A rotational device provides rotation of a location of interest about a rotational axis and includes first and second sockets each having three contact points distributed about the rotational axis. The contact points of each socket may be on convex surfaces and a spindle assembly is held between the sockets, which face each other along the rotational axis. The spindle assembly has a first convex surface centered about the rotational axis that contacts the contact points of the first socket, and a second convex surface that contacts the contact points of the second socket. The spindle assembly also has a drive shaft aligned with the rotational axis. Linear stages may be used to provide adjustment in one or more mutually perpendicular directions. An alternative embodiment uses a spindle assembly with two curved contact surfaces that contact respective curved surfaces that are adjacent to the rotational axis rather than aligned therewith.
A rotational device (10) provides rotation of a location of interest about a rotational axis and includes first and second sockets each having three contact points distributed about the rotational axis. The contact points of each socket may be on convex surfaces and a spindle assembly (12) is held between the sockets, which face each other along the rotational axis. The spindle assembly (12) has a first convex surface centered about the rotational axis that contacts the contact points of the first socket, and a second convex surface that contacts the contact points of the second socket. The spindle assembly (12) also has a drive shaft (20) aligned with the rotational axis. Linear stages (34, 36, 38) may be used to provide adjustment in one or more mutually perpendicular directions. An alternative embodiment uses a spindle (80) assembly (42) with two curved contact surfaces that contact respective curved surfaces that are adjacent to the rotational axis rather than aligned therewith.
G01D 11/02 - Paliers ou suspensions pour pièces mobiles
G01N 23/20025 - Porte-échantillons ou leurs supports
G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
F16C 17/10 - Paliers à contact lisse pour mouvement de rotation exclusivement à la fois pour charges radiales et axiales
F16C 17/22 - Paliers à contact lisse pour mouvement de rotation exclusivement caractérisés par des particularités sans rapport avec la direction de la charge avec des dispositions pour compenser la dilatation thermique
F16C 17/26 - Systèmes consistant en une pluralité de paliers à contact lisse
3.
METHOD FOR THE DETECTION AND CORRECTION OF LENS DISTORTIONS IN AN ELECTRON DIFFRACTION SYSTEM
A method for correcting distortion in a coherent electron diffraction imaging (CEDI) image induced by a projection lens makes use of a known secondary material that is imaged together with a sample of interest. Reflections generated from the secondary material are located in the image, and these observed reflections are used to approximate a beam center location. Using a known lattice structure of the secondary material, Friedel pairs are located in the image and unit cell vectors are identified. Predicted positions for each of the secondary material reflections are then determined, and the position differences between the observed reflections and the predicted reflections are used to construct a relocation function applicable to the overall image. The relocation function is then used to adjust the position of image components so as to correct for the distortion.
G01N 23/20058 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffraction des électrons, p. ex. la diffraction d’électrons lents [LEED] ou la diffraction d’électrons de haute énergie en incidence rasante [RHEED]
G01N 23/2055 - Analyse des diagrammes de diffraction
A diffraction system for determining a crystalline structure of a sample collects a series of diffraction frames from a crystal sample illuminated by a beam of photonic or particulate radiation, such as X-rays. A plurality of software modules for processing the detected diffraction frames perform different tasks in refining the collected diffraction data, such as harvesting, indexing, scaling, integration, and structure determination. Output parameters from certain modules are used as input parameters in others, and are exchanged between the modules as they become available. The modules operate simultaneously, and generate successive versions of output parameters as corresponding input parameters are changed until a final result is achieved. This provides a system of structure determination that is fast and efficient.
An X-ray diffraction method measures crystallite size distribution in a polycrystalline sample using an X-ray diffractometer with a two-dimensional detector. The diffraction pattern collected contains several spotty diffraction rings. The spottiness of the diffraction rings is related to the size, size distribution and orientation distribution of the crystallites as well as the diffractometer condition. The invention allows obtaining of the diffraction intensities of all measured crystallites at perfect Bragg condition so that the crystallite size distribution can be measured based on the 2D diffraction patterns.
G01N 23/2055 - Analyse des diagrammes de diffraction
G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
G01N 23/20025 - Porte-échantillons ou leurs supports
A system and method for processing X-ray fluorescence data in a hand-held X-ray Fluorescence (XRF) analyzer are provided. The X-ray fluorescence (XRF) analyzer includes a radiation source assembly including a first centerline axis and configured to direct an X-ray beam to impinge on a sample to be tested. The XRF analyzer also includes a radiation detector assembly including a second centerline axis configured to sense X-ray fluorescence (XRF) emitted from the sample in response to the X-ray beam. The XRF analyzer further includes a processor configured to determine a property of the sample to be tested from the emitted XRF, and a proximity sensor configured to continuously measure a distance between the XRF analyzer and the sample to be tested, the distance being at least one of displayed to a user and used by the processor to determine the property.
G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
G06F 3/0484 - Techniques d’interaction fondées sur les interfaces utilisateur graphiques [GUI] pour la commande de fonctions ou d’opérations spécifiques, p. ex. sélection ou transformation d’un objet, d’une image ou d’un élément de texte affiché, détermination d’une valeur de paramètre ou sélection d’une plage de valeurs
7.
Method and apparatus for determining object characteristics
Embodiments of the invention provide a method of determining one or more characteristics of a target object, comprising recording one or more diffraction patterns at a detector, wherein each diffraction pattern is formed by a target object scattering incident radiation, determining a phase map for at least a region of the target object based on the one or more diffraction patterns, and determining a refractive property of the target object based on the phase map.
G01B 11/24 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer des contours ou des courbes
G01B 11/06 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la longueur, la largeur ou l'épaisseur pour mesurer l'épaisseur
G01N 21/41 - RéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique
A system and method for generating X-rays are provided. The X-ray source includes an X-ray chamber including a sidewall formed of a piezoelectric material at least partially surrounding an evacuated chamber, a cathode positioned at a first end of the evacuated chamber, an anode positioned at a second opposite end of the evacuated chamber, and a window positioned at the second end, the window substantially transparent to X-ray radiation. The window includes a target layer at least partially covering a surface of the window. The target layer is configured to receive a flow of electrons from the cathode and to generate a flow of X-rays from an interaction with the flow of electrons. The X-ray source includes an actuator coaxially aligned with the X-ray chamber and configured to generate a stress in the sidewall.
Embodiments of the present invention provide a method of estimating a magnitude of background radiation for each of a plurality of regions of a target object comprising providing an estimate of background radiation detected by a detector, measuring radiation scattered by the target object at the detector for each of a plurality of positions of the object with respect to the incident radiation, calculating, for each of the positions, an estimate of a wavefront at the detector, and determining, for each position, an estimated wavefront comprising a coherent contribution from radiation scattered by the target object and a background contribution, wherein said background contribution is at least partly incoherent with the radiation scattered by the target object. This method is particularly suitable for performing coherent diffractive imaging using ptychography where contribution from the incoherently scattered background is taken into account.
G01J 1/42 - Photométrie, p. ex. posemètres photographiques en utilisant des détecteurs électriques de radiations
G01T 1/00 - Mesure des rayons X, des rayons gamma, des radiations corpusculaires ou des radiations cosmiques
G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux
Embodiments of the present invention provide a method of providing image data for constructing an image of at least a region of a target object, comprising the steps of simultaneously recording, at a detector, a plurality of separable diffraction patterns formed by a respective portion of radiation scattered by the target object; and providing the image data via an iterative process responsive to the detected intensity of radiation.
G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux
Embodiments of the invention provide a method of determining one or more characteristics of a target object, comprising determining a first phase map for at least a region of a target object based on radiation directed toward the target object, determining one or more further phase maps for a sub-region of the region of the target object, determining a number of phase wraps for the sub-region based on a plurality of phase maps for the sub-region, and determining a characteristic of the region of the target object based on the number of phase wraps for sub-region and the first phase map. Embodiments of the invention also relate to a method of determining one or more characteristics of a target object, comprising determining a phase map for at least a region of a target object based on one or more diffraction patterns, determining a wavefront at a plane of the object based upon the phase map, and determining a refractive property of the object based on the wavefront.
G01B 11/24 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer des contours ou des courbes
G01B 11/06 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la longueur, la largeur ou l'épaisseur pour mesurer l'épaisseur
G01N 21/41 - RéfringencePropriétés liées à la phase, p. ex. longueur du chemin optique
Embodiments of the invention provide a method of determining a position of an object with respect to incident radiation, comprising iteratively determining at least one of an object function indicating one or more characteristics of an object and a probe function indicative of one or more characteristics of incident radiation, iteratively determining the position of the object, wherein the iteratively determining the position of the object comprises cross correlating first and second estimates of the object function or the probe function, determining a location of a peak of the cross correlation, and determining a translation deviation indicative of a difference in position of the object between the first and second estimates based on the location of the peak.
G01B 11/14 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la distance ou la marge entre des objets ou des ouvertures espacés
G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
13.
Method and apparatus for providing image data for constructing an image of a region of a target object
Embodiments of the present invention provide a method (200) of providing image data for constructing an image of a region of a target object, comprising detecting, by at least one detector (40), at least a portion of radiation scattered by a target object (30) with the incident radiation (10) or an aperture at a predetermined probe position, determining an offset vector (203) for reducing an error associated with the probe position (201), estimating a wavefront (210) based on a probe function having the offset vector applied to the probe position, and providing image data responsive to the detected radiation.
A method of providing image data for constructing an image of a region of a target object, comprising providing a reference diffraction pattern of a reference target object; determining an initial guess for a probe function based upon the reference diffraction pattern; and determining, by an iterative process based on the initial guess for the probe function and an initial guess for an object function, image data for a target object responsive to an intensity of radiation detected by at least one detector.
G06K 9/00 - Méthodes ou dispositions pour la lecture ou la reconnaissance de caractères imprimés ou écrits ou pour la reconnaissance de formes, p.ex. d'empreintes digitales
G06K 9/32 - Alignement ou centrage du capteur d'image ou de la zone image
G01N 23/205 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en utilisant des caméras de diffraction
G01T 1/29 - Mesure effectuée sur des faisceaux de radiations, p. ex. sur la position ou la section du faisceauMesure de la distribution spatiale de radiations
15.
Method and apparatus for imaging a three dimensional target object using incident radiation
A method of providing image data for constructing an image of a region of a three dimensional target object, comprising providing, from a radiation source, incident radiation directed at a target object, detecting an intensity of radiation scattered by the target object, and determining image data for each of a respective plurality of slices within the target object each indicating one or more characteristics of the target object at a respective depth within the target object, wherein the image data is determined based on the detected intensity of radiation via an iterative process wherein running estimates of the image data for each of the plurality of slices are updated step by step.
Embodiments of the present invention provide a method of determining at least one characteristic of a target surface, comprising providing a phase map for a first region of a target surface via radiation having a first wavelength, providing n further phase maps for the first region via radiation having a further n wavelengths each different from the first wavelength, and determining at least one characteristic at the target surface responsive to the first and further phase maps.
G01N 21/00 - Recherche ou analyse des matériaux par l'utilisation de moyens optiques, c.-à-d. en utilisant des ondes submillimétriques, de la lumière infrarouge, visible ou ultraviolette
H01J 37/22 - Dispositifs optiques ou photographiques associés au tube
G01B 11/24 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer des contours ou des courbes
G01B 11/30 - Dispositions pour la mesure caractérisées par l'utilisation de techniques optiques pour mesurer la rugosité ou l'irrégularité des surfaces
G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
Embodiments of the present invention provide a method of providing image data for constructing an image of a region of a target object, comprising providing incident radiation from a radiation source at a target object, detecting, by at least one detector, a portion of radiation scattered by the target object with the incident radiation or an aperture at first and second positions, and providing image data via an iterative process responsive to the detected radiation, wherein in said iterative process image data is provided corresponding to a portion of radiation scattered by the target object and not detected by the detector.
G06K 9/00 - Méthodes ou dispositions pour la lecture ou la reconnaissance de caractères imprimés ou écrits ou pour la reconnaissance de formes, p.ex. d'empreintes digitales
G01J 1/42 - Photométrie, p. ex. posemètres photographiques en utilisant des détecteurs électriques de radiations
G01T 1/29 - Mesure effectuée sur des faisceaux de radiations, p. ex. sur la position ou la section du faisceauMesure de la distribution spatiale de radiations
18.
Quantative phase imaging microscope and method and apparatus performing the same
A method and apparatus are disclosed for generating a plurality of scattered radiation patterns at an image plane of an optical microscope. The apparatus includes at least one lens element, a liquid crystal display (LCD) array, and a housing comprising a body portion supporting the LCD array and lens element in a predetermined spaced apart relationship. The LCD array comprises a plurality of pixel elements arranged in a grid layout, said array being connectable to a processing element adapted to selectively control a transmittance of each pixel in the grid layout.
G02F 1/13 - Dispositifs ou dispositions pour la commande de l'intensité, de la couleur, de la phase, de la polarisation ou de la direction de la lumière arrivant d'une source lumineuse indépendante, p. ex. commutation, ouverture de porte ou modulationOptique non linéaire pour la commande de l'intensité, de la phase, de la polarisation ou de la couleur basés sur des cristaux liquides, p. ex. cellules d'affichage individuelles à cristaux liquides
A collimating device is described. The collimating device includes a housing defining an interior surface and an exterior surface of the collimating device. The housing includes an inlet and an outlet and a cavity extending between the inlet and the outlet. The collimating device also includes a plurality of ridges extending from the interior surface of the housing toward a center of the cavity. The plurality of ridges form a plurality of slits within the cavity configured to collimate radiation entering the inlet and exiting the outlet.
A method and apparatus are disclosed for providing image data. The method includes the steps of providing incident radiation from a radiation source at a target object and, via at least one detector, detecting an intensity of radiation scattered by the target object. Also via the at least one detector an intensity of radiation provided by the radiation source absent the target object is detected. Image data is provided via an iterative process responsive to the intensity of radiation detected absent the target object and the detected intensity of radiation scattered by the target object.
G06K 9/00 - Méthodes ou dispositions pour la lecture ou la reconnaissance de caractères imprimés ou écrits ou pour la reconnaissance de formes, p.ex. d'empreintes digitales
G01T 1/00 - Mesure des rayons X, des rayons gamma, des radiations corpusculaires ou des radiations cosmiques
Embodiments of the present invention provide a computer-based method for providing image data of a region of a target object (31), comprising the steps of estimating (706) a first intermediate object function indicating at least one characteristic of a first sub-region (501, 503) of said region of the target object, estimating (706) a second intermediate object function indicating at least one characteristic of a second sub-region (502, 504) of said region of the target object, and combining (707) the first and second intermediate object functions to form a combined object function indicating at least one characteristic of the region of the target object (31).
A61B 6/00 - Appareils ou dispositifs pour le diagnostic par radiationsAppareils ou dispositifs pour le diagnostic par radiations combinés avec un équipement de thérapie par radiations
G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux
A method and apparatus are disclosed for providing image data for generating an image of a region of a target object. The method includes the steps of providing incident radiation, focusing the radiation downstream or upstream of a target object and via at least one detector located downstream of a focusing element, detecting an intensity of radiation scattered by the target object at an observation plane offset from a back focal plane associated with the focusing element.
G01N 21/00 - Recherche ou analyse des matériaux par l'utilisation de moyens optiques, c.-à-d. en utilisant des ondes submillimétriques, de la lumière infrarouge, visible ou ultraviolette
G01N 23/205 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en utilisant des caméras de diffraction
G01T 1/29 - Mesure effectuée sur des faisceaux de radiations, p. ex. sur la position ou la section du faisceauMesure de la distribution spatiale de radiations
G01N 21/88 - Recherche de la présence de criques, de défauts ou de souillures
brevets
