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Date
Nouveautés (dernières 4 semaines) 1
2026 août (MACJ) 1
2026 juin 2
2026 avril 3
2026 (AACJ) 9
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Classe IPC
G06F 9/44 - Dispositions pour exécuter des programmes spécifiques 134
G06F 3/048 - Techniques d’interaction fondées sur les interfaces utilisateur graphiques [GUI] 44
G06F 3/00 - Dispositions d'entrée pour le transfert de données destinées à être traitées sous une forme maniable par le calculateurDispositions de sortie pour le transfert de données de l'unité de traitement à l'unité de sortie, p. ex. dispositions d'interface 38
G06F 9/45 - Compilation ou interprétation de langages de programmation évolués 38
H04B 17/00 - SurveillanceTests 25
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Statut
En Instance 29
Enregistré / En vigueur 572
Résultats pour  brevets
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1.

Dovetail Rail Chassis for Printed Circuit Boards

      
Numéro d'application 19050430
Statut En instance
Date de dépôt 2025-02-11
Date de la première publication 2026-08-13
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • White, Christopher
  • Friedrich, Jacob Stephen

Abrégé

An electronics chassis includes an enclosure configured to house a printed circuit board (PCB). The enclosure includes one or more dovetail rails that are configured to affix one or more heat spreaders to the enclosure at a customizable position while the one or more heat spreaders are in thermal contact with the PCB.

Classes IPC  ?

  • H05K 7/14 - Montage de la structure de support dans l'enveloppe, sur cadre ou sur bâti
  • H05K 7/20 - Modifications en vue de faciliter la réfrigération, l'aération ou le chauffage

2.

Matrix Switching Workflow in a Test System for Device Testing

      
Numéro d'application 18833810
Statut En instance
Date de dépôt 2023-07-28
Date de la première publication 2026-06-25
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Ilic, Kosta
  • Ren, Yaoming
  • Wong, Jason
  • Gomez, Nestor

Abrégé

A matrix switching workflow allows for extending the virtual device configuration associated with a given single (test) site to multiple (test) sites, and expanding use of a single functional test program/sequence from a single site to multiple sites. Virtual device and connection support in a pin map editor enables mapping between switched instrument channels and switched device under test (DUT) pins on multiple sites, eliminating additional editing work. A switched channels section in a front test program design panel may list fully qualified channel connections to pins configured to a matrix switch. Configurations may be exported based on pin names and not based on the switch channel connection so that the configuration may be applied to switched instrument channels based on the specified pins. In order to avoid entering route/route-group names in the pin map, a specific route/route-group naming scheme may be used.

Classes IPC  ?

3.

Low Common-Mode Noise Planar Transformer

      
Numéro d'application 18987539
Statut En instance
Date de dépôt 2024-12-19
Date de la première publication 2026-06-25
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s) Dougan, Matthew Tate

Abrégé

A planar transformer includes a core, a first circuit, a second circuit, and a primary conductive shield. The first circuit includes two or more primary windings that are stacked in two or more layers and are magnetically coupled to the core. The second circuit includes a rectifier circuit and two or more secondary windings that are magnetically coupled to the core. The primary conductive shield is stacked between a first primary winding of the two or more primary windings and a first secondary winding of the two or more secondary windings. The primary conductive shield reduces a capacitive coupling between the first primary winding and the first secondary winding.

Classes IPC  ?

  • H01F 27/36 - Blindages ou écrans électriques ou magnétiques
  • H01F 30/06 - Transformateurs fixes non couverts par le groupe caractérisés par la structure

4.

Driving High Speed Voltage Waveforms for Current Measurements

      
Numéro d'application 19355665
Statut En instance
Date de dépôt 2025-10-10
Date de la première publication 2026-04-16
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Banaska, John George
  • Sjoboen, Lauren R.
  • Hartner, Eric

Abrégé

Apparatuses, systems, and methods for, and more particularly to apparatuses, systems, and methods for a high-speed composite amplifier driving circuit to generate and output analog signals. The high-speed composite amplifier driving circuit can combine a voltage-controlled pulser and waveform generator with high-accuracy current-voltage (I-V) measurement functions. The voltage-controlled pulser and waveform generator, for example, can provide a ±5 volt, 10 milliamp waveform at up to 50 megahertz with 5 nanosecond rise/fall timing and 8 ns minimum pulse widths. In addition, the high-accuracy I-V measurements can measure a ±10 volts, 10 milliamp waveform at up to 30 MHz with 7-10 nanosecond rise/fall timing and 8 to 12 nanosecond minimum pulse widths.

Classes IPC  ?

  • H03K 3/0232 - Circuits monostables
  • G01R 31/3163 - Tests fonctionnels
  • H03K 3/011 - Modifications du générateur pour compenser les variations de valeurs physiques, p. ex. tension, température
  • H03K 3/57 - Générateurs caractérisés par le type de circuit ou par les moyens utilisés pour produire des impulsions par l'utilisation d'un élément accumulant de l'énergie déchargé dans une charge par un dispositif interrupteur commandé par un signal extérieur et ne comportant pas de réaction positive le dispositif de commutation étant un dispositif à semi-conducteurs

5.

Zero Ohm Output Impedance

      
Numéro d'application 19355710
Statut En instance
Date de dépôt 2025-10-10
Date de la première publication 2026-04-16
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Banaska, John George
  • Sjoboen, Lauren R.
  • Hartner, Eric

Abrégé

Apparatuses, systems, and methods for, and more particularly to apparatuses, systems, and methods for a high-speed composite amplifier driving circuit to generate and output analog signals. The high-speed composite amplifier driving circuit can combine a voltage-controlled pulser and waveform generator with high-accuracy current-voltage (I-V) measurement functions. The voltage-controlled pulser and waveform generator, for example, can provide a ±5 volt, 10 milliamp waveform at up to 50 megahertz with 5 nanosecond rise/fall timing and 8 ns minimum pulse widths. In addition, the high-accuracy I-V measurements can measure a ±10 volts, 10 milliamp waveform at up to 30 MHz with 7-10 nanosecond rise/fall timing and 8 to 12 nanosecond minimum pulse widths.

Classes IPC  ?

  • H03F 3/45 - Amplificateurs différentiels
  • G01R 1/067 - Sondes de mesure
  • G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
  • G01R 31/30 - Tests marginaux, p. ex. en faisant varier la tension d'alimentation
  • G01R 31/316 - Test de circuits analogiques
  • H03F 1/56 - Modifications des impédances d'entrée ou de sortie, non prévues ailleurs

6.

Method for Evaluating a Multi-Channel Signal Generator

      
Numéro d'application 19342049
Statut En instance
Date de dépôt 2025-09-26
Date de la première publication 2026-04-02
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s) Verbeyst, Frans

Abrégé

Methods and systems for performance assessment of a multichannel signal generator including a plurality of transmit channels. Configuration information is sent to the multichannel signal generator. An amplitude and phase is determined for a plurality of tones, and the tones are distributed over the transmit channels. Each transmit channel generates a periodic modulated signal comprising its respective tone. The generated periodic modulated signals are combined in a combined signal. The amplitudes and phases are determined so that the combined signal has a crest factor below a given threshold level. The combined signal is measured, based on the configuration information, and aligned relative to a reference combined signal. Individual tones are extracted from the aligned combined signal, and a relative delay and/or a phase offset is determined for at least two transmit channels by comparing the extracted individual tones with corresponding individual tones extracted from the reference combined signal.

Classes IPC  ?

7.

Simultaneously Sampled Data Acquisition Device

      
Numéro d'application 18828512
Statut En instance
Date de dépôt 2024-09-09
Date de la première publication 2026-03-12
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Dewhirst, Adam H.
  • Lee, Chong Meng

Abrégé

Apparatuses, systems, and methods for data acquisition (DAQ) devices, and more particularly to apparatuses, systems, and methods for a simultaneously sampled DAQ device with flexible input terminal configurations. A DAQ device can be configured, e.g., via programmable driver software, to simultaneously sample analog input (AI) channels in differential mode or simultaneously sample AI+ and AI− signals in a single ended mode (RSE or NRSE). In addition, a DAQ device can be configured, e.g., via programmable driver software, to simultaneously sample AI channels in differential mode or pseudo-simultaneously sample AI+ and AI− signals in single ended mode (RSE or NRSE), e.g., all AI+ channels sampled simultaneously and then all AI− channels sample simultaneously.

Classes IPC  ?

  • H03M 1/00 - Conversion analogique/numériqueConversion numérique/analogique
  • H03M 1/10 - Calibrage ou tests

8.

Sample Accurate Waveform Measurement Synchronization

      
Numéro d'application 19301171
Statut En instance
Date de dépôt 2025-08-15
Date de la première publication 2026-02-19
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Greenstreet, Jordan
  • Hartner, Eric

Abrégé

In some embodiments, a method for synchronizing radio frequency (RF) devices can include receiving, a first stimuli signal including a maker signal from a first RF device and an output signal from a second RF device, wherein the output signal can be based at least in part on a second stimuli signal including a pulse waveform transmitted from the first RF device to the second RF device. The method can include digitizing the pulse waveform, measuring delay values between a first sample of the first stimuli signal and the digitized pulse waveform, and adjusting a timing of the marker signal. The method can include performing one or more pulse delay measurements associated with the first stimuli signal and the output signal as well as calculating a trigger delay. The method can also include performing, using the trigger delay, one or more measurements associated with a device under test (DUT).

Classes IPC  ?

  • G01R 19/25 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe utilisant une méthode de mesure numérique
  • G01R 13/02 - Dispositions pour la présentation de variables électriques ou de formes d'ondes pour la présentation sous forme numérique des variables électriques mesurées
  • G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux

9.

Banana Plug Split Nut Retainer

      
Numéro d'application 19265843
Statut En instance
Date de dépôt 2025-07-10
Date de la première publication 2026-01-15
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s) Friedrich, Jacob

Abrégé

An apparatus for securely retaining a high voltage (e.g., greater than 1000 volts) banana plug can include a clamshell apparatus. The clamshell apparatus can include a first segment that includes a one or more mating pegs and a first threaded portion and a second segment that includes one or more mating slots and a second threaded portion. The first segment and the second segment can be configured to be assembled via a press-fit of the first segment to the second segment over a banana plug. In addition, when assembled, the first threaded portion and the second threaded portion are aligned to form a threaded fastener that is configured to retain the banana plug in a banana socket when engaged with a corresponding mating flange via the threaded fastener.

Classes IPC  ?

  • H01R 13/506 - SoclesBoîtiers composés de différentes pièces assemblées par enclenchement réciproque des pièces
  • H01R 13/207 - Broches, lames ou alvéoles conformés ou ayant une pièce séparée en vue de retenir ensemble les parties en fonctionnement par connexion vissée
  • H01R 13/622 - Bague ou boîtier filetés
  • H01R 24/28 - Pièces de couplage portant des broches, des lames ou des contacts analogues, assujetties uniquement à un fil ou un câble

10.

Converting a Request for Quote into a Specification for a Test System

      
Numéro d'application 19211004
Statut En instance
Date de dépôt 2025-05-16
Date de la première publication 2025-11-20
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Dove, Andrew Philip
  • Thung, Stephen
  • Savard-Rosas, Sebastien

Abrégé

Apparatuses, systems, and methods for generative Artificial Intelligence (AI)/Large Language Model (LMM) assisted test system specification based on an initial input of a request for quote (RFQ) or request for information (RFI). An RFQ/RFI document can be provided as input to the AI/LLM model. The AI/LLM model can also receive selection and detection criteria and user-provided input associated with the RFQ/RFI document as guidance for the generative AI/LLM process. The AI/LLM model generate a test system specification from the RFQ/RFI document, with the test system specification fulfilling one or more criteria identified from the RFQ/RFI document.

Classes IPC  ?

11.

Conversion from device documentation to technical specifications

      
Numéro d'application 19210524
Statut En instance
Date de dépôt 2025-05-16
Date de la première publication 2025-11-20
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Savard-Rosas, Sebastien
  • Dove, Andrew Philip
  • Thung, Stephen

Abrégé

Apparatuses, systems, and methods for one or more models (e.g., generative Artificial Intelligence (AI) and/or large language model(s)) to determine technical specifications based on input documentation of a device under test (DUT). The model(s) may divide the documentation into portions, iteratively identify technical specifications in the portions, format the specifications, and/or identify duplicative or related specifications for removal or consolidation.

Classes IPC  ?

  • G06F 40/289 - Analyse syntagmatique, p. ex. techniques d’états finis ou regroupement
  • G06F 40/103 - Mise en forme, c.-à-d. modification de l’apparence des documents

12.

AI Augmented Data Analysis

      
Numéro d'application 19210652
Statut En instance
Date de dépôt 2025-05-16
Date de la première publication 2025-11-20
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s) Barreto, Alejandro

Abrégé

Apparatuses, systems, and methods for artificial intelligence (AI) augmented data analysis can include providing a large language model (LLM), access to a data set. For example, an end user can interact with a user interface on a user device to provide instructions to the LLM to access the data set. In addition, the LLM can be interacted with via the user interface using natural language instructions and LLM output, based on the LLM analysis of the data set, can also be interacted with via the user interface. The LLM output can include one or more visualizations of the data set.

Classes IPC  ?

  • G06N 3/0475 - Réseaux génératifs
  • G06F 40/169 - Annotation, p. ex. données de commentaires ou notes de bas de page
  • G06F 40/40 - Traitement ou traduction du langage naturel
  • G06N 3/006 - Vie artificielle, c.-à-d. agencements informatiques simulant la vie fondés sur des formes de vie individuelles ou collectives simulées et virtuelles, p. ex. simulations sociales ou optimisation par essaims particulaires [PSO]
  • G06N 3/08 - Méthodes d'apprentissage
  • G06T 11/20 - Traçage à partir d'éléments de base, p. ex. de lignes ou de cercles

13.

Test Sequence Generation

      
Numéro d'application 19210768
Statut En instance
Date de dépôt 2025-05-16
Date de la première publication 2025-11-20
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Thung, Stephen
  • Savard-Rosas, Sebastien
  • Dove, Andrew Philip

Abrégé

Apparatuses, systems, and methods for test sequence generation to validate a device under test (DUT) can include generating a structured set of test sequence inputs and performing a large language model (LLM) call using the structured set of test sequence inputs. The structured set of test sequence inputs can include parameters associated with the DUT, a list of available tests associated with the DUT, instructions for an LLM to query a database to retrieve test sequence information associated with the DUT, and/or an output structure. The LLM call can be used to generate the test sequence for validating the DUT based on the generated structured set of test sequence inputs.

Classes IPC  ?

14.

Requirement Extraction from Documentation

      
Numéro d'application 19210865
Statut En instance
Date de dépôt 2025-05-16
Date de la première publication 2025-11-20
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Thung, Stephen
  • Dove, Andrew Philip
  • Savard-Rosas, Sebastien

Abrégé

Apparatuses, systems, and methods for extracting structured specification requirements from specification documents associated with a device under test (DUT) can include generating one or more semantic units based on DUT specification documentation and performing a structured large language model (LLM) call to generate test requirements for the DUT based on the generated one or more semantic units and an entity extraction task. The entity extraction task can be defined via a system prompt command that is responsive to presenting an end user with a system prompt for the entity extraction task. The one or more semantic units can be generated via portioning of DUT specification documentation.

Classes IPC  ?

15.

DIGITAL ARCHITECTURE FOR CONTINUITY TEST

      
Numéro d'application 18853791
Statut En instance
Date de dépôt 2022-04-29
Date de la première publication 2025-07-17
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Block, Iii, Albert Brantley
  • Yarbrough, Iii, Charles Thomas
  • Ilic, Kosta
  • Ren, Yaoming

Abrégé

Efficient continuity testing for instruments connected to a mass interconnect. Digital input and output capabilities may be used on each pin of the mass interconnect to test a variety of input/output (I/O) types on a device under test. Each pin of the interconnect may connect to a respective corresponding digital input and digital output in the tester, with the digital input resistively coupled to the digital output. The connectivity of the pin to the digital input and the digital output, and the connectivity between the digital input and the digital output may be implemented with shift registers and a buffer stage, respectively. In some embodiments, the structure may be implemented through parallel I/O blocks, as in a complex programmable logic device (CPLD), field programmable gate array (FPGA), or microcontroller.

Classes IPC  ?

16.

Emulating Frequency-Modulated Continuous Wave (FMCW) Light Detection and Ranging (LiDAR) Targets using Optical IQ Modulation

      
Numéro d'application 18513023
Statut En instance
Date de dépôt 2023-11-17
Date de la première publication 2025-05-22
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Dasilva, Marcus Kieling
  • Loewenstein, Edward Benjamin
  • Sannibale, Virginio
  • Johnston, Lee Haley
  • Kerr, Andy
  • Sharma, Abhishek Narendra
  • Harris, Caleb Michael

Abrégé

A system for emulating an over-the-air environment for testing a Frequency-modulated Continuous Wave (FMCW) light detection and ranging (LiDAR) unit under test (UUT). The system includes an optical lens system that receives an FMCW laser signal from the LiDAR UUT, and provides the signals to one or more optical fibers. A slope, chirp timing and intensity of the FMCW laser signal is determined using digital signal processing, and a modulation waveform is determined to emulate an over-the-air (OTA) environment based at least in part on the slope, chirp timing, and intensity. An in-phase quadrature phase (IQ) modulator modulates the FMCW laser signal using the modulation waveform and provides the modulated laser signal back through the optical lens system to the LiDAR UUT.

Classes IPC  ?

  • G01S 7/497 - Moyens de contrôle ou de calibrage
  • G01S 7/481 - Caractéristiques de structure, p. ex. agencements d'éléments optiques
  • G01S 7/4911 - Émetteurs
  • G01S 17/89 - Systèmes lidar, spécialement adaptés pour des applications spécifiques pour la cartographie ou l'imagerie

17.

Fractional Resampler

      
Numéro d'application 18514448
Statut En instance
Date de dépôt 2023-11-20
Date de la première publication 2025-05-22
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s) Vrancic, Aljosa

Abrégé

Methods and systems for resampling an input signal that includes a first plurality of values. A first resampling is performed to obtain an intermediate signal, which includes dividing the first plurality of values into a plurality of groups of values, resampling values in each group according to a first filter tap set to obtain an intermediate group of values. The first value of each group is aligned in time with the first value of each intermediate group. A second resampling is then performed on the intermediate signal to obtain an output signal, which performs a phase shift of each of the intermediate groups of values to align in time with a respective group of values of the output signal. The output signal is output by wired or wireless means.

Classes IPC  ?

  • G06F 17/14 - Transformations de Fourier, de Walsh ou transformations d'espace analogues
  • H03H 17/02 - Réseaux sélecteurs de fréquence

18.

Emulating Frequency-Modulated Continuous Wave (FMCW) Light Detection and Ranging (LiDAR) Targets using Optical IQ Modulation

      
Numéro d'application 18513058
Statut En instance
Date de dépôt 2023-11-17
Date de la première publication 2025-05-22
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Dasilva, Marcus Kieling
  • Loewenstein, Edward Benjamin
  • Sannibale, Virginio
  • Johnston, Lee Haley
  • Kerr, Andy
  • Sharma, Abhishek Narendra
  • Harris, Caleb Michael

Abrégé

A system for emulating an over-the-air environment for testing a Frequency-modulated Continuous Wave (FMCW) light detection and ranging (LiDAR) unit under test (UUT). The system includes an optical lens system that receives an FMCW laser signal from the LiDAR UUT, and provides the signals to one or more optical fibers. A slope, chirp timing and intensity of the FMCW laser signal is determined using digital signal processing, and a modulation waveform is determined to emulate an over-the-air (OTA) environment based at least in part on the slope, chirp timing, and intensity. An in-phase quadrature phase (IQ) modulator modulates the FMCW laser signal using the modulation waveform and provides the modulated laser signal back through the optical lens system to the LiDAR UUT.

Classes IPC  ?

  • G01S 7/497 - Moyens de contrôle ou de calibrage
  • G01S 7/481 - Caractéristiques de structure, p. ex. agencements d'éléments optiques
  • G01S 7/4911 - Émetteurs

19.

TEST SYSTEM RACK WITH RECONFIGURABLE POSITION FOR SYSTEM INTERFACE

      
Numéro d'application 18491891
Statut En instance
Date de dépôt 2023-10-23
Date de la première publication 2025-04-24
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Ilic, Kosta
  • Singerman, Michael H.
  • Krietz, Kevin

Abrégé

A test system rack or cabinet includes a housing containing instruments or equipment and a mass interconnect (MIC) mounted within the housing. The MIC has inputs to couple to the instruments or equipment and outputs to couple to a second MIC separate from the rack. The test system rack has legs positioned underneath the housing to support the housing and the first MIC. The test system rack has actuators configured to adjust a position of the first MIC without adjusting a position of the one or more legs.

Classes IPC  ?

  • H05K 7/14 - Montage de la structure de support dans l'enveloppe, sur cadre ou sur bâti

20.

Probe Integrated Circuit and Measurement System

      
Numéro d'application 18911546
Statut En instance
Date de dépôt 2024-10-10
Date de la première publication 2025-04-17
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s) Whittington, Mark

Abrégé

Disadvantages associated with present day instrument probes, e.g., active probes used with oscilloscopes, may be overcome by implementing an active probe entirely as a packaged integrated circuit (IC). The probe IC may be implemented in a small, low pin-count package to facilitate the mounting of many probe ICs in a small area. The probe IC may include an interface for configuration as well as customized software to control the probe IC and measurement instrumentation, for example, an oscilloscope, for a variety of applications. The probe IC may be implemented as any one of different types of probes, including active probes and passive probes, voltage probes and current probes, or single ended probes and differential probes.

Classes IPC  ?

21.

Edge data reduction in automotive systems

      
Numéro d'application 18506483
Numéro de brevet 12447998
Statut Délivré - en vigueur
Date de dépôt 2023-11-10
Date de la première publication 2025-04-10
Date d'octroi 2025-10-21
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Thung, Stephen
  • Bryson, Kyle Ross
  • Altmann, Walter Michael
  • Kurlak, Peter Andrew

Abrégé

Methods, computing devices, and software programs for identifying a driving scenario in real-time driving data. A driving scenario is received and translated into an ordered sequence of events that correspond to the driving scenario. A signal computation function is determined for each event in the sequence, which quantifies proximity to the respective event. Driving data is received for a plurality of time steps. Values of each signal computation function are determined, evaluated for the driving data at each of the plurality of time steps. It is determined whether the driving scenario has occurred in the driving data based on the values of the signal computation function. A first portion of the driving data is either modified, discarded, or stored in memory based on the determination whether the driving scenario has occurred.

Classes IPC  ?

  • B60W 60/00 - Systèmes d’aide à la conduite spécialement adaptés aux véhicules routiers autonomes
  • G06V 20/56 - Contexte ou environnement de l’image à l’extérieur d’un véhicule à partir de capteurs embarqués

22.

System and Method for Virtual Resistance

      
Numéro d'application 18817742
Statut En instance
Date de dépôt 2024-08-28
Date de la première publication 2025-03-06
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Cheah, Chin-Hong
  • Oong, Tatt-Wee
  • Chan, Hao-Jie
  • Lam, Siew-Leong

Abrégé

A control system exhibits improved dynamic performance in a constant voltage (CV) control mode that is also invariant of the source type and operating points. The improvements may be achieved with minimal or potentially no additional parts to the control circuit by replacing a voltage-controlled current source with a voltage-controlled resistance as the control element in the system feedback loop. An input voltage from a device under test (DUT) is measured, a feedback control voltage is determined based at least in part on the input voltage to provide a CV mode control loop for the DUT, and the feedback control voltage added to the input voltage is applied to the DUT to operate the DUT in the CV mode.

Classes IPC  ?

  • G05F 1/56 - Régulation de la tension ou de l'intensité là où la variable effectivement régulée par le dispositif de réglage final est du type continu utilisant des dispositifs à semi-conducteurs en série avec la charge comme dispositifs de réglage final
  • G01R 19/00 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe

23.

Specification to Test using Generative Artificial Intelligence

      
Numéro d'application 18796978
Statut En instance
Date de dépôt 2024-08-07
Date de la première publication 2025-02-13
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Barreto, Alejandro
  • Dove, Andrew Philip
  • Richardson, Gregory Clark
  • Rangwala, Asrar
  • Thung, Stephen

Abrégé

Apparatuses, systems, and methods for generative Artificial Intelligence (AI) assisted test process development based on an initial input of a specification of a device under test (DUT). The specification of the DUT may be inputted into the Generative AI model. The Generative AI model may summarize the specification, request further input via an interaction with an end user to finalize a description of the DUT, and generate/create test assets, such as code, documentation, tables, diagrams, and so forth. The Generative AI model may collaborate with the end user to refine outputs from the test assets. The refined test assets may be sent to software applications that can use/run/deploy various test assets. Additionally, the generative AI may access local test hardware and enumerate test hardware on other systems via network/serial communications to create a test system that fits the identified hardware.

Classes IPC  ?

  • G06F 11/36 - Prévention d'erreurs par analyse, par débogage ou par test de logiciel

24.

Combining signals received from multiple probe antennas in over-the-air antenna measurements

      
Numéro d'application 18311329
Numéro de brevet 12235305
Statut Délivré - en vigueur
Date de dépôt 2023-05-03
Date de la première publication 2024-11-07
Date d'octroi 2025-02-25
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Deckert, Thomas
  • Obermaier, Martin
  • Plettemeier, Dirk

Abrégé

A system and method for testing an antenna-under-test (AUT). A multi-probe antenna array receiver is moved to a plurality of positions within a scan area. At each position, each probe antenna element of the receiver receives a near-field (NF) over-the-air (OTA) signal from the AUT. An alignment procedure is performed to align reception locations for signals received by different ones of the plurality of probe antenna elements. Correction factors are determined that characterize amplitude and phase discrepancies between the probe antenna elements of the receiver. The correction factors are applied to the received signals, and the corrected signals are combined at each reception location to obtain average signals. A far-field (FF) transmission pattern for the AUT is determined based on a discrete Fourier transform of the average signals and stored in a non-transitory computer readable memory medium.

Classes IPC  ?

  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique

25.

Combining signals transmitted from multiple probe antennas in over-the-air antenna measurements

      
Numéro d'application 18311335
Numéro de brevet 12375188
Statut Délivré - en vigueur
Date de dépôt 2023-05-03
Date de la première publication 2024-11-07
Date d'octroi 2025-07-29
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Deckert, Thomas
  • Obermaier, Martin
  • Plettemeier, Dirk

Abrégé

A system and method for testing an antenna-under-test (AUT). A multi-probe antenna array transmitter is moved to a plurality of positions within a scan area. At each position, each probe antenna element of the transmitter transmits a near-field (NF) over-the-air (OTA) signal to the AUT. An alignment procedure is performed to align transmission locations for signals transmitted by different ones of the plurality of probe antenna elements. Correction factors are determined that characterize amplitude and phase discrepancies between the probe antenna elements of the transmitter. The correction factors are applied to the signals, and the corrected signals are combined at each transmission location to obtain average signals. A far-field (FF) reception pattern for the AUT is determined based on a discrete Fourier transform of the average signals and stored in a non-transitory computer readable memory medium.

Classes IPC  ?

  • H04B 17/00 - SurveillanceTests
  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique
  • H04B 17/16 - Matériel de test placé à l’émetteur

26.

Dynamic Control for Battery Cell Formation

      
Numéro d'application 18183755
Statut En instance
Date de dépôt 2023-03-14
Date de la première publication 2024-09-19
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Vanassche, Piet
  • Van Den Keybus, Jeroen

Abrégé

Systems, methods and devices for performing dynamically controlled battery cell formation. A formation process is performed on a plurality of battery cells. A series connection is established through each of the plurality of battery cells and a cycling device. Each battery cell is coupled to a respective monitoring device to monitor performance during cell formation. The monitoring devices provide indications to a controller when their monitored battery cells experience a status change. Responsive to the indication, instructions are provided for synchronously modifying the series connection through the first battery cell and modifying a voltage amplitude at the cycling device. Modifying the series connection through the first battery cell may include switching a voltage polarity across the first battery cell shorting the series connection around the first battery cell without modifying the series connection through the other battery cells.

Classes IPC  ?

  • H01M 10/44 - Méthodes pour charger ou décharger
  • H02J 7/00 - Circuits pour la charge ou la dépolarisation des batteries ou pour alimenter des charges par des batteries

27.

Modulated over-the-air measurements on dual polarization signals

      
Numéro d'application 18151426
Numéro de brevet 12537609
Statut Délivré - en vigueur
Date de dépôt 2023-01-07
Date de la première publication 2024-07-11
Date d'octroi 2026-01-27
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Orozco, Gerardo
  • Deckert, Thomas
  • Yang, Nan

Abrégé

A system and method for determining an error vector magnitude (EVM) of a polarized transmission from a device-under-test (DUT). A first signal transmitted by the DUT is received via a horizontally polarized receiver antenna, and a second signal transmitted by the DUT is received via a vertically polarized receiver antenna. The second signal is coherent with the first signal. The EVM is calculated based at least in part on the first signal and the second signal and a reference signal.

Classes IPC  ?

  • H04B 17/00 - SurveillanceTests
  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique

28.

Electrical methods for structural defect detection in battery cells

      
Numéro d'application 18408132
Numéro de brevet 12584970
Statut Délivré - en vigueur
Date de dépôt 2024-01-09
Date de la première publication 2024-07-11
Date d'octroi 2026-03-24
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Maccleery, Brian Clifford
  • Weiss, Martin

Abrégé

Systems, methods, and devices for characterizing a defect of a device-under-test (DUT). A first measurement is performed of a first quantity on the DUT prior to performing a first operation on the DUT, producing a first result. The first operation is performed on the DUT, and subsequently a second measurement of the first quantity is performed on the DUT, producing a second result. A defect class is characterized for the DUT from a plurality of defect classes based on a difference between the first and second results.

Classes IPC  ?

  • G01R 31/389 - Mesure de l’impédance interne, de la conductance interne ou des variables similaires
  • G01R 31/36 - Dispositions pour le test, la mesure ou la surveillance de l’état électrique d’accumulateurs ou de batteries, p. ex. de la capacité ou de l’état de charge
  • G01R 31/367 - Logiciels à cet effet, p. ex. pour le test des batteries en utilisant une modélisation ou des tables de correspondance
  • G01R 31/385 - Dispositions pour mesurer des variables des batteries ou des accumulateurs

29.

System and method of adaptively assigning scenario-based tests to test assets

      
Numéro d'application 17985099
Numéro de brevet 12487899
Statut Délivré - en vigueur
Date de dépôt 2022-11-10
Date de la première publication 2024-05-16
Date d'octroi 2025-12-02
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Teplinsky, Shaul
  • Bryson, Kyle Ross
  • Thung, Stephen
  • Farrell, Douglas William
  • Nagle, James C.
  • Monroe, Jeffrey Marcus

Abrégé

Techniques for assigning scenario-based tests to test assets are described. In an example, a scenario-based test operable to test a key performance indicator (KPI) of a System Under Test (SUT), a component behavior exhibited by a first component of the SUT, and a scenario characteristic are received. Based on the component behavior and the scenario characteristic, a first plurality of behavior models associated with the component behavior are identified. Based on the scenario characteristic a characteristic value is extracted from the scenario-based test. Each behavior model of the first plurality of behavior models is executed using the characteristic value to generate a first plurality of predicted behavior outcomes. Based on the first plurality of predicted behavior outcomes, a first test asset type from a plurality of test asset types is selected and the scenario-based test is transmitted to a test asset of the first test asset type.

Classes IPC  ?

  • G06F 11/263 - Génération de signaux d'entrée de test, p. ex. vecteurs, formes ou séquences de test
  • G06F 11/27 - Tests intégrés
  • G06F 30/20 - Optimisation, vérification ou simulation de l’objet conçu
  • G06F 30/27 - Optimisation, vérification ou simulation de l’objet conçu utilisant l’apprentissage automatique, p. ex. l’intelligence artificielle, les réseaux neuronaux, les machines à support de vecteur [MSV] ou l’apprentissage d’un modèle

30.

Electrochemical Process Manifolds for Battery Cell Monitoring

      
Numéro d'application 18489535
Statut En instance
Date de dépôt 2023-10-18
Date de la première publication 2024-04-18
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Maccleery, Brian
  • Weiss, Martin

Abrégé

Systems, methods and devices for constructing an electrochemical process manifold (EPM) for a battery cell during a formation process. The current through the cell is controllably adjusted to charge or discharge the cell. The temperature and/or pressure may be controllably adjusted along with the current. At each of a plurality of time steps as the current is controllably adjusted, the voltage across the cell is measured and integrated over time to obtain a voltage-hours value for each time step. A data point is stored in memory for each time step that includes the measured voltage, the voltage-hours value, and the current through the cell at the respective time step. The data points for each time step are mapped onto an EPM, and the EPM is stored in a non-transitory computer-readable memory medium.

Classes IPC  ?

  • G01R 31/36 - Dispositions pour le test, la mesure ou la surveillance de l’état électrique d’accumulateurs ou de batteries, p. ex. de la capacité ou de l’état de charge
  • G01R 31/378 - Dispositions pour le test, la mesure ou la surveillance de l’état électrique d’accumulateurs ou de batteries, p. ex. de la capacité ou de l’état de charge spécialement adaptées à un type de batterie ou d’accumulateur
  • G01R 31/3828 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p. ex. état de charge utilisant l’intégration du courant
  • G01R 31/3842 - Dispositions pour la surveillance de variables des batteries ou des accumulateurs, p. ex. état de charge combinant des mesures de tension et de courant
  • G01R 31/392 - Détermination du vieillissement ou de la dégradation de la batterie, p. ex. état de santé
  • G01R 31/396 - Acquisition ou traitement de données pour le test ou la surveillance d’éléments particuliers ou de groupes particuliers d’éléments dans une batterie
  • H01M 10/48 - Accumulateurs combinés à des dispositions pour mesurer, tester ou indiquer l'état des éléments, p. ex. le niveau ou la densité de l'électrolyte
  • H01M 50/569 - Détails de construction des connexions conductrices de courant pour détecter les conditions à l'intérieur des cellules ou des batteries, p. ex. détails des bornes de détection de tension

31.

METHOD AND SYSTEM FOR ESTABLISHING DATA TRANSFER PROCESSES BETWEEN COMPONENTS OF A TEST SYSTEM

      
Numéro d'application 18450293
Statut En instance
Date de dépôt 2023-08-15
Date de la première publication 2024-02-22
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s) Hons, Erik Stuart

Abrégé

In an example, a first testing device is configured to receive testing data from a second testing. The first testing device is configured to send a stimulus to a device under test. The first testing device obtains test data reception methods and test data reception formats that are compatible with the first testing device and translates the methods and formats into content that is readable by the second testing device. The content is received by the second testing device, which accesses test data transmission methods and formats compatible with the second testing device and defines an intersection of the reception and transmission test data formats. The second testing device sends the intersection of methods and formats to the first testing device, which reduces the intersection to a final method and format.

Classes IPC  ?

  • G06F 11/267 - Reconfiguration pour les tests, p. ex. LSSD, découpage
  • G06F 11/273 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie

32.

Dual directional asymmetric coupler with a shared through-line

      
Numéro d'application 18452335
Numéro de brevet 12467959
Statut Délivré - en vigueur
Date de dépôt 2023-08-18
Date de la première publication 2023-12-07
Date d'octroi 2025-11-11
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Magers, Justin Regis
  • Seibel, Michael Joseph
  • Dasilva, Marcus Kieling

Abrégé

A reflectometer may include two directional couplers configured in parallel by being disposed across from each other on opposite sides of a shared section of a signal line. One of the couplers may couple, to a first port of the reflectometer, a portion of the signal power of a first signal flowing from the first end of the shared through-line to the second end of the shared through-line, and the other coupler may couple, to a second port of the reflectometer, a portion of the signal power of a second signal flowing from the second end of the shared through-line to the first end of the shared through-line. The reflectometer benefits from reduced size and signal loss relative to a serial coupler configuration. When used in vector network analyzer (VNA) systems, this results in higher output power and higher dynamic range of the VNA.

Classes IPC  ?

  • G01R 27/06 - Mesure des coefficients de réflexionMesure du rapport d'ondes stationnaires
  • G01R 27/28 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire

33.

VIRTUALIZED AUTOMATED TEST EQUIPMENT AND METHODS FOR DESIGNING SUCH SYSTEMS

      
Numéro d'application 18337871
Statut En instance
Date de dépôt 2023-06-20
Date de la première publication 2023-10-19
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Bakker, Christopher
  • Walker, Roy Dennis
  • Snover, Burt

Abrégé

A virtualizable automated test equipment architecture includes a circuit assembly. The circuit assembly includes a number of signal paths that extend between a front plane and a backplane. The signal paths can be continuous and isolated from other signal paths of the plurality of signal paths. The circuit assembly also includes an impedance disposed along a signal path of the plurality of signal paths. A plurality of software-configurable physical disconnects may be arranged within the circuit assembly to form a switching matrix. The plurality of signal paths can be associated with a plurality of software-configurable physical disconnects, which can be configured to open and close signal paths of the plurality of signal paths based on the predetermined test requirements. The circuit assembly also includes a plurality of external device connections, at least one of which may be configured to interface with a unit under test (UUT). The software configurable physical disconnects may be configurable at runtime. Because the system is virtualizable, multiplied UUTs may be tested simultaneously according to different requirements, and the testing may be executed on shared hardware in a manner transparent to the UUTs.

Classes IPC  ?

  • G01M 99/00 - Matière non prévue dans les autres groupes de la présente sous-classe

34.

System and method for efficient data movement in an orchestrated distributed measurement application

      
Numéro d'application 18177611
Numéro de brevet 12177068
Statut Délivré - en vigueur
Date de dépôt 2023-03-02
Date de la première publication 2023-09-07
Date d'octroi 2024-12-24
Propriétaire National Instruments Corporation (USA)
Inventeur(s) Cifra, Christopher George

Abrégé

A method of orchestrating measurements in a measurement system includes configuring a first service with a first configuration for acquiring measurement data by an orchestrator. The method also includes receiving a moniker generated by the first service in response to being configured that represents the first configuration. The moniker includes a location of the first service and an identifier of the first configuration. The method also includes transferring the moniker to a second service configured to establish communication with the first service based on the location, consume the measurement data acquired by the first service using the first configuration and transmitted in response to receiving the identifier from the second service, and generate a result in response to receiving the measurement data from the first service. The method further includes receiving the result from the second service.

Classes IPC  ?

  • H04L 41/5054 - Déploiement automatique des services déclenchés par le gestionnaire de service, p. ex. la mise en œuvre du service par configuration automatique des composants réseau
  • H04L 41/0806 - Réglages de configuration pour la configuration initiale ou l’approvisionnement, p. ex. prêt à l’emploi [plug-and-play]
  • H04L 61/4511 - Répertoires de réseauCorrespondance nom-adresse en utilisant des répertoires normalisésRépertoires de réseauCorrespondance nom-adresse en utilisant des protocoles normalisés d'accès aux répertoires en utilisant le système de noms de domaine [DNS]

35.

Dynamic range extension of radio frequency signals using phasing of two or more IQ channels

      
Numéro d'application 17713587
Numéro de brevet 11901927
Statut Délivré - en vigueur
Date de dépôt 2022-04-05
Date de la première publication 2023-08-24
Date d'octroi 2024-02-13
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Deshmukh, Nikhil Ashok
  • Loehning, Michael

Abrégé

Dynamic range of radio frequency transmitters and receivers may be improved via a multiple-channel phasor configuration in which channels are phased in a manner that distributes the local oscillator phases over π/2 radians. A multiple-channel phasing receiver may include a power splitter to split an input signal into multiple signals, and may further include multiple single-channel receivers providing intermediate signals. Each single-channel receiver may have an input that receives a respective signal of the multiple signals, and may further have an output to provide a respective intermediate signal as a function of the respective input signal, a total gain applied to the respective input signal, a signal frequency of the local oscillator signal, and a respective phase of the local oscillator signal. The multiple-channel receiver may include a digital signal processor that combines the plurality of intermediate signals into a single output signal. A multiple-channel transmitter/transceiver may be similarly implemented.

Classes IPC  ?

36.

Test Abstraction Data Model

      
Numéro d'application 18172754
Statut En instance
Date de dépôt 2023-02-22
Date de la première publication 2023-08-24
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Dove, Andrew Philip
  • Moeller, Jan Viborg
  • Soni, Ritesh K.
  • Peck, Joseph E.

Abrégé

Methods and computing devices for matching an instrument to a device-under-test for performing a test procedure. A first data structure is constructed based on a data sheet of an instrument. The first data structure includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. A test case is constructed based on a test procedure to be performed on the DUT. The test case includes attributes, phenomena to be measured and testing interactions for measuring respective phenomena. The attributes, phenomena, and testing interactions of the first data structure and the test case are compared to determine a matching condition, and instructions are output based on the matching condition.

Classes IPC  ?

  • G01R 31/3183 - Génération de signaux d'entrée de test, p. ex. vecteurs, formes ou séquences de test
  • G01R 31/317 - Tests de circuits numériques

37.

Over-the-air testing of millimeter wave antenna receiver arrays

      
Numéro d'application 17532532
Numéro de brevet 11982699
Statut Délivré - en vigueur
Date de dépôt 2021-11-22
Date de la première publication 2023-05-25
Date d'octroi 2024-05-14
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Obermaier, Martin
  • Laabs, Martin
  • Plettemeier, Dirk
  • Vanden Bossche, Marc
  • Deckert, Thomas
  • Kotzsch, Vincent
  • Lange, Johannes Dietmar Herbert

Abrégé

A system and method for testing devices such as integrated circuits (IC) with integrated antenna arrays configured for wireless signal reception. The method performs a calibration operation on a reference device under test (DUT). During the calibration operation, the DUT receives a series of first signals from a first far-field (FF) location and a series of array transmissions from a second near-field (NF) location using different beamforming settings, and determines therefrom a set of calibration parameters. The calibration parameters may be used by a probe antenna system (PAS) to transmit an array transmission to the DUT from the second NF location to emulate a single probe or multi-probe transmission from the first FF location.

Classes IPC  ?

  • H01Q 21/06 - Réseaux d'unités d'antennes, de même polarisation, excitées individuellement et espacées entre elles
  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique

38.

Nanoseconds-pulse based current/voltage measurement for testing vertical-cavity surface-emitting laser

      
Numéro d'application 17761378
Numéro de brevet 11959945
Statut Délivré - en vigueur
Date de dépôt 2020-11-26
Date de la première publication 2023-05-18
Date d'octroi 2024-04-16
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Lu, Jun
  • Banaska, John George
  • Dougan, Matthew Tate
  • Cornell, Jeffrey Allan
  • Song, Wendi
  • Han, Xuechen
  • Patel, Kunal Harsad

Abrégé

Embodiments are presented herein of an open-loop test system for testing vertical-cavity surface-emitting lasers (VCSELs). A high-speed pulse generator may be used to produce nanoseconds pulses provided to the VCSEL device. A high-speed oscilloscope may be used to measure the resultant nanoseconds pulses across the VCSEL device. The VCSEL device voltage and VCSEL device current may be obtained from the measured nanosecond pulses according to compensation data derived from the system. A pre-test compensation procedure may be used to obtain the compensation data, which may include representative characteristics of each system component. The compensation procedure may also include capturing specified pulse trains under different load conditions of the pulse generator to obtain a scaling relationship between the VCSEL device current and an input voltage used for the pulse generation, and also for obtaining various parameters later used to derive an accurate VCSEL device voltage and an accurate VCSEL device current.

Classes IPC  ?

  • G01R 19/03 - Mesure des valeurs efficaces, c.-à-d. des valeurs moyennes quadratiques utilisant des thermoconvertisseurs
  • G01R 19/00 - Dispositions pour procéder aux mesures de courant ou de tension ou pour en indiquer l'existence ou le signe
  • H01S 5/183 - Lasers à émission de surface [lasers SE], p. ex. comportant à la fois des cavités horizontales et verticales comportant uniquement des cavités verticales, p. ex. lasers à émission de surface à cavité verticale [VCSEL]

39.

Reduction of emulated channel count for phased-array systems through angle-of-arrival processing

      
Numéro d'application 18045354
Numéro de brevet 12088355
Statut Délivré - en vigueur
Date de dépôt 2022-10-10
Date de la première publication 2023-04-20
Date d'octroi 2024-09-10
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Mielens, Jeremy
  • Ammerman, John
  • Vrancic, Aljosa
  • Lynch, Andrew

Abrégé

Systems and methods for emulating a channel for wireless communications between a transmit (TX) system-under-test (SUT) and a receive (RX) SUT. The TX and RX SUTs include integrated antenna arrays for transmitting and receiving wireless signals. For a plurality of paths of the emulated channel, and for each antenna element of the TX SUT, a respective phase shift and gain modification is applied to a wireless signals transmitted by the respective antenna element. The phase shifts and gain modifications emulate path length differences between different antenna elements. The signals for each antenna element are summed, and a path-specific modification is applied to each aggregate signal for each path. For each RX antenna element, phase shift and gain modifications are applied to emulate path-length differences for the RX antenna elements, the resultant signals are summed for each path, and the emulated wireless signals are output to the RX antenna elements.

Classes IPC  ?

40.

Parameter space reduction for device testing

      
Numéro d'application 17500639
Numéro de brevet 11789074
Statut Délivré - en vigueur
Date de dépôt 2021-10-13
Date de la première publication 2023-04-13
Date d'octroi 2023-10-17
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Nagle, James C.
  • Thung, Stephen
  • Kizunov, Sergey
  • Teplinsky, Shaul

Abrégé

Described herein are systems, methods, and other techniques for identifying redundant parameters and reducing parameters for testing a device. A set of test values and limits for a set of parameters are received. A set of simulated test values for the set of parameters are determined based on one or more probabilistic representations for the set of parameters. The one or more probabilistic representations are constructed based on the set of test values. A set of cumulative probabilities of passing for the set of parameters are calculated based on the set of simulated test values and the limits. A reduced set of parameters are determined from the set of parameters based on the set of cumulative probabilities of passing. The reduced set of parameters are deployed for testing the device.

Classes IPC  ?

  • G01R 31/3177 - Tests de fonctionnement logique, p. ex. au moyen d'analyseurs logiques
  • G01R 31/3183 - Génération de signaux d'entrée de test, p. ex. vecteurs, formes ou séquences de test
  • G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
  • G06F 17/16 - Calcul de matrice ou de vecteur
  • G06N 3/047 - Réseaux probabilistes ou stochastiques

41.

Distributed event-based test execution

      
Numéro d'application 17464419
Numéro de brevet 11803456
Statut Délivré - en vigueur
Date de dépôt 2021-09-01
Date de la première publication 2023-03-02
Date d'octroi 2023-10-31
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Chandhoke, Sundeep
  • Ramachandra, Gururaja Kasanadi
  • Malarvizhy, Rajaramm Chokkalingam
  • Mehra, Varun
  • Bachmann, Bjoern

Abrégé

Methods and computing devices for allocating test pods to a distributed computing system for executing a test plan on a device-under-test (DUT). Each test pod may include a test microservice including one or more test steps and an event microservice specifying function relations between the test microservice and other test microservices. The test pods are allocated to different servers to perform a distributed execution of the test plan on the DUT through one or more test interfaces.

Classes IPC  ?

  • G06F 9/44 - Dispositions pour exécuter des programmes spécifiques
  • G06F 11/273 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie
  • G06F 11/22 - Détection ou localisation du matériel d'ordinateur défectueux en effectuant des tests pendant les opérations d'attente ou pendant les temps morts, p. ex. essais de mise en route

42.

Dual directional asymmetric coupler with a shared through-line

      
Numéro d'application 17374697
Numéro de brevet 11774475
Statut Délivré - en vigueur
Date de dépôt 2021-07-13
Date de la première publication 2023-01-19
Date d'octroi 2023-10-03
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Magers, Justin Regis
  • Seibel, Michael Joseph
  • Dasilva, Marcus Kieling

Abrégé

A reflectometer may include two directional couplers in a parallel configuration, sharing the same section of a signal line or through-line. For example, two directional couplers may be disposed across from each other on opposite sides of the shared through-line. One of the directional couplers may couple, to a first port of the reflectometer, a portion of the signal power of a first signal flowing from the first end of the shared through-line to the second end of the shared through-line, and the other directional coupler may couple, to a second port of the reflectometer, a portion of the signal power of a second signal flowing from the second end of the shared through-line to the first end of the shared through-line. The reflectometer benefits from reduced size and signal loss with respect to reflectometers having a serial configuration. When used in vector network analyzer (VNA) systems, this results in higher output power and higher dynamic range of the VNA.

Classes IPC  ?

  • G01R 27/06 - Mesure des coefficients de réflexionMesure du rapport d'ondes stationnaires
  • G01R 27/28 - Mesure de l'atténuation, du gain, du déphasage ou des caractéristiques qui en dérivent dans des réseaux électriques quadripoles, c.-à-d. des réseaux à double entréeMesure d'une réponse transitoire

43.

Modular card cage accessories

      
Numéro d'application 17820112
Numéro de brevet 12114462
Statut Délivré - en vigueur
Date de dépôt 2022-08-16
Date de la première publication 2022-12-08
Date d'octroi 2024-10-08
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Baldwin, Jr., Richard G.
  • Singerman, Michael H.

Abrégé

Various types of electronic devices may be mounted in a chassis in order to facilitate interfacing with the devices, containing the devices, provide cooling systems which may remove heat from the electronic devices, etc. Delivering adequate cooling air flow to each electronic device in a chassis may be an important issue for the proper functioning, lifetime, or other characteristics of electronic devices contained in a chassis. Some electronic devices may be particularly challenging to cool due to various design characteristics. Other electronic devices may have other requirements that are not well served by existing chassis designs. For example, some electronic devices may benefit from additional electrical and/or thermal connections. Embodiments presented herein describe a novel design for a modular card cage accessory that may be configured to modify air flow and/or to meet particular requirements of an electronic device in a chassis, among various possibilities.

Classes IPC  ?

  • H05K 1/14 - Association structurale de plusieurs circuits imprimés
  • H05K 5/02 - Enveloppes, coffrets ou tiroirs pour appareils électriques Détails
  • H05K 7/20 - Modifications en vue de faciliter la réfrigération, l'aération ou le chauffage

44.

Cellular system utilizing beam coherence interval metric

      
Numéro d'application 17741188
Numéro de brevet 11595109
Statut Délivré - en vigueur
Date de dépôt 2022-05-10
Date de la première publication 2022-11-24
Date d'octroi 2023-02-28
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kundargi, Nikhil U.
  • Ganji, Venkata Siva Santosh
  • Aziz, Ahsan
  • Mccoy, James Wesley

Abrégé

A user equipment device (UE) determines a beam coherence interval metric, which is a measure of stability of a beam pair over time based on a set of beam coherence intervals measured by the UE. The beam pair comprises a receive beam of the UE and a transmit beam of a base station transmitting to the UE. A beam coherence interval comprises a time duration within which a quality of a signal received on the UE receive beam remains within one of a plurality of signal quality bins. The UE also determines a hysteresis value based on the beam coherence interval metric and uses the hysteresis value to decide to switch from an active receive beam to a different receive beam that has a signal quality higher than the active receive beam by at least the hysteresis value. Alternatively, the base station determines and sends the UE the hysteresis value.

Classes IPC  ?

  • H04B 7/06 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station d'émission
  • H04W 16/28 - Structures des cellules utilisant l'orientation du faisceau
  • H04W 72/04 - Affectation de ressources sans fil
  • H04B 17/318 - Force du signal reçu
  • H04W 24/10 - Planification des comptes-rendus de mesures
  • H04B 17/336 - Rapport signal/interférence ou rapport porteuse/interférence
  • H04W 80/02 - Protocoles de couche liaison de données

45.

DC resistance measurement contact checking via alternating current high frequency injection

      
Numéro d'application 17728377
Numéro de brevet 11994545
Statut Délivré - en vigueur
Date de dépôt 2022-04-25
Date de la première publication 2022-11-17
Date d'octroi 2024-05-28
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Cheah, Chin-Hong
  • Oong, Tatt-Wee
  • Hartner, Eric

Abrégé

A test system may be used for obtaining accurate remote sense voltage and/or current values. A measurement instrument may provide a regulated stimulus signal to a device under test (DUT) and measure a DUT signal developed at least partially in response to the stimulus signal. A test circuit may superimpose a test signal over the stimulus signal to cause the DUT signal to be developed further in response to the test signal. The DUT signal may be used to derive a resistance of the path that couples the measurement instrument to the DUT. The measurement instrument may include a source measure unit, the stimulus signal may be a regulated voltage, and the DUT signal may be a sense voltage. The harmonics of the DUT signal may be analyzed to determine a correlation between an amplitude of a measured fundamental frequency of the DUT signal and the resistance of the path.

Classes IPC  ?

  • G01R 27/16 - Mesure de l'impédance d'un élément ou d'un réseau dans lequel passe un courant provenant d'une autre source, p. ex. câble, ligne de transport de l'énergie
  • G01R 31/319 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie

46.

Direct network access by a memory mapped peripheral device for scheduled data transfer on the network

      
Numéro d'application 17669708
Numéro de brevet 12066971
Statut Délivré - en vigueur
Date de dépôt 2022-02-11
Date de la première publication 2022-05-26
Date d'octroi 2024-08-20
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Chandhoke, Sundeep
  • Sescila, Iii, Glen O.
  • Castro Scorsi, Rafael

Abrégé

A network interface peripheral device (NIP) may include a network interface for communicating with a network, and an interconnect interface for communicating with a processor subsystem. First buffers in the NIP may hold data received from and/or distributed to peer peripherals by the NIP, and second buffers may hold payload data of scheduled data streams transmitted to and/or received from the network by the NIP. Payload data from the data in the first buffers may be stored in the second buffers and transmitted to the network according to transmit events generated based on a received schedule. Data may be received from the network according to receive events generated based on the received schedule, and distributed from the second buffers to the first buffers. A centralized system configuration entity may generate the schedule, manage configuration of the NIP, and coordinate the internal configuration of the NIP with a network configuration flow.

Classes IPC  ?

  • G06F 13/42 - Protocole de transfert pour bus, p. ex. liaisonSynchronisation
  • G06F 9/48 - Lancement de programmes Commutation de programmes, p. ex. par interruption
  • G06F 9/54 - Communication interprogramme
  • G06F 13/16 - Gestion de demandes d'interconnexion ou de transfert pour l'accès au bus de mémoire

47.

Compact antenna test range (CATR) alignment verification

      
Numéro d'application 17089464
Numéro de brevet 11901636
Statut Délivré - en vigueur
Date de dépôt 2020-11-04
Date de la première publication 2022-05-05
Date d'octroi 2024-02-13
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Orozco Valdes, Gerardo
  • Chen, Dong

Abrégé

Methods, apparatuses, and systems for verifying alignment of a compact antenna test range (CATR) are presented. A radio frequency (RF) profile may be generated based on test signals received by a reference antenna at a plurality of orientations. Phase and amplitude data of the RF profile may be used to determine whether the CATR is aligned properly.

Classes IPC  ?

  • H01Q 21/24 - Combinaisons d'unités d'antennes polarisées dans des directions différentes pour émettre ou recevoir des ondes polarisées circulairement ou elliptiquement ou des ondes polarisées linéairement dans n'importe quelle direction
  • H01Q 13/24 - Antennes constituées par un guide non résonnant à ondes de fuite ou une ligne de transmissionStructures équivalentes produisant un rayonnement le long du trajet de l'onde guidée constitué par une tige ou un tube diélectrique ou ferromagnétique
  • H04B 3/56 - Circuits de couplage, blocage ou dérivation des signaux
  • H01Q 13/28 - Antennes constituées par un guide non résonnant à ondes de fuite ou une ligne de transmissionStructures équivalentes produisant un rayonnement le long du trajet de l'onde guidée comportant des éléments présentant des discontinuités électriques et espacées dans la direction de la propagation de l'onde, p. ex. élément diélectrique ou élément conducteur formant diélectrique artificiel
  • H01Q 1/24 - SupportsMoyens de montage par association structurale avec d'autres équipements ou objets avec appareil récepteur

48.

Virtualized automated test equipment and methods for designing such systems

      
Numéro d'application 17546366
Numéro de brevet 11726008
Statut Délivré - en vigueur
Date de dépôt 2021-12-09
Date de la première publication 2022-03-31
Date d'octroi 2023-08-15
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Bakker, Christopher
  • Walker, Roy Dennis
  • Snover, Burt

Abrégé

A virtualizable automated test equipment architecture includes a circuit assembly. The circuit assembly includes a number of signal paths that extend between a front plane and a backplane. The signal paths can be continuous and isolated from other signal paths of the plurality of signal paths. The circuit assembly also includes an impedance disposed along a signal path of the plurality of signal paths. A plurality of software-configurable physical disconnects may be arranged within the circuit assembly to form a switching matrix. The plurality of signal paths can be associated with a plurality of software-configurable physical disconnects, which can be configured to open and close signal paths of the plurality of signal paths based on the predetermined test requirements. The circuit assembly also includes a plurality of external device connections, at least one of which may be configured to interface with a unit under test (UUT). The software configurable physical disconnects may be configurable at runtime. Because the system if virtualizable, multiplied UUTs may be tested simultaneously according to different requirements, and the testing may be executed on shared hardware in a manner transparent to the UUTs.

Classes IPC  ?

  • G06F 11/30 - Surveillance du fonctionnement
  • G01M 99/00 - Matière non prévue dans les autres groupes de la présente sous-classe

49.

LLC power supply current-sharing and frequency locking mechanism

      
Numéro d'application 17535022
Numéro de brevet 12149176
Statut Délivré - en vigueur
Date de dépôt 2021-11-24
Date de la première publication 2022-03-17
Date d'octroi 2024-11-19
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Banaska, John G.
  • Cheah, Chin-Hong

Abrégé

A multiphase current-sharing configuration may include at least two power supplies providing respective output-currents in the current-sharing configuration. One or more of the power supplies may itself be a multiphase power supply. A first power supply of the current-sharing configuration may detect a phase difference between an external control signal provided to the first power supply to control the output voltage of the first power supply, and an internal control signal provided by a VCO of the first power supply. The phase difference may be provided to an integrator to cause the internal control signal to track the external control signal when the external control signal is available, and maintain a present operating frequency of the internal control signal in case the external control signal is lost, in which case the internal control signal may be used to uninterruptedly control the output voltage of the first power supply.

Classes IPC  ?

  • H02M 3/28 - Transformation d'une puissance d'entrée en courant continu en une puissance de sortie en courant continu avec transformation intermédiaire en courant alternatif par convertisseurs statiques utilisant des tubes à décharge avec électrode de commande ou des dispositifs à semi-conducteurs avec électrodes de commande pour produire le courant alternatif intermédiaire
  • H02J 1/10 - Fonctionnement de sources à courant continu en parallèle
  • H02M 1/00 - Détails d'appareils pour transformation
  • H02M 3/335 - Transformation d'une puissance d'entrée en courant continu en une puissance de sortie en courant continu avec transformation intermédiaire en courant alternatif par convertisseurs statiques utilisant des tubes à décharge avec électrode de commande ou des dispositifs à semi-conducteurs avec électrodes de commande pour produire le courant alternatif intermédiaire utilisant des dispositifs du type triode ou transistor exigeant l'application continue d'un signal de commande utilisant uniquement des dispositifs à semi-conducteurs

50.

Over-the-air testing of millimeter wave antenna arrays

      
Numéro d'application 17464170
Numéro de brevet 11515950
Statut Délivré - en vigueur
Date de dépôt 2021-09-01
Date de la première publication 2022-03-10
Date d'octroi 2022-11-29
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Laabs, Martin
  • Plettemeier, Dirk
  • Deckert, Thomas
  • Lange, Johannes Dietmar Herbert
  • Vanden Bossche, Marc

Abrégé

A system and method for testing (e.g., rapidly and inexpensively) devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave transmission and/or reception. The method may first perform a calibration operation on a reference device under test (DUT). The calibration operation may determine a set of reference DUT FF base functions and may also generate a set of calibration coefficients. After the calibration step using the reference DUT, the resulting reference DUT FF base functions and the calibration coefficients (or reconstruction matrix) may be used in determining far-field patterns of DUTs based on other field measurements, e.g., measurements taken in the near field of the DUT.

Classes IPC  ?

  • H04B 17/00 - SurveillanceTests
  • H04B 17/10 - SurveillanceTests d’émetteurs
  • H01Q 21/06 - Réseaux d'unités d'antennes, de même polarisation, excitées individuellement et espacées entre elles

51.

Fast convergence method for cross-correlation based modulation quality measurements

      
Numéro d'application 17524850
Numéro de brevet 11796621
Statut Délivré - en vigueur
Date de dépôt 2021-11-12
Date de la première publication 2022-03-03
Date d'octroi 2023-10-24
Propriétaire National Instruments Corporation (USA)
Inventeur(s) Chaudhary, Sartaj

Abrégé

Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a complex-valued cross-correlation measurement, and a real component of the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.

Classes IPC  ?

  • G01R 35/00 - Test ou étalonnage des appareils couverts par les autres groupes de la présente sous-classe
  • G01R 31/26 - Test de dispositifs individuels à semi-conducteurs

52.

High-speed performance electrical connector for modular electronics systems

      
Numéro d'application 17408312
Numéro de brevet 11778768
Statut Délivré - en vigueur
Date de dépôt 2021-08-20
Date de la première publication 2022-02-24
Date d'octroi 2023-10-03
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Baldwin, Jr., Richard G.
  • Toth, Dennis Vance

Abrégé

A connector gap between a module connector mating surface and the backplane connector of a chassis may be eliminated through a mechanism that forcefully pushes (or pulls) the module towards the backplane and/or forcefully pushes (or pulls) the backplane toward the module. A spring-loaded or resilient element may be used to fasten the module in a way that effectively fills any designed-in and tolerance-induced gap in the connector interface, allowing the connector to fully seat. In addition, a gasket or other compressible member may be included at the connector mating interface. The gap in the connector interface may be reduced by introducing adjustable card cage members that are capable of being set during the assembly or manufacturing process using special alignment fixtures. The gap in the connector interface may also be reduced by introducing a higher tolerance capable manufacturing process, such as machining, to the card cage sub-assembly.

Classes IPC  ?

  • H05K 7/14 - Montage de la structure de support dans l'enveloppe, sur cadre ou sur bâti
  • G06F 1/18 - Installation ou distribution d'énergie
  • H01R 12/70 - Dispositifs de couplage

53.

Over-the-air testing interface for phase array antennas

      
Numéro d'application 17064814
Numéro de brevet 11255891
Statut Délivré - en vigueur
Date de dépôt 2020-10-07
Date de la première publication 2022-02-22
Date d'octroi 2022-02-22
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Crowley, David M.
  • Orozco Valdes, Gerardo
  • Chang, Chen

Abrégé

Various embodiments are presented of a system including an alignment fixture for testing (e.g., rapidly and cheaply) phased array antennas and other devices configured for radio frequency (RF) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be positioned in a testing position by the alignment fixture. The alignment fixture may provide a configurable level of friction to retain the DUT in the testing position. The alignment fixture may provide isolation from electromagnetic interference for the DUT while in the testing position.

Classes IPC  ?

54.

Machine Condition Monitoring Using Phase Adjusted Frequency Referenced Vector Averaging

      
Numéro d'application 17496283
Statut En instance
Date de dépôt 2021-10-07
Date de la première publication 2022-01-27
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Bendele, Douglas S.
  • Nagle, James C.
  • Armstead, Alan D.
  • Johnson, Preston T.

Abrégé

System and method for machine condition monitoring using phase adjusted vector averaging. An analog signal from a sensor measuring a machine parameter may be acquired, thereby generating a first digital signal that includes multiple analysis blocks of data. For each analysis block, a complex valued frequency spectrum (CVFS) may be computed via a Discrete Fourier transform (DFT), at least one reference frequency may be specified, and a complex valued phase compensation vector that preserves magnitude while adjusting phase constructed to achieve coherence between reference frequency components (RFCs) and the selected analysis block. The CVFS may be phase compensated by multiplying the complex valued phase compensation vector with the complex-valued frequency spectrum. The complex valued frequency spectra of the analysis blocks may be vector averaged, thereby improving signal to noise ratio at specified frequencies. RFCs in the averaged spectrum may be identified, thereby generating average RFCs analyzable to determine machine condition.

Classes IPC  ?

  • G01H 1/00 - Mesure des vibrations dans des solides en utilisant la conduction directe au détecteur

55.

System for emulating an environment for testing a frequency modulated continuous wave (FMCW) light detection and ranging (LiDAR) system

      
Numéro d'application 17315029
Numéro de brevet 12601816
Statut Délivré - en vigueur
Date de dépôt 2021-05-07
Date de la première publication 2021-11-18
Date d'octroi 2026-04-14
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Dasilva, Marcus Kieling
  • Khanna, Amarpal S.
  • Marks, Jason
  • Farrell, Douglas

Abrégé

A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave (FMCW) LiDAR UUT, and/or a flash LiDAR UUT.

Classes IPC  ?

  • G01S 7/497 - Moyens de contrôle ou de calibrage
  • G01S 7/4911 - Émetteurs
  • G01S 7/493 - Extraction des signaux d'écho désirés
  • G01S 17/10 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes à modulation d'impulsion interrompues
  • G01S 17/34 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes continues, soit modulées en amplitude, en fréquence ou en phase, soit non modulées utilisant la transmission d'ondes continues modulées en fréquence, tout en faisant un hétérodynage du signal reçu, ou d’un signal dérivé, avec un signal généré localement, associé au signal transmis simultanément
  • G06F 30/20 - Optimisation, vérification ou simulation de l’objet conçu
  • G01S 17/931 - Systèmes lidar, spécialement adaptés pour des applications spécifiques pour prévenir les collisions de véhicules terrestres

56.

Data model for measurement data storage in databases

      
Numéro d'application 16875566
Numéro de brevet 11288281
Statut Délivré - en vigueur
Date de dépôt 2020-05-15
Date de la première publication 2021-11-18
Date d'octroi 2022-03-29
Propriétaire National Instruments Corporation (USA)
Inventeur(s) Chandhoke, Sundeep

Abrégé

A non-transitory computer-readable memory medium may store a first table comprising rows, wherein each row comprises a first data set identification (ID) field which stores a measurement data set identifier value identifying a measurement data set, and one or more fields for storing measurement data metadata associated with the identified data set. The medium may also store a second table comprising rows, wherein each row comprises a second data set identification (ID) field which stores a measurement data set identifier value present in the first data set ID field. The second table may also store a datapoints field for storing individual data set datapoints and a data set index field corresponding to an ordering of the individual data set datapoints. At least a portion of each of the fields of both the first and second tables may be stored in a columnar format in contiguous memory.

Classes IPC  ?

  • G06F 16/25 - Systèmes d’intégration ou d’interfaçage impliquant les systèmes de gestion de bases de données
  • G06F 16/22 - IndexationStructures de données à cet effetStructures de stockage

57.

System for emulating an environment for testing a time-of-flight (ToF) detection and ranging (LiDAR) system

      
Numéro d'application 17315051
Numéro de brevet 12399264
Statut Délivré - en vigueur
Date de dépôt 2021-05-07
Date de la première publication 2021-11-18
Date d'octroi 2025-08-26
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Dasilva, Marcus Kieling
  • Khanna, Amarpal S.
  • Marks, Jason
  • Farrell, Douglas

Abrégé

A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave LiDAR UUT, and/or a flash LiDAR UUT.

Classes IPC  ?

  • G01S 7/497 - Moyens de contrôle ou de calibrage
  • G01S 7/4911 - Émetteurs
  • G01S 7/493 - Extraction des signaux d'écho désirés
  • G01S 17/10 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes à modulation d'impulsion interrompues
  • G01S 17/34 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes continues, soit modulées en amplitude, en fréquence ou en phase, soit non modulées utilisant la transmission d'ondes continues modulées en fréquence, tout en faisant un hétérodynage du signal reçu, ou d’un signal dérivé, avec un signal généré localement, associé au signal transmis simultanément
  • G06F 30/20 - Optimisation, vérification ou simulation de l’objet conçu
  • G01S 17/931 - Systèmes lidar, spécialement adaptés pour des applications spécifiques pour prévenir les collisions de véhicules terrestres

58.

System for emulating an environment for testing a frequency modulated continuous wave (FMCW) detection and ranging (LiDAR) system

      
Numéro d'application 17315063
Numéro de brevet 11726190
Statut Délivré - en vigueur
Date de dépôt 2021-05-07
Date de la première publication 2021-11-18
Date d'octroi 2023-08-15
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Marks, Jason
  • Dasilva, Marcus Kieling

Abrégé

A system for emulating an over-the-air environment for testing a light detection and ranging (LiDAR) unit under test (UUT). The system may comprise a lens system that receives light from the LiDAR UUT and a plurality of optical processing chains. The system may generate light into free space based on the optical signals processed by each chain. The system may process received light optically to maintain coherence with light received from the LiDAR unit under test and may process all points in a LiDAR image simultaneously. The system may operate to emulate an over-the-air environment for a time-of-flight LiDAR UUT, a frequency modulated continuous wave LiDAR UUT, and/or a flash LiDAR UUT.

Classes IPC  ?

  • G01S 7/497 - Moyens de contrôle ou de calibrage
  • G01S 7/493 - Extraction des signaux d'écho désirés
  • G06F 30/20 - Optimisation, vérification ou simulation de l’objet conçu
  • G01S 17/10 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes à modulation d'impulsion interrompues
  • G01S 17/34 - Systèmes déterminant les données relatives à la position d'une cible pour mesurer la distance uniquement utilisant la transmission d'ondes continues, soit modulées en amplitude, en fréquence ou en phase, soit non modulées utilisant la transmission d'ondes continues modulées en fréquence, tout en faisant un hétérodynage du signal reçu, ou d’un signal dérivé, avec un signal généré localement, associé au signal transmis simultanément
  • G01S 7/4911 - Émetteurs
  • G01S 17/931 - Systèmes lidar, spécialement adaptés pour des applications spécifiques pour prévenir les collisions de véhicules terrestres

59.

Dynamic metadata extraction workflow for measurement data storage

      
Numéro d'application 16875669
Numéro de brevet 11321341
Statut Délivré - en vigueur
Date de dépôt 2020-05-15
Date de la première publication 2021-11-18
Date d'octroi 2022-05-03
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Chandhoke, Sundeep
  • Watson, Michael S.
  • Del Castillo, Alejandro
  • Wilson, Daren K.

Abrégé

A method to dynamically analyze measurement data comprising measurement data sets as the measurement data is received and moved to a data warehouse. The program instructions may receive the measurement data and may extract first metadata from the measurement data. The program instructions may then extract and analyze measurement data points in the measurement data to determine if the measurement data points meet a first criteria and generate second metadata in response to determining that the measurement data points meet the first criteria. The program instructions may then provide the measurement data points, the first metadata and the second metadata to a data warehouse for storage. The analysis of the measurement data and creation of new metadata may be performed dynamically as the data is acquired and stored in the data warehouse.

Classes IPC  ?

  • G06F 16/25 - Systèmes d’intégration ou d’interfaçage impliquant les systèmes de gestion de bases de données
  • G06F 16/16 - Opérations sur les fichiers ou les dossiers, p. ex. détails des interfaces utilisateur spécialement adaptées aux systèmes de fichiers
  • G06F 16/22 - IndexationStructures de données à cet effetStructures de stockage
  • G06F 16/28 - Bases de données caractérisées par leurs modèles, p. ex. des modèles relationnels ou objet

60.

Programmable hardware virtual network interface

      
Numéro d'application 17034726
Numéro de brevet 11604747
Statut Délivré - en vigueur
Date de dépôt 2020-09-28
Date de la première publication 2021-11-11
Date d'octroi 2023-03-14
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Sisterhen, Patrick Karl
  • Chaudhari, Ashish S.
  • Fischer, Moritz Daniel
  • Jepson, Daniel Paul
  • Rubio, Hector M.
  • Lynch, Andrew Michael
  • Braun, Klaus Martin
  • Jones, Antonia Marie Walls

Abrégé

Systems and methods for communication between heterogenous processors via a virtual network interface implemented via programmable hardware and one or more buses. The programmable hardware may be configured with a multi-function bus such that the programmable hardware appears as both a network device and a programmable device to a host system. Additionally, the programmable hardware may be configured with a second bus to appear as a network device to an embedded system. Each system may implement network drivers to allow access to direct memory access engines configured on the programmable hardware. The configured programmable hardware and the network drivers may enable a virtual network connection between the systems to allow for information transfer via one or more network communication protocols.

Classes IPC  ?

  • G06F 13/28 - Gestion de demandes d'interconnexion ou de transfert pour l'accès au bus d'entrée/sortie utilisant le transfert par rafale, p. ex. acces direct à la mémoire, vol de cycle
  • G06F 13/40 - Structure du bus

61.

Switch pruning in a switch fabric bus chassis

      
Numéro d'application 17241394
Numéro de brevet 11704269
Statut Délivré - en vigueur
Date de dépôt 2021-04-27
Date de la première publication 2021-08-12
Date d'octroi 2023-07-18
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Singer, Eric L.
  • Frels, Jason W.
  • Hearn, Jonathan W.

Abrégé

Bus enumeration of a switch fabric bus may be performed without assigning bus numbers to unused switch ports and/or corresponding slots to which the unused switch ports are routed. Accordingly, switches coupled to a switch fabric bus in a chassis may link-train with corresponding slots in the chassis in an attempt to establish active connections with devices coupled to the slots. Unused switch fabric bus lanes running from the switches to unused slots may be identified, and the unused switch ports corresponding to the unused switch fabric bus lanes may be disabled. During a subsequent bus enumeration procedure for the switch fabric bus, bus numbers may be allocated to the identified used switch ports (or corresponding used slots) but not to the identified unused switch ports (or corresponding unused slots). The link training, used/unused switch port identification, and bus enumeration may all be performed each time the chassis is reset.

Classes IPC  ?

62.

Virtualized automated test equipment and methods for designing such systems

      
Numéro d'application 16918461
Numéro de brevet 11226267
Statut Délivré - en vigueur
Date de dépôt 2020-07-01
Date de la première publication 2021-06-17
Date d'octroi 2022-01-18
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Bakker, Christopher
  • Walker, Roy Dennis
  • Snover, Burt

Abrégé

A virtualizable automated test equipment architecture includes a circuit assembly. The circuit assembly includes a number of signal paths that extend between a front plane and a backplane. The signal paths can be continuous and isolated from other signal paths of the plurality of signal paths. The circuit assembly also includes an impedance disposed along a signal path of the plurality of signal paths. A plurality of software-configurable physical disconnects may be arranged within the circuit assembly to form a switching matrix. The plurality of signal paths can be associated with a plurality of software-configurable physical disconnects, which can be configured to open and close signal paths of the plurality of signal paths based on the predetermined test requirements. The circuit assembly also includes a plurality of external device connections, at least one of which may be configured to interface with a unit under test (UUT). The software configurable physical disconnects may be configurable at runtime. Because the system if virtualizable, multiplied UUTs may be tested simultaneously according to different requirements, and the testing may be executed on shared hardware in a manner transparent to the UUTs.

Classes IPC  ?

  • G06F 11/30 - Surveillance du fonctionnement
  • G01M 99/00 - Matière non prévue dans les autres groupes de la présente sous-classe

63.

Robust carrier phase and frequency tracking for M-QAM demodulation

      
Numéro d'application 16703807
Numéro de brevet 11146439
Statut Délivré - en vigueur
Date de dépôt 2019-12-04
Date de la première publication 2021-06-10
Date d'octroi 2021-10-12
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Pal, Prabhat
  • Verma, Aayush

Abrégé

A method for determining coarse carrier phase and frequency offsets of an initial block of received M-QAM symbols includes creating a grid of discrete candidate phase offset values and for each candidate value: applying the candidate value to each symbol, applying a respective hard decision to each applied symbol, and computing a figure of merit based thereon. The candidate value having the best figure of merit is selected as an initial phase offset estimate. An initial frequency offset estimate is computed using the symbols updated with the initial phase offset estimate, their respective hard decisions, and an approximation of the complex exponential function. To track carrier phase and frequency offsets associated with a series of symbol blocks, for each symbol of a current block, set a binary trust weight based on comparison of a computed parameter with a threshold and use the binary trust weights to compute a phase offset error and a frequency offset error for the current block.

Classes IPC  ?

  • H04L 27/26 - Systèmes utilisant des codes à fréquences multiples

64.

Octave Bandwidth High Power Non-Reflective Shunt PIN Diode Switch

      
Numéro d'application 17069041
Statut En instance
Date de dépôt 2020-10-13
Date de la première publication 2021-05-13
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s) Magers, Justin R.

Abrégé

A low-reflectivity solid-state switch circuit includes an input port configured to transmit an electronic signal and first and second output ports configured to receive the electronic signal. The switch circuit further includes a first switching element connected between the input port and the first output port, a second switching element connected between the input port and the second output port, a third switching element connected to a first conductive path between the first switching element and the first output port, and a fourth switching element connected to a second conductive path between the second switching element and the second output port. The third and fourth switching elements are utilizable to shunt current reflections from their connected conducted paths when the respective conductive path is configured in an off configuration.

Classes IPC  ?

  • H03K 17/76 - Dispositifs de commutation comportant plusieurs bornes d'entrée et de sortie, p. ex. multiplexeurs, distributeurs

65.

Efficient beam sweeping at a mobile device receiver

      
Numéro d'application 16671101
Numéro de brevet 11178628
Statut Délivré - en vigueur
Date de dépôt 2019-10-31
Date de la première publication 2021-05-06
Date d'octroi 2021-11-16
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kundargi, Nikhil U.
  • Ganji, Venkata Siva Santosh
  • Aziz, Ahsan
  • Mccoy, James Wesley

Abrégé

A user equipment device (UE) reduces receive beam selection time. An antenna array forms receive beams to receive synchronization signal blocks (SSBs) transmitted by a base station (BS). Each SSB comprises OFDM symbols. Each SSB includes a BS-assigned index. The receive beams are switched in time such that, for each SSB, two or more of the receive beams are used to receive corresponding two or more mutually exclusive sets each having at least one but less than all of the OFDM symbols of the SSB. A processor is programmed to, for each receive beam/SSB index pair, measure a signal quality based on the at least one but less than all of the OFDM symbols of the indexed SSB received by the receive beam of the pair. The processor uses the measured signal qualities to select one of the receive beams to use to receive subsequent communications from the BS.

Classes IPC  ?

  • H04B 7/00 - Systèmes de transmission radio, c.-à-d. utilisant un champ de rayonnement
  • H04W 56/00 - Dispositions de synchronisation
  • H04B 7/08 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station de réception
  • H04W 72/04 - Affectation de ressources sans fil
  • H04L 27/26 - Systèmes utilisant des codes à fréquences multiples
  • H04L 5/00 - Dispositions destinées à permettre l'usage multiple de la voie de transmission

66.

Cellular system utilizing beam coherence interval metric

      
Numéro d'application 16600495
Numéro de brevet 11381297
Statut Délivré - en vigueur
Date de dépôt 2019-10-12
Date de la première publication 2021-04-15
Date d'octroi 2022-07-05
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kundargi, Nikhil U.
  • Ganji, Venkata Siva Santosh
  • Aziz, Ahsan
  • Mccoy, James Wesley

Abrégé

A UE determines a beam coherence interval metric that is a measure of stability of a beam pair over time based on a set of beam coherence intervals measured by the UE. The beam pair comprises a UE receive beam and a base station transmit beam. A beam coherence interval comprises a time duration within which a quality of a signal received on the UE receive beam remains within one of a plurality of signal quality bins. The UE reports the metric to the base station. The base station may update beam management resource and reporting configurations to the UE based on the metric. The UE may also use the metric to determine a hysteresis value useable by the UE to decide to switch from an active receive beam to a different receive beam having a higher signal quality by at least the hysteresis value.

Classes IPC  ?

  • H04W 16/28 - Structures des cellules utilisant l'orientation du faisceau
  • H04B 7/06 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station d'émission
  • H04W 72/04 - Affectation de ressources sans fil
  • H04B 17/318 - Force du signal reçu
  • H04W 24/10 - Planification des comptes-rendus de mesures
  • H04B 17/336 - Rapport signal/interférence ou rapport porteuse/interférence
  • H04W 80/02 - Protocoles de couche liaison de données

67.

Electronically adjustable inductor circuit

      
Numéro d'application 16575850
Numéro de brevet 11050402
Statut Délivré - en vigueur
Date de dépôt 2019-09-19
Date de la première publication 2021-03-25
Date d'octroi 2021-06-29
Propriétaire National Instruments Corporation (USA)
Inventeur(s) Cheah, Chin-Hong

Abrégé

Circuits and methods for electronically adjusting an effective inductance of one or more primary inductors in a circuit. The circuit may include a plurality of sub-circuits connected in parallel between an input and an output of the circuit. Each sub-circuit may include a primary inductor and an auxiliary inductor inductively coupled to the primary inductor. The circuit may further include first circuitry coupled to the primary inductor, wherein the first circuitry configured to introduce an oscillating first voltage across the primary inductor; and second circuitry coupled to the auxiliary inductor, wherein the second circuitry is configured to introduce an oscillating second voltage across the auxiliary inductor. The amplitudes of the second voltages may be selected to reduce a difference between effective inductances of the primary inductors.

Classes IPC  ?

  • H03H 7/40 - Adaptation automatique de l'impédance de charge à l'impédance de la source
  • H01F 21/02 - Inductances ou transformateurs variables du type pour signaux continûment variables, p. ex. variomètres

68.

Multi-phase noise cancelled adjustable switched mode programmable load

      
Numéro d'application 16575758
Numéro de brevet 11038426
Statut Délivré - en vigueur
Date de dépôt 2019-09-19
Date de la première publication 2021-03-25
Date d'octroi 2021-06-15
Propriétaire National Instruments Corporation (USA)
Inventeur(s) Cheah, Chin-Hong

Abrégé

Circuits and methods for operating a programmable load circuit that includes a plurality of sub-circuits connected in parallel between an input and an output. Each sub-circuit may include an inductor, a load, and a switch coupled to the inductor. Each switch may be configurable in a first state and a second state, wherein the inductor is either connected to the output through the load or connected to the output through a connection that bypasses the load. The switches of the plurality of first sub-circuits may be programmable to periodically switch between the first state and the second state according to a duty cycle, and the switches may be out of phase with each other by a predetermined amount. The duty cycle may be programmable to tune the load of the programmable load circuit.

Classes IPC  ?

  • H02M 3/158 - Transformation d'une puissance d'entrée en courant continu en une puissance de sortie en courant continu sans transformation intermédiaire en courant alternatif par convertisseurs statiques utilisant des tubes à décharge avec électrode de commande ou des dispositifs à semi-conducteurs avec électrode de commande utilisant des dispositifs du type triode ou transistor exigeant l'application continue d'un signal de commande utilisant uniquement des dispositifs à semi-conducteurs avec commande automatique de la tension ou du courant de sortie, p. ex. régulateurs à commutation comprenant plusieurs dispositifs à semi-conducteurs comme dispositifs de commande finale pour une charge unique

69.

Switch pruning in a switch fabric bus chassis

      
Numéro d'application 16751934
Numéro de brevet 11023402
Statut Délivré - en vigueur
Date de dépôt 2020-01-24
Date de la première publication 2021-01-07
Date d'octroi 2021-06-01
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Singer, Eric L.
  • Frels, Jason W.
  • Hearn, Jonathan W.

Abrégé

Bus enumeration of a switch fabric bus may be performed without assigning bus numbers to unused switch ports and/or corresponding slots to which the unused switch ports are routed. Accordingly, switches coupled to a switch fabric bus in a chassis may link-train with corresponding slots in the chassis in an attempt to establish active connections with devices coupled to the slots. Unused switch fabric bus lanes running from the switches to unused slots may be identified, and the unused switch ports corresponding to the unused switch fabric bus lanes may be disabled. During a subsequent bus enumeration procedure for the switch fabric bus, bus numbers may be allocated to the identified used switch ports (or corresponding used slots) but not to the identified unused switch ports (or corresponding unused slots). The link training, used/unused switch port identification, and bus enumeration may all be performed each time the chassis is reset.

Classes IPC  ?

70.

Modular card cage accessories

      
Numéro d'application 16901829
Numéro de brevet 11452231
Statut Délivré - en vigueur
Date de dépôt 2020-06-15
Date de la première publication 2020-12-17
Date d'octroi 2022-09-20
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Baldwin, Jr., Richard G.
  • Singerman, Michael H.

Abrégé

Various types of electronic devices may be mounted in a chassis in order to facilitate interfacing with the devices, containing the devices, provide cooling systems which may remove heat from the electronic devices, etc. Delivering adequate cooling air flow to each electronic device in a chassis may be an important issue for the proper functioning, lifetime, or other characteristics of electronic devices contained in a chassis. Some electronic devices may be particularly challenging to cool due to various design characteristics. Other electronic devices may have other requirements that are not well served by existing chassis designs. For example, some electronic devices may benefit from additional electrical and/or thermal connections. Embodiments presented herein describe a novel design for a modular card cage accessory that may be configured to modify air flow and/or to meet particular requirements of an electronic device in a chassis, among various possibilities.

Classes IPC  ?

  • H05K 7/20 - Modifications en vue de faciliter la réfrigération, l'aération ou le chauffage
  • H05K 5/02 - Enveloppes, coffrets ou tiroirs pour appareils électriques Détails
  • H05K 1/14 - Association structurale de plusieurs circuits imprimés

71.

Cross-correlation measurements for modulation quality measurements

      
Numéro d'application 16568527
Numéro de brevet 10841019
Statut Délivré - en vigueur
Date de dépôt 2019-09-12
Date de la première publication 2020-11-17
Date d'octroi 2020-11-17
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Shah, Syed Jaffar
  • Loewenstein, Edward B.

Abrégé

Techniques are disclosed related to determining a modulation quality measurement of a device-under-test (DUT). A modulated signal is received from a source a plurality of times, and each received modulated signal is transmitted to each of a first vector signal analyzer (VSA) and a second VSA. The first VSA and the second VSA demodulate the received modulated signals to produce first error vectors and second error vectors, respectively. A cross-correlation calculation is performed on the first error vectors and second error vectors of respective received modulated signals to produce a cross-correlation measurement, and the cross-correlation measurement is averaged over the plurality of received modulated signals. A modulation quality measurement is determined based on the averaged cross-correlation measurement.

Classes IPC  ?

72.

Asymmetric factorization of generalized raised cosine filters for improved selectivity

      
Numéro d'application 16540838
Numéro de brevet 10841136
Statut Délivré - en vigueur
Date de dépôt 2019-08-14
Date de la première publication 2020-11-17
Date d'octroi 2020-11-17
Propriétaire National Instruments Corporation (USA)
Inventeur(s) Mccoy, James Wesley

Abrégé

An apparatus to transmit and receive wireless communications is disclosed in which the transmit circuitry includes a square root raised cosine filter to pulse shape modulate signals and the receive circuitry includes a higher order Nyquist receive filter coupled to receive the input signals and remove the pulse shaping modulation. The cascaded combination of the transmit and receive filters has a frequency response equivalent to a higher order generalized raised cosine filter response.

Classes IPC  ?

  • H04L 25/03 - Réseaux de mise en forme pour émetteur ou récepteur, p. ex. réseaux de mise en forme adaptatifs

73.

Modular probe for automated test applications

      
Numéro d'application 16811455
Numéro de brevet 11408916
Statut Délivré - en vigueur
Date de dépôt 2020-03-06
Date de la première publication 2020-09-10
Date d'octroi 2022-08-09
Propriétaire National Instruments Corporation (USA)
Inventeur(s) Whittington, Mark

Abrégé

A novel modular probe may include an interchangeable (connectable/disconnectable) probe-tip adaptor having a tip connector for coupling to a device under test, and further having a probe-tip terminal for coupling to a first assembly connector of a cable assembly, which further has a second assembly connector for coupling to a first build-out terminal of a build-out adaptor, which also has a second build-out terminal for coupling to an assembly connector of an interchangeable instrument connector cable assembly, which also has an instrument-end connector for coupling to a measurement instrument. The built-out adaptor may include a compensation adjustment circuit for compensating the probe for varying system capacitances. The probe may include one or more corrective circuits in the interchangeable probe-tip adaptor and/or in the build-out adaptor for at least partially terminating each end of the cable assembly with a characteristic impedance of the cable in the cable assembly to attenuate reflections.

Classes IPC  ?

74.

Wireless communication system that performs measurement based selection of phase tracking reference signal (PTRS) ports

      
Numéro d'application 16858148
Numéro de brevet 11296846
Statut Délivré - en vigueur
Date de dépôt 2020-04-24
Date de la première publication 2020-08-06
Date d'octroi 2022-04-05
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kundargi, Nikhil U.
  • Nahler, Achim

Abrégé

A UE transmits to a BS an indication of a number of PTRS ports. The number of PTRS ports is a suggestion to the BS for allocating the indicated number of PTRS ports to the UE for transmission of PTRS from the BS to the UE to enable the UE to perform phase tracking. The method also includes allocating, by the BS, PTRS ports to the UE based on the indication of the number of PTRS ports. The indication may be included in a UCI message, MAC CE, or RRC message transmitted by the UE to the BS. The BS may map the allocated PTRS ports to DMRS ports corresponding to spatial streams transmitted by the BS. The UE may estimate CPE of each spatial stream, measure correlations of the estimated CPE among the spatial streams, and use the correlations to determine the suggested number of PTRS.

Classes IPC  ?

  • H04L 5/00 - Dispositions destinées à permettre l'usage multiple de la voie de transmission
  • H04L 27/26 - Systèmes utilisant des codes à fréquences multiples
  • H04B 7/06 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station d'émission
  • H04W 56/00 - Dispositions de synchronisation
  • H04B 7/0417 - Systèmes de rétroaction

75.

Hardware timed over-the-air antenna characterization

      
Numéro d'application 16141697
Numéro de brevet 10942214
Statut Délivré - en vigueur
Date de dépôt 2018-09-25
Date de la première publication 2020-03-26
Date d'octroi 2021-03-09
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Orozco Valdes, Gerardo
  • Deckert, Thomas
  • Lange, Johannes D. H.
  • White, Christopher N.
  • Grosz, Karl F.

Abrégé

Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.

Classes IPC  ?

  • G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
  • H04B 17/21 - SurveillanceTests de récepteurs pour l’étalonnageSurveillanceTests de récepteurs pour la correction des mesures
  • G01R 1/073 - Sondes multiples
  • H01L 21/66 - Test ou mesure durant la fabrication ou le traitement

76.

Correlation of device-under-test orientations and radio frequency measurements

      
Numéro d'application 16141733
Numéro de brevet 10725080
Statut Délivré - en vigueur
Date de dépôt 2018-09-25
Date de la première publication 2020-03-26
Date d'octroi 2020-07-28
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Orozco Valdes, Gerardo
  • Deckert, Thomas
  • Lange, Johannes D. H.
  • White, Christopher N.
  • Grosz, Karl F.

Abrégé

Antenna characterization systems and methods are described for hardware-timed testing of integrated circuits (IC) with integrated antennas configured for over-the-air transmission and/or reception. An IC to be tested (e.g., the device under test (DUT)) may be mounted to an adjustable positioner in an anechoic chamber. Radio frequency (RF) characteristics (e.g., including transmission characteristics, reception characteristics, and/or beamforming characteristics) of the IC may be tested over-the-air using an array of antennas or probes within the anechoic chamber while continually transitioning the adjustable positioner through a plurality of orientations. Counters and reference trigger intelligence may be employed to correlate measurement results with orientations of the DUT.

Classes IPC  ?

  • G01R 29/08 - Mesure des caractéristiques du champ électromagnétique
  • H04B 17/29 - Tests de performance
  • H04B 17/10 - SurveillanceTests d’émetteurs

77.

Over-the-air testing of millimeter wave integrated circuits with integrated antennas

      
Numéro d'application 16168650
Numéro de brevet 11050496
Statut Délivré - en vigueur
Date de dépôt 2018-10-23
Date de la première publication 2019-11-21
Date d'octroi 2021-06-29
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Dasilva, Marcus K.
  • Chang, Chen
  • Schroeder, Charles G.
  • Aziz, Ahsan
  • Banwait, Paramjit S.

Abrégé

Testing devices such as integrated circuits (IC) with integrated antennas configured for millimeter wave (mmW) transmission and/or reception. A DUT may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber, etc.). Power and data connections of the DUT may be tested over the interface, which may also provide connections (e.g., wired) for input/output signals, power, and control and may also provide positioning. Radio frequency (RF) characteristics of the DUT may be tested over-the-air using an array of antennas or probes in the radiating Fresnel zone of the DUT's antennas. Each of the antennas or probes of the array may incorporate a power detector (e.g., a diode) so that the RF radiating pattern may be measured using DC voltage measurements. Measured voltage measurements may be compared to an ideal signature, e.g., voltage measurements expected from an ideal or model DUT.

Classes IPC  ?

  • H04B 17/27 - SurveillanceTests de récepteurs pour localiser ou positionner l’émetteur
  • H04B 17/17 - Détection de contre-performance ou d’exécution défectueuse, p. ex. déviations de réponse
  • H04B 17/336 - Rapport signal/interférence ou rapport porteuse/interférence
  • H01Q 3/26 - Dispositifs pour changer ou faire varier l'orientation ou la forme du diagramme de directivité des ondes rayonnées par une antenne ou un système d'antenne faisant varier la phase relative ou l’amplitude relative et l’énergie d’excitation entre plusieurs éléments rayonnants actifsDispositifs pour changer ou faire varier l'orientation ou la forme du diagramme de directivité des ondes rayonnées par une antenne ou un système d'antenne faisant varier la distribution de l’énergie à travers une ouverture rayonnante
  • G01R 1/04 - BoîtiersOrganes de supportAgencements des bornes
  • G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
  • G01R 31/319 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie
  • H04B 17/12 - SurveillanceTests d’émetteurs pour l’étalonnage d’antennes d’émission, p. ex. de l’amplitude ou de la phase

78.

Over-the-air test fixture using antenna array

      
Numéro d'application 16179578
Numéro de brevet 10790915
Statut Délivré - en vigueur
Date de dépôt 2018-11-02
Date de la première publication 2019-11-21
Date d'octroi 2020-09-29
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Dasilva, Marcus K.
  • Chang, Chen
  • Schroeder, Charles G.
  • Aziz, Ahsan
  • Banwait, Paramjit S.

Abrégé

Various embodiments are presented of a system and method for testing (e.g., rapidly and cheaply) devices with antennas configured for radio frequency (RF) and/or millimeter wave (mmW) transmission and/or reception. A device to be tested (e.g., the device under test (DUT)) may be mounted to an interface in a measurement fixture (e.g., a socket, anechoic chamber, etc.). Power and data connections of the DUT may be tested over the interface, which may also provide connections for input/output signals, power, and control and may also provide positioning. RF characteristics (e.g., including transmission, reception, and/or beamforming) of the DUT may be tested over-the-air using an array of antennas or probes.

Classes IPC  ?

  • H04B 17/17 - Détection de contre-performance ou d’exécution défectueuse, p. ex. déviations de réponse
  • H04B 17/336 - Rapport signal/interférence ou rapport porteuse/interférence
  • H01Q 3/26 - Dispositifs pour changer ou faire varier l'orientation ou la forme du diagramme de directivité des ondes rayonnées par une antenne ou un système d'antenne faisant varier la phase relative ou l’amplitude relative et l’énergie d’excitation entre plusieurs éléments rayonnants actifsDispositifs pour changer ou faire varier l'orientation ou la forme du diagramme de directivité des ondes rayonnées par une antenne ou un système d'antenne faisant varier la distribution de l’énergie à travers une ouverture rayonnante
  • G01R 1/04 - BoîtiersOrganes de supportAgencements des bornes
  • G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux
  • H04B 17/27 - SurveillanceTests de récepteurs pour localiser ou positionner l’émetteur
  • G01R 31/319 - Matériel de test, c.-à-d. circuits de traitement de signaux de sortie
  • H04B 17/12 - SurveillanceTests d’émetteurs pour l’étalonnage d’antennes d’émission, p. ex. de l’amplitude ou de la phase

79.

Session management for interactive debugging

      
Numéro d'application 15945143
Numéro de brevet 10996268
Statut Délivré - en vigueur
Date de dépôt 2018-04-04
Date de la première publication 2019-10-10
Date d'octroi 2021-05-04
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Patel, Kunal
  • Gordon, Tobias
  • Nayman, Laura
  • Kirsch, Marcos
  • Lee, Reid
  • Healy, Tyler

Abrégé

Methods and measurements systems are disclosed relating to dynamic measurement prioritization by multiple software interfaces. A first software interface with a low priority may be conducting a first measurement on a device under test (DUT) through a driver connected to a measurement device. A second software interface with a higher priority may initiate a request to conduct a second measurement on the DUT. In response, the driver may automatically determine that the second software interface has a higher priority than the first software interface and may halt the first measurement and conduct the second measurement. The driver may notify the first software interface that its access to the measurement hardware has been revoked, and the first software interface may enter a monitoring mode to monitor the results of the second measurement.

Classes IPC  ?

80.

UE-aided channel reciprocity compensation for radio access in MIMO wireless communication systems

      
Numéro d'application 16392039
Numéro de brevet 10958314
Statut Délivré - en vigueur
Date de dépôt 2019-04-23
Date de la première publication 2019-09-12
Date d'octroi 2021-03-23
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kundargi, Nikhil U.
  • Nieman, Karl F.
  • Sung, Junmo

Abrégé

A wireless cellular base station (BS) transmitter transmits a downlink calibration pilot symbol. A receiver receives from a user equipment (UE) an uplink calibration pilot symbol and an effective downlink channel estimate transmitted by the UE. The effective downlink channel estimate is computed by the UE using the downlink calibration pilot symbol received from the BS. Processing devices compute an effective uplink channel estimate using the uplink calibration pilot symbol received from the UE and compute channel reciprocity calibration coefficients using the effective downlink channel estimate received from the UE and the effective uplink channel estimate computed by the BS. The BS includes multiple antennas, and the BS computes the channel reciprocity calibration coefficients for each antenna. Alternatively, the uplink channel estimate received by the BS is an inverted version of the effective downlink channel estimate, which the processing devices use for channel reciprocity compensation.

Classes IPC  ?

  • H04B 7/0413 - Systèmes MIMO
  • H04B 17/11 - SurveillanceTests d’émetteurs pour l’étalonnage
  • H04L 5/00 - Dispositions destinées à permettre l'usage multiple de la voie de transmission
  • H04B 17/14 - SurveillanceTests d’émetteurs pour l’étalonnage de l’ensemble voie d’émission/voie de réception, p. ex. bouclage d’autotest
  • H04L 27/26 - Systèmes utilisant des codes à fréquences multiples
  • H04L 25/02 - Systèmes à bande de base Détails
  • H04L 25/03 - Réseaux de mise en forme pour émetteur ou récepteur, p. ex. réseaux de mise en forme adaptatifs
  • H04W 72/04 - Affectation de ressources sans fil
  • H04W 72/08 - Affectation de ressources sans fil sur la base de critères de qualité
  • H04W 88/08 - Dispositifs formant point d'accès
  • H04B 7/06 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station d'émission
  • H04W 88/02 - Dispositifs terminaux

81.

One-shot wideband delay measurement with sub-sample accuracy for parallel receivers and/or generators, and alignment procedure

      
Numéro d'application 15918083
Numéro de brevet 10917144
Statut Délivré - en vigueur
Date de dépôt 2018-03-12
Date de la première publication 2019-05-16
Date d'octroi 2021-02-09
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Taher, Tanim Mohammed Abu
  • Rodriguez, Edward

Abrégé

Systems and methods are described for using a single wideband pilot signal to reduce a timing misalignment between receivers in a multiple-input multiple-output (MIMO) radio system. The multiple generators of the MIMO radio system may be aligned using a second wideband pilot signal subsequent to performing the receiver alignment. The calibration kit of the MIMO radio system may be aligned using a third wideband pilot signal prior to performing the receiver alignment. Alignment may be achieved to subsample precision by determining time delays from the rate of change of the phase shift of the wideband pilot signals.

Classes IPC  ?

  • H04B 7/0413 - Systèmes MIMO
  • H04L 5/00 - Dispositions destinées à permettre l'usage multiple de la voie de transmission
  • H04L 27/26 - Systèmes utilisant des codes à fréquences multiples
  • H04J 13/00 - Systèmes de multiplexage en code

82.

Self-calibration of source-measure unit via capacitor

      
Numéro d'application 16242730
Numéro de brevet 10436874
Statut Délivré - en vigueur
Date de dépôt 2019-01-08
Date de la première publication 2019-05-16
Date d'octroi 2019-10-08
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Regier, Christopher G.
  • Limon, Pablo

Abrégé

Systems and methods for calibration and operation of a source-measure unit (SMU). The system may include a functional unit and output terminals coupled to the functional unit. An excitation signal may be applied to a capacitor by the SMU. The capacitor may be included in a calibration circuit. The method may include obtaining one or more of a current calibration coefficient (CCC) or a voltage calibration coefficient (VCC). The CCC may correspond to a current-range setting and the VCC may correspond to a voltage-range setting. The CCC may be obtained from a value of a first current and a value of a second current developed in the capacitor responsive to the excitation signal. The VCC may be obtained from a value of a first voltage and a value of a second voltage developed across the capacitor responsive to the excitation signal.

Classes IPC  ?

  • G01R 35/00 - Test ou étalonnage des appareils couverts par les autres groupes de la présente sous-classe

83.

Active probe powered through driven coax cable

      
Numéro d'application 16180561
Numéro de brevet 10908183
Statut Délivré - en vigueur
Date de dépôt 2018-11-05
Date de la première publication 2019-05-09
Date d'octroi 2021-02-02
Propriétaire National Instruments Corporation (USA)
Inventeur(s) Whittington, Mark

Abrégé

A novel coupling system may include a head-end circuit for coupling a probe via a cable to an instrument, delivering power to the probe over the cable while the cable carries signal(s) from the probe to the instrument. The head-end circuit may include a first terminal for coupling to the probe via a cable, and may further include a second terminal for coupling to the instrument. The head-end circuit may apply direct-current (DC) power to the cable, and may remove a DC voltage offset resulting from the applied DC power before a signal from the probe reaches the instrument. The head-end circuit may include a common node coupled to the first terminal, a current source coupling the common node to a supply voltage, and a voltage source coupling the common node to a second terminal that couples to the instrument.

Classes IPC  ?

84.

System level health monitoring in test systems

      
Numéro d'application 16180967
Numéro de brevet 10746784
Statut Délivré - en vigueur
Date de dépôt 2018-11-05
Date de la première publication 2019-05-09
Date d'octroi 2020-08-18
Propriétaire National Instruments Corporation (USA)
Inventeur(s) Ormston, Jesse D.

Abrégé

To perform system level physical connectivity monitoring measurements, a test signal may be generated in an instrument and transmitted down a signal path extending from the instrument to a device. In a static state (high or low), the test signal generator may produce a specified AC impedance at the point where the signal path connects to the instrument for a designated back termination. A response signal resulting from the test signal may be acquired and used to obtain an impedance value and/or reflection coefficient value representative of the signal path and an additional signal path extending from the source of the test signal to the signal path. The measured response may be compared to an expected response to determine a condition of any component(s) in the signal path and/or in the additional signal path. The expected response may be represented by masks (low and high) created during automated test development.

Classes IPC  ?

  • G01R 31/28 - Test de circuits électroniques, p. ex. à l'aide d'un traceur de signaux

85.

Wireless communication system that performs beam management using nested reference signals

      
Numéro d'application 15969883
Numéro de brevet 10616896
Statut Délivré - en vigueur
Date de dépôt 2018-05-03
Date de la première publication 2019-05-02
Date d'octroi 2020-04-07
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kundargi, Nikhil U.
  • Nahler, Achim

Abrégé

A base station radio transceiver transceives beams with a UE. In a first beam set of wide beam reference signals (RS), each wide beam RS direction is unique, and in a second beam set of narrow beam RS, each narrow beam RS direction is unique and the width of the narrow beam RS is narrower than the width of the wide beam RS. A linkage uniquely links each narrow beam RS to a wide beam RS. The direction of each narrow beam RS is spatially nested within the width of the wide beam RS to which it is uniquely linked. A processor uses the first and second beam sets in a beam management process in which one of the narrow beam RS is selected for the UE and the wide beam RS uniquely linked to the selected narrow beam RS is selected for the UE according to the linkage.

Classes IPC  ?

  • H04W 72/04 - Affectation de ressources sans fil
  • H04B 7/08 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station de réception
  • H04B 17/318 - Force du signal reçu
  • H04W 16/28 - Structures des cellules utilisant l'orientation du faisceau
  • H04W 24/10 - Planification des comptes-rendus de mesures
  • H04W 72/12 - Planification du trafic sans fil

86.

Wireless communication system that performs beam reporting based on a combination of reference signal receive power and channel state information metrics

      
Numéro d'application 15969923
Numéro de brevet 10841925
Statut Délivré - en vigueur
Date de dépôt 2018-05-03
Date de la première publication 2019-05-02
Date d'octroi 2020-11-17
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kundargi, Nikhil U.
  • Nahler, Achim

Abrégé

A base station receives a report of channel state information (CSI) computation capability from a UE, configures the UE with X and Y values based on the reported computation capability, performs a beam sweep by transmitting direction-unique beams, and receives a beam measurement report from the UE comprising a reference signal receive power (RSRP) of Y strongest beams of the transmitted beams and at least a portion of the CSI of X strongest beams of the Y beams. Based on the beam measurement report, one of the X beams is selected to configure the UE for subsequent data and control channel transmissions. X and Y are positive integers, Y is greater than or equal to X, and Y is at least 1.

Classes IPC  ?

  • H04W 72/04 - Affectation de ressources sans fil
  • H04B 7/08 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station de réception
  • H04B 17/318 - Force du signal reçu
  • H04W 16/28 - Structures des cellules utilisant l'orientation du faisceau
  • H04W 24/10 - Planification des comptes-rendus de mesures
  • H04W 72/12 - Planification du trafic sans fil

87.

Wireless communications apparatus and method for performing low latency high throughput layer 2 operations

      
Numéro d'application 15700050
Numéro de brevet 10257329
Statut Délivré - en vigueur
Date de dépôt 2017-09-08
Date de la première publication 2019-03-14
Date d'octroi 2019-04-09
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Aziz, Ahsan
  • Ekbal, Amal
  • Kotzsch, Vincent

Abrégé

A wireless communications apparatus includes first/second data source/sinks that respectively source/sink PDCP SDU and MAC PDU for transfer to/from a memory unit and hardware accelerators controlled by a control processor (CP). In response to sourcing transmit PDCP SDU for transfer to the memory unit, the CP controls the hardware accelerators to generate and write PDCP, RLC, MAC headers to the memory unit and assemble the generated headers and the transmit PDCP SDU from the memory unit into transmit MAC PDU for provision to the second data sink. In response to sourcing receive MAC PDU for transfer to the memory unit, the CP controls the hardware accelerators to decode PDCP, RLC MAC headers of the receive MAC PDU in the memory unit to determine locations of receive PDCP SDU in the memory unit and fetch the receive PDCP SDU from the determined locations for provision to the first data sink.

Classes IPC  ?

  • H04L 29/08 - Procédure de commande de la transmission, p.ex. procédure de commande du niveau de la liaison
  • H04W 84/04 - Réseaux à grande échelleRéseaux fortement hiérarchisés

88.

Automatic multi-clock circuit generation

      
Numéro d'application 15688196
Numéro de brevet 10629161
Statut Délivré - en vigueur
Date de dépôt 2017-08-28
Date de la première publication 2019-02-28
Date d'octroi 2020-04-21
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kee, Hojin
  • Ly, Tai A.
  • Deac, Adrian P.
  • Arnesen, Adam T.

Abrégé

Hardware may be created with different clock speeds used for different components of the system. Clock and throughput requirements on the interface circuitry of hardware components may set limits which are lower requirements for functional components. It may be advantageous to use more or fewer of some functional blocks or interface circuits in order to reduce cost, increase performance or reliability, reduce the requirements for additional parts, or other beneficial factors. Accordingly, it may be advantageous to generate hardware utilizing more than a single clock frequency. Generating instructions which indicate different clock frequencies for separate components may be difficult or time consuming; generating these instructions automatically may provide significant benefits in time savings, increased productivity, increased performance of hardware, or other benefits.

Classes IPC  ?

  • G06F 1/04 - Génération ou distribution de signaux d'horloge ou de signaux dérivés directement de ceux-ci
  • G06F 1/12 - Synchronisation des différents signaux d'horloge
  • G06F 5/06 - Procédés ou dispositions pour la conversion de données, sans modification de l'ordre ou du contenu des données maniées pour modifier la vitesse de débit des données, c.-à-d. régularisation de la vitesse
  • G09G 5/00 - Dispositions ou circuits de commande de l'affichage communs à l'affichage utilisant des tubes à rayons cathodiques et à l'affichage utilisant d'autres moyens de visualisation
  • G06F 1/08 - Générateurs d'horloge ayant une fréquence de base modifiable ou programmable
  • G11C 7/10 - Dispositions d'interface d'entrée/sortie [E/S, I/O] de données, p. ex. circuits de commande E/S de données, mémoires tampon de données E/S
  • G06F 17/18 - Opérations mathématiques complexes pour l'évaluation de données statistiques
  • G06F 17/50 - Conception assistée par ordinateur
  • G01R 31/3185 - Reconfiguration pour les essais, p. ex. LSSD, découpage
  • G06F 16/90 - Détails des fonctions des bases de données indépendantes des types de données cherchés

89.

Wireless radio receiver that performs adaptive phase tracking

      
Numéro d'application 15879369
Numéro de brevet 10218549
Statut Délivré - en vigueur
Date de dépôt 2018-01-24
Date de la première publication 2019-02-26
Date d'octroi 2019-02-26
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Löhning, Michael
  • Ohlmer, Eckhard

Abrégé

A post-equalization phase tracking unit, for each signal block of a received series: computes beginning absolute phase rotation using equalized preceding pilot symbols; subdivides the block into a time sequence of groups of equalized symbols; initializes accumulated phase associated with the first-in-time group with the absolute phase rotation. For each group, the unit: computes a de-rotated version of each symbol using the previous group's accumulated phase used to blindly estimate a residual group phase; assigns the group's accumulated phase with a sum of the group's residual phase and the previous group's accumulated phase; estimates phase drift within the group by using at least the group's accumulated phase to compute a phase compensation signal. A pre-equalization phase tracking unit computes a phase of autocorrelation between identical-as-transmitted initial/terminal sequence portions; estimates a start phase using the autocorrelation phase and the previous signal block start phase; interpolates start phases to estimate phase drift.

Classes IPC  ?

  • H04L 1/00 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue
  • H04L 7/00 - Dispositions pour synchroniser le récepteur avec l'émetteur
  • H04L 27/227 - Circuits de démodulationCircuits récepteurs utilisant une démodulation cohérente
  • H04L 25/03 - Réseaux de mise en forme pour émetteur ou récepteur, p. ex. réseaux de mise en forme adaptatifs

90.

Wireless radio receiver that performs adaptive phase tracking

      
Numéro d'application 15879318
Numéro de brevet 10218548
Statut Délivré - en vigueur
Date de dépôt 2018-01-24
Date de la première publication 2019-02-26
Date d'octroi 2019-02-26
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Löhning, Michael
  • Ohlmer, Eckhard

Abrégé

A pre-equalization phase tracking unit, for each signal block of received series: computes autocorrelation between portion of identical-as-transmitted initial and terminal sequences and computes phase of autocorrelation; estimates start phase of block processing window using autocorrelation phase and start phase of previous signal block in series; estimates phase drift within window by interpolating using estimated start phases of at least the signal block and next signal block in series; and computes phase compensation signal using estimated phase drift. A post-equalization phase tracking unit subdivides the block into time sequence of groups of equalized symbols. For each group: compute de-rotated version of each symbol using previous group's accumulated phase to blindly estimate residual group phase; assign group's accumulated phase with sum of group's residual phase and previous group's accumulated phase; estimate phase drift within group by using at least group's accumulated phase to compute phase compensation signal.

Classes IPC  ?

  • H04L 1/00 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue
  • H04L 7/00 - Dispositions pour synchroniser le récepteur avec l'émetteur
  • H04L 27/227 - Circuits de démodulationCircuits récepteurs utilisant une démodulation cohérente
  • H04L 25/03 - Réseaux de mise en forme pour émetteur ou récepteur, p. ex. réseaux de mise en forme adaptatifs

91.

Distributed run-time auto-calculation of measurement uncertainty

      
Numéro d'application 15678929
Numéro de brevet 10394643
Statut Délivré - en vigueur
Date de dépôt 2017-08-16
Date de la première publication 2019-02-21
Date d'octroi 2019-08-27
Propriétaire National Instruments Corporation (USA)
Inventeur(s) Hamner, Robert W.

Abrégé

System and method for auto-calculating uncertainty of a measurement performed by a measurement device. The measurement device initiates a measurement or measurements. In response to the measurement initiation, a driver of the measurement device sends an error specification request to each of a plurality of hardware modules involved in the measurement. Each of the plurality of hardware modules determines the requested error specifications based on a current configuration of the respective hardware module. The measurement device then calculates an uncertainty associated with the measurement or measurements based on the error specifications.

Classes IPC  ?

  • G06F 11/00 - Détection d'erreursCorrection d'erreursContrôle de fonctionnement
  • G06F 11/07 - Réaction à l'apparition d'un défaut, p. ex. tolérance de certains défauts

92.

Radio frequency beam management and recovery

      
Numéro d'application 16100753
Numéro de brevet 10951300
Statut Délivré - en vigueur
Date de dépôt 2018-08-10
Date de la première publication 2019-02-14
Date d'octroi 2021-03-16
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kundargi, Nikhil U.
  • Nahler, Achim
  • Mccoy, James Wesley

Abrégé

A base station (BS)/user equipment (UE) for performing radio frequency beam management and recovery in communication with a UE/BS. The BS/UE includes a processor and a memory that stores first and second thresholds. The processor evaluates a beam quality metric against the first and second thresholds, performs beam switching and/or beam broadening in response to determining the beam quality metric falls below the first threshold, and performs a beam failure recovery procedure in response to determining the beam quality metric falls below the second threshold.

Classes IPC  ?

  • H04W 16/28 - Structures des cellules utilisant l'orientation du faisceau
  • H04B 7/0413 - Systèmes MIMO
  • H04B 7/08 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station de réception
  • H04B 17/382 - SurveillanceTests de canaux de propagation pour l’attribution de ressources, le contrôle d’accès ou le transfert
  • H04B 7/06 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station d'émission
  • H04W 24/10 - Planification des comptes-rendus de mesures
  • H04B 17/318 - Force du signal reçu
  • H04B 17/21 - SurveillanceTests de récepteurs pour l’étalonnageSurveillanceTests de récepteurs pour la correction des mesures
  • H04B 17/24 - SurveillanceTests de récepteurs avec rétroaction des mesures vers l’émetteur
  • H04L 12/26 - Dispositions de surveillance; Dispositions de test
  • H04W 72/08 - Affectation de ressources sans fil sur la base de critères de qualité
  • H04W 72/04 - Affectation de ressources sans fil
  • H04B 17/10 - SurveillanceTests d’émetteurs
  • H04L 5/00 - Dispositions destinées à permettre l'usage multiple de la voie de transmission

93.

Radio frequency beam management and failure pre-emption

      
Numéro d'application 16100854
Numéro de brevet 10567065
Statut Délivré - en vigueur
Date de dépôt 2018-08-10
Date de la première publication 2019-02-14
Date d'octroi 2020-02-18
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kundargi, Nikhil U.
  • Nahler, Achim
  • Mccoy, James Wesley

Abrégé

A processor in a UE evaluates a radio frequency beam quality metric against a threshold, switches from a first beam to a second beam in response to determining the metric falls below the threshold, and transmits to a base station (BS) a report that includes beam measurements. The report indicates the UE has performed the switching and that the beam measurements are with respect to the second beam. A processor in a UE/BS associates narrower and broader beams, uses the narrower beam, rather than the broader beam, to transfer user data between the BS and the UE, evaluates a beam quality metric of the narrower beam against the threshold, and switches to using the broader beam, rather than the narrower beam, to transfer user data between the BS and the UE in response to determining the beam quality metric of the narrower beam falls below the threshold.

Classes IPC  ?

  • H04B 7/08 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station de réception
  • H04B 17/382 - SurveillanceTests de canaux de propagation pour l’attribution de ressources, le contrôle d’accès ou le transfert
  • H04B 7/06 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station d'émission
  • H04W 24/10 - Planification des comptes-rendus de mesures
  • H04B 17/318 - Force du signal reçu
  • H04B 7/0413 - Systèmes MIMO
  • H04W 16/28 - Structures des cellules utilisant l'orientation du faisceau
  • H04W 72/08 - Affectation de ressources sans fil sur la base de critères de qualité
  • H04L 12/26 - Dispositions de surveillance; Dispositions de test
  • H04W 72/04 - Affectation de ressources sans fil
  • H04B 17/10 - SurveillanceTests d’émetteurs

94.

Wireless transceiver station with performs multi-path reciprocity calibration with multiple reference antennas

      
Numéro d'application 16036372
Numéro de brevet 10312978
Statut Délivré - en vigueur
Date de dépôt 2018-07-16
Date de la première publication 2019-01-24
Date d'octroi 2019-06-04
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Hofrichter, Jörg
  • Löhning, Michael
  • Ohlmer, Eckhard

Abrégé

In a wireless transceiver station having M antennas, designate an antenna as a target reference antenna (TRA) and for each antenna m other than the TRA: define N distinct paths from antenna m to TRA through zero or more intermediate reference antennas, N is two or more, each distinct paths has a distinct associated set of one or more antenna pairs; for each antenna pair of the sets, estimate an effective forward and backward channel response by sending calibration pilots forth and back between the antenna pair and calculate a reciprocity coefficient for the antenna pair using the estimated channel responses; for each of the N distinct paths, calculate a reciprocity coefficient estimate using the reciprocity coefficients calculated for the set of antenna pairs associated with the path; and combine the N calculated reciprocity coefficient estimates to produce a final reciprocity coefficient estimate for antenna pair (m, target reference antenna).

Classes IPC  ?

  • H04W 52/08 - Commande de puissance en boucle fermée
  • H04B 7/0417 - Systèmes de rétroaction
  • H01Q 1/24 - SupportsMoyens de montage par association structurale avec d'autres équipements ou objets avec appareil récepteur
  • H04L 1/00 - Dispositions pour détecter ou empêcher les erreurs dans l'information reçue
  • H04B 1/40 - Circuits

95.

Auto-zero algorithm for reducing measurement noise in analog-to-digital systems over a wide range of sampling rates

      
Numéro d'application 15827824
Numéro de brevet 10181858
Statut Délivré - en vigueur
Date de dépôt 2017-11-30
Date de la première publication 2019-01-15
Date d'octroi 2019-01-15
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s) Medina, Raymundo J.

Abrégé

Sampling accuracy during sampling of analog input signals may be improved by performing an “auto-zero every sample” procedure. The ratio of input signal samples to zero input samples for the sampling time interval defined by the sampling frequency may be determined based on the sampling frequency. For sampling frequencies equal to or less than a specified frequency characteristic of the signal conditioning path of the analog input signal, the ratio may be set to unity (one). For sampling frequencies above the specified frequency, the ratio may be set to be greater than unity (one), and may be a power-of-two. A digital signal processing block may include independent digital signal processing paths for the input signal measurements and the zero input measurements. Each signal processing path may include a low-pass infinite impulse response filter, an average decimation finite impulse response filter, and a binary shifter to allow for the adjustable ratio.

Classes IPC  ?

  • H03M 1/06 - Compensation ou prévention continue de l'influence indésirable de paramètres physiques
  • H03M 3/00 - Conversion de valeurs analogiques en, ou à partir d'une modulation différentielle
  • H03M 1/18 - Commande automatique pour modifier la plage des signaux que le convertisseur peut traiter, p. ex. réglage de la plage de gain
  • H03M 1/12 - Convertisseurs analogiques/numériques

96.

Airflow straightener in an electronics chassis

      
Numéro d'application 15645267
Numéro de brevet 10219405
Statut Délivré - en vigueur
Date de dépôt 2017-07-10
Date de la première publication 2019-01-10
Date d'octroi 2019-02-26
Propriétaire NATIONAL INSTRUMENTS CORPORATION (USA)
Inventeur(s)
  • Baldwin, Jr., Richard G.
  • Harlan, Jared S.
  • Toth, D. Vance

Abrégé

Various types of electronic devices may be mounted in a chassis in order to facilitate interfacing with the devices, containing the devices, provide cooling systems which may remove heat from the electronic devices, etc. Delivering adequate cooling air flow to each electronic device in a chassis may be an important issue for the proper functioning, lifetime, or other characteristics of electronic devices contained in a chassis. Embodiments presented herein describe a novel design for an air flow straightener that is configured for insertion within the chassis to straighten the airflow. In some embodiments, the grating is comprised of long dividers and shorter dividers that are predominantly oriented perpendicularly to each other, resulting in a rectangular grating. Including such a grating in a chassis may improve the uniformity and performance of the cooling system.

Classes IPC  ?

  • G06F 1/20 - Moyens de refroidissement
  • H05K 7/20 - Modifications en vue de faciliter la réfrigération, l'aération ou le chauffage

97.

Automatically transform pass-by-value semantics into pass-by-reference implementation

      
Numéro d'application 15588298
Numéro de brevet 10241764
Statut Délivré - en vigueur
Date de dépôt 2017-05-05
Date de la première publication 2018-11-08
Date d'octroi 2019-03-26
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kee, Hojin
  • Uliana, David C.
  • Ly, Tai A.
  • Arnesen, Adam T.

Abrégé

System and method for compiling a program, including determining one or more program structures containing one or more variables at the entry and exit of each program structure, wherein each variable specifies a value transfer operation of one or more source variables to a destination variable between outside the program structure and inside the program structure. A subset of the destination variables may be determined for which assigning the destination variable to a memory resource of a corresponding source variable does not disrupt the functionality of the program. Implementation of the value transfer operations may be executable to map each of the determined subset of destination variables to a respective memory resource. The mapping may be dynamically changed, thereby transferring the value from the first source variable to the destination variable without copying the value between the memory resources.

Classes IPC  ?

  • G06F 9/44 - Dispositions pour exécuter des programmes spécifiques
  • G06F 8/41 - Compilation
  • G05B 15/02 - Systèmes commandés par un calculateur électriques

98.

Time critical tasks scheduling

      
Numéro d'application 16027773
Numéro de brevet 10503549
Statut Délivré - en vigueur
Date de dépôt 2018-07-05
Date de la première publication 2018-11-01
Date d'octroi 2019-12-10
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Chandhoke, Sundeep
  • Salmon, Iv, Herbert K.

Abrégé

A method and system for scheduling a time critical task. The system may include a processing unit, a hardware assist scheduler, and a memory coupled to both the processing unit and the hardware assist scheduler. The method may include receiving timing information for executing the time critical task, the time critical task executing program instructions via a thread on a core of a processing unit and scheduling the time critical task based on the received timing information. The method may further include programming a lateness timer, waiting for a wakeup time to obtain and notifying the processing unit of the scheduling. Additionally, the method may include executing, on the core of the processing unit, the time critical task in accordance with the scheduling, monitoring the lateness timer, and asserting a thread execution interrupt in response to the lateness timer expiring, thereby suspending execution of the time critical task.

Classes IPC  ?

  • G06F 9/48 - Lancement de programmes Commutation de programmes, p. ex. par interruption

99.

Wireless communication system that performs measurement based selection of phase tracking reference signal (PTRS) ports

      
Numéro d'application 15940103
Numéro de brevet 10686572
Statut Délivré - en vigueur
Date de dépôt 2018-03-29
Date de la première publication 2018-10-04
Date d'octroi 2020-06-16
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Kundargi, Nikhil U.
  • Nahler, Achim

Abrégé

A base station (BS) having a plurality of antennas transmits a plurality of spatial streams. Each user equipment (UE) of a plurality of UE estimates common phase error (CPE) of each of two or more of the plurality of spatial streams, measures correlations of the estimated CPE among the two or more of the plurality of spatial streams, and provides feedback about the CPE correlations to the BS. The BS uses the CPE correlation feedback to allocate phase tracking reference signal (PTRS) ports and to map the allocated PTRS ports to demodulation reference signal (DMRS) ports corresponding to the plurality of spatial streams.

Classes IPC  ?

  • H04L 5/00 - Dispositions destinées à permettre l'usage multiple de la voie de transmission
  • H04L 27/26 - Systèmes utilisant des codes à fréquences multiples
  • H04B 7/06 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées à la station d'émission
  • H04B 7/04 - Systèmes de diversitéSystèmes à plusieurs antennes, c.-à-d. émission ou réception utilisant plusieurs antennes utilisant plusieurs antennes indépendantes espacées
  • H04W 56/00 - Dispositions de synchronisation
  • H04B 7/0417 - Systèmes de rétroaction

100.

Methods for data acquisition systems in real time applications

      
Numéro d'application 15981093
Numéro de brevet 10621025
Statut Délivré - en vigueur
Date de dépôt 2018-05-16
Date de la première publication 2018-09-20
Date d'octroi 2020-04-14
Propriétaire National Instruments Corporation (USA)
Inventeur(s)
  • Castro Scorsi, Rafael
  • Rubio, Hector M.
  • Domene-Ramirez, Gerardo Daniel

Abrégé

A system may include a data acquisition hardware device (DAQ) for acquiring sample data and/or generating control signals, and a host system with memory that may store data samples and information associated with the DAQ and host system operations. The DAQ may push hardware status information to host memory, triggered by predetermined events taking place in the DAQ, e.g. timing events or interrupts. The DAQ may update dedicated buffers in host memory with status data for any of these events. The pushed status information may be read in a manner that allows detection of race conditions, and may be used to handle data acquisition, output control signaling, and interrupts as required without the host system having to query the DAQ. The DAQ may also detect data timing errors and report those data timing errors back to the host system, and also provide improved output operations using counters.

Classes IPC  ?

  • G06F 11/07 - Réaction à l'apparition d'un défaut, p. ex. tolérance de certains défauts
  • G05B 19/418 - Commande totale d'usine, c.-à-d. commande centralisée de plusieurs machines, p. ex. commande numérique directe ou distribuée [DNC], systèmes d'ateliers flexibles [FMS], systèmes de fabrication intégrés [IMS], productique [CIM]
  • G06F 13/24 - Gestion de demandes d'interconnexion ou de transfert pour l'accès au bus d'entrée/sortie utilisant l'interruption
  • G06F 11/00 - Détection d'erreursCorrection d'erreursContrôle de fonctionnement
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