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  • All sections
  • G - Physics
  • G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
  • G01Q 60/50 - MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes

Patent holdings for IPC class G01Q 60/50

Total number of patents in this class: 27

10-year publication summary

1
0
1
1
0
1
0
1
0
2
2017 2018 2019 2020 2021 2022 2023 2024 2025 2026

Principal owners for this class

Owner
All patents
This class
Akita University
105
8
Osaka University
3304
2
International Business Machines Corporation
62220
1
Taiwan Semiconductor Manufacturing Company, Ltd.
47319
1
University of South Florida
1869
1
Aalto University Foundation
308
1
Deutsches Krebsforschungszentrum Stiftung des Offentlichen Rechts
392
1
Ernst-Moritz-Arndt-Universität Greifswald
38
1
Eth Zurich
1311
1
Fundacion Ciencia para La Vida
7
1
Hitachi High-Tech Fine Systems Corporation
27
1
IMEC VZW
1752
1
Katholieke Universiteit Leuven
1253
1
Kyoto University
2887
1
Pontificia Universidad Catolica de Chile
304
1
Tokyo Institute of Technology
1328
1
The United States of America as represented by the Secretary of the Air Force
901
1
Universitat Basel
308
1
Quantamap B.V.
1
1
Other owners 0

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