Abrégé

There is provided a method of analysis of detected X-ray spectra in an instrument, comprising applying a first iteration of a first background algorithm to the detected X-ray spectrum to determine a first partial background spectrum, subtracting the first partial background spectrum from the detected X-ray spectrum to form a first net spectrum, applying a second iteration of a second background algorithm to the first net spectrum to determine a second partial background spectrum wherein the second background algorithm is different from the first background algorithm, forming an estimated background spectrum comprising linear combination of the first partial background spectrum and the second partial background spectrum and using the estimated background spectrum as an input into a deconvolution model.

Classes IPC  ?

• G01N 23/22 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux

Abrégé

The invention provides a sample handling apparatus for transporting a sample holder. The sample handling apparatus comprises a frame, a sample holder having an engagement member, a transport head mounted to the frame, and an actuator arrangement configured to move the transport head on the frame. The transport head comprises a holding arrangement. The holding arrangement includes a first engagement arm for engaging the sample holder. The engagement arm is shaped to co-operate with the engagement member of the sample holder to hold the sample holder.

Classes IPC  ?

• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux

Abrégé

The present invention relates to an X-ray analysis apparatus comprising a first roller having a length, a second roller, the first roller and the second roller forming a sample plane along which a sample passes, an X-ray source for irradiating the sample with X-rays and configured, in operation, to project X-rays to a work area between the first and second rollers, a detector configured to detect X-rays, and an enclosure extending at least the length of the first roller and comprising a first and a second part. The first part is arranged on a first side of the sample plane opposite to the X-ray source and has a first opening adjacent the sample plane and a base distal the sample plane. The second part is arranged on a second side of the sample plane, the same side as the X-ray source, and has a second opening. The first opening and the second opening are complementary. At least one of the second part and at least the base of the first part is moveable between a first position, wherein the enclosure encloses the X-ray source and the detector, and a second position.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Abrégé

The present invention relates to a thin film X-ray analysis apparatus for analysing a sample. The apparatus comprises a first roller and a second roller which form a film plane along which a film passes. The apparatus further comprises an X-ray source for irradiating a sample and a detector configured to detect X-rays. The X-ray source is configured, in operation, to project X-rays to a work area between the first and second rollers. The apparatus further comprises an enclosure comprising a first part having a first opening and a second part having a second opening, the first part being arranged on a first side of the film plane opposite to the X-ray source, the second part being on the second side of the film plane, the same side as the X-ray source and moveable between a first position and a second position, wherein, in the first position the enclosure encloses at least the first roller, the second roller, the X-ray source and the detector.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Abrégé

The present invention relates to an X-ray analysis apparatus for analysing a sample. The X- ray analysis apparatus includes a first roller and a second roller. The first roller and the second roller form an inspection plane along which a sample passes. The apparatus comprises an X-ray source for irradiating a sample with X-rays and a detector configured to detect X-rays. The X-ray source is configured, in operation, to project X-rays to a work area between the first and second rollers and being positioned, in operation on a first side of the inspection plane. The apparatus further comprises a first side wall and a second side wall. The first side wall is positioned on a second, opposite, side of the inspection plane, to the X-ray source and is arranged between the work area and the first roller. The second side wall is also positioned on a second, opposite, side of the inspection plane to the X-ray source and is arranged between the work area and the second roller.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Produits et services

Scientific, measuring and detecting apparatus and instruments; scientific, measuring and detecting apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; X-ray fluorescence analysers and spectrometers; X-ray fluorescence (XRF) analysers and spectrometers; X-ray detecting apparatus and instruments; X-ray detectors; X-ray detectors not for medical purposes; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; spectrometers; spectrophotometers; spectrometry apparatus; X-ray spectroscopy apparatus [other than for medical use]; elemental analysers; X-ray analysers; X-ray neutron activation analysers; X-ray pulsed fast and thermal neutron activation analysers; ICP (inductively coupled plasma) spectroscopy apparatus and instruments; X-ray analytical apparatus; X-ray apparatus not for medical use; diffraction apparatus [microscopy]; diffraction apparatus for microscopy; diffraction apparatus and instruments; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray fluorescence diffractometers; X-ray diffractometers and wafer analysers; wafer analysers; X-ray imaging detectors; X-ray diffraction instruments, including X-ray diffraction meters for the compound semiconductor industry; X-ray fluorescence wafer and disc analysers, and automated ellipsometers; X-ray fluorescence wafer and disc analysers and automated ellipsometers for the silicon semiconductor industry, for analysing film thickness, composition and density; X-ray measuring, detecting and monitoring instruments, indicators and controllers; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, including X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes; materials characterization apparatus, including scientific and measuring apparatus and instruments, including spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; materials characterization apparatus in the nature of scientific and measuring apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; photon counting X-ray detectors; X-ray tubes, not for medical purposes; analytical, process control and measuring apparatus, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for the cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; metrology tools, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; computer software; computer software for analysis purposes; computer software for use in relation to spectrometry; downloadable or recorded computer software for use in relation to spectrometry; computer software for analysis purposes; downloadable or recorded computer software for analysis purposes; computer software for use in relation to diffractometry; downloadable or recorded computer software for use in relation to diffractometry; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; computer software for use in relation to X-ray fluorescence analysis; downloadable or recorded computer software for use in relation to X-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; downloadable or recorded computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to X-ray apparatus not for medical use; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with x-ray apparatus not for medical use; computer software for use in relation to the determination of the thickness of layer samples; downloadable or recorded computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; downloadable or recorded computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; downloadable or recorded computer software for use in relation to the standardless analysis of samples; parts and fittings for all the aforesaid goods; component parts and fittings for all the aforesaid goods. Installation, maintenance and repair of scientific and measuring apparatus and instruments; installation, maintenance and repair of X-ray fluorescence (XRF) analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; installation of scientific and measuring apparatus and instruments; installation of X-ray fluorescence (XRF) analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and research and design relating thereto; scientific services and design relating thereto; design and development of scientific and measuring apparatus and instruments; industrial analysis and industrial research services; scientific analysis; analysis of materials; laboratory services for analytical testing; elemental analysis; technological services in the field of spectrometry and diffractometry; technological services relating to ICP (inductively coupled plasma) spectroscopy; industrial analysis and research services in the field of spectrometry, diffractometry and ICP (inductively coupled plasma) spectroscopy; design and development of X-ray apparatus, X-ray fluorescence (XRF) analysers and spectrometers, X-ray analytical apparatus, analytical apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analysers, wafer analysers, X-ray tubes, elemental spectrometry apparatus and instruments, ICP (inductively coupled plasma) spectroscopy apparatus and instruments; design and development of computer hardware and software; design, development and programming of computer software; design, development and programming of computer software in the field of spectrometry, diffractometry and ICP (inductively coupled plasma) spectroscopy; leasing and rental of scientific and measuring apparatus and instruments; leasing and rental of scientific and measuring apparatus, namely X-ray fluorescence (XRF) analysers and spectrometers, elemental spectrometry apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; technological consultancy services and telecommunications technology consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, X-ray tubes, and ICP (inductively coupled plasma) spectroscopy apparatus and instruments; technological consultancy services and telecommunications technology consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray fluorescence (XRF) analysers and spectrometers, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, X-ray tubes, elemental spectrometry apparatus and instruments, and ICP (inductively coupled plasma) spectroscopy apparatus and instruments.

Abrégé

The present invention relates to an X-ray analysis apparatus and a method of X-ray analysis. The X-ray analysis apparatus enables a user to carry out a plurality of X-ray analysis applications, for analysing a sample by measuring X-ray diffraction and/or X-ray fluorescence, using the same X-ray source. The apparatus comprises an X-ray source for irradiating the sample with X-rays, the X-ray source comprising a solid anode and a cathode for emitting an electron beam. It also comprises a focusing arrangement for focusing the electron beam onto the anode, and a controller. The controller is configured to receive X-ray analysis application information and to control the X-ray analysis apparatus to selectively operate in either a first X-ray analysis mode or a second X-ray analysis mode based on the X-ray analysis application information. In the first X-ray analysis mode the X-ray source operates at a first operating power and has an effective focal spot size that is less than 100 μm. In the second X-ray analysis mode the X-ray source operates at a second operating power that is higher than the first operating power, and the area of the effective focal spot is larger than the area of the effective focal spot in the first X-ray analysis mode.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet
• A61B 6/00 - Appareils ou dispositifs pour le diagnostic par radiationsAppareils ou dispositifs pour le diagnostic par radiations combinés avec un équipement de thérapie par radiations
• A61B 6/40 - Agencements pour générer des radiations spécialement adaptés au diagnostic par radiations
• A61B 6/42 - Agencements pour détecter des radiations spécialement adaptés au diagnostic par radiations
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• H05G 1/52 - Commande de la dimension de la cible ou de sa formeCommande de la direction du faisceau d'électrons, p. ex. dans des tubes avec une anode et plus d'une cathode

Abrégé

The present invention relates to an X-ray analysis apparatus and an X-ray analysis method for analysing a sample. The X-ray analysis method involves using a first slit between the sample and a position sensitive X-ray detector to analyse the sample, including calculating a detection angle based on a distance L1 between the first slit and the X-ray detector, and the position of the first detection element in the array of detection elements. The X-ray analysis apparatus comprises a processor that is configured to analyse data from an X-ray detector comprising an array of detection elements. The processor is configured to receive data comprising an X-ray intensity detected at the first detection element of the array of detection elements and calculate the detection angle based on the distance L1 between the first slit and the X-ray detector, and the position of the first detection element in the array of detection elements.

Classes IPC  ?

• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• G01N 23/20025 - Porte-échantillons ou leurs supports

Abrégé

The present invention relates to a method and an X-ray diffraction apparatus for angular dispersive X-ray diffraction analysis of an analyte (sample) confined in a packaging (a "packaged sample"). The method comprises arranging a first primary X-ray optic between an X-ray source and the packaged sample to focus X-rays from the X-ray source into a focused X-ray beam of convergent or parallel X-rays and to direct the focused X-ray beam towards the packaged sample and arranging a first secondary X-ray optic between the packaged sample and an X-ray detector. The packaged sample is irradiated, by the X-ray source, with the focused X-ray beam of converging or parallel beam of X-rays, the X-rays having an energy greater than about 9 keV, while the analyte is confined in the packaging. The first secondary X-ray optic is configured such that a first portion of diffracted X-rays pass therethrough to be detected by the X-ray detector and a second portion of diffracted X-rays are prevented from being detected by the X-ray detector, wherein the first portion of diffracted X-rays come from a region within the packaging.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Abrégé

The present invention relates to an X-ray analysis apparatus and an X-ray method for analysing a sample. The X-ray analysis apparatus includes an X-ray source comprising an anode and a cathode, and configured to irradiate an irradiated area on a target surface of the anode. The X-ray analysis apparatus further includes a steering arrangement, a processor and a controller. The steering arrangement is configured to position the irradiated area on the target surface of the anode. The processor is configured to receive X-ray analysis information, and to determine a change in position of the irradiated area on the target surface based on the X-ray analysis information. The controller is configured to control the steering arrangement to move the irradiated area on the target surface according to the change in position determined by the processor.

Classes IPC  ?

• H05G 1/52 - Commande de la dimension de la cible ou de sa formeCommande de la direction du faisceau d'électrons, p. ex. dans des tubes avec une anode et plus d'une cathode
• G01N 23/20016 - Goniomètres
• H01J 35/14 - Dispositifs de concentration, de focalisation ou d'orientation du rayon cathodique
• H01J 35/30 - Tubes, dans lesquels le point d'impact du rayon cathodique sur l'anode ou l'anticathode est déplaçable par rapport à la surface de celles-ci par déviation du rayon cathodique

Produits et services

Scientific apparatus and instruments, namely, X-ray fluorescence (XRF) spectrometers for measuring the elemental composition of materials; scientific instruments, namely, X-ray fluorescence (XRF) spectrometers for detecting the elemental composition of materials; Scientific apparatus and instruments, namely, spectrometers for laboratory use, X-ray fluorescence analysers, x-ray spectrometers for laboratory use; Scientific apparatus and instruments, namely, diffractometers for measuring and detecting the diffraction of waves including X-rays; Scientific apparatus and instruments, namely. X-ray diffractometers for measuring and detecting crystal structure, crystallinity, microstructural properties and crystalline phase identification; Scientific apparatus and instruments, namely, neutron activation analysers for analysing the elemental composition of a material including trace elements; Scientific apparatus and instruments, namely, pulsed fast and thermal neutron activation analysers for analysing the elemental composition of a material by identifying and quantifying a large number of elements simultaneously; X-ray fluorescence analysers; X-ray spectrometers for laboratory use; X-ray detecting apparatus and instruments, namely, X-ray fluorescence (XRF) analyzers not for medical purposes; X-ray detectors, namely, X-ray fluorescence analyzers not for medical purposes; X-ray detectors, namely, X-ray fluorescence analyzers; X-ray measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray fluorescence (XRF) analyzers not for medical purposes; spectrometers for laboratory use; Electronic spectrophotometers for use in identifying and measuring colours; apparatus for mass spectrometry; X-ray photo electron spectroscopy analysers, not for medical use; elemental analysers, namely, neutron activation analysers, pulsed fast and thermal neutron activation analysers, and X-ray diffractometers; X-ray neutron activation analysers for analysing the elemental composition of a material including trace elements; X-ray pulsed fast and thermal neutron activation analysers for analysing the elemental composition of a material by identifying and quantifying a large number of elements simultaneously; Inductively coupled plasma spectroscopy apparatus and instruments, namely, instruments for the elemental analysis of samples by Optical Emission Spectrometry and Mass Spectrometry; X-ray analytical apparatus, namely, X-ray fluorescence analyzers; industrial X-ray apparatusnot for medical use; Microscopy diffraction apparatus, namely, X-ray Microdiffractometers; diffraction apparatus for microscopy, namely, X-ray Microdiffractometers; diffraction apparatus and instruments, namely, X-ray diffractometers; Spectrometers for laboratory use, namely, diffractometers; X-ray diffraction apparatus, namely, X-ray diffractometers, X-ray spectrometers for laboratory use, namely, x-ray diffractometers; X-ray fluorescence spectrometers, namely, x-ray fluorescence diffractometers; X-ray diffractometers; Semiconductor wafer analysers for analysing dimensional properties, surface characteristics, material and chemical composition, electrical properties, and defects of semiconductor wafers; X-ray imaging detectors, namely, instruments used to capture the X-ray photons that pass through an object and convert them into an image; X-ray diffraction instruments, namely X-ray diffraction meters for the compound semiconductor industry; X-ray fluorescence wafer and disc analysers for analysing dimensional properties, surface characteristics, material and chemical composition, electrical properties, and defects; automated spectroscopes, namely, ellipsometers; X-ray fluorescence wafer and disc analysers for analysing film thickness, composition and density for the silicon semiconductor industry; Automated spectroscopes, namely, ellipsometers for the silicon semiconductor industry; X-ray measuring, detecting and monitoring instruments, indicators and controllers, namely, X-ray Fluorescence (XRF) Spectrometers, X-ray Diffractometers (XRD), and X-ray Spectrometers; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, namely, X-ray fluorescence spectrometers, x-ray tubes, other than for medical purposes; photon counting X-ray detectors, namely, direct conversion detectors that measure the energy and position of every individual X-ray photon that hits it; X-ray tubes, not for medical purposes; analytical, process control and measuring apparatus, namely, spectrometers for laboratory use, X-ray fluorescence analysers; analytical, process control and measuring apparatus, including spectrometers for laboratory use, X-ray fluorescence analysers for cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industries; analytical, process control and measuring apparatus, including spectrometers for laboratory use, x-ray fluorescence analysers for research and development institutions; metrology tools, namely, spectrometers for laboratory use, X-ray fluorescence analysers; Downloadable computer software for controlling and operating measuring instruments and for processing and analyzing data in the field of materials characterization; Downloadable computer software for analysing the elemental composition of a material including trace elements, crystal structure, crystallinity, microstructural properties and crystalline phase identification; Downloadable computer software for the determination of chemical composition in the field of spectrometry; downloadable computer software for [specify the function of the software in relation to spectrometry] in the field of spectrometry; Recorded computer software for [specify the function of the software in relation to spectrometry] in the field of spectrometry; downloadable computer software for [specify the function of the software operating diffractometers and reviewing and analyzing diffractometry data in the field of diffractometry;; Recorded computer software for operating diffractometers and reviewing and analyzing diffractometry data in the field of diffractometry; Downloadable computer software for operating x-ray diffractometers and reviewing and analyzing data in the field of x-ray diffraction; Computer hardware relating to X-ray diffraction and X-ray diffraction apparatus; Downloadable computer software for operation of x-ray fluorescence analyzers and reviewing and analyzing x-ray fluorescence data in the field of x-ray fluorescence analysis; Recorded computer software for operation of x-ray fluorescence analyzers and reviewing and analyzing x-ray fluorescence data in the field of x-ray fluorescence analysis; Downloadable computer software for determining X-ray intensities; Recorded computer software for determining X-ray intensities; Downloadable computer software for operating and controlling x-ray apparatuses in the field of X-ray apparatuses; Downloadable computer software for performing X-ray diffraction analysis; Recorded computer software for performing x-ray diffraction analysis; Downloadable computer software for determining the thickness of semiconductor wafer layer samples; Recorded computer software for determining the thickness of semiconductor wafer layer samples; Downloadable computer software for determining chemical compositions; Recorded computer software for determining chemical compositions; Downloadable computer software for conducting standardless analysis of samples of solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement; Recorded computer software for conducting standardless analysis of samples of solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement installation, maintenance and repair of X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; installation of X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; information, advisory and consultancy services all relating to the aforesaid Scientific and technological services, namely, scientific research in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; scientific services, namely, research and design in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; design and development of scientific and measuring apparatus and instruments, namely, X-ray fluorescence analysers and spectrometers, spectrometry apparatus, X-ray detectors, X-ray analytical apparatus, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers, materials characterization apparatus, X-ray tubes, elemental spectrometry apparatus and instruments and inductively coupled plasma spectroscopy apparatus and instruments; Industrial research services in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; Scientific services, namely, scientific analysis in the field of materials science, analytical chemistry, geology, mineralogy, and materials engineering and physics; analysis of materials, namely, analysis of solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement; Scientific laboratory services for analytical testing of semiconductor wafers, solids, metals, alloys, polymers, ceramics, minerals, liquids, oils, fuels, powders, and cement; Technological consulting services in the field of spectrometry and diffractometry; technological consulting services in the field of inductively coupled plasma spectroscopy; industrial analysis and research services in the field of spectrometry, diffractometry and inductively coupled plasma spectroscopy; design and development of X-ray apparatus, X-ray fluorescence analysers and spectrometers, X-ray analytical apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analysers, wafer analysers, X-ray tubes, elemental spectrometry apparatus and instruments, inductively coupled plasma spectroscopy apparatus and instruments; design and development of computer hardware and software; design and development of computer software; Programming of computer software for others; design and development of computer software in the field of spectrometry, diffractometry and inductively coupled plasma spectroscopy; Programming of computer software for others in the field of spectrometry, diffractometry and inductively coupled plasmas spectroscopy; leasing and rental of scientific and measuring apparatus and instruments; leasing and rental of scientific and measuring apparatus, namely X-ray fluorescence analysers and spectrometers, elemental spectrometry apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, namely, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes

Abrégé

The invention provides a computer implemented method of X-ray analysis. The method comprises receiving X-ray analysis data from an X-ray detector comprising a plurality of detection channels. The X-ray analysis data comprises intensity angular scan data obtained by measuring X-ray intensity during a continuous scan of the X-ray detector. A sequence of intensity measurements is obtained for each detection channel. Each sequence of intensity measurements forms an intensity angular scan. An angular offset is determined for each detection channel. The method further comprises, for each of a plurality of detection angle bins, determining, for each detection channel, an intensity contribution factor for at least one of the intensity measurements. The intensity contribution factor is determined according to an angular range associated with the detection angle bin and the angular offset of the detection channel. For each of the plurality of detection angle bins, a binned intensity is determined based on the intensity of the at least one intensity measurement and its corresponding intensity contribution factor.

Classes IPC  ?

• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles

Abrégé

An X-ray diffraction apparatus and method of processing signals from an X-ray diffraction apparatus are disclosed. By analysing a time delay between first and second pulses, generated by respective first and second detector cells, and by analysing an energy of each of the first pulse and the second pulse, charge sharing events and coincident photon events can be identified.

Classes IPC  ?

• A61B 6/00 - Appareils ou dispositifs pour le diagnostic par radiationsAppareils ou dispositifs pour le diagnostic par radiations combinés avec un équipement de thérapie par radiations

Abrégé

An X-ray detector for an X-ray diffraction analysis apparatus comprises a sensor, a readout circuit, a processor and a display output for communicating a display signal to a display device. The sensor detects X-ray photons by converting an X-ray photon incident on the sensor into a sensor output signal. The readout circuit receives the sensor output signal from the sensor and determines an X-ray photon count, by counting the sensor output signal. The processor is configured to calculate an X-ray intensity value using the X-ray photon count, and to generate a display signal for displaying an image representing the X-ray intensity value. The display output is configured to communicate the display signal to a display device for displaying the X-ray intensity value.

Classes IPC  ?

• G01N 23/2055 - Analyse des diagrammes de diffraction
• G01N 23/20016 - Goniomètres

Abrégé

The present invention relates to an X-ray analysis apparatus and a method of X-ray analysis. The X-ray analysis apparatus enables a user to carry out a plurality of X-ray analysis applications, for analysing a sample by measuring X-ray diffraction and/or X-ray fluorescence, using the same X-ray source. The apparatus comprises an X-ray source for irradiating the sample with X-rays, the X-ray source comprising a solid anode and a cathode for emitting an electron beam. It also comprises a focusing arrangement for focusing the electron beam onto the anode, and a controller. The controller is configured to receive X-ray analysis application information and to control the X-ray analysis apparatus to selectively operate in either a first X-ray analysis mode or a second X-ray analysis mode based on the X-ray analysis application information. In the first X-ray analysis mode the X-ray source operates at a first operating power and has an effective focal spot size that is less than 100 μm. In the second X-ray analysis mode the X-ray source operates at a second operating power that is higher than the first operating power, and the area of the effective focal spot is larger than the area of the effective focal spot in the first X-ray analysis mode.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• H05G 1/52 - Commande de la dimension de la cible ou de sa formeCommande de la direction du faisceau d'électrons, p. ex. dans des tubes avec une anode et plus d'une cathode
• A61B 6/00 - Appareils ou dispositifs pour le diagnostic par radiationsAppareils ou dispositifs pour le diagnostic par radiations combinés avec un équipement de thérapie par radiations
• A61B 6/40 - Agencements pour générer des radiations spécialement adaptés au diagnostic par radiations
• A61B 6/42 - Agencements pour détecter des radiations spécialement adaptés au diagnostic par radiations

Abrégé

The present invention relates to sample holder for holding a sample. The sample holder comprises a body having an incident surface and an opening in the body for receiving a sample. When the sample is irradiated with X-rays the incident surface of the sample holder may also be irradiated, especially at low incident angles. To reduce background scattering from the incident surface, the incident surface comprises a protrusion for blocking X-rays.

Classes IPC  ?

• G01N 23/20025 - Porte-échantillons ou leurs supports
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles

Abrégé

This application relates to apparatus and method for x-ray fluorescence analysis. There is provided an X-ray fluorescence analysis apparatus for analysing a sample, The X-ray fluorescence analysis apparatus comprises an X-ray source, a measurement chamber for holding the sample in air, and an X-ray detector. The X-ray source is arranged to irradiate the sample with a primary X-ray beam, to cause the sample to fluoresce. The X-ray detector is arranged to detect characteristic X-rays emitted by the sample and to determine a measured X-ray intensity associated with the characteristic X-rays. An X-ray filter, which transmits the primary X-ray beam, is arranged between the X-ray source and the sample. The X-ray source comprises an anode of material having an atomic number that is less than 25. The X-ray fluorescence analysis apparatus further comprises a sensor arrangement configured to sense air pressure and air temperature. A processor receives the measured X-ray intensity. The processor also receives air pressure data and air temperature data from the sensor arrangement. The processor is configured to carry out a compensation calculation for adjusting the measured X-ray intensity using the air pressure data and the air temperature data.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 33/28 - Huiles

Abrégé

The sample mounting system comprises a sample holder and a sample stage having a platform for supporting the sample holder. The sample can be fixed to the sample holder by a mount. The sample holder comprises a holder reference portion, which co-operates with a corresponding reference portion of the sample stage (the stage reference portion) to align the sample holder with the sample stage. When the sample holder is positioned on the platform such that the stage reference portion and the holder reference portion engage each other, the sample holder is aligned with the sample stage.

Classes IPC  ?

• G01N 23/20025 - Porte-échantillons ou leurs supports
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• G01N 23/2204 - Supports d’échantillons à cet effetMoyens de transport des échantillons à cet effet

Abrégé

A beam shaping apparatus (10) for use in an X-ray analysis device (40). The beam shaping apparatus processes an input beam (32) from an X-ray beam source (20), and generates an output beam (34) with an output beam shape for irradiating a sample (112) held by a sample holder (22) of the X-ray analysis device. Movement of the output beam shape is controlled in dependence upon a varying tilt angle (χ) of the sample (112), this defined by a tilt position of the sample holder (22).

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles

Abrégé

The present invention relates to sample holder for holding a sample. The sample holder comprises a body having an incident surface and an opening in the body for receiving a sample. When the sample is irradiated with X-rays the incident surface of the sample holder may also be irradiated, especially at low incident angles. To reduce background scattering from the incident surface, the incident surface comprises a protrusion for blocking X-rays.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Abrégé

An X-ray diffraction apparatus and method of processing signals from an X-ray diffraction apparatus are disclosed. By analysing a time delay between first and second pulses, generated by respective first and second detector cells, and by analysing an energy of each of the first pulse and the second pulse, charge sharing events and coincident photon events can be identified.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Abrégé

An X-ray detector for an X-ray diffraction analysis apparatus comprises a sensor, a readout circuit, a processor and a display output for communicating a display signal to a display device. The sensor detects X-ray photons by converting an X-ray photon incident on the sensor into a sensor output signal. The readout circuit receives the sensor output signal from the sensor and determines an X-ray photon count, by counting the sensor output signal. The processor is configured to calculate an X-ray intensity value using the X-ray photon count, and to generate a display signal for displaying an image representing the X-ray intensity value. The display output is configured to communicate the display signal to a display device for displaying the X-ray intensity value.

Classes IPC  ?

• G01N 23/2055 - Analyse des diagrammes de diffraction

Produits et services

Scientific instruments for material phase identification, residual stress measurement and thin film metrology, namely, X-ray apparatus not for medical use

Produits et services

Scientific, measuring and detecting apparatus and instruments, including diffractometers, X-ray diffractometers and wafer analysers; X-ray detecting apparatus and instruments; X-ray measuring, detecting and monitoring instruments, indicators and controllers; X-ray detectors; analytical apparatus for analysing samples in scientific, industrial and laboratory applications, including X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and wafer analysers; materials characterization apparatus, including scientific and measuring apparatus and instruments, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus; analytical, process control and measuring apparatus, including diffractometers, X-ray diffractometers and X-ray diffraction meters; metrology tools, including diffractometers, X-ray diffractometers and X-ray diffraction meters; diffraction apparatus [microscopy]; diffraction apparatus and instruments; X-ray diffraction instruments; computer software for use in relation to diffractometry; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to X-ray apparatus; parts and fittings for all the aforesaid goods.

Produits et services

Scientific, measuring and detecting apparatus and instruments, namely, diffractometers, X-ray diffractometers and wafer analysers; X-ray detecting apparatus and instruments not for medical purposes; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; X-ray detectors not for medical use; analytical apparatus for analysing samples in scientific, industrial and laboratory applications, namely, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and wafer analysers; materials characterization apparatus, in the nature of scientific and measuring apparatus and instruments, namely, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus not for medical use; analytical, process control and measuring apparatus, namely diffractometers, X-ray diffractometers and X-ray diffraction meters; metrology tools, namely diffractometers, X-ray diffractometers and X-ray diffraction meters; diffraction apparatus for microscopy; diffraction apparatus and instruments; X-ray diffraction instruments; downloadable or recorded computer software for use in relation to diffractometry; downloadable or recorded computer software for determining X-ray intensities, not for medical purposes; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with X-ray apparatus, not for medical purposes; component parts and fittings for all the aforesaid goods

Abrégé

A beam shaping apparatus (10) for use in an X-ray analysis device (40). The beam shaping apparatus processes an input beam (32) from an X-ray beam source (20), and generates an output beam (34) with an output beam shape for irradiating a sample (112) held by a sample holder (22) of the X-ray analysis device. Movement of the output beam shape is controlled in dependence upon a varying tilt angle (χ) of the sample (112), this defined by a tilt position of the sample holder (22).

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet
• G21K 1/02 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer utilisant des diaphragmes, des collimateurs

Abrégé

An X-ray tube according to the present invention comprises an anode and a cathode comprising an emission portion for emitting an electron beam. The emission portion is configured to irradiate a target surface of the anode with electrons to cause the anode to emit X-rays. A window is arranged at an end of the X-ray tube, to allow X-rays to exit the X-ray tube. The target surface of the anode is inclined at an oblique angle with respect to a longitudinal axis, wherein the longitudinal axis passes through the end of the X-ray tube.

Classes IPC  ?

• H01J 35/08 - AnodesAnticathodes
• H01J 35/14 - Dispositifs de concentration, de focalisation ou d'orientation du rayon cathodique
• H01J 35/18 - Fenêtres
• G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

The present invention relates to an X-ray tube for X-ray analysis. The X-ray tube comprises an anode having a target surface and a cathode. The cathode comprises an emission loop. The emission loop extends around an axis that passes through the anode, and the cathode and the anode are spaced apart from one another along the axis. Electrons emitted from the cathode irradiate the target surface of the anode to produce X-rays. The X-ray tube further comprises an electron beam guide. The electron beam guide is configured to guide electrons emitted by the cathode, so as to irradiate an area of the anode. The irradiated area is enclosed by a single boundary.

Classes IPC  ?

• H01J 35/08 - AnodesAnticathodes
• H01J 35/06 - Cathodes
• A61B 6/00 - Appareils ou dispositifs pour le diagnostic par radiationsAppareils ou dispositifs pour le diagnostic par radiations combinés avec un équipement de thérapie par radiations

Produits et services

Scientific, measuring and detecting apparatus and instruments, including spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; X-ray detecting apparatus and instruments; X-ray measuring, detecting and monitoring instruments, indicators and controllers; X-ray detectors; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, including X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes; materials characterization apparatus, including scientific and measuring apparatus and instruments, including spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus not for medical use; analytical, process control and measuring apparatus, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for the cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, including reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; X-ray fluorescence wafer and disc analysers [and automated ellipsometers]; X-ray fluorescence wafer and disc analysers [and automated ellipsometers] for the silicon semiconductor industry, for analysing film thickness, composition and density; diffraction apparatus [microscopy]; diffraction apparatus and instruments; X-ray diffraction instruments, including X-ray diffraction meters for the compound semiconductor industry; X-ray tubes, not for medical purposes; computer software; computer software for use in relation to spectrometry; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to X-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to X-ray apparatus not for medical use; parts and fittings for all the aforesaid goods.

Abrégé

The X-ray analysis apparatus of the present invention comprises a sample stage for supporting a sample, a goniometer having an axis of rotation, and an X-ray detector arranged to be rotatable about the axis of rotation of the goniometer, wherein the X-ray detector is arranged to receive X-rays from the sample directed along an X-ray beam path. The X-ray analysis apparatus further comprises a first collimator, a second collimator and a third collimator each having a first configuration and a second configuration. In its first configuration, the collimator is arranged in the X-ray beam path. In its second configuration the collimator is arranged outside of the X-ray beam path. A first actuator arrangement is configured to move the first collimator and the second collimator between the first configuration and the second configuration by moving the first collimator and the second collimator in a lateral direction that intersects the X-ray beam path. A second actuator arrangement is configured to move the third collimator between its first configuration and its second configuration. A controller is configured to control the first actuator arrangement to move the first collimator between the first configuration and the second configuration.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• G01N 23/20016 - Goniomètres
• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]

Abrégé

An X-ray analysis apparatus comprises an X-ray source configured to irradiate a sample with an incident X-ray beam. A first beam mask component is arranged between the X-ray source and the sample. The first beam mask component has a first opening for limiting the size of the incident X-ray beam. When the first beam mask component is in a first configuration, the first opening is arranged in the incident X-ray beam. The first beam mask component further comprises a second opening. When the first beam mask component is in a second configuration, the second opening is arranged in the incident X-ray beam. The second opening does not limit the size of the incident X-ray beam. A controller is configured to control a first beam mask component actuator to change the configuration of the first beam mask component between the first configuration and the second configuration by moving the first beam mask component in a plane intersected by the incident X-ray beam.

Classes IPC  ?

• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet
• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• G01N 23/2055 - Analyse des diagrammes de diffraction
• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux

Abrégé

a). A controller (17) is configured to control a width of the adjustable slit, between a first width, a larger second width, and an even larger third width. At the first and second widths: the adjustable slit (210) limits the divergence of the incident beam and thereby limits an area of the sample that is irradiated; and the further slit (220) does not limit the divergence of the incident beam. At the third width: the adjustable slit (210) does not limit the divergence of the incident beam, and the further slit (220) limits the divergence of the incident beam and thereby limits the area of the sample that is irradiated. Alternatively, at the third width, the adjustable slit (210) continues to limit the area irradiated.

Classes IPC  ?

• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux
• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet
• G01N 23/20016 - Goniomètres
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Produits et services

Scientific, measuring and detecting apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; X-ray detecting apparatus and instruments; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; X-ray detectors not for medical purposes; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, namely, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes; materials characterization apparatus in the nature of scientific and measuring apparatus and instruments, namely, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus not for medical use; analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for the cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, namely, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; X-ray fluorescence wafer and disc analysers, and automated ellipsometers; X-ray fluorescence wafer and disc analysers and automated ellipsometers for the silicon semiconductor industry, for analysing film thickness, composition and density; diffraction apparatus for microscopy; diffraction apparatus and instruments; X-ray diffraction instruments, including X-ray diffraction meters for the compound semiconductor industry; X-ray tubes, not for medical purposes; downloadable or recorded computer software for use in relation to spectrometry; downloadable or recorded computer software for analysis purposes; downloadable or recorded computer software for use in relation to diffractometry; downloadable or recorded computer software for use in relation to X-ray fluorescence analysis; downloadable or recorded computer software for use in relation to the determination of X-ray intensities; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with x-ray apparatus not for medical use; component parts and fittings for all the aforesaid goods

Abrégé

X ray apparatus includes a sample stage (4) for supporting a sample (6), an X-ray source (2) and an energy dispersive X-ray detector (8). A conical X-ray collimator (10) is provided either between the sample and the X-ray source or between the sample and the energy-dispersive X-ray detector, the conical X-ray collimator including a plurality of truncated cones arranged concentrically around a central axis, the truncated cones having a common apex defining a central measurement spot on the sample.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• B22F 3/105 - Frittage seul en utilisant un courant électrique, un rayonnement laser ou un plasma
• G21K 1/02 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer utilisant des diaphragmes, des collimateurs
• B33Y 10/00 - Procédés de fabrication additive
• B33Y 80/00 - Produits obtenus par fabrication additive

Abrégé

A method of analysis of X-ray spectra in an instrument fits a measured sample spectrum using a combination of at least one measured reference spectrum with at least one calculated function. The method includes measuring a reference spectrum as a plurality of measured values for a plurality of energy bins from at least one reference sample; selecting a region or multiple regions of interest corresponding to a plurality of the energy bins and, for each region of interest, recording the profile for the respective plurality of energy bins from the measured reference spectrum. The method further comprises measuring a sample spectrum as a plurality of intensity values for a plurality of energy bins; and fitting the measured sample spectrum to a fit function, the fit funtion including the at least one profile in at least one respective region of interest of the measured spectrum as well as the at least one calculated function.

Classes IPC  ?

• G06F 17/17 - Évaluation de fonctions par des procédés d'approximation, p. ex. par interpolation ou extrapolation, par lissage ou par le procédé des moindres carrés
• G01N 23/2252 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en utilisant des microsondes électroniques ou ioniques en utilisant des faisceaux d’électrons incidents, p. ex. la microscopie électronique à balayage [SEM] en mesurant les rayons X émis, p. ex. microanalyse à sonde électronique [EPMA]
• G01N 23/083 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et mesurant l'absorption le rayonnement consistant en rayons X
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Produits et services

Computer software for use in relation to thin film or thin layer analysis; computer software for use in relation to the display, simulation and fitting of X-ray scattering data from single crystal substrates and heteroepitaxial layers; computer software for use in relation to the characterization of thin films or thin layers. Design, development, implementation and programming of computer software for use in relation to thin film or thin layer analysis; design, development, implementation and programming of computer software for use in relation to the display, simulation and fitting of X-ray scattering data from single crystal substrates and heteroepitaxial layers; design, development, implementation and programming of computer software for use in relation to the characterization of thin films or thin layers; installation and repair services relating to computer software for use in relation to thin film or thin layer analysis; installation and repair services relating to computer software for use in relation to the display, simulation and fitting of X-ray scattering data from single crystal substrates and heteroepitaxial layers; installation and repair services relating to computer software for use in relation to the characterization of thin films or thin layers.

Abrégé

An X-ray diffraction apparatus for high resolution measurement combines the use of an X-ray source with a target having an atomic number Z less 50 with an energy resolving X-ray detector having an array of pixels and a beta radiation multilayer mirror for selecting the K-beta radiation from the X-ray source and for reflecting the K-beta radiation onto the sample where it is diffracted onto the energy resolving X-ray detector. The sample may in particular be in transmission. The sample may be a powder sample in a capillary.

Classes IPC  ?

• G01N 23/20091 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant le spectre de dispersion d’énergie [EDS] du rayonnement diffracté
• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet

Abrégé

A method of measuring properties of a thin film stack by GIXR divides the stack into sub-layers and represents the composition of each sub-layer by an number P. The numbers P represent the composition of each layer. For example, integers may represent pure material and fractional values represent mixtures of the adjacent pure materials. This representation is then used to fit to measured data and the best fit gives an indication of the material composition of each of the sub-layers and hence as a function of depth.

Classes IPC  ?

• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]
• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux

Abrégé

Apparatus for computed tomography is described that is also suitable for X-ray diffraction. The computed tomography measurement uses a line focus 8 and passes the X-rays from the line focus through a perpendicular slit 22 and then through a sample onto a two dimensional detector. A plurality of images are taken, each with the sample rotated about a rotation axis 14 by a different amount, and combined to create a computed tomography image.

Classes IPC  ?

• G01N 23/046 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux en utilisant la tomographie, p. ex. la tomographie informatisée

Abrégé

A method of making X-ray fluorescence, XRF, measurements of a layered sample is described. At least two measurements are made, one through one surface of the sample and another through the opposite surface. This may be conveniently done by inverting the sample between the measurements. The data from the additional measurements may be used to calculate multiple parameters of the sample, such as the concentration, density or thickness of each of the layers.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Produits et services

[ Design, development, implementation and programming of computer software for use in analyzing thin films and thin layers; design, development, implementation and programming of computer software for use in displaying, simulating, and fitting X-ray scattering data from single crystal substrates and heteroepitaxial layers; design, development, implementation, and programming of computer software for use in characterizing thin films and thin layers; installation and repair services relating to computer software for use in analyzing thin films and thin layers; installation and repair services relating to computer software for use in displaying, simulating, and fitting X-ray scattering data from single crystal substrates and heteroepitaxial layers; installation and repair services relating to computer software for use in characterizing thin films and thin layers ] Computer software for use in analyzing thin films and thin layers; computer software for use in displaying, simulating, and fitting X-ray scattering data from single crystal substrates and heteroepitaxial layers; computer software for use in characterizing thin films and thin layers

Produits et services

Computer software for use in relation to thin film or thin layer analysis; computer software for use in relation to the display, simulation and fitting of X-ray scattering data from single crystal substrates and heteroepitaxial layers; computer software for use in relation to the characterization of thin films or thin layers. Installation and repair services relating to computer software for use in relation to thin film or thin layer analysis; installation and repair services relating to computer software for use in relation to the display, simulation and fitting of X-ray scattering data from single crystal substrates and heteroepitaxial layers; installation and repair services relating to computer software for use in relation to the characterization of thin films or thin layers. Design, development, implementation and programming of computer software for use in relation to thin film or thin layer analysis; design, development, implementation and programming of computer software for use in relation to the display, simulation and fitting of X-ray scattering data from single crystal substrates and heteroepitaxial layers; design, development, implementation and programming of computer software for use in relation to the characterization of thin films or thin layers.

Abrégé

X ray apparatus includes a sample stage (4) for supporting a sample (6), an X-ray source (2) and an energy dispersive X-ray detector (8). A conical X-ray collimator (10) is provided either between the sample and the X-ray source or between the sample and the energy-dispersive X-ray detector, the conical X-ray collimator including a plurality of truncated cones arranged concentrically around a central axis, the truncated cones having a common apex defining a central measurement spot on the sample.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G21K 1/02 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer utilisant des diaphragmes, des collimateurs
• B22F 3/105 - Frittage seul en utilisant un courant électrique, un rayonnement laser ou un plasma
• B33Y 80/00 - Produits obtenus par fabrication additive
• B33Y 10/00 - Procédés de fabrication additive

Abrégé

A sample holder 2 for holding a capillary 40 for X-ray analysis has a first thermal transport member 36 on the base portion 14 on one side of a longitudinal slit 12 and a second thermal transport member 38 on the base portion 16 on the other side. The thermal transport members 36, 38 are compressed between a frame 30 and the base portion 14, 16 in the transverse direction to urge the edges of the first and second thermal transport members together, to hold a capillary 40 longitudinally aligned with the longitudinal slit 12.

Classes IPC  ?

• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux
• G01N 23/20008 - Détails de construction des appareils d’analyse, p. ex. caractérisés par la source de rayons X, le détecteur ou le système optique à rayons XLeurs accessoiresPréparation d’échantillons à cet effet
• G01N 23/20025 - Porte-échantillons ou leurs supports
• G01N 23/20033 - Porte-échantillons ou leurs supports pourvus de moyens de commande de la température ou de chauffage
• G01N 23/20066 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion inélastique des rayons gamma, p. ex. effet Compton
• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]
• G01N 23/22 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

A measurement head for making X-ray measurements on drilling fluid includes an inner pipe (30) having a outlet (32) and an outer pipe (34) around the inner pipe. Drilling fluid is pumped through the outlet refreshing the fluid at the outlet. The pump is then stopped. A height sensor (42) is then used to measuring the height of a meniscus of drilling fluid at the outlet (32). An X-ray head (50) including an X-ray source (52) and an X-ray detector (54) is then moved into a reproducible position above the meniscus of fluid above the outlet. The height sensor (42) may be fixed to a movable cover (40), to the X-ray head (50) or to some other part of the measurement head.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 33/28 - Huiles

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; none of the aforesaid goods being for use in the field of psychological testing; scientific and measuring apparatus and instruments; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers; wafer analysers; X-ray tubes; X-ray apparatus; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; spectrometers; parts and fittings for all the aforesaid; none of the aforesaid goods being for use in the field of psychological testing. Construction and repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto; design, development and programming of computer software; industrial analysis and research services; leasing and rental of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of technological advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes.

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; none of the aforesaid goods being for use in the field of psychological testing; scientific and measuring apparatus and instruments; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers; wafer analysers; X-ray tubes; X-ray apparatus; computer hardware relating to X-ray diffraction and X-ray diffraction apparatus; spectrometers; parts and fittings for all the aforesaid; none of the aforesaid goods being for use in the field of psychological testing.

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples.

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples.

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples.

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples.

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples.

Produits et services

computer software for diffractometric analysis of materials; computer software for spectrometric analysis of materials; computer software for x-ray fluorescence analysis of materials; computer software for determining X-ray intensities; computer software for determining the thickness of layer samples; computer software for determining chemical composition of materials; computer software for standardless analysis of samples; none of the aforesaid goods being for use in the field of psychological testing * or for use in the medical sector * ; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analyzers; X-ray tubes; X-ray apparatus; computer software and hardware for X-ray diffraction and operating X-ray diffraction apparatus; spectrometers; parts and fittings for all the aforesaid; all of the aforesaid goods being for use in the fields of cement production, mining, mineral beneficiation, iron, steel and non-ferrous metals, petroleum and petrochemicals, polymers, glass production, forensics, environmental protection, Restriction of Hazardous Substances compliance, food and cosmetics, and pharmaceutical compounds; none of the aforesaid goods being for medical purposes or for use with silicon wafers in the semi-conductor industry

Produits et services

computer software for diffractometric analysis of materials; computer software for spectrometric analysis of materials; computer software for x-ray fluorescence analysis of materials; computer software for determining X-ray intensities; computer software for determining the thickness of layer samples; computer software for determining chemical composition of materials; computer software for standardless analysis of samples; none of the aforesaid goods being for use in the field of psychological testing; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analyzers; X-ray tubes; X-ray apparatus; computer software and hardware for X-ray diffraction and operating X-ray diffraction apparatus; spectrometers; component parts and fittings for all the aforesaid; none of the aforesaid goods being for medical purposes or for use in the field of psychological testing

Abrégé

A method of X-ray analysis measures X-ray diffraction in transmission. In order to carry out quantitative measurements, a background measurement is taken slightly away from the diffraction peak and the ratio of measured intensities used to correct for variations in sample composition.

Classes IPC  ?

• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux
• G01N 23/22 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles

Abrégé

2 corresponding to an X-ray diffraction peak of a predetermined component. A matrix corrected X-ray intensity is obtained using the measured X-ray intensity in the X-ray diffraction measurement, the correction measurement and the mass attenuation coefficient of the sample calculated from the elemental composition and the mass attenuation coefficients of the elements.

Classes IPC  ?

• G01N 23/22 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux

Abrégé

Apparatus includes an X-ray source 10, a wavelength dispersive X-ray detector for measuring X-ray fluorescence (XRF) and an energy dispersive X-ray detector 14 again for measuring X-ray fluorescence. Selected elements are measured using the wavelength dispersive process to reduce the overall measurement time compared with using only one of the two detectors or compared to a simple approach of measuring low atomic number elements with the wavelength dispersive detector and high atomic number elements with the energy dispersive detector. The selection can take place dynamically, in particular on the basis of the results of the energy-dispersive detector.

Classes IPC  ?

• G01N 23/22 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Produits et services

computer software for analyzing X-ray images; computer software for use in analyzing images in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples

Produits et services

Computer software for analyzing X-ray images; computer software for use in analyzing images in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples

Produits et services

computer software for analyzing X-ray images; computer software for use in analyzing images in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples

Produits et services

computer software for analyzing X-ray images; computer software for use in analyzing images in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples

Produits et services

computer software for analyzing X-ray images; computer software for use in analyzing images in relation to spectrometry; [computer software for use in relation to x-ray fluorescence analysis;] computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples

Abrégé

A method of manufacturing an X-ray tube component, includes diffusion bonding or brazing an anode of rhodium, molybdenum or tungsten to a heat spreader of molybdenum, tungsten, or a composite of molybdenum and/or tungsten. Suitable joint materials for diffusion bonding include gold; suitable joint materials for brazing include an alloy of silver and copper, an alloy of silver, copper and palladium, an alloy of gold and copper or an alloy of gold, copper and nickel. The resulting tube component delivers reliable behaviors and the joint can withstand high temperatures, high temperature gradients, fast temperature changes, extremely high radiation and extremely high electric field, while maintaining good high vacuum properties.

Classes IPC  ?

• H01J 35/18 - Fenêtres
• H01J 35/08 - AnodesAnticathodes
• H01J 9/14 - Fabrication des électrodes ou des systèmes d'électrodes des électrodes non émissives
• H01J 35/12 - Réfrigération d'anodes autres que tournantes

Produits et services

Scientific apparatus and instruments for use in relation to diffractometry; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers; X-ray tubes; X-ray apparatus; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; computer software for use in relation to diffractometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; parts and fittings for all the aforesaid; all of the foregoing excluding apparatus and instruments for the removal of particles and microorganisms from gases and solvents, membranes, filters and filter cartridges for the filtration of air and gas streams. Construction and repair of scientific apparatus and instruments for use in relation to diffractometry, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; installation of scientific apparatus and instruments for use in relation to diffractometry, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto in the field of diffractometry; design, development and programming of computer software in the field of diffractometry; industrial analysis and research services; leasing and rental of scientific apparatus and instruments for use in relation to diffractometry, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; design of scientific apparatus and instruments for use in relation to diffractometry, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation and use of scientific apparatus and instruments for use in relation to diffractometry, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes.

Produits et services

Scientific and measuring apparatus and instruments; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers; wafer analysers; X-ray tubes; X-ray apparatus;   computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; spectrometers; parts and fittings for all the aforesaid; all of the foregoing excluding apparatus and instruments for the removal of particles and microorganisms from gases and solvents, membranes, filters and filter cartridges for the filtration of air and gas streams. Construction and repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid. Scientific services and design relating thereto; design, development and programming of computer software; industrial analysis and research services; leasing and rental of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; none of the aforesaid services relating to furniture.

Produits et services

Scientific and measuring apparatus and instruments; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers; wafer analysers; X-ray tubes; X-ray apparatus; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; spectrometers; parts and fittings for all the aforesaid; none of the aforesaid goods being for use in the field of psychological testing or for use in the medical sector.

Produits et services

Scientific and measuring apparatus and instruments; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers; wafer analysers; X-ray tubes; X-ray apparatus; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; spectrometers; parts and fittings for all the aforesaid; none of the aforesaid goods being for use in the field of psychological testing or for use in the medical sector.

Produits et services

Computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to X-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; none of the aforesaid goods being for use in the field of psychological testing or for use in the medical sector. Construction and repair of X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; installation of X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid; none of the aforesaid services being for medical purposes. Leasing and rental of X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; design of X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers and X-ray tubes; provision of technological advice and consultancy services relating to the selection, operation, and use of Xray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, Xray diffractometers, X-ray analysers and X-ray tubes; none of the aforesaid services being for medical purposes.

Produits et services

Computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples; none of the aforesaid goods being for use in the field of psychological testing; none of the aforesaid goods being for use in the field of psychological testing or for use in the medical sector. Construction and repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid; none of the aforesaid services being in the medical sector. Scientific services and design relating thereto; technological services in the field of spectrometry and diffractometry; design, development and programming of computer software in the field of spectromety and diffractometry; industrial analysis and research services in the field of spectrometry and diffractometry; leasing and rental of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; none of the aforesaid services being in the medical sector.

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples. Construction and repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto; design, development and programming of computer software; industrial analysis and research services; leasing and rental of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes.

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples. Construction and repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto; design, development and programming of computer software; industrial analysis and research services; leasing and rental of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes.

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples. Construction and repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto; design, development and programming of computer software; industrial analysis and research services; leasing and rental of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes.

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples. Construction and repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto; design, development and programming of computer software; industrial analysis and research services; leasing and rental of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes.

Produits et services

Computer software; computer software for analysis purposes; computer software for use in relation to diffractometry; computer software for use in relation to spectrometry; computer software for use in relation to x-ray fluorescence analysis; computer software for use in relation to the determination of X-ray intensities; computer software for use in relation to the determination of the thickness of layer samples; computer software for use in relation to the determination of chemical composition; computer software for use in relation to the standardless analysis of samples. Construction and repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto; design, development and programming of computer software; industrial analysis and research services; leasing and rental of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes.

Abrégé

A method of of preparing samples for XRF using a flux and a platinum crucible includes forming the flux into a free-standing crucible liner. This may be achieved by mixing lithium borate particles with a liquid to form a paste; placing the lithium borate paste onto the inner surface of a mould; and after drying removing from the mould and firing the lithium borate paste to dry the lithium borate to form a free-standing crucible liner. The liner may be placed within a platinum crucible and then a sample placed in the liner. The temperature of the crucible is raised to a sufficient temperature that any oxidation reaction takes place before taking the temperature above the melting temperature of the flux to melt the crucible liner and dissolve the sample into the flux. The crucible can then be cooled and XRF measurements made on the sample.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• F27D 1/00 - CarcassesGarnissagesParoisVoûtes
• C04B 35/01 - Produits céramiques mis en forme, caractérisés par leur compositionCompositions céramiquesTraitement de poudres de composés inorganiques préalablement à la fabrication de produits céramiques à base d'oxydes
• G01N 1/28 - Préparation d'échantillons pour l'analyse
• F27B 14/08 - Parties constitutives spécialement adaptées aux fours à creusets ou à bassin
• F27B 14/10 - Creusets
• C01B 35/12 - Borates

Produits et services

X-ray detectors for use in X-ray apparatus and analyzers not for medical purposes; X-ray imaging detectors for use in X-ray apparatus and analyzers not for medical purposes; photon counting X-ray detectors for use in X-ray apparatus and analyzers not for medical purposes; X-ray analytical apparatus for non-medical purposes; [ diffractometers; X-ray diffraction apparatus, X-ray diffractometers; ] X-ray analysers, namely, non-medical X-ray analyser apparatus for use in analyzing samples of composites for use in scientific applications; wafer analysers; [ X-ray tubes for non-medical purposes; X-ray apparatus for non-medical purposes; ] computer software [ and hardware ] for use with X-ray diffraction and X-ray diffraction apparatus; [ spectrometers; ] parts and fittings for all the aforesaid

Produits et services

X-ray detectors for use in X-ray apparatus and analyzers not for medical purposes; X-ray imaging detectors for use in X-ray apparatus and analyzers not for medical purposes; photon counting X-ray detectors for use in X-ray apparatus and analyzers not for medical purposes; X-ray analytical apparatus for non-medical purposes; [ diffractometers; X-ray diffraction apparatus, X-ray diffractometers; ] X-ray analysers, namely, non-medical X-ray analyser apparatus for use in analyzing samples of composites for use in scientific applications; wafer analysers; [ X-ray tubes for non-medical purposes; X-ray apparatus for non-medical purposes; ] computer software [ and hardware ] for use with X-ray diffraction and X-ray diffraction apparatus; [ spectrometers; ] parts and fittings for all the aforesaid

Produits et services

Scientific and measuring apparatus and instruments; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers; wafer analysers; X-ray tubes; X-ray apparatus; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; spectrometers; parts and fittings for all the aforesaid. Construction and repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto; industrial analysis and research services; leasing and rental of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes.

Produits et services

Scientific and measuring apparatus and instruments; X-ray detectors; X-ray imaging detectors; photon counting X-ray detectors; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers; wafer analysers; X-ray tubes; X-ray apparatus; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; spectrometers; parts and fittings for all the aforesaid. Construction and repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto; industrial analysis and research services; leasing and rental of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray detectors, X-ray imaging detectors, photon counting X-ray detectors, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes.

Produits et services

Scientific and measuring apparatus and instruments relating to X-ray diffraction; X-ray analytical apparatus relating to X-ray diffraction; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers relating to X-ray diffraction; wafer analysers; X-ray tubes and X-ray apparatus relating to X-ray diffraction; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; parts and fittings for all the aforesaid; none of the aforesaid goods relating to X-ray fluorescence spectrometers or to X-ray fluorescence spectrometry. Construction and repair of scientific and measuring apparatus and instruments, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid; none of the aforesaid services relating to X-ray fluorescence spectrometers or to X-ray fluorescence spectrometry. Scientific and technological services and design relating thereto; industrial analysis and research services; leasing and rental of scientific and measuring apparatus and instruments, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; provision of advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; none of the aforesaid services relating to X-ray fluorescence spectrometers or to X-ray fluorescence spectrometry.

Abrégé

X-ray analysis of a primary sample such as a flexible sheet 60 uses apparatus having a primary sample holder such as a material feed-through system 20 for moving the flexible sheet through the apparatus. An X-ray analysis head 6 containing an X-ray source and an X-ray detector is mounted on a robot arm 4. The robot arm moves in three dimensions so that the analysis head can be brought into position to measure the flexible sheet as it is being brought through the apparatus by the material feed-through system.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01T 7/08 - Moyens pour transporter les échantillons reçus
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• B25J 9/00 - Manipulateurs à commande programmée

Abrégé

X-ray diffraction apparatus includes a flat graded multilayer 8 which may be used in a SAXS configuration for a sample 6. The apparatus may be adapted for Bragg-Brentano measurements by a collimator 16 without the need for alternate beam paths or complex arrangements.

Classes IPC  ?

• G01T 1/36 - Mesure de la distribution spectrale des rayons X ou d'une radiation nucléaire
• G21K 1/04 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer utilisant des diaphragmes, des collimateurs utilisant des diaphragmes à ouverture variable, des obturateurs, des hacheurs
• G01N 23/201 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en mesurant la diffusion sous un petit angle, p. ex. la diffusion des rayons X sous un petit angle [SAXS]
• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles

Abrégé

A measurement standard suitable for measuring amounts of certain elements in pharmaceutical excipients is described. A reference standard is dissolved in a solvent, for example acetone, and mixed with a pharmaceutical excipient such as cellulose, lactose or calcium carbonate. The solvent is then evaporated to provide a dry standard.

Classes IPC  ?

• G01N 23/22 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux
• G01T 7/00 - Détails des instruments de mesure des radiations
• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X

Abrégé

A digital X-ray sensor having a detection layer, and a collection layer formed by pixels in the form of a CMOS ASIC, wherein the sensor is provided with a “photon-counting” function and is suitable for radiological applications, so that the best arrangement is obtained between the image quality and the radiation dose absorbed by a subject.

Classes IPC  ?

• G01T 1/24 - Mesure de l'intensité de radiation avec des détecteurs à semi-conducteurs
• G01N 23/04 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en transmettant la radiation à travers le matériau et formant des images des matériaux

Produits et services

Scientific and measuring apparatus and instruments; X-ray analytical apparatus; X-ray apparatus; analytical apparatus, spectrometers; X-ray fluorescence spectrometers; X-ray diffraction and spectrometry apparatus, diffractometers; X-ray diffractometers; X-ray analysers; X-ray detectors; X-ray fluorescence spectrometers; wafer analysers; X-ray tubes; computer software and hardware relating to scientific and measuring apparatus and instruments, X-ray analytical apparatus, X-ray apparatus, analytical apparatus, spectrometers; X-ray fluorescence spectrometers; X-ray diffraction and spectrometry apparatus, diffractometers; X-ray diffractometers; X-ray analysers; X-ray detectors; X-ray fluorescence spectrometers; wafer analysers; X-ray tubes; sample pre-treatment equipment; equipment for analysing and treating samples used in production and manufacturing; parts and fittings for all the aforesaid. construction and repair of scientific and measuring apparatus and instruments: construction and repair of X-ray analytical apparatus, X-ray apparatus, X-ray diffraction and spectrometry apparatus; construction and repair of X-ray analysers, X-ray detectors, spectrometers, X-ray fluorescence spectrometers and diffractometers, X-ray diffractometers, wafer analysers and X-ray tubes; the installation of scientific and measuring apparatus and instruments; the installation of X-ray diffraction and spectrometry apparatus; the installation of X-ray analysers, X-ray detectors, spectrometers, X-ray fluorescence spectrometers, diffractometers, X-ray diffractometers and wafer analysers, X-ray tubes, sample pre-treatment equipment and equipment for analysing and treating samples used in production and manufacturing; the provision of advice and consultancy services in relation to the repair and maintenance of scientific and measuring apparatus and instruments; the provision of advice and consultancy services in relation to X-ray analytical apparatus, X-ray apparatus, X-ray diffraction and spectrometry apparatus, X-ray analysers, X-ray detectors, spectrometers, X-ray fluorescence spectrometers, and diffractometers, X-ray diffractometers, wafer analysers, X-ray tubes and sample pre-treatment equipment and equipment for analysing and treating samples used in production and manufacturing; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto; industrial analysis and research services; the leasing and rental of scientific and measuring apparatus and instruments; the leasing and rental of X-ray analytical apparatus, X-ray apparatus, X-ray diffraction and spectrometry apparatus; the leasing and rental of X-ray analysers, X-ray detectors, spectrometers, X-ray fluorescence spectrometers and diffractometers, wafer analysers, and X-ray tubes; the design of scientific and measuring apparatus and instruments, X-ray diffraction and spectrometry apparatus, X-ray analysers, X-ray detectors, spectrometers and diffractometers, X-ray diffractometers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes and sample pre-treatment equipment and equipment for analysing and treating samples used in production and manufacturing; the provision of advice and consultancy services relating to the selection, operation, and use of X-ray analytical apparatus, X-ray apparatus, X-ray diffraction and spectrometry apparatus, X-ray analysers, X-ray detectors, spectrometers and diffractometers, X-ray diffractometers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes and sample pre-treatment equipment and equipment for analysing and treating samples used in production and manufacturing; the provision of advice and consultancy services relating to industrial analysis and the analysis of samples for use in industrial manufacture or processing; information, advisory and consultancy services all relating to the aforesaid.

Produits et services

Scientific and measuring apparatus and instruments; X-ray analytical apparatus; diffractometers; X-ray diffraction apparatus, X-ray diffractometers; X-ray analysers; wafer analysers; X-ray tubes; X-ray apparatus; computer software and hardware relating to X-ray diffraction and X-ray diffraction apparatus; parts and fittings for all the aforesaid. The construction and repair of scientific and measuring apparatus and instruments, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; the installation of scientific and measuring apparatus and instruments, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto; industrial analysis and research services; the leasing and rental of scientific and measuring apparatus and instruments, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; the design of scientific and measuring apparatus and instruments, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes; the provision of advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, X-ray analytical apparatus, X-ray apparatus, X-ray diffraction apparatus, diffractometers, X-ray diffractometers, X-ray analysers, wafer analysers and X-ray tubes.

Produits et services

X-ray analytical apparatus not for medical purposes; spectrometers; X-ray spectrometry apparatus not for medical purposes; X-ray analyzers not for medical purposes; X-ray fluorescence spectrometers not for medical purposes; replacement parts and fittings for all the aforesaid goods

Produits et services

X-ray apparatus not for medical use; X-ray detectors for use in X-ray apparatus and analysers not for medical use; X-ray pixel detectors not for medical use; diffractometers; replacement parts and fittings for all the aforesaid goods [ Repair and installation of X-ray apparatus, X-ray detectors, X-ray pixel detectors and diffractometers ] [ Industrial analysis and research services in the field of X-ray apparatus, X-ray detectors, X-ray pixel detectors, and diffractometers; design of X-ray apparatus, X-ray detectors, X-ray pixel detectors and diffractometers; information and consulting services relating to science and technology in the field of X-ray apparatus, X-ray detectors, X-ray pixel detectors, and diffractometers ]

Abrégé

2 fulfils a Bragg condition for the first crystalline component which is imaged by a detector to provide a two-dimensional image of the first crystalline component at the surface of the sample.

Classes IPC  ?

• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles
• G01N 23/205 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux en utilisant des caméras de diffraction
• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux

Produits et services

X-ray apparatus; X-ray detectors for use in X-ray apparatus and analysers; X-ray pixel detectors; spectrometers; diffractometers; analytical apparatus; X-ray analysers; parts and fittings for all the aforesaid. The repair of scientific and measuring apparatus and instruments, X-ray detectors, X-ray pixel detectors, X-ray analysers, spectrometers and diffractometers; the installation of scientific and measuring apparatus and instruments, X-ray detectors, X-ray pixel detectors, X-ray analysers, spectrometers and diffractometers. Scientific and technological services and design relating thereto; industrial analysis and research services; the design of scientific and measuring apparatus and instruments, X-ray detectors, X-ray pixel detectors, X-ray analysers, spectrometers and diffractometers; information and consultancy services relating to science and technology.

Produits et services

Scientific and measuring apparatus and instruments; X-ray analytical apparatus; spectrometers; X-ray spectrometry apparatus, X-ray analysers; X-ray fluorescence spectrometers; parts and fittings for all the aforesaid. The construction and repair of scientific and measuring apparatus and instruments, X-ray analytical apparatus, spectrometers, X-ray spectrometry apparatus, X-ray analysers, X-ray fluorescence spectrometers; the installation of scientific and measuring apparatus and instruments, X-ray analytical apparatus, spectrometers, X-ray spectrometry apparatus, X-ray analysers, X-ray fluorescence spectrometers; the provision of advice and consultancy services in relation to the repair and maintenance of scientific and measuring apparatus and instruments, X-ray analytical apparatus, spectrometers, X-ray spectrometry apparatus, X-ray analysers, X-ray fluorescence spectrometers; information, advisory and consultancy services all relating to the aforesaid. Scientific and technological services and design relating thereto; industrial analysis and research services; the leasing and rental of scientific and measuring apparatus and instruments, X-ray analytical apparatus, spectrometers, X-ray spectrometry apparatus, X-ray analysers, X-ray fluorescence spectrometers; the design of scientific and measuring apparatus and instruments, X-ray analytical apparatus, spectrometers, X-ray spectrometry apparatus, X-ray analysers, X-ray fluorescence spectrometers.

Abrégé

A two or three part sample holder for X-ray apparatus has a sample ring 2 and a counter ring 20. The sample ring 2 has two opposed surfaces and foils 8, 10 one on each surface holding a powder sample 6 within the central hole 4. The sample ring 2 is relatively thin, of thickness 0.2 to 4 mm. A counter ring 20 is provided to engage with the sample ring 2 to provide increased strength and/or stiffness.

Classes IPC  ?

• G01N 23/223 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux en irradiant l'échantillon avec des rayons X ou des rayons gamma et en mesurant la fluorescence X
• G01N 23/22 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en mesurant l'émission secondaire de matériaux
• B01L 3/00 - Récipients ou ustensiles pour laboratoires, p. ex. verrerie de laboratoireCompte-gouttes

Abrégé

A method of X-ray diffraction illuminates a beam (4) of X-rays along an illuminated strip (16) on a surface (14) of a sample (10). The X-rays are diffracted by the sample (10) and pass through a mask (20) having a slit extending essentially perpendicularly to the strip (16). The X-rays are detected by a two-dimensional X-ray detector to measure the diffracted X-rays at different positions along the strip (16).

Classes IPC  ?

• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles

Abrégé

A shutter arrangement for an X-ray housing includes a shutter 10 for example of solid tantalum. In embodiments, the shutter has a through hole 22 and slides between a closed and an open position on the inner face of the X-ray housing, in the open position the through hole 22 aligns with an opening 8 in the housing.

Classes IPC  ?

• G21K 1/04 - Dispositions pour manipuler des particules ou des rayonnements ionisants, p. ex. pour focaliser ou pour modérer utilisant des diaphragmes, des collimateurs utilisant des diaphragmes à ouverture variable, des obturateurs, des hacheurs

Abrégé

A compact powder diffractometer has one or more detectors arranged no more than 300 mm, in an example 55 mm, from a sample stage for mounting a powder sample. High resolution is nevertheless obtained in spite of the small dimensions using a geometry that achieves a suitable divergence of X-rays incident on the sample and a small spot size using a grazing exit condition on a monochromator crystal.

Classes IPC  ?

• G01N 23/20 - Recherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffraction de la radiation par les matériaux, p. ex. pour rechercher la structure cristallineRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la diffusion de la radiation par les matériaux, p. ex. pour rechercher les matériaux non cristallinsRecherche ou analyse des matériaux par l'utilisation de rayonnement [ondes ou particules], p. ex. rayons X ou neutrons, non couvertes par les groupes , ou en utilisant la réflexion de la radiation par les matériaux

Abrégé

An imaging system combines CT and XRD measurements, both measuring the XRD diffraction and the absorption as a function of energy. A goniometer 2, source 4 and two dimensional detector 10 may be used. Embodiments use relatively soft X-rays in the 5-25 keV range. An integrated mounting unit to mount the sample 8 close to detector 10 is also described.

Classes IPC  ?

• G01N 23/207 - Diffractométrie, p. ex. en utilisant une sonde en position centrale et un ou plusieurs détecteurs déplaçables en positions circonférentielles

Abrégé

A bead furnace has a furnace with a furnace chamber 4 and opening 6. A closure assembly 20 is provided on closure assembly 22. The closure assembly has a blank closure element 26 and an active closure element 32 on different sides of the closure assembly, each matching the opening 6. A crucible holder 44 with a detent for holding a crucible and a mold holder 60 for holding a mold are provided on the active face. The closure assembly moves between two states, a load state with the blank closure element 26 in the furnace opening and an operation state with the active closure element 32 in the furnace opening with the crucible and mold in the furnace. The closure assembly can agitate the crucible contents and then tip the crucible to pour fused contents into the mold.

Classes IPC  ?

• C03B 19/10 - Fabrication des perles
• F27B 14/02 - Fours à creusetsFours à bassin avec dispositions pour le basculement ou l'oscillation

Abrégé

An X-ray source with a cathode (2) that includes a first wire (4) having optionally thermal loops (12, 14) between an emission loop (10) and first and second ends (6, 8). A spiral second wire (30) is wound around the wire (4) and a low work function coating (32) is provided on both wires. The first and second wires may be of refractory material, such as tungsten, and the low work function coating may include barium oxide.

Classes IPC  ?

• H01J 35/06 - Cathodes

Produits et services

Scientific and measuring apparatus and instruments, including analytical apparatus, spectrometers, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, sample pre-treatment equipment, X-ray diffraction and spectrometry apparatus and X-ray tubes, as well as parts for all the aforesaid. Apparatus for heating; bead furnaces; heating furnaces for samples for use in analysis by spectrometers and X-ray apparatus; heating apparatus for samples for use in analysis by spectrometers and X-ray apparatus; parts for all the aforesaid.

Produits et services

Scientific, measuring and analytical apparatus and instruments, namely, X-ray spectrometers, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, spectrometers, wafer analysers, X-ray tubes, X-ray apparatus; computer hardware relating to X-ray diffraction and X-ray diffraction apparatus; computer software for X-ray spectrometers, spectrometry apparatus, X-ray diffraction and X-ray diffraction apparatus [ Maintenance and repair of scientific and measuring apparatus and instruments, namely, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, spectrometers, X-ray fluorescence spectrometers, and diffractometers, wafer analysers and X-ray tubes; installation of scientific and measuring apparatus and instruments, namely, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, spectrometers, X-ray fluorescence spectrometers, and diffractometers, wafer analysers and X-ray tubes; providing advice and consultancy services in relation to the repair and maintenance of scientific and measuring apparatus and instruments, namely, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, spectrometers, X-ray fluorescence spectrometers, and diffractometers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid ] [ Scientific and technological research and design in the field of X-ray apparatus, spectrometry apparatus, X-ray diffraction and X-ray diffraction apparatus; industrial analysis and research services in the field of X-ray apparatus, spectrometry apparatus, X-ray diffraction and X-ray diffraction apparatus in relation to scientific and technological research and design; leasing and rental of scientific and measuring apparatus and instruments, namely, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, spectrometers, X-ray fluorescence spectrometers, and diffractometers, wafer analysers and X-ray tubes; design of scientific and measuring apparatus and instruments, namely, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, spectrometers, X-ray fluorescence spectrometers, and diffractometers, wafer analysers and X-ray tubes; providing technical advice and consultancy services relating to the selection, operation, and use of scientific and measuring apparatus and instruments, namely, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, spectrometers, X-ray fluorescence spectrometers, and diffractometers, wafer analysers and X-ray tubes; information, advisory and consultancy services all relating to the aforesaid ]