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  • All sections
  • G - Physics
  • G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
  • G01Q 70/06 - Probe tip arrays

Patent holdings for IPC class G01Q 70/06

Total number of patents in this class: 99

10-year publication summary

10
3
11
12
8
13
4
5
7
1
2016 2017 2018 2019 2020 2021 2022 2023 2024 2025

Principal owners for this class

Owner
All patents
This class
Infinitesima Limited
66
12
Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO
2369
12
Xallent Inc.
18
8
Carl Zeiss SMT GmbH
2926
4
Northwestern University
3344
4
Nearfield Instruments B.V.
49
4
The Boeing Company
19960
2
Bruker Nano, Inc.
336
2
IMEC VZW
1577
2
Industry-Academic Cooperation Foundation, Yonsei University
2407
2
Panorama Synergy, Ltd.
6
2
SensApex Oy
14
2
Washington University
1589
2
Xallent, LLC
4
2
TERA-print, LLC
10
2
UNM Rainforest Innovations
409
2
The Regents of the University of California
19780
1
Centre National de La Recherche Scientifique
10266
1
Applied Materials Israel, Ltd.
598
1
Massachusetts Institute of Technology
9975
1
Other owners 31

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