- All sections
- G - Physics
- G01N - Investigating or analysing materials by determining their chemical or physical properties
- G01N 23/044 - Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups , or by transmitting the radiation through the material and forming images of the material using laminography or tomosynthesis
Patent holdings for IPC class G01N 23/044
Total number of patents in this class: 91
10-year publication summary
0
|
2
|
5
|
12
|
16
|
18
|
20
|
12
|
5
|
6
|
2016 | 2017 | 2018 | 2019 | 2020 | 2021 | 2022 | 2023 | 2024 | 2025 |
Principal owners for this class
Owner |
All patents
|
This class
|
---|---|---|
KUB Technologies, Inc., DBA Kubtec | 48 |
9 |
Adaptix Limited | 80 |
8 |
AIX Scan, Inc. | 10 |
8 |
Saki Corporation | 26 |
6 |
Omron Corporation | 7217 |
4 |
Massachusetts Institute of Technology | 9975 |
3 |
Hologic, Inc. | 1114 |
3 |
FUJIFILM Corporation | 29172 |
2 |
Koninklijke Philips N.V. | 24468 |
2 |
Toray Industries, Inc. | 6865 |
2 |
Shimadzu Corporation | 6120 |
2 |
Carl Zeiss SMT GmbH | 2926 |
2 |
Asahi Roentgen Ind. Co., Ltd. | 4 |
2 |
Job Corporation | 31 |
2 |
The Research Foundation for The State University of New York | 1593 |
2 |
Safran Aircraft Engines | 6209 |
2 |
AlxSCAN, Inc. | 3 |
2 |
Varex Imaging Sweden AB | 14 |
2 |
General Electric Company | 17062 |
1 |
Siemens AG | 24562 |
1 |
Other owners | 26 |