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2025
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P/S
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Microscopes; Downloadable and recorded software for use in laboratory operations; Downloadable an... |
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P/S
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Software and hardware for operating probe-based instruments, namely, scanning probe microscopes a... |
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P/S
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Software and Hardware for operating probe-based instruments, namely, scanning probe microscopes a... |
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Invention
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Probe-based instrument and method using torsional oscillation sensing.
A method and apparatus of... |
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Invention
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Probe-based instrument and method using torsional oscillation sensing. A method and apparatus of ... |
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Invention
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Atomic force microscope based infrared spectroscopy with multiple laser pulse repetition rate exc... |
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P/S
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Probe-based instruments, namely, scanning probe microscopes
including atomic force microscopes. |
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Invention
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Method and apparatus of magnetic property measurement using an afm operating in a force mapping a... |
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Invention
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Nanoscale dynamic mechanical analysis via atomic force microscopy (afm-ndma).
An atomic-force-mi... |
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2024
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P/S
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Software and hardware for operating probe-based instruments,
namely, scanning probe microscopes ... |
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Invention
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Testing assembly including a multiple degree of freedom stage.
A multiple degree of freedom samp... |
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P/S
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Probe-based instruments, namely, scanning probe microscopes including atomic force microscopes |
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Invention
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Atomic force microscopy probe with tilted tip and method of fabrication thereof.
A method of bat... |
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Invention
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Environmental conditioning mechanical test system.
Among other things, a heating jacket configur... |
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Invention
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Chemical-mechanical polishing system with a potentiostat and pulsed-force applied to a workpiece.... |
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P/S
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Downloadable and recorded computer software for operating scanning probe microscopes and atomic f... |
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Invention
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Debris removal from high aspect structures.
A debris collection and metrology system for collect... |
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Invention
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Nanoscale dynamic mechanical analysis via atomic force microscopy (afm-ndma). An atomic-force-mic... |
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P/S
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Probe-based instruments, namely, atomic force microscopes
and recorded operating software sold a... |
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2023
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P/S
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Recorded and downloadable software for operating probe-based instruments in the fields of manufac... |
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Invention
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Nano-mechanical infrared spectroscopy system and method using gated peak force ir. An apparatus a... |
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Invention
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Nano-mechanical infrared spectroscopy system and method using gated peak force ir.
An apparatus ... |
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Invention
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Method of analyzing metrology data. The preferred embodiments are directed to a metrology method ... |
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Invention
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Method of analyzing metrology data.
The preferred embodiments are directed to a metrology method... |
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Invention
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Spectroscopic ellipsometry system for thin film imaging.
An imaging spectroscopic ellipsometry a... |
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P/S
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Metrology instruments, namely, scanning probe microscopes |
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P/S
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Probe-based instruments, namely, atomic force microscopes,
and software for operating probe-base... |
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P/S
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Microscopes, and accessories therefor, namely, a holographic
image generation attachment. |
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Invention
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Debris removal from high aspect structures. A debris collection and metrology system for collecti... |
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2022
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Invention
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Imaging spectropolarimeter and sample characterization methodology utilizing the same. An imaging... |
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Invention
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Large radius probe. A large radius probe for a surface analysis instrument such as an atomic forc... |
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P/S
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Probe-based instruments, namely, atomic force microscopes, and recorded software for operating pr... |
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P/S
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Tribology and micromechanical testing instruments. |
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Invention
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Afm imaging with metrology-preserving real time denoising. A method of operating an atomic force ... |
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P/S
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Probe-based instrument used to acquire data corresponding to
submicron scale sample features. |
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P/S
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probe-based instruments, namely, atomic force microscopes and recorded operating software sold as... |
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P/S
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Tribology and micromechanical testing instruments, namely, tribometers and mechanical testers in ... |
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P/S
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microscopes, and accessories therefor, namely, a holographic image generation attachment |
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2021
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Invention
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Testing assembly including a multiple degree of freedom stage. A multiple degree of freedom sampl... |
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P/S
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probe-based instrument, namely, scanning probe microscopes, in particular, an atomic force micros... |
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Invention
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Torsion wing probe assembly. A torsional probe for a metrology instrument includes a cantilever c... |
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Invention
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Silicon nitride x-ray window and method of manufacture for x-ray detector use. A method for produ... |
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Invention
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Methods and systems for inspecting integrated circuits based on x-rays. In one embodiment, an aut... |
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Invention
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Method and apparatus of atomic force microscope based infrared spectroscopy with controlled probi... |
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Invention
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Afm imaging with real time drift correction. A system and method of operating an atomic force mic... |
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Invention
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Device, and method of manufacture, for use in mechanically cleaning nanoscale debris from a sampl... |
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Invention
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Metrology probe with built-in angle and method of fabrication thereof. A method of batch-fabricat... |
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Invention
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Debris removal in high aspect structures. A debris collection and metrology system for collecting... |
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Invention
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Super-resolution x-ray imaging method and apparatus.
In one embodiment, a computing system may o... |
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Invention
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Afm imaging with creep correction. An atomic force microscope (AFM) and method of operating the s... |
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Invention
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Methods and systems for printed circuit board design based on automatic corrections. In one embod... |
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Invention
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High speed atomic force profilometry of large areas. An apparatus and method of operating an atom... |
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Invention
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Chemical-mechanical polishing system and method of operating the same. Shortcomings associated wi... |
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Invention
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Method and apparatus for resolution and sensitivity enhanced atomic force microscope based infrar... |
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2020
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P/S
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Downloadable industrial process control software; Electro-optical instruments for use in inspecti... |
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Invention
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Methods and systems for defects detection and classification using x-rays. In one embodiment, an ... |
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Invention
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Devices processed using x-rays. In one embodiment, an automated high-speed X-ray inspection tool ... |
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2018
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P/S
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Software employed to operate scanning probe microscopes, including atomic force microscopes |
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P/S
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scanning probe microscopes; software for operating scanning probe microscopes |
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2017
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P/S
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Software for operating probe-based instruments in the fields of manufacturing and scientific rese... |
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Invention
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Spectroscopic ellipsometry system for thin film imaging. A spectroscopic ellipsometry system and ... |
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P/S
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Photomask repair systems comprising hardware and software for the removal and mitigation of haze ... |
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2016
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P/S
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software for operating probe-based instruments in the fields of manufacturing and scientific rese... |
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2015
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P/S
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Apparatus and software for metrology instruments, namely,
scanning probe microscopes (SPMs), ato... |
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P/S
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Metrology instruments, namely, scanning probe microscopes
(SPMs) and atomic force microscopes (A... |
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P/S
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Metrology devices, namely, surface profiling machines and optical microscopes for characterizing ... |
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2014
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P/S
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Apparatus and software for metrology instruments, namely, scanning probe microscopes (SPMs), atom... |
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P/S
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Metrology instruments, namely, scanning probe microscopes (SPMs) and atomic force microscopes (AFMs) |
|
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P/S
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Metrology instrumentation, namely, scanning probe microscopes (SPMs) and atomic force microscopes... |
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P/S
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Apparatus, test instruments and probes for conducting enhanced micromechanical and nanomechanical... |
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2013
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P/S
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probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; softwar... |
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P/S
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Electronic controllers and software for operating
nanomechanical testing instruments and accesso... |
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P/S
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metrology tools for surface analysis and software for enhancing high performance of nanoscale met... |
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P/S
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Electronic controllers and software for operating nanomechanical testing instruments and accessories |
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2011
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P/S
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Software for metrology tools, namely, analysis software for atomic force microscopes |
|
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P/S
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Probe-based instruments, namely scanning probe microscopes
and atomic force microscopes; softwar... |
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P/S
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Surface measurement equipment comprised of stylus based surface profilers, and probes and compute... |
|
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P/S
|
Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; Softwar... |
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P/S
|
Probe-based instruments, namely, scanning probe microscopes and atomic force microscopes; softwar... |
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2010
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P/S
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Computer software used in connection with metrology instruments or on a standalone basis for meas... |
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P/S
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Metrology devices, namely, surface profiling machines for measuring surface primary form, surface... |
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P/S
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photomask repair systems comprising hardware and software for the removal and mitigation of haze ... |
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P/S
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photomask repair systems comprising hardware and software for the removal of debris and defects o... |
