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2025
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P/S
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Equipment used to test thin film materials, wafers, and
semiconductor chips, including, chiplets... |
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2024
|
P/S
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Equipment in the nature of metrology systems consisting of wafer probers, microscopes, nanopositi... |
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|
Invention
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Methods and techniques for testing light emitting devices. Methods and techniques for testing lig... |
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|
Invention
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Methods and techniques for determining when a probe tip is proximate to or in contact with a samp... |
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2023
|
Invention
|
Microscope objective adapter for testing semiconductors and thin film materials.
An objective ad... |
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|
Invention
|
Microscope objective adapter for testing semiconductors and thin film materials. An objective ada... |
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2022
|
Invention
|
Systems and methods for manufacturing nano-electro-mechanical-system probes.
A method for implem... |
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|
Invention
|
Probe head with replaceable probe board.
A probe head comprising of pogo pins and a slot for acc... |
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|
Invention
|
Probe head with replaceable probe board. A probe head comprising of pogo pins and a slot for acce... |
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2021
|
Invention
|
Systems and methods for manufacturing nano-electro-mechanical-system probes. Systems and methods ... |
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2020
|
Invention
|
Functional prober chip. Systems, devices, and methods for characterizing semiconductor devices an... |
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|
Invention
|
Fine pitch probe card. A probe chip consisting of multiple probes integrated on a single substrat... |
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Invention
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Multiple integrated tips scanning probe microscope. Device and system for characterizing samples ... |
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2018
|
Invention
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Multiple integrated tips scanning probe microscope with pre-alignment components. Device and syst... |
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2017
|
P/S
|
Semiconductor devices Design, engineering, research, development and testing services in the fiel... |
|
2016
|
Invention
|
Multiple integrated tips scanning probe microscope.
Device and system for characterizing samples... |
