NuFlare Technology, Inc.

Japan


Create a watch for NuFlare Technology, Inc.
Total IP 871
Total IP Rank # 1,543
IP Activity Score 3.4/5.0    443
IP Activity Rank # 1,582
Dominant Nice Class Machines and machine tools

Patents

Trademarks

749 7
0 3
100 10
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Last Patent 2025 - Multiple charged particle beam w...
First Patent 1988 - Pattern drawing apparatus using ...
Last Trademark 2025 - NuFlare Technology
First Trademark 2003 - NUFLARE

Industry (Nice Classification)

Latest Inventions, Goods, Services

2025 G/S Photomask writing machines and tools for semiconductors; metalworking machines and tools; semico...
Invention Electron beam mask inspection apparatus. According to one aspect of the present invention, an el...
Invention Position measurement apparatus, charged particle beam writing apparatus, and mark position measur...
Invention Multi-beam image acquisition apparatus and drift correction method for multiple secondary electro...
Invention Inspection apparatus and inspection method. According to an embodiment, an inspection apparatus ...
Invention Multiple charged-particle beam writing method and multiple charged-particle beam writing apparatu...
Invention Multi charged particle beam irradiation apparatus and adjusting method thereof. In one embodimen...
Invention Multiple charged particle beam writing method, multiple charged particle beam writing apparatus, ...
Invention Pattern inspection device and pattern inspection method. A pattern inspection device according to...
Invention Electron beam image acquisition device and electron beam image acquisition method. An electron be...
Invention Vapor phase growth apparatus and vapor phase growth method. A vapor phase growth apparatus accor...
Invention Charged particle beam writing apparatus, shot data correction method and charged particle beam wr...
Invention Electron gun and electron beam writing apparatus. An electron gun includes a cathode to emit ele...
Invention Multiple-beam image acquisition apparatus and multiple-beam image acquisition method. A multiple...
Invention Multi-electron beam image acquisition apparatus, multi-electron beam image acquisition method, el...
Invention Photoelectron source, multi-photoelectron source and multi-beam irradiation apparatus. In one em...
2024 Invention Method for generating writing data, writing data generation apparatus, method of charged-particle...
Invention Vapor phase growth apparatus. A vapor phase growth apparatus according to an embodiment includes...
Invention Rectification plate, film formation device, and evaluation method for same. According to the embo...
Invention Holder and vapor phase growth apparatus. A holder according to an embodiment includes a portion ...
Invention Mark position measuring device and mark position measuring method. This mark position measuring d...
Invention Multiple charged particle beam writing apparatus and multiple charged particle beam writing metho...
Invention Multiple charged particle beam writing method and multiple charged particle beam writing apparatu...
Invention Method of adjusting charged particle beam writing apparatus, charged particle beam writing appara...
Invention Method for adjusting deflection position of charged particle beam drawing, and charged particle b...
Invention Electromagnetic lens, scanning electron microscope, and multi-electron beam inspection apparatus....
Invention Pattern inspection device, focal point position adjustment method, and pattern inspection method....
Invention Method for calculating effective temperature of multi-charged particle beam writing region, multi...
Invention Multi-beam writing method and multi-beam writing apparatus. In one embodiment, a multi-beam writ...
Invention Electronic component and charged particle beam irradiation apparatus. An electronic component of...
Invention Charged particle beam drawing device, drift amount calculation method, and charged particle beam ...
Invention Method for diagnosing abnormality of blanking aperture array substrate and multi-beam drawing met...
Invention Semiconductor wafer heater
Invention Electronic component and charged particle beam irradiation apparatus. An electronic component ac...
2023 Invention Effective temperature calculation method for multi–charged particle beam drawing area, multi–char...
Invention Method for calculating effective temperature of multi-charged particle beam drawing area, multi-c...
Invention Susceptor unit
Invention Susceptor cover
Invention Cover base for susceptors
Invention Susceptor
2017 G/S Multiple electron beams mask writers used for manufacturing semiconductors
G/S Multiple electron beams mask writers used for manufacturing semiconductors.
2016 G/S Measuring and testing machines and instruments; optical inspection apparatus for industrial use;...
G/S Instruction relating to operation and design of semiconductor manufacturing machines and systems
G/S Application software relating to maintenance manual for semiconductor manufacturing machines and...
2015 G/S Semiconductor making machines. Repair and maintenance of semiconductor manufacturing machines and...
2014 G/S Semiconductor manufacturing machines and systems Repair and maintenance of semiconductor manufact...
G/S Semiconductor manufacturing machines and systems. Repair and maintenance of semiconductor manufac...
G/S Equipment for depositing on semiconductor wafers; equipment for performing epitaxial growth on se...
G/S Apparatus for depositing on semiconductor wafers; apparatus for performing epitaxial growth on se...
G/S Apparatus for depositing on semiconductor wafers; apparatus for performing epitaxial growth on s...
2007 G/S Semiconductor manufacturing machines Repair and maintenance of semiconductor manufacturing machin...
2003 G/S SEMI-CONDUCTOR MANUFACTURING APPARATUS, NAMELY, ELECTRON BEAM EXPOSURE MACHINES, EPITAXIAL REACTO...