- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/26 - Testing of individual semiconductor devices
Patent holdings for IPC class G01R 31/26
Total number of patents in this class: 4838
10-year publication summary
|
343
|
306
|
349
|
293
|
314
|
292
|
301
|
290
|
270
|
151
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Advantest Corporation | 1831 |
212 |
| Samsung Electronics Co., Ltd. | 144143 |
126 |
| Texas Instruments Incorporated | 19487 |
118 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 42118 |
118 |
| Mitsubishi Electric Corporation | 45811 |
109 |
| Tokyo Electron Limited | 12540 |
108 |
| Infineon Technologies AG | 8199 |
89 |
| International Business Machines Corporation | 61023 |
70 |
| Kabushiki Kaisha Nihon Micronics | 382 |
54 |
| Fuji Electric Co., Ltd. | 5106 |
46 |
| Samsung Display Co., Ltd. | 34230 |
43 |
| Hamamatsu Photonics K.K. | 4388 |
42 |
| Intel Corporation | 46699 |
41 |
| Enplas Corporation | 888 |
41 |
| SK Hynix Inc. | 11222 |
39 |
| Changxin Memory Technologies, Inc. | 4926 |
38 |
| Renesas Electronics Corporation | 6041 |
37 |
| Teradyne, Inc. | 546 |
37 |
| Robert Bosch GmbH | 42450 |
34 |
| NHK Spring Co., Ltd. | 1821 |
33 |
| Other owners | 3403 |