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Résultats pour
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1.
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METHOD AND APPARATUS FOR PRODUCING A HIGH GAIN FREE ELECTRON LASER USING A LARGE ENERGY SPREAD ELECTRON BEAM
Numéro d'application |
18767577 |
Statut |
En instance |
Date de dépôt |
2024-07-09 |
Date de la première publication |
2024-10-31 |
Propriétaire |
Lyra Acquisition Holdings LLC (USA)
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Inventeur(s) |
- Loewen, Roderick J.
- Ruth, Ronald D.
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Abrégé
A system including an electron beam source for providing an electron beam and at least one undulator system configured to produce free-electron laser (FEL) radiation is described. The undulator system includes undulators and at least one optical section between the undulators. The undulators are configured to induce the electron beam to microbunch and radiate coherently. The optical section(s) are configured to operate on the electron beam and the FEL radiation generated by the electron beam.
Classes IPC ?
- H01S 3/09 - Procédés ou appareils pour l'excitation, p. ex. pompage
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2.
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Method and apparatus for producing a high gain free electron laser using a large energy spread electron beam
Numéro d'application |
17105178 |
Numéro de brevet |
12057674 |
Statut |
Délivré - en vigueur |
Date de dépôt |
2020-11-25 |
Date de la première publication |
2022-05-26 |
Date d'octroi |
2024-08-06 |
Propriétaire |
Lyra Acquisition Holdings LLC (USA)
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Inventeur(s) |
- Loewen, Roderick J.
- Ruth, Ronald D.
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Abrégé
A system including an electron beam source for providing an electron beam and at least one undulator system configured to produce free-electron laser (FEL) radiation is described. The undulator system includes undulators and at least one optical section between the undulators. The undulators are configured to induce the electron beam to microbunch and radiate coherently. The optical section(s) are configured to operate on the electron beam and the FEL radiation generated by the electron beam.
Classes IPC ?
- H01S 3/09 - Procédés ou appareils pour l'excitation, p. ex. pompage
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3.
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Compact storage ring extreme ultraviolet free electron laser
Numéro d'application |
15438611 |
Numéro de brevet |
10193300 |
Statut |
Délivré - en vigueur |
Date de dépôt |
2017-02-21 |
Date de la première publication |
2018-08-23 |
Date d'octroi |
2019-01-29 |
Propriétaire |
LYRA ACQUISITION HOLDINGS LLC (USA)
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Inventeur(s) |
- Ruth, Ronald D.
- Loewen, Roderick J.
- Feser, Michael
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Abrégé
A high power extreme ultraviolet (EUV) beam is produced. An electron beam is injected in a compact electron storage ring configured for emission of free-electron laser (FEL) radiation. The electron beam is passed through a magnetic undulator on each of a plurality of successive revolutions of the electron beam around the compact electron storage ring. The electron beam is induced to microbunch and radiate coherently while passing through the magnetic undulator. A portion of the free-electron laser radiation at an extreme ultraviolet wavelength produced by an interaction of the electron beam through the magnetic undulator is outputted.
Classes IPC ?
- H01S 3/0959 - Procédés ou appareils pour l'excitation, p. ex. pompage utilisant le pompage par des particules de haute énergie par un faisceau d'électrons
- H01S 4/00 - Dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans des gammes d’ondes autres que celles couvertes par les groupes , ou , p. ex. masers à phonon, lasers à rayons X ou lasers gamma
- G03F 7/20 - ExpositionAppareillages à cet effet
- H01S 3/09 - Procédés ou appareils pour l'excitation, p. ex. pompage
- H05H 9/04 - Accélérateurs linéaires à ondes stationnaires
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4.
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Measurement of critical dimensions of nanostructures using X-ray grazing incidence in-plane diffraction
Numéro d'application |
15065637 |
Numéro de brevet |
10060865 |
Statut |
Délivré - en vigueur |
Date de dépôt |
2016-03-09 |
Date de la première publication |
2016-09-15 |
Date d'octroi |
2018-08-28 |
Propriétaire |
LYRA ACQUISITION HOLDINGS LLC (USA)
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Inventeur(s) |
- Ruth, Ronald D.
- Loewen, Roderick J.
- Gifford, Martin A.
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Abrégé
The manufactured structure is illuminated with an x-ray beam. The manufactured structure is positioned at a selected grazing angle and a selected rotation angle with respect to the x-ray beam. The selected rotation angle has been selected to enhance in-plane diffraction of reflections of the x-ray beam by the manufactured structure. A grazing in-plane diffraction beam produced by interference with the periodic feature is detected. A property of the grazing in-plane diffraction beam is determined by the critical dimension.
Classes IPC ?
- G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
- G01B 15/00 - Dispositions pour la mesure caractérisées par l'utilisation d'ondes électromagnétiques ou de radiations de particules, p. ex. par l'utilisation de micro-ondes, de rayons X, de rayons gamma ou d'électrons
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