Magneto-Optical Trap Device, Physics Package, Physics Package for Optical Lattice Clock, Physics Package for Atomic Clock, Physics Package for Atomic Interferometer, Physics Package for Quantum Information Processing Device, and Physics Package System
In this magneto-optical trap device, five laser beams are irradiated in a trap space in which atoms are trapped. Of the five laser beams, three laser beams (laser beams a1, a2, a3) pass through the inside of the same plane (Z plane) and are irradiated in the trap space. The two laser beams that intersect that plane (laser beams a4, a5) are irradiated in the trap space. The laser beam a1 is used together as a slowing laser beam b for Zeeman slower.
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
G06N 10/40 - Réalisations ou architectures physiques de processeurs ou de composants quantiques pour la manipulation de qubits, p. ex. couplage ou commande de qubit
G21K 1/00 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer
H03L 7/26 - Commande automatique de fréquence ou de phaseSynchronisation utilisant comme référence de fréquence les niveaux d'énergie de molécules, d'atomes ou de particules subatomiques
2.
Charged Particle Gun and Charged Particle Beam System
There is provided a charged particle gun capable of increasing the number of charged particles contained in each pulse. The charged particle gun operates to emit a charged particle beam and includes: an emitter, an extraction electrode for extracting the charged particle beam from the emitter, a capacitor having one end connected to the extraction electrode, an offset power supply for supplying a first voltage to the one end of the capacitor via a resistor, a pulsed power supply providing an output of a second voltage, and a switch circuit that switches between whether the second voltage or a reference potential is supplied to the other end of the capacitor, based on a reference pulsed signal.
A derivatization reagent comprising a compound represented by Formula (1):
A derivatization reagent comprising a compound represented by Formula (1):
RR′CO (1),
A derivatization reagent comprising a compound represented by Formula (1):
RR′CO (1),
In Formula (1), R and R′ are each independently a hydrogen atom, a substituted or unsubstituted alkyl group having 1 to 11 carbon atoms, or a substituted or unsubstituted aryl group having 1 to 11 carbon atoms.
G01N 33/68 - Analyse chimique de matériau biologique, p. ex. de sang ou d'urineTest par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligandsTest immunologique faisant intervenir des protéines, peptides ou amino-acides
G01N 33/58 - Analyse chimique de matériau biologique, p. ex. de sang ou d'urineTest par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligandsTest immunologique faisant intervenir des substances marquées
A focused ion beam (FIB) system capable of preventing a film from being deposited thickly on the surface of a sample The FIB system operates to mill the sample by irradiating it with an ion beam. The FIB system includes an FIB column through which the ion beam is directed at the sample; a nozzle having a blowoff port for blowing a gas against the sample to deposit the film; a sample stage providing mechanical support of the sample; a shield member for impeding the flow of the gas; and a shield support member. The shield member is movable to a shield position located between the blowoff port and the sample. The shield member is also movable to a retractive position not located therebetween. The shield member support mechanism supports the shield member so that it can move between the shield position and the retractive position of the shield member.
C23C 14/22 - Revêtement par évaporation sous vide, pulvérisation cathodique ou implantation d'ions du matériau composant le revêtement caractérisé par le procédé de revêtement
C23C 14/54 - Commande ou régulation du processus de revêtement
H01J 37/305 - Tubes à faisceau électronique ou ionique destinés aux traitements localisés d'objets pour couler, fondre, évaporer ou décaper
5.
Atom Beam Generation Device, Physics Package, Physics Package for Optical Lattice Clock, Physics Package for Atomic Clock, Physics Package for Atomic Interferometer, Physics Package for Quantum Information Processing Device, and Physics Package System
An atom beam generation device includes an atomic oven including a reservoir in which a sample is contained, a deceleration unit, and coil units. The deceleration unit includes a bore through which an atomic beam and a slowing laser beam pass, and decelerates an atomic beam emitted from the atomic oven by means of slowing laser beam and a magnetic field. The coil units supply Joule heat to the atomic oven, and generate a magnetic field in the deceleration unit.
H05H 3/02 - Production d'un faisceau moléculaire ou atomique, p. ex. d'un faisceau résonnant
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
6.
Build Data Generating Device, Three-Dimensional Powder Bed Fusion Additive Manufacturing System, and Cumulative Energy Density Distribution Display Method
Provided is a build data generating device that generates build data for controlling a three-dimensional powder bed fusion additive manufacturing (PBF-AM) apparatus that manufactures an article by melting a cross-sectional shape of each layer by irradiation of a beam. The build data generating device includes: a display control unit that generates data indicating a distribution of an irradiation energy density accumulated in a target layer by beam scanning for the target layer based on the build data and outputs the data to a display device.
B29C 64/393 - Acquisition ou traitement de données pour la fabrication additive pour la commande ou la régulation de procédés de fabrication additive
B29C 64/153 - Procédés de fabrication additive n’utilisant que des matériaux solides utilisant des couches de poudre avec jonction sélective, p. ex. par frittage ou fusion laser sélectif
B33Y 50/02 - Acquisition ou traitement de données pour la fabrication additive pour la commande ou la régulation de procédés de fabrication additive
A superconducting coil device includes a superconducting coil and adhesive layer. The superconducting coil includes a superconducting wire wound into a coil shape. An electrical conductivity is imparted to the adhesive layer. The adhesive layer constitutes at least a part of a current bypass for the superconducting coil. The adhesive layer includes a binder. The adhesive layer includes a resistance-decrease suppression structure that imparts the electrical conductivity to the adhesive layer while suppressing a decrease in contact resistance with the superconducting wire.
H01F 6/02 - Étouffement de la supraconductivitéDispositions pour la protection lors de la phase de transition vers l'état de conductivité normale
H01F 6/06 - Bobines, p. ex. dispositions pour l'enroulement, l'isolation, les enveloppes ou les bornes des bobines
8.
Build Data Generating Device, Three-Dimensional Power Bed Fusion Additive Manufacturing System, and Three-Dimensional Power Bed Fusion Additive Manufacturing Method
Even when shape elements having opposing appropriate manufacturing conditions are mixed in one cross-sectional shape, the entire cross-sectional shape is manufactured under an appropriate manufacturing condition. A build data generating device generating build data for controlling a three-dimensional powder bed fusion additive manufacturing apparatus that manufactures an article by melting a cross-sectional shape of each layer by irradiation of a beam includes: a region segmentation unit that performs processing for segmenting the cross-sectional shape cut out from three-dimensional shape data of the article into a fine region and a coarse region; and a condition application unit that applies different manufacturing conditions to the fine region and the coarse region segmented by the region segmentation unit to generate the build data.
B22F 10/85 - Acquisition ou traitement des données pour la commande ou la régulation de procédés de fabrication additive
B22F 10/28 - Fusion sur lit de poudre, p. ex. fusion sélective par laser [FSL] ou fusion par faisceau d’électrons [EBM]
B22F 10/36 - Commande ou régulation des opérations des paramètres du faisceau d’énergie
B22F 12/90 - Moyens de commande ou de régulation des opérations, p. ex. caméras ou capteurs
B33Y 30/00 - Appareils pour la fabrication additiveLeurs parties constitutives ou accessoires à cet effet
B33Y 50/02 - Acquisition ou traitement de données pour la fabrication additive pour la commande ou la régulation de procédés de fabrication additive
9.
Build Data Generating Device, Three-Dimensional Powder Bed Fusion Additive Manufacturing System, and Three-Dimensional Powder Bed Fusion Additive Manufacturing Method
Provided is a technique capable of reducing variation in density of scanning lines when generating the scanning lines for manufacturing an article by three-dimensional powder bed fusion additive manufacturing. A build data generating device generates build data for controlling the three-dimensional powder bed fusion additive manufacturing apparatus that melts the cross-sectional shape of each layer by irradiation of a beam to manufacture the article. The build data generating device includes a build data generating unit that generates a plurality of scanning lines in a region of the cross-sectional shape cut out from three-dimensional shape data of the article by a predetermined beam scanning method, and generates correction scanning lines in a portion where the arrangement of the scanning lines becomes sparse and/or a portion where the arrangement of the scanning lines becomes dense.
An information processing apparatus includes: an irradiation point output unit configured to output an irradiation point of a manufacturing beam read from a manufacturing file to a display unit; a position specifying unit configured to specify a position of the irradiation point designated by an input unit; and a melting condition output unit 65 configured to search the manufacturing file for a melting condition of the irradiation point at the specified position and output the searched melting condition to the display unit.
A sample coil for NMR detection includes a first coil unit and a second coil unit placed with a sample therebetween. In the first coil unit, a first coil and a second coil are formed on a first plane of a first substrate. In the second coil unit, a third coil and a fourth coil are formed on a second plane of a second substrate. Each of the coils is a superconducting coil. When viewed from an x direction orthogonal to the first plane and the second plane, the first coil and the second coil do not intersect the sample, and, similarly, the third coil and the fourth coil do not intersect the sample.
G01N 24/08 - Recherche ou analyse des matériaux par l'utilisation de la résonance magnétique nucléaire, de la résonance paramagnétique électronique ou d'autres effets de spin en utilisant la résonance magnétique nucléaire
G01R 33/34 - Détails de structure, p. ex. résonateurs
An electron microscope includes an electron optical system that irradiates a sample with an electron beam to form an image with electrons transmitted through the sample, a camera that includes an image sensor having sensor pixels and captures frame images that are based on output values output from each of the sensor pixels by incidence of the electrons on the image sensor, and a correction coefficient calculation unit that calculates correction coefficients for correcting sensitivities of the sensor pixels. The correction coefficient calculation unit determines, from the frame images captured under a condition under which the electrons incident on the image sensor follow a Poisson process, a mode value of the output values for each of the sensor pixels, and calculates the correction coefficients based on the mode value determined for each of the sensor pixels.
A spectrum processing device includes a data acquiring unit configured to acquire, for each of pixels expressing positions on a specimen, spectrum imaging data in which a pixel spectrum based on a signal from the specimen is stored; an extraction unit configured to compare, for each of the pixels, the pixel spectrum and a representative spectrum selected from the spectrum imaging data, and extract a plurality of the pixel spectra from the spectrum imaging data, based on a comparison result; and a spectrum generating unit configured to generate a phase spectrum, based on the plurality of the extracted pixel spectra.
G01N 23/2251 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant des microsondes électroniques ou ioniques en utilisant des faisceaux d’électrons incidents, p. ex. la microscopie électronique à balayage [SEM]
G06T 7/73 - Détermination de la position ou de l'orientation des objets ou des caméras utilisant des procédés basés sur les caractéristiques
14.
Charged Particle Beam Apparatus and Camera Image Displaying Method
During an ascending process of a specimen unit, a camera image including a height guide is displayed. A display magnification controller increases a display magnification of the camera image in response to a representative height of the specimen unit having reached a magnification changing height. A protrusion amount computing unit computes a protrusion amount of a specimen from a specimen holder based on a height of the specimen holder at the time of accepting registration operation.
A multivariable analyzer executes multivariable analysis on a data set formed from a plurality of spectrograms acquired from a plurality of samples, and identifies a primary component of the data set, as a result of the multivariable analysis. Each spectrogram has a first coordinate system. A distribution generator generates a loading distribution corresponding to the primary component, as a result of the multivariable analysis. A plot generator generates a loading plot having a second coordinate system, based on the loading distribution. The second coordinate system is identical to the first coordinate system.
G16B 40/10 - Traitement du signal, p. ex. de spectrométrie de masse ou de réaction en chaîne par polymérase
G16H 50/20 - TIC spécialement adaptées au diagnostic médical, à la simulation médicale ou à l’extraction de données médicalesTIC spécialement adaptées à la détection, au suivi ou à la modélisation d’épidémies ou de pandémies pour le diagnostic assisté par ordinateur, p. ex. basé sur des systèmes experts médicaux
A retention index is calculated based on a detection time (more specifically, retention time) of a compound. A molecular weight range and a number-of-carbon-atoms range are specified based on the retention index. A search range is determined by the molecular weight range. A molecular peak searcher searches for a molecular peak in the search range which is set on a mass spectrum of the compound. A composition estimator estimates a composition of the compound based on an accurate mass specified from the molecular peak. In this process, the number-of-carbon-atoms range is taken into consideration.
An analysis device includes an electron beam source that irradiates a sample with a charged particle beam, and a detection unit having a plurality of detection regions that detects electrons emitted from the sample irradiated with the charged particle beam. The analysis device includes an arithmetic processing unit 100 that performs predetermined arithmetic processing on strength distribution of a plurality of detection signals respectively detected by the plurality of detection regions.
G01N 23/2251 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant des microsondes électroniques ou ioniques en utilisant des faisceaux d’électrons incidents, p. ex. la microscopie électronique à balayage [SEM]
G01N 23/203 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la rétrodiffusion
G01N 23/2206 - Combinaison de plusieurs mesures, l'une au moins étant celle d’une émission secondaire, p. ex. combinaison d’une mesure d’électrons secondaires [ES] et d’électrons rétrodiffusés [ER]
18.
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus and Method for Controlling Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus
A three-dimensional PBF-AM apparatus includes a build plate, a powder supply device, a beam irradiation device, a plurality of detection units, and a control unit. The control unit has a plurality of arithmetic expressions. Then, the control unit selects, according to a build step, a predetermined arithmetic expression from the plurality of arithmetic expressions, uses the selected arithmetic expression to perform arithmetic processing on a plurality of backscattered electron signals, and calculates an arithmetic signal.
B33Y 30/00 - Appareils pour la fabrication additiveLeurs parties constitutives ou accessoires à cet effet
B33Y 50/02 - Acquisition ou traitement de données pour la fabrication additive pour la commande ou la régulation de procédés de fabrication additive
19.
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus and Method for Controlling Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus
A three-dimensional PBF-AM apparatus includes a build plate; a powder supply device; a beam irradiation device; a detection unit; and a control unit that controls the powder supply device and the beam irradiation device. The control unit acquires a post-melting-of-preceding-layer backscattered electron signal that is a backscattered electron signal detected by the detection unit after the powder material was melted by the electron beam in the step of building the layer preceding the current layer. Then, based on the post-melting-of-preceding-layer backscattered electron signal, the control unit sets conditions for controlling the beam irradiation device in the melting step in the step of building the current layer.
A sample holder used for a sample processing apparatus that applies a charged particle beam to a sample to process the sample. The sample holder includes a holder base thermally connected to a cooling source, a rotating body rotatably supported on the holder base to hold the sample, and a drive unit that rotates the rotating body. The rotating body has a sliding surface that comes into slidable surface contact with the holder base.
A pyrolysis product library formed from a plurality of groups of predicted mass spectra corresponding to a plurality of resin candidates is created using a prediction model. An information processing unit generates a plurality of measured mass spectra corresponding to a plurality of compounds generated due to pyrolysis of a resin sample. Next, the information processing unit searches through the pyrolysis product library based on the plurality of measured mass spectra, to thereby judge one or a plurality of contained resins contained in the resin sample.
H01J 49/00 - Spectromètres pour particules ou tubes séparateurs de particules
H01J 49/04 - Dispositions pour introduire ou extraire les échantillons devant être analysés, p. ex. fermetures étanches au videDispositions pour le réglage externe des composants électronoptiques ou ionoptiques
22.
Electron Microscope, Aberration Correction Method, And Imaging Method
An electron microscope includes an electron optical system, and a control unit that controls the electron optical system. The control unit performs processing for determining a standard deviation of a brightness distribution of an electron microscope image; processing for determining an optimum value of a parameter of the electron optical system such that the standard deviation becomes the maximum, by Gaussian process regression; and processing for capturing the electron microscope image with setting a value of the parameter to the optimum value. The control unit repeats the processing for determining the standard deviation, the processing for determining the optimum value, and the processing for capturing the electron microscope image to determine a value of the parameter.
A specimen holder includes a holder main body, a specimen mount to which a specimen is to be fixed, and a pressing member which slidably presses the specimen mount against the holder main body. A through-hole is provided in the specimen mount, and the specimen mount is tilted with respect to the holder main body by tilting a rod-like member which is inserted into the through-hole.
Based on quantification ion peaks and identification ion peaks derived from a plurality of compounds, a plurality of first errors (or retention time errors) and a plurality of second errors (or peak ratio errors) are calculated. In a coordinate system with a first error axis and a second error axis, a plurality of elements representing error sets composed of the first errors and the second errors are plotted, and a chart is thereby created.
There is provided a shield plate fabrication apparatus capable of fabricating a shield plate easily. The shield plate is included in a sample milling apparatus which mills a sample by shielding a part of the sample with the shield plate and irradiating the sample with a charged particle beam. The fabrication apparatus includes: a base plate holding shaft for rotatably holding a base plate and winding tape around the base plate; and a tension mechanism for applying tension to the tape while it is being wound around the base plate.
B65H 35/00 - Délivrance d'articles à partir de machines à découper ou à perforer linéairementAppareils délivrant des articles ou des bandes, comportant des dispositifs pour couper ou perforer linéairement, p. ex. distributeurs de bande adhésive
B65H 59/06 - Réglage ou commande de la tension du matériau filiforme, p. ex. pour empêcher les vrillesUtilisation d'indicateurs de tension par régulation de la délivrance du matériau à partir du paquet d'approvisionnement par dispositifs agissant sur le matériau sortant du paquet
H01J 37/09 - DiaphragmesÉcrans associés aux dispositifs électronoptiques ou ionoptiquesCompensation des champs perturbateurs
26.
Collision Judgment Apparatus, Recording Medium Recording Program, and Collision Judgment Method
Based on a three-dimensional model of a dynamic object having a position which changes, point group information which represents, with a group of points, a three-dimensional shape of the dynamic object is generated. Based on a three-dimensional model of a static object having a position which does not change, point group information representing, with a group of points, a three-dimensional shape of the static object is generated. Based on the point group information of the static object, voxel group information which represents, with a group of voxels, the three-dimensional shape of the static object, and which is formed into a database is generated. Presence or absence of overlap between the dynamic object and the static object is judged by collating voxel group information representing the static object which is present on a movement path of the dynamic object, and point group information representing the dynamic object.
H01J 37/26 - Microscopes électroniques ou ioniquesTubes à diffraction d'électrons ou d'ions
27.
Slow Atomic Beam Generator, Physical Package, Physical Package For Optical Lattice Clock, Physical Package For Atomic Clock, Physical Package For Atomic Interferometer, Physical Package For Quantum Information Processing Device, And Physical Package System
A high-temperature tank includes an optical window which transmits a laser and is provided at one end, and a right-angle conical mirror which is provided at the other end, has an opening at the apex, and which reflects laser light incident from the optical window towards the one end in an area other than opening. A magnetic field generator generates a magnetic field in the region of intersection of the laser reflected by the right-angle conical mirror. A magnetic field gradient attenuation module locally attenuates the gradient of the magnetic field generated by the magnetic field generator.
H03L 7/26 - Commande automatique de fréquence ou de phaseSynchronisation utilisant comme référence de fréquence les niveaux d'énergie de molécules, d'atomes ou de particules subatomiques
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
An angle adjustment mechanism has a block, a projecting piece, and a connection mechanism. The projecting piece is fixed to a stator. The connection mechanism has elongated holes provided in the block and a shaft member provided in the projecting piece. The shaft member is inserted in the elongated holes. During a tilt angle adjustment process, the shaft member is caused to move in a sliding motion in the elongated holes. During a cooling process, the shaft member is also caused to move in a sliding motion in the elongated holes.
There is provided an electron microscope capable of reducing variations of aberrations due to thermal variations. The electron microscope includes an electron optical system having a built-in aberration corrector equipped with multipole elements each for producing a multipolar field. Each multipole element includes a plurality of magnetic polepieces. Each polepiece includes a magnetic core, a first coil wound around the core, and a second coil wound around the core. The first coil and the second coil produce a first multipolar field and a second multipolar field, respectively, when energized. The first and second multipolar fields are identical in terms of symmetry.
An analyzing method using an analyzer including a wavelength-dispersive X-ray spectrometer that has an analyzing element to analyze an X-ray emitted from a specimen and detects an X-ray of energy corresponding to a position of the analyzing element. The analyzing method includes acquiring a plurality of map data by repeatedly performing a mapping analysis while changing the position of the analyzing element, the mapping analysis being an analysis to detect an X-ray of specific energy with the position of the analyzing element fixed to acquire map data while scanning the specimen with an electron beam; and generating, based on the plurality of map data, a spectrum map in which a position on the specimen and an X-ray spectrum are associated with each other.
G01N 23/2209 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant la spectroscopie dispersive en longueur d’onde [WDS]
G01N 23/2252 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant des microsondes électroniques ou ioniques en utilisant des faisceaux d’électrons incidents, p. ex. la microscopie électronique à balayage [SEM] en mesurant les rayons X émis, p. ex. microanalyse à sonde électronique [EPMA]
H01J 37/147 - Dispositions pour diriger ou dévier la décharge le long d'une trajectoire déterminée
31.
Method of Adjusting Charged Particle Optical System and Charged Particle Beam Apparatus
A method of adjusting a charged particle optical system in a charged particle beam apparatus provided with the charged particle optical system including an aberration corrector in which multipole elements disposed in three or more stages and transfer optical systems are alternately disposed. The method includes adjusting aberration using at least two of the multipole elements without using at least one of the multipole elements, and adjusting parameters of the charged particle optical system other than aberration using at least one of the transfer optical systems that is not disposed between the at least two of the multipole elements used.
A stable isotope-labeled indole carboxylic acid compound represented by Formula (I) is provided. In Formula (I), X1 to X8 are each independently C or 13C; Y is N or 15N; M is H, Na, K, Li, CH3, or C2H5; R1 is H or D; R2 is H, CH3, 13CH3, C2H5, or 13C2H5; R3 is H, CH3, 13CH3, C2H5, or 13C2H5; R4 is H or D; and R5 is H or D.
A stable isotope-labeled indole carboxylic acid compound represented by Formula (I) is provided. In Formula (I), X1 to X8 are each independently C or 13C; Y is N or 15N; M is H, Na, K, Li, CH3, or C2H5; R1 is H or D; R2 is H, CH3, 13CH3, C2H5, or 13C2H5; R3 is H, CH3, 13CH3, C2H5, or 13C2H5; R4 is H or D; and R5 is H or D.
G01N 33/574 - Tests immunologiquesTests faisant intervenir la formation de liaisons biospécifiquesMatériaux à cet effet pour le cancer
C07D 209/42 - Atomes de carbone comportant trois liaisons à des hétéro-atomes, avec au plus une liaison à un halogène, p. ex. radicaux ester ou nitrile
G01N 33/96 - Analyse chimique de matériau biologique, p. ex. de sang ou d'urineTest par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligandsTest immunologique faisant intervenir un étalon de contrôle du sang ou du sérum
33.
Atom Beam Generation Device, Physical Package, Optical Lattice Clock Physical Package, Atomic Clock Physical Package, Atomic Interferometer Physical Package, Quantum Information Processing Device Physical Package, and Physical Package System
An atomic oven includes a cartridge and a main body. The cartridge includes a holder that accommodates an atom source; and a capillary nozzle. The main body includes: a housing in which the cartridge is installed; a button heater; an access opening for removing the cartridge from the main body and placing the cartridge into the main body, the access opening being provided on the atmosphere side, which is outside the main body; and a passage from the access opening to the housing. The cartridge is inserted into the main body through the access opening and is installed in the housing. The atom source is heated by the button heater, whereby atomic gas generated from the atom source is emitted as an atom beam to the vacuum side, which is outside the main body.
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
34.
Slow Atomic Beam Generator, Physical Package, Physical Package for Optical Lattice Clock, Physical Package for Atomic Clock, Physical Package for Atomic Interferometer, Physical Package for Quantum Information Processing Device, and Physical Package System
By heating a high-temperature bath with a heater, atomic gas is generated in the high-temperature bath from an atomic source. A magneto-optical trap is realized by a laser beam reflected by a right-angled conical mirror and a magnetic field formed by a magnetic field generator, and the atomic gas is confined by using the magneto-optical trap and cooled. The cooled atoms are output from an opening to the outside of a slow atom beam generator by a laser beam, which is a push laser beam. A slow atomic beam is thereby formed.
An estrogen derivatization method uses a quaternary cation-containing 5-fluoro-2,4-dinitrophenyl compound represented by Formula (1):
An estrogen derivatization method uses a quaternary cation-containing 5-fluoro-2,4-dinitrophenyl compound represented by Formula (1):
where in Formula (1), X is a quaternary cation. A mass spectrometry method includes derivatizing estrogen by the above estrogen derivatization method. A derivatization reagent derivatizing estrogen includes a quaternary cation-containing 5-fluoro-2,4-dinitrophenyl compound represented by Formula (1), where in Formula (1), X is a quaternary cation.
G01N 33/68 - Analyse chimique de matériau biologique, p. ex. de sang ou d'urineTest par des méthodes faisant intervenir la formation de liaisons biospécifiques par ligandsTest immunologique faisant intervenir des protéines, peptides ou amino-acides
A second polymer is prepared through derivatization of a first polymer. Kendrick Mass Defect (KMD) analysis is applied on a mass spectrum of the second polymer, to thereby produce a plot. Meanwhile, a plurality of mass candidates for a non-primary-chain segment are calculated based on a mass spectrum of the first polymer. The KMD analysis is applied on the plurality of mass candidates, to thereby produce reference images. A mass of the non-primary-chain segment is identified through matching of two KMD analysis results.
A laser beam illumination equipment has a laser beam generation section and a mirror unit. An image generation section has a camera and a camera controller. A laser beam illumination control section sets a pulse period of a laser beam to the same period as an exposure period of the camera. With this configuration, a state change of a specimen can be set uniform over exposure durations. A pulse train of the laser beam may be generated based on a synchronization signal which is output from the camera controller.
There is provided a sample milling apparatus capable of mitigating heat damage to a sample. The apparatus mills the sample by irradiating it with an ion beam and includes: an ion source for emitting the ion beam; and a shield plate placed on the sample and covering a part of the sample. The shield plate includes: a shield surface on which the ion beam impinges; and a bottom surface connected to the shield surface and forming a bottom edge. The bottom surface is smaller in area than the shield surface.
An electron microscope includes an irradiation optical system that irradiates a specimen with an electron beam, a specimen stage that supports the specimen, an image forming optical system that forms an image of electrons transmitted through the specimen, an imaging apparatus that captures an image formed by the image forming optical system, and a control unit that controls inclination of the specimen with respect to an incident direction of the electron beam. The irradiation optical system includes an aperture that cuts off a part of the electron beam to be irradiated to the specimen. The control unit acquires an image including Kikuchi bands that appear in a shadow region of the aperture, detects the Kikuchi bands in the shadow region of the aperture in the image, and controls inclination of the specimen with respect to the incident direction of the electron beam, based on the detected Kikuchi bands.
An electron beam accelerated using a first acceleration voltage is applied to respective positions on a sample to obtain spectra A at the respective positions, and an electron beam accelerated using a second acceleration voltage different from the first acceleration voltage is applied to the respective positions on the sample to obtain spectra B at the respective positions. Then, a spectral ratio A/B of the spectra is calculated at each of the positions to generate a waveform representing the spectral ratio A/B. The value of a spectral ratio A/B in an energy region of interest is extracted from each of the waveforms. The extracted values are mapped onto points corresponding to the respective positions on the sample, whereby a spectral map is generated. The spectral map is displayed.
G01N 23/2252 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant des microsondes électroniques ou ioniques en utilisant des faisceaux d’électrons incidents, p. ex. la microscopie électronique à balayage [SEM] en mesurant les rayons X émis, p. ex. microanalyse à sonde électronique [EPMA]
In various embodiments of the invention, a solid sample magic angle spinning nuclear magnetic resonance (NMR) probe can utilize an appropriate inductance parent coil with a fixed capacitor and introducing an idler coil with a variable capacitor which can inductively couple to the parent coil by adjusting the variable capacitance of the idler coil. By coupling the idler coil to the parent coil in this manner a double resonance circuit can be provided without the disadvantages of prior art coils. In an alternative embodiment of the invention, a solid sample magic angle spinning nuclear magnetic resonance probe can utilize an appropriate inductance parent coil with a fixed capacitor, introducing an idler coil with a variable capacitor in a first region and two variable inductor coupling coils and two coupling coils in a second region, where the two variable inductors are connected to the parent coil to reduce the number of coils in the sample region of the NMR probe, where variable inductors can inductively couple to the parent coil by adjusting one or both the capacitance of the variable capacitor of the idler coil and/or adjusting the variable inductors to observe a tuned condition between the parent coil and the idler coil.
A load unit jets a load gas from a cone-shaped slit to a first position located in a pathway. As a result, a first gas stream for loading a sample tube is generated. An eject unit jets an eject gas from a cone-shaped slit to a second position in the pathway. As a result, a second gas stream for ejecting a sample tube is generated.
Provided is a focused ion beam apparatus that machines a cross section of a specimen by scanning the specimen with an ion beam. The focused ion beam apparatus includes an optical system that scans the specimen with the ion beam, a receiving unit that receives setting of a machining region of the specimen and setting of a plurality of machining conditions for the machining region, and a control unit that controls the optical system. The control unit causes the optical system to scan the machining region with the ion beam, based on the machining conditions that have been set for the machining region.
A three-dimensional powder bed fusion additive manufacturing (PBF-AM) apparatus includes: a build plate that holds a powder layer made of a metal powder; a beam irradiating device that irradiates the build plate or the powder layer with an electron beam; and a heat shield unit shields radiant heat emitted from a part heated by irradiation with the electron beam. The heat shield unit is configured of a plurality of heat shield members. Each of the plurality of heat shield members has a side wall surrounding a side of a beam passage region through which the electron beam passes, and the side walls are arranged to overlap each other on a side of the beam passage region.
A first searcher executes a primary search with respect to a primary library based on a sample mass spectrum. The primary library includes a plurality of standard mass spectra. When a judging unit judges that a search range is to be enlarged, a second searcher executes a secondary search with respect to a secondary library based on the sample mass spectrum. The secondary library includes a plurality of predicted mass spectra produced from a plurality of molecular structures.
A superconducting coil device according to one embodiment of the present invention includes: A superconducting coil device including: a bobbin having a tubular body; superconducting wires, a part of which constitutes a wound portion where the superconducting wires are wound on the bobbin; a bobbin-side guide portion holding the superconducting wires extending from the bobbin, the bobbin-side guide portion being provided to extend in a bobbin axial direction, which is an axial direction of the body of the bobbin; a first guide portion holding the superconducting wires extending from the bobbin-side guide portion, the first guide portion being arranged on an outer side of the bobbin-side guide portion in a direction intersecting the bobbin axial direction and provided to extend in the direction intersecting the bobbin axial direction; and a second guide portion capable of holding the superconducting wires extending from the first guide portion, the second guide portion being provided to extend in a direction intersecting the direction of extension of the first guide portion, in which the superconducting wires are constituted of a plurality of wires connected in series, and a connection portion between the wires is fixed to at least either one of the first guide portion and the second guide portion.
A holder includes a first sub holder configured to hold a primary specimen, and a second sub holder configured to hold a support member. The primary specimen is processed in a first state where the holder is disposed within a first specimen processing apparatus. Subsequently, in a second state where the holder is disposed within a second specimen processing apparatus, a secondary specimen is prepared from the primary specimen, the secondary specimen is moved onto the support member, and a thin film specimen is prepared from the secondary specimen.
A powder bed fusion additive manufacturing (PBF-AM) apparatus includes an electron gun chamber, a build chamber, a first vacuum pump, a second vacuum pump, and a beam path. In addition, the three-dimensional PBF-AM apparatus includes a differential evacuation aperture, a focusing lens, and an axis adjustment mechanism. The differential evacuation aperture divides an internal space of the beam path into two, and has a restriction hole through which an electron beam can pass. The focusing lens is configured to focus the electron beam by a restriction hole of the differential evacuation aperture. The axis adjustment mechanism is configured to adjust a trajectory of the electron beam or positions of the focusing lens and the differential evacuation aperture so that an optical axis of the electron beam passes through both the center of the restriction hole and the center of the focusing lens.
B22F 12/41 - Moyens de rayonnement caractérisés par le type, p. ex. laser ou faisceau d’électrons
B33Y 30/00 - Appareils pour la fabrication additiveLeurs parties constitutives ou accessoires à cet effet
B22F 12/90 - Moyens de commande ou de régulation des opérations, p. ex. caméras ou capteurs
49.
COLD ATOM GENERATION DEVICE, COLD ATOM GENERATION METHOD, PHYSICAL PACKAGE, PHYSICAL PACKAGE FOR OPTICAL LATTICE CLOCK, PHYSICAL PACKAGE FOR ATOMIC CLOCK, PHYSICAL PACKAGE FOR ATOM INTERFEROMETER, PHYSICAL PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICAL PACKAGE SYSTEM
According to the present invention, in a first area that captures atoms in a first state by means of first light and a magnetic field, atoms are optically pumped into a second state and thereby captured by magnetic force. The atoms in the second state captured in the first area are moved from the first area to a second area by means of gravity or the radiation pressure of second light. In the second area, the second light is radiated at the atoms in the second state, and the atoms in the second state are thereby cooled. The atoms are optically pumped into a third state that is insensitive to magnetic fields and thereby released from a magnetic trap and supplied to a downstream device by means of a moving optical lattice or an optical dipole guide.
H01S 1/06 - Masers, c.-à-d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes gazeux
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H01S 3/00 - Lasers, c.-à-d. dispositifs utilisant l'émission stimulée de rayonnement électromagnétique dans la gamme de l’infrarouge, du visible ou de l’ultraviolet
50.
Three-Dimensional Powder Bed Fusion Additive Manufacturing Apparatus, Three-Dimensional Powder Bed Fusion Additive Manufacturing Method, and Method For Setting Moving Speed of Regulating Member in Three-Dimensional Powder Bed Fusion Additive Manufacturing
Provided is a three-dimensional powder bed fusion additive manufacturing (PBF-AM) apparatus including a base plate, a regulating member configured to level powder supplied onto the base plate by moving over the base plate at a height position keeping a predetermined interval from a surface of the base plate to form a powder layer, and a controller configured to control movement of the regulating member, in which an input unit for inputting manufacturing data is included, and the controller causes the regulating member to move at a moving speed based on the manufacturing data input from the input unit.
An electron spectrometer is provided which can collect spectra in a reduced measurement time. The electron spectrometer includes an electron analyzer for providing energy dispersion of electrons emitted from a sample (S), a detector having a plurality of detection elements juxtaposed and arranged in the direction of energy dispersion of the dispersed electrons, and a processor. The processor operates (i) to sweep a measurement energy in first incremental energy steps (ΔE1) within the analyzer, to detect the dispersed electrons with the detection elements, and to obtain a plurality of resulting first spectra; (ii) to interpolate points of measurement in each of the first spectra; and (iii) to generate a spectral chart in second incremental energy steps (ΔE2) smaller than the first incremental energy steps (ΔE1) on the basis of the first spectra for which the points of measurement have been interpolated.
Provided is a sample container which is for use with an X-ray fluorescence analyzer and which permits measurement of light elements in a liquid. The sample container includes a sealable first receptacle, a pressure adjusting valve for adjusting the pressure in the first receptacle, a second receptacle receiving a liquid sample (S) and having both a first opening and a second opening located inside and outside, respectively, of the first receptacle, and an analytical film closing off the second opening and transmitting X-rays.
G01N 23/2204 - Supports d’échantillons à cet effetMoyens de transport des échantillons à cet effet
G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
53.
MAGNETIC OPTICAL TRAP DEVICE, PHYSICAL PACKAGE, PHYSICAL PACKAGE FOR OPTICAL LATTICE WATCH, PHYSICAL PACKAGE FOR ATOMIC WATCH, PHYSICAL PACKAGE FOR ATOMIC INTERFEROMETER, PHYSICAL PACKAGE FOR QUANTOM INFORMATION PROCESSING DEVICE, AND PHYSICAL PACKAGE SYSTEM
According to the present invention, atoms are caught by means of a quadruple magnetic field formed by magnets (106), (108) and three groups of laser beam pairs. A portion of the laser beam pairs LZ is masked by the magnets (106), (108), so that a region (114) which is a non-atom catch space is formed inside a crossing region (112) where the three groups of laser beam pairs cross. The inside of the crossing region (112) is irradiated with a laser beam (118) so that atoms inside the non-atom catch space move to the outside of the crossing region (112).
H01S 3/00 - Lasers, c.-à-d. dispositifs utilisant l'émission stimulée de rayonnement électromagnétique dans la gamme de l’infrarouge, du visible ou de l’ultraviolet
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H01S 1/06 - Masers, c.-à-d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes gazeux
54.
Charged Particle Beam Device and Image Acquisition Method
A charged particle beam device acquires an image by scanning a specimen with a probe formed from a charged particle beam and detects a signal emitted from the specimen. The charged particle beam device includes an optical system that forms the probe; a control unit that repeatedly performs correction processing and image acquisition processing for acquiring a frame image; and an image processing unit that generates an image of the specimen based on a plurality of the frame images. In the correction processing, the control unit acquires a reference image, and corrects the shifting of the irradiation position of the probe. The image processing unit acquires position shift information, corrects a position shift between the frame images based on the position shift information, and generates an image of the specimen based on the plurality of corrected frame images.
An electron microscope includes an electronic optical system that irradiates a specimen with an electron beam and forms an image; a camera that includes an image sensor and outputs a frame image; and a computation unit that generates an image based on the frame image. The computation unit sets a threshold; and binarizes the frame image using the threshold, and generates the image based on the binarized frame image. In setting the threshold, the computation unit repeatedly sets a tentative threshold, acquires a plurality of the frame images obtained on a condition that electrons entering the image sensor follow Poisson process, binarizes each of the plurality of acquired frame images using the tentative threshold, generates an integrated image by integrating the plurality of binarized frame images, and obtains a normalized constant based on a mean and variance of pixel values of pixels of the integrated image.
A pre-processor applies a pre-process to an original mass image produced through mass spectrometry of a sample, to produce a model input image. An image quality converter has an image quality conversion model produced through machine learning based on a group of images produced by a scanning electron microscope, and produces a model output image through image quality conversion of the model input image. A post-processor applies a post-process to the model output image, to produce a mass image after image quality conversion.
G06V 10/60 - Extraction de caractéristiques d’images ou de vidéos relative aux propriétés luminescentes, p. ex. utilisant un modèle de réflectance ou d’éclairage
H01J 49/26 - Spectromètres de masse ou tubes séparateurs de masse
57.
ATOM BEAM GENERATION DEVICE, PHYSICS PACKAGE, PHYSICS PACKAGE FOR OPTICAL LATTICE CLOCK, PHYSICS PACKAGE FOR ATOMIC CLOCK, PHYSICS PACKAGE FOR ATOMIC INTERFEREROMETER, PHYSICS PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICS PACKAGE SYSTEM
A sample vessel (104) containing a sample (118), a nozzle (106), and a heated body (108) are arranged in a vacuum vessel (102). An induction coil (114) is located on the outside of the vacuum vessel (102). The heated body (108) is located around the sample vessel (104) and the nozzle (106). Electric power is wirelessly supplied from the induction coil (114) to the heated body (108), whereby the heated body (108) is heated. Heating of the heated body (108) causes the sample vessel (104) and the nozzle (106) to be heated, whereby the sample (118) in the sample vessel (104) is heated. An atomic gas generated by the heating of the sample (118) is emitted from the nozzle (106).
An electron microscope includes an irradiation optical system that focuses electron beams and scans a specimen with the focused electron beams; a deflector that deflects the electron beams transmitted through the specimen; a detector that detects the electron beams transmitted through the specimen; and a control unit that controls the irradiation optical system and the deflector The control unit causes the irradiation optical system to scan the specimen with the electron beams so that the electron beams have a plurality of irradiation positions on the specimen. The control unit causes the deflector to repeatedly deflect the electron beams transmitted through each of the irradiation positions, so that a plurality of electron beams which have the same irradiation position and different incident angle ranges with respect to the specimen are caused to sequentially enter the detector.
G01N 23/18 - Recherche de la présence de défauts ou de matériaux étrangers
G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
59.
Charged Particle Beam System and Control Method Therefor
Provided is a charged particle beam system capable of scanning a sample in a short time. The charged particle beam system is operative to scan the sample with a charged particle beam and to obtain a scanned image, and includes a magnetic deflector for producing a magnetic field to deflect the beam, an electrostatic deflector for producing an electric field to deflect the beam, and a controller for controlling both magnetic deflector and electrostatic deflector. The controller causes the magnetic deflector to deflect the beam in a first direction and to draw a first scan line, causes the magnetic deflector to deflect the beam in a second direction perpendicular to the first direction, causes the electrostatic deflector to deflect the beam in a third direction opposite to the first direction, and causes the magnetic deflector to deflect the beam in the first direction and to draw a second scan line.
A cleaning liquid (112-0) is stored in a cleaning tank (75) before cleaning of a cuvette (92). The cleaning liquid (112-0) in the cleaning tank (75) is retained while the cuvette (92) is being cleaned by a cleaning nozzle (72). At the start of nozzle cleaning after the cleaning of the cuvette (92), a suction nozzle (80) in the cleaning nozzle (72) is inserted into the cleaning liquid (112-0) in the cleaning tank (75). Then, the suction nozzle (80) is further cleaned through discharging and suctioning the cleaning liquid.
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p. ex. dispositifs d'aspiration, dispositifs d'injection
61.
Charged Particle Beam Source and Charged Particle Beam System
Provided is a charged particle beam source having an emitter that can be replaced easily. The charged particle beam source includes an electron gun chamber; a first unit including both a supportive insulative member mechanically supporting a cable and a first set of terminals electrically connected to the cable; and a second unit including both the emitter that releases charged particles and a second set of terminals electrically connected to the emitter. The chamber has a side wall provided with a through-hole in which the first unit is secured. The second unit can be detachably mounted to the first unit. Within the chamber, the emitter is placed on an optical axis, so that the first and second sets of terminals are brought into contact with each other.
A charged particle beam apparatus that forms a probe with a charged particle beam and scans a specimen with the probe to acquire a scanning image. The charged particle beam apparatus includes an optical system for scanning the specimen with the probe; a detector that detects a signal generated from the specimen through the scanning of the specimen with the probe; and a control unit that controls the optical system. The control unit performs correction processing of acquiring a reference image obtained by the scanning of the specimen with the probe, comparing the reference image to a criterion image to determine a drift amount, and correcting a displacement of an irradiation position with the probe on the specimen based on the drift amount; and processing of setting a frequency with which the correction processing is to be performed based on the drift amount.
H01J 37/22 - Dispositifs optiques ou photographiques associés au tube
H01J 37/26 - Microscopes électroniques ou ioniquesTubes à diffraction d'électrons ou d'ions
H01J 37/147 - Dispositions pour diriger ou dévier la décharge le long d'une trajectoire déterminée
63.
DERIVATIZING COMPOSITION FOR MASS SPECTROMETRY, DERIVATIZATION KIT FOR MASS SPECTROMETRY, MASS SPECTROMETRIC METHOD FOR BIOLOGICAL COMPONENT, AND METHOD FOR PREPARING SAMPLE FOR USE IN MASS SPECTROMETRY
11's each independently represent an alkyl group having 1 to 4 carbon atoms and X represents an N-alkyl-N-morpholinium group or a halogen atom (provided that, when X represents an N-alkyl-N-morpholinium group, X further has a counter ion).
G01N 27/62 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'ionisation des gaz, p. ex. des aérosolsRecherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant les décharges électriques, p. ex. l'émission cathodique
C07D 251/46 - Un atome d'azote avec des atomes d'oxygène ou de soufre liés aux deux autres atomes de carbone du cycle
64.
Charged Particle Beam Apparatus and Control Method for Charged Particle Beam Apparatus
A charged particle beam apparatus for scanning a specimen with a charged particle beam and acquiring a scan image. The charged particle beam apparatus including: an optical system that includes a pulse mechanism for illuminating the specimen with pulses of the charged particle beam, and a deflector that deflects the charged particle beam and scans the specimen with the deflected charged particle beam; and a control unit that controls the optical system. The control unit controls the optical system so as to satisfy T = n × t (n is a natural number). T represents a dwell time of the charged particle beam in each pixel of the scan image, and t represents a cycle of pulses of the charged particle beam.
In S14, stirring of a sample is performed by means of a nozzle. In S16, when it has been determined that an elapsed time after the stirring by means of the nozzle does not exceed a predetermined time, sample dispensing is performed using the nozzle in S18. In S16, when it has been determined that an elapsed time after the stirring by means of the nozzle exceeds a predetermined time, steps of S50-S60 are performed. In S56, re-stirring of the sample is performed by a manual operation of an inspector. Instead of re-stirring of the sample by a manual operation, re-stirring of the sample by means of the nozzle may be performed.
G01N 35/02 - Analyse automatique non limitée à des procédés ou à des matériaux spécifiés dans un seul des groupes Manipulation de matériaux à cet effet en utilisant une série de récipients à échantillons déplacés par un transporteur passant devant un ou plusieurs postes de traitement ou d'analyse
G01N 35/10 - Dispositifs pour transférer les échantillons vers, dans ou à partir de l'appareil d'analyse, p. ex. dispositifs d'aspiration, dispositifs d'injection
G01N 1/38 - Dilution, dispersion ou mélange des échantillons
Light which is radiant energy is emitted from a sample which is heated, and is detected by a backscattered electron detector. A detection signal from the backscattered electron detector includes a radiant component. A radiant component removal section extracts the radiant component from the detection signal using a filter, and then removes the radiant component from the detection signal. An optical detector which detects the radiant component may be provided. A divided detector may be provided as the backscattered electron detector.
A partial structure estimation apparatus is configured to generate a first explanatory variable by performing composition estimation for each peak in a mass spectrum acquired from a sample, and to generate a second explanatory variable by performing composition estimation for each peak interval in the mass spectrum. The partial structure estimation apparatus is further configured to then estimate a partial structure as an objective variable based on the first explanatory variable and the second explanatory variable. In a partial structure estimation model generation apparatus, a partial structure estimation model is generated through machine learning using a training data set.
An aberration correcting device includes a first multipole which generates a hexapole field; a second multipole which generates a hexapole field with a polarity opposite to a polarity of the hexapole filed generated by the first multipole; a third multipole which is disposed between the first multipole and the second multipole and generates an octupole field; a first transfer lens system disposed between the first multipole and the third multipole; and a second transfer lens system disposed between the third multipole and the second multipole. The first transfer lens system includes a plurality of fourth multipoles which generate a field in which an electromagnetic-field superposed quadrupole field and an octupole field are superposed; and the second transfer lens system includes a plurality of fifth multipoles which generate a field in which an electromagnetic-field superposed quadrupole field and an octupole field are superposed.
A phase analyzer includes a data acquisition unit that acquires a plurality of pieces of spectrum imaging data in which positions on a sample are associated with spectra which are based on signals from the sample; a first acquisition unit that acquires a first representative spectrum group for each piece of spectrum imaging data by performing multivariate analysis on each of the plurality of pieces of spectrum imaging data; a second acquisition unit that acquires a second representative spectrum group by performing multivariate analysis on the plurality of first representative spectrum groups acquired by the first acquisition unit; and a phase analysis unit that performs phase analysis on each of the plurality of pieces of spectrum imaging data by using the second representative spectrum group.
In various embodiments of the invention, a solid sample magic angle spinning nuclear magnetic resonance (NMR) probe can utilize an appropriate inductance parent coil with a fixed capacitor and introducing an idler coil with a variable capacitor which can inductively couple to the parent coil by adjusting the variable capacitance of the idler coil. By coupling the idler coil to the parent coil in this manner a double resonance circuit can be provided without the disadvantages of prior art coils. In an alternative embodiment of the invention, a solid sample magic angle spinning nuclear magnetic resonance probe can utilize an appropriate inductance parent coil with a fixed capacitor, introducing an idler coil with a variable capacitor in a first region and two variable inductor coupling coils and two coupling coils in a second region, where the two variable inductors are connected to the parent coil to reduce the number of coils in the sample region of the NMR probe, where variable inductors can inductively couple to the parent coil by adjusting one or both the capacitance of the variable capacitor of the idler coil and/or adjusting the variable inductors to observe a tuned condition between the parent coil and the idler coil.
An aberration corrector includes a first multipole element for producing a hexapole field, a second multipole element for producing a hexapole field, and a transfer lens system disposed between the first and second multipole elements. The first and second multipole elements are arranged along an optical axis. At least one of the hexapole fields respectively produced by the first multipole element and the second multipole element varies in strength along the optical axis.
H01J 37/28 - Microscopes électroniques ou ioniquesTubes à diffraction d'électrons ou d'ions avec faisceaux de balayage
H01J 37/153 - Dispositions électronoptiques ou ionoptiques pour la correction de défauts d'images, p. ex. stigmateurs
72.
MAGNETO-OPTICAL TRAP DEVICE, PHYSICAL PACKAGE, PHYSICAL PACKAGE FOR OPTICAL GRID CLOCK, PHYSICAL PACKAGE FOR ATOMIC CLOCK, PHYSICAL PACKAGE FOR ATOMIC INTERFEROMETER, PHYSICAL PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICAL PACKAGE SYSTEM
Tokyo University of Agriculture and Technology (Japon)
JEOL Ltd. (Japon)
Inventeur(s)
Nagata, Akiko
Mizumoto, Yuka
Sakamoto, Ryota
Nagasawa, Kazuo
Takiwaki, Masaki
Kikutani, Yoshikuni
Takahashi, Koji
Fukuzawa, Seketsu
Abrégé
The present invention is intended to provide a compound useful to analyze a vitamin D compound. The present invention provides an alkyne compound represented by Formula (I):
The present invention is intended to provide a compound useful to analyze a vitamin D compound. The present invention provides an alkyne compound represented by Formula (I):
The present invention is intended to provide a compound useful to analyze a vitamin D compound. The present invention provides an alkyne compound represented by Formula (I):
where in Formula (I), A is a linear carbon chain having an alkynyl group at an end and having a vinyl group at another end; X1 is CH or 13CH; X2 is CHY, CDY, 13CHY, 13CDY, CO, 13CO, C18O, or 13C18O; m is an integer from 1 to 4; when m is 2 or more, X2s are identical or different; Y is H, D, NH2, 15NH2, OH, 18OH, SH, OR, O(CO)R, OSO3H, OSO3Na, or a sugar substituent; when Formula (I) contains two or more Ys, Ys are identical or different; R is an alcohol protective group, an alkyl group, an alkenyl group, or an aryl group; X3 is C or 13C; and at least one selected from the group consisting of X1, X2(s), and X3 is modified with a stable isotope D, 13C, 18O, or 15N.
C07C 401/00 - Produits d'irradiation du cholestérol ou de ses dérivésDérivés de vitamine D, séco-9,10 cyclopenta[a]phénanthrène ou leurs analogues obtenus par préparation chimique sans irradiation
A sample cartridge has a sample stand and an inclining mechanism. A sample cartridge holding apparatus has a housing part which is inclined. When the sample cartridge is inserted into the housing part, a contact portion contacts a lever of the inclining mechanism, and the sample stand is inclined by a predetermined angle. With this process, an appropriate inclination angle is realized for the sample stand.
H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support
75.
ATOM BEAM GENERATION DEVICE, PHYSICS PACKAGE, PHYSICS PACKAGE FOR OPTICAL LATTICE CLOCK, PHYSICS PACKAGE FOR ATOMIC CLOCK, PHYSICS PACKAGE FOR ATOMIC INTERFEREROMETER, PHYSICS PACKAGE FOR QUANTUM INFORMATION PROCESSING DEVICE, AND PHYSICS PACKAGE SYSTEM
An atom beam generation device (100) comprises an atomic oven (102) including a sample chamber (106) in which a sample (114) is contained, a deceleration unit (104), and coil units (110, 124). The deceleration unit (104) includes a bore (122) through which an atom gas and a laser light (128) pass, and decelerates an atom gas emitted from the atomic oven (102) by means of light and a magnetic field. The coil units (110, 124) supply Joule heat to the atomic oven (102), and generates a magnetic field in the deceleration unit (104).
A physical package is provided with: a MOT device; an optical chamber which constitutes an optical lattice formation portion; and a vacuum chamber which surrounds these components and has a substantially cylindrical shape. The MOT device is arranged along the beam axis of an atomic beam and traps an atom cluster. The optical lattice formation portion uses optical lattice light that enters therein to form an optical lattice in a cavity, confines the atom cluster trapped by the MOT device in the optical lattice, and transfers, along the X-axis which is a movement axis perpendicular to the beam axis, the atom cluster to a clock transition space which facilitates clock transition. The central axis of the cylinder of the main body of the vacuum chamber passes through the clock transition space, and is set to be substantially parallel with the beam axis.
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H01S 1/06 - Masers, c.-à-d. dispositifs utilisant l’émission stimulée de rayonnement électromagnétique dans la gamme des micro-ondes gazeux
G02F 1/09 - Dispositifs ou dispositions pour la commande de l'intensité, de la couleur, de la phase, de la polarisation ou de la direction de la lumière arrivant d'une source lumineuse indépendante, p. ex. commutation, ouverture de porte ou modulationOptique non linéaire pour la commande de l'intensité, de la phase, de la polarisation ou de la couleur basés sur des éléments magnéto-optiques, p. ex. produisant un effet Faraday
An FIB system includes an ion source for producing the ion beam, a lens system which includes an objective lens and which is operative to focus the ion beam onto a sample such that secondary electrons are produced from the sample, a detector for detecting the secondary electrons, and a controller for controlling the lens system. The controller operates i) to provide control so that a focus of the ion beam is varied by directing the ion beam onto the sample, ii) to measure a signal intensity from the secondary electrons produced from the sample during the variation of the strength of the objective lens, iii) to adjust the focus of the ion beam, iv) to acquire a secondary electron image containing an image of a trace of a spot, and v) to correct the deviation of the field of view of the ion beam.
An optical lattice clock includes a clock transition space having disposed therein an atom group trapped in an optical lattice, and a triaxial magnetic field correction coil for correcting the magnetic field of the clock transition space. Additionally, in a correction space that includes the clock transition space and is larger than the clock transition space, a photoreceiver promotes the clock transition of the atom group trapped in the optical lattice and acquires a clock transition frequency distribution for the correction space. Further, a corrector corrects the magnetic field of the triaxial magnetic field correction coil on the basis of the frequency distribution measured by the photo receiver.
H03L 7/26 - Commande automatique de fréquence ou de phaseSynchronisation utilisant comme référence de fréquence les niveaux d'énergie de molécules, d'atomes ou de particules subatomiques
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
79.
Sample Cartridge Carrier Apparatus and Carrier Base
A sample cartridge carrier apparatus is coupled with a focused ion beam processing apparatus (FIB processing apparatus). A guide mechanism is configured to guide a series of movements of a sample cartridge holder to allow a sample cartridge to be held by a carrier base on a sub stage. Sub cooling equipment is configured to cool the sample cartridge via the sub stage. A carrier mechanism carries the carrier base between the sub stage and a main stage.
Provided is a sample milling apparatus capable of milling various samples efficiently. The sample milling apparatus includes an anode, a cathode for emitting electrons which are made to collide with gas molecules so that ions are generated, an extraction electrode for causing the generated ions to be extracted as an ion beam, and a focusing electrode disposed between the cathode and the extraction electrode and applied with a focusing voltage. The spatial profile of the ion beam is controlled by varying the focusing voltage applied to the focusing electrode.
An amplifier circuit includes a constant current circuit for outputting a constant current signal at its output terminal, an operational amplifier for outputting an amplified control signal based on the first voltage signal, and an amplified voltage output circuit for outputting a second voltage signal based on both the constant current signal and the amplified control signal. The constant current circuit has a light-emitting device having one end supplied with the constant voltage signal and another end supplied with ground potential, a light responsive electricity generating device for outputting a drive signal in response to light emitted by the light-emitting device, a first transistor generating the constant current signal based on the amplified voltage signal applied thereto and to output the constant current signal; and a current control circuit for detecting the value of the constant current signal and controlling the supply of the drive signal based on the detection.
H02M 3/158 - Transformation d'une puissance d'entrée en courant continu en une puissance de sortie en courant continu sans transformation intermédiaire en courant alternatif par convertisseurs statiques utilisant des tubes à décharge avec électrode de commande ou des dispositifs à semi-conducteurs avec électrode de commande utilisant des dispositifs du type triode ou transistor exigeant l'application continue d'un signal de commande utilisant uniquement des dispositifs à semi-conducteurs avec commande automatique de la tension ou du courant de sortie, p. ex. régulateurs à commutation comprenant plusieurs dispositifs à semi-conducteurs comme dispositifs de commande finale pour une charge unique
H01J 37/248 - Composants associés à l'alimentation haute tension
An angle adjuster for nuclear magnetic resonance (NMR) includes a linear motion member composed of a shaft and a support member, a rotary member, a conversion mechanism, and a spring. The linear motion member is a member that serves to change, in an NMR probe device, an angle of a sample tube by a linear motion. The rotary member is rotated by a motor. The conversion mechanism converts a rotary motion of the rotary member into a linear motion of the linear motion member. The spring provides, at a portion where the linear motion member and the rotary member are in engagement with each other, a force that urges the linear motion member in one direction toward the rotary member.
G01R 33/30 - Dispositions pour le traitement des échantillons, p. ex. cellules d'essai, mécanismes rotationnels
G01R 33/483 - Systèmes d'imagerie RMN avec sélection de signaux ou de spectres de régions particulières du volume, p. ex. spectroscopie in vivo
83.
Triaxial magnetic field correction coil, physics package, physics package for optical lattice clock, physics package for atomic clock, physics package for atom interferometer, physics package for quantum information processing device, and physics package system
There is a need to maintain or enhance the magnetic field correction accuracy of a physics package while making the physics package more compact and portable. A triaxial magnetic field correction coil is provided inside a vacuum chamber surrounding a clock transition space having atoms disposed therein. The triaxial magnetic field correction coil is formed into a shape such that it is possible to correct, for magnetic field components of three axial directions passing through the clock transition space, a constant term, a first order spatial derivative term, a second order spatial derivative term, a third or higher order spatial derivative term, or some given combination of these terms. The triaxial magnetic field correction coil can be used in, for example, a physics package for an optical lattice clock.
H03L 7/26 - Commande automatique de fréquence ou de phaseSynchronisation utilisant comme référence de fréquence les niveaux d'énergie de molécules, d'atomes ou de particules subatomiques
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H01F 7/20 - Électro-aimantsActionneurs comportant des électro-aimants sans armature
In a frequency converter, a transmission signal having a first frequency component and a second frequency component is multiplied by a local signal, to thereby frequency-convert the transmission signal. In a power amplifier, the frequency-converted transmission signal is amplified. A demultiplexing circuit generates a first transmission signal and a second transmission signal from the amplified transmission signal. A controller is configured to set for a transmission section a frequency set suitable for two irradiation frequencies.
Ions ejected from a collision cell are detected by a detector. An evaluation unit generates a temporary calibration curve based on an intensity of a detection signal and evaluates an ion accumulation time of the collision cell based on the temporary calibration curve. When the evaluation unit determines signal saturation, the ion accumulation time of the collision cell is reduced. When the evaluation unit determines sensitivity insufficiency, the ion accumulation time of the collision cell is increased.
A phase analyzer includes a data acquisition unit that acquires spectrum imaging data in which a position on a sample is associated with a spectrum of a signal from the sample; a candidate determination unit that performs multivariate analysis on the spectrum imaging data to determine candidates for the number of phases; a phase analysis unit that creates, for each of the candidates, a phase map group including a number of phase maps corresponding to the number of phases; and a display control unit that causes a display unit to display, for each of the candidates, the phase map group.
G01N 23/2208 - Combinaison de plusieurs mesures, l'une au moins étant celle d’une émission secondaire, p. ex. combinaison d’une mesure d’électrons secondaires [ES] et d’électrons rétrodiffusés [ER] toutes les mesures portant sur l’émission secondaire, p. ex. combinaison de la mesure ES et des rayons X caractéristiques
G01N 23/2252 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant des microsondes électroniques ou ioniques en utilisant des faisceaux d’électrons incidents, p. ex. la microscopie électronique à balayage [SEM] en mesurant les rayons X émis, p. ex. microanalyse à sonde électronique [EPMA]
A phase analyzer includes a data acquisition unit that acquires spectrum imaging data in which a position on a sample is associated with a spectrum of a signal from the sample; a phase analysis unit that performs phase analysis based on the spectrum imaging data; a display control unit that displays results of the phase analysis on a first screen; and a condition reception unit that receives an operation for changing a condition for the phase analysis, when the condition reception unit has received the operation for changing the condition, the phase analysis unit performing phase analysis under the changed condition, the display control unit displaying on a second screen the results of the phase analysis performed under the changed condition and when a predetermined operation has been performed, the display control unit reflecting on the first screen the results of the phase analysis displayed on the second screen.
An electron microscope includes an electron source for emitting an electron beam, an illumination lens for focusing the beam, an aberration corrector for correcting aberrations, an illumination deflector assembly disposed between the illumination lens and the aberration corrector and operating to deflect the beam and to vary its tilt relative to a sample, a scanning deflector for scanning the sample with the beam, an objective lens, a detector for detecting electrons transmitted through the sample and producing an image signal, a control section for controlling the illumination deflector assembly, and an image generating section for receiving the image signal and generating a differential phase contrast (DPC) image. The tilt of the beam is varied by the illumination deflector assembly such that the image generating section generates a plurality of DPC images at different tilt angles of the beam and creates a final image based on the DPC images.
H01J 37/26 - Microscopes électroniques ou ioniquesTubes à diffraction d'électrons ou d'ions
H01J 37/28 - Microscopes électroniques ou ioniquesTubes à diffraction d'électrons ou d'ions avec faisceaux de balayage
89.
Tri-axial magnetic field correction coil, physical package, physical package for optical lattice clock, physical package for atomic clock, physical package for atom interferometer, physical package for quantum information processing device, and physical package system
A tri-axial magnetic field correction coil includes a first coil group and a second coil group with respect to an X-axis direction that passes through a clock transition space in which atoms are disposed. The first coil group is a Helmholtz-type coil composed in a point-symmetrical shape around the clock transition space. The second coil group is composed in a point-symmetrical shape around the clock transition space with respect to the X-axis direction, and is a non-Helmholtz-type coil that differs from the first coil group in terms of coil size, coil shape, or distance between coils.
H01F 7/20 - Électro-aimantsActionneurs comportant des électro-aimants sans armature
G04F 5/14 - Appareils pour la production d'intervalles de temps prédéterminés, utilisés comme étalons utilisant des horloges atomiques
H03L 7/26 - Commande automatique de fréquence ou de phaseSynchronisation utilisant comme référence de fréquence les niveaux d'énergie de molécules, d'atomes ou de particules subatomiques
90.
Radiation detection apparatus and sample analysis apparatus
There is provided a radiation detection apparatus capable of effectively discriminating between noise and X-ray signal. The radiation detection apparatus includes a detector for detecting radiation and producing a detector output signal, a first differential filter having a time constant and operative to differentiate and convert the detector output signal into a first pulsed signal, a second differential filter having a time constant greater than that of the first differential filter and operative to differentiate and convert the detector output signal into a second pulsed signal, and a noise detection section for detecting noise based on the difference in timing between peaks of the first and second pulsed signals.
Provided is a charged particle beam system capable of preventing the data acquisition time from increasing. A control method for the system is also provided. The charged particle beam system includes: a beam blanker for blanking a charged particle beam; a sample stage on which a sample is tiltably held and thus can assume a tilt angle; a blanking controller for controlling the blanking of the charged particle beam and causing a pulsed beam having a duty ratio to be directed at the sample; and a tilt controller for controlling the tilt angle of the sample. The blanking controller sets the duty ratio of the pulsed beam based on the tilt angle of the sample.
H01J 37/04 - Dispositions des électrodes et organes associés en vue de produire ou de commander la décharge, p. ex. dispositif électronoptique, dispositif ionoptique
H01J 37/20 - Moyens de support ou de mise en position de l'objet ou du matériauMoyens de réglage de diaphragmes ou de lentilles associées au support
H01J 37/26 - Microscopes électroniques ou ioniquesTubes à diffraction d'électrons ou d'ions
93.
Charged Particle Beam Apparatus and Image Adjustment Method
Provided is a charged particle beam apparatus that acquires an image by scanning a specimen with a charged particle beam, and includes a contrast adjustment circuit that adjusts contrast of the image; a brightness adjustment circuit that adjusts brightness of the image; and a control unit that controls the contrast adjustment circuit and the brightness adjustment circuit. The control unit acquires information on luminance of a reference image in a non-signal state, and information on an average value of luminance of each pixel of the reference image, controls the brightness adjustment circuit, based on the acquired information on luminance of the reference image in a non-signal state, acquires the image in a state where the brightness adjustment circuit is controlled, and adjusts the contrast of the acquired image by controlling the contrast adjustment circuit, based on the average value of luminance of each pixel of the reference image.
Provided is a scatter diagram display device that creates a plurality of scatter diagrams based on mapping data acquired by an analyzer and displays a scatter diagram matrix in which the created plurality of scatter diagrams are arranged in a matrix on a display section, the scatter diagram display device including: a display condition acceptance section that accepts a designation of a display range of an item in each of the plurality of scatter diagrams, and a display control section that extracts all scatter diagrams having the item whose display range has been designated from the plurality of scatter diagrams and changes the display range of the item in the extracted scatter diagrams based on the designation of the display range.
G01N 23/2252 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant des microsondes électroniques ou ioniques en utilisant des faisceaux d’électrons incidents, p. ex. la microscopie électronique à balayage [SEM] en mesurant les rayons X émis, p. ex. microanalyse à sonde électronique [EPMA]
95.
Charged Particle Beam Drawing Apparatus and Control Method for Charged Particle Beam Drawing Apparatus
Provided is a charged particle beam drawing apparatus including a measurement unit that scans a reference mark disposed on a stage with a charged particle beam to detect a position of the reference mark, and measures a positional deviation amount of the charged particle beam, based on the detected position; and a positional correction unit that corrects a drawing position based on the measured positional deviation amount. A plurality of the reference marks is disposed on the stage, and the measurement unit switches from one of the reference marks used for the measurement of the positional deviation amount to another one of the reference marks that is not used yet, when a predetermined condition has been satisfied.
H01J 37/317 - Tubes à faisceau électronique ou ionique destinés aux traitements localisés d'objets pour modifier les propriétés des objets ou pour leur appliquer des revêtements en couche mince, p. ex. implantation d'ions
H01J 37/304 - Commande des tubes par une information en provenance des objets, p. ex. signaux de correction
96.
Charged Particle Beam Device and Image Generation Method
A charged particle beam device scans a specimen with a charged particle beam and generates an image based on a detected signal from a detector that detects a signal generated from the specimen based on the scan performed by the charged particle beam. The charged particle beam device includes: a blanker that performs blanking of the charged particle beam; an image acquisition unit that acquires a plurality of images by controlling the blanking during the scan performed by the charged particle beam, the plurality of images including pixels corresponding to a region of the specimen that is irradiated with the charged particle beam and pixels corresponding to a region of the specimen that is not irradiated with the charged particle beam; and an integrated image generation unit that generates an integrated image by integrating the plurality of acquired images.
H01J 37/04 - Dispositions des électrodes et organes associés en vue de produire ou de commander la décharge, p. ex. dispositif électronoptique, dispositif ionoptique
H01J 37/28 - Microscopes électroniques ou ioniquesTubes à diffraction d'électrons ou d'ions avec faisceaux de balayage
G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
97.
NMR Measurement Apparatus, and Method of Identifying Solvent
An NMR spectrum is acquired from a nucleus of interest in a solvent included in a sample solution. A spectrum analyzer analyzes a number of splits, a splitting interval, a number of signals, and a signal interval based on the NMR spectrum. Based on these characteristic quantities, an identifier identifies the solvent. In another configuration, a plurality of NMR spectra acquired from a plurality of nuclei of interest included in the solvent may be analyzed.
G01N 24/08 - Recherche ou analyse des matériaux par l'utilisation de la résonance magnétique nucléaire, de la résonance paramagnétique électronique ou d'autres effets de spin en utilisant la résonance magnétique nucléaire
98.
NMR apparatus and gas replacement method for replacing gas in NMR probe
An NMR apparatus includes a depressurizing device for depressurizing an NMR probe, a gas supply device for supplying gas into the NMR probe to thereby pressurize the NMR probe, and a control device. The control device alternately repeats depressurization of the NMR probe, using the depressurizing device, and pressurization of the NMR probe, using the gas supply device. This replaces the gas in the NMR probe.
A vacuum pump that evacuates an inside of a vacuum chamber and powder capturing devices disposed on an intake side of the vacuum pump are included. The powder capturing devices include a plurality of flow path forming units that form a continuous gas flow path from an intake unit located on the vacuum chamber side to an exhaust unit located on the vacuum pump side. The plurality of flow path forming units include a first flow path forming unit having a first catching unit that causes the powder sucked from the intake unit to collide and then catch the powder, and a second flow path forming unit having a second catching unit that causes the powder passing through the first flow path forming unit to collide and then catch the powder.
B01D 45/08 - Séparation de particules dispersées dans des gaz ou des vapeurs par gravité, inertie ou force centrifuge par inertie par projection contre les diaphragmes séparateurs
B01D 46/10 - Séparateurs de particules utilisant des plaques, des feuilles ou des tampons filtrants à surface plane, p. ex. appareils de précipitation de poussières
A three-dimensional PBF-AM apparatus includes a stage on which a powder material is spread, and a tubular build box disposed in a state of surrounding the stage. The build box includes a side wall portion having a first tubular member surrounding the stage and a second tubular member surrounding the stage with the first tubular member interposed therebetween and forming a space with the first tubular member, and moreover, a vacuum heat insulating layer can be formed inside the side wall portion by vacuuming the space.
B22F 10/322 - Commande ou régulation des opérations de l’atmosphère, p. ex. de la composition ou de la pression dans une chambre de fabrication d’un écoulement de gaz, p. ex. du débit ou de la direction
B22F 10/47 - Structures destinées à soutenir des pièces ou des articles pendant la fabrication et retirées par la suite caractérisées par des caractéristiques structurelles
