A system is provided for measuring far-field characteristics of an AUT. The system includes an AUT positioner for positioning the AUT on a transverse axis; a curved reflector defining a reference focal plane corresponding to a focal point of the curved reflector at a reference position on the transverse axis of the AUT positioner; and a measurement array including feed antennas configured to communicate RF signals with the AUT via the curved reflector. A selected feed antenna is offset in a transverse direction from a reference line connecting the focal point and the reference position on the transverse axis, such that an offset focal plane corresponding to the selected feed antenna is angularly offset from the reference focal plane. The AUT positioner positions the AUT at an offset location, at which the AUT has a planar phase front parallel to the offset focal plane of the selected feed antenna.
A system and method emulate an echo signal from an emulated target in response to a radar signal from a radar DUT. The system includes an antenna configured to receive the radar signal, and to direct a reflected portion of the radar signal away from an incident direction of the radar signal at a predetermined deflection angle to prevent the radar DUT from receiving the reflected portion; and a transceiver configured to provide an RF signal having an RF frequency shifted from a frequency of the radar signal in an amount indicating a distance to the emulated target, and to transmit the RF signal to the radar DUT as an emulated echo signal. An antenna pattern includes a peak beam angled away from a normal incidence of the antenna at a beam squint angle that compensates for the predetermined deflection angle to direct the peak beam toward the radar DUT.
A system and method are provided to determine at least one of equivalent isotropic radiated power (EIRP) or effective isotropic sensitivity (EIS) of an antenna under test (AUT) in a test chamber, the AUT including an antenna array with an array phase center that is offset from a center of a quiet zone of the test chamber. The method includes performing a local beam peak direction scan of an antenna pattern of the AUT using a probe antenna located at laterally offset positions at a near-field distance from the AUT to determine a beam peak direction; performing EIRP and/or EIS near-field measurements of the AUT in the determined beam peak direction using the probe antenna located at near-field distances from the AUT in a radial direction; deriving a far-field equivalent of the EIRP and/or EIS near-field measurement along the determined beam peak direction; and deriving the beam peak direction of the AUT.
A method determines corrected TRP or TIS of an AUT in a near-field test chamber, the AUT having a phase center offset from a rotation center of the test chamber. The method includes performing EIRP or EIS measurements of the AUT at first sampling grid points on a first closed-surface geometric shape centered at the rotation center; mapping second sampling grid points to the first closed-surface geometric shape to provide mapped sampling grid points on the first closed-surface geometric shape, where the second sampling grid points are on a second closed-surface geometric shape centered at the phase center of the AUT; determining estimated EIRPs or EISs at the mapped sampling grid points using the EIRP or EIS measurements; scaling the estimated EIRPs or EISs at the mapped sampling grid points to provide scaled EIRPs or EISs; and calculating the corrected TRP or TIS based on the scaled EIRPs or EISs.
A system (100) for testing vehicular radar is described. The system (100) include a diffractive optical element (104) (DOE (104)) configured to diffract electromagnetic waves incident on a first side (103) from a radar device under test (DUT). The system (100) also includes a re-illumination element adapted to receive the electromagnetic waves diffracted from the DOE (104) from a second side (105). The re-illumination element being adapted to transmit apparent angle of arrival (AoA) electromagnetic waves back to the DOE (104).
A system tests a device under test (DUT) that includes an antenna. The system includes a probe antenna, a network emulator, and a near-field antenna. The probe antenna measures beam characteristics of a beam-locked beam emitted over the air by the antenna of the DUT as the DUT is moved relative to the probe antenna during testing of the DUT. The network emulator emulates a base station of a communications network in communications with the DUT. The near-field antenna maintains a call link between the network emulator and the DUT using surface waves between the near-field antenna and the DUT as the DUT is moved relative to the probe antenna.
A signal transmission line connector is disclosed. The signal transmission line connector includes an inner electrical conductor comprising a first male portion at an end, a second male portion at an opposing end, and a tapered portion between the first male portion and the second male portion; an outer electrical conductor; and a dielectric region disposed between the inner electrical conductor and the outer electrical conductor, the dielectric region having a taper along a length. The signal transmission line connector has a first cross-sectional area at the end, and a second cross-sectional area at the opposing end, and the second cross-sectional area is smaller than the first cross-sectional area.
An apparatus includes an electrical connector. The electrical connector is configured to electrically couple a signal transmission line to another signal transmission line. The electrical connector includes a first electrical conductor and a second electrical conductor. The first electrical conductor is disposed around a center axis. The first electrical conductor is disposed azimuthally symmetric around the center axis. The second electrical conductor is disposed around the center axis and around the first electrical conductor. The second electrical conductor is disposed azimuthally symmetric around the center axis. Faces on opposing ends of the electrical connector along the center axis are configured to mate the signal transmission line and the second electrical conductor in a first plane and the other signal transmission line and the second electrical conductor in a second plane.
H01R 13/646 - Détails de dispositifs de couplage des types couverts par les groupes ou spécialement adaptés à la haute fréquence, p. ex. structures procurant une adaptation d'impédance ou un accord de phase
H01R 24/38 - Dispositifs de couplage en deux pièces, ou l'une des pièces qui coopèrent dans ces dispositifs, caractérisés par leur structure générale ayant des contacts disposés concentriquement ou coaxialement
A coaxial cable includes, in order, a center conductor, a first dielectric layer, a resistive layer, a second dielectric layer and an outer conductor. A method of manufacturing the coaxial cable includes placing a first dielectric layer around a center conductor along a center axis, and placing a resistive layer around the first dielectric layer along the center axis. The method also includes placing a second dielectric layer around the resistive layer along the center axis, and placing an outer conductor around the second dielectric layer along the center axis.
An electrical connector configured to electrically couple a signal transmission line to another signal transmission line is disclosed. The electrical connector comprises: a first electrical conductor disposed around a center axis, the first electrical conductor having a taper along its length, wherein the first electrical conductor is substantially azimuthally symmetric around the center axis; a second electrical conductor disposed around the center axis, the second electrical conductor having the taper along its length, the second electrical conductor being substantially azimuthally symmetric around the center axis; a dielectric region comprising a gas, and disposed between the first electrical conductor and the second electrical conductor, the dielectric region having the taper along its length; and a dielectric element disposed in the dielectric region between the first and second electrical conductors, the dielectric element being substantially azimuthally symmetric around the center axis.
A test system for testing a device under test includes: a signal processor configured to generate a plurality of independent signals and to apply first fading channel characteristics to each of the independent signals to generate a plurality of first faded test signals; a test system interface configured to provide the plurality of first faded test signals to one or more signal input interfaces of the device under test (DUT); a second signal processor configured to apply second fading channel characteristics to a plurality of output signals of the DUT to generate a plurality of second faded test signals, wherein the second fading channel characteristics are derived from the first fading channel characteristics; and one or more test instruments configured to measure at least one performance characteristic of the DUT from the plurality of second faded test signals.
A test system includes: a signal processor configured to generate a plurality of orthogonal baseband sequences; a signal generator configured to supply the plurality of orthogonal baseband sequences to a corresponding plurality of RF transmitters of a device under test (DUT), wherein the RF transmitters each employ the corresponding orthogonal baseband sequence to generate a corresponding RF signal on a corresponding channel among a plurality of channels of the DUT such that the RF transmitters output a plurality of orthogonal RF signals at a same time; a combiner network configured to combine the plurality of orthogonal RF signals and to output a single signal under test; and a single channel measurement instrument configured to receive the single signal under test and to measure independently therefrom at least one characteristic of each of the RF transmitters. Orthogonal RF test signals may be used similarly to test RF receivers of the DUT.
G01R 31/00 - Dispositions pour tester les propriétés électriquesDispositions pour la localisation des pannes électriquesDispositions pour tests électriques caractérisées par ce qui est testé, non prévues ailleurs
13.
IMAGING APPARATUS HAVING A PLURALITY OF MOVABLE BEAM COLUMNS, AND METHOD OF INSPECTING A PLURALITY OF REGIONS OF A SUBSTRATE INTENDED TO BE SUBSTANTIALLY IDENTICAL
An apparatus for inspecting a substrate includes an X-Y stage that supports a substrate to be inspected and is operable to move a substrate supported thereby in X and Y directions, and an imaging system including a plurality of beam columns operable to irradiate regions of a substrate supported by the X-Y stage with beams of energy, respectively, discrete from one another. Respective ones of the beam columns are movable relative to others of the electron beam columns. A substrate may be inspected by capturing images of at least three of the regions of the substrate, creating an average image of all but one of the captured images, producing a difference image by subtracting the average image from the one image not used to create the average image, and analyzing pixels of the difference image.
A probe includes a main electro-optical modulator (130), first (150) and second (160) optical couplers each having a respective input (152, 162), through (154, 164) and isolated (156, 166) port, and reference (170) and test (174) optical detectors. Reference light and test light, respectively, are received at the Inputs (152, 162) of the optical couplers (150, 160). Main electro-optical modulator 130 Includes an RF through-line (136) between input (132) and output (134) RF connectors, and a modulator optical path (138) alongside the RF through-line. The first and second optical couplers couple the reference and test light to opposite ends of the modulator optical path. The reference and test optical detectors are coupled to the second and first isolated ports (166, 156), respectively, to generate reference and test IF signals respectively representing forward and reverse RF signal propagation along the RF through-line. The received reference and test light is modulated at an LO frequency, or an auxiliary electro-optical modulator (180) is provided to modulate unmodulated received light.
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