- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 70/02 - Probe holders
Patent holdings for IPC class G01Q 70/02
Total number of patents in this class: 70
10-year publication summary
|
6
|
11
|
10
|
9
|
4
|
1
|
5
|
4
|
1
|
1
|
| 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 | 2026 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Nederlandse Organisatie voor Toegepast-natuurwetenschappelijk Onderzoek TNO | 2445 |
16 |
| Nearfield Instruments B.V. | 62 |
4 |
| Shimadzu Corporation | 6364 |
3 |
| Anton Paar GmbH | 187 |
3 |
| Bruker Nano, Inc. | 381 |
3 |
| Infinitesima Limited | 72 |
3 |
| Park Systems Corp. | 40 |
3 |
| Carl Zeiss SMT GmbH | 3352 |
2 |
| Eth Zurich | 1327 |
2 |
| Vmicro | 10 |
2 |
| Schlumberger Technology Corporation | 11879 |
1 |
| International Business Machines Corporation | 62748 |
1 |
| Tsinghua University | 6233 |
1 |
| Boe Technology Group Co., Ltd. | 44409 |
1 |
| Beijing BOE Optoelectronics Technology Co., Ltd. | 3934 |
1 |
| CAMECA Instruments, Inc. | 18 |
1 |
| Cytosurge AG | 19 |
1 |
| Edan Instruments, Inc. | 173 |
1 |
| Hysitron, Inc. | 34 |
1 |
| Japan Advanced Institute of Science and Technology | 129 |
1 |
| Other owners | 19 |