An electronics chassis includes an enclosure configured to house a printed circuit board (PCB). The enclosure includes one or more dovetail rails that are configured to affix one or more heat spreaders to the enclosure at a customizable position while the one or more heat spreaders are in thermal contact with the PCB.
09 - Appareils et instruments scientifiques et électriques
Produits et services
Computer software for test and measurement system design relating to industrial automation and scientific and engineering data acquisition, control and analysis
3.
Matrix Switching Workflow in a Test System for Device Testing
A matrix switching workflow allows for extending the virtual device configuration associated with a given single (test) site to multiple (test) sites, and expanding use of a single functional test program/sequence from a single site to multiple sites. Virtual device and connection support in a pin map editor enables mapping between switched instrument channels and switched device under test (DUT) pins on multiple sites, eliminating additional editing work. A switched channels section in a front test program design panel may list fully qualified channel connections to pins configured to a matrix switch. Configurations may be exported based on pin names and not based on the switch channel connection so that the configuration may be applied to switched instrument channels based on the specified pins. In order to avoid entering route/route-group names in the pin map, a specific route/route-group naming scheme may be used.
A planar transformer includes a core, a first circuit, a second circuit, and a primary conductive shield. The first circuit includes two or more primary windings that are stacked in two or more layers and are magnetically coupled to the core. The second circuit includes a rectifier circuit and two or more secondary windings that are magnetically coupled to the core. The primary conductive shield is stacked between a first primary winding of the two or more primary windings and a first secondary winding of the two or more secondary windings. The primary conductive shield reduces a capacitive coupling between the first primary winding and the first secondary winding.
Apparatuses, systems, and methods for, and more particularly to apparatuses, systems, and methods for a high-speed composite amplifier driving circuit to generate and output analog signals. The high-speed composite amplifier driving circuit can combine a voltage-controlled pulser and waveform generator with high-accuracy current-voltage (I-V) measurement functions. The voltage-controlled pulser and waveform generator, for example, can provide a ±5 volt, 10 milliamp waveform at up to 50 megahertz with 5 nanosecond rise/fall timing and 8 ns minimum pulse widths. In addition, the high-accuracy I-V measurements can measure a ±10 volts, 10 milliamp waveform at up to 30 MHz with 7-10 nanosecond rise/fall timing and 8 to 12 nanosecond minimum pulse widths.
H03K 3/011 - Modifications du générateur pour compenser les variations de valeurs physiques, p. ex. tension, température
H03K 3/57 - Générateurs caractérisés par le type de circuit ou par les moyens utilisés pour produire des impulsions par l'utilisation d'un élément accumulant de l'énergie déchargé dans une charge par un dispositif interrupteur commandé par un signal extérieur et ne comportant pas de réaction positive le dispositif de commutation étant un dispositif à semi-conducteurs
Apparatuses, systems, and methods for, and more particularly to apparatuses, systems, and methods for a high-speed composite amplifier driving circuit to generate and output analog signals. The high-speed composite amplifier driving circuit can combine a voltage-controlled pulser and waveform generator with high-accuracy current-voltage (I-V) measurement functions. The voltage-controlled pulser and waveform generator, for example, can provide a ±5 volt, 10 milliamp waveform at up to 50 megahertz with 5 nanosecond rise/fall timing and 8 ns minimum pulse widths. In addition, the high-accuracy I-V measurements can measure a ±10 volts, 10 milliamp waveform at up to 30 MHz with 7-10 nanosecond rise/fall timing and 8 to 12 nanosecond minimum pulse widths.
Methods and systems for performance assessment of a multichannel signal generator including a plurality of transmit channels. Configuration information is sent to the multichannel signal generator. An amplitude and phase is determined for a plurality of tones, and the tones are distributed over the transmit channels. Each transmit channel generates a periodic modulated signal comprising its respective tone. The generated periodic modulated signals are combined in a combined signal. The amplitudes and phases are determined so that the combined signal has a crest factor below a given threshold level. The combined signal is measured, based on the configuration information, and aligned relative to a reference combined signal. Individual tones are extracted from the aligned combined signal, and a relative delay and/or a phase offset is determined for at least two transmit channels by comparing the extracted individual tones with corresponding individual tones extracted from the reference combined signal.
Apparatuses, systems, and methods for data acquisition (DAQ) devices, and more particularly to apparatuses, systems, and methods for a simultaneously sampled DAQ device with flexible input terminal configurations. A DAQ device can be configured, e.g., via programmable driver software, to simultaneously sample analog input (AI) channels in differential mode or simultaneously sample AI+ and AI− signals in a single ended mode (RSE or NRSE). In addition, a DAQ device can be configured, e.g., via programmable driver software, to simultaneously sample AI channels in differential mode or pseudo-simultaneously sample AI+ and AI− signals in single ended mode (RSE or NRSE), e.g., all AI+ channels sampled simultaneously and then all AI− channels sample simultaneously.
In some embodiments, a method for synchronizing radio frequency (RF) devices can include receiving, a first stimuli signal including a maker signal from a first RF device and an output signal from a second RF device, wherein the output signal can be based at least in part on a second stimuli signal including a pulse waveform transmitted from the first RF device to the second RF device. The method can include digitizing the pulse waveform, measuring delay values between a first sample of the first stimuli signal and the digitized pulse waveform, and adjusting a timing of the marker signal. The method can include performing one or more pulse delay measurements associated with the first stimuli signal and the output signal as well as calculating a trigger delay. The method can also include performing, using the trigger delay, one or more measurements associated with a device under test (DUT).
G01R 19/25 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe utilisant une méthode de mesure numérique
G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
An apparatus for securely retaining a high voltage (e.g., greater than 1000 volts) banana plug can include a clamshell apparatus. The clamshell apparatus can include a first segment that includes a one or more mating pegs and a first threaded portion and a second segment that includes one or more mating slots and a second threaded portion. The first segment and the second segment can be configured to be assembled via a press-fit of the first segment to the second segment over a banana plug. In addition, when assembled, the first threaded portion and the second threaded portion are aligned to form a threaded fastener that is configured to retain the banana plug in a banana socket when engaged with a corresponding mating flange via the threaded fastener.
H01R 13/506 - SoclesBoîtiers composés de différentes pièces assemblées par enclenchement réciproque des pièces
H01R 13/207 - Broches, lames ou alvéoles conformés ou ayant une pièce séparée en vue de retenir ensemble les parties en fonctionnement par connexion vissée
Apparatuses, systems, and methods for artificial intelligence (AI) augmented data analysis can include providing a large language model (LLM), access to a data set. For example, an end user can interact with a user interface on a user device to provide instructions to the LLM to access the data set. In addition, the LLM can be interacted with via the user interface using natural language instructions and LLM output, based on the LLM analysis of the data set, can also be interacted with via the user interface. The LLM output can include one or more visualizations of the data set.
Apparatuses, systems, and methods for test sequence generation to validate a device under test (DUT) can include generating a structured set of test sequence inputs and performing a large language model (LLM) call using the structured set of test sequence inputs. The structured set of test sequence inputs can include parameters associated with the DUT, a list of available tests associated with the DUT, instructions for an LLM to query a database to retrieve test sequence information associated with the DUT, and/or an output structure. The LLM call can be used to generate the test sequence for validating the DUT based on the generated structured set of test sequence inputs.
Apparatuses, systems, and methods for generative Artificial Intelligence (AI)/Large Language Model (LMM) assisted test system specification based on an initial input of a request for quote (RFQ) or request for information (RFI). An RFQ/RFI document can be provided as input to the AI/LLM model. The AI/LLM model can also receive selection and detection criteria and user-provided input associated with the RFQ/RFI document as guidance for the generative AI/LLM process. The AI/LLM model generate a test system specification from the RFQ/RFI document, with the test system specification fulfilling one or more criteria identified from the RFQ/RFI document.
Apparatuses, systems, and methods for one or more models (e.g., generative Artificial Intelligence (AI) and/or large language model(s)) to determine technical specifications based on input documentation of a device under test (DUT). The model(s) may divide the documentation into portions, iteratively identify technical specifications in the portions, format the specifications, and/or identify duplicative or related specifications for removal or consolidation.
Apparatuses, systems, and methods for one or more models (e.g., generative Artificial Intelligence (AI) and/or large language model(s)) to determine technical specifications based on input documentation of a device under test (DUT). The model(s) may divide the documentation into portions, iteratively identify technical specifications in the portions, format the specifications, and/or identify duplicative or related specifications for removal or consolidation.
Apparatuses, systems, and methods for artificial intelligence (AI) augmented data analysis can include providing a large language model (LLM), access to a data set. For example, an end user can interact with a user interface on a user device to provide instructions to the LLM to access the data set. In addition, the LLM can be interacted with via the user interface using natural language instructions and LLM output, based on the LLM analysis of the data set, can also be interacted with via the user interface. The LLM output can include one or more visualizations of the data set.
G06F 40/169 - Annotation, p. ex. données de commentaires ou notes de bas de page
G06F 40/40 - Traitement ou traduction du langage naturel
G06N 3/006 - Vie artificielle, c.-à-d. agencements informatiques simulant la vie fondés sur des formes de vie individuelles ou collectives simulées et virtuelles, p. ex. simulations sociales ou optimisation par essaims particulaires [PSO]
Apparatuses, systems, and methods for test sequence generation to validate a device under test (DUT) can include generating a structured set of test sequence inputs and performing a large language model (LLM) call using the structured set of test sequence inputs. The structured set of test sequence inputs can include parameters associated with the DUT, a list of available tests associated with the DUT, instructions for an LLM to query a database to retrieve test sequence information associated with the DUT, and/or an output structure. The LLM call can be used to generate the test sequence for validating the DUT based on the generated structured set of test sequence inputs.
Apparatuses, systems, and methods for extracting structured specification requirements from specification documents associated with a device under test (DUT) can include generating one or more semantic units based on DUT specification documentation and performing a structured large language model (LLM) call to generate test requirements for the DUT based on the generated one or more semantic units and an entity extraction task. The entity extraction task can be defined via a system prompt command that is responsive to presenting an end user with a system prompt for the entity extraction task. The one or more semantic units can be generated via portioning of DUT specification documentation.
Apparatuses, systems, and methods for extracting structured specification requirements from specification documents associated with a device under test (DUT) can include generating one or more semantic units based on DUT specification documentation and performing a structured large language model (LLM) call to generate test requirements for the DUT based on the generated one or more semantic units and an entity extraction task. The entity extraction task can be defined via a system prompt command that is responsive to presenting an end user with a system prompt for the entity extraction task. The one or more semantic units can be generated via portioning of DUT specification documentation.
Apparatuses, systems, and methods for generative Artificial Intelligence (AI)/Large Language Model (LMM) assisted test system specification based on an initial input of a request for quote (RFQ) or request for information (RFI). An RFQ/RFI document can be provided as input to the AI/LLM model. The AI/LLM model can also receive selection and detection criteria and user-provided input associated with the RFQ/RFI document as guidance for the generative AI/LLM process. The AI/LLM model generate a test system specification from the RFQ/RFI document, with the test system specification fulfilling one or more criteria identified from the RFQ/RFI document.
G06Q 10/20 - Administration de la réparation ou de la maintenance des produits
G06Q 50/00 - Technologies de l’information et de la communication [TIC] spécialement adaptées à la mise en œuvre des procédés d’affaires d’un secteur particulier d’activité économique, p. ex. aux services d’utilité publique ou au tourisme
Efficient continuity testing for instruments connected to a mass interconnect. Digital input and output capabilities may be used on each pin of the mass interconnect to test a variety of input/output (I/O) types on a device under test. Each pin of the interconnect may connect to a respective corresponding digital input and digital output in the tester, with the digital input resistively coupled to the digital output. The connectivity of the pin to the digital input and the digital output, and the connectivity between the digital input and the digital output may be implemented with shift registers and a buffer stage, respectively. In some embodiments, the structure may be implemented through parallel I/O blocks, as in a complex programmable logic device (CPLD), field programmable gate array (FPGA), or microcontroller.
A system for emulating an over-the-air environment for testing a Frequency-modulated Continuous Wave (FMCW) light detection and ranging (LiDAR) unit under test (UUT). The system includes an optical lens system that receives an FMCW laser signal from the LiDAR UUT, and provides the signals to one or more optical fibers. A slope, chirp timing and intensity of the FMCW laser signal is determined using digital signal processing, and a modulation waveform is determined to emulate an over-the-air (OTA) environment based at least in part on the slope, chirp timing, and intensity. An in-phase quadrature phase (IQ) modulator modulates the FMCW laser signal using the modulation waveform and provides the modulated laser signal back through the optical lens system to the LiDAR UUT.
Methods and systems for resampling an input signal that includes a first plurality of values. A first resampling is performed to obtain an intermediate signal, which includes dividing the first plurality of values into a plurality of groups of values, resampling values in each group according to a first filter tap set to obtain an intermediate group of values. The first value of each group is aligned in time with the first value of each intermediate group. A second resampling is then performed on the intermediate signal to obtain an output signal, which performs a phase shift of each of the intermediate groups of values to align in time with a respective group of values of the output signal. The output signal is output by wired or wireless means.
A system for emulating an over-the-air environment for testing a Frequency-modulated Continuous Wave (FMCW) light detection and ranging (LiDAR) unit under test (UUT). The system includes an optical lens system that receives an FMCW laser signal from the LiDAR UUT, and provides the signals to one or more optical fibers. A slope, chirp timing and intensity of the FMCW laser signal is determined using digital signal processing, and a modulation waveform is determined to emulate an over-the-air (OTA) environment based at least in part on the slope, chirp timing, and intensity. An in-phase quadrature phase (IQ) modulator modulates the FMCW laser signal using the modulation waveform and provides the modulated laser signal back through the optical lens system to the LiDAR UUT.
A test system rack or cabinet includes a housing containing instruments or equipment and a mass interconnect (MIC) mounted within the housing. The MIC has inputs to couple to the instruments or equipment and outputs to couple to a second MIC separate from the rack. The test system rack has legs positioned underneath the housing to support the housing and the first MIC. The test system rack has actuators configured to adjust a position of the first MIC without adjusting a position of the one or more legs.
Disadvantages associated with present day instrument probes, e.g., active probes used with oscilloscopes, may be overcome by implementing an active probe entirely as a packaged integrated circuit (IC). The probe IC may be implemented in a small, low pin-count package to facilitate the mounting of many probe ICs in a small area. The probe IC may include an interface for configuration as well as customized software to control the probe IC and measurement instrumentation, for example, an oscilloscope, for a variety of applications. The probe IC may be implemented as any one of different types of probes, including active probes and passive probes, voltage probes and current probes, or single ended probes and differential probes.
Methods, computing devices, and software programs for identifying a driving scenario in real-time driving data. A driving scenario is received and translated into an ordered sequence of events that correspond to the driving scenario. A signal computation function is determined for each event in the sequence, which quantifies proximity to the respective event. Driving data is received for a plurality of time steps. Values of each signal computation function are determined, evaluated for the driving data at each of the plurality of time steps. It is determined whether the driving scenario has occurred in the driving data based on the values of the signal computation function. A first portion of the driving data is either modified, discarded, or stored in memory based on the determination whether the driving scenario has occurred.
A control system exhibits improved dynamic performance in a constant voltage (CV) control mode that is also invariant of the source type and operating points. The improvements may be achieved with minimal or potentially no additional parts to the control circuit by replacing a voltage-controlled current source with a voltage-controlled resistance as the control element in the system feedback loop. An input voltage from a device under test (DUT) is measured, a feedback control voltage is determined based at least in part on the input voltage to provide a CV mode control loop for the DUT, and the feedback control voltage added to the input voltage is applied to the DUT to operate the DUT in the CV mode.
G05F 1/56 - Régulation de la tension ou de l'intensité là où la variable effectivement régulée par le dispositif de réglage final est du type continu utilisant des dispositifs à semi-conducteurs en série avec la charge comme dispositifs de réglage final
G01R 19/00 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe
29.
Specification to Test using Generative Artificial Intelligence
Apparatuses, systems, and methods for generative Artificial Intelligence (AI) assisted test process development based on an initial input of a specification of a device under test (DUT). The specification of the DUT may be inputted into the Generative AI model. The Generative AI model may summarize the specification, request further input via an interaction with an end user to finalize a description of the DUT, and generate/create test assets, such as code, documentation, tables, diagrams, and so forth. The Generative AI model may collaborate with the end user to refine outputs from the test assets. The refined test assets may be sent to software applications that can use/run/deploy various test assets. Additionally, the generative AI may access local test hardware and enumerate test hardware on other systems via network/serial communications to create a test system that fits the identified hardware.
A matrix switching workflow allows for extending the virtual device configuration associated with a given single (test) site to multiple (test) sites, and expanding use of a single functional test program/sequence from a single site to multiple sites. Virtual device and connection support in a pin map editor enables mapping between switched instrument channels and switched device under test (DUT) pins on multiple sites, eliminating additional editing work. A switched channels section in a front test program design panel may list fully qualified channel connections to pins configured to a matrix switch. Configurations may be exported based on pin names and not based on the switch channel connection so that the configuration may be applied to switched instrument channels based on the specified pins. In order to avoid entering route/route-group names in the pin map, a specific route/route-group naming scheme may be used.
A system and method for testing an antenna-under-test (AUT). A multi-probe antenna array receiver is moved to a plurality of positions within a scan area. At each position, each probe antenna element of the receiver receives a near-field (NF) over-the-air (OTA) signal from the AUT. An alignment procedure is performed to align reception locations for signals received by different ones of the plurality of probe antenna elements. Correction factors are determined that characterize amplitude and phase discrepancies between the probe antenna elements of the receiver. The correction factors are applied to the received signals, and the corrected signals are combined at each reception location to obtain average signals. A far-field (FF) transmission pattern for the AUT is determined based on a discrete Fourier transform of the average signals and stored in a non-transitory computer readable memory medium.
A system and method for testing an antenna-under-test (AUT). A multi-probe antenna array transmitter is moved to a plurality of positions within a scan area. At each position, each probe antenna element of the transmitter transmits a near-field (NF) over-the-air (OTA) signal to the AUT. An alignment procedure is performed to align transmission locations for signals transmitted by different ones of the plurality of probe antenna elements. Correction factors are determined that characterize amplitude and phase discrepancies between the probe antenna elements of the transmitter. The correction factors are applied to the signals, and the corrected signals are combined at each transmission location to obtain average signals. A far-field (FF) reception pattern for the AUT is determined based on a discrete Fourier transform of the average signals and stored in a non-transitory computer readable memory medium.
Systems, methods and devices for performing dynamically controlled battery cell formation. A formation process is performed on a plurality of battery cells. A series connection is established through each of the plurality of battery cells and a cycling device. Each battery cell is coupled to a respective monitoring device to monitor performance during cell formation. The monitoring devices provide indications to a controller when their monitored battery cells experience a status change. Responsive to the indication, instructions are provided for synchronously modifying the series connection through the first battery cell and modifying a voltage amplitude at the cycling device. Modifying the series connection through the first battery cell may include switching a voltage polarity across the first battery cell shorting the series connection around the first battery cell without modifying the series connection through the other battery cells.
Systems, methods and devices for performing dynamically controlled battery cell formation. A formation process is performed on a plurality of battery cells. A series connection is established through each of the plurality of battery cells and a cycling device. Each battery cell is coupled to a respective monitoring device to monitor performance during cell formation. The monitoring devices provide indications to a controller when their monitored battery cells experience a status change. Responsive to the indication, instructions are provided for synchronously modifying the series connection through the first battery cell and modifying a voltage amplitude at the cycling device. Modifying the series connection through the first battery cell may include switching a voltage polarity across the first battery cell shorting the series connection around the first battery cell without modifying the series connection through the other battery cells.
Systems, methods, and devices for characterizing a defect of a device-under-test (DUT). A first measurement is performed of a first quantity on the DUT prior to performing a first operation on the DUT, producing a first result. The first operation is performed on the DUT, and subsequently a second measurement of the first quantity is performed on the DUT, producing a second result. A defect class is characterized for the DUT from a plurality of defect classes based on a difference between the first and second results.
A system and method for determining an error vector magnitude (EVM) of a polarized transmission from a device-under-test (DUT). A first signal transmitted by the DUT is received via a horizontally polarized receiver antenna, and a second signal transmitted by the DUT is received via a vertically polarized receiver antenna. The second signal is coherent with the first signal. The EVM is calculated based at least in part on the first signal and the second signal and a reference signal.
Systems, methods, and devices for characterizing a defect of a device-under-test (DUT). A first measurement is performed of a first quantity on the DUT prior to performing a first operation on the DUT, producing a first result. The first operation is performed on the DUT, and subsequently a second measurement of the first quantity is performed on the DUT, producing a second result. A defect class is characterized for the DUT from a plurality of defect classes based on a difference between the first and second results.
G01R 31/389 - Mesure de l’impédance interne, de la conductance interne ou des variables similaires
G01R 31/36 - Dispositions pour le test, la mesure ou la surveillance de l’état électrique d’accumulateurs ou de batteries, p. ex. de la capacité ou de l’état de charge
G01R 31/367 - Logiciels à cet effet, p. ex. pour le test des batteries en utilisant une modélisation ou des tables de correspondance
G01R 31/385 - Dispositions pour mesurer des variables des batteries ou des accumulateurs
39.
System and method of adaptively assigning scenario-based tests to test assets
Techniques for assigning scenario-based tests to test assets are described. In an example, a scenario-based test operable to test a key performance indicator (KPI) of a System Under Test (SUT), a component behavior exhibited by a first component of the SUT, and a scenario characteristic are received. Based on the component behavior and the scenario characteristic, a first plurality of behavior models associated with the component behavior are identified. Based on the scenario characteristic a characteristic value is extracted from the scenario-based test. Each behavior model of the first plurality of behavior models is executed using the characteristic value to generate a first plurality of predicted behavior outcomes. Based on the first plurality of predicted behavior outcomes, a first test asset type from a plurality of test asset types is selected and the scenario-based test is transmitted to a test asset of the first test asset type.
G06F 30/20 - Optimisation, vérification ou simulation de l’objet conçu
G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle
40.
ELECTROCHEMICAL PROCESS MANIFOLDS FOR BATTERY CELL MONITORING
Systems, methods and devices for constructing an electrochemical process manifold (EPM) for a battery cell during a formation process. The current through the cell is controllably adjusted to charge or discharge the cell. The temperature and/or pressure may be controllably adjusted along with the current. At each of a plurality of time steps as the current is controllably adjusted, the voltage across the cell is measured and integrated over time to obtain a voltage-hours value for each time step. A data point is stored in memory for each time step that includes the measured voltage, the voltage-hours value, and the current through the cell at the respective time step. The data points for each time step are mapped onto an EPM, and the EPM is stored in a non-transitory computer-readable memory medium.
H01M 10/42 - Procédés ou dispositions pour assurer le fonctionnement ou l'entretien des éléments secondaires ou des demi-éléments secondaires
G01R 31/367 - Logiciels à cet effet, p. ex. pour le test des batteries en utilisant une modélisation ou des tables de correspondance
H01M 10/0525 - Batteries du type "rocking chair" ou "fauteuil à bascule", p. ex. batteries à insertion ou intercalation de lithium dans les deux électrodesBatteries à l'ion lithium
41.
Electrochemical Process Manifolds for Battery Cell Monitoring
Systems, methods and devices for constructing an electrochemical process manifold (EPM) for a battery cell during a formation process. The current through the cell is controllably adjusted to charge or discharge the cell. The temperature and/or pressure may be controllably adjusted along with the current. At each of a plurality of time steps as the current is controllably adjusted, the voltage across the cell is measured and integrated over time to obtain a voltage-hours value for each time step. A data point is stored in memory for each time step that includes the measured voltage, the voltage-hours value, and the current through the cell at the respective time step. The data points for each time step are mapped onto an EPM, and the EPM is stored in a non-transitory computer-readable memory medium.
G01R 31/36 - Dispositions pour le test, la mesure ou la surveillance de l’état électrique d’accumulateurs ou de batteries, p. ex. de la capacité ou de l’état de charge
G01R 31/378 - Dispositions pour le test, la mesure ou la surveillance de l’état électrique d’accumulateurs ou de batteries, p. ex. de la capacité ou de l’état de charge spécialement adaptées à un type de batterie ou d’accumulateur
G01R 31/3828 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p. ex. état de charge utilisant l’intégration du courant
G01R 31/3842 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p. ex. état de charge combinant des mesures de tension et de courant
G01R 31/392 - Détermination du vieillissement ou de la dégradation de la batterie, p. ex. état de santé
G01R 31/396 - Acquisition ou traitement de données pour le test ou la surveillance d’éléments particuliers ou de groupes particuliers d’éléments dans une batterie
H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p. ex. le niveau ou la densité de l'électrolyte
H01M 50/569 - Détails de construction des connexions conductrices de courant pour détecter les conditions à l'intérieur des cellules ou des batteries, p. ex. détails des bornes de détection de tension
42.
METHOD AND SYSTEM FOR ESTABLISHING DATA TRANSFER PROCESSES BETWEEN COMPONENTS OF A TEST SYSTEM
In an example, a first testing device is configured to receive testing data from a second testing. The first testing device is configured to send a stimulus to a device under test. The first testing device obtains test data reception methods and test data reception formats that are compatible with the first testing device and translates the methods and formats into content that is readable by the second testing device. The content is received by the second testing device, which accesses test data transmission methods and formats compatible with the second testing device and defines an intersection of the reception and transmission test data formats. The second testing device sends the intersection of methods and formats to the first testing device, which reduces the intersection to a final method and format.
A reflectometer may include two directional couplers configured in parallel by being disposed across from each other on opposite sides of a shared section of a signal line. One of the couplers may couple, to a first port of the reflectometer, a portion of the signal power of a first signal flowing from the first end of the shared through-line to the second end of the shared through-line, and the other coupler may couple, to a second port of the reflectometer, a portion of the signal power of a second signal flowing from the second end of the shared through-line to the first end of the shared through-line. The reflectometer benefits from reduced size and signal loss relative to a serial coupler configuration. When used in vector network analyzer (VNA) systems, this results in higher output power and higher dynamic range of the VNA.
G01R 27/06 - Mesure des coefficients de réflexionMesure du rapport d'ondes stationnaires
G01R 27/28 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire
44.
VIRTUALIZED AUTOMATED TEST EQUIPMENT AND METHODS FOR DESIGNING SUCH SYSTEMS
A virtualizable automated test equipment architecture includes a circuit assembly. The circuit assembly includes a number of signal paths that extend between a front plane and a backplane. The signal paths can be continuous and isolated from other signal paths of the plurality of signal paths. The circuit assembly also includes an impedance disposed along a signal path of the plurality of signal paths. A plurality of software-configurable physical disconnects may be arranged within the circuit assembly to form a switching matrix. The plurality of signal paths can be associated with a plurality of software-configurable physical disconnects, which can be configured to open and close signal paths of the plurality of signal paths based on the predetermined test requirements. The circuit assembly also includes a plurality of external device connections, at least one of which may be configured to interface with a unit under test (UUT). The software configurable physical disconnects may be configurable at runtime. Because the system is virtualizable, multiplied UUTs may be tested simultaneously according to different requirements, and the testing may be executed on shared hardware in a manner transparent to the UUTs.
Efficient continuity testing for instruments connected to a mass interconnect. Digital input and output capabilities may be used on each pin of the mass interconnect to test a variety of input/output (I/O) types on a device under test. Each pin of the interconnect may connect to a respective corresponding digital input and digital output in the tester, with the digital input resistively coupled to the digital output. The connectivity of the pin to the digital input and the digital output, and the connectivity between the digital input and the digital output may be implemented with shift registers and a buffer stage, respectively. In some embodiments, the structure may be implemented through parallel I/O blocks, as in a complex programmable logic device (CPLD), field programmable gate array (FPGA), or microcontroller.
A method of orchestrating measurements in a measurement system includes configuring a first service with a first configuration for acquiring measurement data by an orchestrator. The method also includes receiving a moniker generated by the first service in response to being configured that represents the first configuration. The moniker includes a location of the first service and an identifier of the first configuration. The method also includes transferring the moniker to a second service configured to establish communication with the first service based on the location, consume the measurement data acquired by the first service using the first configuration and transmitted in response to receiving the identifier from the second service, and generate a result in response to receiving the measurement data from the first service. The method further includes receiving the result from the second service.
H04L 41/5054 - Déploiement automatique des services déclenchés par le gestionnaire de service, p. ex. la mise en œuvre du service par configuration automatique des composants réseau
H04L 41/0806 - Réglages de configuration pour la configuration initiale ou l’approvisionnement, p. ex. prêt à l’emploi [plug-and-play]
H04L 61/4511 - Répertoires de réseauCorrespondance nom-adresse en utilisant des répertoires normalisésRépertoires de réseauCorrespondance nom-adresse en utilisant des protocoles normalisés d'accès aux répertoires en utilisant le système de noms de domaine [DNS]
47.
Dynamic range extension of radio frequency signals using phasing of two or more IQ channels
Dynamic range of radio frequency transmitters and receivers may be improved via a multiple-channel phasor configuration in which channels are phased in a manner that distributes the local oscillator phases over π/2 radians. A multiple-channel phasing receiver may include a power splitter to split an input signal into multiple signals, and may further include multiple single-channel receivers providing intermediate signals. Each single-channel receiver may have an input that receives a respective signal of the multiple signals, and may further have an output to provide a respective intermediate signal as a function of the respective input signal, a total gain applied to the respective input signal, a signal frequency of the local oscillator signal, and a respective phase of the local oscillator signal. The multiple-channel receiver may include a digital signal processor that combines the plurality of intermediate signals into a single output signal. A multiple-channel transmitter/transceiver may be similarly implemented.
Methods and computing devices for matching an instrument to a device-under-test for performing a test procedure. A first data structure is constructed based on a data sheet of an instrument. The first data structure includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. A test case is constructed based on a test procedure to be performed on the DUT. The test case includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. The attributes, phenomena, and testing interactions of the first data structure and the test case are compared to determine a matching condition, and instructions are output based on the matching condition.
National Instruments Ireland Resources Limited (Irlande)
Inventeur(s)
Vanden Bossche, Marc
Abrégé
In a measurement system, a signal probing circuit may provide probed signals by probing voltages and currents and/or incident and reflected waves at a port of a device under test (DUT). A multi-channel receiver structure may include receivers that receive two probed signals from the signal probing hardware circuit, each receiver having its own sample clock derived from a master clock and further having a respective digitizer for digitizing a corresponding one of the two probed signals. A synchronization block, external to the receivers and including a reference clock derived from the master clock, may enable the two probed signals to be phase coherently digitized across the receivers by synchronizing the respective sample clocks of the receivers while the reference clock is being shared with the receivers. A signal processing circuit may then process the phase coherently digitized probed signals.
A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.
Embodiments are presented herein of an open-loop test system for testing vertical-cavity surface-emitting lasers (VCSELs). A high-speed pulse generator may be used to produce nanoseconds pulses provided to the VCSEL device. A high-speed oscilloscope may be used to measure the resultant nanoseconds pulses across the VCSEL device. The VCSEL device voltage and VCSEL device current may be obtained from the measured nanosecond pulses according to compensation data derived from the system. A pre-test compensation procedure may be used to obtain the compensation data, which may include representative characteristics of each system component. The compensation procedure may also include capturing specified pulse trains under different load conditions of the pulse generator to obtain a scaling relationship between the VCSEL device current and an input voltage used for the pulse generation, and also for obtaining various parameters later used to derive an accurate VCSEL device voltage and an accurate VCSEL device current.
G01R 19/03 - Mesure des valeurs efficaces, c.-à-d. des valeurs moyennes quadratiques utilisant des thermoconvertisseurs
G01R 19/00 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe
H01S 5/183 - Lasers à émission de surface [lasers SE], p. ex. comportant à la fois des cavités horizontales et verticales comportant uniquement des cavités verticales, p. ex. lasers à émission de surface à cavité verticale [VCSEL]
52.
Reduction of emulated channel count for phased-array systems through angle-of-arrival processing
Systems and methods for emulating a channel for wireless communications between a transmit (TX) system-under-test (SUT) and a receive (RX) SUT. The TX and RX SUTs include integrated antenna arrays for transmitting and receiving wireless signals. For a plurality of paths of the emulated channel, and for each antenna element of the TX SUT, a respective phase shift and gain modification is applied to a wireless signals transmitted by the respective antenna element. The phase shifts and gain modifications emulate path length differences between different antenna elements. The signals for each antenna element are summed, and a path-specific modification is applied to each aggregate signal for each path. For each RX antenna element, phase shift and gain modifications are applied to emulate path-length differences for the RX antenna elements, the resultant signals are summed for each path, and the emulated wireless signals are output to the RX antenna elements.
Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or more probabilistic representations for the set of parameters. The one or more probabilistic representations are constructed based on the set of test values. A set of cumulative probabilities of passing for the set of parameters are calculated based on the set of simulated test values and the limits. A reduced set of parameters are determined from the set of parameters based on the set of cumulative probabilities of passing. The reduced set of parameters are deployed for testing the device.
Methods and computing devices for allocating test pods to a distributed computing system for executing a test plan on a device-under-test (DUT). Each test pod may include a test microservice including one or more test steps and an event microservice specifying function relations between the test microservice and other test microservices. The test pods are allocated to different servers to perform a distributed execution of the test plan on the DUT through one or more test interfaces.
G06F 9/44 - Dispositions pour exécuter des programmes spécifiques
G06F 11/273 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie
G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p. ex. essais de mise en route
55.
Dual directional asymmetric coupler with a shared through-line
A reflectometer may include two directional couplers in a parallel configuration, sharing the same section of a signal line or through-line. For example, two directional couplers may be disposed across from each other on opposite sides of the shared through-line. One of the directional couplers may couple, to a first port of the reflectometer, a portion of the signal power of a first signal flowing from the first end of the shared through-line to the second end of the shared through-line, and the other directional coupler may couple, to a second port of the reflectometer, a portion of the signal power of a second signal flowing from the second end of the shared through-line to the first end of the shared through-line. The reflectometer benefits from reduced size and signal loss with respect to reflectometers having a serial configuration. When used in vector network analyzer (VNA) systems, this results in higher output power and higher dynamic range of the VNA.
G01R 27/06 - Mesure des coefficients de réflexionMesure du rapport d'ondes stationnaires
G01R 27/28 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire
Various types of electronic devices may be mounted in a chassis in order to facilitate interfacing with the devices, containing the devices, provide cooling systems which may remove heat from the electronic devices, etc. Delivering adequate cooling air flow to each electronic device in a chassis may be an important issue for the proper functioning, lifetime, or other characteristics of electronic devices contained in a chassis. Some electronic devices may be particularly challenging to cool due to various design characteristics. Other electronic devices may have other requirements that are not well served by existing chassis designs. For example, some electronic devices may benefit from additional electrical and/or thermal connections. Embodiments presented herein describe a novel design for a modular card cage accessory that may be configured to modify air flow and/or to meet particular requirements of an electronic device in a chassis, among various possibilities.
A user equipment device (UE) determines a beam coherence interval metric, which is a measure of stability of a beam pair over time based on a set of beam coherence intervals measured by the UE. The beam pair comprises a receive beam of the UE and a transmit beam of a base station transmitting to the UE. A beam coherence interval comprises a time duration within which a quality of a signal received on the UE receive beam remains within one of a plurality of signal quality bins. The UE also determines a hysteresis value based on the beam coherence interval metric and uses the hysteresis value to decide to switch from an active receive beam to a different receive beam that has a signal quality higher than the active receive beam by at least the hysteresis value. Alternatively, the base station determines and sends the UE the hysteresis value.
H04B 7/06 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station d'émission
H04W 16/28 - Structures des cellules utilisant l'orientation du faisceau
A test system may be used for obtaining accurate remote sense voltage and/or current values. A measurement instrument may provide a regulated stimulus signal to a device under test (DUT) and measure a DUT signal developed at least partially in response to the stimulus signal. A test circuit may superimpose a test signal over the stimulus signal to cause the DUT signal to be developed further in response to the test signal. The DUT signal may be used to derive a resistance of the path that couples the measurement instrument to the DUT. The measurement instrument may include a source measure unit, the stimulus signal may be a regulated voltage, and the DUT signal may be a sense voltage. The harmonics of the DUT signal may be analyzed to determine a correlation between an amplitude of a measured fundamental frequency of the DUT signal and the resistance of the path.
G01R 27/16 - Mesure de l'impédance d'un élément ou d'un réseau dans lequel passe un courant provenant d'une autre source, p. ex. câble, ligne de transport de l'énergie
G01R 31/319 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie
09 - Appareils et instruments scientifiques et électriques
42 - Services scientifiques, technologiques et industriels, recherche et conception
Produits et services
Downloadable computer software for utilizing quantifying and analyzing scientific information across multiple platforms; Recorded computer software and hardware for providing a framework to connect quantification and analysis systems from different platform environments sold as a unit Computer hardware and software design; Design and development of software and hardware for providing a framework to connect quantification and analysis systems from different platform environments
60.
MEASUREMENT SYSTEM FOR CHARACTERIZING A DEVICE UNDER TEST
NATIONAL INSTRUMENTS IRELAND RESOURCES LIMITED (Irlande)
Inventeur(s)
Vanden Bossche, Marc
Abrégé
The present invention relates to a measurement system (100) for determining voltage and current or incident and reflected wave at at least one port of a device under test (OUT). The OUT is excited by at least one modulated signal. The measurement system comprises : - at least one signal probing hardware circuit (30) configured to provide probed signals resulting from probing at a port of the OUT while allowing a signal to flow towards the OUT or while arranged to provide a termination to the OUT, one or more of voltage and current or incident and reflected wave, - a multi-channel receiver structure (62) comprising a plurality of receivers (64), configured to receive two probed signals coming from at least one of the signal probing hardware circuits, each of the plurality of receivers comprising a respective digitizer (66) for digitizing a corresponding one of the two probed signals, the respective digitizer having its own sample clock (67) derived from a master clock, - a synchronization block (80) external to the plurality of receivers and comprising a reference clock derived from the master clock, the synchronization block configured to enable the two probed signals to be phase coherently digitized across the plurality of receivers by synchronizing the respective sample clocks of the plurality of receivers while the reference clock is being shared with the plurality of receivers, - a signal processing circuit (90) configured to process the phase coherently digitized probed signals.
G01R 31/3193 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie avec une comparaison entre la réponse effective et la réponse connue en l'absence d'erreur
G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
G01R 27/28 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire
61.
Measurement system for characterizing a device under test
National Instruments Ireland Resources Limited (Irlande)
Inventeur(s)
Vanden Bossche, Marc
Abrégé
In a measurement system, a signal probing circuit may provide probed signals by probing voltages and currents and/or incident and reflected waves at a port of a device under test (DUT). A multi-channel receiver structure may include receivers that receive two probed signals from the signal probing hardware circuit, each receiver having its own sample clock derived from a master clock and further having a respective digitizer for digitizing a corresponding one of the two probed signals. A synchronization block, external to the receivers and including a reference clock derived from the master clock, may enable the two probed signals to be phase coherently digitized across the receivers by synchronizing the respective sample clocks of the receivers while the reference clock is being shared with the receivers. A signal processing circuit may then process the phase coherently digitized probed signals.
An open-loop test system (300, 400) for testing vertical-cavity surface-emitting lasers (306) is provided. A high-speed pulse generator (402, 302) may be used to produce nanoseconds pulses provided to the VCSEL device (306). A high-speed oscilloscope (410) may be used to measure the resultant nanoseconds pulses across the VCSEL device (306). The VCSEL device voltage and VCSEL device current may be obtained from the measured nanosecond pulses according to compensation data (308) derived from the system (300, 400). A pre-test compensation procedure may be used to obtain the compensation data (308), which may include representative characteristics of each system component. The compensation procedure may also include capturing specified pulse trains under different load conditions of the pulse generator (302) to obtain a scaling relationship between the VCSEL device current and an input voltage used for the pulse generation, and also to obtain various parameters later used to derive the accurate VCSEL device voltage and the accurate VCSEL device current.
G01R 27/00 - Dispositions pour procéder aux mesures de résistance, de réactance, d'impédance, ou de caractéristiques électriques qui en dérivent
G01R 31/00 - Dispositions pour tester les propriétés électriquesDispositions pour la localisation des pannes électriquesDispositions pour tests électriques caractérisées par ce qui est testé, non prévues ailleurs
63.
Direct network access by a memory mapped peripheral device for scheduled data transfer on the network
A network interface peripheral device (NIP) may include a network interface for communicating with a network, and an interconnect interface for communicating with a processor subsystem. First buffers in the NIP may hold data received from and/or distributed to peer peripherals by the NIP, and second buffers may hold payload data of scheduled data streams transmitted to and/or received from the network by the NIP. Payload data from the data in the first buffers may be stored in the second buffers and transmitted to the network according to transmit events generated based on a received schedule. Data may be received from the network according to receive events generated based on the received schedule, and distributed from the second buffers to the first buffers. A centralized system configuration entity may generate the schedule, manage configuration of the NIP, and coordinate the internal configuration of the NIP with a network configuration flow.
Methods, apparatuses, and systems for verifying alignment of a compact antenna test range (CATR) are presented. A radio frequency (RF) profile may be generated based on test signals received by a reference antenna at a plurality of orientations. Phase and amplitude data of the RF profile may be used to determine whether the CATR is aligned properly.
H01Q 21/24 - Combinaisons d'unités d'antennes polarisées dans des directions différentes pour émettre ou recevoir des ondes polarisées circulairement ou elliptiquement ou des ondes polarisées linéairement dans n'importe quelle direction
H01Q 13/24 - Antennes constituées par un guide non résonnant à ondes de fuite ou une ligne de transmissionStructures équivalentes produisant un rayonnement le long du trajet de l'onde guidée constitué par une tige ou un tube diélectrique ou ferromagnétique
H04B 3/56 - Circuits de couplage, blocage ou dérivation des signaux
H01Q 13/28 - Antennes constituées par un guide non résonnant à ondes de fuite ou une ligne de transmissionStructures équivalentes produisant un rayonnement le long du trajet de l'onde guidée comportant des éléments présentant des discontinuités électriques et espacées dans la direction de la propagation de l'onde, p. ex. élément diélectrique ou élément conducteur formant diélectrique artificiel
H01Q 1/24 - SupportsMoyens de montage par association structurale avec d'autres équipements ou objets avec appareil récepteur
65.
Virtualized automated test equipment and methods for designing such systems
A virtualizable automated test equipment architecture includes a circuit assembly. The circuit assembly includes a number of signal paths that extend between a front plane and a backplane. The signal paths can be continuous and isolated from other signal paths of the plurality of signal paths. The circuit assembly also includes an impedance disposed along a signal path of the plurality of signal paths. A plurality of software-configurable physical disconnects may be arranged within the circuit assembly to form a switching matrix. The plurality of signal paths can be associated with a plurality of software-configurable physical disconnects, which can be configured to open and close signal paths of the plurality of signal paths based on the predetermined test requirements. The circuit assembly also includes a plurality of external device connections, at least one of which may be configured to interface with a unit under test (UUT). The software configurable physical disconnects may be configurable at runtime. Because the system if virtualizable, multiplied UUTs may be tested simultaneously according to different requirements, and the testing may be executed on shared hardware in a manner transparent to the UUTs.
A multiphase current-sharing configuration may include at least two power supplies providing respective output-currents in the current-sharing configuration. One or more of the power supplies may itself be a multiphase power supply. A first power supply of the current-sharing configuration may detect a phase difference between an external control signal provided to the first power supply to control the output voltage of the first power supply, and an internal control signal provided by a VCO of the first power supply. The phase difference may be provided to an integrator to cause the internal control signal to track the external control signal when the external control signal is available, and maintain a present operating frequency of the internal control signal in case the external control signal is lost, in which case the internal control signal may be used to uninterruptedly control the output voltage of the first power supply.
H02M 3/28 - Transformation d'une puissance d'entrée en courant continu en une puissance de sortie en courant continu avec transformation intermédiaire en courant alternatif par convertisseurs statiques utilisant des tubes à décharge avec électrode de commande ou des dispositifs à semi-conducteurs avec électrodes de commande pour produire le courant alternatif intermédiaire
H02J 1/10 - Fonctionnement de sources à courant continu en parallèle
H02M 1/00 - Détails d'appareils pour transformation
H02M 3/335 - Transformation d'une puissance d'entrée en courant continu en une puissance de sortie en courant continu avec transformation intermédiaire en courant alternatif par convertisseurs statiques utilisant des tubes à décharge avec électrode de commande ou des dispositifs à semi-conducteurs avec électrodes de commande pour produire le courant alternatif intermédiaire utilisant des dispositifs du type triode ou transistor exigeant l'application continue d'un signal de commande utilisant uniquement des dispositifs à semi-conducteurs
67.
METHOD AND SYSTEM FOR OVER-THE-AIR TESTING OF MILLIMETER WAVE ANTENNA ARRAYS
A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.
A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.
Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a complex-valued cross-correlation measurement, and a real component of the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.
A connector gap between a module connector mating surface and the backplane connector of a chassis may be eliminated through a mechanism that forcefully pushes (or pulls) the module towards the backplane and/or forcefully pushes (or pulls) the backplane toward the module. A spring-loaded or resilient element may be used to fasten the module in a way that effectively fills any designed-in and tolerance-induced gap in the connector interface, allowing the connector to fully seat. In addition, a gasket or other compressible member may be included at the connector mating interface. The gap in the connector interface may be reduced by introducing adjustable card cage members that are capable of being set during the assembly or manufacturing process using special alignment fixtures. The gap in the connector interface may also be reduced by introducing a higher tolerance capable manufacturing process, such as machining, to the card cage sub-assembly.
Various embodiments are presented of a system including an alignment fixture for testing (e.g., rapidly and cheaply) phased array antennas and other devices configured for radio frequency (RF) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be positioned in a testing position by the alignment fixture. The alignment fixture may provide a configurable level of friction to retain the DUT in the testing position. The alignment fixture may provide isolation from electromagnetic interference for the DUT while in the testing position.
System and method for machine condition monitoring using phase adjusted vector averaging. An analog signal from a sensor measuring a machine parameter may be acquired, thereby generating a first digital signal that includes multiple analysis blocks of data. For each analysis block, a complex valued frequency spectrum (CVFS) may be computed via a Discrete Fourier transform (DFT), at least one reference frequency may be specified, and a complex valued phase compensation vector that preserves magnitude while adjusting phase constructed to achieve coherence between reference frequency components (RFCs) and the selected analysis block. The CVFS may be phase compensated by multiplying the complex valued phase compensation vector with the complex-valued frequency spectrum. The complex valued frequency spectra of the analysis blocks may be vector averaged, thereby improving signal to noise ratio at specified frequencies. RFCs in the averaged spectrum may be identified, thereby generating average RFCs analyzable to determine machine condition.
A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave (FMCW) LiDAR UUT, and/or a flash LiDAR UUT.
G01S 7/493 - Extraction des signaux d'écho désirés
G01S 17/10 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes à modulation d'impulsion interrompues
G01S 17/34 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes continues, soit modulées en amplitude, en fréquence ou en phase, soit non modulées utilisant la transmission d'ondes continues modulées en fréquence, tout en faisant un hétérodynage du signal reçu, ou d’un signal dérivé, avec un signal généré localement, associé au signal transmis simultanément
G06F 30/20 - Optimisation, vérification ou simulation de l’objet conçu
G01S 17/931 - Systèmes lidar, spécialement adaptés pour des applications spécifiques pour prévenir les collisions de véhicules terrestres
74.
Data model for measurement data storage in databases
A non-transitory computer-readable memory medium may store a first table comprising rows, wherein each row comprises a first data set identification (ID) field which stores a measurement data set identifier value identifying a measurement data set, and one or more fields for storing measurement data metadata associated with the identified data set. The medium may also store a second table comprising rows, wherein each row comprises a second data set identification (ID) field which stores a measurement data set identifier value present in the first data set ID field. The second table may also store a datapoints field for storing individual data set datapoints and a data set index field corresponding to an ordering of the individual data set datapoints. At least a portion of each of the fields of both the first and second tables may be stored in a columnar format in contiguous memory.
A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave (FMCW) LiDAR UUT, and/or a flash LiDAR UUT.
A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave LiDAR UUT, and/or a flash LiDAR UUT.
G01S 7/493 - Extraction des signaux d'écho désirés
G01S 17/10 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes à modulation d'impulsion interrompues
G01S 17/34 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes continues, soit modulées en amplitude, en fréquence ou en phase, soit non modulées utilisant la transmission d'ondes continues modulées en fréquence, tout en faisant un hétérodynage du signal reçu, ou d’un signal dérivé, avec un signal généré localement, associé au signal transmis simultanément
G06F 30/20 - Optimisation, vérification ou simulation de l’objet conçu
G01S 17/931 - Systèmes lidar, spécialement adaptés pour des applications spécifiques pour prévenir les collisions de véhicules terrestres
77.
System for emulating an environment for testing a frequency modulated continuous wave (FMCW) detection and ranging (LiDAR) system
A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave LiDAR UUT, and/or a flash LiDAR UUT.
G01S 7/493 - Extraction des signaux d'écho désirés
G06F 30/20 - Optimisation, vérification ou simulation de l’objet conçu
G01S 17/10 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes à modulation d'impulsion interrompues
G01S 17/34 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes continues, soit modulées en amplitude, en fréquence ou en phase, soit non modulées utilisant la transmission d'ondes continues modulées en fréquence, tout en faisant un hétérodynage du signal reçu, ou d’un signal dérivé, avec un signal généré localement, associé au signal transmis simultanément
A method to dynamically analyze measurement data comprising measurement data sets as the measurement data is received and moved to a data warehouse. The program instructions may receive the measurement data and may extract first metadata from the measurement data. The program instructions may then extract and analyze measurement data points in the measurement data to determine if the measurement data points meet a first criteria and generate second metadata in response to determining that the measurement data points meet the first criteria. The program instructions may then provide the measurement data points, the first metadata and the second metadata to a data warehouse for storage. The analysis of the measurement data and creation of new metadata may be performed dynamically as the data is acquired and stored in the data warehouse.
Systems and methods for communication between heterogenous processors via a virtual network interface implemented via programmable hardware and one or more buses. The programmable hardware may be configured with a multi-function bus such that the programmable hardware appears as both a network device and a programmable device to a host system. Additionally, the programmable hardware may be configured with a second bus to appear as a network device to an embedded system. Each system may implement network drivers to allow access to direct memory access engines configured on the programmable hardware. The configured programmable hardware and the network drivers may enable a virtual network connection between the systems to allow for information transfer via one or more network communication protocols.
G06F 13/28 - Gestion de demandes d'interconnexion ou de transfert pour l'accès au bus d'entrée/sortie utilisant le transfert par rafale, p. ex. acces direct à la mémoire, vol de cycle
41 - Éducation, divertissements, activités sportives et culturelles
Produits et services
Arranging and conducting trade shows in the field of science and technology Educational services, namely, conducting seminars and conferences in the field of science and technology
Bus enumeration of a switch fabric bus may be performed without assigning bus numbers to unused switch ports and/or corresponding slots to which the unused switch ports are routed. Accordingly, switches coupled to a switch fabric bus in a chassis may link-train with corresponding slots in the chassis in an attempt to establish active connections with devices coupled to the slots. Unused switch fabric bus lanes running from the switches to unused slots may be identified, and the unused switch ports corresponding to the unused switch fabric bus lanes may be disabled. During a subsequent bus enumeration procedure for the switch fabric bus, bus numbers may be allocated to the identified used switch ports (or corresponding used slots) but not to the identified unused switch ports (or corresponding unused slots). The link training, used/unused switch port identification, and bus enumeration may all be performed each time the chassis is reset.
A virtualizable automated test equipment architecture includes a circuit assembly. The circuit assembly includes a number of signal paths that extend between a front plane and a backplane. The signal paths can be continuous and isolated from other signal paths of the plurality of signal paths. The circuit assembly also includes an impedance disposed along a signal path of the plurality of signal paths. A plurality of software-configurable physical disconnects may be arranged within the circuit assembly to form a switching matrix. The plurality of signal paths can be associated with a plurality of software-configurable physical disconnects, which can be configured to open and close signal paths of the plurality of signal paths based on the predetermined test requirements. The circuit assembly also includes a plurality of external device connections, at least one of which may be configured to interface with a unit under test (UUT). The software configurable physical disconnects may be configurable at runtime. Because the system if virtualizable, multiplied UUTs may be tested simultaneously according to different requirements, and the testing may be executed on shared hardware in a manner transparent to the UUTs.
A method for determining coarse carrier phase and frequency offsets of an initial block of received M-QAM symbols includes creating a grid of discrete candidate phase offset values and for each candidate value: applying the candidate value to each symbol, applying a respective hard decision to each applied symbol, and computing a figure of merit based thereon. The candidate value having the best figure of merit is selected as an initial phase offset estimate. An initial frequency offset estimate is computed using the symbols updated with the initial phase offset estimate, their respective hard decisions, and an approximation of the complex exponential function. To track carrier phase and frequency offsets associated with a series of symbol blocks, for each symbol of a current block, set a binary trust weight based on comparison of a computed parameter with a threshold and use the binary trust weights to compute a phase offset error and a frequency offset error for the current block.
A low-reflectivity solid-state switch circuit includes an input port configured to transmit an electronic signal and first and second output ports configured to receive the electronic signal. The switch circuit further includes a first switching element connected between the input port and the first output port, a second switching element connected between the input port and the second output port, a third switching element connected to a first conductive path between the first switching element and the first output port, and a fourth switching element connected to a second conductive path between the second switching element and the second output port. The third and fourth switching elements are utilizable to shunt current reflections from their connected conducted paths when the respective conductive path is configured in an off configuration.
A user equipment device (UE) reduces receive beam selection time. An antenna array forms receive beams to receive synchronization signal blocks (SSBs) transmitted by a base station (BS). Each SSB comprises OFDM symbols. Each SSB includes a BS-assigned index. The receive beams are switched in time such that, for each SSB, two or more of the receive beams are used to receive corresponding two or more mutually exclusive sets each having at least one but less than all of the OFDM symbols of the SSB. A processor is programmed to, for each receive beam/SSB index pair, measure a signal quality based on the at least one but less than all of the OFDM symbols of the indexed SSB received by the receive beam of the pair. The processor uses the measured signal qualities to select one of the receive beams to use to receive subsequent communications from the BS.
H04B 7/08 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station de réception
41 - Éducation, divertissements, activités sportives et culturelles
42 - Services scientifiques, technologiques et industriels, recherche et conception
Produits et services
Educational services, namely, conducting informal programs in the fields of engineering and technology, using on-line activities and interactive exhibits, and printable materials distributed therewith; Entertainment services, namely, providing podcasts in the field of engineering and technology Technical services, namely, the design and development of computer hardware and software, updating computer software, providing computer assistance in the nature of consultation concerning design and development of computer software and hardware and maintenance of computer software via on-line communications, and related consulting services, all in the fields of scientific and engineering data acquisition, control and analysis
87.
Cellular system utilizing beam coherence interval metric
A UE determines a beam coherence interval metric that is a measure of stability of a beam pair over time based on a set of beam coherence intervals measured by the UE. The beam pair comprises a UE receive beam and a base station transmit beam. A beam coherence interval comprises a time duration within which a quality of a signal received on the UE receive beam remains within one of a plurality of signal quality bins. The UE reports the metric to the base station. The base station may update beam management resource and reporting configurations to the UE based on the metric. The UE may also use the metric to determine a hysteresis value useable by the UE to decide to switch from an active receive beam to a different receive beam having a higher signal quality by at least the hysteresis value.
H04W 16/28 - Structures des cellules utilisant l'orientation du faisceau
H04B 7/06 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station d'émission
Circuits and methods for electronically adjusting an effective inductance of one or more primary inductors in a circuit. The circuit may include a plurality of sub-circuits connected in parallel between an input and an output of the circuit. Each sub-circuit may include a primary inductor and an auxiliary inductor inductively coupled to the primary inductor. The circuit may further include first circuitry coupled to the primary inductor, wherein the first circuitry configured to introduce an oscillating first voltage across the primary inductor; and second circuitry coupled to the auxiliary inductor, wherein the second circuitry is configured to introduce an oscillating second voltage across the auxiliary inductor. The amplitudes of the second voltages may be selected to reduce a difference between effective inductances of the primary inductors.
Circuits and methods for operating a programmable load circuit that includes a plurality of sub-circuits connected in parallel between an input and an output. Each sub-circuit may include an inductor, a load, and a switch coupled to the inductor. Each switch may be configurable in a first state and a second state, wherein the inductor is either connected to the output through the load or connected to the output through a connection that bypasses the load. The switches of the plurality of first sub-circuits may be programmable to periodically switch between the first state and the second state according to a duty cycle, and the switches may be out of phase with each other by a predetermined amount. The duty cycle may be programmable to tune the load of the programmable load circuit.
H02M 3/158 - Transformation d'une puissance d'entrée en courant continu en une puissance de sortie en courant continu sans transformation intermédiaire en courant alternatif par convertisseurs statiques utilisant des tubes à décharge avec électrode de commande ou des dispositifs à semi-conducteurs avec électrode de commande utilisant des dispositifs du type triode ou transistor exigeant l'application continue d'un signal de commande utilisant uniquement des dispositifs à semi-conducteurs avec commande automatique de la tension ou du courant de sortie, p. ex. régulateurs à commutation comprenant plusieurs dispositifs à semi-conducteurs comme dispositifs de commande finale pour une charge unique
Bus enumeration of a switch fabric bus may be performed without assigning bus numbers to unused switch ports and/or corresponding slots to which the unused switch ports are routed. Accordingly, switches coupled to a switch fabric bus in a chassis may link-train with corresponding slots in the chassis in an attempt to establish active connections with devices coupled to the slots. Unused switch fabric bus lanes running from the switches to unused slots may be identified, and the unused switch ports corresponding to the unused switch fabric bus lanes may be disabled. During a subsequent bus enumeration procedure for the switch fabric bus, bus numbers may be allocated to the identified used switch ports (or corresponding used slots) but not to the identified unused switch ports (or corresponding unused slots). The link training, used/unused switch port identification, and bus enumeration may all be performed each time the chassis is reset.
Various types of electronic devices may be mounted in a chassis in order to facilitate interfacing with the devices, containing the devices, provide cooling systems which may remove heat from the electronic devices, etc. Delivering adequate cooling air flow to each electronic device in a chassis may be an important issue for the proper functioning, lifetime, or other characteristics of electronic devices contained in a chassis. Some electronic devices may be particularly challenging to cool due to various design characteristics. Other electronic devices may have other requirements that are not well served by existing chassis designs. For example, some electronic devices may benefit from additional electrical and/or thermal connections. Embodiments presented herein describe a novel design for a modular card cage accessory that may be configured to modify air flow and/or to meet particular requirements of an electronic device in a chassis, among various possibilities.
Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a cross-correlation measurement, and the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.
An apparatus to transmit and receive wireless communications is disclosed in which the transmit circuitry includes a square root raised cosine filter to pulse shape modulate signals and the receive circuitry includes a higher order Nyquist receive filter coupled to receive the input signals and remove the pulse shaping modulation. The cascaded combination of the transmit and receive filters has a frequency response equivalent to a higher order generalized raised cosine filter response.
09 - Appareils et instruments scientifiques et électriques
42 - Services scientifiques, technologiques et industriels, recherche et conception
Produits et services
Computer hardware, namely, interface units, and downloadable
or recorded computer software for use in the fields of
scientific and engineering data acquisition control and
analysis for data acquisition and processing of engineering,
scientific, and industrial automation data and for analyzing
industrial automation data, and for controlling and
emulating scientific and engineering instruments and
instrument systems, and for performing instrumentation
functions, and downloadable electronic instruction manuals
sold therewith. Technical services, namely, design and development of
computer hardware and software, updating computer software,
providing computer assistance in the nature of consultation
concerning design and development of computer software and
hardware and maintenance of computer software via on-line
communications, and related consulting services, all in the
fields of scientific and engineering data acquisition,
control and analysis.
A novel modular probe may include an interchangeable (connectable/disconnectable) probe-tip adaptor having a tip connector for coupling to a device under test, and further having a probe-tip terminal for coupling to a first assembly connector of a cable assembly, which further has a second assembly connector for coupling to a first build-out terminal of a build-out adaptor, which also has a second build-out terminal for coupling to an assembly connector of an interchangeable instrument connector cable assembly, which also has an instrument-end connector for coupling to a measurement instrument. The built-out adaptor may include a compensation adjustment circuit for compensating the probe for varying system capacitances. The probe may include one or more corrective circuits in the interchangeable probe-tip adaptor and/or in the build-out adaptor for at least partially terminating each end of the cable assembly with a characteristic impedance of the cable in the cable assembly to attenuate reflections.
09 - Appareils et instruments scientifiques et électriques
42 - Services scientifiques, technologiques et industriels, recherche et conception
Produits et services
Computer hardware, namely, interface units, and downloadable
or recorded computer software for use in the fields of
scientific and engineering data acquisition control and
analysis for data acquisition and processing of engineering,
scientific, and industrial automation data and for analyzing
industrial automation data, and for controlling and
emulating scientific and engineering instruments and
instrument systems, and for performing instrumentation
functions, and downloadable electronic instruction manuals
sold therewith. Technical services, namely, design and development of
computer hardware and software, updating computer software,
providing computer assistance in the nature of consultation
concerning design and development of computer software and
hardware and maintenance of computer software via on-line
communications, and related consulting services, all in the
fields of scientific and engineering data acquisition,
control and analysis.
09 - Appareils et instruments scientifiques et électriques
42 - Services scientifiques, technologiques et industriels, recherche et conception
Produits et services
Computer hardware, namely, interface units, and downloadable
or recorded computer software for use in the fields of
scientific and engineering data acquisition control and
analysis for data acquisition and processing of engineering,
scientific, and industrial automation data and for analyzing
industrial automation data, and for controlling and
emulating scientific and engineering instruments and
instrument systems, and for performing instrumentation
functions, and downloadable electronic instruction manuals
sold therewith. Technical services, namely, the design and development of
computer hardware and software, updating computer software,
providing computer assistance in the nature of consultation
concerning design and development of computer software and
hardware and maintenance of computer software via on-line
communications, and related consulting services, all in the
fields of scientific and engineering data acquisition,
control and analysis.
98.
Wireless communication system that performs measurement based selection of phase tracking reference signal (PTRS) ports
A UE transmits to a BS an indication of a number of PTRS ports. The number of PTRS ports is a suggestion to the BS for allocating the indicated number of PTRS ports to the UE for transmission of PTRS from the BS to the UE to enable the UE to perform phase tracking. The method also includes allocating, by the BS, PTRS ports to the UE based on the indication of the number of PTRS ports. The indication may be included in a UCI message, MAC CE, or RRC message transmitted by the UE to the BS. The BS may map the allocated PTRS ports to DMRS ports corresponding to spatial streams transmitted by the BS. The UE may estimate CPE of each spatial stream, measure correlations of the estimated CPE among the spatial streams, and use the correlations to determine the suggested number of PTRS.
H04L 5/00 - Dispositions destinées à permettre l'usage multiple de la voie de transmission
H04L 27/26 - Systèmes utilisant des codes à fréquences multiples
H04B 7/06 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station d'émission
09 - Appareils et instruments scientifiques et électriques
42 - Services scientifiques, technologiques et industriels, recherche et conception
Produits et services
(1) Computer hardware, namely, interface units, and downloadable or recorded computer software for use in the fields of scientific and engineering data acquisition control and analysis for data acquisition and processing of engineering, scientific, and industrial automation data and for analyzing industrial automation data, and for controlling and emulating scientific and engineering instruments and instrument systems, and for performing instrumentation functions, and downloadable electronic instruction manuals sold therewith.
(2) Computer hardware, namely, interface units, and downloadable or recorded computer software for use in the fields of scientific and engineering data acquisition control and analysis for data acquisition and processing of engineering, scientific, and industrial automation data and for analyzing industrial automation data, and for controlling and emulating scientific and engineering instruments and instrument systems, and for performing instrumentation functions, and instruction manuals sold therewith (1) Technical services, namely, design and development of computer hardware and software, updating computer software, providing computer assistance in the nature of consultation concerning design and development of computer software and hardware and maintenance of computer software via on-line communications, and related consulting services, all in the fields of scientific and engineering data acquisition, control and analysis
09 - Appareils et instruments scientifiques et électriques
42 - Services scientifiques, technologiques et industriels, recherche et conception
Produits et services
(1) Computer hardware, namely, interface units, and downloadable or recorded computer software for use in the fields of scientific and engineering data acquisition control and analysis for data acquisition and processing of engineering, scientific, and industrial automation data and for analyzing industrial automation data, and for controlling and emulating scientific and engineering instruments and instrument systems, and for performing instrumentation functions, and downloadable electronic instruction manuals sold therewith.
(2) Computer hardware, namely, interface units, and downloadable or recorded computer software for use in the fields of scientific and engineering data acquisition control and analysis for data acquisition and processing of engineering, scientific, and industrial automation data and for analyzing industrial automation data, and for controlling and emulating scientific and engineering instruments and instrument systems, and for performing instrumentation functions, and instruction manuals sold therewith (1) Technical services, namely, design and development of computer hardware and software, updating computer software, providing computer assistance in the nature of consultation concerning design and development of computer software and hardware and maintenance of computer software via on-line communications, and related consulting services, all in the fields of scientific and engineering data acquisition, control and analysis.
(2) Technical services, namely, the design and development of computer hardware and software, updating computer software, providing computer assistance in the nature of consultation concerning design and development of computer software and hardware and maintenance of computer software via on-line communications, and related consulting services, all in the fields of scientific and engineering data acquisition, control and analysis
