- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/24 - AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
Patent holdings for IPC class G01Q 60/24
Total number of patents in this class: 316
10-year publication summary
|
29
|
23
|
29
|
21
|
19
|
34
|
28
|
14
|
18
|
6
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Bruker Nano, Inc. | 339 |
26 |
| Taiwan Semiconductor Manufacturing Company, Ltd. | 42704 |
11 |
| The Regents of the University of California | 19918 |
8 |
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2376 |
8 |
| Shimadzu Corporation | 6169 |
6 |
| Board of Regents, The University of Texas System | 5793 |
5 |
| UT-Battelle, LLC | 1455 |
5 |
| International Business Machines Corporation | 61228 |
4 |
| Olympus Corporation | 13182 |
4 |
| Carl Zeiss SMT GmbH | 2978 |
4 |
| A.L.M. Holding Company | 85 |
4 |
| Ergon Asphalt & Emulsions, Inc. | 117 |
4 |
| Oxford Instruments Asylum Research, Inc. | 31 |
4 |
| Saudi Arabian Oil Company | 13155 |
4 |
| Quantum Silicon Inc. | 25 |
4 |
| Molecular Vista, Inc. | 15 |
4 |
| Hitachi, Ltd. | 15484 |
3 |
| Applied Materials Israel, Ltd. | 613 |
3 |
| Korea Advanced Institute of Science and Technology | 4376 |
3 |
| Dalian University of Technology | 1520 |
3 |
| Other owners | 199 |