-09-27
First Publication Date 2025-04-03
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Higuchi, Seiji
  • Ogaki, Ryosuke
  • Ueda, Takayuki

Abstract

The present invention is to accurately measure a dimension of a pattern by using statistical outlier processing, and is a pattern measurement device for measuring a dimension of a pattern formed on a sample. The pattern measurement device includes: a dimension measurement unit configured to measure a dimension of the pattern; an outlier removal unit configured to execute outlier processing at least twice on a plurality of dimension values measured by the dimension measurement unit; and a representative value determination unit configured to obtain a representative dimension value of the pattern from one or a plurality of the dimension values from which an outlier has been removed by the outlier removal unit.

IPC Classes  ?

  • G01B 11/14 - Measuring arrangements characterised by the use of optical techniques for measuring distance or clearance between spaced objects or spaced apertures

64.

X-RAY ANALYSIS DEVICE, X-RAY ANALYSIS METHOD, INFORMATION PROCESSING DEVICE, AND COMPUTER PROGRAM

      
Application Number JP2024034558
Publication Number 2025/070683
Status In Force
Filing Date 2024-09-27
Publication Date 2025-04-03
Owner HORIBA, LTD. (Japan)
Inventor Aoyama, Tomoki

Abstract

Provided are: an X-ray analysis device that is capable of individually measuring the amounts of elements contained in layers on the obverse surface side and the reverse surface side of a multilayer sample; an X-ray analysis method; an information processing device; and a computer program. This X-ray analysis device is provided with: an emission unit that emits X-rays to a sample in which a plurality of layers are laminated, so as to sequentially penetrate a first layer, an intermediate layer, and a second layer; a fluorescent X-ray detector that detects fluorescent X-rays generated from the first layer or the second layer; a penetrating X-ray detector that detects penetrating X-rays that have penetrated the sample; and an analysis unit. The analysis unit calculates the amount of a specific element contained in one of the first layer or the second layer in accordance with the intensity of fluorescent X-rays having a prescribed first energy, calculates the total amount of the specific element contained in the first layer and the second layer in accordance with the intensity of penetrating X-rays having a prescribed second energy higher than the first energy, and calculates the amount of the specific element contained in the other of the first layer or the second layer.

IPC Classes  ?

  • G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

65.

FLUID CONTROL VALVE AND FLUID CONTROL DEVICE

      
Application Number JP2024029184
Publication Number 2025/069770
Status In Force
Filing Date 2024-08-16
Publication Date 2025-04-03
Owner HORIBA STEC, CO., LTD. (Japan)
Inventor Dick, John

Abstract

The present invention improves the durability of a displacement changing mechanism that changes the displacement of an actuator and transmits this displacement to a valve body, while reducing the number of components to achieve a compact configuration. A displacement changing mechanism 6 for changing the displacement of an actuator 4 and transmitting this displacement to a valve body 3 side is provided with: a cylindrical holding member 61 interposed between the valve body 3 and the actuator 4; a plurality of movable members 62 forming a partial columnar shape corresponding to the inner peripheral surface of the holding member 61; and a plurality of rotation support shafts 63 for rotatably supporting the plurality of movable members 62 with respect to the holding member 61. Each of the plurality of movable members 62 has an input part 62a displaced by receiving the driving force from the actuator 4, and an output part 62b for changing the displacement applied to the input part 62a and transmitting this displacement to the valve body 3 side.

IPC Classes  ?

  • F16K 1/32 - Lift valves, i.e. cut-off apparatus with closure members having at least a component of their opening and closing motion perpendicular to the closing faces Details

66.

PLATINALINK

      
Application Number 1847626
Status Registered
Filing Date 2024-12-13
Registration Date 2024-12-13
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Computer software for verifying data integrity; computer software for verifying data accuracy, completeness and consistency; computer software for access control, user identification, verification and security management; computer software for generating reports regarding data integrity; computer software for generating reports regarding data accuracy, completeness and consistency; computer software for measuring, controlling, testing, experimenting, data collection and management of engines, brakes and drives and apparatus attached thereto for vehicles and automobiles; computer software for measuring, controlling, testing, experimenting, data collection and management of pharmaceuticals, cosmetics, foodstuffs and dietary supplements; computer software for measuring, controlling, testing, experimenting, data collection and management of solid samples, gaseous samples and liquid samples; computer software for use with measuring or testing machines and instruments; computer software for use with laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus. Repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of electronic machines and apparatus; repair or maintenance of optical machines and apparatus. Design, programming and maintenance of computer software for verifying data integrity; design, programming and maintenance of computer software for verifying data accuracy, completeness and consistency; design, programming and maintenance of computer software for access control, user identification, verification and security management; design, programming and maintenance of computer software; computer software design, computer programming, or maintenance of computer software; rental of computer software for verifying data integrity; rental of computer software for verifying data accuracy, completeness and consistency; rental of computer software for access control, user identification, verification and security management; rental of computer software; providing on-line non-downloadable computer software for verifying data integrity; providing on-line non-downloadable computer software for verifying data accuracy, completeness and consistency; providing on-line non-downloadable computer software for access control, user identification, verification and security management; providing on-line non-downloadable computer software; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of measuring or testing machines and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on measuring or testing machines and instruments.

67.

HORIBA PLATINALINK

      
Application Number 1847627
Status Registered
Filing Date 2024-12-13
Registration Date 2024-12-13
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Computer software for verifying data integrity; computer software for verifying data accuracy, completeness and consistency; computer software for access control, user identification, verification and security management; computer software for generating reports regarding data integrity; computer software for generating reports regarding data accuracy, completeness and consistency; computer software for measuring, controlling, testing, experimenting, data collection and management of engines, brakes and drives and apparatus attached thereto for vehicles and automobiles; computer software for measuring, controlling, testing, experimenting, data collection and management of pharmaceuticals, cosmetics, foodstuffs and dietary supplements; computer software for measuring, controlling, testing, experimenting, data collection and management of solid samples, gaseous samples and liquid samples; computer software for use with measuring or testing machines and instruments; computer software for use with laboratory apparatus and instruments; computer software; electronic computer and data processing machines and apparatus and their parts; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus. Repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of electronic machines and apparatus; repair or maintenance of optical machines and apparatus. Design, programming and maintenance of computer software for verifying data integrity; design, programming and maintenance of computer software for verifying data accuracy, completeness and consistency; design, programming and maintenance of computer software for access control, user identification, verification and security management; design, programming and maintenance of computer software; computer software design, computer programming, or maintenance of computer software; rental of computer software for verifying data integrity; rental of computer software for verifying data accuracy, completeness and consistency; rental of computer software for access control, user identification, verification and security management; rental of computer software; providing on-line non-downloadable computer software for verifying data integrity; providing on-line non-downloadable computer software for verifying data accuracy, completeness and consistency; providing on-line non-downloadable computer software for access control, user identification, verification and security management; providing on-line non-downloadable computer software; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; rental of computers; calibration of measuring or testing machines and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing engines, brakes and drives and apparatus attached thereto for vehicles and automobiles, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing pharmaceuticals, cosmetics, foodstuffs and dietary supplements, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of laboratory apparatus and instruments for testing solid samples, gaseous samples and liquid samples, validation and qualification thereof, and providing information concerning the results of the aforementioned services; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of electronic machines and apparatus; calibration of optical machines and apparatus; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of electronic machines and apparatus; design of optical machines and apparatus; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; technological advice relating to computers, automobiles and industrial machines; testing or research on measuring or testing machines and instruments.

68.

VAPORIZER AND VAPORIZING SYSTEM

      
Application Number 18904016
Status Pending
Filing Date 2024-10-01
First Publication Date 2025-04-03
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Kanamaru, Takashi
  • Kawakado, Hajime

Abstract

A vaporizer for vaporizing a liquid substance includes: a tank for storing the liquid substance; a heater for heating the liquid substance by heating the tank; and a porous structure, disposed inside the tank, for breaking up and letting pass through it bubbles that form as a result of the liquid substance being heated by the heater.

IPC Classes  ?

  • B01J 7/02 - Apparatus for generating gases by wet methods

69.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2024031091
Publication Number 2025/062997
Status In Force
Filing Date 2024-08-29
Publication Date 2025-03-27
Owner HORIBA, LTD. (Japan)
Inventor Park, Sangwoon

Abstract

This analysis device is provided with: an impulse heating furnace or a high-frequency heating furnace that heats a sample to generate a sample gas containing elements that constitute the sample; a suction flow path that sucks the sample gas generated in the impulse heating furnace or the high-frequency heating furnace by means of a suction unit; and an element detecting unit that is provided in the suction flow path to detect the elements contained in the sample gas.

IPC Classes  ?

  • G01N 31/12 - Investigating or analysing non-biological materials by the use of the chemical methods specified in the subgroupsApparatus specially adapted for such methods using combustion

70.

CAPACITIVE PRESSURE SENSOR

      
Application Number 18824086
Status Pending
Filing Date 2024-09-04
First Publication Date 2025-03-27
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Kuwahara, Akira
  • Kishida, Sotaro

Abstract

The present invention is intended to simplify the configuration of the baffle and prevent deposition on the diaphragm, and includes: a housing surrounding a pressure receiving surface of the diaphragm to form a measurement chamber, the housing having a gas introduction port for introducing a gas into the measurement chamber; and a baffle member provided in the measurement chamber, in which the baffle member includes: a facing surface portion facing the gas introduction port; and an surrounding surface portion provided closer to a side of the gas introduction port than the facing surface portion and surrounding a periphery of the gas introduction port, and the surrounding surface portion includes a flow passage portion that allows a gas introduced from the gas introduction port to flow from an end portion on the side of the gas introduction port side toward a side of the diaphragm.

IPC Classes  ?

  • G01L 19/06 - Means for preventing overload or deleterious influence of the measured medium on the measuring device or vice versa
  • G01L 9/00 - Measuring steady or quasi-steady pressure of a fluid or a fluent solid material by electric or magnetic pressure-sensitive elementsTransmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means

71.

VAPORIZER AND LIQUID MATERIAL VAPORIZING DEVICE

      
Application Number 18892220
Status Pending
Filing Date 2024-09-20
First Publication Date 2025-03-27
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Nishiwaki, Keisuke

Abstract

A vaporizer that heats and vaporizes liquid material includes a spray chamber, a plurality of heating channels, and a tapered portion. The liquid material is sprayed into the spray chamber. The plurality of heating channels extends from the spray chamber to at least an axial direction one side. The tapered portion is tapered off toward the axial direction in a communication portion between the spray chamber and the heating channel.

IPC Classes  ?

  • B01B 1/00 - BoilingBoiling apparatus for physical or chemical purposes
  • H01L 21/67 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components

72.

DISPENSING INSTRUMENT PROVIDED WITH A MEMBER FOR PREVENTING THE REMOVAL OF A TUBE

      
Application Number FR2024051228
Publication Number 2025/062102
Status In Force
Filing Date 2024-09-19
Publication Date 2025-03-27
Owner HORIBA ABX SAS (France)
Inventor Cremien, Didier

Abstract

The invention relates to a dispensing instrument (55) comprising: - an elongate body (13) having a cavity extending from a first end (15) to a second end (17), wherein the body (13) further has an opening at the first end (15) and a hole at the second end (17); - a needle (31) partially covered by a sleeve (33) and extending within the cavity, wherein the needle (31) exits the body (13) through the hole; - a tube (7) closed by a cap (9) and accommodated in the cavity such that the cap (9) compresses the sleeve (33) and the needle (31) pierces the sleeve (33), passes through the cap (9) and enters the tube (7); and - a member (11) arranged so as to prevent the removal of the tube (7) by counteracting the return force exerted on the tube (7) by the sleeve (33).

IPC Classes  ?

  • A61B 5/15 - Devices for taking samples of blood
  • A61B 5/154 - Devices for taking samples of blood specially adapted for taking samples of venous or arterial blood, e.g. by syringes using pre-evacuated means
  • B01L 9/06 - Test-tube standsTest-tube holders

73.

VEHICLE ELEMENT RESPONSE LEARNING METHOD, VEHICLE ELEMENT RESPONSE CALCULATION METHOD, VEHICLE ELEMENT RESPONSE LEARNING SYSTEM, AND VEHICLE ELEMENT RESPONSE LEARNING PROGRAM

      
Application Number 18293282
Status Pending
Filing Date 2022-07-29
First Publication Date 2025-03-20
Owner HORIBA, LTD. (Japan)
Inventor
  • Tabata, Kunio
  • Roberts, Philip
  • Bates, Luke
  • Whelan, Steven

Abstract

The present invention is to accurately obtain a vehicle element response data under a desired driving environment by simulation without performing actual road driving and is a vehicle element response learning method for generating a trained model related to a response of a vehicle element that is a vehicle or a part of the vehicle, and the method includes: (1) an input step of giving an input including parameters related to a vehicle speed, a load, and a temperature assuming actual road driving, to the vehicle element; (2) an acquisition step of acquiring response data of the vehicle element and acquiring, as training data, input data representing the input and the response data; and (3) a generation step of generating the trained model related to the response of the vehicle element, from the training data by using machine learning.

IPC Classes  ?

74.

ANALYSIS DEVICE, SPECIMEN EVALUATION SYSTEM, AND ANALYSIS METHOD

      
Application Number JP2024031162
Publication Number 2025/053065
Status In Force
Filing Date 2024-08-30
Publication Date 2025-03-13
Owner
  • HORIBA, LTD. (Japan)
  • HORIBA ADVANCED TECHNO, CO., LTD. (Japan)
Inventor
  • Miyamura, Kazuhiro
  • Okada, Yoichi
  • Yamashita, Tsubasa

Abstract

Provided is an analysis device used in a specimen evaluation device that evaluates the state of a specimen by analyzing a waste liquid from the specimen. This analysis device comprises a component concentration measurement unit that is connected to a discharge gas flow passage through which a post-dilution waste liquid obtained by diluting the waste liquid discharged from the specimen by a diluent flows and that measures the concentration of a component contained in the post-dilution waste liquid.

IPC Classes  ?

  • H01M 8/0444 - ConcentrationDensity
  • C25B 15/023 - Measuring, analysing or testing during electrolytic production
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 5/00 - Analysing materials by weighing, e.g. weighing small particles separated from a gas or liquid
  • H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
  • H01M 8/02 - Fuel cellsManufacture thereof Details
  • H01M 8/10 - Fuel cells with solid electrolytes
  • H01M 8/12 - Fuel cells with solid electrolytes operating at high temperature, e.g. with stabilised ZrO2 electrolyte

75.

ASSAY METHOD USING MAGNETIC PARTICLES

      
Application Number 18722357
Status Pending
Filing Date 2022-12-13
First Publication Date 2025-03-06
Owner HORIBA ABX SAS (France)
Inventor
  • Daynes, Aurélien
  • Temurok, Nevzat

Abstract

Method for assaying a target analyte in a biological sample in liquid medium, comprising: contacting the sample with first magnetic particles bearing a first receptor specific to a first analyte site of attachment to form first complexes; applying a first magnetic field to locally combine the formed complexes formed and optionally to agglomerate interfering complexes to form interfering aggregates; negating the applied magnetic field; adding second magnetic particles to a liquid medium that bear a second receptor specific to a second analyte site of attachment; measuring a first quantity of interfering aggregates; applying a second magnetic field to form second complexes; measuring a second quantity of the collective amount of interfering aggregates and second complexes to determine an amount of formed second complexes as a function of the first quantity, and deducing the amount of analyte present in the sample and, optionally, the amount of interfering analyte.

IPC Classes  ?

  • G01N 33/543 - ImmunoassayBiospecific binding assayMaterials therefor with an insoluble carrier for immobilising immunochemicals

76.

SPECIMEN TESTING SYSTEM, INFORMATION PROCESSING METHOD, AND COMPUTER PROGRAM

      
Application Number JP2024028237
Publication Number 2025/047353
Status In Force
Filing Date 2024-08-07
Publication Date 2025-03-06
Owner HORIBA, LTD. (Japan)
Inventor
  • Tabata, Kunio
  • Shimura, Miyoko
  • Yamamoto, Mitsunobu

Abstract

Provided are a specimen testing system, an information processing method, and a computer program for preventing alteration of data pertaining to measurement. The specimen testing system comprises a measurement device and an information processing device. The measurement device acquires, in accordance with a prescribed rule, a measurement result required to assess the state of a specimen, generates measurement data representing the measurement result, and stores, in association with each other: protected device data that includes device data and a hash vale for the device data, said device data representing a result of testing whether the state of the measurement device follows the prescribed rule; and protected measurement data that includes the measurement data and a hash value for the measurement data.

IPC Classes  ?

  • G06F 21/64 - Protecting data integrity, e.g. using checksums, certificates or signatures

77.

FLOW RATE CONTROL VALVE, MANUFACTURING METHOD OF FLOW RATE CONTROL VALVE, AND FLOW RATE CONTROL APPARATUS

      
Application Number 18723382
Status Pending
Filing Date 2022-10-20
First Publication Date 2025-02-27
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor
  • Shakudo, Kazuya
  • Hayashi, Shigeyuki
  • Nagasawa, Masayuki

Abstract

A flow rate control valve includes a valve seat portion, a valve member, a driving portion, and a support member supporting the valve member via a diaphragm portion. The valve member has an opposite face opposite from a valve seat face with respect to a seat face and a circumferential face connecting together the seat face and the opposite face. The diaphragm portion is connected to the circumferential face of the valve member at a position closer to the seat face than to the opposite face. The support member has a first face on the same side as the opposite face with respect to a membrane face of the diaphragm portion and a second face closer to the valve seat portion than the first face. When the diaphragm portion is not deformed, the opposite face and the first face are on the same plane.

IPC Classes  ?

  • F16K 1/36 - Valve members
  • F16K 27/02 - Construction of housingsUse of materials therefor of lift valves

78.

ENCLOSED BATTERY EMISSIONS DILUTION AND SAMPLING

      
Application Number US2024040155
Publication Number 2025/042552
Status In Force
Filing Date 2024-07-30
Publication Date 2025-02-27
Owner HORIBA INSTRUMENTS INCORPORATED (USA)
Inventor
  • Rahman, Montajir
  • Stocker, Richard
  • Sobczak, Terry

Abstract

An enclosed battery emissions dilution and sampling system includes a heated exhaust tube, an enclosure defining at least one inlet port on one end of the enclosure and an outlet port on another end of the enclosure fed into the heated exhaust tube, a dilution air line, at least one heated inlet line arranged with an end of the dilution air line and fed into the at least one inlet port, and a bypass line connected between the dilution air line and heated exhaust tube, and around the enclosure.

IPC Classes  ?

  • H01M 10/42 - Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups

79.

OPEN AIR BATTERY EMISSIONS DILUTION AND SAMPLING

      
Application Number US2024041956
Publication Number 2025/042612
Status In Force
Filing Date 2024-08-12
Publication Date 2025-02-27
Owner HORIBA INSTRUMENTS INCORPORATED (USA)
Inventor
  • Rahman, Montajir
  • Stocker, Richard
  • Sobczak, Terry
  • Israel, Joshua

Abstract

An open air battery emissions dilution and sampling system includes a sample accumulator that defines a funneled cavity having an open end exposed to ambient dilution air and that captures and dilutes with the ambient dilution air emissions from a battery, at least partially disposed within the funneled cavity and experiencing thermal runaway, to form diluted exhaust.

IPC Classes  ?

  • G01N 1/38 - Diluting, dispersing or mixing samples
  • G01N 1/24 - Suction devices
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups
  • H01M 10/42 - Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells

80.

ENCLOSED BATTERY EMISSIONS DILUTION AND SAMPLING

      
Application Number 18452131
Status Pending
Filing Date 2023-08-18
First Publication Date 2025-02-20
Owner HORIBA INSTRUMENTS INCORPORATED (USA)
Inventor
  • Rahman, Montajir
  • Stocker, Richard
  • Sobczak, Terry

Abstract

An enclosed battery emissions dilution and sampling system includes a heated exhaust tube, an enclosure defining at least one inlet port on one end of the enclosure and an outlet port on another end of the enclosure fed into the heated exhaust tube, a dilution air line, at least one heated inlet line arranged with an end of the dilution air line and fed into the at least one inlet port, and a bypass line connected between the dilution air line and heated exhaust tube, and around the enclosure.

IPC Classes  ?

  • G01F 1/684 - Structural arrangementsMounting of elements, e.g. in relation to fluid flow
  • G01F 1/696 - Circuits therefor, e.g. constant-current flow meters
  • G01F 15/00 - Details of, or accessories for, apparatus of groups insofar as such details or appliances are not adapted to particular types of such apparatus
  • H01M 10/42 - Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells

81.

OPEN AIR BATTERY EMISSIONS DILUTION AND SAMPLING

      
Application Number 18452191
Status Pending
Filing Date 2023-08-18
First Publication Date 2025-02-20
Owner HORIBA INSTRUMENTS INCORPORATED (USA)
Inventor
  • Rahman, Montajir
  • Stocker, Richard
  • Sobczak, Terry
  • Israel, Joshua

Abstract

An open air battery emissions dilution and sampling system includes a sample accumulator that defines a funneled cavity having an open end exposed to ambient dilution air and that captures and dilutes with the ambient dilution air emissions from a battery, at least partially disposed within the funneled cavity and experiencing thermal runaway, to form diluted exhaust.

IPC Classes  ?

  • H01M 10/52 - Removing gases inside the secondary cell, e.g. by absorption
  • H01M 10/42 - Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
  • H01M 10/615 - Heating or keeping warm
  • H01M 50/317 - Re-sealable arrangements

82.

ENERGY MANAGEMENT SYSTEM, ENERGY MANAGEMENT METHOD, AND ENERGY MANAGEMENT PROGRAM

      
Application Number JP2024027995
Publication Number 2025/033401
Status In Force
Filing Date 2024-08-06
Publication Date 2025-02-13
Owner HORIBA, LTD. (Japan)
Inventor
  • Iwao, Keijiro
  • Kakino, Toru
  • Ishikuma, Toru

Abstract

The present invention is an energy management system that realizes energy conservation focusing on a frequency distribution indicating the frequency of energy consumption amounts in an energy demand facility, the energy management system managing consumed energy in the energy demand facility, wherein the energy management system comprises a clustering unit for clustering past energy consumption amounts for the energy demand facility into a plurality of clusters on the basis of a prescribed condition, a modeling unit for modeling a frequency distribution indicating the frequency of the energy consumption amounts in each cluster into a distribution having at least one positive skew, and a schedule adjustment unit for adjusting the operation schedule of the energy demand facility so as to reduce the variance of the modeled distribution.

IPC Classes  ?

83.

POLISPECTRA

      
Application Number 019138490
Status Registered
Filing Date 2025-02-04
Registration Date 2025-06-13
Owner HORIBA Instruments Incorporated (USA)
NICE Classes  ? 09 - Scientific and electric apparatus and instruments

Goods & Services

SCIENTIFIC APPARATUS AND INSTRUMENTS FOR OPTICAL ANALYSIS, SPECTROSCOPY, NAMELY, IMAGING CCD AND SCMOS SPECTROMETERS AND SPECTROGRAPHS.

84.

GAS ANALYSIS DEVICE, GAS ANALYSIS METHOD, AND PROGRAM FOR GAS ANALYSIS DEVICE

      
Application Number 18696835
Status Pending
Filing Date 2022-10-03
First Publication Date 2025-01-30
Owner HORIBA, LTD. (Japan)
Inventor
  • Nagura, Naoki
  • Kawabuchi, Yasushi
  • Takahashi, Daichi
  • Hara, Kenji
  • Kikuta, Takayuki
  • Yoshioka, Masaya
  • Nakamura, Kotaro

Abstract

A gas analysis device includes a sample cell into which sample gas is introduced, a light source that irradiates the sample cell with light, a photodetector that detects light intensity of light which passes through the sample cell irradiated by the light source, a concentration calculation unit which calculates a concentration of a measurement target component contained in the sample gas based on light intensity outputted from the photodetector, and a light intensity output unit that outputs, comparably with a reference light intensity set in advance, a light intensity at calibration detected by the photodetector during calibration.

IPC Classes  ?

  • G01N 21/3504 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis
  • G01N 1/22 - Devices for withdrawing samples in the gaseous state
  • G01N 21/03 - Cuvette constructions
  • G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
  • G01N 21/39 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using tunable lasers

85.

Yumivet

      
Application Number 1834279
Status Registered
Filing Date 2024-12-04
Registration Date 2024-12-04
Owner HORIBA ABX SAS (France)
NICE Classes  ? 10 - Medical apparatus and instruments

Goods & Services

Veterinary apparatus and instruments.

86.

Miscellaneous Design

      
Application Number 1835060
Status Registered
Filing Date 2024-11-28
Registration Date 2024-11-28
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 10 - Medical apparatus and instruments

Goods & Services

Computer software; computer software for medical use; computer software for electronic chart for medical purposes; computer software for veterinary use; computer software for electronic chart for veterinary purposes; computer programs; measuring or testing machines and instruments; laboratory apparatus and instruments; photographic machines and apparatus; optical machines and apparatus. Medical apparatus and instruments; diagnostic apparatus and instruments; veterinary apparatus and instruments; veterinary diagnostic apparatus and instruments.

87.

BLOOD ANALYSIS APPARATUS, BLOOD ANALYSIS METHOD, AND RECORDING MEDIUM

      
Application Number 18715686
Status Pending
Filing Date 2022-11-28
First Publication Date 2025-01-23
Owner HORIBA, Ltd. (Japan)
Inventor
  • Isshiki, Ryota
  • Ikeda, Motohide
  • Osawa, Kenta

Abstract

A blood analysis apparatus includes: a container information acquisition portion that acquires container information on the type of sample container to be used; a needle that sucks and discharges a blood sample contained in the sample container; a blood analysis portion having a chamber that receives the blood sample sucked from the sample container and discharged into it with the needle; and a control portion that controls suction and discharge of the blood sample with the needle based on the container information. The control portion sets the amount of blood sample to be sucked with the needle based on the container information.

IPC Classes  ?

  • G01N 35/10 - Devices for transferring samples to, in, or from, the analysis apparatus, e.g. suction devices, injection devices
  • G01N 1/14 - Suction devices, e.g. pumpsEjector devices
  • G01N 35/00 - Automatic analysis not limited to methods or materials provided for in any single one of groups Handling materials therefor

88.

OUTPUT DEVICE, BLOOD ANALYSIS APPARATUS, BLOOD ANALYSIS METHOD, AND RECORDING MEDIUM

      
Application Number 18715671
Status Pending
Filing Date 2022-11-28
First Publication Date 2025-01-16
Owner HORIBA, Ltd. (Japan)
Inventor
  • Nishimori, Masashi
  • Ohashi, Akika
  • Nakagawa, Yohei

Abstract

An output device includes: a measurement information reception portion configured to receive measurement information including a measurement result on a blood sample; a code information generation portion configured to generate code information by adding the measurement information to browsing destination information indicating a browsing destination at which to browse the measurement information; and an output portion configured to output the code information.

IPC Classes  ?

  • G16H 10/40 - ICT specially adapted for the handling or processing of patient-related medical or healthcare data for data related to laboratory analysis, e.g. patient specimen analysis
  • G01N 33/48 - Biological material, e.g. blood, urineHaemocytometers
  • G06F 21/60 - Protecting data
  • G06K 19/06 - Record carriers for use with machines and with at least a part designed to carry digital markings characterised by the kind of the digital marking, e.g. shape, nature, code

89.

FLOW RATE CALCULATION DEVICE AND FLOW RATE CALCULATION METHOD

      
Application Number 18770538
Status Pending
Filing Date 2024-07-11
First Publication Date 2025-01-16
Owner HORIBA STEC, Co., Ltd. (Japan)
Inventor Horinouchi, Osamu

Abstract

A flow rate calculation device includes: a specific flow path and a bypass flow path which are provided to branch from a main flow path; a first fluid resistance element which is provided in the specific flow path; a second fluid resistance element which is provided in the bypass flow path; a container which is arranged in the specific flow path; a pressure sensor which detects a pressure in the container; and a flow rate calculation unit. The flow rate calculation unit calculates the flow rate of a first branch fluid diverted to the specific flow path based on a change in the pressure in the container, and calculates the flow rate of the fluid flowing through the main flow path based on the calculated flow rate of the first branch fluid and a diversion ratio determined according to the first fluid resistance element and the second fluid resistance element.

IPC Classes  ?

  • G01F 1/36 - Measuring the volume flow or mass flow of fluid or fluent solid material wherein the fluid passes through a meter in a continuous flow by using mechanical effects by measuring pressure or differential pressure the pressure or differential pressure being created by the use of flow constriction

90.

RADIATION DETECTION DEVICE AND SIGNAL PROCESSING METHOD

      
Application Number JP2024021278
Publication Number 2025/013496
Status In Force
Filing Date 2024-06-12
Publication Date 2025-01-16
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Daisuke
  • Murata, Shunsuke
  • Ohashi, Satoshi
  • Valiev, Ildar
  • Aoyama, Tomoki
  • Okubo, Yuji

Abstract

Provided are a radiation detection device and a signal processing method that are capable of preventing damage to a radiation detector. The radiation detection device comprises: a radiation detector that outputs a signal in response to the entry of radiation or light; and a stop processing unit that determines whether excessive radiation or excessive light has entered the radiation detector on the basis of the signal output from the radiation detector, and that stops the operation of the radiation detector or stops the generation of radiation or light when it is determined that excessive radiation or excessive light has entered the radiation detector.

IPC Classes  ?

  • G01T 1/17 - Circuit arrangements not adapted to a particular type of detector
  • G01T 1/24 - Measuring radiation intensity with semiconductor detectors

91.

VERIDRIVE

      
Application Number 1833419
Status Registered
Filing Date 2024-11-26
Registration Date 2024-11-26
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 37 - Construction and mining; installation and repair services
  • 42 - Scientific, technological and industrial services, research and design

Goods & Services

Measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measurement apparatus and instruments for engine emission, and parts and fittings therefor; measurement apparatus and instruments for emission, and parts and fittings therefor; measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; measurement apparatus and instruments for process gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; on-board measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for engine emission, and parts and fittings therefor; on-board measurement apparatus and instruments for emission, and parts and fittings therefor; on-board measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measurement apparatus and instruments for process gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; on-board measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; portable measurement apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for engine emission, and parts and fittings therefor; portable measurement apparatus and instruments for emission, and parts and fittings therefor; portable measurement apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measurement apparatus and instruments for process gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for vehicle engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for engine emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for emission, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for exhaust gases, and parts and fittings therefor; portable measuring and analyzing apparatus and instruments for process gases, and parts and fittings therefor; measurement apparatus and instruments for automobile emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for automobile emission, and parts and fittings therefor; measurement apparatus and instruments for vehicle emission, and parts and fittings therefor; measuring and analyzing apparatus and instruments for vehicle emission, and parts and fittings therefor; vehicle engine testing apparatus and instruments, and parts and fittings therefor; automotive engine testing apparatus and instruments, and parts and fittings therefor; engine testing apparatus and instruments, and parts and fittings therefor; computer software for controlling measurement apparatus and instruments for vehicle engine emission; computer software for controlling measurement apparatus and instruments for engine emission; computer software for controlling measurement apparatus and instruments for emission; computer software for controlling measurement apparatus and instruments for exhaust gases; computer software for controlling measurement apparatus and instruments for process gases; computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; computer software for controlling measuring and analyzing apparatus and instruments for engine emission; computer software for controlling measuring and analyzing apparatus and instruments for emission; computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; computer software for controlling measuring and analyzing apparatus and instruments for process gases; computer software for controlling engine testing apparatus and instruments; computer software; measuring or testing machines and instruments; laboratory apparatus and instruments; optical machines and apparatus; cinematographic machines and apparatus; photographic machines and apparatus. Repair or maintenance of measurement apparatus and instruments for vehicle engine emission; repair or maintenance of measurement apparatus and instruments for engine emission; repair or maintenance of measurement apparatus and instruments for emission; repair or maintenance of measurement apparatus and instruments for exhaust gases; repair or maintenance of measurement apparatus and instruments for process gases; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of measuring and analyzing apparatus and instruments for emission; repair or maintenance of measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of measuring and analyzing apparatus and instruments for process gases; repair or maintenance of on-board measurement apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measurement apparatus and instruments for engine emission; repair or maintenance of on-board measurement apparatus and instruments for emission; repair or maintenance of on-board measurement apparatus and instruments for exhaust gases; repair or maintenance of on-board measurement apparatus and instruments for process gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for emission; repair or maintenance of on-board measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of on-board measuring and analyzing apparatus and instruments for process gases; repair or maintenance of portable measurement apparatus and instruments for vehicle engine emission; repair or maintenance of portable measurement apparatus and instruments for engine emission; repair or maintenance of portable measurement apparatus and instruments for emission; repair or maintenance of portable measurement apparatus and instruments for exhaust gases; repair or maintenance of portable measurement apparatus and instruments for process gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for vehicle engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for engine emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for emission; repair or maintenance of portable measuring and analyzing apparatus and instruments for exhaust gases; repair or maintenance of portable measuring and analyzing apparatus and instruments for process gases; repair or maintenance of measurement apparatus and instruments for automobile emission; repair or maintenance of measuring and analyzing apparatus and instruments for automobile emission; repair or maintenance of measurement apparatus and instruments for vehicle emission; repair or maintenance of measuring and analyzing apparatus and instruments for vehicle emission; repair or maintenance of vehicle engine testing apparatus and instruments; repair or maintenance of automotive engine testing apparatus and instruments; repair or maintenance of engine testing apparatus and instruments; repair or maintenance of measuring or testing machines and instruments; repair or maintenance of laboratory apparatus and instruments; repair or maintenance of optical machines and apparatus; repair or maintenance of cinematographic machines and apparatus; repair or maintenance of photographic machines and apparatus. Rental of measurement apparatus and instruments for vehicle engine emission; rental of measurement apparatus and instruments for engine emission; rental of measurement apparatus and instruments for emission; rental of measurement apparatus and instruments for exhaust gases; rental of measurement apparatus and instruments for process gases; rental of measuring and analyzing apparatus and instruments for vehicle engine emission; rental of measuring and analyzing apparatus and instruments for engine emission; rental of measuring and analyzing apparatus and instruments for emission; rental of measuring and analyzing apparatus and instruments for exhaust gases; rental of measuring and analyzing apparatus and instruments for process gases; rental of on-board measurement apparatus and instruments for vehicle engine emission; rental of on-board measurement apparatus and instruments for engine emission; rental of on-board measurement apparatus and instruments for emission; rental of on-board measurement apparatus and instruments for exhaust gases; rental of on-board measurement apparatus and instruments for process gases; rental of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; rental of on-board measuring and analyzing apparatus and instruments for engine emission; rental of on-board measuring and analyzing apparatus and instruments for emission; rental of on-board measuring and analyzing apparatus and instruments for exhaust gases; rental of on-board measuring and analyzing apparatus and instruments for process gases; rental of portable measurement apparatus and instruments for vehicle engine emission; rental of portable measurement apparatus and instruments for engine emission; rental of portable measurement apparatus and instruments for emission; rental of portable measurement apparatus and instruments for exhaust gases; rental of portable measurement apparatus and instruments for process gases; rental of portable measuring and analyzing apparatus and instruments for vehicle engine emission; rental of portable measuring and analyzing apparatus and instruments for engine emission; rental of portable measuring and analyzing apparatus and instruments for emission; rental of portable measuring and analyzing apparatus and instruments for exhaust gases; rental of portable measuring and analyzing apparatus and instruments for process gases; rental of measurement apparatus and instruments for automobile emission; rental of measuring and analyzing apparatus and instruments for automobile emission; rental of measurement apparatus and instruments for vehicle emission; rental of measuring and analyzing apparatus and instruments for vehicle emission; rental of vehicle engine testing apparatus and instruments; rental of automotive engine testing apparatus and instruments; rental of engine testing apparatus and instruments; rental of measuring or testing machines and instruments; rental of laboratory apparatus and instruments; calibration of measurement apparatus and instruments for vehicle engine emission; calibration of measurement apparatus and instruments for engine emission; calibration of measurement apparatus and instruments for emission; calibration of measurement apparatus and instruments for exhaust gases; calibration of measurement apparatus and instruments for process gases; calibration of measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of measuring and analyzing apparatus and instruments for engine emission; calibration of measuring and analyzing apparatus and instruments for emission; calibration of measuring and analyzing apparatus and instruments for exhaust gases; calibration of measuring and analyzing apparatus and instruments for process gases; calibration of on-board measurement apparatus and instruments for vehicle engine emission; calibration of on-board measurement apparatus and instruments for engine emission; calibration of on-board measurement apparatus and instruments for emission; calibration of on-board measurement apparatus and instruments for exhaust gases; calibration of on-board measurement apparatus and instruments for process gases; calibration of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of on-board measuring and analyzing apparatus and instruments for engine emission; calibration of on-board measuring and analyzing apparatus and instruments for emission; calibration of on-board measuring and analyzing apparatus and instruments for exhaust gases; calibration of on-board measuring and analyzing apparatus and instruments for process gases; calibration of portable measurement apparatus and instruments for vehicle engine emission; calibration of portable measurement apparatus and instruments for engine emission; calibration of portable measurement apparatus and instruments for emission; calibration of portable measurement apparatus and instruments for exhaust gases; calibration of portable measurement apparatus and instruments for process gases; calibration of portable measuring and analyzing apparatus and instruments for vehicle engine emission; calibration of portable measuring and analyzing apparatus and instruments for engine emission; calibration of portable measuring and analyzing apparatus and instruments for emission; calibration of portable measuring and analyzing apparatus and instruments for exhaust gases; calibration of portable measuring and analyzing apparatus and instruments for process gases; calibration of measurement apparatus and instruments for automobile emission; calibration of measuring and analyzing apparatus and instruments for automobile emission; calibration of measurement apparatus and instruments for vehicle emission; calibration of measuring and analyzing apparatus and instruments for vehicle emission; calibration of vehicle engine testing apparatus and instruments; calibration of automotive engine testing apparatus and instruments; calibration of engine testing apparatus and instruments; calibration of measuring or testing machines and instruments; calibration of laboratory apparatus and instruments; calibration of optical machines and apparatus; calibration of cinematographic machines and apparatus; calibration of photographic machines and apparatus; design of measurement apparatus and instruments for vehicle engine emission; design of measurement apparatus and instruments for engine emission; design of measurement apparatus and instruments for emission; design of measurement apparatus and instruments for exhaust gases; design of measurement apparatus and instruments for process gases; design of measuring and analyzing apparatus and instruments for vehicle engine emission; design of measuring and analyzing apparatus and instruments for engine emission; design of measuring and analyzing apparatus and instruments for emission; design of measuring and analyzing apparatus and instruments for exhaust gases; design of measuring and analyzing apparatus and instruments for process gases; design of on-board measurement apparatus and instruments for vehicle engine emission; design of on-board measurement apparatus and instruments for engine emission; design of on-board measurement apparatus and instruments for emission; design of on-board measurement apparatus and instruments for exhaust gases; design of on-board measurement apparatus and instruments for process gases; design of on-board measuring and analyzing apparatus and instruments for vehicle engine emission; design of on-board measuring and analyzing apparatus and instruments for engine emission; design of on-board measuring and analyzing apparatus and instruments for emission; design of on-board measuring and analyzing apparatus and instruments for exhaust gases; design of on-board measuring and analyzing apparatus and instruments for process gases; design of portable measurement apparatus and instruments for vehicle engine emission; design of portable measurement apparatus and instruments for engine emission; design of portable measurement apparatus and instruments for emission; design of portable measurement apparatus and instruments for exhaust gases; design of portable measurement apparatus and instruments for process gases; design of portable measuring and analyzing apparatus and instruments for vehicle engine emission; design of portable measuring and analyzing apparatus and instruments for engine emission; design of portable measuring and analyzing apparatus and instruments for emission; design of portable measuring and analyzing apparatus and instruments for exhaust gases; design of portable measuring and analyzing apparatus and instruments for process gases; design of measurement apparatus and instruments for automobile emission; design of measuring and analyzing apparatus and instruments for automobile emission; design of measurement apparatus and instruments for vehicle emission; design of measuring and analyzing apparatus and instruments for vehicle emission; design of vehicle engine testing apparatus and instruments; design of automotive engine testing apparatus and instruments; design of engine testing apparatus and instruments; design of measuring or testing machines and instruments; design of laboratory apparatus and instruments; design of optical machines and apparatus; design of cinematographic machines and apparatus; design of photographic machines and apparatus; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measurement apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for emission; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; design, programming and maintenance of computer software for controlling measuring and analyzing apparatus and instruments for process gases; design, programming and maintenance of computer software for controlling engine testing apparatus and instruments; design, programming and maintenance of computer software; rental of computer software for controlling measurement apparatus and instruments for vehicle engine emission; rental of computer software for controlling measurement apparatus and instruments for engine emission; rental of computer software for controlling measurement apparatus and instruments for emission; rental of computer software for controlling measurement apparatus and instruments for exhaust gases; rental of computer software for controlling measurement apparatus and instruments for process gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for engine emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for emission; rental of computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; rental of computer software for controlling measuring and analyzing apparatus and instruments for process gases; rental of computer software for controlling engine testing apparatus and instruments; rental of computer software; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measurement apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for vehicle engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for engine emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for emission; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for exhaust gases; providing on-line non-downloadable computer software for controlling measuring and analyzing apparatus and instruments for process gases; providing on-line non-downloadable computer software for controlling engine testing apparatus and instruments; providing on-line non-downloadable computer software; designing of machines, apparatus, instruments [including their parts] or systems composed of such machines, apparatus and instruments; computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; testing or research on machines, apparatus and instruments.

92.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number 18574020
Status Pending
Filing Date 2022-05-25
First Publication Date 2025-01-09
Owner HORIBA, LTD. (Japan)
Inventor
  • Tachibana, Kohei
  • Nakamura, Keishi
  • Niina, Kodai
  • Miyawaki, Daisuke
  • Watanabe, Tsuyoshi
  • Ido, Takuya

Abstract

To appropriately take explosion-proof measures for an analysis device while suppressing consumption of a purge gas, an analysis device includes a filling unit, an irradiation unit, a propagation unit, a housing, a purge gas introduction unit, and an explosion-proof gas introduction unit. The filling unit is filled with a sample gas containing a gas to be measured. The irradiation unit emits measurement light to be used for analyzing the gas to be measured. The propagation unit is disposed between the filling unit and the irradiation unit, so as to form a propagation space for propagating the measurement light emitted from the irradiation unit to the filling unit. The housing houses the filling unit, the irradiation unit, and the propagation unit. The purge gas introduction unit introduces the purge gas into the propagation space. The explosion-proof gas introduction unit introduces an explosion-proof gas into the internal space of the housing.

IPC Classes  ?

  • G01N 21/31 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
  • G01N 33/00 - Investigating or analysing materials by specific methods not covered by groups

93.

GATELINK

      
Application Number 1831423
Status Registered
Filing Date 2024-11-28
Registration Date 2024-11-28
Owner HORIBA, Ltd. (Japan)
NICE Classes  ?
  • 09 - Scientific and electric apparatus and instruments
  • 10 - Medical apparatus and instruments

Goods & Services

Computer software; computer software for medical use; computer software for electronic chart for medical purposes; computer software for veterinary use; computer software for electronic chart for veterinary purposes; computer programs; measuring or testing machines and instruments; laboratory apparatus and instruments; photographic machines and apparatus; optical machines and apparatus. Medical apparatus and instruments; diagnostic apparatus and instruments; veterinary apparatus and instruments; veterinary diagnostic apparatus and instruments.

94.

GAS ANALYSIS DEVICE, FUEL GAS SUPPLY MECHANISM, AND GAS ANALYSIS METHOD

      
Application Number JP2024018439
Publication Number 2025/004598
Status In Force
Filing Date 2024-05-20
Publication Date 2025-01-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Kondo, Yosuke
  • Kasugai, Tetsuya
  • Nishigai, Hiroki

Abstract

The present invention is a fuel gas supply mechanism for replacing a fuel gas cylinder without causing an accidental fire of hydrogen flame in a hydrogen flame ionization detection device, and comprises a first fuel gas port 51 to which a first fuel gas cylinder 10a is connected, a second fuel gas port 52 to which a second fuel gas cylinder 10b is connected, a first fuel gas flow passage 53 that connects the first fuel gas port 51 and an FID detector 4, a second fuel gas flow passage 54 that connects the second fuel gas port 52 and the FID detector 4, and a fuel gas backflow prevention mechanism 50 that prevents backflow from the first fuel gas flow passage 53 to the second fuel gas flow passage 54 or backflow from the second fuel gas flow passage 54 to the first fuel gas flow passage 53.

IPC Classes  ?

  • G01N 27/626 - Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating the ionisation of gases, e.g. aerosolsInvestigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electric discharges, e.g. emission of cathode using heat to ionise a gas
  • G01M 15/10 - Testing internal-combustion engines by monitoring exhaust gases

95.

ANALYSIS DEVICE AND ANALYSIS METHOD

      
Application Number JP2024021190
Publication Number 2025/004791
Status In Force
Filing Date 2024-06-11
Publication Date 2025-01-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Nakamura, Ryuhei
  • Ito, Hiroshi
  • Matsumoto, Erika

Abstract

The present invention acquires analysis results relating to the mass concentration and the elements of an analysis object in a short time and with a simple device configuration. An analysis device (100) comprises a β ray source (51), a detection unit (7, 7', 7"), and an analysis unit (9). The β ray source (51) irradiates the analysis object with β rays. The detection unit (7, 7', 7") simultaneously detects transmitted β rays that have passed through the analysis object and fluorescent X-rays that have been produced by irradiating the analysis object with the β rays, and outputs detection signals. The analysis unit (9) acquires, from the detection signals, a first signal produced by detecting the transmitted β rays and a second signal produced by detecting the fluorescent X-rays. The analysis unit (9) calculates information relating to the mass concentration of the analysis object on the basis of the first signal, and calculates information relating to the elements included in the analysis object on the basis of the second signal.

IPC Classes  ?

  • G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
  • G01N 23/02 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material

96.

BATTERY CASE EVALUATION SYSTEM, BATTERY CASE EVALUATION PROGRAM, AND BATTERY CASE EVALUATION METHOD

      
Application Number JP2024023511
Publication Number 2025/005247
Status In Force
Filing Date 2024-06-28
Publication Date 2025-01-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsunaga, Shimpachi
  • Hatakeyama, Hiroshi
  • Tatsukawa, Shogo

Abstract

A battery case evaluation system 100 for evaluating the thermal properties of a battery case BC constituting a battery pack or of a component of said battery case BC, said system being equipped with a simulation battery 10 which is installed in the battery case BC and simulates the thermal behavior of an actual battery which is a component of a battery pack, a power supply device 20 which supplies power to the simulation battery 10, and a control device 30 which controls the power supply device 20, wherein the control device 30 is configured so as to have: a parameter reception unit 31 which receives an input profile expressing the change over time in the current, voltage or power supplied to the actual battery as one evaluation parameter; a resistance value calculation unit 331 which calculates a resistance value of the actual battery which changes over time on the basis of the simulation battery temperature and the input profile; and a supply power control unit 33 which controls the power supply device 20 by using the resistance value calculated by the resistance value calculation unit 331.

IPC Classes  ?

  • G01R 31/367 - Software therefor, e.g. for battery testing using modelling or look-up tables
  • G01N 25/18 - Investigating or analysing materials by the use of thermal means by investigating thermal conductivity
  • G01R 31/382 - Arrangements for monitoring battery or accumulator variables, e.g. SoC
  • G01R 31/385 - Arrangements for measuring battery or accumulator variables
  • G01R 31/389 - Measuring internal impedance, internal conductance or related variables
  • G01R 31/392 - Determining battery ageing or deterioration, e.g. state of health
  • H01M 10/48 - Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte

97.

TEST SAMPLE TESTING SYSTEM, TEMPERATURE ADJUSTMENT DEVICE, TEST SAMPLE TESTING METHOD, AND TEST SAMPLE TESTING PROGRAM

      
Application Number JP2024021305
Publication Number 2025/004803
Status In Force
Filing Date 2024-06-12
Publication Date 2025-01-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Tatsukawa, Shogo
  • Hatakeyama, Hiroshi
  • Matsunaga, Shimpachi

Abstract

The present invention is for testing a test sample while simulating heat input or heat dissipation via an actual power line during actual use, and is a test sample testing system 100 for testing a test sample W, which is an electrical device, the test sample testing system 100 comprising: a test power line 4 that is connected to the test sample W; and a temperature adjustment device 5 for adjusting the temperature of the test power line 4 connected to the test sample W.

IPC Classes  ?

  • G01M 17/007 - Wheeled or endless-tracked vehicles
  • G01R 31/36 - Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]

98.

ANALYSIS DEVICE, ANALYSIS METHOD, AND PROGRAM

      
Application Number JP2024023176
Publication Number 2025/005137
Status In Force
Filing Date 2024-06-26
Publication Date 2025-01-02
Owner HORIBA, LTD. (Japan)
Inventor
  • Matsumoto, Erika
  • Ito, Hiroshi

Abstract

The present invention efficiently performs analysis regarding the amount of an analyte and analysis regarding an element. An analysis device (100) comprises a radiation source, a detector (5), and an analysis unit (6). The radiation source irradiates particulate matter (FP) with radiation. The detector (5) detects transmitted radiation passing through the particulate matter (FP) and a fluorescent X-ray generated through the irradiation of the particulate matter (FP) with radiation. The analysis unit (6) performs analysis regarding the amount of the particulate matter (FP) on the basis of the transmitted radiation detected by the detector (5), and performs analysis regarding an element contained in the particulate matter (FP) on the basis of the fluorescent X-ray detected by the detector (5).

IPC Classes  ?

  • G01N 23/2206 - Combination of two or more measurements, at least one measurement being that of secondary emission, e.g. combination of secondary electron [SE] measurement and back-scattered electron [BSE] measurement
  • G01N 1/02 - Devices for withdrawing samples
  • G01N 23/02 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material
  • G01N 23/223 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence

99.

FUEL CELL EVALUATION SYSTEM, INCLINATION TEST DEVICE, FUEL CELL EVALUATION METHOD, AND PROGRAM FOR FUEL CELL EVALUATION SYSTEM

      
Application Number JP2024020546
Publication Number 2024/262315
Status In Force
Filing Date 2024-06-05
Publication Date 2024-12-26
Owner HORIBA, LTD. (Japan)
Inventor
  • Mizutaka, Toshio
  • Tabata, Kunio
  • Komada, Mineyuki

Abstract

This fuel cell evaluation system evaluates a test piece that is a fuel cell to be mounted on a movable body or a portion of the fuel cell, the fuel cell evaluation system comprising: a hydrogen gas supply line for supplying hydrogen gas to the test piece; an electric discharge unit that controls an electric discharge load on the test piece; and an inclination test device that has a mounting base on which the test piece is mounted and that inclines the mounting base so as to change the orientation of the test piece according to the movement state of the movable body.

IPC Classes  ?

  • H01M 8/04 - Auxiliary arrangements, e.g. for control of pressure or for circulation of fluids
  • H01M 8/00 - Fuel cellsManufacture thereof
  • H01M 8/04746 - PressureFlow

100.

METHOD FOR GENERATING DATA FOR PARTICLE ANALYSIS, NON-TRANSITORY COMPUTER PROGRAM FOR GENERATING DATA FOR PARTICLE ANALYSIS, AND DEVICE FOR GENERATING DATA FOR PARTICLE ANALYSIS

      
Application Number 18813339
Status Pending
Filing Date 2024-08-23
First Publication Date 2024-12-19
Owner HORIBA, Ltd. (Japan)
Inventor
  • Koshikawa, Hiroyuki
  • Akiyama, Hisashi
  • Mori, Tetsuya
  • Matsuo, Kosuke
  • Nakatani, Hitoshi
  • Katsuda, Toshihiro

Abstract

In relation to application of artificial intelligence to image analysis of particles, to make it possible to provide data for machine learning corresponding to user demands while making it possible to reduce, as much as possible, man-hours taken to, for example, prepare vast amounts of actual image data obtained by actually capturing images of particles, the present invention generates virtual particle image data, which is image data of a virtual particle, on the basis of a predetermined condition, generates label data corresponding to the virtual particle, and associates the virtual particle image data with the label data.

IPC Classes  ?

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