Siemens Industry Software Inc.

États‑Unis d’Amérique

Retour au propriétaire

1-100 de 253 pour Siemens Industry Software Inc. Trier par
Recheche Texte
Brevet
International - WIPO
Affiner par Reset Report
Date
Nouveautés (dernières 4 semaines) 5
2025 novembre (MACJ) 3
2025 octobre 5
2025 septembre 9
2025 août 4
Voir plus
Classe IPC
G06F 30/10 - CAO géométrique 27
G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation 24
G06F 30/17 - Conception mécanique paramétrique ou variationnelle 17
G06F 113/10 - Fabrication additive, p. ex. impression en 3D 16
G06F 30/20 - Optimisation, vérification ou simulation de l’objet conçu 16
Voir plus
Résultats pour  brevets
  1     2     3        Prochaine page

1.

METHOD OF FILTERING A SPATIAL INDEX

      
Numéro d'application US2024026782
Numéro de publication 2025/230506
Statut Délivré - en vigueur
Date de dépôt 2024-04-29
Date de publication 2025-11-06
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Fitt, Andrew
  • Johannsen, Andreas Hugo Walter

Abrégé

A computer implemented method for filtering a spatial index is provided. When implemented in a rendering loop, the computer implemented method reduces a number of client server calls by removing item paths that are not visible in the configured product early in the rendering loop. The method includes identifying a subset of spatial bounding boxes that are visible from a given viewpoint of a scene displayed on a client device, communicating a request to a product management server to obtain model data for each of the spatial bounding boxes in the subset, receiving a message from the product management server in response to the request, and filtering the subset based on the message

Classes IPC  ?

  • G06Q 10/0875 - Énumération ou classification des pièces, des fournitures ou des services, p. ex. nomenclatures
  • G06F 16/22 - IndexationStructures de données à cet effetStructures de stockage
  • G06F 30/10 - CAO géométrique
  • G06Q 50/04 - Fabrication
  • G06T 17/00 - Modélisation tridimensionnelle [3D] pour infographie

2.

SYSTEM AND METHOD FOR MANAGING QUERIES PERTAINING TO A PRODUCT

      
Numéro d'application US2025026924
Numéro de publication 2025/231047
Statut Délivré - en vigueur
Date de dépôt 2025-04-29
Date de publication 2025-11-06
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Dave, Manal
  • Gandhe, Ajay
  • Kelkar, Nikhil
  • Shabbir, Patheria

Abrégé

A system and method for managing queries pertaining to a product are provided. The method includes receiving, by a processing unit, a user query from a user device. Further, one or more contexts are identified from a plurality of contexts by comparing the user query with each context among the plurality of contexts. Each of the contexts includes values of one or more attributes characteristic to at least a part of the product. Further, a prompt is generated by updating the user query based on the one or more contexts identified. The prompt is provided as input to a Large Language Model to generate a natural language output, on an output device.

Classes IPC  ?

3.

A MANUFACTURING PROCESS

      
Numéro d'application US2024027156
Numéro de publication 2025/230523
Statut Délivré - en vigueur
Date de dépôt 2024-05-01
Date de publication 2025-11-06
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Mysore, Vadiraj
  • Dhatrak, Nilam
  • Walker, Jeffrey A.

Abrégé

A computer-implemented method in a manufacturing process to manufacture an object using at least one manufacturing machine is disclosed. The method comprises, obtaining model data representing the object, determining one or more features of the object represented by the model data by generating for each feature a respective feature descriptor in the form of a vector of numbers describing characteristics of the respective feature and performing a machine-learning model on each feature descriptor to classify the respective feature and determining the one or more features based on the classifications, determining machine operations to manufacture the determined features, and determining an order of performance of the determined machine operations to manufacture the determined features.

Classes IPC  ?

  • G05B 19/418 - Commande totale d'usine, c.-à-d. commande centralisée de plusieurs machines, p. ex. commande numérique directe ou distribuée [DNC], systèmes d'ateliers flexibles [FMS], systèmes de fabrication intégrés [IMS], productique [CIM]

4.

METHOD AND APPARATUS FOR DESIGNING COOLING CHANNEL, DEVICE AND STORAGE MEDIUM

      
Numéro d'application CN2024089855
Numéro de publication 2025/222445
Statut Délivré - en vigueur
Date de dépôt 2024-04-25
Date de publication 2025-10-30
Propriétaire
  • SIEMENS INDUSTRY SOFTWARE INC. (USA)
  • SIEMENS LTD., CHINA (Chine)
Inventeur(s)
  • Wang, Liwen
  • Li, Daping
  • Yang, Jianwu
  • Wang, Jingmei

Abrégé

Embodiments of the present disclosure provide a method and apparatus for designing a cooling channel, an electronic device and a computer storage medium. The method includes: acquiring a product molding line contained in a mold; receiving cooling channel quantity information, the cooling channel quantity information representing a quantity of cooling channels; generating a target polygon in the mold for an enclosed area formed by the product molding line, the target polygon being located inside the enclosed area, or, the target polygon containing the enclosed area, the target polygon having the quantity of sides matching the quantity of the cooling channels; and determining positions of the cooling channels in the mold based on positions of sides of the target polygon, to generate the cooling channels based on the positions of the cooling channels in the mold. The solution provided by the embodiments of the present disclosure may improve a design efficiency and a cooling effect.

Classes IPC  ?

  • B29C 33/02 - Moules ou noyauxLeurs détails ou accessoires comportant des moyens incorporés de chauffage ou de refroidissement
  • B29C 45/73 - Chauffage ou refroidissement du moule

5.

KERNEL BASED MODELING OF EDGE INTERACTIONS IN THREE-DIMENSIONAL PHOTOMASK TRANSMISSION

      
Numéro d'application US2024024702
Numéro de publication 2025/216744
Statut Délivré - en vigueur
Date de dépôt 2024-04-16
Date de publication 2025-10-16
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Clifford, Christopher
  • Raghuram, Nikhil

Abrégé

Methods for use in integrated circuit design and corresponding systems and computer- readable mediums. A method includes receiving (902) a mask pattern for a semiconductor layer. The method includes creating (904) edge grids (322, 324, 326, 328, 330) corresponding to the mask pattern and creating (906) proximity grids (1002) corresponding to the mask pattern. The method includes convolving (908) each edge grid (322, 324, 326, 328, 330) and each proximity grid (1002) with a corresponding kernel (700) and summing (910) the convolutions and a rastered mask grid to produce a final mask pattern. The method includes performing (912) a simulation of a manufacturing process using the final mask pattern.

Classes IPC  ?

  • G03F 1/36 - Masques à correction d'effets de proximitéLeur préparation, p. ex. procédés de conception à correction d'effets de proximité [OPC optical proximity correction]
  • G03F 1/70 - Adaptation du tracé ou de la conception de base du masque aux exigences du procédé lithographique, p. ex. correction par deuxième itération d'un motif de masque pour l'imagerie
  • G03F 7/00 - Production par voie photomécanique, p. ex. photolithographique, de surfaces texturées, p. ex. surfaces impriméesMatériaux à cet effet, p. ex. comportant des photoréservesAppareillages spécialement adaptés à cet effet

6.

ANALOG SIMULATION OF CIRCUIT DESIGNS WITH TEMPORAL PARALLELISM AND TIME-VARIANT REDUCTION

      
Numéro d'application US2024021946
Numéro de publication 2025/207095
Statut Délivré - en vigueur
Date de dépôt 2024-03-28
Date de publication 2025-10-02
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Silk, Ryan
  • Puckett, Joshua

Abrégé

A computing system (101) implementing a design verification system (300) to alter (401) a circuit design (301) describing an electronic system into a simplified representation of the circuit design (313), and also implement an analog simulator (340) to perform (402) a simulation of the simplified representation of the circuit design. The design verification system can identify (403) circuit activity (317) corresponding to the electronic system in different temporal windows during the simulation of the simplified representation of the circuit design, perform (404) a topological analysis of the circuit design based, at least in part, on the identified circuit activity in the different temporal windows. The design verification system can modify (405) the circuit design into a plurality of circuit design subsets corresponding to the different temporal windows based, at least in part, on the topological analysis.

Classes IPC  ?

  • G06F 30/367 - Vérification de la conception, p. ex. par simulation, programme de simulation avec emphase de circuit intégré [SPICE], méthodes directes ou de relaxation

7.

DETERMINING PARASITIC ELEMENTS OF AN INTERCONNECT OF AN ELECTRONIC CIRCUIT LAYOUT

      
Numéro d'application US2024022026
Numéro de publication 2025/207098
Statut Délivré - en vigueur
Date de dépôt 2024-03-28
Date de publication 2025-10-02
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Saleh, Mohamed Saleh Abouelyazid
  • Falbo, James K.
  • Petranovic, Dusan

Abrégé

The invention relates to a method for determining parasitic elements of an interconnect of an electronic circuit layout. To facilitate determining the parasitic elements, the method includes determining an interconnect parasitic model from a plurality of interconnect parasitic models of the interconnect based on a comparison between at least one performance indicator associated with each one of the interconnect parasitic models, and determining the parasitic elements of the interconnect based on the determined interconnect parasitic model.

Classes IPC  ?

  • G06F 30/398 - Vérification ou optimisation de la conception, p. ex. par vérification des règles de conception [DRC], vérification de correspondance entre géométrie et schéma [LVS] ou par les méthodes à éléments finis [MEF]
  • G06F 30/33 - Vérification de la conception, p. ex. simulation fonctionnelle ou vérification du modèle
  • G06F 30/333 - Conception en vue de la testabilité [DFT], p. ex. chaîne de balayage ou autotest intégré [BIST]
  • G06F 30/367 - Vérification de la conception, p. ex. par simulation, programme de simulation avec emphase de circuit intégré [SPICE], méthodes directes ou de relaxation
  • G06F 30/373 - Optimisation de la conception
  • G06F 11/00 - Détection d'erreursCorrection d'erreursContrôle de fonctionnement

8.

CIRCUIT FUNCTIONAL SIGNAL MONITORING BASED ON SIGNATURE GENERATION

      
Numéro d'application US2024021908
Numéro de publication 2025/207094
Statut Délivré - en vigueur
Date de dépôt 2024-03-28
Date de publication 2025-10-02
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Krzewski, Marcin
  • Hlond, Marcin
  • Rajski, Janusz

Abrégé

A circuit configured to monitor functional signals comprises a signal selection unit configured to select signals for monitoring from one or more signal sources and a signature generation unit configured to generate signatures for the selected signals. The signature generation unit comprises one or more multiple-input signature registers. Each of the one or more multiple-input signature registers being constructed based on an n-bit hybrid ring generator.

Classes IPC  ?

  • G06F 21/57 - Certification ou préservation de plates-formes informatiques fiables, p. ex. démarrages ou arrêts sécurisés, suivis de version, contrôles de logiciel système, mises à jour sécurisées ou évaluation de vulnérabilité

9.

REGION-BASED FILTERING OF PARASITIC NETWORKS FOR CIRCUIT TEST SIMULATIONS

      
Numéro d'application US2024024952
Numéro de publication 2025/198606
Statut Délivré - en vigueur
Date de dépôt 2024-04-17
Date de publication 2025-09-25
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Bakhali, Abdellah
  • Srinivasan, Sridhar
  • Thompson, Alex
  • Geoletsyan, Grigor
  • Sargsyan, Lusine

Abrégé

Systems and methods are presented for region-specific filtering of parasitic networks for circuit test simulations. A method may include performing a circuit test through a parasitic network extracted for a circuit design, including by defining a region of the circuit design based on test locations specified for the circuit test and performing a tile filtering to remove any tiles for the specific nets that do not intersect with the region. Performing the circuit test may also include, for remaining tiles after the tile filtering, performing a resistor-filtering to remove any parasitic resistors in the remaining tiles that do not intersect with the region, obtaining a filtered parasitic network by performing a network-filtering on the parasitic network to remove network portions that do correspond to remaining parasitic resistors in the remaining tiles after the resistor-filtering, and performing a simulation for the circuit test through the filtered parasitic network.

Classes IPC  ?

  • G06F 30/367 - Vérification de la conception, p. ex. par simulation, programme de simulation avec emphase de circuit intégré [SPICE], méthodes directes ou de relaxation
  • G06F 115/12 - Cartes de circuits imprimés [PCB] ou modules multi-puces [MCM]

10.

FAULT PARTITION NODE SYSTEMS FOR CIRCUIT DESIGN, TEST AND DIAGNOSIS

      
Numéro d'application US2024044186
Numéro de publication 2025/183730
Statut Délivré - en vigueur
Date de dépôt 2024-08-28
Date de publication 2025-09-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Cheng, Wu-Tung

Abrégé

Fault Partition Node Systems for Circuit Design, Test and Diagnosis Techniques for generating a fault partition node system (also referred to as asymmetric partition tree (APT)) for a circuit design (330). The fault partition node system comprise equivalent fault group information extracted from a huge amount of fault simulation data for the circuit design. The related equivalent fault group information allows the fault partition node system to shrink or expand under certain conditions. Based on the fault partition node system, diagnosis coverage values can be predicted for various constraints, which can be employed to make circuit designs diagnosis friendly (350). The fault partition node system can also comprise diagnose-care bit information. Dictionary-like diagnosis can be performed more efficiently using the fault partition node system (360).

Classes IPC  ?

  • G06F 30/3308 - Vérification de la conception, p. ex. simulation fonctionnelle ou vérification du modèle par simulation
  • G06F 30/333 - Conception en vue de la testabilité [DFT], p. ex. chaîne de balayage ou autotest intégré [BIST]
  • G01R 31/3183 - Génération de signaux d'entrée de test, p. ex. vecteurs, formes ou séquences de test
  • G06F 119/22 - Analyse de rendement ou optimisation de rendement

11.

DIAGNOSIS POINTS FOR SCAN CHAIN FAILURE DIAGNOSIS USING CONTROLLABLE INVERTER IN SCAN CHAIN SHIFT PATH

      
Numéro d'application US2024053821
Numéro de publication 2025/183759
Statut Délivré - en vigueur
Date de dépôt 2024-10-31
Date de publication 2025-09-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Cheng, Wu-Tung
  • Sharma, Manish
  • Yang, Xin

Abrégé

A scan chain comprises two neighboring scan cells (K + 1) and K and a controllable inverting device inserted between a serial output of the scan cell (K + 1) and a serial input of the scan cell K. The selection of the scan cell K for the insertion of the controllable inverting device (diagnosis point insertion) is determined based on a diagnosis coverage analysis process. The scan cell K is configured to operate in one of a plurality of test-related modes based on a regular scan enable signal and a diagnosis mode signal. The plurality of test-related modes comprises a diagnosis capture mode in which the scan cell K is configured to capture the inverted version of a bit received at the data input of the controllable inverting device. The diagnosis mode signal may be provided by a storage device.

Classes IPC  ?

  • G11C 29/32 - Accès séquentielTest par balayage

12.

DIAGNOSIS COVERAGE AND PERFORMANCE ENHANCEMENT

      
Numéro d'application US2025017509
Numéro de publication 2025/184285
Statut Délivré - en vigueur
Date de dépôt 2025-02-27
Date de publication 2025-09-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Urban, Szczepan
  • Janicki, Jakub
  • Cheng, Wu-Tung
  • Sharma, Manish

Abrégé

A fault partition node system is created for a circuit design based on fault simulation for each of a plurality of test patterns. Based on the fault partition node system, a diagnosis coverage contribution value for each of the plurality of test patterns is determined. Test patterns in the plurality of test patterns are then reordered based on the diagnosis coverage contribution value. The above operations of creating, determining, and reordering can be repeated. The fault partition node system can also be used for selective chain diagnosis for performance improvement.

Classes IPC  ?

  • G01R 31/3183 - Génération de signaux d'entrée de test, p. ex. vecteurs, formes ou séquences de test
  • G01R 31/3181 - Tests fonctionnels

13.

TEST PATTERN GENERATION FOR DIAGNOSIS

      
Numéro d'application US2025017511
Numéro de publication 2025/184287
Statut Délivré - en vigueur
Date de dépôt 2025-02-27
Date de publication 2025-09-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Cheng, Wu-Tung
  • Janicki, Jakub
  • Urban, Szczepan
  • Sharma, Manish
  • Stelmach, Artur

Abrégé

Various aspects of the present disclosed technology relate to techniques for test pattern generation for diagnosis. A fault partition node system or a failing bit node system is created for a circuit design based on fault simulation for each of a plurality of test patterns. Based on the fault partition node system or the failing bit node system, a plurality of faults are updated by removing, from the plurality of faults, faults of which each becomes a fault in an equivalent fault group alone. One or more test patterns are then generated targeting some of equivalent faults in the updated plurality of faults to increase diagnosis coverage. The fault partition node system or the failing bit node system is expanded based on fault simulation for each of the one or more test patterns. The above operations of updating, generating, and expanding are repeated.

Classes IPC  ?

  • G01R 31/3183 - Génération de signaux d'entrée de test, p. ex. vecteurs, formes ou séquences de test
  • G01R 31/3181 - Tests fonctionnels

14.

PROPAGATION DETERMINATIONS OF UNKNOWN VALUES IN LOGIC SIMULATIONS OF DIGITAL CIRCUIT DESIGNS

      
Numéro d'application US2024017836
Numéro de publication 2025/183699
Statut Délivré - en vigueur
Date de dépôt 2024-02-29
Date de publication 2025-09-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Chang, Kai-Hui
  • Tsai, Yueh-Shiuan

Abrégé

Systems and methods are provided for propagation determinations of unknown values in logic simulations of digital circuit designs. A method may include accessing (402) a digital circuit design (210) and parsing (404) the digital circuit design (210) to detect state elements. The method may also include performing (406) a logic simulation on the digital circuit design (210) that includes tracking propagation of x-values in the digital circuit, wherein the x-values represent an unknown value for an output of a digital circuit design element. During the logic simulation, method steps can include tracking (408) the state elements of the digital circuit design (210) to determine when any output of the state elements is the x-value during the logic simulation and triggering (410) an x-propagation response when an x-propagation criterion is satisfied based on detected x-value outputs for the state elements of the digital circuit design (210).

Classes IPC  ?

  • G06F 30/33 - Vérification de la conception, p. ex. simulation fonctionnelle ou vérification du modèle

15.

FAILING BIT NODE SYSTEMS FOR CIRCUIT DESIGN, TEST AND DIAGNOSIS

      
Numéro d'application US2024044177
Numéro de publication 2025/183729
Statut Délivré - en vigueur
Date de dépôt 2024-08-28
Date de publication 2025-09-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Cheng, Wu-Tung

Abrégé

Techniques for generating a failing bit node system for a circuit design (330). The failing bit node system comprise equivalent fault group information extracted from a huge amount of fault simulation data for the circuit design. The related equivalent fault group information allows the failing bit node system to shrink or expand under certain conditions. Based on the failing bit node system, diagnosis coverage values are be predicted for various constraints, which can be employed to make circuit designs diagnosis friendly (350). The failing bit node system can be converted into a fault partition node system. Dictionary-like diagnosis are performed based on the failing bit node system (360).

Classes IPC  ?

  • G06F 30/333 - Conception en vue de la testabilité [DFT], p. ex. chaîne de balayage ou autotest intégré [BIST]
  • G06F 30/3308 - Vérification de la conception, p. ex. simulation fonctionnelle ou vérification du modèle par simulation
  • G01R 31/3183 - Génération de signaux d'entrée de test, p. ex. vecteurs, formes ou séquences de test
  • G06F 119/22 - Analyse de rendement ou optimisation de rendement

16.

CROSS MASK ERROR ENHANCEMENT FUNCTION (MEEF)-BASED OPTICAL PROXIMITY CORRECTION (OPC) FOR CURVILINEAR MASKS

      
Numéro d'application US2025017753
Numéro de publication 2025/184446
Statut Délivré - en vigueur
Date de dépôt 2025-02-28
Date de publication 2025-09-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Lei, Junjiang
  • Yang, Yi
  • Lippincott, George P.

Abrégé

Systems and methods are presented in support of cross-mask error enhancement factor (MEEF)-based optical proximity correction (OPC) for curvilinear masks. In some examples, a method may include the steps of accessing a curvilinear mask and a cross- MEEF matrix for the curvilinear mask. The curvilinear mask may be represented through a set of vertices and the cross-MEEF matrix may specify edge placement error (EPE) changes to the set of vertices of the curvilinear mask when a given vertex of the set of vertices of the curvilinear mask is moved by a distance unit. The method may also include a step of performing an OPC operation using the cross-MEEF matrix.

Classes IPC  ?

  • G03F 1/36 - Masques à correction d'effets de proximitéLeur préparation, p. ex. procédés de conception à correction d'effets de proximité [OPC optical proximity correction]
  • G06F 30/392 - Conception de plans ou d’agencements, p. ex. partitionnement ou positionnement
  • G03F 1/70 - Adaptation du tracé ou de la conception de base du masque aux exigences du procédé lithographique, p. ex. correction par deuxième itération d'un motif de masque pour l'imagerie
  • G03F 1/78 - Création des motifs d'un masque par imagerie par un faisceau de particules chargées [CPB charged particle beam], p. ex. création des motifs d'un masque par un faisceau d'électrons
  • G03F 1/86 - Inspection au moyen d'un faisceau de particules chargées [CPB charged particle beam]
  • G03F 7/20 - ExpositionAppareillages à cet effet
  • G06F 17/16 - Calcul de matrice ou de vecteur
  • G06F 17/18 - Opérations mathématiques complexes pour l'évaluation de données statistiques

17.

CREATING A LAYOUT OF A PRINTED CIRCUIT BOARD (PCB) INCLUDING ELECTRICAL COMPONENTS USING A MODEL FOR ASSIGNING THE ELECTRICAL COMPONENTS ONTO POSITIONS OF A PCB ARRAY

      
Numéro d'application US2024017913
Numéro de publication 2025/183702
Statut Délivré - en vigueur
Date de dépôt 2024-02-29
Date de publication 2025-09-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Ringsquandl, Martin
  • Mogoreanu, Serghei
  • Hildebrandt, Marcel
  • Wei, Wei
  • Lototskyy, Yaroslav
  • Akella, Chandra Sekhar
  • Suiter Ii, Gerald P.
  • Collins, Zachariah

Abrégé

The invention relates to a method for creating a layout of a PCB including a plurality of electrically connected, electrical components. To facilitate creating the PCB layout, the method includes: providing an array of a board canvas of the PCB; providing a list of components and electrical connections of the components; providing feature information of the respective component and of the respective connection; providing a model incorporating the array, the list, and the feature information, where the model describes a sequence of consecutive actions of assigning one of the components of the list onto a respective position of the array; determining a respective probability distribution for assigning one of the components onto a respective position of the array using the model; composing the layout of the components on the array using the respective assigning action with the highest respective probability in the respective probability distribution; and outputting the composed layout.

Classes IPC  ?

  • G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle
  • G06F 30/392 - Conception de plans ou d’agencements, p. ex. partitionnement ou positionnement
  • G06F 111/08 - CAO probabiliste ou stochastique
  • G06F 115/12 - Cartes de circuits imprimés [PCB] ou modules multi-puces [MCM]

18.

A TRANSISTOR STRESS STATE MODEL AND ITS APPLICATIONS

      
Numéro d'application IB2024051605
Numéro de publication 2025/177017
Statut Délivré - en vigueur
Date de dépôt 2024-02-20
Date de publication 2025-08-28
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Eggersgluess, Stephan
  • Glowatz, Andreas

Abrégé

A, preferably computer-implemented, method comprising the step of determining one or more latent defects in an integrated circuit based on a stress target, the integrated circuit comprising at least one instance of a library cell, preferably from a plurality of library cells, wherein the library cell comprises or is associated with the stress target, wherein the stress target of the library cell is indicative of one or more stress states of at least one transistor of the library cell.

Classes IPC  ?

  • G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux

19.

A METHOD AND A SYSTEM FOR AN AUTOMATIC CLASSIFICATION OF THE SOLDER PRINTER TOOLING IN THE PREPARATION OF A PRINTED CIRCUIT BOARD

      
Numéro d'application IB2024051366
Numéro de publication 2025/172733
Statut Délivré - en vigueur
Date de dépôt 2024-02-14
Date de publication 2025-08-21
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Soltin, Jari

Abrégé

The present invention discloses a method and a system for an automatic classification of the solder printer tooling in the preparation of a printed circuit board, the method comprising: - providing the printed circuit board and placing a stencil layer on the printed circuit board thereby covering the printed circuit board with a stencil layer; said stencil layer comprising a variety of openings that fit to positions of the printed circuit board where a solder past pad has to be deposited; - bringing the solder past onto the stencil layer and wiping the squeegee over the stencil layer wherein the squeegee is used to bring the solder past into the openings of the stencil layer by exposing a predetermined pressure to the solder past and the stencil layer in a direction substantially perpendicular to the plane of the printed circuit board; - positioning in alignment with the squeegee an array of distance sensors in proximity to the squeegee and measuring the distance between the distance sensors and the stencil layer while wiping with the squeegee over the stencil layer; and - evaluating the measured distances with respect to a predetermined threshold for the distance between the stencil layer and the distance sensors.

Classes IPC  ?

  • B41F 15/40 - Systèmes d'encrage
  • H05K 3/34 - Connexions soudées
  • H05K 3/12 - Appareils ou procédés pour la fabrication de circuits imprimés dans lesquels le matériau conducteur est appliqué au support isolant de manière à former le parcours conducteur recherché utilisant la technique de l'impression pour appliquer le matériau conducteur

20.

METHOD FOR COMPUTER-BASED SIMULATING A SYSTEM

      
Numéro d'application US2024015072
Numéro de publication 2025/170587
Statut Délivré - en vigueur
Date de dépôt 2024-02-08
Date de publication 2025-08-14
Propriétaire
  • SIEMENS INDUSTRY SOFTWARE INC. (USA)
  • SIEMENS AKTIENGESELLSCHAFT (Allemagne)
  • SIEMENS ELECTRONIC DESIGN AUTOMATION SARL (France)
  • SIEMENS INDUSTRY SOFTWARE SAS (France)
Inventeur(s)
  • Held, Harald
  • Schmitt, Jonas
  • Magnin, Pacome
  • Sellier, Franck
  • Jensen, Michael
  • Donnelly, James
  • Brooks, Lance

Abrégé

A method for computer-based simulating a system (SYS) by co-simulation of subunits (SSY) of the system (SYS) includes (a) generating dedicated models (MDL) for the simulation of the subunits (SSY) using at least partially different simulation tools (SMT). The method also includes (b) exchanging simulation data (SMD) between the dedicated models (MDL) according to a communication format standard (FMI) during co-simulation in the form of a standard simulation communication (SSC). At least one dedicated model (MDL) is a foreign model (FMD), so it was generated using a non-preparing tool (NPT), which is a simulation tool (SMT) that does not prepare models for communication according to the communication format standard (FMI). The method also includes (c) representing the foreign model (FMD) using a substitution module (SBM) in the simulation data (SMD) exchange, (d) providing an interface service (IFS) to the non-preparing tool (NPT), which converts the standard simulation communication (SSC) into communication according to the non-preparing tool's (NPT) application programming interface (1), and vice versa, and (e) operating the foreign model (FMD) in an environment of the non-preparing tool (NPT) according to the converted communication input (CVC) received from the interface service (IFS) and (f) the foreign model (FMD) sending simulation data (SMD) via the conversion of the interface service (IFS) and via the substitution module into (FMU) the standard simulation communication (SSC).

Classes IPC  ?

  • G05B 17/02 - Systèmes impliquant l'usage de modèles ou de simulateurs desdits systèmes électriques
  • G05B 19/418 - Commande totale d'usine, c.-à-d. commande centralisée de plusieurs machines, p. ex. commande numérique directe ou distribuée [DNC], systèmes d'ateliers flexibles [FMS], systèmes de fabrication intégrés [IMS], productique [CIM]
  • G06F 9/455 - ÉmulationInterprétationSimulation de logiciel, p. ex. virtualisation ou émulation des moteurs d’exécution d’applications ou de systèmes d’exploitation
  • G06G 7/66 - Calculateurs analogiques pour des procédés, des systèmes ou des dispositifs spécifiques, p. ex. simulateurs de systèmes de commande

21.

GENERATING AN AUTOMATIC BLEND BETWEEN TWO COMPONENTS IN A COMPUTER MODEL

      
Numéro d'application US2024015220
Numéro de publication 2025/170593
Statut Délivré - en vigueur
Date de dépôt 2024-02-09
Date de publication 2025-08-14
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Eisenlohr, Johr

Abrégé

A computer-implemented method for generating a computer model representation of an object includes obtaining a density grid representation of at least part of the object, generating a computer model representation based on the density grid, and determining a portion of the computer model representation. The computer-implemented method also includes interpolating values in the density grid, determining a portion of the interpolation of the density grid corresponding to the portion of the computer model representation, and modifying the computer model representation based on the portion of the interpolation of the density grid

Classes IPC  ?

  • G06F 30/23 - Optimisation, vérification ou simulation de l’objet conçu utilisant les méthodes des éléments finis [MEF] ou les méthodes à différences finies [MDF]
  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation
  • G06F 111/06 - Optimisation multi-objectif, p. ex. optimisation de Pareto utilisant le recuit simulé, les algorithmes de colonies de fourmis ou les algorithmes génétiques
  • G06F 119/18 - Analyse de fabricabilité ou optimisation de fabricabilité

22.

LIGHTWEIGHT STREAM CIPHER FOR HARDWARE ROOT OF TRUST

      
Numéro d'application US2024013098
Numéro de publication 2025/159757
Statut Délivré - en vigueur
Date de dépôt 2024-01-26
Date de publication 2025-07-31
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Rajski, Janusz
  • Trawka, Maciej
  • Tyszer, Jerzy
  • Wlodarczak, Bartosz

Abrégé

A circuit comprises a first device comprising a nonlinear feedback shift register, a second device comprising a nonlinear feedback shift register, a third device comprising a ring generator, selection-combination devices, and an encryption device. Each of the selection-combination devices is configured to output one of bits of a keystream which is derived from a combination of first one or more bits and second one or more bits. The first one or more bits are generated based on a first group of bits outputted from the first device and a third group of bits outputted from the third device. The second one or more bits are generated based on a second group of bits outputted from the second device and a fourth group of bits outputted from the third device. The encryption device is configured to combine bits for encryption with bits of the keystream to generate encrypted bits.

Classes IPC  ?

  • H04L 9/06 - Dispositions pour les communications secrètes ou protégéesProtocoles réseaux de sécurité l'appareil de chiffrement utilisant des registres à décalage ou des mémoires pour le codage par blocs, p. ex. système DES
  • H04L 9/12 - Dispositifs de chiffrement d'émission et de réception synchronisés ou initialisés d'une manière particulière

23.

METHOD AND SYSTEM FOR MODELLING AND MANUFACTURING COMPOSITE PARTS

      
Numéro d'application US2024013151
Numéro de publication 2025/159762
Statut Délivré - en vigueur
Date de dépôt 2024-01-26
Date de publication 2025-07-31
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Santiago, Nabori

Abrégé

A method for modelling a composite part is provided. The method includes accessing a model in a modelling system where the model includes a representation of a selected layer forming the composite part and the selected layer includes one or more plies of composite fabric material. The method includes simulating a manufacturing process for the selected layer based on the model. The method also includes, for each ply in the selected layer, evaluating simulation data from simulating the manufacturing process to quantitatively determine a deviation of the ply in the manufactured selected layer from the model, identifying a set of regions of the ply in the model, based on the deviation, and automatically modifying the model based on the identified set of regions, before manufacturing the composite part.

Classes IPC  ?

24.

MESH PATTERNING METHOD AND SYSTEM

      
Numéro d'application US2024011535
Numéro de publication 2025/155279
Statut Délivré - en vigueur
Date de dépôt 2024-01-15
Date de publication 2025-07-24
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Rousseau, Iddo
  • Cox, Diana

Abrégé

A computer-implemented method in a computer aided design (CAD) system is provided. The method includes accessing a first facetted model representing a shape element, connecting instances of the facetted model to obtain a second facetted model, applying a nonlinear transformation to the second facetted model to obtain a third facetted model, and determining a distortion of a pair of facets between the second facetted model and the third facetted model. A topology of the third facetted model is modified based on the distortion

Classes IPC  ?

  • G06F 30/17 - Conception mécanique paramétrique ou variationnelle
  • G06T 17/10 - Description de volumes, p. ex. de cylindres, de cubes ou utilisant la GSC [géométrie solide constructive]
  • G06T 17/30 - Description de surfaces, p. ex. description de surfaces polynomiales
  • G06T 19/20 - Édition d'images tridimensionnelles [3D], p. ex. modification de formes ou de couleurs, alignement d'objets ou positionnements de parties
  • G06F 119/18 - Analyse de fabricabilité ou optimisation de fabricabilité

25.

MESH INCARNATION METHOD FOR A BLENDED LATTICE

      
Numéro d'application US2023085645
Numéro de publication 2025/136407
Statut Délivré - en vigueur
Date de dépôt 2023-12-22
Date de publication 2025-06-26
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Gunton, James
  • Goddard, Matthew
  • Nanson, Peter

Abrégé

A method for generating a mesh for a blended rod and ball lattice is provided. The method includes obtaining, from a first lattice, a second lattice by offsetting the first lattice by a predetermined distance. The method includes marking portions of rods in the second lattice with a first identifier or a second identifier based on intersections with other lattice topologies, marking balls in the second lattice with the first identifier or the second identifier or leaving the balls unmarked, and identifying regions of the first lattice corresponding to marked regions of the second lattice. The method includes applying a blend to the first lattice to obtain a third lattice and incarnating the third lattice as a mesh. Different mesh incarnation methods are applied in the marked regions, based on whether the regions are marked with the first identifier or the second identifier.

Classes IPC  ?

  • G06T 17/10 - Description de volumes, p. ex. de cylindres, de cubes ou utilisant la GSC [géométrie solide constructive]
  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation

26.

PATTERNING METHOD FOR COMPUTER AIDED DESIGN

      
Numéro d'application US2023085761
Numéro de publication 2025/136414
Statut Délivré - en vigueur
Date de dépôt 2023-12-22
Date de publication 2025-06-26
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Ferguson, John
  • Rousseau, Iddo

Abrégé

A method for modifying a model of a shape element in a computer-aided design (CAD) system. The method comprises accessing the model in the CAD system and generating an arrangement comprising a plurality of instances of the model. A set of modifications to the model are identified to enable the plurality of instances to connect seamlessly. The modifications are implemented on the model to obtain a modified model which can be used to form a patterned CAD object.

Classes IPC  ?

  • B33Y 50/00 - Acquisition ou traitement de données pour la fabrication additive
  • G06F 30/10 - CAO géométrique
  • G06T 19/20 - Édition d'images tridimensionnelles [3D], p. ex. modification de formes ou de couleurs, alignement d'objets ou positionnements de parties
  • G06F 119/18 - Analyse de fabricabilité ou optimisation de fabricabilité

27.

MESH INCARNATION METHOD FOR A BLENDED LATTICE HUB

      
Numéro d'application US2023085855
Numéro de publication 2025/136418
Statut Délivré - en vigueur
Date de dépôt 2023-12-22
Date de publication 2025-06-26
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Gunton, James
  • Goddard, Matthew
  • Nanson, Peter

Abrégé

RR as a plurality of polylines based on a pre-determined threshold. The method includes generating a set of line segments, each line segment in the set of line segments extending radially from a surface of an unblended rod and ball lattice and terminating on a bounding sphere that contains the identified constraint curves. The method includes intersecting each line segment in the set of line segments with the blended lattice surface to obtain a set of points lying on the blended lattice surface and triangulating the set of points to obtain a mesh representation of a region of the hub.

Classes IPC  ?

  • G06T 17/10 - Description de volumes, p. ex. de cylindres, de cubes ou utilisant la GSC [géométrie solide constructive]
  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation

28.

SYSTEM AND METHOD FOR MANAGING REAL-TIME MULTI-USER COLLABORATION IN A FILE BASED CAX APPLICATION

      
Numéro d'application US2024057139
Numéro de publication 2025/122373
Statut Délivré - en vigueur
Date de dépôt 2024-11-22
Date de publication 2025-06-12
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Sen, Avijit
  • Garimella, Raman
  • Solomon, Bernard
  • Anderson, Taylor

Abrégé

A system and method for managing real-time multi-user collaboration in a file based CAX application is disclosed herein. The method comprises receiving, by a processing unit, a plurality of inputs indicative of a plurality of operations to be performed on one or more objects in a CAX file. Each of the inputs is received from one of a plurality of user sessions as-sociated with the file based CAX application, in real time. Further, a chronological sequence of execution of each of the operations is determined, based on an order of receipt of each of the inputs. based on the chronological sequence of execution determined, each of the operations is executed on the CAX file. Furthermore, an output is generated on each of the user sessions, based on execution of each of the operations on the CAX file in the chronological sequence.

Classes IPC  ?

  • G06F 9/451 - Dispositions d’exécution pour interfaces utilisateur
  • G06F 16/176 - Support d’accès partagé aux fichiersSupport de partage de fichiers
  • G06F 30/10 - CAO géométrique

29.

GENERATING A FINITE ELEMENT MESH, IMPROVING A DESIGN, GENERATING A COMPONENT, COMPUTER SYSTEM

      
Numéro d'application US2024057447
Numéro de publication 2025/122390
Statut Délivré - en vigueur
Date de dépôt 2024-11-26
Date de publication 2025-06-12
Propriétaire
  • SIEMENS INDUSTRY SOFTWARE LIMITED (Royaume‑Uni)
  • SIEMENS INDUSTRY SOFTWARE INC. (USA)
  • SIEMENS INDUSTRY SOFTWARE NV (Belgique)
Inventeur(s)
  • Chemin, Jovana
  • Makem, Jonathan
  • Fogg, Harry
  • Mukherjee, Nilanjan

Abrégé

A computer-implemented method for generating a finite element mesh of a component for the numerical solution of partial differential equations for the description of technical-physical circumstances to which the component is subjected in its intended operation. The invention further relates to a method for improving the components design and generating the component. Furthermore, the invention relates to a system for performing such method. Furthermore, the invention relates to a computer-readable medium encoded with executable instructions, that when executed, cause the computer system to carry out a method according to the invention.

Classes IPC  ?

  • G06F 30/23 - Optimisation, vérification ou simulation de l’objet conçu utilisant les méthodes des éléments finis [MEF] ou les méthodes à différences finies [MDF]
  • G06F 17/13 - Opérations mathématiques complexes pour la résolution d'équations d'équations différentielles
  • G06F 30/398 - Vérification ou optimisation de la conception, p. ex. par vérification des règles de conception [DRC], vérification de correspondance entre géométrie et schéma [LVS] ou par les méthodes à éléments finis [MEF]
  • G06T 19/00 - Transformation de modèles ou d'images tridimensionnels [3D] pour infographie
  • G06F 30/00 - Conception assistée par ordinateur [CAO]

30.

SYSTEM AND METHOD FOR CONFIGURING A PRODUCT

      
Numéro d'application US2024058001
Numéro de publication 2025/117919
Statut Délivré - en vigueur
Date de dépôt 2024-11-30
Date de publication 2025-06-05
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Akkarbote, Jinendra Bansilal

Abrégé

A method and system for configuring a product is disclosed. The method comprises obtaining, by a processor (102) of the PDM system (100), a plurality of options and one or more constraints defined for the product from a product database (116), wherein each of the options has one or more variants. Further, ordered logical groups are generated from the plurality of options obtained, based on a weight associated with each of the options. Furthermore, a branch and bound algorithm is used to determine one or more buildable product configurations based on the ordered logical groups and one or more of the constraints applicable to the options, wherein applicability of the one or more constraints is determined using a Satisfiability Modulo Theory-based solver. The one or more buildable product configurations are further outputted on an output device (110).

Classes IPC  ?

  • G06Q 10/0631 - Planification, affectation, distribution ou ordonnancement de ressources d’entreprises ou d’organisations
  • G06Q 30/0601 - Commerce électronique [e-commerce]
  • G06Q 50/04 - Fabrication
  • G06Q 10/087 - Gestion d’inventaires ou de stocks, p. ex. exécution des commandes, approvisionnement ou régularisation par rapport aux commandes

31.

MACHINING A WORKPIECE BY MEANS OF A B-AXIS LATHE MACHINE

      
Numéro d'application IB2024060688
Numéro de publication 2025/109404
Statut Délivré - en vigueur
Date de dépôt 2024-10-30
Date de publication 2025-05-30
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Brake, Sebastian

Abrégé

Method of machining a workpiece (WPC) by means of a B-axis lathe machine (MCH), where the method, involves the continuous change of the angular position (AGP) of a turning tool (TTL), the method comprising the following steps: (a) Providing a workpiece (WPC) raw contour geometry (RCG), (b) Providing a. workpiece (WPC) target contour geometry (TCG), (c) Providing a predetermined chip thickness (CPT) as target chip thickness (CPT) during machining, (d) Providing a tool path (TPT) of the turning tool (TTL), (e) Providing preset angular positions (PAP) of the turning tool (TTL), characterized, by the method including the additional steps: (f) Providing a. feed, map (FMP) that provides a. feed. rate (FDR), (g) Splitting the tool path (TPT) segments (SGT) into tool path (TPT) subsegments (SSG) with a predefined, segment length (SGL), (n) Determining angular positions (AGP) at the segment (SGT) end positions (EPT) by interpolating (ITP) between the positions of specified tool angle (TAP), Determination of the feed rate (FDR) at the segment end. positions (SGT) by specifying the respective preset local angular positions (PAP) to the feed map (FMP), (j) Determining of a dynamic feed rate (DFR) and a. dynamic angular position change (DAP) from an interpolation (TTP) along the segment (SGT) tool path (TPT) between the respective segment (SGT) end position (EPT) parameters, and machining the workpiece (WPC) in such a way that the tool position is continuously changed between the preset angle positions, while the tool is moved along a tool path (TPT) according to a feed calculation based, on. the specified chip thickness (CPT).

Classes IPC  ?

  • G05B 19/416 - Commande numérique [CN], c.-à-d. machines fonctionnant automatiquement, en particulier machines-outils, p. ex. dans un milieu de fabrication industriel, afin d'effectuer un positionnement, un mouvement ou des actions coordonnées au moyen de données d'un programme sous forme numérique caractérisée par la commande de vitesse, d'accélération ou de décélération
  • G05B 19/41 - Commande numérique [CN], c.-à-d. machines fonctionnant automatiquement, en particulier machines-outils, p. ex. dans un milieu de fabrication industriel, afin d'effectuer un positionnement, un mouvement ou des actions coordonnées au moyen de données d'un programme sous forme numérique caractérisée par l'interpolation, p. ex. par le calcul de points intermédiaires entre les points extrêmes programmés pour définir le parcours à suivre et la vitesse du déplacement le long de ce parcours

32.

DETERMINING A SURFACE OF AN OBJECT IN A COMPUTER MODEL

      
Numéro d'application US2023079514
Numéro de publication 2025/106063
Statut Délivré - en vigueur
Date de dépôt 2023-11-13
Date de publication 2025-05-22
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Jones, Kevin
  • Canann, Scott

Abrégé

A computer-implemented method for determining a surface of an object in a computer model of the object is disclosed. The method comprises: determining a position on a surface of the computer model of the object; determining a reference point that is intersected by an axis projecting from the surface near to the position on the surface; determining one or more portions of the surface near to the position on the surface or near to another of the one or more portions of the surface; determining whether an uninterrupted line-of-sight exists between the one or more portions and the reference point; and determining that the one or more portions constitute the surface in response to determining that the uninterrupted line-of-sight exists between the one or more portions and the reference point.

Classes IPC  ?

  • G06F 30/12 - CAO géométrique caractérisée par des moyens d’entrée spécialement adaptés à la CAO, p. ex. interfaces utilisateur graphiques [UIG] spécialement adaptées à la CAO
  • G06F 30/17 - Conception mécanique paramétrique ou variationnelle
  • G06T 7/11 - Découpage basé sur les zones
  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation

33.

EVALUATING POWER DISSIPATION

      
Numéro d'application US2023077123
Numéro de publication 2025/085076
Statut Délivré - en vigueur
Date de dépôt 2023-10-17
Date de publication 2025-04-24
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Dey, Amit Kumar
  • Tayal, Vijay

Abrégé

A computer-implemented method for evaluating power dissipation of an electronic circuit design including at least one logic gate is disclosed. The method includes receiving one or more data files descriptive of the electronic circuit design, descriptive of waveform data descriptive of signal activity for logic gates used in the electronic circuit design, and descriptive of power dissipation values for internal cells of the logic gates of the electronic circuit design (701). Waveform data is extracted from the one or more data files descriptive of signal activity at primary inputs of the electronic circuit design and descriptive of outputs of registers and memories of the electronic circuit design (702). Simulation of the logic gates is performed using the extracted waveform data to generate simulated waveform data descriptive of simulated logic transitions for the internal cells of the logic gates (703), and event-based evaluation of the power dissipation of the electronic circuit design is performed based on the extracted waveform data, the simulated waveform data, and the power dissipation values (704).

Classes IPC  ?

  • G06F 30/3308 - Vérification de la conception, p. ex. simulation fonctionnelle ou vérification du modèle par simulation
  • G06F 119/06 - Analyse de puissance ou optimisation de puissance

34.

MONITORING PROPAGATION DELAY

      
Numéro d'application US2023076238
Numéro de publication 2025/075650
Statut Délivré - en vigueur
Date de dépôt 2023-10-06
Date de publication 2025-04-10
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Mukherjee, Nilanjan
  • Rajski, Janusz
  • Addepalli, Hari
  • Wu, Jay
  • Pomeranz, Irith

Abrégé

A monitor device for monitoring a propagation delay of a signal along a path through an integrated circuit is disclosed. The monitor device comprises a delay device configured to receive the signal and generate a delayed signal being a version of the received signal that is time-delayed relative to the received signal, a detection window device configured to generate a detection window signal based on a clock signal of the integrated circuit, and a determination device configured to determine whether a value of the received signal is different to a value of the delayed signal during a time defined by the detection window signal, and to generate a determination signal based on the determination.

Classes IPC  ?

35.

LAYOUT-BASED SYSTEMATIC DEFECT DETERMINATIONS THROUGH DESIGN UNIQUENESS AND REPEATER OVERLAP

      
Numéro d'application US2023076199
Numéro de publication 2025/075648
Statut Délivré - en vigueur
Date de dépôt 2023-10-06
Date de publication 2025-04-10
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Veda, Gaurav
  • Sharma, Manish
  • Klingenberg, Robert R.
  • D'Souza, Jayant C.

Abrégé

Systems and methods are presented for determination of layout-based systematic defect candidates based on design uniqueness and repeater overlap. A method may include accessing diagnosis reports (220) generated for physical circuits and identifying multiple repeater sets (230) from the diagnosis reports (220). The method may also include extracting layout patterns (250) from the diagnosis reports (220) and determining (608) a layout-based systematic defect candidate (510) from among the layout patterns (250) based on a design uniqueness factor and a repeater overlap factor. The design uniqueness factor may be based on a degree to which other layout patterns similar to a given layout pattern do not otherwise occur among layout patterns (320) for the circuit design (310). The repeater overlap factor may be based on a degree to which other layout patterns similar to the given layout pattern occur among layout patterns for other repeater sets of the multiple repeater sets (230).

Classes IPC  ?

  • G06F 30/33 - Vérification de la conception, p. ex. simulation fonctionnelle ou vérification du modèle
  • G06F 11/07 - Réaction à l'apparition d'un défaut, p. ex. tolérance de certains défauts
  • G06F 30/398 - Vérification ou optimisation de la conception, p. ex. par vérification des règles de conception [DRC], vérification de correspondance entre géométrie et schéma [LVS] ou par les méthodes à éléments finis [MEF]
  • G06F 119/02 - Analyse de fiabilité ou optimisation de fiabilitéAnalyse de défaillance, p. ex. performance dans le pire scénario, analyse du mode de défaillance et de ses effets [FMEA]

36.

MONITORING PROPAGATION DELAY

      
Numéro d'application US2023076233
Numéro de publication 2025/075649
Statut Délivré - en vigueur
Date de dépôt 2023-10-06
Date de publication 2025-04-10
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Mukherjee, Nilanjan
  • Rajski, Janusz
  • Addepalli, Hari
  • Wu, Jay
  • Pomeranz, Irith

Abrégé

A computer-implemented method for determining placement of monitors for monitoring propagation delays in paths through an integrated circuit is disclosed. The method comprises: determining one or more paths through an integrated circuit which terminate at a same flip flop of the integrated circuit (706 a ii); determining logical cells in the one or more paths terminating at that flip flop (706 a ii); determining a measure of the number of those logical cells that are also in one or more alternative paths terminating at one or more alternative flip flops monitored by one or more monitors (706 a iii); determining whether the measure of the number of those logical cells that are also in the alternative paths satisfies a threshold condition (706 a iii); and determining, based on a determination that the number of logical cells that are also in the alternative paths does satisfy the threshold condition, placement of a monitor to monitor the flip flop.

Classes IPC  ?

  • G06F 30/3312 - Analyse temporelle
  • G06F 30/392 - Conception de plans ou d’agencements, p. ex. partitionnement ou positionnement
  • G06F 119/12 - Analyse temporelle ou optimisation temporelle
  • G06F 119/04 - Analyse de vieillissement ou optimisation contre le vieillissement

37.

MONITORING PROPAGATION DELAY

      
Numéro d'application US2024018345
Numéro de publication 2025/075666
Statut Délivré - en vigueur
Date de dépôt 2024-03-04
Date de publication 2025-04-10
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Mukherjee, Nilanjan
  • Rajski, Janusz
  • Addepalli, Hari
  • Wu, Jay
  • Pomeranz, Irith
  • Robertson, Iain
  • Cote, Jean-Francois

Abrégé

A monitor device for monitoring a propagation delay of a signal along a path through an integrated circuit is disclosed. The monitor device comprises a delay device configured to receive the signal and generate a delayed signal being a version of the received signal that is time-delayed relative to the received signal, a detection window device configured to generate a detection window signal based on a clock signal of the integrated circuit, and a determination device configured to determine whether a value of the received signal is different to a value of the delayed signal during a time defined by the detection window signal, and to generate a determination signal based on the determination.

Classes IPC  ?

  • G01R 31/30 - Tests marginaux, p. ex. en faisant varier la tension d'alimentation
  • G01R 31/317 - Tests de circuits numériques

38.

SYSTEM AND METHOD FOR MANAGING REPLACEMENT OF PARTS IN A CAD ENVIRONMENT

      
Numéro d'application US2024048827
Numéro de publication 2025/072652
Statut Délivré - en vigueur
Date de dépôt 2024-09-27
Date de publication 2025-04-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Dhatrak, Nilam
  • Ghosh, Hriya
  • Gole, Ameya
  • Vhanakaware, Vishal

Abrégé

A system and method for managing replacement of parts in a computer-aided design (CAD) environment is disclosed. The method includes identifying, by a processing unit, a user intent for replacing a first part with a second part in the CAD environment. A plurality of face pairs for the second part and the base part is determined. A face pair vector corresponding to each face pair of the plurality of face pairs is computed. A machine learning model is further used to compute a constraint creation probability for each face pair of the plurality of face pairs based on the corresponding face pair vector. A plurality of placement solutions is generated based on the plurality of face pairs, and one or more relationships that existed between the first part and the base part. The computed constraint creation probabilities for the face pairs in the placement solutions are further used for providing one or more recommendations on a display device.

Classes IPC  ?

  • G06F 30/17 - Conception mécanique paramétrique ou variationnelle
  • G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle
  • G06F 111/04 - CAO basée sur les contraintes
  • G06F 111/20 - CAO de configuration, p. ex. conception par assemblage ou positionnement de modules sélectionnés à partir de bibliothèques de modules préconçus

39.

TECHNIQUES FOR TEST CASE PRIORITIZATION

      
Numéro d'application IB2023059779
Numéro de publication 2025/068754
Statut Délivré - en vigueur
Date de dépôt 2023-09-29
Date de publication 2025-04-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Guirguis, Michael

Abrégé

A, preferably computer-implemented, method of test case prioritization, the method comprising: obtaining a test case coverage for each one of a plurality of the test cases, wherein the test cases serve for testing an integrated circuit, e.g., in a hardware description language, preferably on the register transfer level, determining a priority of each test case based on the respective test case coverage, wherein the priority indicates an execution sequence of the test cases.

Classes IPC  ?

  • G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle
  • G06F 30/33 - Vérification de la conception, p. ex. simulation fonctionnelle ou vérification du modèle
  • G06N 3/00 - Agencements informatiques fondés sur des modèles biologiques
  • G06F 111/08 - CAO probabiliste ou stochastique

40.

STEPOVER-BASED TOOLPATH GENERATION THROUGH PARTITIONED SLICE REGIONS

      
Numéro d'application US2023033829
Numéro de publication 2025/071554
Statut Délivré - en vigueur
Date de dépôt 2023-09-27
Date de publication 2025-04-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Jaje, Jeffrey
  • Fithian, Timothy
  • Maynard, James
  • Bhatia, Roshanbir

Abrégé

Systems and methods are presented for stepover-based generation toolpaths for additive manufacturing processes. A method may include automatically generating a toolpath (130) for a slice region (120) based on an allowable stepover range specified for an additive manufacturing process, including by determining a medial axis (210) of the slice region (120), partitioning the slice region (120) into multiple subsections (231, 232, 233, 234) based on the medial axis (210), modifying a given subsection responsive to a determination that a sub-toolpath for the given subsection would violate the allowable stepover rang, generating sub-toolpaths for each of the multiple subsections of the partitioned slice region, including any modified subsections, and generating the toolpath (130) for the slice region (120) as a combination of the sub-toolpaths generated for each of the multiple subsections of the partitioned slice region.

Classes IPC  ?

  • G06F 30/10 - CAO géométrique
  • B29C 64/386 - Acquisition ou traitement de données pour la fabrication additive
  • B33Y 50/02 - Acquisition ou traitement de données pour la fabrication additive pour la commande ou la régulation de procédés de fabrication additive
  • G06F 113/10 - Fabrication additive, p. ex. impression en 3D

41.

THREE DIMENSIONAL TOPOLOGY RECONSTRUCTION WITH CURVATURE-BASED AND REGION GROWING SEGMENTATION OF 3D SCANNING IMAGES

      
Numéro d'application US2023034080
Numéro de publication 2025/071565
Statut Délivré - en vigueur
Date de dépôt 2023-09-29
Date de publication 2025-04-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Kördel, Martin
  • Vega Merchan, Luis
  • Golovlev, Valeri

Abrégé

A computer-implemented method and system extract surface feature information from point cloud data. A 3D topology reconstruction engine receives point cloud data comprising one or more point cloud representations of an object and generates a curvature-based segmentation and region growing segmentation of the point cloud data. A feature removal module identifies and removes isolated clusters to correct over- segmentation.

Classes IPC  ?

  • G06T 7/187 - DécoupageDétection de bords impliquant des croissances de zonesDécoupageDétection de bords impliquant des fusions de zonesDécoupageDétection de bords impliquant un étiquetage de composantes connexes

42.

SELECTIVE REUSE IN ANALOG SIMULATION OF AN INTEGRATED CIRCUIT

      
Numéro d'application US2023075347
Numéro de publication 2025/071606
Statut Délivré - en vigueur
Date de dépôt 2023-09-28
Date de publication 2025-04-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Cooper, Joel
  • Dyck, Jeffrey
  • Fisher, Kyle

Abrégé

A computing system can identify result data corresponding to a simulation of a first circuit design (301) utilizing a set of samples from a distribution describing manufacturing variation for integrated circuitry (302), determine a second circuit design describing an integrated circuit is compatible with the first circuit design based on a comparison of variables for manufacturing variation in the first circuit design to variables for manufacturing variation in the second circuit design (342), and reuse at least a portion of the result data when simulating the second circuit design utilizing values from the distribution describing the manufacturing variation identified based, at least in part, the result data corresponding to the simulation of the first circuit design. The computing system can estimate a yield for an output of the integrated circuit described by the second circuit design based on a response of the second circuit design to the simulation (306).

Classes IPC  ?

  • G06F 30/367 - Vérification de la conception, p. ex. par simulation, programme de simulation avec emphase de circuit intégré [SPICE], méthodes directes ou de relaxation
  • G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle
  • G06F 111/08 - CAO probabiliste ou stochastique
  • G06F 119/18 - Analyse de fabricabilité ou optimisation de fabricabilité
  • G06F 119/20 - Conception de réutilisation, analyse de réutilisabilité ou optimisation de réutilisabilité
  • G06F 119/22 - Analyse de rendement ou optimisation de rendement

43.

SYSTEM AND METHOD FOR SYNCHRONIZING AND ALIGNING SEVERAL MODULES ON A SAME CLOCK

      
Numéro d'application US2023075365
Numéro de publication 2025/071607
Statut Délivré - en vigueur
Date de dépôt 2023-09-28
Date de publication 2025-04-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Couteaux, Pascal
  • Maquignon, Franck
  • Giniaux, Marc
  • Fermon, Yannick
  • Selvidge, Charles, W.

Abrégé

11,...,BM}, wherein the module A (110) is configured for operating in synchronicity with a clock signal CK_A (210) of period T and the module Bj (120) is configured for operating in synchronicity with a clock signal CK Bj of said period T, the method comprising: - adjusting or controlling, by a phase adjustment circuit, for each couple of modules formed by the module A (110) and one of said modules Bj (120) and in function of a total adjustment time TT_ Dj calculated for each couple, a relative time between an arrival time of signal S_Aj data at the sampling location of the sampling component of the module Bj (120) and a sampling time of said data by the sampling component of module Bj, wherein said sampling time is temporally directly adjacent to the arrival time; wherein said total adjustment time TT_Dj is configured for increasing, for both a sampling by a sampling component of module A (110) of data values of a signal S_Bj sent by the module Bj (120) to the module A and the sampling by the sampling component of module Bj (120) of data values of the signal S_Aj, a time separation between data arrival at a sampling location of the concerned sampling component and data sampling by said concerned sampling component, wherein the time at which said data sampling takes place is temporally directly adjacent to the time at which the data arrive at said sampling location of the concerned sampling component.

Classes IPC  ?

  • G06F 1/12 - Synchronisation des différents signaux d'horloge
  • G06F 1/10 - Répartition des signaux d'horloge
  • H03L 7/00 - Commande automatique de fréquence ou de phaseSynchronisation

44.

METHOD AND SYSTEM FOR PREDICTING HEATING IN ADDITIVE MANUFACTURING

      
Numéro d'application US2023075385
Numéro de publication 2025/071610
Statut Délivré - en vigueur
Date de dépôt 2023-09-28
Date de publication 2025-04-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Van 'T Erve, Tom
  • Balkenende, Theo
  • Peng, Hao
  • Chen, Qian

Abrégé

A method and system for predicting overheating in layers of build material in an additive manufacturing system are provided. The method comprises accessing a representation of a three-dimensional object as a plurality of cross-sectional layers for printing in an additive manufacturing system, accessing scan path data for a region of a selected one of the plurality of cross-sectional layers, sub-dividing the region into a plurality of cells and for each cell, generating a vector of features based on the representation of the object and scan path data and evaluating a trained predictive model based the vector of features, to obtain an output comprising a predicted melting time for the cell.

Classes IPC  ?

  • B22F 10/36 - Commande ou régulation des opérations des paramètres du faisceau d’énergie
  • B22F 10/80 - Acquisition ou traitement des données
  • B33Y 50/00 - Acquisition ou traitement de données pour la fabrication additive
  • G06N 7/04 - Réalisation physique
  • G06N 7/06 - Simulation sur des calculateurs universels
  • B29C 64/386 - Acquisition ou traitement de données pour la fabrication additive
  • G06N 3/02 - Réseaux neuronaux
  • G06N 3/09 - Apprentissage supervisé

45.

METHOD AND SYSTEM FOR MANAGING GATE LEVEL SIMULATION OF AN ELECTRONIC CIRCUIT

      
Numéro d'application US2024049125
Numéro de publication 2025/072873
Statut Délivré - en vigueur
Date de dépôt 2024-09-27
Date de publication 2025-04-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Guha, Kaustav

Abrégé

A method and a system for managing gate level simulation of an electronic circuit are provided. The method includes identifying at least one circuit topology from a plurality of circuit topologies in an electronic circuit design, based on a netlist and a timing data file. Further, one or more non-critical pins are determined from the identified circuit topology, based on delay corresponding to each of the pins in the identified circuit topology. Based on determination of the one or more non-critical pins, a modified timing data file is generated. The delay associated with each of the non-critical pins is set to zero in the modified timing data file. The method may further include performing a gate-level simulation based on the modified timing data file

Classes IPC  ?

46.

COMPRESSION DETECTION FOR IQ DATA

      
Numéro d'application IB2023059748
Numéro de publication 2025/068751
Statut Délivré - en vigueur
Date de dépôt 2023-09-29
Date de publication 2025-04-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Niiranen, Miika
  • Ollitervo, Sakari

Abrégé

A, preferably computer-implemented, method of processing in- phase and quadrature data, IQ data, the method comprising the steps of : determining a plurality of IQ samples from the IQ data, determining a constellation error of each one of the plurality of IQ samples, and identifying a (de-)compression method and/or IQ bit width of the IQ data based on the constellation error.

Classes IPC  ?

  • H04L 27/00 - Systèmes à porteuse modulée
  • H03M 7/30 - CompressionExpansionÉlimination de données inutiles, p. ex. réduction de redondance
  • H04L 1/24 - Tests pour s'assurer du fonctionnement correct
  • H04L 27/22 - Circuits de démodulationCircuits récepteurs
  • H04L 27/38 - Circuits de démodulationCircuits récepteurs
  • H04W 24/00 - Dispositions de supervision, de contrôle ou de test
  • H04B 10/07 - Dispositions pour la surveillance ou le test de systèmes de transmissionDispositions pour la mesure des défauts de systèmes de transmission
  • H04L 27/20 - Circuits de modulationCircuits émetteurs
  • H04L 27/34 - Systèmes à courant porteur à modulation de phase et d'amplitude, p. ex. en quadrature d'amplitude

47.

STATISTICAL CHANNEL ANALYSIS WITH FEEDBACK BURST ERROR

      
Numéro d'application US2023034110
Numéro de publication 2025/071567
Statut Délivré - en vigueur
Date de dépôt 2023-09-29
Date de publication 2025-04-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Dmitriev-Zdorov, Vladimir B.

Abrégé

This application discloses a computing system configured to measure a step response of a channel in an electronic device, determine a feedback voltage that a decision feedback equalizer adds to the channel in response to detecting inter-symbol interference in received symbols, and predict a signal integrity of the channel based, at least in part, on the step response of the channel and the feedback voltage. The computing system can utilize the predicted signal integrity to determine a probability that the feedback voltage added by the decision feedback equalizer to the channel was erroneous, and determine the signal integrity of the channel based, at least in part, on the step response of the channel, the feedback voltage, and the probability that the feedback voltage added by the decision feedback equalizer to the channel was erroneous.

Classes IPC  ?

  • H04L 25/03 - Réseaux de mise en forme pour émetteur ou récepteur, p. ex. réseaux de mise en forme adaptatifs
  • H04B 3/46 - SurveillanceTests
  • H04B 17/00 - SurveillanceTests
  • H04L 1/20 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue en utilisant un détecteur de la qualité du signal
  • H04L 25/02 - Systèmes à bande de base Détails

48.

A METHOD AND A SYSTEM FOR AN AUTOMATIC LAYER CLASSIFICATION IN THE PREPARATION OF PCB DESIGN GERBER DATA

      
Numéro d'application IB2023058975
Numéro de publication 2025/056936
Statut Délivré - en vigueur
Date de dépôt 2023-09-11
Date de publication 2025-03-20
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Raghuvanshi, Nilesh
  • Huttunen-Heikinmaa, Kalle

Abrégé

The present invention discloses a method and a system for an automatic layer classification in the preparation of PCB design Gerber data that is intended to support the design process for a printed circuit board, the method and the system comprising: - providing a list of the Gerber data for a process preparation layer stackup tool, said Gerber data comprising at least a number of electronic layer designs and related information to the manifestation of the electronic layer designs in the printed circuit board; - importing the list of Gerber data into the process preparation layer stackup tool and converting the list of Gerber data by the process preparation layer stackup tool into fabrication data thus enabling the production of the printed circuit board; wherein: - the conversion being supported by a machine learning process that has been executed for training a conversion algorithm; said machine learning process comprising a number of training steps wherein as a result of the training steps a predetermined set of the Gerber data is automatically recognized and converted into the respective fabrication data; and - preparing the execution of the production of the printed circuit board according to the so-yielded production data.

Classes IPC  ?

  • G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle
  • G06F 30/398 - Vérification ou optimisation de la conception, p. ex. par vérification des règles de conception [DRC], vérification de correspondance entre géométrie et schéma [LVS] ou par les méthodes à éléments finis [MEF]
  • G06F 115/12 - Cartes de circuits imprimés [PCB] ou modules multi-puces [MCM]

49.

A METHOD FOR THE GENERATION OF A META-MODEL DRIVEN DYNAMIC USER INTERFACE

      
Numéro d'application IB2024055450
Numéro de publication 2025/056985
Statut Délivré - en vigueur
Date de dépôt 2024-06-04
Date de publication 2025-03-20
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Kaplan, Metin
  • Nagamalli, Ramesh
  • Rohde, Wolfgang
  • Iannone, Stephanie
  • Aghazarian, Nick
  • Martin, Kevin
  • Bulyha, Vitali
  • Phelps, Jeremy

Abrégé

It is the objective of the present invention to define a method that provides a simple and effective way to create and/or customize a user interface at client side, particularly enabling the option of doing this on the fly while the production is running would be highly desirable. This objective is achieved according to the present invention by a method for generating a user interface (MMOM UI) in at least one MOM system, said at least one MOM system controlling a manufacturing environment of a variety of manufacturing resources present in a number of business domains, comprising the steps of: a) providing for each business domain a business domain model, said business domain model comprising beside other information all relevant information to the resources and objects in the specific business domain and their attributes that are potentially a subject for a UI tag (UI Tags); b) generating from all business domain models a set of metadata (MOM Metadata); said set of metadata comprising the relevant information to the resources and objects and their related attributes; c) enhancing the set of metadata to comprise additional UI-related information on how these business domain models shall be presented; d) utilizing this set of metadata about the business domain models including the enrichment with the UI related information by a dynamic rendering engine which is executed in the manufacturing environment on the client side; e) selecting according to the available set of metadata the information that shall be displayed in the user interface (MMOM UI) via an interface provided by a web framework (SWF); said web framework (SWF) offering the set of metadata in a selectable way to a user; and f) using the selected information by the dynamic rendering engine to generate the user interface (MOM UI) showing the selected information 2023P06594WO according to the rendering data in the set of metadata and the enhanced UI related information. Thus, the present method eliminates the need for an intermediate design phase which requires a running application to design or develop the UI pages. With the present invention the client user can design and configure the UI along with the rest of the business domain models in one phase without having a running software development system. Both the business domain models and the corresponding UIs are developed/deployed/published together in one go.

Classes IPC  ?

  • G06F 8/38 - Création ou génération de code source pour la mise en œuvre d'interfaces utilisateur
  • G06F 16/958 - Organisation ou gestion de contenu de sites Web, p. ex. publication, conservation de pages ou liens automatiques

50.

CRITICALITY DETERMINATIONS FOR ELEMENTARY SUBPARTS OF CIRCUIT DESIGNS

      
Numéro d'application US2023031154
Numéro de publication 2025/048770
Statut Délivré - en vigueur
Date de dépôt 2023-08-25
Date de publication 2025-03-06
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Garg, Vedant
  • Gogineni, Arun Kumar
  • Pillay, Sanjay

Abrégé

Systems and methods are presented for criticality determinations for elementary subparts of a circuit design. Determination of criticality values (220) for elementary subparts (e.g., registers) in a logic-level circuit design (210) may be based on an input flop factor, an input combinational logic factor, and an output flop factor. The input flop factor may be based on a number of other registers in the logic-level circuit design (210) that affect to an input signal to a given register, the input combinational logic factor may be based on a number of logic gates that affect the input signal, and the output flop factor may be based on a number of other registers in the logic-level circuit design (210) with input signals that are affected by an output signal of the given register. Determined criticality values (220) may be used to set physical designs of corresponding elementary subparts.

Classes IPC  ?

  • G06F 30/33 - Vérification de la conception, p. ex. simulation fonctionnelle ou vérification du modèle
  • G06F 30/337 - Optimisation de la conception
  • G06F 119/02 - Analyse de fiabilité ou optimisation de fiabilitéAnalyse de défaillance, p. ex. performance dans le pire scénario, analyse du mode de défaillance et de ses effets [FMEA]

51.

AUTOMATIC CELL AND MACRO PLACEMENT IN VLSI LAYOUT DESIGN

      
Numéro d'application US2023031233
Numéro de publication 2025/048776
Statut Délivré - en vigueur
Date de dépôt 2023-08-28
Date de publication 2025-03-06
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Liu, Dongzi
  • Liu, Tai-Hung
  • Tzeng, Ping-San
  • Lin, Chien-Chin
  • Lin, Yu-Hsin
  • Hu, Chih-Yao

Abrégé

Systems (101) and methods (300) for generation of a very-large-scale-integration floorplan (400). A method includes receiving (302) inputs (322, 324, 326) for automatic placements of macros in a floorplan (400). The method includes performing (304) an automatic macro placement process based on the received inputs (322, 324, 326). The method includes generating (308) the floorplan (400) according to the automatic macro placement process. The floorplan (400) can thereafter be used to generate a physical layout and a physical chip can thereafter be manufactured according to the generated physical layout.

Classes IPC  ?

  • G06F 30/392 - Conception de plans ou d’agencements, p. ex. partitionnement ou positionnement
  • G06F 30/398 - Vérification ou optimisation de la conception, p. ex. par vérification des règles de conception [DRC], vérification de correspondance entre géométrie et schéma [LVS] ou par les méthodes à éléments finis [MEF]
  • G06F 111/06 - Optimisation multi-objectif, p. ex. optimisation de Pareto utilisant le recuit simulé, les algorithmes de colonies de fourmis ou les algorithmes génétiques
  • G06F 115/08 - Blocs propriété intellectuelle [PI] ou cœur PI

52.

THREE-DIMENSIONAL PHOTOMASK TRANSMISSION WITH KERNEL-BASED MODELING

      
Numéro d'application US2023031287
Numéro de publication 2025/048779
Statut Délivré - en vigueur
Date de dépôt 2023-08-28
Date de publication 2025-03-06
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Clifford, Christopher

Abrégé

This application discloses a computing system to simulate three-dimensional light transmission in a near-field of a lithographic mask using a thin mask approximation of the lithographic mask rasterized from a mask layout design describing the lithographic mask and using a compact mask model including a plurality of directional kernels representing light diffraction in the near-field of the lithographic mask. The computing system can generate a wafer image or resist contours based on the simulated three-dimensional light transmission in the near-field of the lithographic mask, and utilize an optical proximity correction (OPC) process to modify the mask layout design based on the wafer image or the resist contours. The lithographic mask corresponding to the mask layout design is configured for use in the manufacturing of an integrated circuit.

Classes IPC  ?

  • G03F 1/36 - Masques à correction d'effets de proximitéLeur préparation, p. ex. procédés de conception à correction d'effets de proximité [OPC optical proximity correction]
  • G03F 7/00 - Production par voie photomécanique, p. ex. photolithographique, de surfaces texturées, p. ex. surfaces impriméesMatériaux à cet effet, p. ex. comportant des photoréservesAppareillages spécialement adaptés à cet effet

53.

TEST PATTERN GENERATION

      
Numéro d'application US2023031665
Numéro de publication 2025/048819
Statut Délivré - en vigueur
Date de dépôt 2023-08-31
Date de publication 2025-03-06
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Mukherjee, Nilanjan
  • Rajski, Janusz
  • Tsai, Kun-Han
  • Wu, Jay
  • Addepalli, Hari
  • Pomeranz, Irith

Abrégé

A method and data processing system for extracting a path with a longest delay time through an integrated circuit is provided. The method comprises obtaining a dataset for the integrated circuit comprising a maximum arrival time and maximum propagation delay, selecting a logical cell in the integrated circuit, identifying a longest arrival path from a start point in the integrated circuit to an output pin, O, of the selected logical cell based on the dataset, identifying a longest propagation path from an input pin, I, of the selected logical cell to an end point in the integrated circuit and extracting a longest path through the selected logical cell based on the identified longest arrival path and longest propagation path.

Classes IPC  ?

  • G01R 31/317 - Tests de circuits numériques
  • G01R 31/3183 - Génération de signaux d'entrée de test, p. ex. vecteurs, formes ou séquences de test
  • G01R 31/3193 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie avec une comparaison entre la réponse effective et la réponse connue en l'absence d'erreur
  • G06F 30/3312 - Analyse temporelle
  • G06F 30/367 - Vérification de la conception, p. ex. par simulation, programme de simulation avec emphase de circuit intégré [SPICE], méthodes directes ou de relaxation

54.

CELL LIBRARY CHARACTERIZATION

      
Numéro d'application US2023031744
Numéro de publication 2025/048823
Statut Délivré - en vigueur
Date de dépôt 2023-08-31
Date de publication 2025-03-06
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Mukherjee, Nilanjan
  • Rajski, Janusz
  • Tsai, Kun-Han
  • Wu, Jay
  • Addepalli, Hari
  • Pomeranz, Irith

Abrégé

A method and data processing system for characterizing a logical cell in an integrated circuit are provided. The method comprises identifying an input pin and output pin of the cell as a selected input pin and output pin, evaluating a model of the logical cell for each pair of input signals from a set comprising pairs of input signals, identifying a subset of the set based on the evaluation, and determining a propagation delay for each pair in the subset.

Classes IPC  ?

  • G01R 31/317 - Tests de circuits numériques
  • G06F 30/33 - Vérification de la conception, p. ex. simulation fonctionnelle ou vérification du modèle
  • G06F 30/3312 - Analyse temporelle

55.

METHOD, SYSTEM, DEVICE, AND MEDIUM FOR GENERATING 3D MODEL OF INDUSTRIAL SCENE

      
Numéro d'application CN2023115931
Numéro de publication 2025/043559
Statut Délivré - en vigueur
Date de dépôt 2023-08-30
Date de publication 2025-03-06
Propriétaire
  • SIEMENS INDUSTRY SOFTWARE INC. (USA)
  • SIEMENS LTD. , CHINA (Chine)
Inventeur(s)
  • Liao, Zibo
  • Zhao, Yu Hang
  • Blumenfeld, Rafael
  • Cohen, Bar

Abrégé

A method, system, device, and medium for generating 3D model of industrial scene are disclosed. The method comprises: acquiring point cloud data for an industrial scene; determining a domain of the industrial scene; acquiring a trained semantic segmentation model associated with the domain from a model library, wherein the model library comprises multiple trained semantic segmentation models associated with respective domains; performing semantic segmentation on the point cloud data to obtain multiple segmented objects, based on the trained semantic segmentation model associated with the domain; meshing the multiple segmented objects; and generating a 3D model of the industrial scene based on the meshed multiple segmented objects. A flexible domain-specific model library is provided to meet the needs from different industrial scenes, thus improving modeling efficiency.

Classes IPC  ?

  • G06T 17/00 - Modélisation tridimensionnelle [3D] pour infographie

56.

HASHING CIRCUITRY BASED ON HYBRID RING GENERATORS

      
Numéro d'application US2023029827
Numéro de publication 2025/034214
Statut Délivré - en vigueur
Date de dépôt 2023-08-09
Date de publication 2025-02-13
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Rajski, Janusz
  • Trawka, Maciej
  • Tyszer, Jerzy
  • Wlodarczak, Bartosz

Abrégé

A hashing circuit comprises: an n-bit hybrid ring generator configured to implement a primitive polynomial of degree n, a phase shifter coupled to outputs of the n-bit hybrid ring generator, and an m-bit nonlinear sequential device coupled to outputs of the phase shifter. The n-bit hybrid ring generator comprises n state elements coupled to each other to form an n-bit ringlike structure, k feedback-enable devices, and injection devices configured to inject bits of the binary value into the n-bit ringlike structure. The n-bit ringlike structure has a top row and a bottom row, of which each has at least one of the n state elements and at least one of the k feedback- enable devices. The m-bit nonlinear sequential device comprises m state elements coupled to each other to form an m-bit ringlike structure and one or more feedback paths comprising nonlinear devices implementing nonlinear functions.

Classes IPC  ?

  • H04L 9/06 - Dispositions pour les communications secrètes ou protégéesProtocoles réseaux de sécurité l'appareil de chiffrement utilisant des registres à décalage ou des mémoires pour le codage par blocs, p. ex. système DES

57.

PINN-BASED SURROGATE MODELING USING LOCAL TURBULENCE ESTIMATES

      
Numéro d'application US2023028311
Numéro de publication 2025/023920
Statut Délivré - en vigueur
Date de dépôt 2023-07-21
Date de publication 2025-01-30
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Chakraborty, Amit
  • Dey, Biswadip
  • Ghosh, Shinjan

Abrégé

System and method optimize fluid dynamics modeling using a physics informed neural network (FINN) and a deep neural network (DNN). The DNN is trained to create a data driven mapping for invariants and Reynolds stress tensors associated with the fluid field based on simulation data. The FINN is trained using Navier Stokes and continuity equation based losses, using Reynolds stress tensor correction terms derived from the mapping and from invariants and tensors derived from estimated flow field variables. The FINN inputs include boundary conditions, and time-space coordinates for sampling points in the fluid flow field which describe time evolution of the turbulence problem depending on geometric bounds for the flow field.

Classes IPC  ?

  • G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle
  • G06F 30/28 - Optimisation, vérification ou simulation de l’objet conçu utilisant la dynamique des fluides, p. ex. les équations de Navier-Stokes ou la dynamique des fluides numérique [DFN]
  • G06N 3/045 - Combinaisons de réseaux
  • G06N 3/0895 - Apprentissage faiblement supervisé, p. ex. apprentissage semi-supervisé ou auto-supervisé
  • G06F 111/10 - Modélisation numérique
  • G06F 113/08 - Fluides

58.

MESH OFFSETTING METHOD

      
Numéro d'application US2023028655
Numéro de publication 2025/023935
Statut Délivré - en vigueur
Date de dépôt 2023-07-26
Date de publication 2025-01-30
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Lyons, Alex
  • Nanson, Peter
  • Collins, Richard
  • Case, Timothy
  • Cox, Diana

Abrégé

A computer-implemented method for offsetting a mesh in a three-dimensional model is provided. A first mesh offsetting method is applied to a mesh to obtain a first offset mesh. A self-intersecting portion of the first offset mesh, where either a topological or geometric condition is met, is identified. Facets of the mesh that map to facets of the first offset mesh containing the self-intersecting portion are identified. A region of the mesh where facets at the boundary of the region satisfy a predefined set of boundary conditions is generated. A second mesh offsetting method is applied to the region of the mesh to obtain a second offset mesh. Facets of the first offset mesh corresponding to the facets of the region are removed from the first offset mesh and the first offset mesh and the second offset mesh are combined to obtain a third offset mesh.

Classes IPC  ?

  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation
  • G06T 19/20 - Édition d'images tridimensionnelles [3D], p. ex. modification de formes ou de couleurs, alignement d'objets ou positionnements de parties

59.

METHOD OF IDENTIFYING MESSAGE END POINTS IN A MESSAGE STREAM

      
Numéro d'application US2023026315
Numéro de publication 2025/005906
Statut Délivré - en vigueur
Date de dépôt 2023-06-27
Date de publication 2025-01-02
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Potter, Alexander
  • Robertson, Iain

Abrégé

A method for identifying message end points in real-time in a data transmission of contiguous multibyte messages in an integrated circuit is provided. The method includes receiving a data transmission of bytes over one or more clock cycles. The data transmission includes a plurality of contiguous multibyte messages. The method also includes generating an array of data values for each of the one or more clock cycles, storing the arrays, and identifying end points of one or more messages of the plurality of contiguous multibyte messages based on the stored arrays.

Classes IPC  ?

  • G01R 31/317 - Tests de circuits numériques
  • G06F 11/34 - Enregistrement ou évaluation statistique de l'activité du calculateur, p. ex. des interruptions ou des opérations d'entrée–sortie
  • G06F 11/36 - Prévention d'erreurs par analyse, par débogage ou par test de logiciel

60.

METHOD AND APPARATUS FOR DECODING TRACE DATA

      
Numéro d'application US2023026653
Numéro de publication 2025/005921
Statut Délivré - en vigueur
Date de dépôt 2023-06-29
Date de publication 2025-01-02
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Zak, Marcel

Abrégé

A method and apparatus for decoding trace data output by monitoring circuitry configured to monitor execution of a program on a computing system are provided. The method includes receiving trace data including a sequence of packets from the computing system, identifying a first synchronization packet in a first predefined format, and identifying one or more further synchronization packets. The method also includes partitioning the sequence of packets into subsequences based on the identified synchronization packets, and decoding the plurality of subsequences.

Classes IPC  ?

  • G06F 11/36 - Prévention d'erreurs par analyse, par débogage ou par test de logiciel

61.

METHOD OF IDENTIFYING STRUCTURES IN A CAD MODEL

      
Numéro d'application US2023024446
Numéro de publication 2024/253635
Statut Délivré - en vigueur
Date de dépôt 2023-06-05
Date de publication 2024-12-12
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Mawby, Eric
  • Ozanne, Nicholas
  • Rogers, Jeremy
  • Gibbens, Michael

Abrégé

A computer-implemented method for identifying topological structures in a three-dimensional model is described. A signature including characteristics of a first set of topological structures of the three-dimensional model is obtained. A selection of a second topological structure by a user is received via a user input device. The signature is modified based on the selection to include characteristics common to the first set of topological structures, the second topological structure, and a topological neighborhood of the second topological structure. Further topological structures are identified based on the modified signature.

Classes IPC  ?

  • G06F 30/10 - CAO géométrique
  • G06F 3/048 - Techniques d’interaction fondées sur les interfaces utilisateur graphiques [GUI]
  • G06F 3/04815 - Interaction s’effectuant dans un environnement basé sur des métaphores ou des objets avec un affichage tridimensionnel, p. ex. modification du point de vue de l’utilisateur par rapport à l’environnement ou l’objet
  • G06F 111/04 - CAO basée sur les contraintes

62.

METHOD OF GENERATING SHAPE PROFILES OF COMPONENTS IN A COMPUTER-AIDED DESIGN MODEL

      
Numéro d'application US2023024423
Numéro de publication 2024/253634
Statut Délivré - en vigueur
Date de dépôt 2023-06-05
Date de publication 2024-12-12
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Kennett, David
  • Huang, Hsu-Wei

Abrégé

A computer implemented method for generating a vector representation of shape characteristics of a component that forms part of a computer-aided design (CAD) model is provided. The method includes generating a mesh representation comprising a plurality of triangular facets; determining a set of points that are quasi-randomly distributed on the mesh; portioning a domain containing the component into a plurality of concentric spheres; identifying a subset of points in each sphere; and determining a vector representation of shape characteristics of the component based on the variance of points along principal axes in each sphere.

Classes IPC  ?

  • G06F 30/12 - CAO géométrique caractérisée par des moyens d’entrée spécialement adaptés à la CAO, p. ex. interfaces utilisateur graphiques [UIG] spécialement adaptées à la CAO
  • G06F 18/2411 - Techniques de classification relatives au modèle de classification, p. ex. approches paramétriques ou non paramétriques basées sur la proximité d’une surface de décision, p. ex. machines à vecteurs de support

63.

SMART SVG ICONS

      
Numéro d'application US2023023803
Numéro de publication 2024/248791
Statut Délivré - en vigueur
Date de dépôt 2023-05-30
Date de publication 2024-12-05
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Dunn, Jason

Abrégé

Computer-implemented method and system enable rendering scalable vector icons used in a computer application. An icon engine retrieves a single icon file from a library, the icon file having graphic information for a plurality of defined icon sizes and color themes defined using vectors for each of a plurality of icon sizes with unique elements assigned to a respective size layer. Icon modes of an active computer application are identified, such as size mode and color theme mode. Layer activation for features assigned to a size mode for the icon is based on the identified icon mode. Color theme for the icon is based on the identified color theme mode. The icon data file is configured according to the selected layer activation and color theme and rendered on a computer display.

Classes IPC  ?

  • G06F 9/451 - Dispositions d’exécution pour interfaces utilisateur
  • G06F 16/957 - Optimisation de la navigation, p. ex. mise en cache ou distillation de contenus
  • G06T 11/60 - Édition de figures et de texteCombinaison de figures ou de texte

64.

A METHOD FOR PROVIDING AN INTUITIVE USER INTERFACE IN AT LEAST ONE MOM SYSTEM

      
Numéro d'application EP2024063307
Numéro de publication 2024/245747
Statut Délivré - en vigueur
Date de dépôt 2024-05-15
Date de publication 2024-12-05
Propriétaire
  • SIEMENS AKTIENGESELLSCHAFT (Allemagne)
  • SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Corsini, Giorgio
  • Neill, Stephen
  • Rohde, Wolfgang
  • Venturi, Giovanni

Abrégé

It is the objective of the present invention to define a method that uses semantic technology to manage a single abstract level data model of different applications and automatize the process of producing the interoperability rules when necessary. Further, it would be desirable when an intuitive user interface could be provided that opens a natural and intuitive way of exploring the ontology for the user while shielding the user at the same time from the technical aspects such as executing SPARQL queries, etc. This objective is achieved according to the present invention by a method for providing an intuitive user interface in at least one MOM system, said at least one MOM system controlling a manufacturing environment of autonomous factories, said method comprising the steps of: a) encoding manufacturing domain knowledge for the autonomous factories in a democratic network of extensible and configurable ontologies, b) defining the ontology of a MOM domain through a semantic conceptualization of the manufacturing domain knowledge; c) providing a web-based framework to create an intuitive user interface for navigating the ontologies and for associating concepts comprised in the ontologies to logical data structures coming from existing applications that are comprised in the MOM system, wherein: c1) the user interface being enabled to allow a user to select an ontology and to use common terms for searching for a concept associated with said ontology the user is interested in; c2) the user interface being further enabled to provide a list of concepts that match the respective search; c3) the user interface being further enabled to allow a user to select at least one concept out of the list of concepts and to provide a list of entities related to the selected concept; c4) the user interface being further enabled to allow a user to select at least one entity out of the list of entities and to provide a visualization of the selected entity; and c5) the user interface being further enabled to allow a user to select a number of entities referring to the same concept over manufacturing domains thereby generating transformation rules to handle the logical data structure across said factories and/or domains with respect to the selected entities in the manufacturing environment of autonomous factories.

Classes IPC  ?

65.

METHOD FOR DETERMINING MASS PROPERTIES OF A BALL-AND-ROD LATTICE

      
Numéro d'application US2023022057
Numéro de publication 2024/237904
Statut Délivré - en vigueur
Date de dépôt 2023-05-12
Date de publication 2024-11-21
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Durnford, Callum
  • Ettle, James
  • Cox, Diana
  • Goddard, Matthew
  • Collins, Richard

Abrégé

A method for determining a mass property of a rod and ball lattice (400) is provided. The method comprises determining the mass property for each ball (410,420,430) in the lattice, determining, for each rod (440,450), the mass property of a portion comprising the inter-body volume between the terminal balls (410,420,430) of the rod (440,450), generating an initial estimate of the mass property for the lattice (400) based on the mass properties of the balls (410,420,430) and portions of the rods (440,450), and for each ball (410,420,430), identifying overlapping portions (460) between pairs of rods (440,450) that terminate at the ball (410,420,430) and estimating the mass property for each identified overlapping portion (460) and modifying the initial estimate of the mass property of the lattice (400) based on the estimation of the mass properties of the overlapping portions (460).

Classes IPC  ?

  • G06F 30/23 - Optimisation, vérification ou simulation de l’objet conçu utilisant les méthodes des éléments finis [MEF] ou les méthodes à différences finies [MDF]
  • G06T 7/62 - Analyse des attributs géométriques de la superficie, du périmètre, du diamètre ou du volume
  • G06T 7/66 - Analyse des attributs géométriques des moments d'image ou du centre de gravité
  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation
  • G06F 113/10 - Fabrication additive, p. ex. impression en 3D

66.

AUTOMATED CONTROL OF ACCESS TO AN ASSET IN INDUSTRIAL POINTCLOUD-BASED REPRESENTATION

      
Numéro d'application IB2023055016
Numéro de publication 2024/236349
Statut Délivré - en vigueur
Date de dépôt 2023-05-16
Date de publication 2024-11-21
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Murashkin, Vladislav
  • Blumenfeld, Rafael

Abrégé

Systems and a method for receiving data of an engineering model and data of a pointcloud-based representation of a same given industrial environment. Data on a selection of at least two dimension-sizes of an asset of the engineering model is received; whereby a view access to the asset is to be controlled for at least one user. For the asset, the third dimension-size is received or extrapolating it from spatial information. An asset volume whose access is to be controlled is defined, herein called ACA-volume. Within the pointcloud-based representation a volume corresponding to the ACA-volume is identified.

Classes IPC  ?

  • G06T 7/50 - Récupération de la profondeur ou de la forme
  • G06T 17/05 - Modèles géographiques
  • G06T 17/10 - Description de volumes, p. ex. de cylindres, de cubes ou utilisant la GSC [géométrie solide constructive]
  • G06V 20/64 - Objets tridimensionnels

67.

POINT-BASED MESH GENERATION FOR COMPUTER-AIDED DESIGN (CAD) OBJECTS

      
Numéro d'application US2023019779
Numéro de publication 2024/226033
Statut Délivré - en vigueur
Date de dépôt 2023-04-25
Date de publication 2024-10-31
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Mukherjee, Nilanjan
  • Reddy, Vasa
  • Schlessman, Gregory
  • Kandula, Dhana

Abrégé

A computing system (100) may include a point identification engine (108) configured to identify a point (220, 320, 610, 620) on a computer-aided design (CAD) face (210) of a CAD object and a point-based meshing engine (110) configured to construct an imprint shape (530) that surrounds the identified point (220, 320, 610, 620) by performing an iterative imprint shape determination process. The point-based meshing engine (110) may construct a candidate imprint shape (510, 520) for a given iteration, orient the candidate imprint shape, and perform an intersection check for the candidate imprint shape (510, 520). When the intersection check indicates an intersection, the point-based meshing engine (110) may determine a candidate imprint shape from a previous iteration as the imprint shape (530). The point-based meshing engine 110 may also be configured to mesh (414) the determined imprint shape (530) that surrounds the identified point (220, 320, 610, 620).

Classes IPC  ?

  • G06F 30/10 - CAO géométrique
  • G06T 17/00 - Modélisation tridimensionnelle [3D] pour infographie
  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation
  • G06F 111/10 - Modélisation numérique

68.

METHOD AND SYSTEM FOR ANALYZING A COMPUTER PROGRAM

      
Numéro d'application US2023020020
Numéro de publication 2024/226045
Statut Délivré - en vigueur
Date de dépôt 2023-04-26
Date de publication 2024-10-31
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Zak, Marcel

Abrégé

A method for inferring a program counter of a program executed by a computing system is provided. The method includes identifying, based on a program counter value including an address of a sequential instruction in the program, a sequential execution path containing the sequential instruction. The method also includes inferring a further program counter value based on the identified sequential execution path. The further program counter value includes an address of a last sequential instruction in the identified sequential execution path.

Classes IPC  ?

  • G06F 11/34 - Enregistrement ou évaluation statistique de l'activité du calculateur, p. ex. des interruptions ou des opérations d'entrée–sortie

69.

HYBRID RING GENERATORS

      
Numéro d'application US2023020389
Numéro de publication 2024/226059
Statut Délivré - en vigueur
Date de dépôt 2023-04-28
Date de publication 2024-10-31
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Rajski, Janusz
  • Tyszer, Jerzy
  • Trawka, Maciej
  • Wlodarczak, Bartosz

Abrégé

nnmmnnnnn-bit hybrid ring generator-based system may be a configurable hybrid ring generator, or a multiple-input signature register.

Classes IPC  ?

  • G06F 7/58 - Générateurs de nombres aléatoires ou pseudo-aléatoires

70.

S)

      
Numéro d'application US2023066342
Numéro de publication 2024/226095
Statut Délivré - en vigueur
Date de dépôt 2023-04-28
Date de publication 2024-10-31
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Ramses, John
  • Antoun, Georges
  • Roushdy, Mazin
  • Ollitervo, Sakari
  • Squiers, Ronald James

Abrégé

A system (100) may include a verification platform (120) configured to represent a design-under-test (DUT) (122) to verify operation of the DUT (122). The system (100) may also include a computing system (102) comprising a data construction engine (110) configured to construct management data (210) to configure the DUT (122) in a given manner and a data blending engine (112). The data blending engine (112) may be configured to access synthetic traffic data (220) to test the operation of the DUT (122), blend the management data (210) and the synthetic traffic data (220) into a blended data stream (230), and communicate the blended data stream (230) comprising the management data (210) and the synthetic data across a physical communication link to the verification platform (120) that represents the DUT (122).

Classes IPC  ?

  • G06F 30/331 - Vérification de la conception, p. ex. simulation fonctionnelle ou vérification du modèle par simulation avec accélération matérielle, p. ex. en utilisant les réseaux de portes programmables [FPGA] ou une émulation
  • G06F 13/42 - Protocole de transfert pour bus, p. ex. liaisonSynchronisation
  • G06F 13/362 - Gestion de demandes d'interconnexion ou de transfert pour l'accès au bus ou au système à bus communs avec commande d'accès centralisée

71.

MEMORY BUILT-IN SELF-TEST WITH AUTOMATED DETECTION OF MAGNETIC TUNNELING JUNCTION DEGRADATION FOR REPAIR

      
Numéro d'application US2023018666
Numéro de publication 2024/215333
Statut Délivré - en vigueur
Date de dépôt 2023-04-14
Date de publication 2024-10-17
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Yun, Jongsin
  • Keim, Martin
  • Bakhtavari Mamaghani, Sina
  • Münch, Christopher
  • Tahoori, Mehdi Baradaran

Abrégé

This application discloses a memory device having multiple memory cells, each configured to store different values of data using different resistance states. A memory built-in self-test system can prompt the memory device to perform memory read operations for the memory cells storing the data in the different resistance states, determine a separation between the different resistance states of at least a subset of the memory cells, and detect one or more of the memory cells has a degraded tunneling layer in a magnetic tunneling junction based on the separation between the different resistive states in the at least the subset of the memory cells. A built-in repair analysis circuit can perform a repair of a group of the memory cells including at least on one of the detected memory cells based on the detection of the memory cells having degraded tunneling layers in the magnetic tunneling junctions.

Classes IPC  ?

  • G11C 29/50 - Test marginal, p. ex. test de vitesse, de tension ou de courant
  • G11C 29/00 - Vérification du fonctionnement correct des mémoiresTest de mémoires lors d'opération en mode de veille ou hors-ligne
  • G11C 29/02 - Détection ou localisation de circuits auxiliaires défectueux, p. ex. compteurs de rafraîchissement défectueux
  • G11C 29/04 - Détection ou localisation d'éléments d'emmagasinage défectueux
  • G11C 29/12 - Dispositions intégrées pour les tests, p. ex. auto-test intégré [BIST]
  • G11C 29/16 - Mise en œuvre d'une logique de commande, p. ex. décodeurs de mode de test utilisant des unités microprogrammées, p. ex. machines à états logiques
  • G11C 29/24 - Accès à des cellules additionnelles, p. ex. cellules factices ou cellules redondantes
  • G11C 29/44 - Indication ou identification d'erreurs, p. ex. pour la réparation
  • G11C 29/34 - Accès simultané à plusieurs bits
  • G11C 29/42 - Dispositifs de vérification de réponse utilisant des codes correcteurs d'erreurs [ECC] ou un contrôle de parité

72.

ENABLING AND OPTIMIZING PRODUCTION IN THE ONE OR MORE PLANTS

      
Numéro d'application US2023016846
Numéro de publication 2024/205587
Statut Délivré - en vigueur
Date de dépôt 2023-03-30
Date de publication 2024-10-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Blumenfeld, Rafael
  • Grimm, Stephan
  • Lange, Ronald
  • Michaeli, David
  • Milligan, Patrick Jon
  • Peschke, Jörn
  • Schlögl, Wolfgang

Abrégé

A method of generating a master recipe including resources and describing a process flow for a specific production in a specific plant includes obtaining a general recipe including information related to the process flow without identifying the resources to be used to perform the process. The method includes: determining required capabilities of the general recipe in the form of a first semantic graph; determining provided capabilities of at least one plant in the form of a second semantic graph labeled with the capabilities of resources of the one or more plants and/or based on an equipment topology of the respective plant also in the industry specific language or ontology; semantically matching the required capabilities with the provided capabilities by identifying one or more sub-graphs in the second semantic graph comprising the resources for carrying out the process flow; and outputting the one or more sub-graphs as a master recipe.

Classes IPC  ?

  • G05B 19/418 - Commande totale d'usine, c.-à-d. commande centralisée de plusieurs machines, p. ex. commande numérique directe ou distribuée [DNC], systèmes d'ateliers flexibles [FMS], systèmes de fabrication intégrés [IMS], productique [CIM]
  • G06F 16/901 - IndexationStructures de données à cet effetStructures de stockage

73.

METHOD TO ENABLE AUTONOMOUS FACTORIES BY ENCODING MANUFACTURING DOMAIN KNOWLEDGE IN A NETWORK OF EXTENSIBLE AND CONFIGURABLE ONTOLOGIES

      
Numéro d'application EP2024056188
Numéro de publication 2024/199956
Statut Délivré - en vigueur
Date de dépôt 2024-03-08
Date de publication 2024-10-03
Propriétaire
  • SIEMENS AKTIENGESELLSCHAFT (Allemagne)
  • SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Corsini, Giorgio
  • Neill, Stephen
  • Rohde, Wolfgang
  • Venturi, Giovanni

Abrégé

Thus, it is the objective of the present invention to define a method that uses semantic technology to manage a single abstract level data model of different applications and automatize the process of producing the interoperability rules among different manufacturing sites. This objective is achieved according to the present invention by a method for enabling MOM systems for autonomous factories by encoding manufacturing domain knowledge in a democratic network of extensible and configurable ontologies, said method comprising the steps of: a) defining an ontology of a MOM domain through a semantic conceptualization of the manufacturing domain knowledge; b) representing the ontology through a least one knowledge graph; c) implementing the ontology in owl format; d) providing a web-based framework to provide a set of intuitive user friendly user interfaces to navigate the ontology and associate concepts comprised in the ontology to logical data structures coming from existing applications that are comprised in the MOM systems; e) mapping of the logical data structures through semantic matches of the semantic conceptualization; f) generating an interoperability code between the data structures of different applications thereby mapping data structure of the different applications within the same MOM system and/or over a number of distributed MOM systems of the autonomous factories.

Classes IPC  ?

74.

MULTI-PORT MEMORY TESTING USING CONCURRENT OPERATIONS

      
Numéro d'application US2023016206
Numéro de publication 2024/205554
Statut Délivré - en vigueur
Date de dépôt 2023-03-24
Date de publication 2024-10-03
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Nadeau-Dostie, Benoit
  • Wei, Zou
  • Au, Albert

Abrégé

A memory-testing circuit in a circuit configured to perform a test on one or more memories in the circuit, of which each has a plurality of logical ports. The memory-testing circuit comprises: a test algorithm control unit configured to implement a test algorithm, a reference address generator configured to generate, based on the test algorithm, a reference address, one or more concurrent address generators configured to generate, based on the reference address, one or more concurrent addresses, and address selecting circuitry for each of the one or more memories configured to select, based on an address selection signal, the reference address or one of the one or more concurrent addresses for each of the plurality of logical ports. One logical port is configured to receive an algorithm command and the reference address, while the other logical ports are configured to receive concurrent commands and the concurrent addresses.

Classes IPC  ?

  • G11C 29/18 - Dispositifs pour la génération d'adressesDispositifs pour l'accès aux mémoires, p. ex. détails de circuits d'adressage
  • G11C 29/20 - Dispositifs pour la génération d'adressesDispositifs pour l'accès aux mémoires, p. ex. détails de circuits d'adressage utilisant des compteurs ou des registres à décalage à rétroaction linéaire [LFSR]
  • G11C 29/28 - Réseaux multiples dépendants, p. ex. réseaux multi-bits
  • G11C 29/56 - Équipements externes pour test de mémoires statiques, p. ex. équipement de test automatique [ATE]Interfaces correspondantes
  • G11C 8/16 - Réseau de mémoire à accès multiple, p. ex. adressage à un élément d'emmagasinage par au moins deux groupes de lignes d'adressage indépendantes

75.

MEMORY BUILT-IN SELF-TEST WITH AUTOMATED WRITE TRIM TUNING

      
Numéro d'application US2023016078
Numéro de publication 2024/196372
Statut Délivré - en vigueur
Date de dépôt 2023-03-23
Date de publication 2024-09-26
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Yun, Jongsin
  • Nadeau-Dostie, Benoit
  • Keim, Martin

Abrégé

This application discloses a memory device configured to store data using a write voltage having a voltage level corresponding to a write trim. A memory built-in self-test system can prompt the memory device to perform memory write operations to store the data using selected test values for the write trim, determine when the memory device fails to correctly store the data with the write voltages corresponding to each of the selected test values for the write trim, and set the write trim for the memory device based, at least in part, on the determination of failures of the memory device to correctly store the data. The memory built-in self-test system is configured to iteratively select one or more of the test values for the write trim based on the determination of failures of the memory device to correctly store the data.

Classes IPC  ?

  • G11C 29/02 - Détection ou localisation de circuits auxiliaires défectueux, p. ex. compteurs de rafraîchissement défectueux
  • G11C 11/16 - Mémoires numériques caractérisées par l'utilisation d'éléments d'emmagasinage électriques ou magnétiques particuliersÉléments d'emmagasinage correspondants utilisant des éléments magnétiques utilisant des éléments dans lesquels l'effet d'emmagasinage est basé sur l'effet de spin

76.

METHOD FOR GENERATING TOOLPATH, AND SYSTEM FOR GENERATING TOOLPATH AND COMPUTER-READABLE STORAGE MEDIUM THEREOF

      
Numéro d'application CN2023079388
Numéro de publication 2024/178727
Statut Délivré - en vigueur
Date de dépôt 2023-03-02
Date de publication 2024-09-06
Propriétaire
  • SIEMENS INDUSTRY SOFTWARE INC. (USA)
  • SIEMENS LTD. , CHINA (Chine)
Inventeur(s) Wang, Kai

Abrégé

Disclosed is a method for generating a toolpath of a tool for fixed shaft milling. The method includes: inputting a workpiece geometry, the workpiece geometry including a milling region; defining a region falling within the same range of height and communicated with the milling region on the workpiece geometry as an auxiliary region, the height being a height defined along an orientation of a tool axis; defining a combined region of the milling region and the auxiliary region as a transition region; generating a spiral toolpath of the transition region; and replacing a portion for milling the auxiliary region in the spiral tool path with a non-milling toolpath. The method is favorable to improving uniformity of the toolpath. Further disclosed is a system for generating a toolpath and computer-readable storage medium thereof.

Classes IPC  ?

  • G05B 19/19 - Commande numérique [CN], c.-à-d. machines fonctionnant automatiquement, en particulier machines-outils, p. ex. dans un milieu de fabrication industriel, afin d'effectuer un positionnement, un mouvement ou des actions coordonnées au moyen de données d'un programme sous forme numérique caractérisée par systèmes de commande de positionnement ou de commande de contournage, p. ex. pour commander la position à partir d'un point programmé vers un autre point ou pour commander un mouvement le long d'un parcours continu programmé

77.

CHARACTERIZATION OF LITHOGRAPHIC PROCESS VARIATION FOR MANUFACTURING PROCESS CALIBRATION USING IMPORTANCE SAMPLING

      
Numéro d'application US2023014092
Numéro de publication 2024/181968
Statut Délivré - en vigueur
Date de dépôt 2023-02-28
Date de publication 2024-09-06
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Pan, Zexin
  • Latypov, Azat
  • Fenger, Germain Louis
  • Wei, Chih-I

Abrégé

A computing system can characterize stochastic variation in a lithographic process for manufacturing an integrated circuit using importance sampling. The computing system can select a modification to the lithographic process, and identify structures of the integrated circuit that, when manufactured using the modified lithographic process, correspond to manufacturing failures. The computing system can determine a likelihood ratio based on the modification to the lithographic process relative the unmodified lithographic process for manufacturing the integrated circuit, and utilize the likelihood ratio to weigh the manufacturing failures of the structures manufactured using the modified lithographic process to characterize the stochastic variation in the unmodified lithographic process. The computing system can utilize the characterization of the stochastic variation in the unmodified lithographic process to calibrate an electronic design automation tool configured to modify a layout design for the integrated circuit or a mask design for manufacturing of the integrated circuit.

Classes IPC  ?

  • G03F 7/00 - Production par voie photomécanique, p. ex. photolithographique, de surfaces texturées, p. ex. surfaces impriméesMatériaux à cet effet, p. ex. comportant des photoréservesAppareillages spécialement adaptés à cet effet

78.

EXPERT-BASED GUIDANCE THROUGH VIRTUAL AVATARS IN AUGMENTED REALITY AND VIRTUAL REALITY ENVIRONMENTS

      
Numéro d'application US2023013706
Numéro de publication 2024/177634
Statut Délivré - en vigueur
Date de dépôt 2023-02-23
Date de publication 2024-08-29
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Rezayat, Mohsen
  • Hamadou, Mehdi

Abrégé

A system may include a semantic actions database configured to reference a working context knowledge graph to specify target actions to perform a task and environment conditions of an environment in which an individual performs the task. The system may also include an expert avatar engine configured to access a posture set from a digital data stream of a target individual performing the task in an environment, classify the postures of the posture set into discrete actions, retrieve target actions from the semantic actions database for performing the task in the environment, generate guidance for the target individual based on a comparison between the discrete actions classified for the target individual and the target actions retrieved from the semantic actions database, and provide the guidance to the target individual to assist the target individual in performing the task.

Classes IPC  ?

  • G06F 3/01 - Dispositions d'entrée ou dispositions d'entrée et de sortie combinées pour l'interaction entre l'utilisateur et le calculateur
  • G06V 10/776 - ValidationÉvaluation des performances
  • G06V 40/20 - Mouvements ou comportement, p. ex. reconnaissance des gestes
  • G09B 19/00 - Enseignement non couvert par d'autres groupes principaux de la présente sous-classe
  • G05B 19/418 - Commande totale d'usine, c.-à-d. commande centralisée de plusieurs machines, p. ex. commande numérique directe ou distribuée [DNC], systèmes d'ateliers flexibles [FMS], systèmes de fabrication intégrés [IMS], productique [CIM]

79.

BLENDING METHOD

      
Numéro d'application US2023012993
Numéro de publication 2024/172808
Statut Délivré - en vigueur
Date de dépôt 2023-02-14
Date de publication 2024-08-22
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Nagy, Adam
  • Nanson, Peter
  • Collins, Richard

Abrégé

A computer-implemented method is provided for generating a blend surface for a model of a component. The method comprises: determining a first curve in three-dimensional space, wherein, for each point on the first curve, the distance of the point from a first surface and the distance of the point from a second surface is within a threshold of a pre-determined parameter; determining a second curve comprising a projection of the first curve on to the first surface; determining a third curve comprising a projection of the first curve on to the second surface; generating, based on the first curve, the second curve, and the third curve, a first field function comprising a signed distance from a point in three-dimensional space to a blend surface between the first surface and the second surface; and generating the blend surface based on the first field function.

Classes IPC  ?

  • G06T 17/30 - Description de surfaces, p. ex. description de surfaces polynomiales
  • G06T 15/10 - Effets géométriques

80.

CELL-AWARE CHAIN DIAGNOSIS

      
Numéro d'application US2023061896
Numéro de publication 2024/163015
Statut Délivré - en vigueur
Date de dépôt 2023-02-03
Date de publication 2024-08-08
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Urban, Szczepan
  • Janicki, Jakub
  • Sharma, Manish

Abrégé

Chain pattern results are analyzed to identify a faulty scan chain in a circuit and a fault associated with the faulty scan chain. Scan pattern results are analyzed to identify one or more faulty scan element candidates on the faulty scan chain. Analog simulation is then performed to identify faulty component candidates in the one or more faulty scan element candidates. During the process, components in each of the one or more faulty scan element candidates sensitive to a signal change at an input of the each of the one or more faulty scan element candidates can be determined. Physical failure analysis can be performed on the circuit to locate one or more defective components in the faulty component candidates.

Classes IPC  ?

  • G11C 29/02 - Détection ou localisation de circuits auxiliaires défectueux, p. ex. compteurs de rafraîchissement défectueux
  • G11C 29/36 - Dispositifs de génération de données, p. ex. inverseurs de données
  • G06F 30/333 - Conception en vue de la testabilité [DFT], p. ex. chaîne de balayage ou autotest intégré [BIST]
  • G06F 11/267 - Reconfiguration pour les tests, p. ex. LSSD, découpage

81.

OPTIMIZATION OF A PRODUCTION SYSTEM BASED ON PRODUCTION PLAN

      
Numéro d'application US2023011333
Numéro de publication 2024/158374
Statut Délivré - en vigueur
Date de dépôt 2023-01-23
Date de publication 2024-08-02
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Blumenfeld, Rafael
  • Grimm, Stephan
  • Lange, Ronald
  • Michaeli, David
  • Milligan, Patrick Jon
  • Peschke, Jörn
  • Schlögl, Wolfgang

Abrégé

A method, (e.g., a computer-implemented method), of generating a production plan (BOP) is provided. The method includes obtaining one or more product and/or production characteristics (E-BOM, CAD-BOM, M-BOM), (e.g., a production content, a production time, and/or a production quantity, for example in a E-BOM, M-BOM, and/or CAD file format), for a product to be manufactured. The method further includes determining, by a rule engine (10), based on the characteristics one or more library elements from a plurality of library elements (11a, 11b), wherein each library element includes one or more process descriptions relating to the characteristic. The method further includes arranging, by the rule engine (10), the one or more process descriptions into a production plan (BOP).

Classes IPC  ?

  • G06Q 10/06 - Ressources, gestion de tâches, des ressources humaines ou de projetsPlanification d’entreprise ou d’organisationModélisation d’entreprise ou d’organisation
  • G06Q 10/04 - Prévision ou optimisation spécialement adaptées à des fins administratives ou de gestion, p. ex. programmation linéaire ou "problème d’optimisation des stocks"
  • G06Q 10/08 - Logistique, p. ex. entreposage, chargement ou distributionGestion d’inventaires ou de stocks

82.

CIRCUIT DESIGN DATA OBFUSCATION

      
Numéro d'application US2023061158
Numéro de publication 2024/158426
Statut Délivré - en vigueur
Date de dépôt 2023-01-24
Date de publication 2024-08-02
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Cheng, Wu-Tung
  • Sharma, Manish
  • Gehringer, Douglas

Abrégé

Obfuscation types are assigned to strings related to a circuit design. The obfuscation types determine whether and how the strings are obfuscated. An obfuscation-related operation is then performed on the strings based on the obfuscation types. An interface unit determines whether a string to be written into an output file has one or more obfuscation types, wherein the output file is to be used in a process related to testing circuits fabricated based on the circuit design. The interface unit request access to the output file from an output file managing unit. Upon determining that the interface unit has a predefined security mechanism, the output file managing unit provides to the interface unit the access. Here, the predefined security mechanism comprises determining whether a string has one or more obfuscation types. The interface unit then generates the output file.

Classes IPC  ?

  • G06F 21/75 - Protection de composants spécifiques internes ou périphériques, où la protection d'un composant mène à la protection de tout le calculateur pour assurer la sécurité du calcul ou du traitement de l’information par inhibition de l’analyse de circuit ou du fonctionnement, p. ex. pour empêcher l'ingénierie inverse
  • G06F 21/14 - Protection des logiciels exécutables contre l’analyse de logiciel ou l'ingénierie inverse, p. ex. par masquage
  • G06F 30/30 - Conception de circuits

83.

METHOD AND SYSTEM FOR PERFORMING A SIX DEGREE OF FREEDOM MANIPULATION OF A VIRTUAL ENTITY IN THE 3D SPACE

      
Numéro d'application IB2023050369
Numéro de publication 2024/153966
Statut Délivré - en vigueur
Date de dépôt 2023-01-16
Date de publication 2024-07-25
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Feldman, Shahar

Abrégé

A virtual space mouse is provided which comprising three virtual 2D graphic objects called central knob, top knob and side knob. The three knobs are placed on a navigation area reachable by finger gestures. Each knob is configured for being draggable via substantially vertical/horizonal direction movements so as to define six basic mouse manipulation gestures each one associated to a corresponding basic 6DOF change which is a basic manipulation of a position or of a rotation of a given virtual entity in the 3D space in six degrees of freedom. Receive a drag gesture input applied to one or more of its three knobs and a corresponding 6DOF manipulation of the given virtual entity in the 3D space is performed.

Classes IPC  ?

  • G06F 3/0346 - Dispositifs de pointage déplacés ou positionnés par l'utilisateurLeurs accessoires avec détection de l’orientation ou du mouvement libre du dispositif dans un espace en trois dimensions [3D], p. ex. souris 3D, dispositifs de pointage à six degrés de liberté [6-DOF] utilisant des capteurs gyroscopiques, accéléromètres ou d’inclinaison
  • G06F 3/033 - Dispositifs de pointage déplacés ou positionnés par l'utilisateurLeurs accessoires
  • G06F 3/03 - Dispositions pour convertir sous forme codée la position ou le déplacement d'un élément
  • G06F 3/02 - Dispositions d'entrée utilisant des interrupteurs actionnés manuellement, p. ex. des claviers ou des cadrans

84.

MESH GENERATION METHOD

      
Numéro d'application US2023010915
Numéro de publication 2024/155270
Statut Délivré - en vigueur
Date de dépôt 2023-01-17
Date de publication 2024-07-25
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Goddard, Matthew
  • Durnford, Callum
  • Nanson, Peter
  • Lyons, Alex
  • Collins, Richard

Abrégé

A method for generating a mesh for a lattice structure in a three-dimensional model is provided. A first mesh incarnation method is applied to a first lattice to generate a first mesh. A region of the first lattice is identified where the first mesh incarnation method fails to generate mesh facets. A second lattice is extracted from the first lattice, including bodies of the first lattice in the region where the first mesh incarnation method fails to generate mesh facets. Polylines on the first mesh of the first lattice where an offset of the second lattice intersects with the first mesh are identified. A third lattice is generated based on the polylines. A second mesh incarnation method is applied to generate a first mesh of the third lattice. The first mesh of the first lattice and the first mesh of the third lattice are trimmed and combined to generate a second mesh with mesh facets in the region where the first mesh incarnation method fails to generate facets.

Classes IPC  ?

  • G06T 17/10 - Description de volumes, p. ex. de cylindres, de cubes ou utilisant la GSC [géométrie solide constructive]
  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation
  • B33Y 50/00 - Acquisition ou traitement de données pour la fabrication additive
  • G06F 30/20 - Optimisation, vérification ou simulation de l’objet conçu

85.

METHOD AND SYSTEM OF ASSEMBLING GEOMETRIC COMPONENTS IN A COMPUTER-AIDED DESIGN ENVIRONMENT

      
Numéro d'application US2023020185
Numéro de publication 2024/155289
Statut Délivré - en vigueur
Date de dépôt 2023-04-27
Date de publication 2024-07-25
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Sen, Avijit

Abrégé

A method and system for assembling one or more geometric components in a computer-aided design (CAD) environment is disclosed. In one embodiment, a method includes generating a first set of points corresponding to geometric feature(s) of a first geometric component, and generating a second set of points corresponding to geometric feature(s) of a second geometric component. The method includes determining whether there is a match between the first set of points and the second set of points based on distances between the first set of points and distances between the second set of points. Furthermore, the method includes generating assembly solution(s) for assembling the first geometric component and the second geometric component based on the match between the first set of points and the second set of points. Moreover, the method includes generating a CAD model including the first geometric component constrained with the second geometric component.

Classes IPC  ?

  • G06F 30/17 - Conception mécanique paramétrique ou variationnelle
  • G06F 111/04 - CAO basée sur les contraintes

86.

VOLUME MESH GENERATION

      
Numéro d'application US2022049491
Numéro de publication 2024/102129
Statut Délivré - en vigueur
Date de dépôt 2022-11-10
Date de publication 2024-05-16
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Detomi, Davide
  • Canann, Scott
  • Blake, Kenneth

Abrégé

A computer-implemented method of generating a volume mesh between two proximate, disjoint, and opposing mesh surfaces of a three-dimensional object in a modelling system is described. A projected volume is determined, wherein a mesh volume having a first topology is generated when the volume reaches the opposing mesh surfaces within a distance determined by the local mesh size. A second volume mesh with a different topology is generated when the projected volume does not reach the opposing mesh surface.

Classes IPC  ?

  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation

87.

VERTEX CHAIN OPTIMIZATION IN MESH STRUCTURES

      
Numéro d'application US2022049492
Numéro de publication 2024/102130
Statut Délivré - en vigueur
Date de dépôt 2022-11-10
Date de publication 2024-05-16
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Detomi, Davide
  • Blake, Kenneth
  • Canann, Scott

Abrégé

A computer-implemented method of optimizing vertex chains in a stack of disjoint mesh surfaces in a three-dimensional object in a modelling system is described. A vertex chain includes nearest-neighbor mesh vertices in adjacent surface meshes in the stack terminated by first and second endpoints. The modelling system is configured to render an image of the object including the meshed surfaces to a user. Aa stack of disjoint surface meshes describing a thin volume of an object, the stack containing at least one vertex chain is retrieved, and the alignment between the mesh vertices is constrained by an optimal Bézier curve.

Classes IPC  ?

  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation

88.

APPLICATIONS OF FUZZY LOGIC TO THIN REGION DETECTION IN MESH GENERATION

      
Numéro d'application US2022049486
Numéro de publication 2024/102128
Statut Délivré - en vigueur
Date de dépôt 2022-11-10
Date de publication 2024-05-16
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Detomi, Davide
  • Canann, Scott
  • Blake, Kenneth

Abrégé

ttt determine the membership of the fuzzy sets thin and non-thin.

Classes IPC  ?

  • G06F 30/23 - Optimisation, vérification ou simulation de l’objet conçu utilisant les méthodes des éléments finis [MEF] ou les méthodes à différences finies [MDF]
  • G06F 30/28 - Optimisation, vérification ou simulation de l’objet conçu utilisant la dynamique des fluides, p. ex. les équations de Navier-Stokes ou la dynamique des fluides numérique [DFN]
  • G06N 5/048 - Inférence floue
  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation
  • G06F 113/08 - Fluides

89.

METHOD AND SYSTEM FOR DETECTING AN OBJECT IN PHYSICAL ENVIRONMENTS

      
Numéro d'application US2022047700
Numéro de publication 2024/091226
Statut Délivré - en vigueur
Date de dépôt 2022-10-25
Date de publication 2024-05-02
Propriétaire SIEMENS INDUSTRY SOFTWARE INC, (USA)
Inventeur(s)
  • Blumenfeld, Rafael
  • Murashkin, Vladislav

Abrégé

The present invention proposes a system and a method for detecting and locating an object (310) in a physical environment (300), the method comprising: - - receiving (210) a first image (301) representing said physical environment (300), wherein said first image is a 3D point cloud image comprising location data for points in the point cloud image; - receiving (220) a second image (302) representing said physical environment (300), wherein said second image (302) is a 2D pixel image of said physical environment (300); - detecting (230) said object (310) in one or several regions in the second image (302); - for each region where said object (310) has been detected in the second image (302), finding (240) a corresponding region in the first image (301); - providing (250), via an interface, said corresponding region in the first image (301) as a location where said object (310) has been detected.

Classes IPC  ?

  • G06T 19/00 - Transformation de modèles ou d'images tridimensionnels [3D] pour infographie
  • G06T 7/73 - Détermination de la position ou de l'orientation des objets ou des caméras utilisant des procédés basés sur les caractéristiques
  • G06V 20/00 - ScènesÉléments spécifiques à la scène

90.

METHOD AND SYSTEM FOR CAPTURING AND MANAGING CHANGES TO A HISTORY-BASED PART MODEL

      
Numéro d'application US2022047808
Numéro de publication 2024/091228
Statut Délivré - en vigueur
Date de dépôt 2022-10-26
Date de publication 2024-05-02
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • King, Douglas
  • Mattson, Howard
  • Baardse, Dick
  • Rogers, Jeremy
  • Hu, Gang
  • Ozanne, Nicholas
  • Copley-May, Michael
  • Yu, Feng
  • He, Kai

Abrégé

A computer-implemented method and a system for capturing and managing changes to a history-based part model are described. The changes are generated external to the part and are stored as a feature within the history-based modelling system. The method and system are used in the context of a part assembly edit. A user supplies a generic change to the part assembly in the form of an initial driving change. This is analyzed to determine consequential changes within the model that need to be made to preserve the consistency of the model of the part assembly. For each part affected by the generic change, part-level shape-changes generated external to the part are captured in a new shape-change feature and stored at the end of the current feature history of the part

Classes IPC  ?

  • G06T 19/20 - Édition d'images tridimensionnelles [3D], p. ex. modification de formes ou de couleurs, alignement d'objets ou positionnements de parties
  • G06F 30/00 - Conception assistée par ordinateur [CAO]

91.

MULTI-PHASE LOGIC BUILT-IN SELF-TEST OBSERVATION SCAN TECHNOLOGY

      
Numéro d'application US2022077755
Numéro de publication 2024/076370
Statut Délivré - en vigueur
Date de dépôt 2022-10-07
Date de publication 2024-04-11
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Mukherjee, Nilanjan
  • Liu, Yingdi
  • Solecki, Jedrzej
  • Rajski, Janusz

Abrégé

A circuit comprises scan chains comprising scan cells and one or more observation scan chains. The scan chains comprise scan cells. The one or more observation scan chains comprises observation scan cells. Testing the circuit comprises a scan-capture phase and an observation scan phase. During the scan-capture phase, both the scan cells and the observation scan cells operate in a shift mode and a capture mode alternately. During the observation scan phase, the scan cells operating in the shift mode and the observation scan cells operating in a shift-observation mode.

Classes IPC  ?

  • G01R 31/3185 - Reconfiguration pour les essais, p. ex. LSSD, découpage

92.

METHOD OF GENERATING A COMPONENT INCLUDING A BLENDED LATTICE

      
Numéro d'application US2022049562
Numéro de publication 2024/072429
Statut Délivré - en vigueur
Date de dépôt 2022-11-10
Date de publication 2024-04-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Gunton, James
  • Goddard, Matthew

Abrégé

hfg22 gg22 fgg22 hh(p) is then generated.

Classes IPC  ?

  • G06F 30/10 - CAO géométrique
  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation
  • G06T 17/30 - Description de surfaces, p. ex. description de surfaces polynomiales
  • B33Y 50/00 - Acquisition ou traitement de données pour la fabrication additive
  • B29C 64/386 - Acquisition ou traitement de données pour la fabrication additive
  • G05B 19/4099 - Usinage de surface ou de courbe, fabrication d'objets en trois dimensions 3D, p. ex. fabrication assistée par ordinateur
  • G06F 17/10 - Opérations mathématiques complexes
  • G06F 30/17 - Conception mécanique paramétrique ou variationnelle
  • G06F 30/23 - Optimisation, vérification ou simulation de l’objet conçu utilisant les méthodes des éléments finis [MEF] ou les méthodes à différences finies [MDF]
  • G06F 113/10 - Fabrication additive, p. ex. impression en 3D

93.

MONITORING AN OPERABILITY OF A PRODUCTION SYSTEM

      
Numéro d'application EP2022077199
Numéro de publication 2024/067978
Statut Délivré - en vigueur
Date de dépôt 2022-09-29
Date de publication 2024-04-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Fischer, Jan
  • Frank, Johannes
  • Grimm, Stephan
  • Joshi, Janaki
  • Klein, Wolfram
  • Listl, Franz Georg
  • Liu, Kai
  • Sohr, Annelie

Abrégé

The invention provides an apparatus for monitoring an operability of a production system, the apparatus comprising: - an input unit configured to input production-related data of the production system, - a mapping engine configured to map the production-related data to instance data of a first knowledge graph according to a given mapping definition, - a first validation unit configured to validate a consistency and/or an integrity of the instance data by means of declarative constraints and to output a first validation result, - a simulator configured to generate a computer-implemented material flow simulation model of the production system based on the instance data and depending on the first validation result, - a generator configured to generate simulated production logs using the material flow simulation model, - a second validation unit configured to validate the simulated production logs against measured production logs of the production system and to output a second validation result, and - an output unit configured to output the second validation result for monitoring the operability of the production system.

Classes IPC  ?

  • G05B 17/02 - Systèmes impliquant l'usage de modèles ou de simulateurs desdits systèmes électriques
  • G05B 19/418 - Commande totale d'usine, c.-à-d. commande centralisée de plusieurs machines, p. ex. commande numérique directe ou distribuée [DNC], systèmes d'ateliers flexibles [FMS], systèmes de fabrication intégrés [IMS], productique [CIM]
  • G05B 23/02 - Test ou contrôle électrique

94.

BANDWIDTH MAXIMIZATION

      
Numéro d'application US2022045190
Numéro de publication 2024/072393
Statut Délivré - en vigueur
Date de dépôt 2022-09-29
Date de publication 2024-04-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Robertson, Iain

Abrégé

An integrated circuit including at least two interconnected sub-blocks in a System-on-Chip (SoC) arrangement and a method for communicating data in the integrated circuit are provided. The method includes transmitting a first signal asserting that a first sub-block is ready to transmit data to a second sub-block, receiving a second signal asserting that the second sub-block is ready to receive data from the first sub-block and transmitting data including one or more contiguous messages via a third signal from the first sub-block to the second sub-block. The first signal includes information that enables the second sub-block to determine a position of the end of the last message in the contiguous messages.

Classes IPC  ?

  • G06F 13/42 - Protocole de transfert pour bus, p. ex. liaisonSynchronisation

95.

EVENT SIGNALS

      
Numéro d'application US2022045219
Numéro de publication 2024/072395
Statut Délivré - en vigueur
Date de dépôt 2022-09-29
Date de publication 2024-04-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Robertson, Iain

Abrégé

A method for an integrated circuit including a plurality of interconnected sub-blocks in a System-on-Chip (SoC) arrangement is provided. The method includes transmitting a message from a first sub-block to at least one sub-block of the plurality of interconnected sub-blocks, in response to an event on the integrated circuit and transmitting a signal from the first sub-block to the at least one sub-block of the plurality of interconnected sub-blocks. The signal includes information identifying a class of the event based on a classification of events associated to the integrated circuit into one or more classes.

Classes IPC  ?

  • G06F 15/78 - Architectures de calculateurs universels à programmes enregistrés comprenant une seule unité centrale
  • G06F 13/14 - Gestion de demandes d'interconnexion ou de transfert

96.

METHODS OF GENERATING A COMPONENT INCLUDING A BLENDED LATTICE

      
Numéro d'application US2022045344
Numéro de publication 2024/072408
Statut Délivré - en vigueur
Date de dépôt 2022-09-30
Date de publication 2024-04-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Gunton, James

Abrégé

hfgfghi11 , i22 f1f2f1f2hff1vhff2rvhff1f2rf1vhg rhh(p) is then generated.

Classes IPC  ?

  • G06F 30/10 - CAO géométrique
  • G06T 17/20 - Description filaire, p. ex. polygonalisation ou tessellation
  • G06T 17/30 - Description de surfaces, p. ex. description de surfaces polynomiales
  • B33Y 50/00 - Acquisition ou traitement de données pour la fabrication additive
  • B29C 64/386 - Acquisition ou traitement de données pour la fabrication additive
  • G05B 19/4099 - Usinage de surface ou de courbe, fabrication d'objets en trois dimensions 3D, p. ex. fabrication assistée par ordinateur
  • G06F 17/10 - Opérations mathématiques complexes
  • G06F 30/17 - Conception mécanique paramétrique ou variationnelle
  • G06F 30/23 - Optimisation, vérification ou simulation de l’objet conçu utilisant les méthodes des éléments finis [MEF] ou les méthodes à différences finies [MDF]
  • G06F 113/10 - Fabrication additive, p. ex. impression en 3D

97.

MACHINE LEARNING-BASED CONVERSION OF SCHEMATIC DIAGRAMS

      
Numéro d'application US2022077141
Numéro de publication 2024/072445
Statut Délivré - en vigueur
Date de dépôt 2022-09-28
Date de publication 2024-04-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Yu, Dan
  • Mcdonald, Joseph
  • Kornilov, Artem V.

Abrégé

A computing system can parse a schematic diagram illustrating an electronic system to identify design blocks and wire lines coupled to the design blocks in the schematic diagram. The computing system, implementing at least one supervised machine-learning classification algorithm, can classify the design blocks and the wire lines. The classification of the design blocks can correspond to one or more symbols representing components of the electronic system. The classification of the wire lines can correspond to one or more links representing connectivity for at least one of the components of the electronic system. The computing system can generate a system design describing the electronic system based, at least in part, on the symbols representing the components of the electronic system classified to the design blocks and the links representing connectivity for at least one of the components of the electronic system classified to the wire lines.

Classes IPC  ?

  • G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle
  • G06F 113/16 - Câbles, arbres de câblage ou faisceaux de fils électriques

98.

USER CREDENTIAL PARAMETER SPACE PARTITIONING IN A RULE BASED ACCESS CONTROL SYSTEM

      
Numéro d'application US2022077249
Numéro de publication 2024/072452
Statut Délivré - en vigueur
Date de dépôt 2022-09-29
Date de publication 2024-04-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s) Kaiser, Reiner, K.

Abrégé

This application discloses a computing system to process rules defining access privileges for product data stored in a product data management system, which identifies accessor parameters capable of satisfying the rules for accessing the product data. The computing system can identify session parameters corresponding to user characteristics in an organization for a plurality of users, and correlate the accessor parameters for the product data to the session parameters for the users, which can partition a parameter space of the session parameters for the plurality of the users. The computing system can selectively evaluate the access privileges to the product data for at least one of the users by selecting one of the users in each partition, evaluating the access privileges to the product data using the session parameters of the selected users, and skipping evaluation of the access privileges to the product data using the session parameters of non-selected users.

Classes IPC  ?

  • G06F 21/60 - Protection de données
  • G06F 21/62 - Protection de l’accès à des données via une plate-forme, p. ex. par clés ou règles de contrôle de l’accès

99.

ADDITIVE MANUFACTURING USING A BUILD PROCESS WITH LAZY LOCAL SLICING

      
Numéro d'application US2022077337
Numéro de publication 2024/072455
Statut Délivré - en vigueur
Date de dépôt 2022-09-30
Date de publication 2024-04-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Ameta, Gaurav
  • Madeley, David
  • Arvanitis, Elena
  • Yao, Wenjie

Abrégé

Computer-implemented system and method are provided for generating an additive manufacturing (AM) build program used to build an object having a manifold boundary body. A manufacturing definition module merges build information and AM machine schema information for a manufacturing definition. The build information includes specification of region-based build parameters and the machine schema information includes AM machine specific parameters related to material build by layers. Slice generation module performs a direct slicing algorithm of a 3D CAD model defining the geometry for the object, wherein slices of the model are defined according to layer thickness along a slicing direction. A region based recipe module is configured to generate annotated slices, wherein each slice is annotated with information based on the manufacturing definition. The annotated slices are sent to an edge computing device controlling the AM machine to be converted to a final build file with tool path and process parameters.

Classes IPC  ?

  • G05B 19/4069 - Simulation du procédé d'usinage à l'écran
  • G05B 19/4099 - Usinage de surface ou de courbe, fabrication d'objets en trois dimensions 3D, p. ex. fabrication assistée par ordinateur
  • B22F 10/80 - Acquisition ou traitement des données
  • B29C 64/386 - Acquisition ou traitement de données pour la fabrication additive

100.

CROSS-DOMAIN LINK DETERMINATIONS THROUGH CELL FUSION AND SUPERGRAPH PROCESSING

      
Numéro d'application US2022077342
Numéro de publication 2024/072456
Statut Délivré - en vigueur
Date de dépôt 2022-09-30
Date de publication 2024-04-04
Propriétaire SIEMENS INDUSTRY SOFTWARE INC. (USA)
Inventeur(s)
  • Canedo, Arquimedes Martinez
  • Viswanathan, Rishabh

Abrégé

A computing system (100) may include a database identification engine (108) configured to identify databases (111, 112) of different systems (121, 122). The computing system (100) may also include a link discovery engine (110) configured to construct a supergraph (220) that represents the data elements stored in the databases (111, 112), including by constructing graphs (211, 212) for tables in the databases (111, 112) and merging the graphs (211, 212) into the supergraph (220), including by performing a cell fusion to merge multiple nodes (311, 312) from the graphs (211, 212) with an identical data element value into a fused node (320) in the supergraph (220). The link discovery engine (110) also be configured to process the supergraph (220) according to cross-domain linking criteria to determine cross-domain links (410) for data stored in the databases (111, 112) of the different systems (121, 122).

Classes IPC  ?

  • G06F 16/25 - Systèmes d’intégration ou d’interfaçage impliquant les systèmes de gestion de bases de données
  • G06F 16/28 - Bases de données caractérisées par leurs modèles, p. ex. des modèles relationnels ou objet
  1     2     3        Prochaine page