Abstract

b) of the measured object (2). Hereby, the THz-Receiver (14) may also transmit temporarily, in particular alternatingly. The user can adjust the measuring apparatus, whereby the position can be determined by an accelerometer (18) and temporal integration so as to obtain further measuring data.

IPC Classes  ?

• G01N 21/88 - Investigating the presence of flaws, defects or contamination
• G01N 21/3581 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared lightInvestigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using Terahertz radiation

Abstract

subsequently the control and evaluation device determines layer thicknesses between the boundary surfaces from the virtual model.

IPC Classes  ?

• G01B 15/02 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring thickness
• G01B 15/04 - Measuring arrangements characterised by the use of electromagnetic waves or particle radiation, e.g. by the use of microwaves, X-rays, gamma rays or electrons for measuring contours or curvatures
• G01S 13/26 - Systems for measuring distance only using transmission of interrupted, pulse modulated waves wherein the transmitted pulses use a frequency- or phase-modulated carrier wave
• G01S 13/90 - Radar or analogous systems, specially adapted for specific applications for mapping or imaging using synthetic aperture techniques
• G01S 3/26 - Systems for determining direction or deviation from predetermined direction using amplitude comparison of signals derived sequentially from receiving antennas or antenna systems having differently-oriented directivity characteristics or from an antenna system having periodically-varied orientation of directivity characteristic derived from different combinations of signals from separate antennas, e.g. comparing sum with difference the separate antennas having differently-oriented directivity characteristics

Abstract

a controller and evaluation unit (3) for driving the transmitter and receiver unit (2) and evaluating measuring signals (M) of the transmitter and receiver unit (2). b) reflected on the test object (8) and puts it out to the controller and evaluation unit (3) for determining at least one layer thickness and/or one distance of the test object (8).

IPC Classes  ?

• G01B 11/02 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness
• G01B 11/06 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness for measuring thickness
• G01B 11/08 - Measuring arrangements characterised by the use of optical techniques for measuring diameters
• G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
• G01N 21/3581 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared lightInvestigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using Terahertz radiation

Abstract

an evaluation unit (12) for determining a run-time of the terahertz radiation and at least one distance of the test object (2), b) and the synchronising signal (S1).

IPC Classes  ?

• G01N 21/3581 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared lightInvestigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using Terahertz radiation
• G01B 11/06 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness for measuring thickness
• G01N 21/952 - Inspecting the exterior surface of cylindrical bodies or wires

Abstract

a controller unit (10) for driving the transmitter and receiver unit (14) whereby it comprises, at a front end are (5), in particular, a moulded screen (5), a support contour (7) including several support points (P, P1, P2, P3, P4) for being applied to a curved surface (18) of the test object (20, 120, 220), for perpendicular positioning on the surface (18, 118, 218).

IPC Classes  ?

• G01B 11/06 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness for measuring thickness
• G01N 21/3581 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared lightInvestigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using Terahertz radiation
• G01S 13/88 - Radar or analogous systems, specially adapted for specific applications
• G01N 21/89 - Investigating the presence of flaws, defects or contamination in moving material, e.g. paper, textiles
• G01B 21/04 - Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points

Abstract

The invention relates to a terahertz measuring device (1) for measuring a test object (7), comprising: a controller and evaluator device (12) for receiving and evaluating the signal amplitude (S). a) of the emitted terahertz radiation (3). An alternative measuring arrangement can reveal defects also by injecting the THz radiation at a right angle in that additional measuring peaks are detected which cannot be associated with the layer thickness measurement as such.

IPC Classes  ?

• G01N 21/35 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
• G01N 21/3581 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared lightInvestigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using Terahertz radiation
• G01B 11/24 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures
• G01N 21/88 - Investigating the presence of flaws, defects or contamination
• G01B 11/06 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness for measuring thickness

Abstract

b) of the layer (3). a) is adjusted during the measurements or between the measurements and one of the multiple measurements is used for ascertaining the layer thickness (d). Preferably, the optical axis is adjusted continuously and/or periodically within an adjustment angle range (α) and in the process the multiple measurements are recorded, the measurement therefrom with maximum amplitude being used as the measurement for ascertaining the layer thickness.

IPC Classes  ?

• G01B 11/245 - Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures using a plurality of fixed, simultaneously operating transducers
• G01B 11/02 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness
• G01B 11/06 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness for measuring thickness
• G01N 21/3586 - Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using far infrared lightInvestigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light using Terahertz radiation by Terahertz time domain spectroscopy [THz-TDS]