- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/207 - Diffractometry, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
Patent holdings for IPC class G01N 23/207
Total number of patents in this class: 641
10-year publication summary
|
42
|
69
|
61
|
68
|
64
|
59
|
66
|
39
|
43
|
22
|
| 2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
| Owner |
All patents
|
This class
|
|---|---|---|
| Rigaku Corporation | 435 |
101 |
| Bruker AXS, Inc. | 39 |
18 |
| Shimadzu Corporation | 6169 |
16 |
| Bruker Technologies Ltd. | 84 |
16 |
| Malvern PANalytical B.V. | 131 |
13 |
| Sigray, Inc. | 81 |
10 |
| Xinmei Fontana Holding (Hong Kong) Limited | 157 |
10 |
| FEI Company | 943 |
9 |
| KLA-Tencor Corporation | 2544 |
9 |
| Shin-Etsu Chemical Co., Ltd. | 5658 |
8 |
| LG Energy Solution, Ltd. | 14982 |
8 |
| LG Chem, Ltd. | 17632 |
7 |
| Semiconductor Energy Laboratory Co., Ltd. | 11403 |
7 |
| Xnovo Technology ApS | 10 |
7 |
| KLA Corporation | 1549 |
7 |
| Bruker AXS SE | 36 |
7 |
| Danmarks Tekniske Universitet | 969 |
6 |
| JEOL Ltd. | 580 |
6 |
| Sintokogio, Ltd. | 1166 |
6 |
| Commissariat à l'énergie atomique et aux energies alternatives | 10923 |
5 |
| Other owners | 365 |