- All sections
- G - Physics
- G01Q - Scanning-probe techniques or apparatusapplications of scanning-probe techniques, e.g. scanning-probe microscopy [spm]
- G01Q 60/00 - Particular types of SPM [Scanning-Probe Microscopy] or apparatus thereforEssential components thereof
Patent holdings for IPC class G01Q 60/00
Total number of patents in this class: 58
10-year publication summary
|
4
|
2
|
7
|
3
|
1
|
3
|
3
|
2
|
4
|
3
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Bruker Nano, Inc. | 347 |
4 |
| International Business Machines Corporation | 61734 |
3 |
| JPK Instruments AG | 18 |
3 |
| Tiptek, LLC | 4 |
3 |
| The Regents of the University of California | 20268 |
2 |
| CAMECA | 17 |
2 |
| DCG Systems, Inc. | 55 |
2 |
| The University of Melbourne | 547 |
2 |
| Samsung Electronics Co., Ltd. | 148924 |
1 |
| ASML Netherlands B.V. | 7573 |
1 |
| Wisconsin Alumni Research Foundation | 3890 |
1 |
| Shimadzu Corporation | 6229 |
1 |
| National Institute of Advanced Industrial Science and Technology | 3793 |
1 |
| Korea Advanced Institute of Science and Technology | 4458 |
1 |
| Bruker Nano GmbH | 67 |
1 |
| Chungbuk National University Industry-Academic Cooperation Foundation | 231 |
1 |
| Cnrs | 99 |
1 |
| EMX International, LLC | 2 |
1 |
| Femtonics Kft. | 50 |
1 |
| Fudan University | 706 |
1 |
| Other owners | 25 |