An integral value measuring circuit includes an operational amplifier and a capacitor connected between input and output sides thereof, an electric potential of an output terminal where a predetermined resistance element connected to an output side of the operational amplifier is being zero, positive and negative DC voltage generating circuits which comprise positive and negative power sources, respectively, at the output side of the operational amplifier, the positive and negative DC voltage generating circuits and being connected to positive and negative power terminals, respectively, of the operational amplifier through switches, and a connection line between the negative power terminal and one switch and a connection line between the positive power terminal and another switch being connected to the positive and negative power terminals, respectively, of the operational amplifier through cross resistance elements having resistance values negligible compared to a leakage resistance value of the switches.
G06F 7/64 - Analyseurs différentiels numériques, c.-à-d. dispositifs de calcul pour le calcul différentiel et intégral ou la résolution d'équations différentielles ou intégrales, en utilisant des impulsions représentant des incrémentsAutres dispositifs de calcul incrémentiel pour la résolution d'équations aux différences
G01R 22/08 - Dispositions pour la mesure de l'intégrale dans le temps d'une puissance électrique ou d'un courant, p. ex. compteurs d'électricité par des méthodes électroniques en utilisant des techniques analogiques
G01R 19/00 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe
2.
MALFUNCTION DETECTING APPARATUS FOR PLURALITY OF TESTED CIRCUITS, AND MALFUNCTION DETECTING METHOD USING THAT APPARATUS
This invention is directed to provision of an apparatus and a testing method whereby the noise discharging time period can be appropriately selected and effectively implemented. According to a malfunction testing apparatus for a plurality of tested circuits (5) and a malfunction detecting method using that apparatus, a noise discharging circuit (2), which comprises a charging resistor element (R1), a discharging resistor element (R2) and a capacitance (C), is disposed between a DC power supply (1) and the plurality of tested circuits (5). A probe (4), which intervenes between the noise discharging circuit (2) and the tested circuits (5), can select and connect each of the plurality of tested circuits (5), while a sync/delay controller circuit (6), which is connected to each of the tested circuits (5) via a selection circuit (8), can adjust the noise discharging time period via an application controller circuit (7).
Calibration method for calibrating transient behavior of a TLP test system. The system comprises a TLP generator, probe needles, nominally impedance matched transmission lines and measurement equipment, connected between the transmission lines and the TLP generator, for detecting transient behavior of a device under test by simultaneously capturing voltage and current waveforms as a result of generated pulses. The calibration method comprises (a) applying the TLP test system on an open and capturing first voltage and current waveforms; (b) applying the TLP test system on a calibration element having a known finite impedance and a known transient response and capturing second voltage and current waveforms; (c) transforming the captured first and second current and voltage waveforms to the frequency domain, and (d) determining calibration data for the transient behavior of the TLP test system on the basis of the transformed first and second voltage and current waveforms.
G01R 27/02 - Mesure de résistances, de réactances, d'impédances réelles ou complexes, ou autres caractéristiques bipolaires qui en dérivent, p. ex. constante de temps
4.
SYNCHRONOUS TYPE IMPULSE IMMUNITY EVALUATION DEVICE
The timing at which noise impulses are applied is not interlocked with the operation of an electronic circuit. The problem is thus that the application of impulses can only be probabilistic and the correspondence with the malfunction mechanism cannot be ascertained. A signal generated in an electronic circuit to be evaluated is used as a timing trigger for noise impulse application. The timing of application is additionally changed with a timer, and the noise immunity of the electronic circuit is evaluated by applying noise impulses to the electronic circuit.
G01R 31/30 - Tests marginaux, p. ex. en faisant varier la tension d'alimentation
G01R 31/00 - Dispositions pour tester les propriétés électriquesDispositions pour la localisation des pannes électriquesDispositions pour tests électriques caractérisées par ce qui est testé, non prévues ailleurs
According to the application method based on the related art, it is impossible to apply a rectangular wave having a rapid rise to an electronic circuit with a sufficient voltage. Moreover, the electrostatic discharge test can perform application with a sufficient voltage but only an oscillating waveform can be applied. A TLP generation device is used for a rectangular wave generation device. 'Resistance to be applied + matching resistance' are set so as to match with the characteristic impedance of a transmission path which transmits the rectangular wave to an evaluation object. By making a connection with a return line of the applied rectangular wave by a capacitor, it is possible to perform stable application. Immunity is the applied voltage at which an erroneous operation monitor function of the electronic circuit firstly detects an erroneous operation while gradually increasing the wave height value of the rectangular wave.
A method of quickly measuring a characteristic impedance of an ESD protecting circuit by applying a discharge voltage to the ESD protecting circuit, includes the steps of measuring a variation in discharge voltage applied to and a variation in discharge current caused to flow through the ESD protecting circuit with time; simultaneously detecting a state when both the discharge voltage and discharge current corresponding to each other are attenuated, after both the discharge voltage and discharge current sequentially rise to arrive individually to respective peak values based on an input to or an output from a computer; and taking a ratio of the variation of discharge voltage to the variation of discharge current during the attenuation as an impedance value when the ratio is nearly constant as well as an apparatus for realizing the same.
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