• All sections
• G - Physics
• G01N - Investigating or analysing materials by determining their chemical or physical properties
• G01N 23/205 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using diffraction of the radiation by the materials, e.g. for investigating crystal structureInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materialsInvestigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by using reflection of the radiation by the materials using diffraction cameras

Patent holdings for IPC class G01N 23/205

Total number of patents in this class: 108

10-year publication summary

Principal owners for this class