Verigy (Singapore) Pte. Ltd.

Singapore

Create a watch for Verigy (Singapore) Pte. Ltd.
Total IP 55
Total IP Rank # 25,470
IP Activity Score 0/5.0    0
IP Activity Rank # 1,707,690

Patents

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Last Patent 2011 - Adjustable gain amplifier, autom...
First Patent 1986 - Circuit for measuring characteri...

Latest Inventions, Goods, Services

2009 Invention Test electronics to device under test interfaces, and methods and apparatus using same. In one em...
Invention Apparatus and method for wireless testing of a plurality of transmit paths and a plurality of rec...
Invention Adjustable gain amplifier, automated test equipment and method for adjusting a gain of an amplifi...
Invention Methods, apparatus and articles of manufacture for testing a plurality of singulated die. In one ...
Invention Optimized automated test equipment multi-path receiver concept. A multi-path receiver (300) for a...
Invention Apparatus, method and computer program for providing a modulated bit stream in dependence on a mo...
Invention Apparatus and method for combining electrical or electronic components; apparatus and method for ...
Invention Clamp with a non-linear biasing member. In an embodiment, there is disclosed a clamp, having a ho...
Invention A transmit/receive unit, and methods and apparatus for transmitting signals between transmit/rece...
Invention Methods and apparatus that selectively use or bypass a remote pin electronics block to test at le...
Invention Parallel test circuit with active devices. In accordance with one embodiment of the invention, a ...
2008 Invention Apparatus for determining a compensation parameter for compensating a signal level change of a te...
Invention Method and apparatus for determining relevance values for a detection of a fault on a chip and fo...
Invention Apparatus for determining a position in a bit sequence. An apparatus for determining a position i...
Invention Re-configurable test circuit, method for operating an automated test equipment, apparatus, method...
Invention Methods for analyzing scan chains, and for determining numbers or locations of hold time faults i...
Invention Test arrangement, pogo-pin and method for testing a device under test. A test arrangement (400) c...
Invention Apparatus and method for emulating a full-rate finite state machine. A method for processing a fu...
Invention State machine and generator for generating a description of a state machine feedback function. An...
Invention Signal distribution structure and method for distributing a signal. A signal distribution structu...
Invention A data processing unit and a method of processing data. A data processing unit comprises a time i...
Invention Method of sharing a test resource at a plurality of test sites, automated test equipment, handler...
Invention Test system for testing a signal path and method for testing a signal path. A test system (100) f...
Invention Error catch ram support using fan-out/fan-in matrix. In accordance with one embodiment of the inv...
Invention Wafer boat for semiconductor testing. In accordance with one embodiment of the invention, a metho...
Invention Method and apparatus for determining a minimum/maximum of a plurality of binary values. For deter...
Invention A high current transmission line and a method for transmitting high currents. A high current tran...
Invention Apparatus and method for estimating data relating to a time difference and apparatus and method f...
Invention Manipulator for positioning a test head. A manipulator for positioning a test head has a manipula...
Invention Resource allocation in a distributed system. A distributed system has a plurality of nodes and a ...
Invention Method and apparatus for the determination of a repetitive bit value pattern. A repetitive bit va...
Invention Method and apparatus for singulated die testing. In accordance with one embodiment of the inventi...
Invention Clamp with a non-linear biasing member. In an embodiment, there is disclosed a clamp, having a h...
Invention System, method and computer program for detecting an electrostatic discharge event. A system (100...
2007 Invention System and method for electronic testing of devices. A coupler and associated method electronica...
Invention Chip tester, method for providing timing information, test fixture set, apparatus for post-proces...
Invention Chip tester, chip test system, chip test setup, method for identifying an open-line failure and c...
Invention License management tool to monitor and analyze license usage to determine need for additional lic...
Invention Methods and apparatus for displaying a dynamically updated set of test data items derived from vo...
Invention Method and apparatus for selecting and displaying a number of test data items. In one embodiment...
Invention Method and apparatus for displaying sorted test data entries. In one embodiment, a plurality of ...
Invention Methods and apparatus for dynamically updating a graphical user interface, to focus on a producti...
Invention Methods and apparatus for compiling and displaying test data items. In one embodiment, different...
Invention Method and apparatus for displaying test data. In one embodiment, a plurality of test data entri...
Invention Methods and apparatus that enable a viewer to distinguish different test data entries and test da...
Invention Methods and apparatus for displaying test results and alerts. In one embodiment, a sequence of t...
Invention Methods and apparatus for displaying production and debug test data. In one embodiment, a comput...
Invention Method and apparatus for displaying pin result data. In one embodiment, a plurality of test data...
Invention Apparatus, method and computer program for obtaining a time-domain-reflection response-informatio...