- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/40 - Conductive probes
Patent holdings for IPC class G01Q 60/40
Total number of patents in this class: 55
10-year publication summary
|
2
|
0
|
3
|
2
|
6
|
3
|
3
|
6
|
5
|
2
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Taiwan Semiconductor Manufacturing Company, Ltd. | 41903 |
5 |
| The Regents of the University of California | 19780 |
3 |
| International Business Machines Corporation | 60804 |
3 |
| Hon Hai Precision Industry Co., Ltd. | 4035 |
2 |
| Tsinghua University | 5813 |
2 |
| Park Systems Corp. | 33 |
2 |
| Tianjin University | 781 |
2 |
| Universitat Autonoma de Barcelona | 317 |
2 |
| Samsung Electronics Co., Ltd. | 143303 |
1 |
| Centre National de La Recherche Scientifique | 10266 |
1 |
| Hitachi, Ltd. | 15383 |
1 |
| Angstrom Science, Inc. | 3 |
1 |
| Board of Supervisors of Louisiana State University | 31 |
1 |
| Bruker Nano, Inc. | 336 |
1 |
| Fondazione Istituto Italiano di Tecnologia | 573 |
1 |
| HORIBA, Ltd. | 804 |
1 |
| Industry-Academic Cooperation Foundation, Yonsei University | 2407 |
1 |
| Korea Institute of Machinery & Materials | 736 |
1 |
| Kyoto University | 2787 |
1 |
| Lehigh University | 165 |
1 |
| Other owners | 22 |