STMicroelectronics, Inc.

United States of America

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H01L 29/66 - Types of semiconductor device 65
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1.

LEAD STABILIZATION IN SEMICONDUCTOR PACKAGES

      
Application Number 19000420
Status Pending
Filing Date 2024-12-23
First Publication Date 2025-06-05
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor
  • Cadag, Ela Mia
  • Gomez, Frederick Ray
  • Cadag, Aaron

Abstract

Generally described, one or more embodiments are directed to semiconductor packages comprising a plurality of leads and methods of forming same. The plurality of leads include active leads that are electrically coupled to bond pads of a semiconductor die and thereby coupled to active components of the semiconductor die, and inactive leads that are not electrically coupled to bond pads of the semiconductor die. The active leads have surfaces that are exposed at a lower surface of the semiconductor package and forms lands, while the inactive leads are not exposed at the lower surface of the package.

IPC Classes  ?

  • H01L 23/498 - Leads on insulating substrates
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 23/00 - Details of semiconductor or other solid state devices

2.

LEAD STABILIZATION IN SEMICONDUCTOR PACKAGES

      
Application Number 19000426
Status Pending
Filing Date 2024-12-23
First Publication Date 2025-06-05
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor
  • Cadag, Ela Mia
  • Gomez, Frederick Ray
  • Cadag, Aaron

Abstract

Generally described, one or more embodiments are directed to semiconductor packages comprising a plurality of leads and methods of forming same. The plurality of leads include active leads that are electrically coupled to bond pads of a semiconductor die and thereby coupled to active components of the semiconductor die, and inactive leads that are not electrically coupled to bond pads of the semiconductor die. The active leads have surfaces that are exposed at a lower surface of the semiconductor package and forms lands, while the inactive leads are not exposed at the lower surface of the package.

IPC Classes  ?

  • H01L 23/498 - Leads on insulating substrates
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 23/00 - Details of semiconductor or other solid state devices

3.

HIGH DOSE IMPLANTATION FOR ULTRATHIN SEMICONDUCTOR-ON-INSULATOR SUBSTRATES

      
Application Number 19030171
Status Pending
Filing Date 2025-01-17
First Publication Date 2025-05-22
Owner STMICROELECTRONICS, INC. (USA)
Inventor Gimbert, Jocelyne

Abstract

Methods and structures for forming highly-doped, ultrathin layers for transistors formed in semiconductor-on-insulator substrates are described. High dopant concentrations may be achieved in ultrathin semiconductor layers to improve device characteristics. Ion implantation at elevated temperatures may mitigate defect formation for stoichiometric dopant concentrations up to about 30%. In-plane stressors may be formed adjacent to channels of transistors formed in ultrathin semiconductor layers.

IPC Classes  ?

  • H10D 30/69 - IGFETs having charge trapping gate insulators, e.g. MNOS transistors
  • H01L 21/265 - Bombardment with wave or particle radiation with high-energy radiation producing ion implantation
  • H01L 21/324 - Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
  • H01L 21/70 - Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in or on a common substrate or of specific parts thereofManufacture of integrated circuit devices or of specific parts thereof
  • H10D 30/01 - Manufacture or treatment
  • H10D 62/822 - Heterojunctions comprising only Group IV materials heterojunctions, e.g. Si/Ge heterojunctions
  • H10D 62/832 - Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge being Group IV materials comprising two or more elements, e.g. SiGe
  • H10D 84/01 - Manufacture or treatment
  • H10D 84/03 - Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
  • H10D 86/00 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
  • H10D 86/01 - Manufacture or treatment

4.

INTEGRATED CIRCUIT DEVICES AND FABRICATION TECHNIQUES

      
Application Number 18983040
Status Pending
Filing Date 2024-12-16
First Publication Date 2025-05-08
Owner STMicroelectronics, Inc. (USA)
Inventor Zhang, John H.

Abstract

Single gate and dual gate FinFET devices suitable for use in an SRAM memory array have respective fins, source regions, and drain regions that are formed from portions of a single, contiguous layer on the semiconductor substrate, so that STI is unnecessary. Pairs of FinFETs can be configured as dependent-gate devices wherein adjacent channels are controlled by a common gate, or as independent-gate devices wherein one channel is controlled by two gates. Metal interconnects coupling a plurality of the FinFET devices are made of a same material as the gate electrodes. Such structural and material commonalities help to reduce costs of manufacturing high-density memory arrays.

IPC Classes  ?

  • H10D 86/00 - Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
  • H01L 21/266 - Bombardment with wave or particle radiation with high-energy radiation producing ion implantation using masks
  • H01L 23/528 - Layout of the interconnection structure
  • H10B 10/00 - Static random access memory [SRAM] devices
  • H10B 20/00 - Read-only memory [ROM] devices
  • H10D 30/01 - Manufacture or treatment
  • H10D 30/60 - Insulated-gate field-effect transistors [IGFET]
  • H10D 30/63 - Vertical IGFETs
  • H10D 30/69 - IGFETs having charge trapping gate insulators, e.g. MNOS transistors
  • H10D 62/10 - Shapes, relative sizes or dispositions of the regions of the semiconductor bodiesShapes of the semiconductor bodies
  • H10D 62/832 - Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge being Group IV materials comprising two or more elements, e.g. SiGe
  • H10D 84/01 - Manufacture or treatment
  • H10D 84/03 - Manufacture or treatment characterised by using material-based technologies using Group IV technology, e.g. silicon technology or silicon-carbide [SiC] technology
  • H10D 84/85 - Complementary IGFETs, e.g. CMOS
  • H10D 86/01 - Manufacture or treatment

5.

STRAINED-CHANNEL FIN FETS

      
Application Number 19000478
Status Pending
Filing Date 2024-12-23
First Publication Date 2025-04-17
Owner STMicroelectronics, Inc. (USA)
Inventor
  • Loubet, Nicolas
  • Morin, Pierre

Abstract

Methods and structures for forming strained-channel finFETs are described. Fin structures for finFETs may be formed in two epitaxial layers that are grown over a bulk substrate. A first thin epitaxial layer may be cut and used to impart strain to an adjacent channel region of the finFET via elastic relaxation. The structures exhibit a preferred design range for increasing induced strain and uniformity of the strain over the fin height.

IPC Classes  ?

  • H10D 30/69 - IGFETs having charge trapping gate insulators, e.g. MNOS transistors
  • H10D 30/01 - Manufacture or treatment
  • H10D 30/62 - Fin field-effect transistors [FinFET]
  • H10D 62/815 - Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures exhibiting quantum-confinement effects, e.g. single quantum wellsSemiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials of structures having periodic or quasi-periodic potential variation of structures having periodic or quasi-periodic potential variation, e.g. superlattices or multiple quantum wells [MQW]
  • H10D 62/822 - Heterojunctions comprising only Group IV materials heterojunctions, e.g. Si/Ge heterojunctions
  • H10D 62/83 - Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
  • H10D 62/832 - Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge being Group IV materials comprising two or more elements, e.g. SiGe

6.

MULTIPLE THRESHOLD CHECKERS FOR SPECIFIC APPLICATIONS AND FFT BASED BREATHING DETECTION FOR PRESENCE

      
Application Number 18638354
Status Pending
Filing Date 2024-04-17
First Publication Date 2024-10-17
Owner
  • STMicroelectronics (Grenoble 2) SAS (France)
  • STMicroelectronics, Inc. (USA)
Inventor
  • Lemarchand, Olivier
  • Felter, Pierre-Loic
  • Winterton, Darin K.
  • Vadlamudi-Reddy, Kalyan-Kumar

Abstract

In accordance with embodiments, methods and systems for utilizing multiple threshold checkers are provided. A range sensor collects measurement data. The range sensor examines the measurement data based on multiple threshold checkers to determine satisfaction of a trigger condition. In response to the satisfaction of the trigger condition, the range sensor provides the measurement data to a host computing device of the range sensor.

IPC Classes  ?

  • G06F 1/3231 - Monitoring the presence, absence or movement of users
  • G01S 7/41 - Details of systems according to groups , , of systems according to group using analysis of echo signal for target characterisationTarget signatureTarget cross-section
  • G01S 13/56 - Discriminating between fixed and moving objects or between objects moving at different speeds for presence detection

7.

DEVICE, SYSTEM AND METHOD FOR SYNCHRONIZING OF DATA FROM MULTIPLE SENSORS

      
Application Number 18617533
Status Pending
Filing Date 2024-03-26
First Publication Date 2024-07-18
Owner
  • STMICROELECTRONICS S.r.l. (Italy)
  • STMICROELECTRONICS, INC. (USA)
Inventor
  • Sayed, Karimuddin
  • Pabla, Chandandeep Singh
  • Bracco, Lorenzo
  • Rizzardini, Federico

Abstract

In an embodiment, a device comprises a memory, which, in operation, stores data samples associated with a plurality of data sensors, and circuitry, coupled to the memory, wherein the circuitry, in operation, generates synchronized output data sets associated with the plurality of data sensors. Generating a synchronized output data set includes: determining a reference sample associated with a sensor of the plurality of sensors; verifying a timing validity of a data sample associated with another sensor of the plurality of sensors; identifying a closest-in-time data sample associated with the another sensor of the plurality of sensors with respect to the reference sample; and generating the synchronized output data set based on interpolation.

IPC Classes  ?

  • H04W 4/38 - Services specially adapted for particular environments, situations or purposes for collecting sensor information
  • G01D 5/244 - Mechanical means for transferring the output of a sensing memberMeans for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for convertingTransducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trainsMechanical means for transferring the output of a sensing memberMeans for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for convertingTransducers not specially adapted for a specific variable using electric or magnetic means generating pulses or pulse trains
  • G01D 9/00 - Recording measured values
  • H04W 4/70 - Services for machine-to-machine communication [M2M] or machine type communication [MTC]

8.

CUFFLESS BLOOD PRESSURE MONITOR WITH MULTIPLE INERTIAL MEASUREMENT UNITS

      
Application Number 18063021
Status Pending
Filing Date 2022-12-07
First Publication Date 2024-06-13
Owner
  • STMICROELECTRONICS, INC. (USA)
  • STMicroelectronics International N.V. (Switzerland)
Inventor
  • Chowdhary, Mahesh
  • Kumar, Vijay
  • Paul, Kolin

Abstract

A blood pressure monitoring device includes a patch including two inertial measurement units placed adjacent to the skin of a user. The blood pressure monitoring device includes a control unit coupled to the patch and configured to receive sensor data from the inertial measurement units. The control unit includes an analysis model trained with multiple machine learning processes to generate blood pressure estimations based on the sensor data. A first general machine learning process trains the analysis model with a training set gathered from plurality of other individuals. The second general machine learning process retrains a portion of the analysis model with a second machine learning process utilizing individualized training set gathered from the user.

IPC Classes  ?

  • A61B 5/021 - Measuring pressure in heart or blood vessels
  • A61B 5/00 - Measuring for diagnostic purposes Identification of persons
  • A61B 5/026 - Measuring blood flow
  • A61B 5/11 - Measuring movement of the entire body or parts thereof, e.g. head or hand tremor or mobility of a limb

9.

Sensor unit with on-device unsupervised learning and classification

      
Application Number 18063584
Grant Number 12242663
Status In Force
Filing Date 2022-12-08
First Publication Date 2024-06-13
Grant Date 2025-03-04
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Saha, Swapnil Sayan
  • Chowdhary, Mahesh

Abstract

An electronic device includes a sensor unit. The sensor unit includes a sensor and low power, low area sensor processing unit. The sensor processing unit performs an unsupervised machine learning processes to learn to recognize an activity or motion of the user or device. The user can request to learn the new activity. The sensor processing unit can request that the user remain stationary for a selected period of time before performing the activity. The sensor processing unit records sensor data while the user performs the activity and generates an activity template from the sensor data. The sensor processing can then infer when the user is performing the activity by comparing sensor signals to the activity template.

IPC Classes  ?

  • G06F 3/01 - Input arrangements or combined input and output arrangements for interaction between user and computer
  • G06F 1/16 - Constructional details or arrangements
  • G06F 3/0346 - Pointing devices displaced or positioned by the userAccessories therefor with detection of the device orientation or free movement in a 3D space, e.g. 3D mice, 6-DOF [six degrees of freedom] pointers using gyroscopes, accelerometers or tilt-sensors

10.

Method for manufacturing leadless semiconductor package with wettable flanks

      
Application Number 18435915
Grant Number 12255076
Status In Force
Filing Date 2024-02-07
First Publication Date 2024-05-30
Grant Date 2025-03-18
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor
  • Arellano, Ian Harvey
  • Cadag, Aaron
  • Cadag, Ela Mia

Abstract

The present disclosure is directed to leadless semiconductor packages with improved wettable flanks that encourage the formation of solder fillets when the leadless semiconductor package is mounted to a substrate. The solder fillets are consistently formed and are easily detectable by inspection systems, such as automated optical inspection (AOI) systems.

IPC Classes  ?

  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 23/495 - Lead-frames
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings

11.

Semiconductor device having cavities at an interface of an encapsulant and a die pad or leads

      
Application Number 18531561
Grant Number 12224251
Status In Force
Filing Date 2023-12-06
First Publication Date 2024-05-16
Grant Date 2025-02-11
Owner STMicroelectronics, Inc. (Philippines)
Inventor Arellano, Ian Harvey

Abstract

In various embodiments, the present disclosure provides semiconductor devices, packages, and methods. In one embodiment, a device includes a die pad, a lead that is spaced apart from the die pad, and an encapsulant on the die pad and the lead. A plurality of cavities extends into at least one of the die pad or the lead to a depth from a surface of the at least one of the die pad or the lead. The depth is within a range from 0.5 μm to 5 μm. The encapsulant extends into the plurality of cavities. The cavities facilitate improved adhesion between the die pad or lead and the encapsulant, as the cavities increase a surface area of contact with the encapsulant, and further increase a mechanical interlock with the encapsulant, as the cavities may have a rounded or semi-spherical shape.

IPC Classes  ?

  • H01L 23/495 - Lead-frames
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement

12.

Integrated circuit devices and fabrication techniques

      
Application Number 18326841
Grant Number 12211853
Status In Force
Filing Date 2023-05-31
First Publication Date 2024-05-02
Grant Date 2025-01-28
Owner STMICROELECTRONICS, INC. (USA)
Inventor Zhang, John H.

Abstract

Single gate and dual gate FinFET devices suitable for use in an SRAM memory array have respective fins, source regions, and drain regions that are formed from portions of a single, contiguous layer on the semiconductor substrate, so that STI is unnecessary. Pairs of FinFETs can be configured as dependent-gate devices wherein adjacent channels are controlled by a common gate, or as independent-gate devices wherein one channel is controlled by two gates. Metal interconnects coupling a plurality of the FinFET devices are made of a same material as the gate electrodes. Such structural and material commonalities help to reduce costs of manufacturing high-density memory arrays.

IPC Classes  ?

  • H01L 27/12 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
  • H01L 21/266 - Bombardment with wave or particle radiation with high-energy radiation producing ion implantation using masks
  • H01L 21/8238 - Complementary field-effect transistors, e.g. CMOS
  • H01L 21/84 - Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being other than a semiconductor body, e.g. being an insulating body
  • H01L 23/528 - Layout of the interconnection structure
  • H01L 27/092 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
  • H01L 29/06 - Semiconductor bodies characterised by the shapes, relative sizes, or dispositions of the semiconductor regions
  • H01L 29/161 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System in uncombined form including two or more of the elements provided for in group
  • H01L 29/66 - Types of semiconductor device
  • H01L 29/78 - Field-effect transistors with field effect produced by an insulated gate
  • H10B 10/00 - Static random access memory [SRAM] devices
  • H10B 20/00 - Read-only memory [ROM] devices

13.

CAPLESS SEMICONDUCTOR PACKAGE WITH A MICRO-ELECTROMECHANICAL SYSTEM (MEMS)

      
Application Number 18397930
Status Pending
Filing Date 2023-12-27
First Publication Date 2024-04-18
Owner STMicroelectronics, Inc. (Philippines)
Inventor Talledo, Jefferson Sismundo

Abstract

A semiconductor package that contains an application-specific integrated circuit (ASIC) die and a micro-electromechanical system (MEMS) die. The MEMS die and the ASIC die are coupled to a substrate that includes an opening that extends through the substrate and is in fluid communication with an air cavity positioned between and separating the MEMS die from the substrate. The opening exposes the air cavity to an external environment and, following this, the air cavity exposes a MEMS element of the MEMS die to the external environment. The air cavity separating the MEMS die from the substrate is formed with a method of manufacturing that utilizes a thermally decomposable die attach material.

IPC Classes  ?

  • B81C 1/00 - Manufacture or treatment of devices or systems in or on a substrate
  • B81B 7/00 - Microstructural systems

14.

POWER LEADFRAME PACKAGE WITH REDUCED SOLDER VOIDS

      
Application Number 18233092
Status Pending
Filing Date 2023-08-11
First Publication Date 2024-04-04
Owner STMicroelectronics, Inc. (Philippines)
Inventor Talledo, Jefferson Sismundo

Abstract

An electronic device includes an integrated circuit (IC) with its second face bonded to a first surface of a first support. A conductive clip has a first portion that is elongate and extends across the IC, having its second surface bonded to a first face of the IC by a solder layer. A second portion of the clip extends from the first portion away from the IC toward a second support with the second surface bonded to a first surface of the second support. A first surface of the clip has a pattern formed therein including a depressed floor with fins extending upwardly therefrom. Through-holes extend through the depressed floor to the second surface of the clip. An encapsulating layer covers portions of the first and second supports, IC, and clip while leaving the first surface of the first portion exposed to permit heat to radiate away therefrom.

IPC Classes  ?

15.

METHODS AND DEVICES FOR FAST FOURIER TRANSFORMS

      
Application Number 18505770
Status Pending
Filing Date 2023-11-09
First Publication Date 2024-03-07
Owner STMicroelectronics, Inc. (USA)
Inventor Vitali, Andrea Lorenzo

Abstract

A method of operating a microcontroller to perform a Fast Fourier Transform, the method including receiving, by the microcontroller, N samples from a signal; and performing, by the microcontroller, a first butterfly operation of the Fast Fourier Transform before all of the N samples have been received from the signal, based on the performing of the first butterfly operation, the microcontroller performs the Fast Fourier Transform at a higher performance to power efficiency than a Fast Fourier Transform operation that begins after all of the N samples are received.

IPC Classes  ?

  • G06F 17/14 - Fourier, Walsh or analogous domain transformations

16.

METHOD FOR MOTION ESTIMATION IN A VEHICLE, CORRESPONDING DEVICE AND COMPUTER PROGRAM PRODUCT

      
Application Number 18496124
Status Pending
Filing Date 2023-10-27
First Publication Date 2024-02-29
Owner
  • STMICROELECTRONICS S.r.l. (Italy)
  • STMICROELECTRONICS, INC. (USA)
  • STMicroelectronics (Grand Ouest) SAS (France)
Inventor
  • Palella, Nicola Matteo
  • Colombo, Leonardo
  • Donadel, Andrea
  • Mura, Roberto
  • Jain, Mahaveer
  • Philippe, Joelle

Abstract

A system includes inertial sensors and a GPS. The system generates a first estimated vehicle velocity based on motion data and positioning data, generates a second estimated vehicle velocity based on the processed motion data and the first estimated vehicle velocity, and generates fused datasets indicative of position, velocity and attitude of a vehicle based on the processed motion data, the positioning data and the second estimated vehicle velocity. The generating the second estimated vehicle velocity includes: filtering the motion data, transforming the filtered motion data in a frequency domain based on the first estimated vehicle velocity, generating spectral power density signals, generating an estimated wheel angular frequency and an estimated wheel size based on the spectral power density signals, and generating the second estimated vehicle velocity as a function of the estimated wheel angular frequency and the estimated wheel size.

IPC Classes  ?

  • B60W 40/101 - Side slip angle of tyre
  • B60W 40/11 - Pitch movement
  • B60W 40/112 - Roll movement
  • B60W 40/114 - Yaw movement
  • G01S 19/47 - Determining position by combining measurements of signals from the satellite radio beacon positioning system with a supplementary measurement the supplementary measurement being an inertial measurement, e.g. tightly coupled inertial

17.

SYSTEM AND METHOD FOR FAST MAGNETOMETER CALIBRATION USING GYROSCOPE

      
Application Number 18488750
Status Pending
Filing Date 2023-10-17
First Publication Date 2024-02-08
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Jain, Mahaveer
  • Chowdhary, Mahesh

Abstract

An electronic device includes a magnetometer that outputs magnetometer sensor signals and a gyroscope that outputs gyroscope sensor signals. The electronic device includes a magnetometer calibration module that calibrates the magnetometer utilizing the gyroscope sensor signals. The electronic device generates a first magnetometer calibration parameter based on a Kalman filter process. The electronic device generates a second magnetometer calibration parameter based on a least squares estimation process.

IPC Classes  ?

  • G01R 33/00 - Arrangements or instruments for measuring magnetic variables
  • G01C 25/00 - Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass

18.

TIME OF FLIGHT SENSING

      
Application Number 17876341
Status Pending
Filing Date 2022-07-28
First Publication Date 2024-02-01
Owner STMicroelectronics, Inc. (USA)
Inventor
  • Varillon, Paul
  • Kandappan Singaravadivelu, Sivakumar

Abstract

An embodiment method for operating a device includes determining, based on data collected by a first sensor, first information between the first sensor and an object; determining, based on data collected by a second sensor, second information between the second sensor and the object; and determining a distance between the device and the object based on comparing the first information and the second information.

IPC Classes  ?

  • G01S 17/894 - 3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar
  • G01S 17/46 - Indirect determination of position data
  • G01S 17/10 - Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves
  • G01S 7/4865 - Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak

19.

Methods and devices to identify focal objects

      
Application Number 18470702
Grant Number 12143719
Status In Force
Filing Date 2023-09-20
First Publication Date 2024-01-11
Grant Date 2024-11-12
Owner
  • STMicroelectronics France (France)
  • STMicroelectronics, Inc. (USA)
  • STMicroelectronics (Research & Development) Limited (United Kingdom)
Inventor
  • Winterton, Darin K.
  • Baxter, Donald
  • Hodgson, Andrew
  • Lunn, Gordon
  • Pothier, Olivier
  • Vadlamudi-Reddy, Kalyan-Kumar

Abstract

A method includes dividing a field of view into a plurality of zones and sampling the field of view to generate a photon count for each zone of the plurality of zones, identifying a focal sector of the field of view and analyzing each zone to select a final focal object from a first prospective focal object and a second prospective focal object.

IPC Classes  ?

  • H04N 23/67 - Focus control based on electronic image sensor signals
  • H04N 23/61 - Control of cameras or camera modules based on recognised objects

20.

LEADFRAME WITH PAD ANCHORING MEMBERS AND METHOD OF FORMING THE SAME

      
Application Number 18339615
Status Pending
Filing Date 2023-06-22
First Publication Date 2023-12-28
Owner STMicroelectronics, Inc. (Philippines)
Inventor Talledo, Jefferson Sismundo

Abstract

A leadframe having extensions around an outer edge of a die pad are disclosed. More specifically, leadframes are created with a flange formed at the outer edge of the die pad and extending away from the die pad. The flange is bent, such that it is positioned at an angle with respect to the die pad. Leadframes are also created with anchoring posts formed adjacent the outer edge of the die pad and extending away from the die pad. The anchoring posts have a central thickness that is less than a thickness of first and second portions opposite the central portion. When the leadframe is incorporated into a package, molding compound completely surrounds each flange or anchoring post, which increases the bond strength between the leadframe and the molding compound due to increased contact area. The net result is a reduced possibility of delamination at edges of the die pad.

IPC Classes  ?

  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 23/495 - Lead-frames
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or

21.

THIN SUBSTRATE PACKAGE AND LEAD FRAME

      
Application Number 18330284
Status Pending
Filing Date 2023-06-06
First Publication Date 2023-12-21
Owner STMicroelectronics, Inc. (Philippines)
Inventor Talledo, Jefferson Sismundo

Abstract

The present disclosure is directed to a thin substrate package and a lead frame method of fabricating the semiconductor package. The semiconductor package includes a first lead frame portion and a second lead frame portion. A substrate is positioned in a center opening between the first lead frame portion and the second lead frame portion, the substrate having a thickness less than or equal to 0.10-millimeters (mm). A first die having a plurality of wires is positioned on the substrate by an adhesive. A molding compound covers the first and second lead frame portions, the substrate, and the first die.

IPC Classes  ?

  • H01L 23/495 - Lead-frames
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 23/00 - Details of semiconductor or other solid state devices

22.

Motion based device wake up

      
Application Number 17806813
Grant Number 12066881
Status In Force
Filing Date 2022-06-14
First Publication Date 2023-12-14
Grant Date 2024-08-20
Owner
  • STMICROELETRONICS (BEIJING) R&D CO., LTD. (China)
  • STMicroelectronics (Grenoble 2) SAS (France)
  • STMicroelectronics, Inc. (USA)
Inventor
  • Deleule, Arnaud
  • Vadlamudi-Reddy, Kalyan-Kumar
  • Winterton, Darin K
  • Chen, Jihong
  • Lemarchand, Olivier

Abstract

A method for operating an electronic device includes while a display is in low power mode, detecting based on data collected by a time of flight (ToF) sensor, a movable object within a field of view of the electronic device; in response to the detecting initiating a period of detection having a plurality of frames, the period of detection being a time period over which a distance value indicative of a distance between the movable object and the display is detected; for each of the plurality of frames, changing the distance value to reflect whether the movable object is moving near or further from the electronic device; detecting that the distance value after the period of detection is less than a threshold distance value indicative of the movable object approaching the display; if the distance value is less than the threshold distance value, waking up the display.

IPC Classes  ?

  • G06F 1/32 - Means for saving power
  • G01S 13/08 - Systems for measuring distance only
  • G06F 1/3231 - Monitoring the presence, absence or movement of users
  • G06F 1/3234 - Power saving characterised by the action undertaken

23.

INERTIAL NAVIGATION SYSTEM CAPABLE OF DEAD RECKONING IN VEHICLES

      
Application Number 18352969
Status Pending
Filing Date 2023-07-14
First Publication Date 2023-11-09
Owner
  • STMICROELECTRONICS, INC. (USA)
  • STMICROELECTRONICS S.r.l. (Italy)
Inventor
  • Jain, Mahaveer
  • Chowdhary, Mahesh
  • Mura, Roberto
  • Palella, Nicola Matteo
  • Colombo, Leonardo

Abstract

A device including microelectromechanical systems (MEMS) sensors are used in dead reckoning in conditions where Global Positioning System (GPS) signals or Global Navigation Satellite System (GNSS) signals are lost. The device is capable of tracking the location of the device after the GPS/GNSS signals are lost by using MEMS sensors such as accelerometers and gyroscopes. By calculating a misalignment angle between a forward axis of a sensor frame of the device and a forward axis of a vehicle frame using the data received from the MEMS sensors, the device can accurately calculate the location of a user or the vehicle of the device even without the GPS/GNSS signals. Accordingly, a device capable of tracking the location of the user riding in the vehicle in GPS/GNSS signals absent environment can be provided.

IPC Classes  ?

  • G01C 21/16 - NavigationNavigational instruments not provided for in groups by using measurement of speed or acceleration executed aboard the object being navigatedDead reckoning by integrating acceleration or speed, i.e. inertial navigation
  • G01C 21/20 - Instruments for performing navigational calculations
  • G01S 19/49 - Determining position by combining or switching between position solutions derived from the satellite radio beacon positioning system and position solutions derived from a further system whereby the further system is an inertial position system, e.g. loosely-coupled

24.

Strained-channel fin FETs

      
Application Number 18146962
Grant Number 12211936
Status In Force
Filing Date 2022-12-27
First Publication Date 2023-11-02
Grant Date 2025-01-28
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Loubet, Nicolas
  • Morin, Pierre

Abstract

Methods and structures for forming strained-channel finFETs are described. Fin structures for finFETs may be formed in two epitaxial layers that are grown over a bulk substrate. A first thin epitaxial layer may be cut and used to impart strain to an adjacent channel region of the finFET via elastic relaxation. The structures exhibit a preferred design range for increasing induced strain and uniformity of the strain over the fin height.

IPC Classes  ?

  • H01L 29/78 - Field-effect transistors with field effect produced by an insulated gate
  • H01L 29/10 - Semiconductor bodies characterised by the shapes, relative sizes, or dispositions of the semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified, or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
  • H01L 29/15 - Structures with periodic or quasi periodic potential variation, e.g. multiple quantum wells, superlattices
  • H01L 29/16 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System in uncombined form
  • H01L 29/161 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System in uncombined form including two or more of the elements provided for in group
  • H01L 29/165 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System in uncombined form including two or more of the elements provided for in group in different semiconductor regions
  • H01L 29/66 - Types of semiconductor device

25.

Method, device, and system of measuring eye convergence angle

      
Application Number 18339912
Grant Number 12118146
Status In Force
Filing Date 2023-06-22
First Publication Date 2023-10-19
Grant Date 2024-10-15
Owner STMICROELECTRONICS, INC. (USA)
Inventor Barbier, Dominique Paul

Abstract

An electronic device capable of determining an eye convergence angle using a magnetometer sensor is provided. The magnetometer sensor is capable of reporting angle readings in three dimensions that is aligned with an eye gaze direction of each eye of a user. The magnetometer which is incorporated into the device can fit into a human eye like a contact lens and determine the angle of the gaze direction of both eyes with respect to an object within a field of view. By obtaining this eye convergence angle for an object, it is possible to accurately detect depth information. The electronic device also functions as a digital contact lens that can automatically adjust the focal point of the object to provide the user with a clear vision. The electronic device also includes a display that provides the user with additional information about the object.

IPC Classes  ?

  • G06F 3/01 - Input arrangements or combined input and output arrangements for interaction between user and computer
  • G01C 3/06 - Use of electric means to obtain final indication
  • G01C 3/14 - Measuring distances in line of sightOptical rangefinders using a parallactic triangle with variable angles and a base of fixed length in the observation station, e.g. in the instrument with binocular observation at a single point, e.g. stereoscopic type
  • G01C 3/22 - Measuring distances in line of sightOptical rangefinders using a parallactic triangle with variable angles and a base of fixed length at, near, or formed by, the object
  • G02C 7/04 - Contact lenses for the eyes

26.

SYSTEM AND METHOD FOR DETECTING HUMAN PRESENCE BASED ON DEPTH SENSING AND INERTIAL MEASUREMENT

      
Application Number 18335046
Status Pending
Filing Date 2023-06-14
First Publication Date 2023-10-12
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Yang, Xiaoyong
  • Vadlamudi-Reddy, Kalyan-Kumar

Abstract

An electronic device includes a depth sensor and an inertial measurement unit. The electronic device detects a presence of the user of the electronic device by analyzing a combination of inertial sensor signals from the inertial measurement unit and depth sensor signals from the depth sensor.

IPC Classes  ?

  • G06V 40/16 - Human faces, e.g. facial parts, sketches or expressions
  • G01B 7/30 - Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapersMeasuring arrangements characterised by the use of electric or magnetic techniques for testing the alignment of axes
  • G01C 19/00 - GyroscopesTurn-sensitive devices using vibrating massesTurn-sensitive devices without moving massesMeasuring angular rate using gyroscopic effects
  • G01S 17/08 - Systems determining position data of a target for measuring distance only
  • G01S 17/894 - 3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar
  • G01B 11/22 - Measuring arrangements characterised by the use of optical techniques for measuring depth
  • G01P 15/18 - Measuring accelerationMeasuring decelerationMeasuring shock, i.e. sudden change of acceleration in two or more dimensions
  • G06F 18/25 - Fusion techniques
  • G06F 18/214 - Generating training patternsBootstrap methods, e.g. bagging or boosting

27.

Motion event detection

      
Application Number 17717855
Grant Number 12134361
Status In Force
Filing Date 2022-04-11
First Publication Date 2023-10-12
Grant Date 2024-11-05
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Jain, Mahaveer
  • Chowdhary, Mahesh

Abstract

The present disclosure is directed to a device and method for detection of motion events including towing of the vehicle, jacking of the vehicle, and the vehicle being hit by another object. Processing is split between an MCU and a sensor unit. After the vehicle is turned off and before the MCU enters a sleep mode, the MCU calculates a gravity vector of the vehicle using accelerometer data, calculates threshold values based on the gravity vector, and saves the threshold values. After the MCU enters the sleep mode, the sensor unit subsequently monitors and detects motion events with the saved threshold values.

IPC Classes  ?

  • B60W 40/10 - Estimation or calculation of driving parameters for road vehicle drive control systems not related to the control of a particular sub-unit related to vehicle motion
  • B60R 16/023 - Electric or fluid circuits specially adapted for vehicles and not otherwise provided forArrangement of elements of electric or fluid circuits specially adapted for vehicles and not otherwise provided for electric for transmission of signals between vehicle parts or subsystems
  • B60R 16/03 - Electric or fluid circuits specially adapted for vehicles and not otherwise provided forArrangement of elements of electric or fluid circuits specially adapted for vehicles and not otherwise provided for electric for supply of electrical power to vehicle subsystems

28.

MEMS gyroscope start-up process and circuit

      
Application Number 17712718
Grant Number 12313408
Status In Force
Filing Date 2022-04-04
First Publication Date 2023-10-05
Grant Date 2025-05-27
Owner
  • STMicroelectronics, Inc. (USA)
  • STMicroelectronics S.r.l. (Italy)
Inventor
  • Hu, Yamu
  • Sahoo, Naren K
  • Nallamothu, Pavan
  • Fang, Deyou
  • Mcclure, David
  • Garbarino, Marco

Abstract

At start-up of a microelectromechanical system (MEMS) gyroscope, the drive signal is inhibited, and the phase, frequency and amplitude of any residual mechanical oscillation is sensed and processed to determine a process path for start-up. In the event that the sensed frequency of the residual mechanical oscillation is a spurious mode frequency and a quality factor of the residual mechanical oscillation is sufficient, an anti-phase signal is applied as the MEMS gyroscope drive signal in order to implement an active dampening of the residual mechanical oscillation. A kicking phase can then be performed to initiate oscillation. Also, in the event that the sensed frequency of the residual mechanical oscillation is a resonant mode frequency with sufficient drive energy, a quadrature phase signal with phase lock loop frequency control and amplitude controlled by the drive energy is applied as the MEMS gyroscope drive signal in order to induce controlled oscillation.

IPC Classes  ?

  • G01C 19/5726 - Signal processing
  • G01C 19/5762 - Structural details or topology the devices having a single sensing mass the sensing mass being connected to a driving mass, e.g. driving frames

29.

System and method for disk drive fly height measurement

      
Application Number 17742202
Grant Number 11756582
Status In Force
Filing Date 2022-05-11
First Publication Date 2023-09-12
Grant Date 2023-09-12
Owner
  • STMicroelectronics, Inc. (USA)
  • STMicroelectronics S.r.l. (Italy)
Inventor
  • Pulici, Paolo
  • Hogg, Dennis
  • Bartolini, Michele
  • Sentieri, Enrico
  • Mammei, Enrico

Abstract

A system for determining a fly height includes a first head of a disk drive, a second head of the disk drive, a capacitive sensor circuit coupled to the first head and the second head, and a logic device coupled to the capacitive sensor circuit. The capacitive sensor circuit is configured to measure a first capacitance between the first head and the first disk, remove noise from the first capacitance using a second capacitance between the second head and the second disk, and based thereon determine a corrected first capacitance. The logic device is configured to determine the fly height between the first head and the first disk using the corrected first capacitance.

IPC Classes  ?

  • G11B 5/60 - Fluid-dynamic spacing of heads from record carriers
  • G11B 21/10 - Track finding or aligning by moving the head

30.

MEMS gyroscope control circuit

      
Application Number 18136088
Grant Number 12111158
Status In Force
Filing Date 2023-04-18
First Publication Date 2023-08-31
Grant Date 2024-10-08
Owner STMicroelectronics, Inc. (USA)
Inventor
  • Fang, Deyou
  • Tsai, Chao-Ming
  • Alwardi, Milad
  • Hu, Yamu
  • Mcclure, David

Abstract

A microelectromechanical system (MEMS) gyroscope includes a driving mass and a driving circuit that operates to drive the driving mass in a mechanical oscillation at a resonant drive frequency. An oscillator generates a system clock that is independent of and asynchronous to the resonant drive frequency. A clock generator circuit outputs a first clock and a second clock that are derived from the system clock. The drive loop of the driving circuit including an analog-to-digital converter (ADC) circuit that is clocked by the first clock and a digital signal processing (DSP) circuit that is clocked by the second clock.

IPC Classes  ?

  • G01C 19/5726 - Signal processing
  • G01C 19/5733 - Structural details or topology
  • G01C 25/00 - Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass

31.

SEMICONDUCTOR PACKAGE WITH OVERLAPPING LEADS AND DIE PAD

      
Application Number 18169146
Status Pending
Filing Date 2023-02-14
First Publication Date 2023-08-31
Owner STMicroelectronics, Inc. (Philippines)
Inventor Talledo, Jefferson

Abstract

The present disclosure is directed to a package having a die on a die pad that has a first portion and a second portion, the second portion being larger than the first portion in a first direction. The package includes a plurality of leads, where at least a first lead has a first surface coplanar with a first, lower surface of the first portion of the die pad. The first lead having a second surface that is transverse to the first surface of the first lead. The second surface being an external surface of the lead and package. The second portion of the die pad being an extension that is overlapping the first lead.

IPC Classes  ?

  • H01L 23/495 - Lead-frames
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings

32.

MULTISPECTRAL IMAGER

      
Application Number 18108110
Status Pending
Filing Date 2023-02-10
First Publication Date 2023-08-17
Owner
  • STMicroelectronics (Grenoble 2) SAS (France)
  • STMicroelectronics, Inc. (USA)
Inventor
  • Steckel, Jonathan
  • Pattantyus-Abraham, Andras G.

Abstract

An imaging device includes a first layer made of quantum dots and a second layer including at least two filter regions extending over the first layer. The at least two filter regions are configured to transmit distinct wavelengths. The quantum dots of the first layer are configured to generate charges upon reception of light in the distinct wavelengths.

IPC Classes  ?

  • G01J 3/28 - Investigating the spectrum
  • H01L 31/0352 - SEMICONDUCTOR DEVICES NOT COVERED BY CLASS - Details thereof characterised by their semiconductor bodies characterised by their shape or by the shapes, relative sizes or disposition of the semiconductor regions

33.

Lead frame for improving adhesive fillets on semiconductor die corners

      
Application Number 18303471
Grant Number 12170240
Status In Force
Filing Date 2023-04-19
First Publication Date 2023-08-10
Grant Date 2024-12-17
Owner STMicroelectronics, Inc. (Philippines)
Inventor
  • Rodriguez, Rennier
  • Maming, Maiden Grace
  • Talledo, Jefferson Sismundo

Abstract

The present disclosure is directed to a lead frame including a die pad with cavities, and methods for attaching a semiconductor die to the lead frame. The cavities allow for additional adhesive to be formed on the die pad at the corners of the semiconductor die, and prevent the additional adhesive from overflowing on to active areas of the semiconductor die.

IPC Classes  ?

  • H01L 23/49 - Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads or terminal arrangements consisting of soldered or bonded constructions wire-like
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 23/495 - Lead-frames

34.

Door unlock mechanism

      
Application Number 18178201
Grant Number 11808063
Status In Force
Filing Date 2023-03-03
First Publication Date 2023-06-29
Grant Date 2023-11-07
Owner
  • STMicroelectronics S.r.l. (Italy)
  • STMicroelectronics, Inc. (USA)
Inventor
  • Sy, Williamson
  • Piccinelli, Emiliano Mario
  • Walters, Keith

Abstract

A method and device for unlatching a door from a frame, using a keyless door latch system, is provided. In one embodiment, a secondary unlocking component receives a signal and derives power from the signal to provide a power source for the keyless door latch system. A microcontroller generates a control signal and an actuator, in response to receiving the control signal, actuates the secondary unlocking component, which allows an energy source, from an exterior of the door, to be transferred to the keyless door latch system for the unlatching of the door.

IPC Classes  ?

  • E05B 81/90 - Manual override in case of power failure
  • E05B 77/54 - Automatic securing or unlocking of bolts triggered by certain vehicle parameters, e.g. exceeding a speed threshold
  • E05B 81/46 - Clutches
  • E05B 81/56 - Control of actuators
  • E05B 81/80 - Electrical circuits characterised by the power supplyEmergency power operation
  • B60R 25/24 - Means to switch the anti-theft system on or off using electronic identifiers containing a code not memorised by the user
  • E05B 77/02 - Vehicle locks characterised by special functions or purposes for accident situations

35.

Die embedded in substrate with stress buffer

      
Application Number 18168319
Grant Number 12080657
Status In Force
Filing Date 2023-02-13
First Publication Date 2023-06-15
Grant Date 2024-09-03
Owner STMicroelectronics, Inc. (Philippines)
Inventor Talledo, Jefferson Sismundo

Abstract

The present disclosure is directed to a package, such as a wafer level chip scale package (WLCSP) or a package containing a semiconductor die, with a die embedded within a substrate that is surrounded by an elastomer. The package includes nonconductive layers on surfaces of the substrate and the elastomer as well as conductive layers and conductive vias that extend through these layers to form electrical connections in the package. The package includes surfaces of the conductive material, which may be referred to as contacts. These surfaces of the conductive material are exposed on both sides of the package and allow the package to be mounted within an electronic device and have other electronic components coupled to the package, or allow the package to be included in a stacked configuration of semiconductor dice or packages.

IPC Classes  ?

  • H01L 23/538 - Arrangements for conducting electric current within the device in operation from one component to another the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 21/683 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for supporting or gripping
  • H01L 23/00 - Details of semiconductor or other solid state devices

36.

METHOD, SYSTEM, AND CIRCUITS FOR RF LOW-LATENCY, MULTIPLE PRIORITY COMMUNICATION

      
Application Number 17542272
Status Pending
Filing Date 2021-12-03
First Publication Date 2023-06-08
Owner STMICROELECTRONICS, INC. (USA)
Inventor Gentili, Maurizio

Abstract

System, method, and circuitry for utilizing a transmit token to create a floating transmission window for multiple priority data in half-duplex communication systems. A first computing device selects audio data and control data to transmit to a second computing device based on a first low priority for audio data relative to a second high priority for control data and on buffer statuses. In response to the first computing device determining that the first computing device possesses a transmit token, the first computing device transmits the selected audio data and the selected control data to the second computing device. The first computing device then transmits the transmit token to the second computing device. The first computing device then waits for the transmit token to be returned before transmitting more data to the second computing device.

IPC Classes  ?

  • H04L 47/62 - Queue scheduling characterised by scheduling criteria

37.

Device and method for decoding data from wireless signals

      
Application Number 17538803
Grant Number 12009954
Status In Force
Filing Date 2021-11-30
First Publication Date 2023-06-08
Grant Date 2024-06-11
Owner STMICROELECTRONICS, INC. (USA)
Inventor Vitali, Andrea Lorenzo

Abstract

An electronic device receives wireless signals encoded with data in an amplitude-shift keying format. The electronic device passes the wireless signals through a low-pass filter. The low-pass filter has a cutoff frequency between a first frequency associated with data values of a first type and a second frequency associated with data values of a second type. The low-pass filter has the effect of changing the wireless signal from the amplitude-shift keying format to an on-off keying format without losing the data. The electronic device decodes the data from the wireless signal in the on-off keying format.

IPC Classes  ?

  • H04L 27/06 - Demodulator circuitsReceiver circuits

38.

Automatic skew calibration circuit for pattern-dependent dynamic wave shaping for HDD preamplifier write

      
Application Number 17710608
Grant Number 11657846
Status In Force
Filing Date 2022-03-31
First Publication Date 2023-05-23
Grant Date 2023-05-23
Owner
  • STMicroelectronics S.r.l. (Italy)
  • STMicroelectronics, Inc. (USA)
Inventor
  • Mammei, Enrico
  • Sanna, Paolo
  • Hogg, Dennis
  • Contini, Edoardo

Abstract

A method to determine a relative delay between a current-overshoot signal and a write data signal for a hard disk drive preamplifier, the method including using a memory element to strobe a test current-overshoot signal with a test data signal; counting a number of strobed transitions of the test current-overshoot signal; adjusting the delay based on the number of strobed transitions; setting a phase difference between the current-overshoot signal and the write data signal according to the delay; and using the memory element to strobe the current-overshoot signal with the write data signal.

IPC Classes  ?

39.

System and method to increase display area utilizing a plurality of discrete displays

      
Application Number 18063028
Grant Number 12223218
Status In Force
Filing Date 2022-12-07
First Publication Date 2023-04-06
Grant Date 2025-02-11
Owner
  • STMICROELECTRONICS, INC. (USA)
  • STMICROELECTRONICS INTERNATIONAL N.V. (Netherlands)
Inventor
  • Vigna, Benedetto
  • Chowdhary, Mahesh
  • Dameno, Matteo

Abstract

A method includes receiving, at a master agent, announcements from candidate consumer agents indicating the presence of the candidate consumer agents. Each announcement includes display parameters for a display of the corresponding candidate consumer agent. The method further includes receiving at the master agent content parameters from a producer agent, the content parameters defining characteristics of content to be provided by the consumer agent. A mosaic screen is configured based on the received announcements and the content parameters. This configuring of the mosaic screen includes selecting ones of the consumer agents for which an announcement was received and generating content distribution parameters based on the content parameters and the display parameters of the selected ones of the consumer agents. The generated content distribution parameters are provided to the consumer agent.

IPC Classes  ?

  • G06F 3/14 - Digital output to display device
  • G01P 1/07 - Indicating devices, e.g. for remote indication
  • G06F 3/12 - Digital output to print unit

40.

DEVICE WITH TIME STAMP SYNCHRONIZING AND RELATED METHOD

      
Application Number 17953848
Status Pending
Filing Date 2022-09-27
First Publication Date 2023-03-30
Owner STMICROELECTRONICS, INC. (USA)
Inventor Ciocca, Denis

Abstract

A device includes processing circuitry and sensor communication interface circuitry. The processing circuitry, in operation, generates one or more parameters of a regression model based on a plurality of data sets. Each data set includes an application time stamp and a sensor time stamp. Based on the one or more parameters, the processing circuitry estimates application time stamps associated with received sensor data samples. The received sensor data samples have associated sensor time stamps. The sensor communication interface circuitry is coupled to the processing circuitry. The sensor communication interface circuitry, in operation, communicatively couples the processing circuitry to a sensor. Data samples of the sensor are received by the processor via the sensor communication interface circuitry.

IPC Classes  ?

  • H04L 67/12 - Protocols specially adapted for proprietary or special-purpose networking environments, e.g. medical networks, sensor networks, networks in vehicles or remote metering networks
  • H04L 67/1095 - Replication or mirroring of data, e.g. scheduling or transport for data synchronisation between network nodes

41.

Methods and devices to identify focal objects

      
Application Number 17987280
Grant Number 11800224
Status In Force
Filing Date 2022-11-15
First Publication Date 2023-03-16
Grant Date 2023-10-24
Owner
  • STMicroelectronics, Inc. (USA)
  • STMicroelectronics (Research & Development) Limited (United Kingdom)
Inventor
  • Winterton, Darin K.
  • Baxter, Donald
  • Hodgson, Andrew
  • Lunn, Gordon
  • Pothier, Olivier
  • Vadlamudi-Reddy, Kalyan-Kumar

Abstract

A method includes dividing a field of view into a plurality of zones and sampling the field of view to generate a photon count for each zone of the plurality of zones, identifying a focal sector of the field of view and analyzing each zone to select a final focal object from a first prospective focal object and a second prospective focal object.

IPC Classes  ?

  • H04N 23/67 - Focus control based on electronic image sensor signals
  • H04N 23/61 - Control of cameras or camera modules based on recognised objects

42.

LEADFRAME WITH VARYING THICKNESSES AND METHOD OF MANUFACTURING SEMICONDUCTOR PACKAGES

      
Application Number 17889251
Status Pending
Filing Date 2022-08-16
First Publication Date 2023-03-02
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor Talledo, Jefferson Sismundo

Abstract

The present disclosure is directed to semiconductor packages manufactured utilizing a leadframe with varying thicknesses. The leadframe with varying thicknesses has a reduced likelihood of deformation while being handled during the manufacturing of the semiconductor packages as well as when being handled during a shipping process. The method of manufacturing is not required to utilize a leadframe tape based on the leadframe with varying thicknesses. This reduces the overall manufacturing costs of the semiconductor packages due to the reduced materials and steps in manufacturing the semiconductor packages as compared to a method that utilizes a leadframe tape to support a leadframe. The semiconductor packages may include leads of varying thicknesses formed by utilizing the leadframe of varying thicknesses to manufacture the semiconductor packages.

IPC Classes  ?

  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 23/495 - Lead-frames
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings

43.

Robotic device with time-of-flight proximity sensing system

      
Application Number 17884492
Grant Number 12226909
Status In Force
Filing Date 2022-08-09
First Publication Date 2023-02-02
Grant Date 2025-02-18
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Peng, Cheng
  • Yang, Xiaoyong

Abstract

A robotic device including one or more proximity sensing systems coupled to various portions of a robot body. The proximity sensing systems detect a distance of an object about the robot body and the robotic device reacts based on the detected distance. The proximity sensing systems obtain a three-dimensional (3D) profile of the object to determine a category of the object. The distance of the object is detected multiple times in a sequence to determine a movement path of the object.

IPC Classes  ?

44.

LEADLESS SEMICONDUCTOR PACKAGE WITH DE-METALLIZED POROUS STRUCTURES AND METHOD FOR MANUFACTURING THE SAME

      
Application Number 17811804
Status Pending
Filing Date 2022-07-11
First Publication Date 2023-02-02
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor Arellano, Ian Harvey Juralbal

Abstract

A semiconductor package device having a porous copper adhesion promoter layer is provided. The porous copper adhesion promoter layer developed via de-metallization of the intermetallic compound layer grown after the thermal treatment of a thin metal layer plated on the copper base material. The highly selective de-metallization of the intermetallic compound layer ensures that the plated surfaces are not affected and does not create wire-bondability issues. The porous copper layer solves the delamination between the carrier and the epoxy molding compound by providing mechanical interlock features. Further, increasing the surface area of contact between the carrier and the epoxy molding compound improves the mechanical interlock features.

IPC Classes  ?

  • H01L 23/495 - Lead-frames
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement

45.

Method and apparatus for cryptographically aligning and binding a secure element with a host device

      
Application Number 17939385
Grant Number 11991276
Status In Force
Filing Date 2022-09-07
First Publication Date 2023-01-05
Grant Date 2024-05-21
Owner STMICROELECTRONICS, INC. (USA)
Inventor Pilozzi, Giuseppe

Abstract

A secure element device that is configured to be cryptographically bound to a host device includes a secure element host key slot configured to store host key information that allows only the host device to control the secure element, a secure memory storing binding information, and limited functionality allowing the binding information to be read from the secure memory by the host device during a binding process. The binding information is cryptographically correlated with the host key information. The host key information is generated by the host device using the binding information read from the secure element and a secret key. The secure element device further includes general functionality only accessible to the host device using the host key information that is generated by the host device. The secure memory includes prevention measures impeding unauthorized entities from obtaining information from the secure memory.

IPC Classes  ?

  • H04L 9/08 - Key distribution
  • G06F 8/61 - Installation
  • G06F 11/14 - Error detection or correction of the data by redundancy in operation, e.g. by using different operation sequences leading to the same result
  • H04L 9/14 - Arrangements for secret or secure communicationsNetwork security protocols using a plurality of keys or algorithms
  • H04L 9/30 - Public key, i.e. encryption algorithm being computationally infeasible to invert and users' encryption keys not requiring secrecy
  • H04L 9/32 - Arrangements for secret or secure communicationsNetwork security protocols including means for verifying the identity or authority of a user of the system

46.

Dynamic memory protection device system and method

      
Application Number 17307893
Grant Number 11921655
Status In Force
Filing Date 2021-05-04
First Publication Date 2022-11-10
Grant Date 2024-03-05
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Panzica, Massimo
  • Gentili, Maurizio

Abstract

A microcontroller includes a memory, direct memory access (DMA) controllers and a microprocessor. The microprocessor maintains one or more memory protection (MP) configurations to control access to protected memory areas of the microcontroller. In response to a secure service call of an unsecure user-application, the microprocessor executes a state machine which disables interrupt requests, determining whether DMA controller configurations and MP configurations satisfy secure-service criteria. When the secure-service criteria are satisfied, at least one secure operation associated with the secure service call is performed, and memory areas accessed during the execution of the at least one secure operation are cleaned. The interrupt requests are re-enabled and a response to the secure service call is generated.

IPC Classes  ?

  • G06F 13/28 - Handling requests for interconnection or transfer for access to input/output bus using burst mode transfer, e.g. direct memory access, cycle steal
  • G06F 13/24 - Handling requests for interconnection or transfer for access to input/output bus using interrupt
  • H04L 9/32 - Arrangements for secret or secure communicationsNetwork security protocols including means for verifying the identity or authority of a user of the system

47.

POWER AND SECURITY ADJUSTMENT FOR FACE IDENTIFICATION WITH REFLECTIVITY DETECTION BY A RANGING SENSOR

      
Application Number 17856586
Status Pending
Filing Date 2022-07-01
First Publication Date 2022-10-20
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Deleule, Arnaud
  • Kvam, John E.
  • Vadlamudi-Reddy, Kalyan-Kumar

Abstract

The present disclosure is directed to a system and method of controlling a facial recognition process by validating preconditions with a ranging sensor. The ranging sensor transmits a ranging signal that is reflected off of a user's face and received back at the ranging sensor. The received ranging signal can be used to determine distance between the user's face and the mobile device or to determine the reflectivity of the user's face. Comparing the distance to a range of distances corresponding to normal operation of the device or normal reflectivities associated with human skin tones can reduce the number of false positive activations of the facial recognition process. Furthermore, a multiple zone ranging sensor can produce a face depth map that can be compared to a stored face depth map or can produce a reflectivity map that can be compared to a stored face reflectivity map to further increase power efficiency and device security.

IPC Classes  ?

  • G01B 11/02 - Measuring arrangements characterised by the use of optical techniques for measuring length, width, or thickness
  • G01C 3/02 - Measuring distances in line of sightOptical rangefinders Details
  • H04N 5/232 - Devices for controlling television cameras, e.g. remote control
  • G06T 7/521 - Depth or shape recovery from laser ranging, e.g. using interferometryDepth or shape recovery from the projection of structured light
  • G01S 17/00 - Systems using the reflection or reradiation of electromagnetic waves other than radio waves, e.g. lidar systems
  • G01S 17/89 - Lidar systems, specially adapted for specific applications for mapping or imaging
  • G06V 40/16 - Human faces, e.g. facial parts, sketches or expressions

48.

Semiconductor device having cavities at an interface of an encapsulant and a die pad or leads

      
Application Number 17845867
Grant Number 11862579
Status In Force
Filing Date 2022-06-21
First Publication Date 2022-10-06
Grant Date 2024-01-02
Owner STMicroelectronics, Inc. (USA)
Inventor Arellano, Ian Harvey

Abstract

In various embodiments, the present disclosure provides semiconductor devices, packages, and methods. In one embodiment, a device includes a die pad, a lead that is spaced apart from the die pad, and an encapsulant on the die pad and the lead. A plurality of cavities extends into at least one of the die pad or the lead to a depth from a surface of the at least one of the die pad or the lead. The depth is within a range from 0.5 μm to 5 μm. The encapsulant extends into the plurality of cavities. The cavities facilitate improved adhesion between the die pad or lead and the encapsulant, as the cavities increase a surface area of contact with the encapsulant, and further increase a mechanical interlock with the encapsulant, as the cavities may have a rounded or semi-spherical shape.

IPC Classes  ?

  • H01L 23/495 - Lead-frames
  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or

49.

Method of manufacturing semiconductor devices and corresponding semiconductor device

      
Application Number 17688013
Grant Number 12211772
Status In Force
Filing Date 2022-03-07
First Publication Date 2022-09-15
Grant Date 2025-01-28
Owner
  • STMicroelectronics S.r.l. (Italy)
  • STMicroelectronics, Inc. (Philippines)
Inventor
  • Fontana, Fulvio Vittorio
  • Benelli, Davide Maria
  • Talledo, Jefferson Sismundo

Abstract

A semiconductor device, such as a Quad-Flat No-lead (QFN) package, includes a semiconductor chip arranged on a die pad of a leadframe. The leadframe has an array of electrically-conductive leads around the die pad. The leads in the array have distal ends facing away from the die pad as well as recessed portions at an upper surface of the leads. Resilient material, such as low elasticity modulus material, is present at the upper surface of the leads and filling the recessed portions. An insulating encapsulation is molded onto the semiconductor chip. The resilient material is sandwiched between the insulating encapsulation and the distal ends of the leads. This resilient material facilitates flexibility of the leads, making them suited for reliable soldering to an insulated metal substrate.

IPC Classes  ?

  • H01L 23/495 - Lead-frames
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 23/16 - Fillings or auxiliary members in containers, e.g. centering rings
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 23/00 - Details of semiconductor or other solid state devices

50.

BOTTOM PACKAGE EXPOSED DIE MEMS PRESSURE SENSOR INTEGRATED CIRCUIT PACKAGE DESIGN

      
Application Number 17752567
Status Pending
Filing Date 2022-05-24
First Publication Date 2022-09-08
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor
  • Cadag, Aaron
  • Arellano, Frederick
  • Antilano, Jr., Ernesto

Abstract

A MEMS pressure sensor packaged with a molding compound. The MEMS pressure sensor features a lead frame, a MEMS semiconductor die, a second semiconductor die, multiple pluralities of bonding wires, and a molding compound. The MEMS semiconductor die has an internal chamber, a sensing component, and apertures. The MEMS semiconductor die and the apertures are exposed to an ambient atmosphere. A method is desired to form a MEMS pressure sensor package that reduces defects caused by mold flashing and die cracking. Fabrication of the MEMS pressure sensor package comprises placing a lead frame on a lead frame tape; placing a MEMS semiconductor die adjacent to the lead frame and on the lead frame tape with the apertures facing the tape and being sealed thereby; attaching a second semiconductor die to the MEMS semiconductor die; attaching pluralities of bonding wires to form electrical connections between the MEMS semiconductor die, the second semiconductor die, and the lead frame; and forming a molding compound.

IPC Classes  ?

  • H01L 23/495 - Lead-frames
  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • B81B 7/00 - Microstructural systems
  • B81C 1/00 - Manufacture or treatment of devices or systems in or on a substrate

51.

System and method for fast magnetometer calibration using gyroscope

      
Application Number 17135628
Grant Number 11815568
Status In Force
Filing Date 2020-12-28
First Publication Date 2022-06-30
Grant Date 2023-11-14
Owner STMicroelectronics, Inc. (USA)
Inventor
  • Jain, Mahaveer
  • Chowdhary, Mahesh

Abstract

An electronic device includes a magnetometer that outputs magnetometer sensor signals and a gyroscope that outputs gyroscope sensor signals. The electronic device includes a magnetometer calibration module that calibrates the magnetometer utilizing the gyroscope sensor signals. The electronic device generates a first magnetometer calibration parameter based on a Kalman filter process. The electronic device generates a second magnetometer calibration parameter based on a least squares estimation process.

IPC Classes  ?

  • G01R 33/00 - Arrangements or instruments for measuring magnetic variables
  • G01C 25/00 - Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass

52.

Threshold adjustment for quantum dot array devices with metal source and drain

      
Application Number 17574329
Grant Number 12107144
Status In Force
Filing Date 2022-01-12
First Publication Date 2022-05-05
Grant Date 2024-10-01
Owner STMICROELECTRONICS, INC. (USA)
Inventor Zhang, John H.

Abstract

t. Use of a mass spectrometer during film deposition can assist in varying the composition of the quantum dot film. The metallic quantum dots can be incorporated into ion-doped source and drain regions. Alternatively, the metallic quantum dots can be incorporated into epitaxially doped source and drain regions.

IPC Classes  ?

  • H01L 29/45 - Ohmic electrodes
  • H01L 21/265 - Bombardment with wave or particle radiation with high-energy radiation producing ion implantation
  • H01L 21/66 - Testing or measuring during manufacture or treatment
  • H01L 21/8238 - Complementary field-effect transistors, e.g. CMOS
  • H01L 29/41 - Electrodes characterised by their shape, relative sizes or dispositions
  • H01L 29/66 - Types of semiconductor device
  • H01L 29/775 - Field-effect transistors with one-dimensional charge carrier gas channel, e.g. quantum wire FET
  • H01L 29/778 - Field-effect transistors with two-dimensional charge carrier gas channel, e.g. HEMT
  • H01L 29/10 - Semiconductor bodies characterised by the shapes, relative sizes, or dispositions of the semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified, or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
  • H01L 29/165 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System in uncombined form including two or more of the elements provided for in group in different semiconductor regions
  • H01L 29/417 - Electrodes characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
  • H01L 29/423 - Electrodes characterised by their shape, relative sizes or dispositions not carrying the current to be rectified, amplified or switched
  • H01L 29/49 - Metal-insulator semiconductor electrodes

53.

AUTOMATIC FILTER SELECTION IN DECISION TREE FOR MACHINE LEARNING CORE

      
Application Number 17085593
Status Pending
Filing Date 2020-10-30
First Publication Date 2022-05-05
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Jain, Mahaveer
  • Chowdhary, Mahesh

Abstract

Technological advancements are disclosed that utilize inertial sensor data for multiple classes to select a combination of filters to extract information though features to train a machine learning core decision tree. A determination is made whether the data for a class includes a frequency peak or dominating frequency that contains significant information about the class. In response to the data for the class including a frequency peak, a peak-based frequency range is determined. An entropy value is calculated for multiple frequency ranges in the data for the class. An entropy-based frequency range is selected from the multiple frequency ranges having a minimum entropy value. A frequency of interest is selected from the peak-based frequency range and the entropy-based frequency range for the class. A combination of filters is selected for each frequency of interest for each class and a decision tree is trained based on selected filter combination.

IPC Classes  ?

  • G06N 5/00 - Computing arrangements using knowledge-based models
  • G06N 20/00 - Machine learning

54.

SEMICONDUCTOR PACKAGE WITH ELECTROMAGNETIC SHIELD

      
Application Number 17509758
Status Pending
Filing Date 2021-10-25
First Publication Date 2022-05-05
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor
  • Manalo, Endalicio
  • Rodriguez, Rennier

Abstract

The present disclosure is directed to a semiconductor package that include a non-conductive encapsulation layer encapsulation an integrated circuit chip, and a conductive encapsulation layer over the non-conductive encapsulation layer. A lead is exposed from the non-conductive encapsulation layer and contacts the conductive encapsulation layer. The conductive encapsulation layer and the lead provide EMI shielding for the integrated circuit chip.

IPC Classes  ?

  • H01L 23/552 - Protection against radiation, e.g. light
  • H01L 23/495 - Lead-frames
  • H01L 23/29 - Encapsulation, e.g. encapsulating layers, coatings characterised by the material
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement

55.

DEAD RECKONING BY DETERMINING MISALIGNMENT ANGLE BETWEEN MOVEMENT DIRECTION AND SENSOR HEADING DIRECTION

      
Application Number 17532792
Status Pending
Filing Date 2021-11-22
First Publication Date 2022-03-17
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Jain, Mahaveer
  • Chowdhary, Mahesh

Abstract

A device including microelectromechanical systems (MEMS) sensors is used in dead reckoning in conditions where Global Positioning System (GPS) signals or Global Navigation Satellite System (GNSS) signals are lost. The device is capable of tracking the location of the device after the GPS/GNSS signals are lost by using MEMS sensors such as accelerometers and gyroscopes. By calculating a misalignment angle between a sensor frame of the device with either the movement direction of the vehicle or the walking direction of a pedestrian using the MEMS sensors, the device can accurately calculate the location of a user of the device even without the GPS/GNSS signals. Accordingly, a device capable of tracking the location of a pedestrian and a user riding in a vehicle without utilizing GPS/GNSS signals can be provided.

IPC Classes  ?

  • G01C 21/16 - NavigationNavigational instruments not provided for in groups by using measurement of speed or acceleration executed aboard the object being navigatedDead reckoning by integrating acceleration or speed, i.e. inertial navigation
  • G01C 21/20 - Instruments for performing navigational calculations
  • G01C 21/28 - NavigationNavigational instruments not provided for in groups specially adapted for navigation in a road network with correlation of data from several navigational instruments
  • G01S 19/47 - Determining position by combining measurements of signals from the satellite radio beacon positioning system with a supplementary measurement the supplementary measurement being an inertial measurement, e.g. tightly coupled inertial

56.

Method for motion estimation in a vehicle, corresponding device and computer program product

      
Application Number 17470962
Grant Number 11834054
Status In Force
Filing Date 2021-09-09
First Publication Date 2022-03-17
Grant Date 2023-12-05
Owner
  • STMICROELECTRONICS S.r.l. (Italy)
  • STMICROELECTRONICS, INC. (USA)
  • STMicroelectronics (Grand Ouest) SAS (France)
Inventor
  • Palella, Nicola Matteo
  • Colombo, Leonardo
  • Donadel, Andrea
  • Mura, Roberto
  • Jain, Mahaveer
  • Philippe, Joëlle

Abstract

A system includes inertial sensors and a GPS. The system generates a first estimated vehicle velocity based on motion data and positioning data, generates a second estimated vehicle velocity based on the processed motion data and the first estimated vehicle velocity, and generates fused datasets indicative of position, velocity and attitude of a vehicle based on the processed motion data, the positioning data and the second estimated vehicle velocity. The generating the second estimated vehicle velocity includes: filtering the motion data, transforming the filtered motion data in a frequency domain based on the first estimated vehicle velocity, generating spectral power density signals, generating an estimated wheel angular frequency and an estimated wheel size based on the spectral power density signals, and generating the second estimated vehicle velocity as a function of the estimated wheel angular frequency and the estimated wheel size.

IPC Classes  ?

  • B60W 40/11 - Pitch movement
  • B60W 40/101 - Side slip angle of tyre
  • B60W 40/112 - Roll movement
  • B60W 40/114 - Yaw movement
  • G01S 19/47 - Determining position by combining measurements of signals from the satellite radio beacon positioning system with a supplementary measurement the supplementary measurement being an inertial measurement, e.g. tightly coupled inertial

57.

System and method for detecting human presence based on depth sensing and inertial measurement

      
Application Number 17006594
Grant Number 11727719
Status In Force
Filing Date 2020-08-28
First Publication Date 2022-03-03
Grant Date 2023-08-15
Owner STMicroelectronics, Inc. (USA)
Inventor
  • Yang, Xiaoyong
  • Vadlamudi-Reddy, Kalyan-Kumar

Abstract

An electronic device includes a depth sensor and an inertial measurement unit. The electronic device detects a presence of the user of the electronic device by analyzing a combination of inertial sensor signals from the inertial measurement unit and depth sensor signals from the depth sensor.

IPC Classes  ?

  • G06V 40/16 - Human faces, e.g. facial parts, sketches or expressions
  • G06F 18/25 - Fusion techniques
  • G06F 18/214 - Generating training patternsBootstrap methods, e.g. bagging or boosting
  • G01B 7/30 - Measuring arrangements characterised by the use of electric or magnetic techniques for measuring angles or tapersMeasuring arrangements characterised by the use of electric or magnetic techniques for testing the alignment of axes
  • G01C 19/00 - GyroscopesTurn-sensitive devices using vibrating massesTurn-sensitive devices without moving massesMeasuring angular rate using gyroscopic effects
  • G01S 17/08 - Systems determining position data of a target for measuring distance only
  • G01S 17/894 - 3D imaging with simultaneous measurement of time-of-flight at a 2D array of receiver pixels, e.g. time-of-flight cameras or flash lidar
  • G01B 11/22 - Measuring arrangements characterised by the use of optical techniques for measuring depth
  • G01P 15/18 - Measuring accelerationMeasuring decelerationMeasuring shock, i.e. sudden change of acceleration in two or more dimensions

58.

MEMS gyroscope control circuit

      
Application Number 17504994
Grant Number 11662205
Status In Force
Filing Date 2021-10-19
First Publication Date 2022-02-03
Grant Date 2023-05-30
Owner STMicroelectronics, Inc. (USA)
Inventor
  • Fang, Deyou
  • Tsai, Chao-Ming
  • Alwardi, Milad
  • Hu, Yamu
  • Mcclure, David

Abstract

A microelectromechanical system (MEMS) gyroscope includes a driving mass and a driving circuit that operates to drive the driving mass in a mechanical oscillation at a resonant drive frequency. An oscillator generates a system clock that is independent of and asynchronous to the resonant drive frequency. A clock generator circuit outputs a first clock and a second clock that are derived from the system clock. The drive loop of the driving circuit including an analog-to-digital converter (ADC) circuit that is clocked by the first clock and a digital signal processing (DSP) circuit that is clocked by the second clock.

IPC Classes  ?

  • G01C 19/5726 - Signal processing
  • G01C 25/00 - Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
  • G01C 19/5733 - Structural details or topology

59.

Tapeless leadframe package with exposed integrated circuit die

      
Application Number 17342765
Grant Number 11916090
Status In Force
Filing Date 2021-06-09
First Publication Date 2022-01-06
Grant Date 2024-02-27
Owner STMicroelectronics, Inc. (Philippines)
Inventor
  • Cadag, Aaron
  • Serapio, Rohn Kenneth
  • Cadag, Ela Mia

Abstract

A first side of a tapeless leadframe package is etched to form a ring shaped protrusion and a lead protrusion extending from a base layer. An integrated circuit die is mounted to tapeless leadframe package in flip chip orientation with a front side facing the first side. An electrical and mechanical attachment is made between a bonding pad of the integrated circuit die and the lead protrusion. A mechanical attachment is made between the front side of the integrated circuit die and the ring shaped protrusion. The integrated circuit die and the protrusions from the tapeless leadframe package are encapsulated within an encapsulating block. The second side of the tapeless leadframe package is then etched to remove portions of the base layer and define a lead for a leadframe from the lead protrusion and further define a die support for the leadframe from the ring shaped protrusion.

IPC Classes  ?

  • H01L 31/0203 - Containers; Encapsulations
  • H01L 27/146 - Imager structures
  • H01L 23/495 - Lead-frames
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 23/00 - Details of semiconductor or other solid state devices

60.

Device, system and method for synchronizing of data from multiple sensors

      
Application Number 17356180
Grant Number 11968602
Status In Force
Filing Date 2021-06-23
First Publication Date 2021-12-30
Grant Date 2024-04-23
Owner
  • STMICROELECTRONICS S.r.l. (Italy)
  • STMICROELECTRONICS, INC. (USA)
Inventor
  • Sayed, Karimuddin
  • Pabla, Chandandeep Singh
  • Bracco, Lorenzo
  • Rizzardini, Federico

Abstract

In an embodiment, a device comprises a memory, which, in operation, stores data samples associated with a plurality of data sensors, and circuitry, coupled to the memory, wherein the circuitry, in operation, generates synchronized output data sets associated with the plurality of data sensors. Generating a synchronized output data set includes: determining a reference sample associated with a sensor of the plurality of sensors; verifying a timing validity of a data sample associated with another sensor of the plurality of sensors; identifying a closest-in-time data sample associated with the another sensor of the plurality of sensors with respect to the reference sample; and generating the synchronized output data set based on interpolation.

IPC Classes  ?

  • H04W 4/38 - Services specially adapted for particular environments, situations or purposes for collecting sensor information
  • G01D 5/244 - Mechanical means for transferring the output of a sensing memberMeans for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for convertingTransducers not specially adapted for a specific variable using electric or magnetic means influencing characteristics of pulses or pulse trainsMechanical means for transferring the output of a sensing memberMeans for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for convertingTransducers not specially adapted for a specific variable using electric or magnetic means generating pulses or pulse trains
  • G01D 9/00 - Recording measured values
  • H04W 4/70 - Services for machine-to-machine communication [M2M] or machine type communication [MTC]

61.

SEMICONDUCTOR DEVICE PACKAGES HAVING CAP WITH INTEGRATED ELECTRICAL LEADS

      
Application Number 17346766
Status Pending
Filing Date 2021-06-14
First Publication Date 2021-12-16
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor
  • Rodriguez, Rennier
  • Soriano, John Alexander
  • Cadag, Aaron

Abstract

One or more embodiments are directed to semiconductor device packages having a cap with integrated metal interconnects or conductive leads. One embodiment is directed to a semiconductor device package that includes a cap having a cover extending along a first direction and sidewalls extending from the cover along a second direction that is transverse to the first direction. A plurality of electrical leads are disposed on inner surfaces of the sidewalls and extend over lower surfaces of the sidewalls. A semiconductor die is attached to an inner surface of the cover of the cap, and the semiconductor die is electrically coupled to the plurality of electrical leads.

IPC Classes  ?

  • H01L 23/043 - ContainersSeals characterised by the shape the container being a hollow construction and having a conductive base as a mounting as well as a lead for the semiconductor body
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 21/52 - Mounting semiconductor bodies in containers
  • H01L 23/495 - Lead-frames

62.

Integrated circuit devices and fabrication techniques

      
Application Number 17159013
Grant Number 11705458
Status In Force
Filing Date 2021-01-26
First Publication Date 2021-12-16
Grant Date 2023-07-18
Owner STMICROELECTRONICS, INC. (USA)
Inventor Zhang, John H.

Abstract

Single gate and dual gate FinFET devices suitable for use in an SRAM memory array have respective fins, source regions, and drain regions that are formed from portions of a single, contiguous layer on the semiconductor substrate, so that STI is unnecessary. Pairs of FinFETs can be configured as dependent-gate devices wherein adjacent channels are controlled by a common gate, or as independent-gate devices wherein one channel is controlled by two gates. Metal interconnects coupling a plurality of the FinFET devices are made of a same material as the gate electrodes. Such structural and material commonalities help to reduce costs of manufacturing high-density memory arrays.

IPC Classes  ?

  • H01L 27/12 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being other than a semiconductor body, e.g. an insulating body
  • H01L 21/266 - Bombardment with wave or particle radiation with high-energy radiation producing ion implantation using masks
  • H01L 21/8238 - Complementary field-effect transistors, e.g. CMOS
  • H01L 21/84 - Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices to produce devices, e.g. integrated circuits, each consisting of a plurality of components the substrate being other than a semiconductor body, e.g. being an insulating body
  • H01L 23/528 - Layout of the interconnection structure
  • H01L 27/092 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate complementary MIS field-effect transistors
  • H01L 29/06 - Semiconductor bodies characterised by the shapes, relative sizes, or dispositions of the semiconductor regions
  • H01L 29/66 - Types of semiconductor device
  • H01L 29/161 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System in uncombined form including two or more of the elements provided for in group
  • H01L 29/78 - Field-effect transistors with field effect produced by an insulated gate
  • H10B 10/00 - Static random access memory [SRAM] devices
  • H10B 20/00 - Read-only memory [ROM] devices

63.

System and method to increase display area utilizing a plurality of discrete displays

      
Application Number 17380754
Grant Number 11550531
Status In Force
Filing Date 2021-07-20
First Publication Date 2021-11-11
Grant Date 2023-01-10
Owner
  • STMICROELECTRONICS, INC. (USA)
  • STMICROELECTRONICS INTERNATIONAL N.V. (Netherlands)
Inventor
  • Vigna, Benedetto
  • Chowdhary, Mahesh
  • Dameno, Matteo

Abstract

A method includes receiving, at a master agent, announcements from candidate consumer agents indicating the presence of the candidate consumer agents. Each announcement includes display parameters for a display of the corresponding candidate consumer agent. The method further includes receiving at the master agent content parameters from a producer agent, the content parameters defining characteristics of content to be provided by the consumer agent. A mosaic screen is configured based on the received announcements and the content parameters. This configuring of the mosaic screen includes selecting ones of the consumer agents for which an announcement was received and generating content distribution parameters based on the content parameters and the display parameters of the selected ones of the consumer agents. The generated content distribution parameters are provided to the consumer agent.

IPC Classes  ?

  • G06F 3/14 - Digital output to display device
  • G01P 1/07 - Indicating devices, e.g. for remote indication

64.

Die embedded in substrate with stress buffer

      
Application Number 17221374
Grant Number 11610851
Status In Force
Filing Date 2021-04-02
First Publication Date 2021-11-04
Grant Date 2023-03-21
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor Talledo, Jefferson Sismundo

Abstract

The present disclosure is directed to a package, such as a wafer level chip scale package (WLCSP) or a package containing a semiconductor die, with a die embedded within a substrate that is surrounded by an elastomer. The package includes nonconductive layers on surfaces of the substrate and the elastomer as well as conductive layers and conductive vias that extend through these layers to form electrical connections in the package. The package includes surfaces of the conductive material, which may be referred to as contacts. These surfaces of the conductive material are exposed on both sides of the package and allow the package to be mounted within an electronic device and have other electronic components coupled to the package, or allow the package to be included in a stacked configuration of semiconductor dice or packages.

IPC Classes  ?

  • H01L 23/538 - Arrangements for conducting electric current within the device in operation from one component to another the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 21/683 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for supporting or gripping

65.

Method for manufacturing leadless semiconductor package with wettable flanks

      
Application Number 17353684
Grant Number 11929259
Status In Force
Filing Date 2021-06-21
First Publication Date 2021-10-07
Grant Date 2024-03-12
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor
  • Arellano, Ian Harvey
  • Cadag, Aaron
  • Cadag, Ela Mia

Abstract

The present disclosure is directed to leadless semiconductor packages with improved wettable flanks that encourage the formation of solder fillets when the leadless semiconductor package is mounted to a substrate. The solder fillets are consistently formed and are easily detectable by inspection systems, such as automated optical inspection (AOI) systems.

IPC Classes  ?

  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 23/495 - Lead-frames
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings

66.

Multiple threshold checkers for specific applications and FFT based breathing detection for presence

      
Application Number 16832515
Grant Number 12016670
Status In Force
Filing Date 2020-03-27
First Publication Date 2021-09-30
Grant Date 2024-06-25
Owner
  • STMICROELECTRONICS (GRENOBLE 2) SAS (France)
  • STMICROELECTRONICS, INC. (USA)
Inventor
  • Vadlamudi-Reddy, Kalyan-Kumar
  • Winterton, Darin K
  • Felter, Pierre-Loic
  • Lemarchand, Olivier

Abstract

In accordance with embodiments, methods and systems for utilizing multiple threshold checkers are provided. A range sensor collects measurement data. The range sensor examines the measurement data based on multiple threshold checkers to determine satisfaction of a trigger condition. In response to the satisfaction of the trigger condition, the range sensor provides the measurement data to a host computing device of the range sensor.

IPC Classes  ?

  • A61B 5/08 - Measuring devices for evaluating the respiratory organs
  • G06F 17/14 - Fourier, Walsh or analogous domain transformations

67.

Multiple threshold checkers for specific applications and FFT based breathing detection for presence

      
Application Number 17081319
Grant Number 12001259
Status In Force
Filing Date 2020-10-27
First Publication Date 2021-09-30
Grant Date 2024-06-04
Owner
  • STMICROELECTRONICS, INC. (USA)
  • STMICROELECTRONICS (GRENOBLE 2) SAS (France)
Inventor
  • Lemarchand, Olivier
  • Felter, Pierre-Loic
  • Winterton, Darin K
  • Vadlamudi-Reddy, Kalyan-Kumar

Abstract

In accordance with embodiments, methods and systems for utilizing multiple threshold checkers are provided. A range sensor collects measurement data. The range sensor examines the measurement data based on multiple threshold checkers to determine satisfaction of a trigger condition. In response to the satisfaction of the trigger condition, the range sensor provides the measurement data to a host computing device of the range sensor.

IPC Classes  ?

  • G06F 1/3231 - Monitoring the presence, absence or movement of users
  • G01S 7/41 - Details of systems according to groups , , of systems according to group using analysis of echo signal for target characterisationTarget signatureTarget cross-section
  • G01S 13/56 - Discriminating between fixed and moving objects or between objects moving at different speeds for presence detection

68.

METHOD AND SYSTEM FOR UPDATING MACHINE LEARNING BASED CLASSIFIERS FOR RECONFIGURABLE SENSORS

      
Application Number 17321251
Status Pending
Filing Date 2021-05-14
First Publication Date 2021-09-02
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Chowdhary, Mahesh
  • Jain, Mahaveer

Abstract

A sensor management system includes a cloud-based sensor configuration system and an electronic device. The electronic device includes a sensor unit. The sensor unit includes configuration data that controls operation of the sensor unit. The configuration data includes a classifier that classifies feature sets generated from sensor signals of the sensor unit. The electronic device sends sensor data to the cloud-based sensor configuration system. The cloud-based sensor configuration system analyzes the sensor data and generates a new classifier customized for the sensor unit based on the sensor data. The cloud-based sensor configuration system sends the new classifier to the electronic device. The electronic device replaces the classifier in the sensor unit with the new classifier.

IPC Classes  ?

  • G06N 20/20 - Ensemble learning
  • G06N 5/00 - Computing arrangements using knowledge-based models

69.

Lead frame for improving adhesive fillets on semiconductor die corners

      
Application Number 17317818
Grant Number 11664239
Status In Force
Filing Date 2021-05-11
First Publication Date 2021-08-26
Grant Date 2023-05-30
Owner STMicroelectronics, Inc. (Philippines)
Inventor
  • Rodriguez, Rennier
  • Maming, Maiden Grace
  • Talledo, Jefferson

Abstract

The present disclosure is directed to a lead frame including a die pad with cavities, and methods for attaching a semiconductor die to the lead frame. The cavities allow for additional adhesive to be formed on the die pad at the corners of the semiconductor die, and prevent the additional adhesive from overflowing on to active areas of the semiconductor die.

IPC Classes  ?

  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 23/495 - Lead-frames
  • H01L 23/00 - Details of semiconductor or other solid state devices

70.

Leadframe with pad anchoring members and method of forming the same

      
Application Number 17306363
Grant Number 11699667
Status In Force
Filing Date 2021-05-03
First Publication Date 2021-08-19
Grant Date 2023-07-11
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor Talledo, Jefferson

Abstract

A leadframe having extensions around an outer edge of a die pad are disclosed. More specifically, leadframes are created with a flange formed at the outer edge of the die pad and extending away from the die pad. The flange is bent, such that it is positioned at an angle with respect to the die pad. Leadframes are also created with anchoring posts formed adjacent the outer edge of the die pad and extending away from the die pad. The anchoring posts have a central thickness that is less than a thickness of first and second portions opposite the central portion. When the leadframe is incorporated into a package, molding compound completely surrounds each flange or anchoring post, which increases the bond strength between the leadframe and the molding compound due to increased contact area. The net result is a reduced possibility of delamination at edges of the die pad.

IPC Classes  ?

  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 23/495 - Lead-frames
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or

71.

Device and method for monitoring HVAC air filter

      
Application Number 17137204
Grant Number 12044423
Status In Force
Filing Date 2020-12-29
First Publication Date 2021-07-08
Grant Date 2024-07-23
Owner
  • STMICROELECTRONICS S.r.l. (Italy)
  • STMICROELECTRONICS, INC. (USA)
Inventor
  • Dameno, Matteo
  • Tesi, Mario
  • Bianco, Marco
  • Chowdhary, Mahesh
  • Ferraina, Michele

Abstract

The present disclosure is directed to an air filter sensor system that can monitor a status of a filter and provide information to a remote system regarding the filter's status. The system can receive, by a computing server via one or more computer networks and from each of a plurality of sensor assemblies coupled to a corresponding plurality of air filters, information indicative of filter contamination levels respectively associated with each corresponding air filter of the plurality of air filters. Each of the respective filter contamination levels being provided by one sensor assembly of the plurality of sensor assemblies based at least in part on a difference in detected air pressure between first and second sides of the corresponding air filter. The system tracks the respective filter contamination levels over a first period of time and determines, by the computing server and based at least in part on the tracking of the respective filter contamination levels, a schedule for one or more maintenance events associated with a first air filter of the plurality of air filters.

IPC Classes  ?

72.

Context awareness of a smart device through sensing transient and continuous events

      
Application Number 17207294
Grant Number 11467180
Status In Force
Filing Date 2021-03-19
First Publication Date 2021-07-08
Grant Date 2022-10-11
Owner
  • STMICROELECTRONICS, INC. (USA)
  • STMICROELECTRONICS INTERNATIONAL N.V. (Netherlands)
Inventor
  • Chowdhary, Mahesh
  • Kumar, Arun
  • Singh, Ghanapriya
  • Bahl, Rajendar

Abstract

A distributed computing system for artificial intelligence in autonomously appreciating a circumstance context of a smart device. Raw context data is detected by sensors associated with the smart device. The raw context data is pre-processed by the smart device and then provided to a cloud based server for further processing. At the cloud based server, various sets of feature data are obtained from the pre-processed context data. The various sets of feature data are compared with corresponding classification parameters to determine a classification of a continuous event and/or a classification of transient event, if any, which occur in the context. The determined classification of the continuous event and the transient event will be used to autonomously configure the smart device or another related smart device to fit the context.

IPC Classes  ?

  • G06F 1/16 - Constructional details or arrangements
  • H04W 4/029 - Location-based management or tracking services
  • G06N 20/10 - Machine learning using kernel methods, e.g. support vector machines [SVM]
  • G10L 21/10 - Transforming into visible information
  • G06K 9/62 - Methods or arrangements for recognition using electronic means
  • G01P 15/00 - Measuring accelerationMeasuring decelerationMeasuring shock, i.e. sudden change of acceleration
  • G01P 15/18 - Measuring accelerationMeasuring decelerationMeasuring shock, i.e. sudden change of acceleration in two or more dimensions
  • H04W 4/50 - Service provisioning or reconfiguring
  • G06F 3/0346 - Pointing devices displaced or positioned by the userAccessories therefor with detection of the device orientation or free movement in a 3D space, e.g. 3D mice, 6-DOF [six degrees of freedom] pointers using gyroscopes, accelerometers or tilt-sensors
  • G10L 25/51 - Speech or voice analysis techniques not restricted to a single one of groups specially adapted for particular use for comparison or discrimination
  • G06F 3/01 - Input arrangements or combined input and output arrangements for interaction between user and computer
  • H04M 1/72454 - User interfaces specially adapted for cordless or mobile telephones with means for adapting the functionality of the device according to specific conditions according to context-related or environment-related conditions
  • G10L 25/78 - Detection of presence or absence of voice signals
  • H04W 4/38 - Services specially adapted for particular environments, situations or purposes for collecting sensor information
  • H04L 67/12 - Protocols specially adapted for proprietary or special-purpose networking environments, e.g. medical networks, sensor networks, networks in vehicles or remote metering networks

73.

METHOD AND SYSTEM FOR GENERATING MACHINE LEARNING BASED CLASSIFIERS FOR RECONFIGURABLE SENSOR

      
Application Number 16728822
Status Pending
Filing Date 2019-12-27
First Publication Date 2021-07-01
Owner STMicroelectronics, Inc. (USA)
Inventor
  • Chowdhary, Mahesh
  • Jain, Mahaveer

Abstract

A sensor management system includes a cloud-based sensor configuration system and an electronic device. The electronic device includes a sensor unit. The sensor unit includes configuration data that controls operation of the sensor unit. The configuration data includes a classifier that classifies feature sets generated from sensor signals of the sensor unit. The electronic device sends sensor data to the cloud-based sensor configuration system. The cloud-based sensor configuration system analyzes the sensor data and generates a new classifier customized for the sensor unit based on the sensor data. The cloud-based sensor configuration system sends the new classifier to the electronic device. The electronic device replaces the classifier in the sensor unit with the new classifier.

IPC Classes  ?

  • G06N 20/00 - Machine learning
  • G06N 5/00 - Computing arrangements using knowledge-based models

74.

Method, device, and system of measuring eye convergence angle

      
Application Number 16727795
Grant Number 11720170
Status In Force
Filing Date 2019-12-26
First Publication Date 2021-07-01
Grant Date 2023-08-08
Owner STMicroelectronics, Inc. (USA)
Inventor Barbier, Dominique Paul

Abstract

An electronic device capable of determining an eye convergence angle using a magnetometer sensor is provided. The magnetometer sensor is capable of reporting angle readings in three dimensions that is aligned with an eye gaze direction of each eye of a user. The magnetometer which is incorporated into the device can fit into a human eye like a contact lens and determine the angle of the gaze direction of both eyes with respect to an object within a field of view. By obtaining this eye convergence angle for an object, it is possible to accurately detect depth information. The electronic device also functions as a digital contact lens that can automatically adjust the focal point of the object to provide the user with a clear vision. The electronic device also includes a display that provides the user with additional information about the object.

IPC Classes  ?

  • G06F 3/01 - Input arrangements or combined input and output arrangements for interaction between user and computer
  • G01C 3/06 - Use of electric means to obtain final indication
  • G01C 3/14 - Measuring distances in line of sightOptical rangefinders using a parallactic triangle with variable angles and a base of fixed length in the observation station, e.g. in the instrument with binocular observation at a single point, e.g. stereoscopic type
  • G02C 7/04 - Contact lenses for the eyes
  • G01C 3/22 - Measuring distances in line of sightOptical rangefinders using a parallactic triangle with variable angles and a base of fixed length at, near, or formed by, the object

75.

Overvoltage protection

      
Application Number 17118028
Grant Number 11394195
Status In Force
Filing Date 2020-12-10
First Publication Date 2021-06-17
Grant Date 2022-07-19
Owner
  • STMicroelectronics (Tours) SAS (France)
  • STMicroelectronics, Inc. (USA)
Inventor
  • Rouviere, Mathieu
  • Blauser, Jr., Jeffrey
  • Grange, Karl
  • Saadna, Mohamed

Abstract

A power supply interface includes a first switch that couples an input terminal to an output terminal. A voltage dividing bridge is coupled to receive a supply potential. A comparator has a first input connected to a first node of the bridge and a second input configured to receive a constant potential. A digital-to-analog converter generates a control voltage that is selectively coupled by a second switch to a second node of the bridge. A circuit control controls actuation of the second switch based on operating mode and generates a digital value input to the converter based on a negotiated set point of the supply potential applied to the input terminal.

IPC Classes  ?

  • H02H 3/20 - Emergency protective circuit arrangements for automatic disconnection directly responsive to an undesired change from normal electric working condition, with or without subsequent reconnection responsive to excess voltage
  • G06F 1/26 - Power supply means, e.g. regulation thereof
  • G06F 11/30 - Monitoring
  • G06F 1/28 - Supervision thereof, e.g. detecting power-supply failure by out of limits supervision
  • G06F 1/30 - Means for acting in the event of power-supply failure or interruption, e.g. power-supply fluctuations
  • H02J 7/34 - Parallel operation in networks using both storage and other DC sources, e.g. providing buffering
  • G06F 1/3234 - Power saving characterised by the action undertaken
  • G06F 13/42 - Bus transfer protocol, e.g. handshakeSynchronisation

76.

Capless semiconductor package with a micro-electromechanical system (MEMS)

      
Application Number 17103796
Grant Number 11897763
Status In Force
Filing Date 2020-11-24
First Publication Date 2021-06-17
Grant Date 2024-02-13
Owner STMicroelectronics, Inc. (Philippines)
Inventor Talledo, Jefferson Sismundo

Abstract

A semiconductor package that contains an application-specific integrated circuit (ASIC) die and a micro-electromechanical system (MEMS) die. The MEMS die and the ASIC die are coupled to a substrate that includes an opening that extends through the substrate and is in fluid communication with an air cavity positioned between and separating the MEMS die from the substrate. The opening exposes the air cavity to an external environment and, following this, the air cavity exposes a MEMS element of the MEMS die to the external environment. The air cavity separating the MEMS die from the substrate is formed with a method of manufacturing that utilizes a thermally decomposable die attach material.

IPC Classes  ?

  • B81C 1/00 - Manufacture or treatment of devices or systems in or on a substrate
  • B81B 7/00 - Microstructural systems

77.

Smart push button device utilizing MEMS sensors

      
Application Number 16696772
Grant Number 11407098
Status In Force
Filing Date 2019-11-26
First Publication Date 2021-05-27
Grant Date 2022-08-09
Owner
  • STMICROELECTRONICS S.R.L. (Italy)
  • STMICROELECTRONICS, INC. (USA)
Inventor
  • Bianco, Marco
  • Bracco, Lorenzo
  • Chowdhary, Mahesh
  • Mura, Roberto
  • Rivolta, Stefano Paolo
  • Rizzardini, Federico

Abstract

A device for generating a control signal based on the linear movement of a linear member is provided. The device includes a linear member, a rotatable member, a first inertial measurement unit (IMU) coupled to the rotatable member and a second IMU having a fixed position. The device also includes a processing circuit which uses sensing signals from the IMUS to determine an attitude of the first IMU referenced to the second IMU and generate a control signal based on the attitude.

IPC Classes  ?

  • B25F 5/00 - Details or components of portable power-driven tools not particularly related to the operations performed and not otherwise provided for
  • B23B 45/00 - Hand-held or like portable drilling machines, e.g. drill gunsEquipment therefor
  • G01C 19/00 - GyroscopesTurn-sensitive devices using vibrating massesTurn-sensitive devices without moving massesMeasuring angular rate using gyroscopic effects

78.

Flat no-lead package with surface mounted structure

      
Application Number 17139669
Grant Number 12159820
Status In Force
Filing Date 2020-12-31
First Publication Date 2021-05-20
Grant Date 2024-12-03
Owner STMicroelectronics, Inc. (Philippines)
Inventor
  • Rodriguez, Rennier
  • Agudon, Aiza Marie
  • Maming, Maiden Grace

Abstract

The present disclosure is directed to a flat no-lead semiconductor package with a surfaced mounted structure. An end portion of the surface mounted structure includes a recessed member so that the surface mounted structure is coupled to leads of the flat no-lead semiconductor package through, among others, the sidewalls of the recessed members.

IPC Classes  ?

79.

Package with interlocking leads and manufacturing the same

      
Application Number 17137262
Grant Number 11557548
Status In Force
Filing Date 2020-12-29
First Publication Date 2021-04-22
Grant Date 2023-01-17
Owner STMicroelectronics, Inc. (Philippines)
Inventor
  • Cadag, Aaron
  • Belalo, Lester Joseph
  • Cadag, Ela Mia

Abstract

A semiconductor package formed utilizing multiple etching steps includes a lead frame, a die, and a molding compound. The lead frame includes leads and a die pad. The leads and the die pad are formed from a first conductive material by the multiple etching steps. More specifically, the leads and the die pad of the lead frame are formed by at least three etching steps. The at least three etching steps including a first etching step, a second undercut etching step, and a third backside etching step. The second undercut etching step forming interlocking portions at an end of each lead. The end of the lead is encased in the molding compound. This encasement of the end of the lead with the interlocking portion allows the interlocking portion to mechanically interlock with the molding compound to avoid lead pull out. In addition, by utilizing at least three etching steps the leads can be formed to have a height that is greater than the die pad of the lead frame. This differential in height reduces the span of wires used to form electrical connections within the semiconductor package. These reductions in the span of the wires reduces the chances of wire to wire and wire to die short circuiting because the wire sweep of the wires is reduced when the molding compound is placed.

IPC Classes  ?

  • H01L 23/495 - Lead-frames
  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 21/78 - Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices

80.

Flat no-lead package with surface mounted structure

      
Application Number 17131222
Grant Number 12074100
Status In Force
Filing Date 2020-12-22
First Publication Date 2021-04-15
Grant Date 2024-08-27
Owner STMicroelectronics, Inc. (Philippines)
Inventor
  • Rodriguez, Rennier
  • Agudon, Aiza Marie
  • Maming, Maiden Grace

Abstract

The present disclosure is directed to a flat no-lead semiconductor package with a surfaced mounted structure. An end portion of the surface mounted structure includes a recessed member so that the surface mounted structure is coupled to leads of the flat no-lead semiconductor package through, among others, the sidewalls of the recessed members.

IPC Classes  ?

81.

Double-tap event detection device, system and method

      
Application Number 17122999
Grant Number 11579710
Status In Force
Filing Date 2020-12-15
First Publication Date 2021-04-08
Grant Date 2023-02-14
Owner
  • STMICROELECTRONICS S.r.l. (Italy)
  • STMICROELECTRONICS, INC. (USA)
Inventor
  • Rivolta, Stefano Paolo
  • Jain, Mahaveer
  • Bhargava, Ashish

Abstract

Digital signal processing circuitry, in operation, determines, based on accelerometer data, a carry-position of a device. Double-tap detection parameters are set using the determined carry-position. Double-taps are detected using the set double-tap detection parameters. In response to detection of a double-tap, control signals, such as a flag or an interrupt signal, are generated and used to control operation of the device. For example, a device may enter a wake mode of operation in response to detection of a double-tap.

IPC Classes  ?

  • G06F 3/0346 - Pointing devices displaced or positioned by the userAccessories therefor with detection of the device orientation or free movement in a 3D space, e.g. 3D mice, 6-DOF [six degrees of freedom] pointers using gyroscopes, accelerometers or tilt-sensors
  • G06F 3/0487 - Interaction techniques based on graphical user interfaces [GUI] using specific features provided by the input device, e.g. functions controlled by the rotation of a mouse with dual sensing arrangements, or of the nature of the input device, e.g. tap gestures based on pressure sensed by a digitiser

82.

Power supply package with built-in radio frequency identification tag

      
Application Number 17108646
Grant Number 11250224
Status In Force
Filing Date 2020-12-01
First Publication Date 2021-03-25
Grant Date 2022-02-15
Owner STMicroelectronics, Inc. (USA)
Inventor Tran, John N.

Abstract

A method includes providing a power supply package (PSP) that includes a power supply, an RFID tag, and a power switch, where a control terminal of the power switch is coupled to an output terminal of the RFID tag, and load path terminals of the power switch are coupled between an output terminal of the PSP and a first terminal of the power supply, where a control register of the RFID tag is pre-programmed with a first value such that the RFID tag is configured to generate a first control signal that turns off the power switch; receiving, by the RFID tag, a second value for the control register of the RFID tag; and writing, by the RFID tag, the second value to the control register of the RFID tag such that the RFID tag is configured to generate a second control signal that turns on the power switch.

IPC Classes  ?

  • G06K 7/10 - Methods or arrangements for sensing record carriers by electromagnetic radiation, e.g. optical sensingMethods or arrangements for sensing record carriers by corpuscular radiation
  • G06K 19/07 - Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards with integrated circuit chips

83.

Semiconductor device having cavities at an interface of an encapsulant and a die pad or leads

      
Application Number 16996712
Grant Number 11393774
Status In Force
Filing Date 2020-08-18
First Publication Date 2021-02-25
Grant Date 2022-07-19
Owner STMicroelectronics, Inc. (Philippines)
Inventor Arellano, Ian Harvey

Abstract

In various embodiments, the present disclosure provides semiconductor devices, packages, and methods. In one embodiment, a device includes a die pad, a lead that is spaced apart from the die pad, and an encapsulant on the die pad and the lead. A plurality of cavities extends into at least one of the die pad or the lead to a depth from a surface of the at least one of the die pad or the lead. The depth is within a range from 0.5 μm to 5 μm. The encapsulant extends into the plurality of cavities. The cavities facilitate improved adhesion between the die pad or lead and the encapsulant, as the cavities increase a surface area of contact with the encapsulant, and further increase a mechanical interlock with the encapsulant, as the cavities may have a rounded or semi-spherical shape.

IPC Classes  ?

  • H01L 23/495 - Lead-frames
  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or

84.

Adaptive laser power and ranging limit for time of flight sensor

      
Application Number 17064398
Grant Number 12313789
Status In Force
Filing Date 2020-10-06
First Publication Date 2021-02-04
Grant Date 2025-05-27
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Yang, Xiaoyong
  • Xiao, Rui
  • Deleule, Arnaud

Abstract

A time of flight range detection device includes a laser configured to transmit an optical pulse into an image scene, a return single-photon avalanche diode (SPAD) array, a reference SPAD array, a range detection circuit coupled to the return SPAD array and the reference SPAD array, and a laser driver circuit. The range detection circuit in operation determines a distance to an object based on signals from the return SPAD array and the reference SPAD array. The laser driver circuit in operation varies an output power level of the laser in response to the determined distance to the object.

IPC Classes  ?

  • G01S 7/484 - Transmitters
  • G01S 7/486 - Receivers
  • G01S 17/10 - Systems determining position data of a target for measuring distance only using transmission of interrupted, pulse-modulated waves

85.

Method to induce strain in 3-D microfabricated structures

      
Application Number 17074121
Grant Number 11569384
Status In Force
Filing Date 2020-10-19
First Publication Date 2021-02-04
Grant Date 2023-01-31
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Loubet, Nicolas
  • Morin, Pierre

Abstract

Methods and structures for forming strained-channel finFETs are described. Fin structures for finFETs may be formed in two epitaxial layers that are grown over a bulk substrate. A first thin epitaxial layer may be cut and used to impart strain to an adjacent channel region of the finFET via elastic relaxation. The structures exhibit a preferred design range for increasing induced strain and uniformity of the strain over the fin height.

IPC Classes  ?

  • H01L 27/088 - Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including integrated passive circuit elements with at least one potential-jump barrier or surface barrier the substrate being a semiconductor body including only semiconductor components of a single kind including field-effect components only the components being field-effect transistors with insulated gate
  • H01L 29/78 - Field-effect transistors with field effect produced by an insulated gate
  • H01L 29/66 - Types of semiconductor device
  • H01L 29/10 - Semiconductor bodies characterised by the shapes, relative sizes, or dispositions of the semiconductor regions with semiconductor regions connected to an electrode not carrying current to be rectified, amplified, or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
  • H01L 29/165 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System in uncombined form including two or more of the elements provided for in group in different semiconductor regions
  • H01L 29/15 - Structures with periodic or quasi periodic potential variation, e.g. multiple quantum wells, superlattices
  • H01L 29/16 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System in uncombined form
  • H01L 29/161 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System in uncombined form including two or more of the elements provided for in group

86.

Semiconductor package with flexible interconnect

      
Application Number 16934981
Grant Number 11542152
Status In Force
Filing Date 2020-07-21
First Publication Date 2021-02-04
Grant Date 2023-01-03
Owner STMicroelectronics, Inc. (Philippines)
Inventor Talledo, Jefferson

Abstract

A cavity type semiconductor package with a substrate and a cap is disclosed. The semiconductor package includes a first semiconductor die coupled to the substrate and a layer of flexible material on a surface of the cap. A trace is on the layer of flexible material. The cap is coupled to the substrate with the layer of flexible material and the trace between the cap and the substrate. A second semiconductor die is coupled to the layer of flexible material and the trace on the cap. The cap further includes an aperture to expose the second semiconductor die to the ambient environment. The layer of flexible material absorbs stress during operation cycles of the package induced by the different coefficient of thermal expansions of the cap and the substrate to reduce the likelihood of separation of the cap from the substrate.

IPC Classes  ?

  • B81B 7/00 - Microstructural systems
  • B81C 1/00 - Manufacture or treatment of devices or systems in or on a substrate

87.

MEMS gyroscope control circuit

      
Application Number 16452850
Grant Number 11175138
Status In Force
Filing Date 2019-06-26
First Publication Date 2020-12-31
Grant Date 2021-11-16
Owner STMicroelectronics, Inc. (USA)
Inventor
  • Fang, Deyou
  • Tsai, Chao-Ming
  • Alwardi, Milad
  • Hu, Yamu
  • Mcclure, David

Abstract

A microelectromechanical system (MEMS) gyroscope includes a driving mass and a driving circuit that operates to drive the driving mass in a mechanical oscillation at a resonant drive frequency. An oscillator generates a system clock that is independent of and asynchronous to the resonant drive frequency. A clock generator circuit outputs a first clock and a second clock that are derived from the system clock. The drive loop of the driving circuit including an analog-to-digital converter (ADC) circuit that is clocked by the first clock and a digital signal processing (DSP) circuit that is clocked by the second clock.

IPC Classes  ?

  • G01C 19/5726 - Signal processing
  • G01C 25/00 - Manufacturing, calibrating, cleaning, or repairing instruments or devices referred to in the other groups of this subclass
  • G01C 19/5733 - Structural details or topology

88.

MEMS accelerometer self-test using an active mobile mass deflection technique

      
Application Number 16452904
Grant Number 11320452
Status In Force
Filing Date 2019-06-26
First Publication Date 2020-12-31
Grant Date 2022-05-03
Owner
  • STMicroelectronics, Inc. (USA)
  • STMicroelectronics S.r.l. (Italy)
Inventor
  • Hu, Yamu
  • Mcclure, David
  • Tocchio, Alessandro
  • Sahoo, Naren K.
  • Casillan, Anthony Junior

Abstract

A microelectromechanical system (MEMS) accelerometer sensor has a mobile mass and a sensing capacitor. To self-test the sensor, a test signal is applied to the sensing capacitor during a reset phase of a sensing circuit coupled to the sensing capacitor. The test signal is configured to cause an electrostatic force which produces a physical displacement of the mobile mass corresponding to a desired acceleration value. Then, during a read phase of the sensing circuit, a variation in capacitance of sensing capacitor due to the physical displacement of the mobile mass is sensed. This sensed variation in capacitance is converted to a sensed acceleration value. A comparison of the sensed acceleration value to the desired acceleration value provides an indication of an error in operation of the MEMS accelerometer sensor if the sensed acceleration value and desired acceleration value are not substantially equal.

IPC Classes  ?

  • G01P 21/00 - Testing or calibrating of apparatus or devices covered by the other groups of this subclass
  • G01P 15/08 - Measuring accelerationMeasuring decelerationMeasuring shock, i.e. sudden change of acceleration by making use of inertia forces with conversion into electric or magnetic values

89.

Semiconductor package with a cavity in a die pad for reducing voids in the solder

      
Application Number 16910824
Grant Number 11133241
Status In Force
Filing Date 2020-06-24
First Publication Date 2020-12-31
Grant Date 2021-09-28
Owner STMicroelectronics, Inc. (Philippines)
Inventor Talledo, Jefferson

Abstract

A semiconductor package having an aperture in a die pad and solder in the aperture coplanar with a surface of the package is disclosed. The package includes a die pad, a plurality of leads, and a semiconductor die coupled to the die pad with a die attach material. A cavity or aperture is formed through the die pad to expose a portion of the die attach material. Multiple solder reflows are performed to reduce the presence of voids in the die attach material. In a first solder reflow, the voids of trapped gas that form when attaching the die to the die pad are released. Then, in a second solder reflow, solder is added to the aperture coplanar with a surface of the die pad. The additional solder can be the same material as the die attach material or a different material.

IPC Classes  ?

  • H01L 23/495 - Lead-frames
  • H01L 23/44 - Arrangements for cooling, heating, ventilating or temperature compensation the complete device being wholly immersed in a fluid other than air
  • H01L 23/48 - Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads or terminal arrangements
  • H01L 21/00 - Processes or apparatus specially adapted for the manufacture or treatment of semiconductor or solid-state devices, or of parts thereof
  • H01R 9/00 - Structural associations of a plurality of mutually-insulated electrical connecting elements, e.g. terminal strips or terminal blocksTerminals or binding posts mounted upon a base or in a caseBases therefor
  • H05K 5/02 - Casings, cabinets or drawers for electric apparatus Details
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 23/00 - Details of semiconductor or other solid state devices

90.

Power supply package with built-in radio frequency identification tag

      
Application Number 16581019
Grant Number 10878207
Status In Force
Filing Date 2019-09-24
First Publication Date 2020-12-29
Grant Date 2020-12-29
Owner STMicroelectronics, Inc. (USA)
Inventor Tran, John N.

Abstract

A method includes providing a power supply package (PSP) that includes a power supply, an RFID tag, and a power switch, where a control terminal of the power switch is coupled to an output terminal of the RFID tag, and load path terminals of the power switch are coupled between an output terminal of the PSP and a first terminal of the power supply, where a control register of the RFID tag is pre-programmed with a first value such that the RFID tag is configured to generate a first control signal that turns off the power switch; receiving, by the RFID tag, a second value for the control register of the RFID tag; and writing, by the RFID tag, the second value to the control register of the RFID tag such that the RFID tag is configured to generate a second control signal that turns on the power switch.

IPC Classes  ?

  • G06K 19/00 - Record carriers for use with machines and with at least a part designed to carry digital markings
  • G06K 7/10 - Methods or arrangements for sensing record carriers by electromagnetic radiation, e.g. optical sensingMethods or arrangements for sensing record carriers by corpuscular radiation
  • G06K 19/07 - Record carriers with conductive marks, printed circuits or semiconductor circuit elements, e.g. credit or identity cards with integrated circuit chips

91.

Method and apparatus for cryptographically aligning and binding a secure element with a host device

      
Application Number 16425118
Grant Number 11444759
Status In Force
Filing Date 2019-05-29
First Publication Date 2020-12-03
Grant Date 2022-09-13
Owner STMICROELECTRONICS, INC. (USA)
Inventor Pilozzi, Giuseppe

Abstract

A method of cryptographically binding a secure element to a host device includes storing host key information in a host key information slot of the secure element and storing binding information in secure memory of the secure element. The binding information is correlated with the host key information. The method includes storing a second secret key within system operational code of the host device. The second secret key is cryptographically correlated with the host key information. The method includes, after storing the binding information and after storing the second secret key, operationally coupling the secure element to the host device, reading, by the host device, the binding information from the secure element, generating, by the host device, the host key information using the binding information and the second secret key, and storing, by the host device, the host key information in a host key information slot of the host device.

IPC Classes  ?

  • H04L 9/08 - Key distribution
  • G06F 8/61 - Installation
  • G06F 11/14 - Error detection or correction of the data by redundancy in operation, e.g. by using different operation sequences leading to the same result
  • H04L 9/14 - Arrangements for secret or secure communicationsNetwork security protocols using a plurality of keys or algorithms
  • H04L 9/30 - Public key, i.e. encryption algorithm being computationally infeasible to invert and users' encryption keys not requiring secrecy
  • H04L 9/32 - Arrangements for secret or secure communicationsNetwork security protocols including means for verifying the identity or authority of a user of the system

92.

Package with lead frame with improved lead design for discrete electrical components and manufacturing the same

      
Application Number 16945641
Grant Number 11404355
Status In Force
Filing Date 2020-07-31
First Publication Date 2020-11-19
Grant Date 2022-08-02
Owner
  • STMICROELECTRONICS PTE LTD (Singapore)
  • STMICROELECTRONICS, INC. (Philippines)
Inventor
  • Rodriguez, Rennier
  • Bacquian, Bryan Christian
  • Maming, Maiden Grace
  • Gani, David

Abstract

A semiconductor package includes a lead frame, a die, a discrete electrical component, and electrical connections. The lead frame includes leads and a die pad. Some of the leads include engraved regions that have recesses therein and the die pad may include an engraved region or multiple engraved regions. Each engraved region is formed to contain and confine a conductive adhesive from flowing over the edges of the engraved leads or the die pad. The boundary confines the conductive adhesive to the appropriate location on the engraved lead or the engraved die pad when being placed on the engraved regions. By utilizing a lead frame with engraved regions, the flow of the conductive adhesive or the wettability of the conductive adhesive can be contained and confined to the appropriate areas of the engraved lead or engraved die pad such that a conductive adhesive does not cause cross-talk between electrical components within a semiconductor package or short circuiting within a semiconductor package.

IPC Classes  ?

  • H01L 23/495 - Lead-frames
  • H01L 23/31 - Encapsulation, e.g. encapsulating layers, coatings characterised by the arrangement
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 21/56 - Encapsulations, e.g. encapsulating layers, coatings
  • H01L 21/78 - Manufacture or treatment of devices consisting of a plurality of solid state components or integrated circuits formed in, or on, a common substrate with subsequent division of the substrate into plural individual devices
  • H01L 23/00 - Details of semiconductor or other solid state devices
  • H01L 21/683 - Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereofApparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components for supporting or gripping

93.

Mobile device transportation mode management device, system and method

      
Application Number 16892161
Grant Number 10868906
Status In Force
Filing Date 2020-06-03
First Publication Date 2020-11-12
Grant Date 2020-12-15
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Jain, Mahaveer
  • Chowdhary, Mahesh

Abstract

A portable device includes one or more memories and travel mode control circuitry coupled to the one or more memories. The travel mode control circuitry, in operation, monitors motion data and detects a first travel state of the device based on the monitored motion data and an acceleration profile. When the first travel state of the device is detected, motion data and pressure data are monitored to detect a transition from the first travel state to a second travel state of the device. When the transition to the second travel state of the device is detected, one or more control signals are generated to cause the device to enter a first travel mode of operation.

IPC Classes  ?

  • H04M 1/00 - Substation equipment, e.g. for use by subscribers
  • H04M 1/725 - Cordless telephones

94.

Inertial navigation system capable of dead reckoning in vehicles

      
Application Number 16399842
Grant Number 11747142
Status In Force
Filing Date 2019-04-30
First Publication Date 2020-11-05
Grant Date 2023-09-05
Owner
  • STMICROELECTRONICS, INC. (USA)
  • STMICROELECTRONICS S.r.l. (Italy)
Inventor
  • Jain, Mahaveer
  • Chowdhary, Mahesh
  • Mura, Roberto
  • Palella, Nicola Matteo
  • Colombo, Leonardo

Abstract

A device including microelectromechanical systems (MEMS) sensors are used in dead reckoning in conditions where Global Positioning System (GPS) signals or Global Navigation Satellite System (GNSS) signals are lost. The device is capable of tracking the location of the device after the GPS/GNSS signals are lost by using MEMS sensors such as accelerometers and gyroscopes. By calculating a misalignment angle between a forward axis of a sensor frame of the device and a forward axis of a vehicle frame using the data received from the MEMS sensors, the device can accurately calculate the location of a user or the vehicle of the device even without the GPS/GNSS signals. Accordingly, a device capable of tracking the location of the user riding in the vehicle in GPS/GNSS signals absent environment can be provided.

IPC Classes  ?

  • G01C 21/16 - NavigationNavigational instruments not provided for in groups by using measurement of speed or acceleration executed aboard the object being navigatedDead reckoning by integrating acceleration or speed, i.e. inertial navigation
  • G01C 21/20 - Instruments for performing navigational calculations
  • G01S 19/49 - Determining position by combining or switching between position solutions derived from the satellite radio beacon positioning system and position solutions derived from a further system whereby the further system is an inertial position system, e.g. loosely-coupled

95.

Dead reckoning by determining misalignment angle between movement direction and sensor heading direction

      
Application Number 16399829
Grant Number 11199410
Status In Force
Filing Date 2019-04-30
First Publication Date 2020-11-05
Grant Date 2021-12-14
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Jain, Mahaveer
  • Chowdhary, Mahesh

Abstract

A device including microelectromechanical systems (MEMS) sensors is used in dead reckoning in conditions where Global Positioning System (GPS) signals or Global Navigation Satellite System (GNSS) signals are lost. The device is capable of tracking the location of the device after the GPS/GNSS signals are lost by using MEMS sensors such as accelerometers and gyroscopes. By calculating a misalignment angle between a sensor frame of the device with either the movement direction of the vehicle or the walking direction of a pedestrian using the MEMS sensors, the device can accurately calculate the location of a user of the device even without the GPS/GNSS signals. Accordingly, a device capable of tracking the location of a pedestrian and a user riding in a vehicle without utilizing GPS/GNSS signals can be provided.

IPC Classes  ?

  • G01C 21/16 - NavigationNavigational instruments not provided for in groups by using measurement of speed or acceleration executed aboard the object being navigatedDead reckoning by integrating acceleration or speed, i.e. inertial navigation
  • G01C 21/20 - Instruments for performing navigational calculations
  • G01C 21/28 - NavigationNavigational instruments not provided for in groups specially adapted for navigation in a road network with correlation of data from several navigational instruments
  • G01S 19/47 - Determining position by combining measurements of signals from the satellite radio beacon positioning system with a supplementary measurement the supplementary measurement being an inertial measurement, e.g. tightly coupled inertial

96.

Lead stabilization in semiconductor packages

      
Application Number 16848635
Grant Number 12211774
Status In Force
Filing Date 2020-04-14
First Publication Date 2020-10-29
Grant Date 2025-01-28
Owner STMICROELECTRONICS, INC. (Philippines)
Inventor
  • Cadag, Ela Mia
  • Gomez, Frederick Ray
  • Cadag, Aaron

Abstract

Generally described, one or more embodiments are directed to semiconductor packages comprising a plurality of leads and methods of forming same. The plurality of leads include active leads that are electrically coupled to bond pads of a semiconductor die and thereby coupled to active components of the semiconductor die, and inactive leads that are not electrically coupled to bond pads of the semiconductor die. The active leads have surfaces that are exposed at a lower surface of the semiconductor package and forms lands, while the inactive leads are not exposed at the lower surface of the package.

IPC Classes  ?

  • H01L 23/498 - Leads on insulating substrates
  • H01L 21/48 - Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the groups or
  • H01L 23/00 - Details of semiconductor or other solid state devices

97.

Door unlock mechanism

      
Application Number 16375577
Grant Number 11613918
Status In Force
Filing Date 2019-04-04
First Publication Date 2020-10-08
Grant Date 2023-03-28
Owner
  • STMicroelectronics S.r.l. (Italy)
  • STMicroelectronics, Inc. (USA)
Inventor
  • Sy, Williamson
  • Piccinelli, Emiliano Mario
  • Walters, Keith

Abstract

A method and device for unlatching a door from a frame, using a keyless door latch system, is provided. In one embodiment, a secondary unlocking component receives a signal and derives power from the signal to provide a power source for the keyless door latch system. A microcontroller generates a control signal and an actuator, in response to receiving the control signal, actuates the secondary unlocking component, which allows an energy source, from an exterior of the door, to be transferred to the keyless door latch system for the unlatching of the door.

IPC Classes  ?

  • E05B 81/90 - Manual override in case of power failure
  • E05B 77/54 - Automatic securing or unlocking of bolts triggered by certain vehicle parameters, e.g. exceeding a speed threshold
  • E05B 81/46 - Clutches
  • E05B 81/56 - Control of actuators
  • E05B 81/80 - Electrical circuits characterised by the power supplyEmergency power operation
  • B60R 25/24 - Means to switch the anti-theft system on or off using electronic identifiers containing a code not memorised by the user
  • E05B 77/02 - Vehicle locks characterised by special functions or purposes for accident situations

98.

Mobile device transportation mode management device, system and method

      
Application Number 16703692
Grant Number 10708413
Status In Force
Filing Date 2019-12-04
First Publication Date 2020-07-07
Grant Date 2020-07-07
Owner STMICROELECTRONICS, INC. (USA)
Inventor
  • Jain, Mahaveer
  • Chowdhary, Mahesh

Abstract

A portable device includes one or more memories and travel mode control circuitry coupled to the one or more memories. The travel mode control circuitry, in operation, monitors motion data and temperature data to detect a first travel state of the device. When the first travel state of the device is detected, motion data and pressure data are monitored to detect a transition from the first travel state to a second travel state of the device. When the transition to the second travel state of the device is detected, one or more control signals are generated to cause the device to enter a first travel mode of operation.

IPC Classes  ?

  • H04M 1/00 - Substation equipment, e.g. for use by subscribers
  • H04M 1/725 - Cordless telephones

99.

Forming replacement low-k spacer in tight pitch fin field effect transistors

      
Application Number 16743293
Grant Number 11374111
Status In Force
Filing Date 2020-01-15
First Publication Date 2020-05-14
Grant Date 2022-06-28
Owner
  • INTERNATIONAL BUSINESS MACHINES CORPORATION (USA)
  • GLOBALFOUNDRIES INC. (Cayman Islands)
  • STMICROELECTRONICS, INC. (USA)
Inventor
  • Cai, Xiuyu
  • Yeh, Chun-Chen
  • Liu, Qing
  • Xie, Ruilong

Abstract

A semiconductor device that a fin structure, and a gate structure present on a channel region of the fin structure. A composite spacer is present on a sidewall of the gate structure including an upper portion having a first dielectric constant, a lower portion having a second dielectric constant that is less than the first dielectric constant, and an etch barrier layer between sidewalls of the first and second portion of the composite spacer and the gate structure. The etch barrier layer may include an alloy including at least one of silicon, boron and carbon.

IPC Classes  ?

  • H01L 29/78 - Field-effect transistors with field effect produced by an insulated gate
  • H01L 29/66 - Types of semiconductor device
  • H01L 29/417 - Electrodes characterised by their shape, relative sizes or dispositions carrying the current to be rectified, amplified or switched
  • H01L 29/06 - Semiconductor bodies characterised by the shapes, relative sizes, or dispositions of the semiconductor regions
  • H01L 21/768 - Applying interconnections to be used for carrying current between separate components within a device
  • H01L 29/08 - Semiconductor bodies characterised by the shapes, relative sizes, or dispositions of the semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified, or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
  • H01L 29/161 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System in uncombined form including two or more of the elements provided for in group
  • H01L 29/165 - Semiconductor bodies characterised by the materials of which they are formed including, apart from doping materials or other impurities, only elements of Group IV of the Periodic System in uncombined form including two or more of the elements provided for in group in different semiconductor regions

100.

Control circuit for power switch

      
Application Number 16719053
Grant Number 10917087
Status In Force
Filing Date 2019-12-18
First Publication Date 2020-04-23
Grant Date 2021-02-09
Owner
  • STMICROELECTRONICS S.r.l. (Italy)
  • STMICROELECTRONICS, Inc. (USA)
  • STMICROELECTRONICS (ALPS) SAS (France)
Inventor
  • Poletto, Vanni
  • Swanson, David F.
  • Torrisi, Giovanni Luca
  • Chevalier, Laurent

Abstract

A circuit for controlling a first plurality of transistors connected in parallel and a second plurality of transistors connected in parallel, includes: a first plurality of stages, a respective one of the first plurality of stages being configured to supply a first control signal to a respective one of the first plurality of transistors; and a second plurality of stages, a respective one of the second plurality of stages being configured to supply a second control signal to a respective one of the second plurality of transistors. An output current of the respective one of the first plurality of stages is regulated based on a difference between a first value representative of a sum of output currents of each stage of the first plurality of stages and a second value representative of a sum of set points assigned to the first plurality of stages.

IPC Classes  ?

  • H03K 17/687 - Electronic switching or gating, i.e. not by contact-making and -breaking characterised by the use of specified components by the use, as active elements, of semiconductor devices the devices being field-effect transistors
  • G01R 19/165 - Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
  • G05B 11/42 - Automatic controllers electric with provision for obtaining particular characteristics, e.g. proportional, integral, differential for obtaining a characteristic which is both proportional and time-dependent, e.g. P. I., P. I. D.
  • G05F 1/618 - Regulating voltage or current wherein the variable actually regulated by the final control device is DC using semiconductor devices in series and in parallel with the load as final control devices
  • G05F 1/56 - Regulating voltage or current wherein the variable actually regulated by the final control device is DC using semiconductor devices in series with the load as final control devices
  • H02J 7/34 - Parallel operation in networks using both storage and other DC sources, e.g. providing buffering
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