• All sections
  • G - Physics
  • G01N - Investigating or analysing materials by determining their chemical or physical properties
  • G01N 23/205 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials using diffraction cameras

Patent holdings for IPC class G01N 23/205

Total number of patents in this class: 108

10-year publication summary

10
7
12
8
22
8
11
5
4
0
2016 2017 2018 2019 2020 2021 2022 2023 2024 2025

Principal owners for this class

Owner
All patents
This class
Rigaku Corporation
426
18
Nottingham Trent University
87
7
Cranfield University
87
6
California Institute of Technology
3966
4
KLA Corporation
1503
4
Paul Scherrer Institut
284
3
Japan Science and Technology Agency
1344
2
FEI Company
934
2
KLA-Tencor Corporation
2546
2
Shin-Etsu Handotai Co., Ltd.
1287
2
Sigray, Inc.
77
2
The University of Tokyo
4146
2
Xnovo Technology ApS
10
2
LM WP Patent Holding A/S
260
2
Bruker AXS, LLC
23
2
Halo X-Ray Technologies Limited
6
2
Halliburton Energy Services, Inc.
20730
1
The Regents of the University of California
19803
1
International Business Machines Corporation
60907
1
Centre National de La Recherche Scientifique
10311
1
Other owners 42