- All sections
- G - Physics
- G21K - Techniques for handling particles or ionising radiation not otherwise provided forirradiation devicesgamma ray or x-ray microscopes
- G21K 1/14 - Arrangements for handling particles or ionising radiation, e.g. focusing or moderating using charge exchange devices, e.g. for neutralising or changing the sign of the electrical charges of beams
Patent holdings for IPC class G21K 1/14
Total number of patents in this class: 38
10-year publication summary
2
|
3
|
9
|
6
|
1
|
1
|
0
|
0
|
1
|
1
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Kaneka Corporation | 4487 |
6 |
Tae Technologies, Inc. | 237 |
5 |
Riken | 1688 |
4 |
Sumitomo Heavy Industries, Ltd. | 1867 |
3 |
Varian Semiconductor Equipment Associates, Inc. | 1235 |
2 |
Gigaphoton Inc. | 1214 |
2 |
Balakin, Andrey Vladimirovich | 65 |
2 |
Balakin, Pavel Vladimirovich | 65 |
2 |
NGK Insulators, Ltd. | 4909 |
1 |
LAM Research AG | 190 |
1 |
Bondtech Co., Ltd. | 62 |
1 |
ION Beam Applications S.A. | 186 |
1 |
Japan Atomic Energy Agency | 90 |
1 |
National University Corporation Nagoya University | 864 |
1 |
Sunje HiTek Co., Ltd. | 6 |
1 |
The Trustees of Princeton University | 1203 |
1 |
The University Court of the University of Glasgow | 243 |
1 |
IonQ, Inc. | 274 |
1 |
University Court of University of Glasgow | 1 |
1 |
PESCO Co., Ltd. | 2 |
1 |
Other owners | 0 |