- All sections
- G - Physics
- G01R - Measuring electric variablesmeasuring magnetic variables
- G01R 31/3193 - Tester hardware, i.e. output processing circuits with comparison between actual response and known fault-free response
Patent holdings for IPC class G01R 31/3193
Total number of patents in this class: 210
10-year publication summary
15
|
15
|
33
|
17
|
21
|
14
|
25
|
11
|
12
|
5
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
Advantest Corporation | 1830 |
14 |
International Business Machines Corporation | 60753 |
8 |
Texas Instruments Incorporated | 19472 |
7 |
Samsung Electronics Co., Ltd. | 143021 |
6 |
Teradyne, Inc. | 545 |
5 |
NXP USA, Inc. | 4253 |
5 |
Qualcomm Incorporated | 83961 |
4 |
Intel Corporation | 46631 |
4 |
Micron Technology, Inc. | 26152 |
4 |
Microchip Technology Incorporated | 2806 |
4 |
Changxin Memory Technologies, Inc. | 4925 |
4 |
Renesas Electronics Corporation | 6093 |
3 |
Taiwan Semiconductor Manufacturing Company, Ltd. | 41799 |
3 |
SK Hynix Inc. | 11122 |
3 |
Altera Corporation | 2203 |
3 |
Media Tek Singapore Pte. Ltd. | 1058 |
3 |
Realtek Semiconductor Corp. | 3254 |
3 |
IBM United Kingdom Limited | 4361 |
3 |
ROHDE & Schwarz GmbH & Co. KG | 1915 |
3 |
STMicroelectronics International N.V. | 3018 |
3 |
Other owners | 118 |