- All sections
- G - Physics
- G01B - Measuring length, thickness or similar linear dimensionsmeasuring anglesmeasuring areasmeasuring irregularities of surfaces or contours
- G01B 9/02055 - Reduction or prevention of errorsTestingCalibration
Patent holdings for IPC class G01B 9/02055
Total number of patents in this class: 276
10-year publication summary
|
1
|
3
|
1
|
6
|
10
|
29
|
40
|
57
|
65
|
32
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| ASML Netherlands B.V. | 7385 |
13 |
| Carl Zeiss SMT GmbH | 2978 |
12 |
| Centre National de La Recherche Scientifique | 10418 |
6 |
| Ecole Superieure de Physique et de Chimie Industrielles de La Ville de Paris | 351 |
6 |
| Kineolabs, Inc. | 18 |
6 |
| ams International AG | 429 |
5 |
| Leica Microsystems CMS GmbH | 1090 |
5 |
| Leica Microsystems Inc. | 23 |
5 |
| Tokyo Seimitsu Co., Ltd. | 339 |
5 |
| KLA Corporation | 1549 |
5 |
| Massachusetts Institute of Technology | 10057 |
4 |
| Mitutoyo Corporation | 1249 |
4 |
| Orbotech Ltd. | 230 |
4 |
| Precitec Optronik GmbH | 76 |
4 |
| Silixa Ltd. | 95 |
4 |
| California Institute of Technology | 3976 |
3 |
| Omron Corporation | 7261 |
3 |
| Hamamatsu Photonics K.K. | 4417 |
3 |
| ADIGE S.p.A. | 53 |
3 |
| Energetiq Technology, Inc. | 49 |
3 |
| Other owners | 173 |