Xcerra Corporation

États‑Unis d’Amérique


 
Quantité totale PI 90
Quantité totale incluant filiales 107 (+ 17 pour les filiales)
Rang # Quantité totale PI 14 754
Note d'activité PI 2/5.0    15
Rang # Activité PI 57 382
Activité incl filiales 1,9/5.0    22
Classe Nice dominante Appareils et instruments scienti...

Brevets

Marques

57 4
1 1
24 0
3
 
Dernier brevet 2023 - System and method for attenuatin...
Premier brevet 1988 - Sine wave generator using a cord...
Dernière marque 2015 - ACCORDION
Première marque 1983 - POGO

Filiales

1 subsidiaries with IP (10 patents, 7 trademarks)

2 subsidiaries without IP

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Industrie (Classification de Nice)

Derniers inventions, produits et services

2023 Invention System and method for attenuating and/or terminating rf circuit. A high-speed circuit assembly i...
2022 Invention Reflective and interference controlled absorptive contactor. An apparatus (100) including a conta...
2021 Invention Reflective and interference controlled absorptive contactor. An apparatus including a contactor ...
Invention Calibration system. A verification probe system is configured to verify an automated test platfor...
Invention System and method for attenuating and/or terminating rf circuit. A high-speed circuit assembly in...
2020 Invention Dielectric resonating test contactor and method. A test contactor is disclosed. The test contacto...
Invention Coaxial probe. An apparatus and method for the manufacturing and use in a semiconductor test syst...
Invention Test socket assembly with waveguide antenna probe. A test socket assembly including a contactor b...
2019 Invention Test probe assembly for high frequency device characterization. A test probe assembly includes a...
Invention High frequency circuit with radar absorbing material termination component and related methods. ...
Invention High frequency circuit with radar absorbing material termination component and related methods. A...
Invention Hybrid probe head assembly for testing a wafer device under test. A hybrid probe head assembly fo...
Invention Capacitive test needle for measuring electrically conductive layers in printed circuit board hole...
2018 Invention Test socket assembly with hybrid ring coupler and related methods. A test socket assembly include...
Invention Test socket assembly with antenna and related methods. A test socket assembly includes a contacto...
Invention Test socket assembly with waveguide transition and related methods. A test socket assembly includ...
Invention Test socket assembly and related methods. A test socket assembly for coupling a device under test...
Invention Test socket assembly with linear spring damper assisted cantilever contacts. A test socket assemb...
Invention Testing device and method for testing a printed circuit boards. The invention relates to a testin...
2017 Invention Spring-loaded probe having folded portions and probe assembly. A test probe for use with a testin...
Invention Test socket assembly and related methods. A socket assembly including a housing that has one or m...
Invention Multi-node testing system and method. An automated microtester array, for simultaneously testing ...
Invention Multi-node testing system and method. An automated microtester, for simultaneously testing a plur...
Invention Multi-node testing system and method. An automated microtester, for simultaneously testing a plu...
Invention Multi-node testing system and method. An automated microtester array, for simultaneously testing...
Invention Link socket sliding mount with preload. A test socket with a link and mount system is used to cou...
Invention Testing system and method. A method, computer program product, computing system, and an automated...
2016 Invention Compact testing system. An automated test platform includes a CPU subsystem housed in an enclosur...
Invention Compact testing system. An automated test platform includes a CPU subsystem housed in an enclosu...
Invention Positioning device for a parallel tester for testing printed circuit boards and parallel tester f...
2015 P/S Electrical connectors, contacts and test probes. Design of electrical connectors, contacts and te...
Invention Integrated circuit chip tester with embedded micro link. A contact for testing an integrated circ...
Invention Debugging system and method. A debugging system for debugging an automated test process used on ...
Invention Debugging system and method. A method, computer program product, and computing system for electr...
Invention Debugging system and method. A debugging system for debugging an automated test process used on a...
Invention Debugging system and method. A method, computer program product, and computing system for defini...
Invention Integrated circuit (ic) test socket with faraday cage background. An integrated circuit test sock...
Invention Automated test platform for testing short circuits. An automated test platform for testing a firs...
2014 Invention Integrated circuit chip tester with an anti-rotation link. A socket for testing or connecting an ...
2005 P/S Printed circuit board probing and testing equipment, testers, test fixtures and kits for making t...
P/S Testers, test fixtures, and test fixture kits for printed wiring boards; components for all the a...
P/S PRINTED CIRCUIT BOARD PROBING AND TESTING EQUIPMENT, NAMELY, TESTERS; TEST FIXTURES; KITS FOR MAK...
1992 P/S printed wiring board probing and testing equipment; namely, testers, test fixtures, and kits for ...
1987 P/S ELECTRICAL WIRE TERMINATION RECEPTACLE FOR MINIATURE SPRING PROBES
1983 P/S Electrical contacts.