Toyo Corporation

Japon

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Type PI
        Brevet 30
        Marque 3
Juridiction
        International 21
        États-Unis 12
Date
2025 octobre 1
2025 septembre 1
2025 (AACJ) 2
2024 3
2023 3
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Classe IPC
G01R 23/16 - Analyse de spectreAnalyse de Fourier 5
G01R 29/08 - Mesure des caractéristiques du champ électromagnétique 5
G01L 3/24 - Dispositifs pour déterminer la valeur de la puissance, p. ex. en mesurant et en multipliant simultanément les valeurs du couple par le nombre de tours par unité de temps, en multipliant les valeurs de la force de traction ou propulsive par la vitesse 2
G01N 27/00 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques 2
G01N 27/02 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance 2
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Classe NICE
09 - Appareils et instruments scientifiques et électriques 3
10 - Appareils et instruments médicaux 3
42 - Services scientifiques, technologiques et industriels, recherche et conception 3
Statut
En Instance 1
Enregistré / En vigueur 32

1.

METHOD FOR PRODUCING CAPSULE AND KIT FOR PRODUCING CAPSULE

      
Numéro d'application JP2024012724
Numéro de publication 2025/203455
Statut Délivré - en vigueur
Date de dépôt 2024-03-28
Date de publication 2025-10-02
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s) Aoki Hiroyoshi

Abrégé

[Problem] To provide: a method for producing a capsule in which a to-be-embedded object vulnerable to acidic conditions can be embedded; and a kit for producing the capsule. [Solution] The present invention pertains to a method for producing a capsule that has a core derived from an ion-binding polymer capable of making reversible sol-gel transition by means of ions, the method comprising: a step for dispersing, in a first oil phase, an aqueous phase (first aqueous phase) containing a sol of the ion-binding polymer; and a step for supplying ions to the dispersed first aqueous phase, and forming gel beads of the ion-binding polymer, at least the surfaces of the gel beads having been gelled. In the step for forming gel beads, in order to supply ions, a carboxylic acid is added to the first oil phase so as to achieve a final concentration of 0.005-0.0125 w/w%.

Classes IPC  ?

  • B01J 13/06 - Fabrication de microcapsules ou de microbilles par séparation de phase

2.

PHYSICAL PROPERTY MEASUREMENT METHOD, PHYSICAL PROPERTY MEASUREMENT SYSTEM, AND ELEMENT FOR PHYSICAL PROPERTY MEASUREMENT

      
Numéro d'application 18861703
Statut En instance
Date de dépôt 2022-05-02
Date de la première publication 2025-09-11
Propriétaire TOYO Corporation (Japon)
Inventeur(s)
  • Oyabu, Noriaki
  • Inoue, Masaru
  • Murata, Hideyuki
  • Iwata, Takuro

Abrégé

A physical property measurement method includes applying a voltage, which periodically varies and periodically reverses in polarity, between a pair of electrodes in an element for physical property measurement. The element for physical property measurement includes: a material to be measured; an insulation layer disposed on only one of both sides of the material to be measured in a thickness direction thereof; and the pair of electrodes between which the material to be measured and the insulation layer are interposed in the thickness direction. The physical property measurement method also includes measuring a physical property of the material to be measured based on a current flowing through the element for physical property measurement as a result of the application of the voltage. The measuring of the physical property of the material to be measured includes measuring a polarity of an ion contained in the material to be measured.

Classes IPC  ?

  • G01N 27/48 - Systèmes utilisant la polarographie, c.-à-d. la mesure des variations d'intensité sous une tension qui varie lentement

3.

Charge amount measurement method and charge amount measurement system

      
Numéro d'application 18695154
Numéro de brevet 12188891
Statut Délivré - en vigueur
Date de dépôt 2021-09-27
Date de la première publication 2024-10-03
Date d'octroi 2025-01-07
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Inoue, Masaru
  • Oyabu, Noriaki

Abrégé

A charge amount measurement method includes applying a periodically-changing voltage between a pair of electrodes arranged with a sample interposed therebetween in a cell in which the sample is encapsulated, the sample being created by mixing a material to be measured with a nonpolar liquid crystal whose liquid crystal molecules do not rotate due to an application of the periodically-changing voltage; and measuring an amount of charge in the material to be measured, based on a current that flows through the pair of the electrodes and the sample due to the application of the periodically-changing voltage.

Classes IPC  ?

  • G01N 27/22 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la capacité

4.

ORGANIC EL DEVICE, METHOD FOR MANUFACTURING ORGANIC EL DEVICE, AND METHOD FOR EVALUATING CHARACTERISTIC OF ORGANIC EL DEVICE

      
Numéro d'application JP2023040625
Numéro de publication 2024/106347
Statut Délivré - en vigueur
Date de dépôt 2023-11-10
Date de publication 2024-05-23
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Oyabu, Noriaki
  • Inoue, Masaru
  • Murata, Hideyuki
  • Iwata, Takuro

Abrégé

An organic EL device (100) comprises a pair of electrodes (11, 12), a light emitting layer (15) disposed between the pair of electrodes (11, 12), and a carrier transport layer (positive hole transport layer (14)) disposed between one electrode (11) of the pair of electrodes (11, 12) and the light emitting layer (15). The carrier transport layer (positive hole transport layer (14)) contains ions (cations (17)) which are from a material different from a formation material forming the carrier transport layer (positive hole transport layer (14)) and have the same polarity as that of the carriers (positive holes) to be transported by the carrier transport layer (positive hole transport layer (14)).

Classes IPC  ?

  • H10K 50/155 - Couches de transport de trous comprenant des dopants
  • H10K 71/70 - Tests, p. ex. tests de durée de vie accélérée

5.

TEST METHOD, TEST SYSTEM, AND ELEMENT FOR ANTIGEN TESTING

      
Numéro d'application JP2023022816
Numéro de publication 2024/004767
Statut Délivré - en vigueur
Date de dépôt 2023-06-20
Date de publication 2024-01-04
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Inoue, Masaru
  • Oyabu, Noriaki

Abrégé

In this test method, a periodically varying voltage with a periodically reversing polarity is applied at each of the following: between an electrode pair (32A, 33A) of a first test element (3A) that comprises a test specimen (4) of a sample mixed in a solvent and the electrode pair (32A, 33A) positioned so as to sandwich a space (SP1) in which the test specimen (4) is enclosed; and between an electrode pair (32B, 33B) of a second test element (3B) that comprises the test specimen (4) and the electrode pair (32B, 33B) positioned so as to sandwich a space (SP1) in which the test specimen (4) is enclosed. This test method tests for the presence/absence of antigen (40) in a sample by comparing the current flowing in the first test element (3A) due to the applied voltage, with the current flowing in the second test element (3B) due to the applied voltage. The second test element (3B) comprises antibody (38) that is immobilized in a state of exposure to the test specimen (4) and that specifically binds to the antigen (40). The first test element (3A) does not have the antibody (38).

Classes IPC  ?

  • G01N 27/02 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance

6.

MICROCHIP, TWO-DIMENSIONAL SAMPLE SEPARATION SYSTEM, AND METHOD FOR MANUFACTURING MICROCHIP

      
Numéro d'application JP2022024496
Numéro de publication 2023/248280
Statut Délivré - en vigueur
Date de dépôt 2022-06-20
Date de publication 2023-12-28
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s) Sasaki, Hirohito

Abrégé

A microchip (100), which is used for two-dimensionally separating a sample by a first long carrier for developing the sample in a first direction and a second carrier for developing the sample in a second direction intersecting the first carrier, comprises a substrate (99) which has formed therein a first long space (103) for disposing therein the first carrier and a second space which is for disposing therein the second carrier and which is inside the substrate (99). The second space is configured from at least 50 capillaries (105) that are arranged in the longitudinal direction of the first space (103), that extend in an intersection direction intersecting the longitudinal direction, and that are all connected to the first space (103).

Classes IPC  ?

7.

PHYSICAL PROPERTY MEASUREMENT METHOD, PHYSICAL PROPERTY MEASUREMENT SYSTEM, AND ELEMENT FOR PHYSICAL PROPERTY MEASUREMENT

      
Numéro d'application JP2022019537
Numéro de publication 2023/214455
Statut Délivré - en vigueur
Date de dépôt 2022-05-02
Date de publication 2023-11-09
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Oyabu, Noriaki
  • Inoue, Masaru
  • Murata, Hideyuki
  • Iwata, Takuro

Abrégé

In this physical property measurement method, in an element (3) for physical property measurement that comprises a material (4) to be measured which is a solid object, an insulating layer (31) disposed on only one of both sides in the thickness direction of the material (4) to be measured, and a pair of electrodes (32, 33) between which the material (4) to be measured and the insulation layer (31) are sandwiched in the thickness direction, a voltage that varies periodically and of which the polarity is reversed periodically is applied between the pair of electrodes (32, 33). Further, in the physical property measurement method, a physical property of the material (4) to be measured is measured on the basis of a current that flows through the element (3) for physical property measurement due to the applied voltage. In the step for measuring the physical property of the material (4) to be measured, the polarity of ions contained in the material (4) to be measured is measured.

Classes IPC  ?

  • G01N 27/00 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques
  • G01N 27/48 - Systèmes utilisant la polarographie, c.-à-d. la mesure des variations d'intensité sous une tension qui varie lentement

8.

CHARGE AMOUNT MEASUREMENT METHOD AND CHARGE AMOUNT MEASUREMENT SYSTEM

      
Numéro d'application JP2021035456
Numéro de publication 2023/047600
Statut Délivré - en vigueur
Date de dépôt 2021-09-27
Date de publication 2023-03-30
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Inoue, Masaru
  • Oyabu, Noriaki

Abrégé

A charge amount measurement method comprises applying, in a liquid crystal cell (3) that encloses a sample (4) in which a material to be measured is mixed with nonpolar liquid crystal in which the liquid crystal molecules do not rotate even when a voltage is applied, a periodically changing voltage between a pair of electrodes (31) positioned with the sample (4) interposed therebetween, and measuring an amount of charge in the material to be measured on the basis of an electric current that flows through the pair of electrodes (31) and the sample (4) due to the voltage application.

Classes IPC  ?

  • G01R 29/24 - Dispositions pour mesurer des quantités de charge

9.

System, device, method, and program for analysis

      
Numéro d'application 17552564
Numéro de brevet 11946962
Statut Délivré - en vigueur
Date de dépôt 2021-12-16
Date de la première publication 2022-08-11
Date d'octroi 2024-04-02
Propriétaire TOYO Corporation (Japon)
Inventeur(s)
  • Li, Congbing
  • Kitagawa, Kazu
  • Miura, Nozomu
  • Nakamura, Tetsuya
  • Azuma, Naoki

Abrégé

An analysis system includes inference processer circuitry configured to infer a corresponding classification by inputting part of frequency spectrum data corresponding to reference measurement data to a learned model having learned a relation between part of frequency spectrum data corresponding to sample measurement data and a classification related to noise corresponding to the part, causal component identification processer circuitry configured to identify causal component data of noise from a component data list based on the inferred classification, and a presentation information generator configured to generate presentation information for a user based on the causal component data.

Classes IPC  ?

  • G01R 23/00 - Dispositions pour procéder aux mesures de fréquencesDispositions pour procéder à l'analyse de spectres de fréquences
  • G01R 23/16 - Analyse de spectreAnalyse de Fourier
  • G06F 40/279 - Reconnaissance d’entités textuelles

10.

ANALYSIS SYSTEM, DEVICE, METHOD, AND PROGRAM

      
Numéro d'application JP2021004681
Numéro de publication 2022/168332
Statut Délivré - en vigueur
Date de dépôt 2021-02-08
Date de publication 2022-08-11
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Li Congbing
  • Kitagawa Kazu
  • Miura Nozomu
  • Nakamura Tetsuya
  • Azuma Naoki

Abrégé

Provided is an analysis system comprising: an inference processing unit for inputting a portion of frequency spectrum data corresponding to reference measurement data into a trained model that has learned the correspondence relationship between a portion of frequency spectrum data corresponding to sample measurement data and the classification of noise corresponding to the portion, and thereby inferring a corresponding classification; a source component specification unit for specifying noise source component data from a component data list on the basis of the inferred classification; and a presentation information generation unit for generating information to present to a user on the basis of the source component data.

Classes IPC  ?

  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique

11.

Related interference wave presentation device and method

      
Numéro d'application 17552568
Numéro de brevet 11988699
Statut Délivré - en vigueur
Date de dépôt 2021-12-16
Date de la première publication 2022-04-07
Date d'octroi 2024-05-21
Propriétaire TOYO Corporation (Japon)
Inventeur(s)
  • Suetsugu, Kentaro
  • Li, Congbing
  • Nakamura, Tetsuya

Abrégé

A related interference wave presentation device includes a class specifying processer circuitry configured to specify a class to which a reference interference wave, which is a referenced interference wave, belongs, using a learned model generated by machine learning of sample data including interference waves to specify a class to which an interference wave belongs based on feature values of the interference wave, a related interference wave information generator configured to retrieve the sample data based on the class to which the reference interference wave belongs and generate related interference wave information which is information about a related interference wave; and a presentation controller configured to perform control to present the related interference wave information in part or in whole.

Classes IPC  ?

  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique
  • H04B 17/345 - Valeurs d’interférence
  • H04B 17/391 - Modélisation du canal de propagation

12.

Packet capture device and packet capture method

      
Numéro d'application 17430866
Numéro de brevet 11296958
Statut Délivré - en vigueur
Date de dépôt 2020-04-24
Date de la première publication 2022-02-10
Date d'octroi 2022-04-05
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s) Ogita, Keiichi

Abrégé

A packet capture device incudes: a capture unit which captures packets that flow in a communication network at 200 Gbps; a control unit which temporarily holds the packets captured; and an interface which stores the packets temporarily held into a secondary storage device. The control unit includes: a first NUMA node including a first processor and a first memory; and a second NUMA node including a second processor and a second memory. The capture unit includes: a first capture unit which captures packets and stores the packets into a first memory; and a second capture unit which captures packets and stores the packets into a second memory.

Classes IPC  ?

  • H04L 12/26 - Dispositions de surveillance; Dispositions de test
  • H04L 43/022 - Capture des données de surveillance par échantillonnage
  • H04L 43/04 - Traitement des données de surveillance capturées, p. ex. pour la génération de fichiers journaux

13.

PACKET CAPTURE DEVICE AND METHOD

      
Numéro d'application JP2020017856
Numéro de publication 2021/215011
Statut Délivré - en vigueur
Date de dépôt 2020-04-24
Date de publication 2021-10-28
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s) Ogita, Keiichi

Abrégé

A packet capture device (20) comprises: a capture unit (21) that captures packets flowing at 200 Gbps through a communication network (10); a control unit (22) that temporarily holds the captured packets; and an interface unit (25) that records the temporarily held packets into a secondary storage device (12). The control unit (22) has a first NUMA node (23) constituted by a first processor (23a) and a first memory (23b), and a second NUMA node (24) constituted by a second processor (24a) and a second memory (24b). The capture unit (21) has a first capture unit (21a) for capturing and storing the packets into the first memory (23b), and a second capture unit (21b) for capturing and storing the packets into the second memory (24b).

Classes IPC  ?

  • H04L 12/70 - Systèmes de commutation par paquets

14.

Radiated emission measurement method and radiated emission measurement system

      
Numéro d'application 16467791
Numéro de brevet 11175327
Statut Délivré - en vigueur
Date de dépôt 2018-04-20
Date de la première publication 2021-10-21
Date d'octroi 2021-11-16
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Nakamura, Tetsuya
  • Tsuboi, Naoki

Abrégé

A radiated emission measurement method includes a prescan measurement step of performing broadband measurement including detection of a peak and detection of a quasi-peak by one fast Fourier transform in a target measurement frequency range; a calculation step of calculating a difference in level between the peak and the quasi-peak obtained for a measurement frequency to be a candidate for a result of measurement; a determination step of determining whether the obtained difference is less than a reference value; and an output step of outputting a result obtained as an interference level of the radiated emission in the broadband measurement when it is determined that the difference is less than reference value, and performing narrowband measurement and outputting the obtained result as the interference level of the radiated emission, when it is determined that the difference is equal to or higher than the reference value.

Classes IPC  ?

  • G01R 31/00 - Dispositions pour tester les propriétés électriquesDispositions pour la localisation des pannes électriquesDispositions pour tests électriques caractérisées par ce qui est testé, non prévues ailleurs
  • G01R 23/16 - Analyse de spectreAnalyse de Fourier

15.

Spectrum analysis method and spectrum analysis apparatus

      
Numéro d'application 16468908
Numéro de brevet 11268857
Statut Délivré - en vigueur
Date de dépôt 2018-05-25
Date de la première publication 2021-10-21
Date d'octroi 2022-03-08
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Nakamura, Tetsuya
  • Tsuboi, Naoki

Abrégé

Provided is a spectrum analysis method including: accumulating n spectrums obtained by consecutively fast Fourier transforming an input signal n times; receiving a threshold; identifying, in the n spectrums accumulated in the accumulating, frequently occurring data that includes data whose number of occurrences exceeds the threshold received in the receiving, the number of occurrences being defined as a total number of items of data at a same frequency point that indicate levels that are close to each other, to within a predetermined range; selecting a maximum level at each of the frequency points from among only the identified frequently occurring data; and outputting a spectrum indicating the maximum levels selected at the frequency points.

Classes IPC  ?

16.

RELATED INTERFERENCE WAVE PRESENTATION DEVICE AND METHOD

      
Numéro d'application JP2019026223
Numéro de publication 2021/001915
Statut Délivré - en vigueur
Date de dépôt 2019-07-02
Date de publication 2021-01-07
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Suetsugu Kentaro
  • Li Congbing
  • Nakamura Tetsuya

Abrégé

[Problem] To reduce the work involved in identifying the cause of an interference wave. [Solution] Provided is a related interference wave presentation device comprising: a class identifying unit for using a learned model, which has been generated through machine learning using sample data including interference waves and is for identifying the class that an interference wave belongs to on the basis of feature values of the interference wave, to identify the class of a reference interference wave that is an interference wave being referenced; a related interference wave information generation unit for searching through the sample data on the basis of the class that the reference interference wave belongs to and generating related interference wave information that is information about related interference waves; and a presentation control unit for carrying out control for presenting some or all of the related interference wave information.

Classes IPC  ?

  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique

17.

Measuring container, measuring system and measuring method

      
Numéro d'application 16934802
Numéro de brevet 11994487
Statut Délivré - en vigueur
Date de dépôt 2020-07-21
Date de la première publication 2020-11-05
Date d'octroi 2024-05-28
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Inoue, Masaru
  • Oyabu, Noriaki

Abrégé

A measuring container for measurement of impurity ions in a liquid includes: a first electrode; a first insulation film formed on the first electrode; a second insulation film formed apart from the first insulation film to create a space into which the liquid is to be sealed; a second electrode on which the second insulation film is formed, the second electrode being arranged to face the first electrode; and a seal material having an inlet through which the liquid is injected into the space, the seal material being configured to seal the space.

Classes IPC  ?

  • G01R 27/26 - Mesure de l'inductance ou de la capacitanceMesure du facteur de qualité, p. ex. en utilisant la méthode par résonanceMesure de facteur de pertesMesure des constantes diélectriques
  • G01N 27/04 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance
  • G01N 27/06 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la résistance d'un liquide
  • G01N 27/22 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance en recherchant la capacité
  • G01R 31/312 - Test sans contact par des méthodes capacitives
  • G01D 5/24 - Moyens mécaniques pour le transfert de la grandeur de sortie d'un organe sensibleMoyens pour convertir la grandeur de sortie d'un organe sensible en une autre variable, lorsque la forme ou la nature de l'organe sensible n'imposent pas un moyen de conversion déterminéTransducteurs non spécialement adaptés à une variable particulière utilisant des moyens électriques ou magnétiques influençant la valeur d'un courant ou d'une tension en faisant varier la capacité
  • G01D 5/241 - Moyens mécaniques pour le transfert de la grandeur de sortie d'un organe sensibleMoyens pour convertir la grandeur de sortie d'un organe sensible en une autre variable, lorsque la forme ou la nature de l'organe sensible n'imposent pas un moyen de conversion déterminéTransducteurs non spécialement adaptés à une variable particulière utilisant des moyens électriques ou magnétiques influençant la valeur d'un courant ou d'une tension en faisant varier la capacité par mouvement relatif d'électrodes de condensateur

18.

Dynamometer load device

      
Numéro d'application 16475919
Numéro de brevet 10564058
Statut Délivré - en vigueur
Date de dépôt 2017-06-08
Date de la première publication 2019-12-19
Date d'octroi 2020-02-18
Propriétaire TOYO Corporartion (Japon)
Inventeur(s)
  • Kiuchi, Takeo
  • Kimura, Takashi

Abrégé

A dynamometer load device applies a load to a dynamometer unit that is connected to a hub of a wheel of a motor vehicle and being movable. The dynamometer load device applies, in conjunction with steering of the motor vehicle, a load to the dynamometer unit turning along with the hub. The load is applied in a direction opposite to a turning direction of the dynamometer unit.

Classes IPC  ?

  • G01L 3/24 - Dispositifs pour déterminer la valeur de la puissance, p. ex. en mesurant et en multipliant simultanément les valeurs du couple par le nombre de tours par unité de temps, en multipliant les valeurs de la force de traction ou propulsive par la vitesse
  • G01L 3/16 - Dynamomètres d'absorption rotatifs, p. ex. du type frein
  • B60W 50/04 - Détails des systèmes d'aide à la conduite des véhicules routiers qui ne sont pas liés à la commande d'un sous-ensemble particulier pour surveiller le fonctionnement du système d'aide à la conduite
  • B60W 50/00 - Détails des systèmes d'aide à la conduite des véhicules routiers qui ne sont pas liés à la commande d'un sous-ensemble particulier
  • G01M 17/00 - Test des véhicules
  • G01M 15/02 - Détails ou accessoires pour appareils de test

19.

Data writing device and method

      
Numéro d'application 16331315
Numéro de brevet 10585622
Statut Délivré - en vigueur
Date de dépôt 2017-12-04
Date de la première publication 2019-12-05
Date d'octroi 2020-03-10
Propriétaire TOYO Corporation (Japon)
Inventeur(s)
  • Saitoh, Yoshiyuki
  • Luo, Chunshan

Abrégé

A data writing device includes secondary storages, an interface circuit which obtains data, and a computer apparatus which writes the data obtained in one of the secondary storages. The computer apparatus includes writing processes corresponding to the secondary storages as an application, respectively; a monitoring process which detects quantities of data whose writing is finished in the secondary storages; and a data distribution process which selects a secondary storage as a target for next writing based on requested data quantities of the secondary storages and the finished data quantities thereof, and instructs a writing process corresponding to the secondary storage as a target for next writing to write.

Classes IPC  ?

  • G06F 12/00 - Accès à, adressage ou affectation dans des systèmes ou des architectures de mémoires
  • G06F 3/06 - Entrée numérique à partir de, ou sortie numérique vers des supports d'enregistrement

20.

SPECTRUM ANALYSIS METHOD AND DEVICE THEREFOR

      
Numéro d'application JP2018020198
Numéro de publication 2019/225014
Statut Délivré - en vigueur
Date de dépôt 2018-05-25
Date de publication 2019-11-28
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Nakamura, Tetsuya
  • Tsuboi, Naoki

Abrégé

This spectrum analysis method includes: an accumulation step (S10) for accumulating n spectra obtained by consecutively repeating a fast Fourier transform (FFT) n times on an input signal; a receiving step (S11) for receiving a threshold; a filtering step (S12) for specifying high frequency data that includes data, an occurrence frequency of which exceeds the threshold, when the number of pieces of data, which represent nearer levels within a prescribed range at the same frequency point among the accumulated n spectra, is taken as the occurrence frequency; a max hold step (S13) in which only specified high frequency data is taken as a target and a maximum level is selected for each frequency point; and an output step (S14) for outputting a spectrum that represents the selected level for each frequency point.

Classes IPC  ?

  • G01R 23/16 - Analyse de spectreAnalyse de Fourier

21.

RADIATION INTERFERENCE WAVE MEASUREMENT METHOD AND RADIATION INTERFERENCE WAVE MEASUREMENT SYSTEM

      
Numéro d'application JP2018016285
Numéro de publication 2019/202732
Statut Délivré - en vigueur
Date de dépôt 2018-04-20
Date de publication 2019-10-24
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Nakamura, Tetsuya
  • Tsuboi, Naoki

Abrégé

This radiation interference wave measurement method includes: a provisional measurement step (S21) for carrying out broadband measurement which includes peak value detection and a quasi-peak value detection by targeting a measurement frequency range through high-speed Fourier transform executed once by an EMI receiver (16); a calculation step (S22) for calculating the difference between an acquired peak value level and an acquired quasi-peak value level regarding a measurement frequency which becomes a measurement result candidate; a determination step (S23) for determining whether the calculated difference is lower than a predetermined reference value corresponding to the measurement frequency; and an output step in which when it is determined that the difference is lower than the reference value, the result of the broadband measurement is outputted as the interference level of a radiation interference wave (S24), whereas when it is determined that the difference is not less than the reference value, narrow band measurement which is based on the high-speed Fourier transform executed by the EMI receiver (16) is carried out by targeting the measurement frequency within a frequency range narrower than the measurement frequency range, and the acquired result is outputted as the interference level of the radiation interference wave(S25).

Classes IPC  ?

  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique
  • G01R 23/16 - Analyse de spectreAnalyse de Fourier
  • G01R 23/173 - Dispositifs wobbulateurs du genre des récepteurs panoramiques à balayage

22.

MEASUREMENT INSTRUMENT, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD

      
Numéro d'application JP2018007599
Numéro de publication 2019/167186
Statut Délivré - en vigueur
Date de dépôt 2018-02-28
Date de publication 2019-09-06
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Inoue, Masaru
  • Oyabu, Noriaki

Abrégé

A measurement device (1) for measuring impurity ions in a liquid is provided with a first electrode (4), a first insulating film (6) formed on the first electrode (4), a second insulating film (7) disposed apart from the first insulating film (6) so as to form a space in which a liquid (9) is enclosed, a second electrode (5) on which a second insulating film (7) is formed and which is disposed so as to face the first electrode (4), and a seal material (8) which has an injection port for injecting the liquid (9) into the space and which is configured so as to seal the space.

Classes IPC  ?

  • G01N 27/00 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques

23.

DATA WRITING DEVICE AND METHOD

      
Numéro d'application JP2017043533
Numéro de publication 2019/111303
Statut Délivré - en vigueur
Date de dépôt 2017-12-04
Date de publication 2019-06-13
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Saitoh, Yoshiyuki
  • Luo, Chunshan

Abrégé

A data writing device (10) is provided with secondary storage devices (20a to 20c), an interface circuit (30) that acquires data, and a computer device (40) that writes the acquired data to one of the secondary storage devices (20a to 20c). The computer device (40) includes, as an application (50): write processes (51a to 51c) associated with the secondary storage devices (20a to 20c), respectively; a monitoring process (53) which detects the amount of data that has been written to each of the secondary storage devices (20a to 20c); and a data distribution process (52) which selects the next secondary storage device to be written to, on the basis of a requested amount of data to be written to each of the secondary storage devices (20a to 20c) and the amount of data that has been written to each of the secondary storage devices (20a to 20c), wherein the data distribution process (52) instructs the write process associated with the selected secondary storage device to write to that secondary storage device.

Classes IPC  ?

  • G06F 3/06 - Entrée numérique à partir de, ou sortie numérique vers des supports d'enregistrement

24.

PROBE

      
Numéro d'application JP2017038026
Numéro de publication 2019/077743
Statut Délivré - en vigueur
Date de dépôt 2017-10-20
Date de publication 2019-04-25
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Yamaguchi, Masaki
  • Kitahara, Tadashi

Abrégé

A probe (100) for measuring electrical impedance of a specimen (10) is provided with: a shield conductor (101) as a hollow-structured first electrode having a closed space (104) for housing the specimen (10); and a center conductor (106) as a second electrode, which extends in the closed space (104), and which is insulated from the shield conductor (101). The center conductor (106) extends by having a gap between a wall section of the shield conductor (101) and the center conductor, and has the specimen (10) between the wall section and the shield conductor, and the closed space (104) is in a vacuum state or filled with an inert gas (110).

Classes IPC  ?

  • G01R 27/02 - Mesure de résistances, de réactances, d'impédances réelles ou complexes, ou autres caractéristiques bipolaires qui en dérivent, p. ex. constante de temps
  • G01N 27/02 - Recherche ou analyse des matériaux par l'emploi de moyens électriques, électrochimiques ou magnétiques en recherchant l'impédance

25.

RADIATION INTERFERENCE WAVE MEASUREMENT METHOD AND RADIATION INTERFERENCE WAVE MEASUREMENT SYSTEM

      
Numéro d'application JP2017031372
Numéro de publication 2019/043874
Statut Délivré - en vigueur
Date de dépôt 2017-08-31
Date de publication 2019-03-07
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Kohno, Toshiya
  • Nakamura, Tetsuya
  • Tsuboi, Naoki

Abrégé

This radiation interference measurement method takes a measurement frequency range as a target range and measures a radiation interference wave from a subject to be measured (12) which is placed on a turn table (11) through an antenna (14) ascendably and descendably mounted on an antenna mast (13). The radiation interference measurement method includes: location control steps (S10, S12, S16, S17) for controlling ascending and descending of the antenna (14) on the antenna mast (13), and for controlling turning of the subject to be measured (12) by the turn table (11); and Fast Fourier transform measurement steps (S11 to S15) for dividing the measurement frequency range in a Fast Fourier transform bandwidth, when a bandwidth of a frequency range that is to be subjected to one time Fast Fourier transform is taken as the Fast Fourier transform bandwidth, and for executing a measurement in a Fast Fourier transform scheme in which a radiation interference wave received by the antenna (14) is Fast-Fourier-transformed, while sequentially moving a plurality of the frequency ranges after the division.

Classes IPC  ?

  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique
  • G01R 23/16 - Analyse de spectreAnalyse de Fourier

26.

DYNAMOMETER LOAD DEVICE

      
Numéro d'application JP2017021403
Numéro de publication 2018/225233
Statut Délivré - en vigueur
Date de dépôt 2017-06-08
Date de publication 2018-12-13
Propriétaire TOYO CORPORATION (Japon)
Inventeur(s)
  • Kiuchi, Takeo
  • Kimura, Takashi

Abrégé

This dynamometer load device (100) applies a load to a movable dynamometer unit (20a) which is connected to a hub (2) of a wheel of an automobile (1). The dynamometer load device (100) applies, to the dynamometer unit (20a), a load in the opposite direction from the turning direction of the dynamometer unit (20a), which turns together with the hub (2) in conjunction with the steering of a steering wheel of the automobile (1).

Classes IPC  ?

  • G01L 3/24 - Dispositifs pour déterminer la valeur de la puissance, p. ex. en mesurant et en multipliant simultanément les valeurs du couple par le nombre de tours par unité de temps, en multipliant les valeurs de la force de traction ou propulsive par la vitesse
  • G01M 17/007 - Véhicules à roues ou à chenilles

27.

T TOYO Corporation

      
Numéro d'application 1310309
Statut Enregistrée
Date de dépôt 2016-05-11
Date d'enregistrement 2016-05-11
Propriétaire TOYO Corporation (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 10 - Appareils et instruments médicaux
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Laboratory apparatus and instruments; measuring or testing machines and instruments; power distribution or control machines and apparatus; electric or magnetic meters and testers; optical machines and apparatus; telecommunication machines and apparatus; electronic machines, apparatus and their parts. Medical apparatus and instruments. Computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; rental of measuring apparatus; rental of computers; providing computer programs on data networks; rental of laboratory apparatus and instruments.

28.

Quest for Precision

      
Numéro d'application 1310310
Statut Enregistrée
Date de dépôt 2016-05-11
Date d'enregistrement 2016-05-11
Propriétaire TOYO Corporation (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 10 - Appareils et instruments médicaux
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Laboratory apparatus and instruments; measuring or testing machines and instruments; power distribution or control machines and apparatus; electric or magnetic meters and testers; optical machines and apparatus; telecommunication machines and apparatus; electronic machines, apparatus and their parts. Medical apparatus and instruments. Computer software design, computer programming, or maintenance of computer software; technological advice relating to computers, automobiles and industrial machines; rental of measuring apparatus; rental of computers; providing computer programs on data networks; rental of laboratory apparatus and instruments.

29.

T TOYO CORPORATION

      
Numéro de série 79192256
Statut Enregistrée
Date de dépôt 2016-05-11
Date d'enregistrement 2018-06-19
Propriétaire TOYO Corporation (Japon)
Classes de Nice  ?
  • 09 - Appareils et instruments scientifiques et électriques
  • 10 - Appareils et instruments médicaux
  • 42 - Services scientifiques, technologiques et industriels, recherche et conception

Produits et services

Measuring or testing machines and instruments, namely, communication link testers for testing communication links in internet protocol networks and high speed optical networks; communication link testers for testing communication links of mobile telecommunication and terminals; [ electronic monitors and monitor modules for monitoring electric current and electrical signals; measuring devices for assessment of vulnerability of telecommunication machines and apparatus; analyzers for testing communication links of wireless LAN (local area network); simulators for global positioning system (GPS) apparatus; scanners for vulnerability of communication links in networks; accelerometers; electrical sensor apparatus for sensing pressure and force; electronic devices and apparatus for telemetry, namely, torque, voltage and temperature telemeter; microphones; electrical sensor apparatus for sensing particle velocity; electronic devices and apparatus, namely, Fast Fourier Transform (FFT) analyzer for analysis of noise and vibration; meters for torque analysis; robots for testing of drives; ] dynamometers; [ electronic systems comprised primarily of electrical load and gas control system for evaluation of fuel cells; measuring systems comprised primarily of voltage/current source meter and impedance measurement equipment for electrochemical analyses; electronic systems comprised primarily of voltage/current meter, impedance measurement, temperature and magnetic field control system for evaluation of semiconductor material; ] electronic systems comprised primarily of current/voltage amplifier, arbitrary waveform generator, A/D convertor, temperature controller and personal computer for testing liquid crystal display panels; [ electronic systems comprised primarily of measurement technology hardware for magnetometers, vibrating sample magnetometers and alternating gradient magnetometers for measuring magnetic material and magnetic field; ] electronic systems and equipment comprised primarily of Radio Frequency (RF) power amplifier, signal generator, power meter/power sensor, antenna for Electromagnetic Susceptibility (EMS) Measurement, Line Impedance Stabilization Network (LISN), Coupling Decoupling Networks (CDN), Radio Frequency (RF) Electric Field Probe, immunity measurement software for measuring electromagnetic compatibility; [ electronic systems comprised primarily of Electrostatic Discharge (ESD) Simulators, Fast Transient Burst Simulator, Lightning Surge Simulator, Voltage Dip and Swell Simulator for testing electrostatic burst or surge by electrostatic discharge or electrical fast transient; electrical sensor apparatus for sensing electric or magnetic field; ] electronic systems comprised primarily of Electromagnetic Interference (EMI) test receiver, RF selector, antenna for EMI measurement, measurement software, LISN (Line Impedance Stabilization Networks), ISN (Impedance Stabilization Networks) for testing electromagnetic interference; antenna parameter measuring apparatus; electronic systems comprised primarily of spectrum analyzer, network analyzer, microwave amplifier, log-periodic antenna, ridged guide horn antenna, precision dipole antenna, dipole antennas, antenna pattern measurement software for measuring wireless performance [ ; electronic systems comprised primarily of voltage amplifier, current/electric charge converter, arbitrary waveform generator, A/D converter, temperature controller and personal computer for measuring elastic modulus; electronic systems comprised primarily of amplifier, and data logging system comprised primarily of measurement technology computer hardware for capturing dynamic data, and computer software and sensors for measuring ferroelectric and piezoelectric material; Optical machines and apparatus, namely, microscopes; scanning electron microscopes; scanning probe microscope and their parts; 3D scanners, and infrared surveillance cameras; Telecommunication machines and apparatus, namely, underwater electronic communications systems comprised of computer hardware and software for the transmission of data between two points; antennas; parabolic antennas; filters for antennas and diplexers; Electronic machines, apparatus and their parts, namely, echo sounders; seismic exploration machines and apparatus; sonars; inertial measurement unit; hydrophones; electrical transducer; sensors for oceanographic survey; printed circuit boards and their parts; amplifiers; frequency converters; isolators and circulators in the nature of electronic components ] [ Medical apparatus and instruments, namely, medical devices and apparatus for digital radiography; digital photograph viewers for mammography; surgical apparatus and instruments for use in orthopedic surgery; digital flat panel detectors for medical use; medical devices and apparatus for image acquisition; electronic display boards for medical use; software development kits (SDK) of 3D digital photograph viewers for medical use; medical devices and apparatus for image display ] Technological advice relating to computers, automobiles and industrial machines; Rental of measuring apparatus; Providing on-line non-downloadable computer software programs for [ software configuration management, tracking system, analyzing computer software, testing computer software, life cycle management, management of security risk, analyzing software vulnerability, computer software development, ] measuring electromagnetic compatibility [ , hydrographic survey, 4D simulation, processing digital images or X-ray Images, analysis of data collected for measurement purposes ] ; Rental of laboratory apparatus and instruments

30.

DISTRIBUTED SURVEY SYSTEM FOR OBTAINING UNDERGROUND ELECTRICAL CHARACTERISTICS AND DISTRIBUTED SURVEY METHOD USING SAME

      
Numéro d'application JP2014000574
Numéro de publication 2014/125787
Statut Délivré - en vigueur
Date de dépôt 2014-02-04
Date de publication 2014-08-21
Propriétaire
  • OYO CORPORATION (Japon)
  • B.R.G.M. - BUREAU DE RECHERCHES GEOLOGIQUES ET MINIERES (France)
Inventeur(s)
  • Yamashita, Yoshihiro
  • Shima, Hiromasa
  • Sano, Kou

Abrégé

A distributed survey system for obtaining underground electrical characteristics and a distributed survey method using said distributed survey system are provided, said distributed survey system being capable of flexibly accommodating different survey purposes, survey-region geographical conditions, and the like and thus being capable of obtaining underground electrical characteristics over a shorter time frame and more efficiently than existing technologies. In the present invention, a plurality of survey units (1, 2, 3, …, (N−1), N) are distributed across a region in which underground electrical characteristics are to be obtained. Each of said survey units is provided with one or both of the following: one or more current-supply points (TX) and a current-supplying means for supplying current thereto underground; and/or one or more measurement points (RX) and a measuring means for measuring response signals from the measurement point(s) (RX) in response to the aforementioned current. A synchronization control means is provided in each survey unit. Said synchronization control means synchronize the operations of the current-supplying means and measuring means between survey units, supply currents from the plurality of current-supply points (TX) using waveforms encoded so as to yield a covariance of zero, and make the measuring means measure the response signals in response to said currents.

Classes IPC  ?

  • G01V 3/02 - Prospection ou détection électrique ou magnétiqueMesure des caractéristiques du champ magnétique de la terre, p. ex. de la déclinaison ou de la déviation fonctionnant par propagation de courant électrique

31.

SUBSURFACE EXPLORATION METHOD AND SUBSURFACE EXPLORATION APPARATUS

      
Numéro d'application JP2013006975
Numéro de publication 2014/097552
Statut Délivré - en vigueur
Date de dépôt 2013-11-27
Date de publication 2014-06-26
Propriétaire OYO CORPORATION (Japon)
Inventeur(s) Sawada, Shun-Ichi

Abrégé

Provided are a subsurface exploration method and apparatus whereby physical characteristics such as the dynamic strength (penetration resistance value) of the subsurface at test depth and the soil quality distinction at each depth can be easily evaluated, and liquefaction strength at any point can be easily measured. According to the present invention, there is provided a subsurface exploration method for exploring the subsurface (t) by driving in a rod (3) having a removable penetrating member (2) at the tip (3a), and causing the penetrating member (2) to penetrate the subsurface (t) in a depth direction. By causing the penetrating member (2) to penetrate the subsurface (t), the amount of penetrating displacement of the penetrating member (2) is measured, the penetration resistance value of the subsurface depth is analyzed from the obtained amount of penetrating displacement, and after the penetrating member (2) penetrates down to a subsurface depth that has been set in advance, the amount of withdraw displacement and a withdraw resistance value are measured by withdrawing the rod (3), physical characteristics including at least a soil quality distinction are analyzed from the obtained measured values and the penetration resistance value, and the liquefaction strength of the subsurface is analyzed from the obtained physical characteristics and the penetration resistance value.

Classes IPC  ?

  • E02D 1/02 - Étude des sols de fondation sur place avant les travaux de construction

32.

Communication system

      
Numéro d'application 14129152
Numéro de brevet 11146941
Statut Délivré - en vigueur
Date de dépôt 2012-07-02
Date de la première publication 2014-05-22
Date d'octroi 2021-10-12
Propriétaire TOKYO CORPORATION (Japon)
Inventeur(s)
  • Sharma, Vivek
  • Awad, Yassin Aden

Abrégé

A communication system is presented in which a base station operates a first cell using a first component carrier and a second cell using a second component carrier. A control channel and reference signals of a first type are provided using the first component carrier. The control channel and the reference signals of the first type are not provided, and reference signals of a second type are provided, using the second component carrier. The base station determines from results of measurements performed on reference signals of the second type whether or not the mobile communication device is within an area covered by said second cell and, if it is, transmits cell configuration information to the mobile communication device.

Classes IPC  ?

  • H04W 8/06 - Enregistrement dans un registre de localisation de réseau-serveur, un VLR ou un serveur de mobilité des utilisateurs
  • H04W 88/06 - Dispositifs terminaux adapté au fonctionnement dans des réseaux multiples, p. ex. terminaux multi-mode
  • H04L 5/00 - Dispositions destinées à permettre l'usage multiple de la voie de transmission

33.

METHOD OF MEASURING PHYSICAL PROPERTY OF TFT LIQUID CRYSTAL PANEL, AND DEVICE FOR MEASURING PHYSICAL PROPERTY OF TFT LIQUID CRYSTAL PANEL

      
Numéro d'application JP2008050449
Numéro de publication 2008/090786
Statut Délivré - en vigueur
Date de dépôt 2008-01-16
Date de publication 2008-07-31
Propriétaire
  • TOYO Corporation (Japon)
  • Sharp Kabushiki Kaisha (Japon)
Inventeur(s)
  • Inoue, Masaru
  • Sasaki, Kunihiko
  • Kurihara, Takashi
  • Kume, Yasuhiro

Abrégé

A method of measuring physical property of a TFT liquid crystal panel (4, 400) is comprised of an impedance value setting step (step S1, Step S11, Step S12) for setting an impedance value between the source electrode (42A, 420A)-the drain electrode (43A, 430A) of a TFT (4A, 400A) in the TFT liquid crystal panel (4, 400), a voltage applying step (step S2, step S13) for applying periodically changing voltages to a liquid crystal layer (4B, 400B) in the TFT liquid crystal panel (4, 400), and a property measuring step (step S3, step S4, step S14, step S15) for measuring transient electric currents flowing through the liquid crystal layer (4B, 400B) to which the periodically changing voltages are applied in the voltage applying step (step S2, step S13) to measure the property of the liquid crystal layer (4B, 400B).

Classes IPC  ?

  • G02F 1/1368 - Cellules à adressage par une matrice active dans lesquelles l'élément de commutation est un dispositif à trois électrodes
  • G02F 1/13 - Dispositifs ou dispositions pour la commande de l'intensité, de la couleur, de la phase, de la polarisation ou de la direction de la lumière arrivant d'une source lumineuse indépendante, p. ex. commutation, ouverture de porte ou modulationOptique non linéaire pour la commande de l'intensité, de la phase, de la polarisation ou de la couleur basés sur des cristaux liquides, p. ex. cellules d'affichage individuelles à cristaux liquides